CN114047439A - Test system and test method for probe function - Google Patents
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Abstract
The invention relates to the technical field of motor testing, in particular to a test system and a test method for probe functions, wherein the test system comprises a butt-dragging platform, a signal adapter plate and an upper computer; the counter-dragging platform comprises a coupler which is used for enabling the motion shafts of the tested motor and the dragged motor to be coaxially connected; the signal adapter plate is used for acquiring a Z phase difference signal of the tested motor, converting the Z phase difference signal into a switching signal and providing the switching signal for the tested motor as an external trigger signal of a probe function; the upper computer is used for performing hardware delay compensation on the signal adapter plate; the probe latch position error acquisition module is used for acquiring and comparing latch data of the tested motor to obtain a probe latch position error. The invention realizes the same point triggering of one circle of rotation of the motor, realizes the automatic test of the latching position error and improves the test efficiency.
Description
Technical Field
The invention relates to the technical field of motor testing, in particular to a system and a method for testing probe functions.
Background
The Probe function (Touch Probe) is a position latch function, when the motion unit meets the trigger condition (EXT1/EXT2/Z phase), the Probe function is triggered immediately, and the position of the motor encoder when the condition is triggered is latched. If the trigger position is at the same point of one rotation of the motor, the difference value between the probe positions latched twice in succession should theoretically be the number of pulses sent by one rotation of the motor encoder, but since a certain time is needed from the generation of an external trigger signal to the receiving of the signal by the motion unit and the latching operation of the motor position, a certain error must exist between the value latched by the probe function and the position value triggered by the actual signal, and the magnitude of the error is related to the running speed of the motor, the hardware performance and the internal software processing of the driver, so a test method is needed to measure the error.
Problems and disadvantages in the prior art:
1. at present, the test method mainly aims at the basic functions of the probe function, namely external signals are generated (signal rising edge or signal falling edge), a driver latch position is triggered, whether the value of latch position data 60BAh/60BBh/60BCh/60BDh changes or not is observed, the test method is completed through manual test, the test time is long, and the efficiency is low;
2. the trigger signal generation of the test method is random, and position triggering at the same point of one rotation of the motor cannot be realized, so that the error between the probe latch position and the actual real value cannot be evaluated.
Disclosure of Invention
The invention aims to provide a system and a method for testing the probe function, which can realize the trigger of the same point of one circle of rotation of a motor, realize the automatic test of the error of a latching position and improve the test efficiency.
In order to solve the technical problems, the technical scheme of the invention is as follows: a system for testing probe functionality, comprising:
the counter-dragging platform comprises a coupling for coaxially connecting the motion shafts of the tested motor and the dragged motor;
the signal adapter plate is used for acquiring a Z phase difference signal of the tested motor, converting the Z phase difference signal into a switching signal and providing the switching signal to the tested motor as an external trigger signal of a probe function;
the upper computer is used for performing hardware delay compensation on the signal adapter plate; the probe latch position error acquisition module is used for acquiring and comparing latch data of the tested motor to obtain a probe latch position error.
Preferably, the counter-dragging platform further comprises a base, and the base is used for mounting the motor to be tested and the motor to be dragged, so that the motion axes of the motor to be tested and the motor to be dragged are flush.
Preferably, the signal patch panel comprises a differential signal driving chip and a switch circuit; the differential signal driving chip is used for converting the Z phase difference signal of the tested motor into a single-ended signal and outputting the single-ended signal; the switch circuit is used for outputting a switch signal according to the single-ended signal to trigger the probe; the switching circuit adopts a triode, the base electrode of the triode is connected to the output end of the differential signal driving chip, the collector electrode of the triode is connected to a power supply through a pull-up resistor, and the emitting electrode of the triode is grounded; the output voltage of the triode collector is used as a switching signal.
Preferably, the differential signal driving chip adopts 26LS32 chip.
Preferably, the signal patch panel further comprises a power conversion module for converting the 24V voltage into 5V to supply power to the differential signal driving chip.
Preferably, the delay compensation method in the upper computer is as follows:
s1, acquiring the delay time Tdelay between the input signal and the output signal of the signal adapter plate;
s2, acquiring a speed value velocity of the motor when an external signal triggers the probe function;
s3, calculating the position deviation:
Position_offset＝Tdelay*N*velocity/60；
n represents the number of pulses of a single circle of a motor encoder; the positions latched by the probe functions are integers, and the position deviation is defined to be an integer type;
and S4, subtracting the position deviation from the position value latched by the probe function to realize the delay compensation of the hardware interface circuit.
A test method for probe functions adopts the test system, and comprises the following steps:
step 1: acquiring servo motion axis parameters;
step 2: setting functional parameters of the probe;
and step 3: judging whether the rotation speed of the servo motion shaft is stable or not;
and 4, step 4: and acquiring probe latching data to compare probe latching position errors.
Preferably, in step 1, TwinCAT software of california corporation is used to identify different types of servo motion axes and obtain servo motion axis parameters.
Preferably, in the step 3, the judging method is: collecting the actual speed value of the servo motion shaft of the tested motor, subtracting the actual speed value from the set speed target value, then taking the absolute value of the difference value through an internal function ABS, comparing the absolute value with 20rpm of turns per minute, if the absolute value is less than 20, accumulating the value of a variable uv _ counter, and when the value of the uv _ counter is more than or equal to 100, indicating that the rotation speed of the servo motion shaft is stable, otherwise, considering that the speed is not stable, and continuing to wait.
Preferably, in step 4, the acquisition of the latched data is performed by determining whether bit6, i.e. probe channel 1 state bit), and bit14, i.e. probe channel 2 state bit of the state word 60B9h have changed, because the latched data is a 32-bit signed integer and is greater than the number of pulses of one turn of the encoder, in order to obtain the position of one turn of the corresponding encoder, an MOD remainder function is adopted, as shown in the following formula:
temp_pos＝Pos_1MOD(MAIN.single_plus/factor) (1)
wherein temp _ Pos is a local variable, Pos _1 is latch data of a probe function, MAIN.Single _ plus is the number of pulses of one turn of an encoder, factor is a scale factor, and a numerical value in test is set to be 1; because the position of the servo motion axis may be negative, when the position is negative, the latched data range is controlled to be 0 to one pulse number of the encoder, so that on the basis of the formula (1), the pulse number of the encoder is accumulated by the variable temp _ pos, the variable temp _ pos with a negative value is assigned as shown in the following formula (2), and the variable temp _ pos with a positive value is obtained, so that the acquired data are all positive values:
temp_pos＝MAIN.single_plus/factor+temp_pos (2)
through circulation, the value of the local variable temp _ pos is written into the array with the number of 500, so that 500 groups of data are acquired, finally, the maximum value and the minimum value in 500 groups of data are obtained through an algorithm of circulation comparison, and the maximum error value is obtained by subtracting the two values.
The invention has the following beneficial effects:
the invention uses the dual-dragging platform to realize the function of triggering the probe at the same position, uses the signal adapter plate to convert the Z-phase signal differential signal of the dragged motor encoder into a 24V switching signal, and provides the 24V switching signal to the tested driver as the probe triggering signal of the probe to realize the same point triggering of one circle of rotation of the motor;
secondly, the upper computer is used for realizing the hardware delay compensation function of the signal adapter plate and the acquisition and processing of probe function data, the redundant algorithm is used for comparing the probe latching position errors, the error of the probe function is confirmed, and the test of the probe function is automatically completed;
and thirdly, the testing method is perfected, automatic testing is realized, and testing efficiency is improved.
Drawings
FIG. 1 is a schematic structural diagram of a test motor and a towed motor mounted on a towing platform according to an embodiment of the present invention;
FIG. 2 is a schematic circuit diagram of a signal patch panel according to an embodiment of the present invention;
FIG. 3 is a flowchart illustrating a testing method according to the present embodiment.
Reference numerals: 1. a platform is dragged; 101. a coupling; 102. a base; 2. a motor to be tested; 3. a towed motor; 4. a signal transfer board.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
Referring to fig. 1 and 2, the present invention is a probe function testing system, which includes a dual-dragging platform 1, a signal adapter board 4 and an upper computer.
The counter-dragging platform 1 comprises a coupler 101 and a base 102, wherein the base 102 is used for mounting the tested motor 2 and the dragged motor 3 to enable the motion shafts of the tested motor 2 and the dragged motor 3 to be flush, and the coupler 101 is used for enabling the motion shafts of the tested motor 2 and the dragged motor 3 to be coaxially connected; by using the counter-dragging platform 1, the axes of the dragged motor 3 and the tested motor 2 are aligned, as shown in the attached figure 1, so that the Z-phase signal of the dragged motor 3 can be accurately corresponding to a certain position of the tested motor 2, and the Z-phase signal can be ensured not to jump in the motor operation process because the motor encoder can generate a Z-phase signal every time the motor encoder rotates for one circle.
The signal adapter plate 4 is used for acquiring a Z phase difference signal of the tested motor 2, converting the Z phase difference signal into a switching signal and providing the switching signal to the tested motor 2 as an external trigger signal of a probe function; since the collected Z-phase signal of the towed motor 3 is a differential signal, and the external trigger signal of the probe function of the driver to be tested is a 24V switching signal, the signal adapter board 4 is required to realize the function of converting the differential signal into the 24V switching signal, as shown in fig. 2, the Z-phase differential signal is converted into a single-ended signal by using a 26LS32 chip, and then a triode is driven to generate the 24V switching signal.
The signal adapter plate 4 comprises a differential signal driving chip, a switch circuit and a power supply conversion module;
the differential signal driving chip is used for converting the Z phase difference signal of the tested motor 2 into a single-ended signal and outputting the single-ended signal; the differential signal driving chip adopts a 26LS32 chip; two input ends of the 26LS32 chip are respectively connected with a common-mode inductor L1 and an L2, the common-mode inductors L1 and L2 are used for suppressing common-mode noise, and a filter resistor R1 is connected between the two input ends of the 26LS32 chip for interference resistance.
The switch circuit is used for outputting a switch signal according to the single-ended signal to trigger the probe; the switching circuit adopts a triode J1, the base of a triode J1 is connected to the output end of the differential signal driving chip, the collector of the triode is connected to a 24V power supply through a pull-up resistor R3, and the emitter of the triode J1 is grounded; the output voltage of the collector of the triode is used as a 24V switching signal;
when the output signal of the differential signal driving chip is at a high level, the triode J1 is in a saturated state, and the output switching signal is triode saturation voltage drop, namely, a low level;
when the differential signal driving chip output signal is at low level, the transistor J1 is in off state, and the output switching signal is pulled up to the power supply 24V, i.e. high level, by the collector resistor R1.
In this embodiment, the switch circuit further includes a base current limiting resistor R2 and a filter capacitor C1, so that the base current limiting resistor R2 is connected to the base of the transistor and the output end of the 26LS32 chip to prevent the transistor from being damaged by excess base current caused by too high amplitude of the input voltage; the filter capacitor C1 is connected with the base of the triode and then grounded to play a role in filtering.
The power conversion module is used for converting the 24V voltage into 5V to supply power to the differential signal driving chip 26LS 32. In order to enable a tester to know that the adapter plate is electrified to work, the LED lamp display circuit is specially designed, and the LED lamp is lightened to inform the tester that the adapter plate 4 is electrified to work.
The upper computer is used for performing hardware delay compensation on the signal adapter plate 4; and the probe latch position error is obtained by acquiring and comparing the latch data of the tested motor 2.
Because the signal adapter plate 4 is used to generate signal delay, the delay is compensated through software design; the delay compensation method in the upper computer comprises the following steps:
s1, the upper computer collects the delay time Tdelay between the input signal and the output signal of the signal adapter plate 4 through an oscilloscope;
s2, under the condition that the number N of single-circle pulses of a motor encoder is known, the upper computer collects a speed value velocity of the motor when an external signal triggers a probe function;
s3, calculating the position deviation:
Position_offset＝Tdelay*N*velocity/60；
since the speed unit of the motor is rpm (revolutions per minute), the speed needs to be divided by 60 in the formula, and in addition, since the positions latched by the probe functions are all integers, the position deviation needs to be defined as an integer type;
and S4, subtracting the position deviation from the position value latched by the probe function to realize the delay compensation of the hardware interface circuit.
The invention also provides a test method for testing the probe function by adopting the test system, the probe function is set on the upper computer interface, such as the enabling, single triggering or continuous triggering of the probe function, whether the external signal triggering is performed, the signal rising edge or falling edge and the like, the running speed of the tested motor can be directly set on the upper computer interface, so that the latch position deviation of the probe function at different rotating speeds can be tested, and the latch data of the position of the probe function triggering motor can be displayed on the interface.
The test method comprises the following steps:
step 1: acquiring servo motion axis parameters;
step 2: setting functional parameters of the probe;
and step 3: judging whether the rotation speed of the servo motion shaft is stable or not;
and 4, step 4: and acquiring probe latching data to compare probe latching position errors.
In step 1, functional blocks of upper computer software TwinCAT self-carrying of IOF _ DeviceReset, IOF _ GetDeviceNetId, IOF _ GetDeviceName, FB _ EcCoESdorRead and FB _ EcCoESDOWrite are respectively adopted for acquiring parameters of servo motion axes to automatically identify different types of servo motion axes, wherein the upper computer software is the existing technology in the market and uses TwinCAT of Beifu corporation; FB _ ADS _ Read _ Write functional blocks are designed through an EtherCAT slave station Service Data Object (SDO) reading functional block FB _ EcCoESdoread and a writing functional block FB _ EcCoESdorWrite, so that parameters such as a servo driver type, a motor type, an encoder type and the like can be conveniently Read; the IOF _ DeviceReset function block allows the resetting action of an IO device, and the IO device can be set as a field bus board card; the IOF _ GetDeviceNetId function block is used for reading AMSNetiD distributed to the IO device by a system manager of the upper computer so that a program can identify the specific IO device; and acquiring the name distributed to the IO equipment by the system manager of the upper computer by using the IOF _ GetDeviceName function block so as to judge whether the system manager is an EtherCAT slave station.
In the step 2, in the setting of the probe function parameters, the process data object PDO mapping is carried out on the probe function parameters of the EtherCAT slave station, and the parameters are set on the PLC of the upper computer to be associated with the parameters, so that the setting of the probe function parameters can be conveniently carried out, and the data latched by the probe function can be collected in real time.
In the step 3, on the function of judging the speed stability, the actual speed value of the servo shaft is collected and subtracted from the set speed target value, then the absolute value of the difference is obtained through an internal function ABS and compared with 20rpm (circles per minute), if the absolute value is less than 20, the value of the variable uv _ counter is accumulated, when the value of the uv _ counter is more than or equal to 100, the rotating speed of the servo moving shaft is stable, otherwise, the speed is considered to be unstable, and the waiting is continued.
In step 4, on the acquisition of the latched data of the probe, acquiring the latched data by judging whether bit6, namely the state bit of the probe channel 1, and bit14, namely the state bit of the probe channel 2 of the state word 60B9h are changed, wherein the latched data are signed integers of 32 bits and are far greater than the pulse number of one turn of the encoder, in order to obtain the position corresponding to one turn of the encoder, an MOD remainder function is adopted, and the following formula is shown:
temp_pos＝Pos_1 MOD(MAIN.single_plus/factor) (1)
wherein temp _ Pos is a local variable, Pos _1 is latch data of a probe function, MAIN.Single _ plus is the number of pulses of one turn of an encoder, factor is a scale factor, and a numerical value in test is set to be 1; because the position of the servo motion axis may be negative, when the position is negative, the latched data range is controlled to be 0 to one pulse number of the encoder, so that on the basis of the formula (1), the pulse number of the encoder is accumulated by the variable temp _ pos, the variable temp _ pos with a negative value is assigned as shown in the following formula (2), and the variable temp _ pos with a positive value is obtained, so that the acquired data are all positive values:
temp_pos＝MAIN.single_plus/factor+temp_pos (2)
through circulation, the value of the local variable temp _ pos is written into the array with the number of 500, so that 500 groups of data are acquired, finally, the maximum value and the minimum value in 500 groups of data are obtained through an algorithm of circulation comparison, and the maximum error value is obtained by subtracting the two values.
The invention realizes the same point triggering of one circle of rotation of the motor by using the Z-phase signal of the towed motor encoder as the probe signal of the motion unit through the towing platform and the signal adapter plate; secondly, compensation of probe function hardware delay and automation of testing are achieved by using an upper computer and a software platform, and probe position deviation under different rotating speeds and different trigger signals (rising edge or falling edge of EXT1/EXT 2) can be tested.
Before the probe function test is carried out by adopting the test system, firstly, as shown in figure 1, two motors are required to be fixed on a butt-towing platform, the shaft coupling of the two motors is used for connecting the shafts of the two motors together, wherein the towed motor only needs to connect an encoder cable to a towed servo driver, a power cable and the encoder cable of the tested motor are connected to the tested servo driver, then, according to figure 2, a plug on a signal adapter plate is respectively connected to an IO port of the towed servo driver and an IO port of the tested servo driver, finally, the servo driver is powered, and then, a 24V power supply is provided for the signal adapter plate. And respectively opening the corresponding upper computers, then switching the running state of the software engineering of the upper computer from a configuration state (config) to a running state (run), setting relevant parameters of the probe function on the upper computer, and then operating according to a software design flow, so that the test of the probe function can be automatically completed.
The parts not involved in the present invention are the same as or implemented using the prior art.
The foregoing is a more detailed description of the present invention that is presented in conjunction with specific embodiments, and specific implementations of the present invention are not to be considered as limited by these descriptions. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (10)
1. A system for testing probe functions, comprising: comprises that
The counter-dragging platform comprises a coupling for coaxially connecting the motion shafts of the tested motor and the dragged motor;
the signal adapter plate is used for acquiring a Z phase difference signal of the tested motor, converting the Z phase difference signal into a switching signal and providing the switching signal to the tested motor as an external trigger signal of a probe function;
the upper computer is used for performing hardware delay compensation on the signal adapter plate; the probe latch position error acquisition module is used for acquiring and comparing latch data of the tested motor to obtain a probe latch position error.
2. The probe function test system of claim 1, wherein: the counter-dragging platform further comprises a base, and the base is used for mounting the tested motor and the dragged motor to enable the motion shafts of the tested motor and the dragged motor to be parallel and level.
3. The probe function test system of claim 1, wherein: the signal adapter plate comprises a differential signal driving chip and a switch circuit; the differential signal driving chip is used for converting the Z phase difference signal of the tested motor into a single-ended signal and outputting the single-ended signal; the switch circuit is used for outputting a switch signal according to the single-ended signal to trigger the probe; the switching circuit adopts a triode, the base electrode of the triode is connected with the output end of the differential signal driving chip, the collector electrode of the triode is connected with a power supply through a pull-up resistor, and the emitting electrode of the triode is grounded; the output voltage of the triode collector is used as a switching signal.
4. The probe function test system of claim 3, wherein: the differential signal driving chip adopts a 26LS32 chip.
5. The probe function test system of claim 3, wherein: the signal adapter plate further comprises a power supply conversion module for converting the 24V voltage into 5V voltage to supply power to the differential signal driving chip.
6. The probe function test system of claim 1, wherein: the delay compensation method in the upper computer comprises the following steps:
s1, acquiring the delay time Tdelay between the input signal and the output signal of the signal adapter plate;
s2, acquiring a speed value velocity of the motor when an external signal triggers the probe function;
s3, calculating the position deviation:
Position_offset＝Tdelay*N*velocity/60；
n represents the number of pulses of a single circle of a motor encoder; the positions latched by the probe functions are integers, and the position deviation is defined to be an integer type;
and S4, subtracting the position deviation from the position value latched by the probe function to realize the delay compensation of the hardware interface circuit.
7. A method for testing the functions of a probe is characterized in that: the test system of any one of claims 1 to 6 is adopted, and the test method comprises the following steps:
step 1: acquiring servo motion axis parameters;
step 2: setting functional parameters of the probe;
and step 3: judging whether the rotation speed of the servo motion shaft is stable or not;
and 4, step 4: and acquiring probe latching data to compare probe latching position errors.
8. The method for testing the function of a probe according to claim 7, wherein: in the step 1, TwinCAT software of Beifu corporation is adopted to identify different types of servo motion axes, and servo motion axis parameters are obtained.
9. The method for testing the function of a probe according to claim 7, wherein: in the step 3, the judging method is as follows: collecting the actual speed value of the servo motion shaft of the tested motor, subtracting the actual speed value from the set speed target value, then taking the absolute value of the difference value through an internal function ABS, comparing the absolute value with 20rpm of turns per minute, if the absolute value is less than 20, accumulating the value of a variable uv _ counter, and when the value of the uv _ counter is more than or equal to 100, indicating that the rotation speed of the servo motion shaft is stable, otherwise, considering that the speed is not stable, and continuing to wait.
10. The method for testing the function of a probe according to claim 7, wherein: in step 4, the acquisition of the latched data is performed by judging whether the bit6, i.e. the state bit of the probe channel 1, and the bit14, i.e. the state bit of the probe channel 2, of the state word 60B9h are changed, because the latched data are 32-bit signed integers which are larger than the pulse number of one turn of the encoder, in order to obtain the position of one turn of the corresponding encoder, an MOD remainder function is adopted, and the following formula is shown:
temp_pos＝Pos_1 MOD(MAIN.single_plus/factor) (1)
wherein temp _ Pos is a local variable, Pos _1 is latch data of a probe function, MAIN.Single _ plus is the number of pulses of one turn of an encoder, factor is a scale factor, and a numerical value in test is set to be 1;
because the latched data range is controlled to be 0 to one pulse number of the encoder when the position of the servo motion axis is negative, on the basis of the formula (1), the pulse number of the encoder is accumulated by the variable temp _ pos, and the variable temp _ pos with a negative value is assigned as shown in the following formula (2), so that the variable temp _ pos with a positive value is obtained:
temp_pos＝MAIN.single_plus/factor+temp_pos (2)
through circulation, the value of the local variable temp _ pos is written into the array with the number of 500, so that 500 groups of data are acquired, finally, the maximum value and the minimum value in 500 groups of data are obtained through a circulation comparison algorithm, and the maximum error value is obtained by subtracting the two values.
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| CN116909932A (en) * | 2023-09-12 | 2023-10-20 | 吉孚汽车技术(苏州)有限公司 | Continuous integrated automatic software testing system and method based on VT system |
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| CN105699105A (en) * | 2016-01-29 | 2016-06-22 | 成都乐创自动化技术股份有限公司 | An ST test system and method for an alternating current servo system |
| CN106020059A (en) * | 2016-07-19 | 2016-10-12 | 珠海格力电器股份有限公司 | Code compensation method and apparatus and servo driver |
| CN107942788A (en) * | 2017-11-17 | 2018-04-20 | 深圳市雷赛软件技术有限公司 | Acquisition methods, device and the servo-driver of motor shaft position |
| CN208736981U (en) * | 2018-08-28 | 2019-04-12 | 西门子数控（南京）有限公司 | Motor performance test system |
| CN112803865A (en) * | 2020-12-31 | 2021-05-14 | 上海新时达机器人有限公司 | Position latching method, servo driver and storage medium |
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| CN116909932A (en) * | 2023-09-12 | 2023-10-20 | 吉孚汽车技术(苏州)有限公司 | Continuous integrated automatic software testing system and method based on VT system |
| CN116909932B (en) * | 2023-09-12 | 2023-12-05 | 吉孚汽车技术(苏州)有限公司 | Continuous integrated automatic software testing system and method based on VT system |
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