CN114062895A - Board card testing device and system - Google Patents

Board card testing device and system Download PDF

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Publication number
CN114062895A
CN114062895A CN202111256762.4A CN202111256762A CN114062895A CN 114062895 A CN114062895 A CN 114062895A CN 202111256762 A CN202111256762 A CN 202111256762A CN 114062895 A CN114062895 A CN 114062895A
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China
Prior art keywords
signal
test
board card
board
tested
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CN202111256762.4A
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Chinese (zh)
Inventor
翟春荣
石先武
刘文臻
陈磊
贺少亮
邹诚
汤仲鸣
卜凡
胡铸萱
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State Nuclear Power Automation System Engineering Co Ltd
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State Nuclear Power Automation System Engineering Co Ltd
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Application filed by State Nuclear Power Automation System Engineering Co Ltd filed Critical State Nuclear Power Automation System Engineering Co Ltd
Priority to CN202111256762.4A priority Critical patent/CN114062895A/en
Publication of CN114062895A publication Critical patent/CN114062895A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815Functional tests, e.g. boundary scans, using the normal I/O contacts

Abstract

The invention discloses a board card testing device and a testing system, wherein the board card testing device comprises a signal generating unit and a signal collecting unit; the signal generating unit is used for generating an excitation signal and sending the excitation signal to the board card to be tested and the signal acquisition unit; the signal acquisition unit is used for acquiring a response signal generated by the board card to be tested based on the excitation signal and generating a test result based on the excitation signal and the response signal. The board card testing device generates various excitation signals required by testing through the signal generating unit, acquires response signals generated by a board card to be tested on the basis of the excitation signals through the signal acquisition unit, and generates a testing result on the basis of the excitation signals and the response signals; the automation of the test process is realized, the test report is automatically generated, manual intervention is not needed in the test process, the performance and the function of the board card to be tested can be stably monitored and recorded for a long time, the test efficiency and the reliability are improved, the test process is optimized, the test time is shortened, and the human errors are reduced.

Description

Board card testing device and system
Technical Field
The invention relates to the technical field of automatic testing, in particular to a board testing device and a board testing system.
Background
The nuclear measurement system outside the reactor is a subsystem of an important safety instrument control system of a nuclear power station, and generally consists of a neutron detector assembly, a preamplifier and a nuclear measurement signal processing system outside the reactor. The neutron detector assembly is used for collecting thermal neutrons leaked from the pressure vessel; the preamplifier is used for amplifying and processing the weak electric signal; the out-of-core nuclear measurement signal processing system is used for collecting and processing signals from a preamplifier or a neutron detector.
In order to ensure safe and reliable operation of the nuclear power station, functional performance test is required before the board card of the out-of-core nuclear measurement signal processing system is put into use. At present, the board card function and performance test of the nuclear power station out-of-core nuclear test signal processing system is implemented manually, various test signals need to be input manually during the test, output signals and test results need to be recorded manually, the test efficiency is low, and long-term stability monitoring and recording cannot be carried out.
Disclosure of Invention
The invention aims to solve the technical problem that the board card testing device and the board card testing system are provided in order to overcome the defects that in the prior art, the board card testing process of the out-of-stack nuclear test signal processing system needs manual whole-process operation, manual input of testing signals and manual output of testing results are carried out, the testing time is long, the testing efficiency is low, long-term stability monitoring and recording cannot be carried out, and the testing process cannot be automated.
The invention solves the technical problems through the following technical scheme:
in a first aspect, a board card testing device is provided, which includes a signal generating unit and a signal collecting unit;
the signal generating unit is used for generating an excitation signal and sending the excitation signal to the board card to be tested and the signal acquisition unit;
the signal acquisition unit is used for acquiring a response signal generated by the board card to be tested based on the excitation signal and generating a test result based on the excitation signal and the response signal.
In the board card testing device, the signal generating unit generates an excitation signal and sends the excitation signal to a board card to be tested and a signal acquisition unit; the signal acquisition unit acquires an excitation signal and a response signal generated by the board card to be tested based on the excitation signal and generates a test result; the automation of the test flow of the board card to be tested is realized, the test result is automatically generated, the whole test process does not need manual intervention, the performance and the function of the board card to be tested can be stably monitored and recorded for a long time, the test efficiency and the test reliability are improved, the test flow is optimized, the test time is shortened, and the human error is reduced.
Preferably, the excitation signal comprises an electrical pulse signal;
the board card testing device also comprises a pulse amplification unit which is used for amplifying the electric pulse signal;
the signal generating unit is used for sending the excitation signal to the signal acquisition unit through the pulse amplification unit.
The board card testing device tests the response capability and the processing capability of the board card to be tested to the electric pulse signal by testing the electric pulse signal and generating the electric pulse test result, reflects whether the electric pulse signal processing function of the board card to be tested is normal, and verifies the performance and the function of the board card to be tested.
Preferably, the excitation signal comprises an electrical pulse signal; the board card testing device also comprises a photoelectric conversion unit and a pulse amplification unit;
the photoelectric conversion unit is used for converting the electric pulse signal into an optical pulse signal;
the pulse amplification unit is used for amplifying the optical pulse signal;
the signal generating unit is used for sending the excitation signal to the board card to be tested through the photoelectric conversion unit;
the signal generating unit is used for sending the excitation signal to the signal acquisition unit through the photoelectric conversion unit and the pulse amplification unit.
The board card testing device provided by the invention converts the electric pulse signal into the optical pulse signal, tests the optical pulse signal and generates the optical pulse test result to test the response capability and the processing capability of the board card to be tested to the optical pulse signal, reflects whether the optical pulse signal processing function of the board card to be tested is normal or not, and verifies the performance and the function of the board card to be tested.
Preferably, the excitation signal comprises an analog electrical signal; the signal acquisition unit comprises an alternating current-direct current converter and a signal processor;
the alternating current-direct current converter is used for collecting the response signal and converting direct current quantity in the response signal into alternating current quantity;
the signal processor is used for generating a test result based on the excitation signal and the converted response signal.
According to the board card testing device, the response capability and the processing capability of the board card to be tested to the alternating current signal are tested by testing the alternating current signal and generating the alternating current signal testing result, whether the alternating current signal processing function of the board card to be tested is normal or not is reflected, and the performance and the function of the board card to be tested are verified.
Preferably, the excitation signal comprises an analog electrical signal, and the signal acquisition unit comprises a voltage division circuit and a signal processor;
the voltage division circuit is used for dividing the voltage of the response signal;
the signal processor is used for generating a test result based on the excitation signal and the response signal after voltage division.
According to the board card testing device, the response capability and the processing capability of the board card to be tested to the partial pressure electric signals are tested by performing partial pressure processing on the analog electric signals, generating the partial pressure electric signals, testing the partial pressure electric signals and generating the partial pressure electric signal testing result, whether the partial pressure electric signal processing function of the board card to be tested is normal is reflected, and the performance and the function of the board card to be tested are verified.
Preferably, the analog electrical signal is an analog voltage signal or an analog current signal.
According to the board card testing device, the response capability and the processing capability of the board card to be tested to the alternating current signal and the partial voltage signal are tested by testing the analog voltage signal or the analog current signal and generating the alternating current signal testing result and the partial voltage signal testing result, whether the processing functions of the alternating current signal and the partial voltage signal of the board card to be tested are normal or not is reflected, and the performance and the function of the board card to be tested are verified.
Preferably, the board card to be tested and the board card testing device are connected through a testing cable.
In the board card testing device, the board card to be tested and the board card testing device are connected through the physical testing cable to carry out signal transmission and communication, when the signal processing is abnormal, the fault of the testing cable or the fault of the board card to be tested can be quickly positioned, and when the testing cable has the fault, the testing cable can be replaced in time.
Preferably, the board card testing device further comprises a cabinet, and the signal generating unit and the signal collecting unit are both installed in the cabinet.
In the board card testing device, the signal generating unit and the signal acquiring unit are accommodated by the cabinet, so that the signal generating unit and the signal acquiring unit are prevented from being placed on the testing table in a scattered manner, testing interference of dust, sundries and the like on the signal generating unit and the signal acquiring unit is reduced, the testing environment of a board card to be tested is optimized, and the testing performance of the board card to be tested is improved.
Preferably, the board card testing device further includes a display for receiving the test result sent by the signal acquisition unit and displaying the test result.
In the board test device, the test result is displayed by the display of the board test device, so that the tester can conveniently check the test result and the test report, and the practicability of the board test device is improved.
In a second aspect, a board test system is provided, where the test system includes any one of the board test apparatuses and a board to be tested.
The board card test system of the embodiment tests the board card to be tested through the mutual matching of the test units and the test circuit, realizes the automation of the test flow of the board card to be tested, automatically generates the test report, does not need manual intervention in the whole test process, can stably monitor and record the performance and the function of the board card to be tested for a long time, improves the test efficiency and the test reliability, optimizes the test flow and reduces the test time.
The positive progress effects of the invention are as follows:
the board card testing device generates various excitation signals required by testing through the signal generating unit and sends the excitation signals to the board card to be tested and the signal acquisition unit; acquiring a response signal generated by the board card to be tested based on the excitation signal through a signal acquisition unit, and generating a test result based on the excitation signal and the response signal; the automation of the test flow of the board card to be tested is realized, the test report is automatically generated, the whole test process does not need manual intervention, the performance and the function of the board card to be tested can be stably monitored and recorded for a long time, the test efficiency and the test reliability are improved, the test flow is optimized, the test time is shortened, and the human errors are reduced.
Drawings
Fig. 1 is a schematic signal processing flow diagram of a board testing device according to embodiment 2 of the present invention.
Fig. 2 is a schematic signal processing flow chart of a board testing device according to embodiment 3 of the present invention.
Fig. 3 is a schematic signal processing flow chart of a board testing device according to embodiment 5 of the present invention.
Fig. 4 is a schematic signal processing flow chart of another board test device according to embodiment 5 of the present invention.
Fig. 5 is a schematic structural diagram of a board testing system according to embodiment 6 of the present invention.
Detailed Description
The invention is further illustrated by the following examples, which are not intended to limit the scope of the invention.
Example 1
The embodiment provides a board card testing device, which comprises a signal generating unit and a signal collecting unit; the signal generating unit is used for generating an excitation signal and sending the excitation signal to the board card to be tested and the signal acquisition unit; the signal acquisition unit is used for acquiring a response signal generated by the board card to be tested based on the excitation signal and generating a test result based on the excitation signal and the response signal.
The signal generating unit in this embodiment may be a waveform generator, and is configured to generate various excitation signals input by the simulated reactor nuclear measurement signal processing system, and send the excitation signals to the board card to be tested and the signal acquisition unit; because the board card to be tested needs to test various different functions, various corresponding excitation signals need to be generated in a simulation mode, so that the board card to be tested can generate corresponding response signals based on the different excitation signals.
The signal acquisition unit in this embodiment is configured to acquire the board card to be tested and generate a corresponding response signal based on different excitation signals, and generate a test result based on different excitation signals and a response signal corresponding to a certain excitation signal, where the test result represents a response result and a processing capability of the board card to be tested for the certain excitation signal, and reflects performance and functions of the board card to be tested.
In the board test device of the embodiment, the signal generation unit generates an excitation signal and sends the excitation signal to the board to be tested and the signal acquisition unit; the signal acquisition unit acquires an excitation signal and a response signal generated by the board card to be tested based on the excitation signal and generates a test result; the automation of the test flow of the board card to be tested is realized, the test result is automatically generated, the whole test process does not need manual intervention, the performance and the function of the board card to be tested can be stably monitored and recorded for a long time, the test efficiency and the test reliability are improved, the test flow is optimized, the test time is shortened, and the human error is reduced.
In an optional embodiment, the board test device includes a test cable, and the board to be tested and the board test device are connected through the test cable.
The board card testing device is provided with a cable interface, one end of a testing cable is connected with the cable interface of the board card testing device, and the other end of the testing cable is connected with the cable interface of the board card to be tested.
In the board card testing device of the embodiment, the board card to be tested and the board card testing device are connected through the physical testing cable to carry out signal transmission and communication, when the signal processing is abnormal, the fault of the testing cable or the board card to be tested can be rapidly positioned, and when the testing cable fails, the testing cable can be replaced in time.
In an optional embodiment, the board card testing device further includes a cabinet, and the signal generating unit and the signal collecting unit are both installed in the cabinet.
In the integrated circuit board testing arrangement of this embodiment, hold signal generation unit and signal acquisition unit through the rack, prevent scattered the placing on the test table of signal generation unit and signal acquisition unit, reduce the test interference that dust or debris etc. produced signal generation unit and signal acquisition unit, through removing the rack, can remove integrated circuit board testing arrangement, optimize the test environment of the integrated circuit board that awaits measuring, improve the test performance of the integrated circuit board that awaits measuring.
In another optional implementation manner, the board test device further includes a display, and the display is configured to receive the test result sent by the signal acquisition unit and display the test result.
In the board test device of the embodiment, the test result is displayed through the display of the board test device, so that the tester can conveniently check the test result and the test report, and the practicability of the board test device is improved.
Example 2
This embodiment is a specific implementation manner of embodiment 1, and fig. 1 is a schematic signal processing flow diagram of a board testing device according to an embodiment of the present invention.
In the board test device of the embodiment, the excitation signal is an electric pulse signal; the board card testing device also comprises a pulse amplification unit which is used for amplifying the electric pulse signal; the signal generating unit is used for sending the excitation signal to the signal acquisition unit through the pulse amplification unit.
In this embodiment, the signal generating unit is a waveform generator, and the signal collecting unit is an oscilloscope; as shown in fig. 1, a waveform generator 1 generates an electrical pulse signal and sends the electrical pulse signal to a board card 2 to be tested, and the board card 2 to be tested responds and processes the electrical pulse signal, outputs an electrical pulse response signal and sends the electrical pulse response signal to an oscilloscope 4; the board card testing device also comprises a pulse amplifying unit 3, wherein the pulse amplifying unit 3 amplifies an electric pulse signal generated by the waveform generator 1, outputs an electric pulse amplifying signal and sends the electric pulse amplifying signal to the oscilloscope 4; the oscilloscope 4 is used as a signal acquisition unit to process the acquired electric pulse response signal and the electric pulse amplification signal and generate an electric pulse test result, so that the test of the board card to be tested is realized.
In the board test device in this embodiment, the response capability and the processing capability of the board to be tested to the electrical pulse signal are tested by testing the electrical pulse signal and generating an electrical pulse test result, which reflects whether the electrical pulse signal processing function of the board to be tested is normal, and verifies the performance and the function of the board to be tested.
Example 3
This embodiment is a specific implementation manner of embodiment 1, and fig. 2 is a schematic signal processing flow diagram of a board testing device according to an embodiment of the present invention.
The excitation signal of the board card testing device of the embodiment is an electric pulse signal; the board card testing device also comprises a photoelectric conversion unit 5 and a pulse amplification unit 3; the photoelectric conversion unit 5 is used for converting the electric pulse signal into an optical pulse signal; the pulse amplification unit 3 is used for amplifying the optical pulse signal; the signal generating unit is used for sending the excitation signal to the board card to be tested through the photoelectric conversion unit; the signal generating unit is also used for sending the excitation signal to the signal acquisition unit through the photoelectric conversion unit and the pulse amplification unit.
As shown in fig. 2, in this embodiment, the waveform generator 1 generates an electrical pulse signal and sends the electrical pulse signal to the photoelectric conversion unit 5, the photoelectric conversion unit 5 converts the electrical pulse signal into an optical pulse signal and sends the optical pulse signal to the board card 2 to be tested, the board card 2 to be tested responds and/or processes the optical pulse signal, outputs an optical pulse response signal and sends the optical pulse response signal to the oscilloscope 4; the pulse amplification unit 3 amplifies the optical pulse signal and outputs an optical pulse amplification signal, and sends the optical pulse amplification signal to the oscilloscope 4; the oscilloscope 4 is used as a signal acquisition unit to process the acquired optical pulse response signal and the optical pulse amplification signal and generate an optical pulse test result, so that the test of the optical pulse signal by the board card to be tested is realized.
In the board test device in this embodiment, the electrical pulse signal is converted into the optical pulse signal, the optical pulse signal is tested, and an optical pulse test result is generated, so that the response capability and the processing capability of the board to be tested to the optical pulse signal are tested, whether the optical pulse signal processing function of the board to be tested is normal is reflected, and the performance and the function of the board to be tested are verified.
Example 4
On the basis of the embodiments 2 and 3, the board card testing device provided in this embodiment further includes a multiplexing unit, where the multiplexing unit is configured to receive the electrical pulse amplification signal and the optical pulse amplification signal amplified by the pulse amplification unit 3, output the optical pulse amplification signal to the oscilloscope 4 during the optical pulse signal test, and output the electrical pulse amplification signal to the oscilloscope 4 during the electrical pulse signal test.
The signal acquisition unit in this embodiment is not limited to an oscilloscope, and may also be a counter, where the counter is used to acquire an electrical pulse response signal and an optical pulse response signal output by the board card to be tested.
Example 5
This embodiment is another specific implementation manner of embodiment 1, and fig. 3 is a schematic signal processing flow diagram of a board testing device according to an embodiment of the present invention.
In this embodiment, the excitation signal in the board test device is an analog electrical signal; the signal acquisition unit comprises an alternating current-direct current converter 6 and a signal processor 7; the alternating current-direct current converter 6 is used for collecting the response signal and converting the direct current quantity in the response signal into alternating current quantity; the signal processor 7 is used for generating a test result based on the excitation signal and the converted response signal.
As shown in fig. 3, in this embodiment, the signal generating unit is an analog quantity output device 8, the analog quantity output device 8 is configured to generate an analog electrical signal and send the analog electrical signal to the board 2 to be tested, the board 2 to be tested generates an analog electrical response signal based on the analog electrical signal and sends the analog electrical response signal to the ac-dc converter 6, the ac-dc converter 6 converts a dc quantity in the analog electrical response signal into an ac quantity and outputs an ac electrical signal to the signal processor 7, and the signal processor 7 generates a test result based on the analog electrical signal and the ac electrical signal, thereby implementing a test on the board to be tested.
The ac-dc converter 6 in this embodiment may also be referred to as a ripple test circuit, the ripple test circuit includes a load resistor and an isolation capacitor, the analog electrical signal output by the board to be tested is transmitted to the isolation capacitor through the load resistor, and the isolation capacitor outputs the analog electrical response signal to the signal processor 7, so as to implement the high-voltage ripple test.
In this embodiment, the signal processor 7 may be an oscilloscope, and the oscilloscope is configured to process the ac electrical signal processed by the ac-dc converter 6 and generate an ac electrical signal test result.
In the board test device in this embodiment, the response capability and the processing capability of the board to be tested to the alternating current signal are tested by testing the alternating current signal and generating the alternating current signal test result, so that whether the alternating current signal processing function of the board to be tested is normal or not is reflected, and the performance and the function of the board to be tested are verified.
Fig. 4 is a schematic signal processing flow chart of another board test device according to an embodiment of the present invention. In an optional embodiment, the excitation signal of the board test device is an analog electrical signal; the signal acquisition unit comprises a voltage division circuit 9 and a signal processor 7; the voltage division circuit 9 is used for dividing the voltage of the response signal; the signal processor 7 is used for generating a test result based on the excitation signal and the divided response signal.
As shown in fig. 4, in this embodiment, the signal generating unit is an analog quantity output device 8, the analog quantity output device 8 is configured to generate an analog electrical signal and send the analog electrical signal to the board 2 to be tested, the board 2 to be tested generates an analog electrical response signal based on the analog electrical signal and sends the analog electrical response signal to the voltage dividing circuit 9, the voltage dividing circuit 9 processes a voltage in the analog electrical response signal to obtain a divided electrical signal and outputs the divided electrical signal to the signal processor 7, and the signal processor 7 generates a test result based on the analog electrical signal and the divided electrical signal, thereby implementing a test on the board to be tested.
In this embodiment, the signal processor 7 may be an analog quantity collector, and the analog quantity collector is configured to process the divided-voltage electrical signal processed by the divided-voltage circuit 9 and generate a test result of the divided-voltage electrical signal.
In the board test device in this embodiment, the analog electrical signal is subjected to voltage division processing, a voltage division electrical signal is generated, the voltage division electrical signal is tested, and a voltage division electrical signal test result is generated, so that the response capability and the processing capability of the board to be tested on the voltage division electrical signal are tested, whether the voltage division electrical signal processing function of the board to be tested is normal or not is reflected, and the performance and the function of the board to be tested are verified.
In another alternative embodiment, the analog electrical signal is an analog voltage signal or an analog current signal.
If the analog electric signal is an analog voltage signal, the board card 2 to be tested generates an analog voltage response signal based on the analog voltage signal, and sends the analog voltage response signal to the alternating current-direct current converter 6 and the voltage division circuit 9 for subsequent processing; if the analog electric signal is an analog current signal, the signal acquisition unit further comprises a current-voltage converter, and the current-voltage converter is used for receiving an analog current response signal generated by the board card 2 to be tested based on the analog current signal, converting the analog current response signal into an analog voltage response signal, and sending the analog voltage response signal to the alternating current-direct current converter 6 and the voltage division circuit 9 for subsequent processing.
In the board test device in this embodiment, the response capability and the processing capability of the board to be tested to the alternating current signal and the divided voltage signal are tested by testing the analog voltage signal or the analog current signal and generating the alternating current signal test result and the divided voltage signal test result, so that whether the processing functions of the alternating current signal and the divided voltage signal of the board to be tested are normal or not is reflected, and the performance and the function of the board to be tested are verified.
Example 6
The present embodiment provides a board testing system, and fig. 5 is a schematic structural diagram of the board testing system provided in embodiment 6 of the present invention.
As shown in fig. 5, the board test system includes the board test apparatus according to any one of embodiments 1 to 5 and the board 2 to be tested. The board card testing device comprises a signal generating unit and a signal collecting unit; the signal generating unit may include a waveform generator 1 or an analog quantity outputter 8; the signal acquisition unit can comprise an oscilloscope 4, an alternating current-direct current converter 6, a signal processor 7 or a voltage division circuit 9; the board card testing device can also comprise a pulse amplification unit 3 or a photoelectric conversion unit 5; the board card testing device can also comprise a display and a cabinet; the board card to be tested can be connected with the board card testing device through the testing cable.
The board card test system of the embodiment tests the board card to be tested through the mutual matching of the test units and the test circuit, realizes the automation of the test flow of the board card to be tested, automatically generates the test report, does not need manual intervention in the whole test process, can stably monitor and record the performance and the function of the board card to be tested for a long time, improves the test efficiency and the test reliability, optimizes the test flow and reduces the test time.
While specific embodiments of the invention have been described above, it will be appreciated by those skilled in the art that this is by way of example only, and that the scope of the invention is defined by the appended claims. Various changes and modifications to these embodiments may be made by those skilled in the art without departing from the spirit and scope of the invention, and these changes and modifications are within the scope of the invention.

Claims (10)

1. The board card testing device is characterized by comprising a signal generating unit and a signal acquiring unit;
the signal generating unit is used for generating an excitation signal and sending the excitation signal to the board card to be tested and the signal acquisition unit;
the signal acquisition unit is used for acquiring a response signal generated by the board card to be tested based on the excitation signal and generating a test result based on the excitation signal and the response signal.
2. The board card testing device of claim 1, wherein the stimulus signal comprises an electrical pulse signal;
the board card testing device also comprises a pulse amplification unit which is used for amplifying the electric pulse signal;
the signal generating unit is used for sending the excitation signal to the signal acquisition unit through the pulse amplification unit.
3. The board card testing device of claim 1, wherein the stimulus signal comprises an electrical pulse signal; the board card testing device also comprises a photoelectric conversion unit and a pulse amplification unit;
the photoelectric conversion unit is used for converting the electric pulse signal into an optical pulse signal;
the pulse amplification unit is used for amplifying the optical pulse signal;
the signal generating unit is used for sending the excitation signal to the board card to be tested through the photoelectric conversion unit;
the signal generating unit is used for sending the excitation signal to the signal acquisition unit through the photoelectric conversion unit and the pulse amplification unit.
4. A board card testing device according to claim 1, wherein the excitation signal comprises an analog electrical signal; the signal acquisition unit comprises an alternating current-direct current converter and a signal processor;
the alternating current-direct current converter is used for collecting the response signal and converting direct current quantity in the response signal into alternating current quantity;
the signal processor is used for generating a test result based on the excitation signal and the converted response signal.
5. The board card testing device of claim 1, wherein the excitation signal comprises an analog electrical signal, and the signal acquisition unit comprises a voltage division circuit and a signal processor;
the voltage division circuit is used for dividing the voltage of the response signal;
the signal processor is used for generating a test result based on the excitation signal and the response signal after voltage division.
6. A board card testing device according to claim 4 or 5, characterized in that the analog electrical signal is an analog voltage signal or an analog current signal.
7. A card test device according to any of claims 1-5, characterized in that the card to be tested and the card test device are connected by a test cable.
8. A board test arrangement according to any of claims 1-5, characterized in that the board test arrangement further comprises a cabinet, the signal generation unit and the signal acquisition unit both being mounted in the cabinet.
9. A board test device according to any of claims 1-5, characterized in that the board test device further comprises a display for receiving the test results sent by the signal acquisition unit and displaying the test results.
10. A board test system comprising the board test apparatus according to any one of claims 1 to 9 and a board to be tested.
CN202111256762.4A 2021-10-27 2021-10-27 Board card testing device and system Pending CN114062895A (en)

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Application Number Priority Date Filing Date Title
CN202111256762.4A CN114062895A (en) 2021-10-27 2021-10-27 Board card testing device and system

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Application Number Priority Date Filing Date Title
CN202111256762.4A CN114062895A (en) 2021-10-27 2021-10-27 Board card testing device and system

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Publication Number Publication Date
CN114062895A true CN114062895A (en) 2022-02-18

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CN202111256762.4A Pending CN114062895A (en) 2021-10-27 2021-10-27 Board card testing device and system

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050146342A1 (en) * 2004-01-02 2005-07-07 Jang Jin-Mo Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test
CN102565563A (en) * 2010-12-29 2012-07-11 上海汽车集团股份有限公司 Automated integration test system and method for automotive electronic and electric appliance system
CN203054186U (en) * 2013-01-31 2013-07-10 武汉华中数控股份有限公司 Universal board testing device
CN109976305A (en) * 2018-12-28 2019-07-05 北京航天测控技术有限公司 A kind of aircraft automatic control system real-time closed-loop test system

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050146342A1 (en) * 2004-01-02 2005-07-07 Jang Jin-Mo Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test
CN102565563A (en) * 2010-12-29 2012-07-11 上海汽车集团股份有限公司 Automated integration test system and method for automotive electronic and electric appliance system
CN203054186U (en) * 2013-01-31 2013-07-10 武汉华中数控股份有限公司 Universal board testing device
CN109976305A (en) * 2018-12-28 2019-07-05 北京航天测控技术有限公司 A kind of aircraft automatic control system real-time closed-loop test system

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