CN114061907A - Halo quantization system and method - Google Patents
Halo quantization system and method Download PDFInfo
- Publication number
- CN114061907A CN114061907A CN202010747140.0A CN202010747140A CN114061907A CN 114061907 A CN114061907 A CN 114061907A CN 202010747140 A CN202010747140 A CN 202010747140A CN 114061907 A CN114061907 A CN 114061907A
- Authority
- CN
- China
- Prior art keywords
- halo
- area
- image
- brightness
- point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 125000001475 halogen functional group Chemical group 0.000 title claims abstract description 277
- 238000013139 quantization Methods 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 27
- 239000000523 sample Substances 0.000 claims abstract description 124
- 238000012545 processing Methods 0.000 claims abstract description 46
- 230000003287 optical effect Effects 0.000 claims abstract description 42
- 238000003384 imaging method Methods 0.000 claims abstract description 10
- 230000007613 environmental effect Effects 0.000 claims description 23
- 238000011002 quantification Methods 0.000 claims description 7
- 230000015572 biosynthetic process Effects 0.000 claims description 4
- 238000012360 testing method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 12
- XOFYZVNMUHMLCC-ZPOLXVRWSA-N prednisone Chemical compound O=C1C=C[C@]2(C)[C@H]3C(=O)C[C@](C)([C@@](CC4)(O)C(=O)CO)[C@@H]4[C@@H]3CCC2=C1 XOFYZVNMUHMLCC-ZPOLXVRWSA-N 0.000 description 5
- 238000005286 illumination Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000003709 image segmentation Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
Abstract
The invention discloses a halo quantization system and a halo quantization method. The system comprises a detected irradiation light source, wherein the detected irradiation light source is provided with a light outlet with a preset shape; the reference standard mirror reflection plate is used for imaging the light outlet to form a standard image; the sample to be detected can image the light outlet to form a main image and a halo positioned around the main image, and image the environment around the light outlet to form an environment image; the optical probe is used for acquiring a first image, and the second image processing unit is used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the processing unit is used for acquiring the brightness of the first image and the brightness of the measured irradiation light source and calculating the brightness of each point of the halo area, and the processing unit is also used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula. The embodiment of the invention can quantize the halation.
Description
Technical Field
The embodiment of the invention relates to a halo quantization technology, in particular to a halo quantization system and a halo quantization method.
Background
With the development of display technology, the display panel plays an increasingly greater role, and accordingly, the requirements on the display panel are also increasingly higher.
The environmental light has an important influence on the display of the display panel, so that the research on the display effect of the display panel under the environmental light has an important meaning, the research on the display effect of the display panel under the environmental light in the prior art mainly focuses on the reflection influence of the display panel on the environmental light, for example, the environmental light contrast test method is used for evaluation, however, the display panel has a halo phenomenon under the environmental light, the halo can have a more serious influence on the display effect of the display panel, and a system for quantifying the halo to evaluate the halo in the prior art is lacked.
Disclosure of Invention
The invention provides a halo quantization system and a halo quantization method, which are used for quantizing halos and evaluating the halos according to quantization values.
In a first aspect, an embodiment of the present invention provides a halo quantization system, configured to quantize halos of a sample to be measured, where the system includes: the device comprises a measured irradiation light source, a reference standard mirror reflection plate, an optical probe and a processing unit; the measured irradiation light source is provided with a light outlet with a preset shape; the reference standard specular reflection plate is used for imaging the light outlet to form a standard image; the sample to be detected can image the light outlet to form a main image and a halo positioned around the main image, and can image the environment around the light outlet to form an environment image; the optical probe is used for acquiring a first image and a second image, wherein the first image at least comprises a halo area corresponding to part of the halo and an environmental area corresponding to at least part of the environmental image, and the second image comprises a standard area corresponding to the standard image; the processing unit is used for acquiring the first image and the second image, calculating the area of the standard area, calculating color coordinates of each point in the halo area and calculating color coordinates of the reference point in the environment area; the processing unit is further used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the processing unit is used for acquiring the first image and the brightness of the measured irradiation light source and calculating the brightness of each point of the halo area, and the processing unit is also used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula.
Optionally, when the processing unit is configured to calculate the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area, and a first preset formula, the first preset formula includes:
wherein, the Δ LiIs the difference between the black and white value in the color coordinate of the ith point in the halo region and the black and white value in the color coordinate of the reference point, the delta aiThe difference value of the red-green value in the ith point color coordinate in the halo area and the red-green value in the reference point color coordinate is delta biThe difference value of the yellow-blue value in the ith point color coordinate in the halo area and the yellow-blue value in the reference point color coordinate is represented, i is more than or equal to 1 and less than or equal to N, and N is the number of the middle points in the halo area; JNAD is S1/S; wherein S1 is the area of a dot formation region where Δ E is greater than 1 in the halo region, S is the area of the standard region, and JNAD is the halo area index; when the processing unit is used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point in the halo area, the brightness of the irradiation light source to be measured and a second preset formula, the second preset formula is L1/L2, wherein L1 is the maximum value of the brightness value in the color coordinate of each point in the halo area, L2 is the brightness of the irradiation light source to be measured, and Lcr is the halo brightness ratio.
Optionally, the system further comprises a light shielding plate, wherein the light shielding plate comprises an opening, and the opening is used for arranging the sample to be tested; the optical probe is used for acquiring a third image when the light shielding plate is at a first position, wherein the third image comprises a main image area corresponding to the main image, a halo area corresponding to the halo and a light shielding area corresponding to the light shielding plate; the optical probe is further configured to acquire an image of the light shielding plate moving a preset distance D in a direction opposite to the first direction as the first image, where D is F + G/2, F is a distance between the center of the main image area in the third image and the light shielding area in the first direction, and G is a width of the standard area in the second image along the first direction.
Optionally, the system further comprises: the device comprises a semi-integrating sphere, a guide rail, an illuminometer, an irradiation light source and an irradiation light source baffle; the guide rail is arranged on the inner wall of the semi-integrating sphere, the optical probe and the to-be-detected irradiation light source are arranged on the guide rail, the to-be-detected sample is arranged at the sphere center of the semi-integrating sphere, the irradiation light source and the irradiation light source baffle are arranged inside the semi-integrating sphere, and the illuminometer is used for detecting the ambient illuminance in the semi-integrating sphere.
Optionally, the reference standard specular reflection plate is disposed at a position on the surface of the light shielding plate adjacent to the opening, and the reference standard specular reflection plate is not coplanar with the sample to be measured.
Optionally, the preset shape of the light outlet is a rectangle;
preferably, the size of the rectangular light outlet is such that the length and the width of the standard region are respectively less than 1/3 and 1/3 of the length and the width of the sample display region to be detected.
In a second aspect, an embodiment of the present invention further provides a halo quantization method, which is performed by the halo quantization system in the first aspect, and the method includes: the optical probe acquires the first image and the second image; the processing unit acquires the first image and the second image, calculates the area of the standard area, calculates the color coordinates of each point in the halo area and calculates the color coordinates of the reference point in the environment area; the processing unit is further used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the processing unit acquires the brightness of the first image and the brightness of the measured irradiation light source and calculates the brightness of each point of the halo area, and the processing unit is further used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula.
Optionally, when the processing unit is configured to determine color coordinates of each point in the halo region and color coordinates of the reference pointWhen the area of the standard area and a first preset formula are used for calculating the halo area index of the sample to be detected, the first preset formula comprises:
wherein, the Δ LiIs the difference between the black and white value in the color coordinate of the ith point in the halo region and the black and white value in the color coordinate of the reference point, the delta aiThe difference value of the red-green value in the ith point color coordinate in the halo area and the red-green value in the reference point color coordinate is delta biThe difference value of the yellow-blue value in the ith point color coordinate in the halo area and the yellow-blue value in the reference point color coordinate is represented, i is more than or equal to 1 and less than or equal to N, and N is the number of the middle points in the halo area; JNAD is S1/S; wherein S1 is the area of a dot formation region where Δ E is greater than 1 in the halo region, S is the area of the standard region, and JNAD is the halo area index; when the processing unit is used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point in the halo area, the brightness of the irradiation light source to be measured and a second preset formula, the second preset formula is L1/L2, wherein L1 is the maximum value of the brightness value in the color coordinate of each point in the halo area, L2 is the brightness of the irradiation light source to be measured, and Lcr is the halo brightness ratio.
Optionally, the system further comprises a light shielding plate, wherein the light shielding plate comprises an opening, and the opening is used for arranging the sample to be tested; the method further comprises the following steps: acquiring a third image when the shading plate is at a first position, wherein the third image comprises a main image area corresponding to the main image, a halo area corresponding to the halo and a shading area corresponding to the shading plate; moving the light shielding plate by a preset distance D along the direction opposite to the first direction, wherein D is F + G/2, F is the distance between the center of the main image area in the third image and the light shielding area in the first direction, and G is the width of the standard area in the second image along the first direction; and acquiring an image of the shading plate moving a preset distance D along a first direction as the first image.
Optionally, the system further comprises: the device comprises a semi-integrating sphere, a guide rail, an illuminometer, an irradiation light source and an irradiation light source baffle; the guide rail is arranged on the inner wall of the semi-integrating sphere, the optical probe and the to-be-detected irradiation light source are arranged on the guide rail, the to-be-detected sample is arranged at the sphere center of the semi-integrating sphere, the irradiation light source and the irradiation light source baffle are arranged inside the semi-integrating sphere, and the illuminometer is used for detecting the ambient illuminance in the semi-integrating sphere; the method further comprises the following steps: moving the measured irradiation light source and the optical probe so that emergent light of the measured irradiation light source and the sphere center of the semi-integrating sphere form a preset included angle; and calculating the area index and/or brightness ratio of the halo of the sample to be detected under the preset included angle.
According to the technical scheme of the embodiment of the invention, the adopted halo quantification system comprises a measured irradiation light source, a reference standard mirror reflection plate, an optical probe and a processing unit; the measured irradiation light source is provided with a light outlet with a preset shape; the reference standard mirror reflection plate is used for imaging the light outlet to form a standard image; the sample to be detected can image the light outlet to form a main image and a halo positioned around the main image, and image the environment around the light outlet to form an environment image; the optical probe is used for acquiring a first image and a second image, wherein the first image at least comprises a halo area corresponding to part of halos and an environmental area corresponding to at least part of environmental images, and the second image comprises a standard area corresponding to the standard images; the processing unit is used for acquiring the first image and the second image, calculating the area of the standard area, calculating the color coordinates of each point in the halo area and calculating the color coordinates of the reference points in the environment area; the processing unit is also used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the processing unit is used for acquiring the brightness of the first image and the brightness of the measured irradiation light source and calculating the brightness of each point of the halo area, and the processing unit is also used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula. The invention can quantize the halo in a simple mode, and the halo quantized value is related to the color coordinates of each point in the halo, the color coordinates of the reference point, the area of the standard image and the like, namely the halo quantized value can accurately reflect the severity of the halo.
Drawings
Fig. 1 is a schematic structural diagram of a halo quantization system according to an embodiment of the present invention;
FIG. 2 is a diagram illustrating a second image according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating the imaging result of a sample to be tested according to an embodiment of the present invention;
FIG. 4 is a diagram illustrating a first image according to an embodiment of the present invention;
FIG. 5 is a top view of FIG. 1;
FIG. 6 is a schematic diagram of a third image;
FIG. 7 is a schematic diagram of an image acquired by the optical probe after the light shielding plate moves a distance D;
fig. 8 is a flowchart of a halo quantization method according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Fig. 1 is a schematic structural diagram of a halo quantization system according to an embodiment of the present invention, and referring to fig. 1, the halo quantization system is configured to evaluate a halo of a sample to be measured, and the halo quantization system includes: a measured irradiation light source 101, a reference standard specular reflection plate 102, an optical probe 103, and a processing unit (not shown); the measured irradiation light source 101 has a light exit 1011 with a preset shape (the periphery of the light exit is blackened), and the reference standard specular reflection plate 102 is used for imaging the light exit to form a standard image; the sample 104 to be measured can image the light outlet 1011 to form a main image and a halo around the main image, and image the environment around the light outlet to form an environment image; the optical probe 103 is used for acquiring a first image and a second image, wherein the first image at least comprises a halo region corresponding to a part of halo and an environmental region corresponding to at least a part of environmental image, and the second image comprises a standard region corresponding to a standard image; the processing unit is used for acquiring the first image and the second image, calculating the area of the standard area, calculating the color coordinates of each point in the halo area and calculating the color coordinates of the reference points in the environment area; the processing unit is also used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the processing unit is used for acquiring the brightness of the first image and the brightness of the measured irradiation light source and calculating the brightness of each point of the halo area, and the processing unit is also used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula.
Specifically, the sample to be tested may be, for example, a device for Light Emitting display, such as a display panel, and the display panel may be, for example, a liquid crystal display panel or an Organic Light-Emitting Diode (OLED) display panel; fig. 2 is a schematic diagram of a second image according to an embodiment of the present invention, and as shown in fig. 2, the reference standard specular reflection plate 102 can generate specular reflection on light reaching the surface of the reference standard specular reflection plate, that is, no halo phenomenon is generated, light emitted from the light outlet 1011 of the measured illumination light source 101 is reflected by the reference standard specular reflection plate 102 and then collected by the optical probe 103, the optical probe 103 may be, for example, a CCD, and a portion of the second image corresponding to the light outlet is a bright spot, an area where the bright spot is located can be understood as a standard area 201, the shape of the bright spot is the same as that of the light outlet 1011, and the difference between the bright spot and the surrounding brightness is large, so that the area of the bright spot can be calculated easily; fig. 3 is a schematic diagram of a result of imaging a sample to be measured according to an embodiment of the present invention, referring to fig. 3, when incident light reaches the surface of the sample to be measured 104, in addition to reflection and scattering caused by surface treatment, there is reflection caused by a lower film layer structure through the surface, because a reflection grating is formed by a regular pattern structure of the film layer, the reflection light forms multi-level color diffraction fringes, mixes surface scattering light, generates a halo, when the brightness of the light reaching the surface is higher, the brightness of light emitted from the light outlet is higher, and further the generated halo is more obvious, that is, an image formed by the sample to be measured 104 on the light outlet 1011 (where blackening treatment is performed around the light outlet) and the environment around the light outlet 1011 includes a main image 301 and a halo 302 corresponding to the light outlet 1011, and an environment image 303 corresponding to the environment, taking the light outlet 1011 as a rectangle as an example, the main image 301 is also a rectangle, the halo 302 comprises four parts which respectively correspond to four sides of the main image 301, and the brightness of each part of the halo 302 is gradually reduced along the direction far away from the main image 301; fig. 4 is a schematic diagram of a first image according to an embodiment of the present invention, referring to fig. 4, the first image includes a halo region 3021 corresponding to a partial halo and an environment region 3031 corresponding to a partial environment image, because the halo 302 exists, the boundary between the luminance of the halo 302 and the main image 301 is blurred, so that the area, the contour, and the like of the main image 301 are difficult to be directly determined, and the main image 301 and the halo 302 are difficult to be divided, but because the area, the shape, and the like of the main image 301 and the standard image are the same, the area of the standard region 201 can be used as the area of the main image 301, the shape of the standard region 201 is used as the shape of the main image 301, and the imaging of the second image and the sample to be measured are compared, so that the halo region 3021 and the environment region 3031 in the first image (the halo region 3021 and the environment region 3031 can also be obtained by other means, which will be described in detail in the following embodiments) are obtained, then, the color coordinates of each point (such as each pixel point) of the halo region 3021 are calculated, and comparing with the color coordinates of the reference points in the environment area 3031, obtaining a halo area index according to a first preset formula, for example, counting the ratio of the area of a point forming area (for example, the number of pixels of the type can be counted) in which the color coordinates in the halo area have a larger difference with the color coordinates of the reference points to the area of the standard area (for example, the total number of pixels in the standard area can be counted) as a halo quantization value, wherein the halo area index is related to the color coordinates of each point in the halo area, so that the halo area index can accurately reflect the severity of the halo, the reference point can be any point in the environment area 3031, preferably the center point of the environment area 3031, when the environment area contains a plurality of independent parts (for example, two parts are contained in fig. 4), the center point of any one of the parts can be selected as the reference point, if the sample to be detected has no halo, the color coordinates of each point in the halo area are closer to the color coordinates of the reference points in the environment area, and when the halo exists, the difference is larger, and a reference point is selected from the environment area, so that the obtained halo area index is more representative. The halo brightness ratio of the sample to be measured can also be calculated according to the brightness of each point of the halo region, the brightness of the irradiation light source to be measured and a second preset formula (which will be described in detail below).
According to the technical scheme of the embodiment, the adopted halo quantification system comprises a measured irradiation light source, a reference standard mirror reflection plate, an optical probe and a processing unit; the measured irradiation light source is provided with a light outlet with a preset shape; the reference standard mirror reflection plate is used for imaging the light outlet to form a standard image; the sample to be detected can image the light outlet to form a main image and a halo positioned around the main image, and image the environment around the light outlet to form an environment image; the optical probe is used for acquiring a first image and a second image, wherein the first image at least comprises a halo area corresponding to part of halos and an environmental area corresponding to at least part of environmental images, and the second image comprises a standard area corresponding to the standard images; the processing unit is used for acquiring the first image and the second image, calculating the area of the standard area, calculating the color coordinates of each point in the halo area and calculating the color coordinates of the reference points in the environment area; the processing unit is also used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the processing unit is used for acquiring the brightness of the first image and the brightness of the measured irradiation light source and calculating the brightness of each point of the halo area, and the processing unit is also used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula. The invention can quantize the halo in a simple mode, and the halo quantized value is related to the color coordinates of each point in the halo, the color coordinates of the reference point, the area of the standard image and the like, namely the halo quantized value can accurately reflect the severity of the halo.
Optionally, the first preset formula includes:
wherein, Δ LiIs the difference value of the black and white value of the color coordinate of the ith point in the halo area and the black and white value of the color coordinate of the reference point,Δaiis the difference between the red-green value in the color coordinate of the ith point in the halo region and the red-green value in the color coordinate of the reference point, delta biThe difference value of a yellow-blue value in the color coordinate of the ith point in the halo area and a yellow-blue value in the color coordinate of the reference point is shown, i is more than or equal to 1 and less than or equal to N, and N is the number of midpoints in the halo area; JNAD is S1/S; wherein S1 is the area of a point forming area with delta E larger than 1 in the halo area, S is the area of a standard area, and JNAD is the halo area index; the second preset formula is that Lcr is L1/L2, where L1 is the maximum value of the luminance values in the color coordinates of each point in the halo region, L2 is the luminance of the measured irradiation light source, and Lcr is the halo luminance ratio.
Specifically,. DELTA.EiExpressing the difference between each point (each pixel point) in the halo region and the color coordinate of the reference point, wherein the color coordinate can be obtained by comparing with the color coordinate of the D65 standard light source, Delta EiThe larger the difference between the color coordinate representing the pixel point and the color coordinate of the reference point is, namely the halo is stronger at the point, and the delta E isiThe smaller the difference between the color coordinate of the pixel and the color coordinate of the reference point is, that is, the halo is weaker at the point, and the severity of the halo is related to the area of the main image and the emergent light intensity of the measured illumination light source, in this embodiment, a halo area index JNAD may be used as a ratio between an area formed by a point in the halo region having a larger difference between the color coordinates of the halo region and the reference point and an area of the standard region (for example, a ratio between a point in the halo region having a larger difference between the color coordinates of the halo region and the reference point and a number of pixels in the standard region, or a ratio between an area surrounded by a point in the halo region having a larger difference between the color coordinates of the reference point and the area of the standard region), the larger JNAD indicates that the halo is more serious, and the smaller JNAD indicates that the halo is weaker. Alternatively, the relationship between the halo and the measured irradiation light source is represented by the halo luminance ratio Lcr, and if Lcr is larger, the halo is more serious, and if Lcr is smaller, the halo is weaker. In the embodiment of the embodiment, the adopted preset formulas are simple, but the severity of the halation can be accurately reflected, the calculated amount is small, and the implementation is easy.
Optionally, fig. 5 is a top view of fig. 1, and in conjunction with fig. 1 and fig. 5, the halo quantization system further includes: the light shielding plate 105, wherein the light shielding plate 105 comprises an opening 1051, and the opening 1051 is used for arranging the sample 104 to be tested; the optical probe 103 is configured to acquire a third image when the light shielding plate is at the first position, where the third image includes a main image area corresponding to the main image, a halo area corresponding to the halo, and a light shielding area corresponding to the light shielding plate; the optical probe is further used for acquiring an image of the shading plate moving a preset distance D along the first direction as a first image, wherein D is F + G/2, F is the distance between the center of the main image area in the third image and the shading area in the first direction, and G is the width of the standard area in the second image along the first direction.
Specifically, as shown in fig. 5, the light shielding plate 104 in fig. 5 is located at the first position, the size of the opening 1051 may be greater than or equal to the size of the display area of the sample 104 to be detected, and the light shielding plate is, for example, black, and the image formed in the optical probe 103 is black, which is easier to identify; fig. 6 is a schematic diagram of a third image, and with reference to fig. 5 and 6, a reference standard specular reflection plate may be disposed on the light shielding plate 105, where the third image includes the second image, the image 1051 of the light shielding plate, and the image of the sample to be measured, the width G of the standard region along the first direction Y is obtained from the third image by using an image algorithm or measurement, and the distance F between the center of the main image region 3011 and the light shielding region along the first direction Y is obtained, since the standard region 2011 is identical to the main image region 3011, D is the distance Y along the first direction, the sum of the width of the main image region 3011 and the width of a part (upper part in fig. 6) of the halo region 3021, after the light shielding plate moves the distance D along the opposite direction (i.e., -Y) of the first direction Y, as shown in fig. 7, fig. 7 is a schematic diagram of an image collected by the optical probe after the light shielding plate moves the distance D, and the light shielding plate just covers the main image region 3011, only the halo region 3021 and the environmental region 3031 in the lower half portion of fig. 6 are exposed, so that the main image region and the halo region are accurately cut, which is beneficial for the optical probe to accurately acquire the first image, and further obtain a more accurate halo quantization value. The sample to be detected can be placed on the black platform, so that after the light shielding plate is moved, the part of the sample to be detected, which is exposed out of the opening part, is also black, and the accuracy of the first image segmentation is further improved. The meaning that the light shielding plate just covers the main image area 3011 is as follows: the light shielding plate shields the light reflected to the optical probe from the main image area, but does not shield the light incident to the sample to be measured from the measured irradiation light source, so that the halo still exists. It should be noted that the first direction Y is only an example, the obtained first image is a halo of the sample to be measured in the first direction Y, that is, the halo quantization value is a halo of the sample to be measured in the first direction Y, the first direction Y may be any direction, and the halo quantization values of the sample to be measured in multiple directions are obtained through multiple measurements.
Optionally, with continued reference to fig. 1, the halo quantization system further comprises: a semi-integrating sphere 106, a guide rail 107, an illuminometer 108, an irradiation light source 109 and an irradiation light source baffle 110; the guide rail 107 is arranged on the inner wall of the semi-integrating sphere 106, the optical probe 103 and the to-be-measured irradiation light source 101 are arranged on the guide rail 107, the to-be-measured sample 105 is arranged at the center of the semi-integrating sphere 106, the irradiation light source 109 and the irradiation light source baffle 110 are arranged inside the semi-integrating sphere 106, and the illuminometer 108 is used for detecting the ambient light illuminance inside the semi-integrating sphere 106.
Specifically, the halo quantization system can test halos generated by the irradiation light source to be tested on the sample to be tested under various ambient lights, at this time, the half integrating sphere 106, the irradiation light source 109 and the irradiation light source baffle 110 can be arranged to simulate real ambient lights, the irradiation light source baffle 110 and the half integrating sphere 106 are made of the same diffuse reflection material, and the illuminance of the ambient lights in the half integrating sphere can be detected through an illuminometer to enable the ambient lights to meet requirements, so that the quantification of the halos under various ambient lights is facilitated. Simultaneously, the sample that awaits measuring sets up in the center of half integrating sphere, and the light path is designed easily, and the light that is sent by surveyed irradiation light source reflects the light path to optical probe easily and realizes promptly through the sample that awaits measuring, and optical probe and surveyed irradiation light source can independent removal to be for be the contained angle of predetermineeing between the emergent light of being surveyed irradiation light source and the sample that awaits measuring, thereby conveniently be to the quantification of halation under the multiple angle illumination.
Alternatively, with continued reference to fig. 1 and 5, the reference standard specular reflection plate 102 is disposed on the surface of the mask 105 adjacent to the opening 104, and the reference standard specular reflection plate 102 is not coplanar with the sample to be measured. By the arrangement, the image information acquired by the optical probe 103 can be ensured to include both the second image and the imaging result image of the sample to be detected, that is, the position of the optical probe 103 can be ensured to observe the image of the light outlet in the reference standard specular reflection plate 102 and the sample to be detected 104; in other embodiments, the reference standard specular reflection plate may be placed at the center of the half-integrating sphere, an optical probe is used to collect a second image, the sample to be measured is placed at the center of the half-integrating sphere, and the first image is obtained after the light shielding plate is located at the first position and moves by the distance D according to the first position.
Optionally, the preset shape of the light outlet is a rectangle. The shape of the main image area is consistent with that of the light outlet, the formed halo comprises four parts corresponding to four sides of the rectangle, and the distances D, F and G are calculated conveniently, so that the acquisition process of the halo quantization value is simplified.
Preferably, the size of the rectangular light outlet is such that the length and width of the standard region are less than 1/3 and less than 1/3 of the length and width of the display region of the sample to be tested, respectively. If the size of the rectangular light outlet is larger, the size of the standard area is also larger, and then the halo can be completely covered by the main image area on the sample to be detected, so that the halo cannot be quantized.
Fig. 8 is a flowchart of a halo quantization method according to an embodiment of the present invention, and referring to fig. 8, the halo quantization method is executed by a halo quantization system, and the halo quantization method includes:
step S501, an optical probe collects a first image and a second image;
step S502, the processing unit acquires the first image and the second image, calculates the area of the standard area, calculates the color coordinates of each point in the halo area and calculates the color coordinates of the reference point in the environment area; the processing unit is also used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the presence of a gas in the gas,
the processing unit is used for obtaining the brightness of the first image and the brightness of the measured irradiation light source, calculating the brightness of each point of the halo area, and calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula.
The specific working process of the halo quantization method in the embodiment of the present invention may refer to the description of the halo quantization system in the embodiment of the present invention, which is not repeated herein, the halo quantization method in the embodiment of the present invention is simple and efficient, the obtained halo quantization value can accurately reflect the severity of the halo, and the obtained halo quantization value has strong correlation with the severity of the halo.
The first preset formula includes:
wherein, Δ LiIs the difference between the black and white value in the color coordinate of the ith point in the halo region and the black and white value in the color coordinate of the reference point, Δ aiIs the difference between the red-green value in the color coordinate of the ith point in the halo region and the red-green value in the color coordinate of the reference point, delta biThe difference value of a yellow-blue value in the color coordinate of the ith point in the halo area and a yellow-blue value in the color coordinate of the reference point is shown, i is more than or equal to 1 and less than or equal to N, and N is the number of midpoints in the halo area; JNAD is S1/S; wherein S1 is the area of a point forming area with delta E larger than 1 in the halo area, S is the area of a standard area, and JNAD is the halo area index; the second preset formula is that Lcr is L1/L2, where L1 is the maximum value of the luminance values in the color coordinates of each point in the halo region, L2 is the luminance of the measured irradiation light source, and Lcr is the halo luminance ratio.
The larger JNAD indicates a more severe halo, and the smaller JNAD indicates a weaker halo. Alternatively, the relationship between the halo and the measured irradiation light source is represented by the halo luminance ratio Lcr, and if Lcr is larger, the halo is more serious, and if Lcr is smaller, the halo is weaker. In the embodiment of the embodiment, the adopted preset formulas are simple, but the severity of the halation can be accurately reflected, the calculated amount is small, and the implementation is easy.
Optionally, the system further comprises a light shielding plate, wherein the light shielding plate comprises an opening, and the opening is used for arranging the sample to be detected; the method further comprises the following steps:
acquiring a third image when the shading plate is at the first position, wherein the third image comprises a main image area corresponding to the main image, a halo area corresponding to the halo and a shading area corresponding to the shading plate;
moving the light shielding plate by a preset distance D along the direction opposite to the first direction, wherein D is F + G/2, F is the distance between the center of the main image area and the light shielding area in the third image in the first direction, and G is the width of the standard area in the second image along the first direction;
and acquiring an image of the shading plate moving a preset distance D along a first direction as the first image.
After the light shielding plate is moved by a distance D in the opposite direction of the first direction, the light shielding plate just covers the main image area, and only the halo area 3021 and the environmental area 3031 in the lower half portion in fig. 6 are exposed, so that the main image area and the halo area are accurately cut, the optical probe is facilitated to accurately acquire the first image, and a more accurate halo quantization value is obtained.
Optionally, the halo quantization system further comprises: the device comprises a semi-integrating sphere, a guide rail, an illuminometer, an irradiation light source and an irradiation light source baffle; the method further comprises the following steps: moving the measured irradiation light source and the optical probe so that emergent light of the measured irradiation light source and the sphere center of the semi-integrating sphere form a preset included angle;
calculating the halo area index and/or halo brightness ratio of the sample to be detected under a preset included angle; and/or the presence of a gas in the gas,
the method further comprises the following steps: adjusting the brightness of the illuminating light source to make the ambient light brightness in the half-integrating sphere be a preset brightness value;
and calculating the halo area index and/or halo brightness ratio of the sample to be detected under the preset brightness value.
The halo quantification system can be used for testing halos generated by the irradiation light source to be tested on the sample to be tested under various environmental lights, the half integrating sphere 106, the irradiation light source 109 and the irradiation light source baffle 110 can be arranged to simulate real environmental lights, and the illuminance of the environmental lights in the half integrating sphere can be detected through the illuminometer, so that the environmental lights meet the requirements, and the quantification of the halos under various environmental lights is facilitated. And the optical probe and the measured irradiation light source can independently move, so that a preset included angle is formed between emergent light of the measured irradiation light source and a sample to be measured, and the halo can be conveniently quantized under illumination of various angles (such as 0-85 degrees).
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. A halo quantification system for quantifying halo of a sample under test, the system comprising:
the device comprises a measured irradiation light source, a reference standard mirror reflection plate, an optical probe and a processing unit;
the measured irradiation light source is provided with a light outlet with a preset shape; the reference standard specular reflection plate is used for imaging the light outlet to form a standard image;
the sample to be detected can image the light outlet to form a main image and a halo positioned around the main image, and can image the environment around the light outlet to form an environment image;
the optical probe is used for acquiring a first image and a second image, wherein the first image at least comprises a halo area corresponding to part of the halo and an environmental area corresponding to at least part of the environmental image, and the second image comprises a standard area corresponding to the standard image;
the processing unit is used for acquiring the first image and the second image, calculating the area of the standard area, calculating color coordinates of each point in the halo area and calculating color coordinates of the reference point in the environment area; the processing unit is further used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the presence of a gas in the gas,
the processing unit is used for obtaining the brightness of the first image and the brightness of the measured irradiation light source and calculating the brightness of each point of the halo area, and the processing unit is further used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula.
2. The system of claim 1,
when the processing unit is configured to calculate the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area, and a first preset formula, the first preset formula includes:
JNAD is S1/S; wherein S1 is the area of a dot formation region where Δ E is greater than 1 in the halo region, S is the area of the standard region, and JNAD is the halo area index;
when the processing unit is used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point in the halo area, the brightness of the irradiation light source to be measured and a second preset formula, the second preset formula is L1/L2, wherein L1 is the maximum value of the brightness value of each point in the halo area, L2 is the brightness of the irradiation light source to be measured, and Lcr is the halo brightness ratio.
3. The system of claim 1,
the system also comprises a light shielding plate, wherein the light shielding plate comprises an opening, and the opening is used for arranging the sample to be detected;
the optical probe is used for acquiring a third image when the light shielding plate is at a first position, wherein the third image comprises a main image area corresponding to the main image, a halo area corresponding to the halo and a light shielding area corresponding to the light shielding plate;
the optical probe is further configured to acquire an image of the light shielding plate moving a preset distance D in a direction opposite to the first direction as the first image, where D is F + G/2, F is a distance between the center of the main image area in the third image and the light shielding area in the first direction, and G is a width of the standard area in the second image along the first direction.
4. The system of claim 1, further comprising: the device comprises a semi-integrating sphere, a guide rail, an illuminometer, an irradiation light source and an irradiation light source baffle;
the guide rail is arranged on the inner wall of the semi-integrating sphere, the optical probe and the to-be-detected irradiation light source are arranged on the guide rail, the to-be-detected sample is arranged at the sphere center of the semi-integrating sphere, the irradiation light source and the irradiation light source baffle are arranged inside the semi-integrating sphere, and the illuminometer is used for detecting the ambient illuminance in the semi-integrating sphere.
5. The system of claim 3, wherein the reference standard specular reflection plate is disposed on the surface of the light shielding plate adjacent to the opening, and the reference standard specular reflection plate is not coplanar with the sample to be tested.
6. The system of claim 1, wherein the predetermined shape of the light outlet is rectangular;
preferably, the size of the rectangular light outlet is such that the length and the width of the standard region are respectively less than 1/3 and 1/3 of the length and the width of the sample display region to be detected.
7. A halo quantization method performed by the halo quantization system of any one of claims 1-6,
the method comprises the following steps:
the optical probe acquires the first image and the second image;
the processing unit acquires the first image and the second image, calculates the area of the standard area, calculates the color coordinates of each point in the halo area and calculates the color coordinates of the reference point in the environment area; the processing unit is further used for calculating the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area and a first preset formula; and/or the presence of a gas in the gas,
the processing unit is used for obtaining the brightness of the first image and the brightness of the measured irradiation light source, calculating the brightness of each point of the halo area, and calculating the halo brightness ratio of the sample to be measured according to the brightness of each point of the halo area, the brightness of the measured irradiation light source and a second preset formula.
8. The method of claim 7,
when the processing unit is configured to calculate the halo area index of the sample to be measured according to the color coordinates of each point in the halo area, the color coordinates of the reference point, the area of the standard area, and a first preset formula, the first preset formula includes:
JNAD is S1/S; wherein S1 is the area of a dot formation region where Δ E is greater than 1 in the halo region, S is the area of the standard region, and JNAD is the halo area index;
when the processing unit is used for calculating the halo brightness ratio of the sample to be measured according to the brightness of each point in the halo area, the brightness of the irradiation light source to be measured and a second preset formula, the second preset formula is L1/L2, wherein L1 is the maximum value of the brightness value of each point in the halo area, L2 is the brightness of the irradiation light source to be measured, and Lcr is the halo brightness ratio.
9. The method of claim 7, wherein the system further comprises a shutter plate comprising an opening for positioning the sample to be tested;
the method further comprises the following steps:
acquiring a third image when the shading plate is at a first position, wherein the third image comprises a main image area corresponding to the main image, a halo area corresponding to the halo and a shading area corresponding to the shading plate;
moving the light shielding plate by a preset distance D along the direction opposite to the first direction, wherein D is F + G/2, F is the distance between the center of the main image area in the third image and the light shielding area in the first direction, and G is the width of the standard area in the second image along the first direction;
and acquiring an image of the shading plate moving a preset distance D along a first direction as the first image.
10. The method of claim 7, wherein the system further comprises: the device comprises a semi-integrating sphere, a guide rail, an illuminometer, an irradiation light source and an irradiation light source baffle; the guide rail is arranged on the inner wall of the semi-integrating sphere, the optical probe and the to-be-detected irradiation light source are arranged on the guide rail, the to-be-detected sample is arranged at the sphere center of the semi-integrating sphere, the irradiation light source and the irradiation light source baffle are arranged inside the semi-integrating sphere, and the illuminometer is used for detecting the ambient illuminance in the semi-integrating sphere;
the method further comprises the following steps: moving the measured irradiation light source and the optical probe so that emergent light of the measured irradiation light source and the sphere center of the semi-integrating sphere form a preset included angle;
and calculating the area index and/or brightness ratio of the halo of the sample to be detected under the preset included angle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010747140.0A CN114061907A (en) | 2020-07-29 | 2020-07-29 | Halo quantization system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010747140.0A CN114061907A (en) | 2020-07-29 | 2020-07-29 | Halo quantization system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114061907A true CN114061907A (en) | 2022-02-18 |
Family
ID=80226874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010747140.0A Pending CN114061907A (en) | 2020-07-29 | 2020-07-29 | Halo quantization system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114061907A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117405363A (en) * | 2023-12-14 | 2024-01-16 | 东南大学 | Halation characterization method and system of Mini-LED partition backlight display |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000258614A (en) * | 1999-03-10 | 2000-09-22 | Dainippon Printing Co Ltd | Antidazzle film and method for quantitative evaluation of antidazzle property |
| US6577756B1 (en) * | 1999-02-19 | 2003-06-10 | Dai Nippon Printing Co., Ltd. | Method and apparatus for quantitatively evaluating scintillation, antiglare film and method of producing the same |
| JP2004333291A (en) * | 2003-05-07 | 2004-11-25 | Fuji Photo Film Co Ltd | Method and apparatus for evaluating reflection property of antireflection material |
| JP2008170344A (en) * | 2007-01-12 | 2008-07-24 | Fujifilm Corp | Evaluating method and measuring device of glareproof |
| CN101952709A (en) * | 2007-11-15 | 2011-01-19 | 爱克斯崔里斯科技有限公司 | Particle detection |
| US20130194169A1 (en) * | 2010-10-06 | 2013-08-01 | Eizo Nanao Corporation | Screen light computation device or method |
| CN104296971A (en) * | 2014-10-22 | 2015-01-21 | 中国电子科技集团公司第四十一研究所 | Display contrast calibration method and device under high luminance environment |
| TW201508256A (en) * | 2013-08-20 | 2015-03-01 | Sumika Technology Co Ltd | System and method of measuring antiglare degree |
| CN106198399A (en) * | 2016-08-17 | 2016-12-07 | 远方谱色科技有限公司 | A kind of intelligibility measure device |
| CN111239164A (en) * | 2020-04-02 | 2020-06-05 | 上海御微半导体技术有限公司 | Defect detection device and method thereof |
-
2020
- 2020-07-29 CN CN202010747140.0A patent/CN114061907A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6577756B1 (en) * | 1999-02-19 | 2003-06-10 | Dai Nippon Printing Co., Ltd. | Method and apparatus for quantitatively evaluating scintillation, antiglare film and method of producing the same |
| JP2000258614A (en) * | 1999-03-10 | 2000-09-22 | Dainippon Printing Co Ltd | Antidazzle film and method for quantitative evaluation of antidazzle property |
| JP2004333291A (en) * | 2003-05-07 | 2004-11-25 | Fuji Photo Film Co Ltd | Method and apparatus for evaluating reflection property of antireflection material |
| JP2008170344A (en) * | 2007-01-12 | 2008-07-24 | Fujifilm Corp | Evaluating method and measuring device of glareproof |
| CN101952709A (en) * | 2007-11-15 | 2011-01-19 | 爱克斯崔里斯科技有限公司 | Particle detection |
| US20130194169A1 (en) * | 2010-10-06 | 2013-08-01 | Eizo Nanao Corporation | Screen light computation device or method |
| TW201508256A (en) * | 2013-08-20 | 2015-03-01 | Sumika Technology Co Ltd | System and method of measuring antiglare degree |
| CN104296971A (en) * | 2014-10-22 | 2015-01-21 | 中国电子科技集团公司第四十一研究所 | Display contrast calibration method and device under high luminance environment |
| CN106198399A (en) * | 2016-08-17 | 2016-12-07 | 远方谱色科技有限公司 | A kind of intelligibility measure device |
| CN111239164A (en) * | 2020-04-02 | 2020-06-05 | 上海御微半导体技术有限公司 | Defect detection device and method thereof |
Non-Patent Citations (3)
| Title |
|---|
| PIPER, JOERGCLIN MEDUNA, DEPT INTERNAL MED: "Variable Phase Dark-Field Contrast-A Variant Illumination Technique for Improved Visualizations of Transparent Specimens", MICROSCOPY AND MICROANALYSIS, vol. 18, no. 2, 30 April 2012 (2012-04-30), pages 343 - 352, XP001574243, DOI: 10.1017/S1431927612000153 * |
| 张敏: "基于图像处理的自聚焦透镜端面质量检测研究", 中国优秀硕士学位论文全文数据库 (工程科技Ⅱ辑), no. 2, 15 February 2019 (2019-02-15), pages 030 - 35 * |
| 杨侦: "玻璃幕墙建筑反射眩光防控设计策略研究", 中国优秀硕士学位论文全文数据库 (工程科技Ⅱ辑), no. 5, 15 May 2018 (2018-05-15), pages 038 - 71 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117405363A (en) * | 2023-12-14 | 2024-01-16 | 东南大学 | Halation characterization method and system of Mini-LED partition backlight display |
| CN117405363B (en) * | 2023-12-14 | 2024-03-01 | 东南大学 | Halation characterization method and system of Mini-LED partition backlight display |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7215807B2 (en) | Nondestructive inspection method and apparatus | |
| CN108027328A (en) | The color measuring of jewel | |
| US8184294B2 (en) | Apparatus and method for measuring haze of sheet materials or other materials | |
| US6975391B1 (en) | Method and apparatus for non-destructive testing | |
| CN113281343B (en) | System and method for detecting defects of multilayer transparent material | |
| JP2009520980A (en) | Optical measuring device | |
| JPH11211673A (en) | Apparatus and method for evaluation of surface property | |
| KR20050110005A (en) | Detection of macro-defects using micro-inspection inputs | |
| CN114061907A (en) | Halo quantization system and method | |
| CN112833812B (en) | Measuring instrument for testing a sample and method for determining a height map of a sample | |
| KR20020032766A (en) | Three-dimensional Visual Inspection Method of Semiconductor Packages and Apparatus using Single Camera | |
| JP2003329612A (en) | Test method of object to be tested | |
| US6515293B1 (en) | Method and apparatus for detecting thickness of thin layer formed on a wafer | |
| EP3410101B1 (en) | Evaluation device and recording medium storing evaluation program | |
| US6947150B2 (en) | Method and apparatus for determining out-of-plane defects in a paper sample | |
| KR100983877B1 (en) | System and method for measuring reflectance of an object | |
| KR20030063428A (en) | Method for determining and evaluating defects in a sample surface | |
| KR101041095B1 (en) | Yolk measurnig method | |
| CN114663341A (en) | Quantitative detection method for glare defect of optical lens | |
| CN112839221A (en) | Quantification method and quantification device for definition of display equipment under ambient light | |
| KR101269128B1 (en) | Surface roughness measurement apparatus and method having intermediate view generator | |
| JP5479345B2 (en) | Equipment for observing the surface of a sample | |
| Chen et al. | Image profile area calculation based on circular sample measurement calibration | |
| CN111316090A (en) | Microscopic defect detection system and method for transparent or semitransparent material | |
| JPH10115514A (en) | Method and apparatus for inspection of surface smoothness |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |