CN114048084A - Method and device for generating test case schema of schematic diagram and storage medium - Google Patents
Method and device for generating test case schema of schematic diagram and storage medium Download PDFInfo
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- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
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Abstract
The invention belongs to the technical field of hardware testing, and discloses a method and a device for generating a test case schema of a schematic diagram and a storage medium, wherein the method comprises the following steps: obtaining mark devices of different modules in a schematic diagram, wherein the mark devices comprise bit numbers and values; the bit number is used for identifying the mark device, and the value is used for searching in a test case library; the flag device does not establish a connection with the device; searching a special test case, a functional test case and a general test case of each module in a test case library according to the obtained value of the marking device of each module; and generating a test case outline according to the special test case, the functional test case and the general test case of each module. Has the advantages that: according to the invention, the marking device is designed in different modules, the test case required by the module can be retrieved through the marking device, and the test outline is generated according to the retrieved test case, so that the generation efficiency and accuracy of the test case are greatly improved.
Description
Technical Field
The invention relates to the technical field of hardware testing, in particular to a method and a device for generating a test case schema of a schematic diagram and a storage medium.
Background
After the hardware engineer completes the design, the hardware engineer needs to design a test scheme according to the major problem and the minor problem, and the design of the test scheme needs to be checked by a designer or a test scheme is selected from a general design library.
A great deal of time is consumed in selecting the test scheme, and the manual inspection is easy to miss or mistake, so that repeated tests or invalid tests can be caused. Therefore, a new method for generating the test case schema is needed, so that the accuracy and the efficiency of generating the test case schema are improved.
Disclosure of Invention
The purpose of the invention is: the method, the device and the storage medium for generating the test case schema are provided, and the accuracy and the efficiency of generating the test case schema are improved.
In order to achieve the above object, the present invention provides a method for generating a test case schema of a schematic diagram, comprising:
obtaining mark devices of different modules in a schematic diagram, wherein the mark devices comprise bit numbers and values; the bit number is used for identifying the mark device, and the value is used for searching in a test case library; the schematic diagram comprises a plurality of modules, each module comprises a plurality of devices and at least one mark device, and the mark devices are not connected with the devices;
searching a special test case, a functional test case and a general test case of each module in a test case library according to the obtained value of the marking device of each module;
and generating a test case outline according to the special test case, the functional test case and the general test case of each module.
Further, the obtaining of the mark devices of different modules in the schematic diagram specifically includes:
the method comprises the steps of obtaining the partition information of modules to determine the ranges of different modules in a schematic diagram, searching for a marker device which is not connected with a device in the range of each module, obtaining the bit number of the marker device, judging whether the bit number is stored in a preset marker device library, and confirming that the marker device is retrieved if the bit number is stored in the preset marker device library.
Further, the value of the flag device is a character string, the character string includes identifiers of different test cases, and the character string includes at least one identifier.
Further, the retrieving, in the test case library, the dedicated test case, the functional test case, and the general test case of each module according to the obtained value of the flag device of each module specifically includes:
acquiring an identifier included in the value of each marker device, and associating test cases according to the identifier; if the identification is associated to the special test case, extracting the special test case to a test case outline; if the identification is associated to the functional test case, extracting the functional test case to a test case outline; and if the identification is associated to the universal test case, extracting the universal test case to the test case outline.
Further, the generating of the test case schema according to the dedicated test case, the functional test case and the general test case of each module specifically includes:
and generating a test unit from all kinds of test cases included in each module, and extracting the test cases from each test unit according to the permutation and combination to form a test outline.
The invention also discloses a device for generating the test case outline of the schematic diagram, which comprises a marker device acquisition module, a test case search module and a test case outline generation module;
the device comprises a marking device acquisition module, a marking device acquisition module and a marking device analysis module, wherein the marking device acquisition module is used for acquiring marking devices of different modules in a schematic diagram, and the marking devices comprise bit numbers and values; the bit number is used for identifying the mark device, and the value is used for searching in a test case library; the schematic diagram comprises a plurality of modules, each module comprises a plurality of devices and at least one mark device, and the mark devices are not connected with the devices;
the test case searching module is used for searching the special test case, the functional test case and the general test case of each module in the test case library according to the obtained value of the marking device of each module;
and the test case outline generating module is used for generating the test case outline according to the special test case, the functional test case and the general test case of each module.
Further, the obtaining of the mark devices of different modules in the schematic diagram specifically includes:
the method comprises the steps of obtaining the partition information of modules to determine the ranges of different modules in a schematic diagram, searching for a marker device which is not connected with a device in the range of each module, obtaining the bit number of the marker device, judging whether the bit number is stored in a preset marker device library, and confirming that the marker device is retrieved if the bit number is stored in the preset marker device library.
Further, the value of the flag device is a character string, the character string includes identifiers of different test cases, and the character string includes at least one identifier.
Further, the retrieving, in the test case library, the dedicated test case, the functional test case, and the general test case of each module according to the obtained value of the flag device of each module specifically includes:
acquiring an identifier included in the value of each marker device, and associating test cases according to the identifier; if the identification is associated to the special test case, extracting the special test case to a test case outline; if the identification is associated to the functional test case, extracting the functional test case to a test case outline; and if the identification is associated to the universal test case, extracting the universal test case to the test case outline.
The invention also discloses a computer readable storage medium, which comprises a stored computer program, wherein when the computer program runs, the device where the computer readable storage medium is located is controlled to execute the method for generating the test case schema of the schematic diagram.
Compared with the prior art, the method, the device and the storage medium for generating the test case schema of the schematic diagram have the advantages that: according to the invention, the marking device is designed in different modules, the test case required by the module can be retrieved through the marking device, and the test outline is generated according to the retrieved test case, so that the generation efficiency and accuracy of the test case are greatly improved.
Drawings
FIG. 1 is a schematic flow chart of a method for generating a test case schema according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a device for generating a test case schema according to the present invention.
Detailed Description
The following detailed description of embodiments of the present invention is provided in connection with the accompanying drawings and examples. The following examples are intended to illustrate the invention but are not intended to limit the scope of the invention.
Example 1:
as shown in fig. 1, the present invention discloses a method for generating a test case schema of a schematic diagram, which is applied to a test of hardware design and mainly includes the following steps:
step S1, obtaining the mark devices of different modules in the schematic diagram, wherein the mark devices comprise bit numbers and values; the bit number is used for identifying the mark device, and the value is used for searching in a test case library; the schematic diagram comprises a plurality of modules, each module comprises a plurality of devices and at least one mark device, and the mark devices are not connected with the devices;
step S2, searching the special test case, the functional test case and the general test case of each module in the test case library according to the obtained value of the marking device of each module;
and step S3, generating a test case outline according to the special test case, the functional test case and the general test case of each module.
In the schematic diagram design, a plurality of components are required to be placed, connection relations are established, then the components and the connection relations are exported to form netlist information, and the netlist information is imported into PCB design software for testing. However, during testing, the outline of the test case is often required to be manually set, and then the test is performed by using the outline of the test case. This process takes a lot of time for the staff, and the generated test outline is often limited by the experience and level of the staff and needs to be checked. This results in reduced testing efficiency and accuracy.
Therefore, in order to improve the prior art, the invention defines a marking device in a schematic diagram, the marking device and a general device have many properties, but different from the general device, the marking device has no electrical connection, no encapsulation and no appearance in the PCB design, and the properties of the marking device at least comprise the following information:
a) the bit number has the same function as the bit number attribute of a general device and is used as a unique mark of the device in a schematic diagram, such as B1 and B2;
b) values, string information, for retrieval from a test case library, such as DCDC-MPQ 2143.
Those skilled in the art will appreciate that the devices in the schematic diagram may be divided into different groups of devices (hereinafter referred to as modules) according to the implemented functions, and the different modules need to have special information for distinguishing them. It is thus possible to help set and find the position of the marker device based on this information.
Based on the above description, in step S1, the obtaining of the flag devices of different modules in the schematic diagram specifically includes:
the method comprises the steps of obtaining the partition information of modules to determine the ranges of different modules in a schematic diagram, searching for a marker device which is not connected with a device in the range of each module, obtaining the bit number of the marker device, judging whether the bit number is stored in a preset marker device library, and confirming that the marker device is retrieved if the bit number is stored in the preset marker device library.
In this embodiment, the value of the flag device is a character string, the character string includes identifiers of different test cases, and the character string includes at least one identifier.
In step S2, the retrieving, in the test case library, the dedicated test case, the functional test case, and the general test case of each module according to the obtained value of the flag device of each module specifically includes:
acquiring an identifier included in the value of each marker device, and associating test cases according to the identifier; if the identification is associated to the special test case, extracting the special test case to a test case outline; if the identification is associated to the functional test case, extracting the functional test case to a test case outline; and if the identification is associated to the universal test case, extracting the universal test case to the test case outline.
In this embodiment, the module test includes three test cases. Each string includes a plurality of identifiers. Such as string DCDC-MPQ2143, may be associated with a test case for MPQ 2143. The test case of MPQ2143 is a special test case. For example, the DCDC-MPQ2143 may be associated to a functional test case of the DCDC class. Also included are general test cases, such as placing a flag device, B3, with a value of EMC, which is then correlated to EMC testing.
A module can be used for placing a plurality of mark devices, and after verification of each obtained mark device is completed, test cases are extracted step by step according to the values of the mark devices.
In step S3, the generating a test case schema according to the dedicated test case, the functional test case, and the general test case of each module specifically includes:
and generating a test unit from all kinds of test cases included in each module, and extracting the test cases from each test unit according to the permutation and combination to form a test outline.
According to the invention, the marking device is designed in different modules, the test case required by the module can be retrieved through the marking device, and the test outline is generated according to the retrieved test case, so that the generation efficiency and accuracy of the test case are greatly improved.
Example 2:
the invention discloses a generating device of a test case outline of a schematic diagram, which comprises a marking device obtaining module 101, a test case searching module 102 and a test case outline generating module 103, wherein the marking device obtaining module is used for obtaining a marking device;
a marking device obtaining module 101, configured to obtain marking devices of different modules in a schematic diagram, where the marking devices include bit numbers and values; the bit number is used for identifying the mark device, and the value is used for searching in a test case library; the schematic diagram comprises a plurality of modules, each module comprises a plurality of devices and at least one mark device, and the mark devices are not connected with the devices;
the test case searching module 102 is configured to search the dedicated test case, the functional test case and the general test case of each module in the test case library according to the obtained value of the flag device of each module;
and the test case outline generating module 103 is used for generating a test case outline according to the special test case, the functional test case and the general test case of each module.
In this embodiment, the obtaining of the mark devices of different modules in the schematic diagram specifically includes:
the method comprises the steps of obtaining the partition information of modules to determine the ranges of different modules in a schematic diagram, searching for a marker device which is not connected with a device in the range of each module, obtaining the bit number of the marker device, judging whether the bit number is stored in a preset marker device library, and confirming that the marker device is retrieved if the bit number is stored in the preset marker device library.
In this embodiment, the value of the flag device is a character string, the character string includes identifiers of different test cases, and the character string includes at least one identifier.
In this embodiment, the retrieving, in the test case library, the dedicated test case, the functional test case, and the general test case of each module according to the obtained value of the flag device of each module specifically includes:
acquiring an identifier included in the value of each marker device, and associating test cases according to the identifier; if the identification is associated to the special test case, extracting the special test case to a test case outline; if the identification is associated to the functional test case, extracting the functional test case to a test case outline; and if the identification is associated to the universal test case, extracting the universal test case to the test case outline.
In this embodiment, the generating a test case schema according to the dedicated test case, the functional test case, and the general test case of each module specifically includes:
and generating a test unit from all kinds of test cases included in each module, and extracting the test cases from each test unit according to the permutation and combination to form a test outline.
Since the embodiment 2 is written based on the embodiment 1, the description of the embodiment 1 can be applied to the embodiment 2, and it can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working process of the apparatus described above may refer to the corresponding process in the foregoing method embodiment, and is not described herein again.
Example 3:
the invention also discloses a computer readable storage medium, which comprises a stored computer program, wherein when the computer program runs, the device where the computer readable storage medium is located is controlled to execute the method for generating the test case schema of the schematic diagram according to the embodiment.
To sum up, compared with the prior art, the method, the device and the storage medium for generating the test case schema of the schematic diagram have the following beneficial effects: according to the invention, the marking device is designed in different modules, the test case required by the module can be retrieved through the marking device, and the test outline is generated according to the retrieved test case, so that the generation efficiency and accuracy of the test case are greatly improved.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and substitutions can be made without departing from the technical principle of the present invention, and these modifications and substitutions should also be regarded as the protection scope of the present invention.
Claims (10)
1. A method for generating a test case schema of a schematic diagram is characterized by comprising the following steps:
obtaining mark devices of different modules in a schematic diagram, wherein the mark devices comprise bit numbers and values; the bit number is used for identifying the mark device, and the value is used for searching in a test case library; the schematic diagram comprises a plurality of modules, each module comprises a plurality of devices and at least one mark device, and the mark devices are not connected with the devices;
searching a special test case, a functional test case and a general test case of each module in a test case library according to the obtained value of the marking device of each module;
and generating a test case outline according to the special test case, the functional test case and the general test case of each module.
2. The method for generating the test case schema of the schematic diagram according to claim 1, wherein the obtaining of the flag devices of different modules in the schematic diagram specifically includes:
the method comprises the steps of obtaining the partition information of modules to determine the ranges of different modules in a schematic diagram, searching for a marker device which is not connected with a device in the range of each module, obtaining the bit number of the marker device, judging whether the bit number is stored in a preset marker device library, and confirming that the marker device is retrieved if the bit number is stored in the preset marker device library.
3. The method according to claim 1, wherein the value of the flag device is a character string, the character string includes identifiers of different test cases, and the character string includes at least one identifier.
4. The method according to claim 3, wherein the method for generating the test case schema of the schematic diagram is characterized in that the method for retrieving the dedicated test case, the functional test case and the general test case of each module in the test case library according to the obtained value of the flag device of each module specifically comprises:
acquiring an identifier included in the value of each marker device, and associating test cases according to the identifier; if the identification is associated to the special test case, extracting the special test case to a test case outline; if the identification is associated to the functional test case, extracting the functional test case to a test case outline; and if the identification is associated to the universal test case, extracting the universal test case to the test case outline.
5. The method for generating the test case schema of the schematic diagram according to claim 1, wherein the generating the test case schema according to the dedicated test case, the functional test case and the general test case of each module specifically comprises:
and generating a test unit from all kinds of test cases included in each module, and extracting the test cases from each test unit according to the permutation and combination to form a test outline.
6. A generating device of a test case outline of a schematic diagram is characterized by comprising a marking device obtaining module, a test case searching module and a test case outline generating module;
the device comprises a marking device acquisition module, a marking device acquisition module and a marking device analysis module, wherein the marking device acquisition module is used for acquiring marking devices of different modules in a schematic diagram, and the marking devices comprise bit numbers and values; the bit number is used for identifying the mark device, and the value is used for searching in a test case library; the schematic diagram comprises a plurality of modules, each module comprises a plurality of devices and at least one mark device, and the mark devices are not connected with the devices;
the test case searching module is used for searching the special test case, the functional test case and the general test case of each module in the test case library according to the obtained value of the marking device of each module;
and the test case outline generating module is used for generating the test case outline according to the special test case, the functional test case and the general test case of each module.
7. The apparatus for generating a test case schema of a schematic diagram according to claim 6, wherein the obtaining of the flag devices of different modules in the schematic diagram specifically includes:
the method comprises the steps of obtaining the partition information of modules to determine the ranges of different modules in a schematic diagram, searching for a marker device which is not connected with a device in the range of each module, obtaining the bit number of the marker device, judging whether the bit number is stored in a preset marker device library, and confirming that the marker device is retrieved if the bit number is stored in the preset marker device library.
8. The apparatus according to claim 6, wherein the flag device is a string, the string includes identifiers of different test cases, and the string includes at least one identifier.
9. The apparatus according to claim 6, wherein the device for generating the test case schema of the schematic diagram is configured to retrieve the dedicated test case, the functional test case, and the general test case of each module in the test case library according to the obtained value of the flag device of each module, and specifically includes:
acquiring an identifier included in the value of each marker device, and associating test cases according to the identifier; if the identification is associated to the special test case, extracting the special test case to a test case outline; if the identification is associated to the functional test case, extracting the functional test case to a test case outline; and if the identification is associated to the universal test case, extracting the universal test case to the test case outline.
10. A computer-readable storage medium, comprising a stored computer program, wherein when the computer program runs, the computer-readable storage medium controls a device to execute a method for generating a test case schema of a schematic diagram according to any one of claims 1 to 5.
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