CN114004788A - Defect detection method, device, equipment and storage medium - Google Patents
Defect detection method, device, equipment and storage medium Download PDFInfo
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- CN114004788A CN114004788A CN202111115664.9A CN202111115664A CN114004788A CN 114004788 A CN114004788 A CN 114004788A CN 202111115664 A CN202111115664 A CN 202111115664A CN 114004788 A CN114004788 A CN 114004788A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/514—Depth or shape recovery from specularities
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10028—Range image; Depth image; 3D point clouds
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10048—Infrared image
Abstract
The application discloses a defect detection method, a defect detection device, equipment and a storage medium, wherein the depth information of an object to be detected can present the distance or the surface height of different positions of the object to be detected by acquiring the depth information of the object to be detected, and an acquired image of the object to be detected is acquired; the defect area and the non-defect area on the object to be detected may have different depths, the collected image is divided into a plurality of image partitions according to the depth information, and the plurality of image partitions correspond to different image depths; and determining the defect information of the object to be detected according to the area parameters of the image partitions, so that the defect of the object to be detected can be detected relatively quickly.
Description
Technical Field
The present application relates to the field of detection technologies, and in particular, to a method, an apparatus, a device, and a storage medium for detecting defects.
Background
With the development of the electronic device manufacturing industry, the requirements for electronic devices are higher and higher, and the requirements for industrial detection are also increased. In order to improve the durability of products, defect detection of electronic devices is required.
Disclosure of Invention
The embodiment of the application provides a defect detection method, a defect detection device, defect detection equipment and a storage medium.
In a first aspect, the present application provides a defect detection method, including:
acquiring depth information of an object to be detected, and acquiring a collected image of the object to be detected;
dividing the collected image into a plurality of image partitions according to the depth information, wherein the image partitions correspond to different image depths;
and determining the defect information of the object to be detected according to the area parameters of the image partitions.
In a second aspect, the present application provides a defect detection apparatus comprising:
the device comprises an acquisition unit, a processing unit and a display unit, wherein the acquisition unit is used for acquiring the depth information of an object to be detected and acquiring an acquired image of the object to be detected;
the dividing unit is used for dividing the acquired image into a plurality of image partitions according to the depth information, and the image partitions correspond to different image depths;
and the determining unit is used for determining the defect information of the object to be detected according to the area parameters of the image partitions.
In a third aspect, an embodiment of the present invention provides a computer-readable storage medium storing a computer program for electronic data exchange, wherein the computer program causes a computer to execute the method provided in the first aspect.
In a fourth aspect, embodiments of the present invention provide a computer program product, where the computer program product comprises a non-transitory computer-readable storage medium storing a computer program, the computer program being operable to cause a computer to perform some or all of the steps as described in the first aspect of embodiments of the present invention. The computer program product may be a software installation package.
It can be seen that, in the embodiment of the application, by acquiring the depth information of the object to be detected, the depth information can present the distances or the surface heights of different positions of the object to be detected, and the acquired image of the object to be detected is acquired; the defect area and the non-defect area on the object to be detected may have different depths, the collected image is divided into a plurality of image partitions according to the depth information, and the plurality of image partitions correspond to different image depths; and determining the defect information of the object to be detected according to the area parameters of the image partitions, so that the defect of the object to be detected can be detected relatively quickly.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic flow chart of a defect detection method according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of another defect detection method according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a defect detection apparatus according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of another defect detection apparatus according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terms "first," "second," and the like in the description and claims of the present invention and in the above-described drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the invention. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
The following describes embodiments of the present invention in detail.
Referring to fig. 1, fig. 1 is a schematic flow chart of a defect detection method according to an embodiment of the present invention, the defect detection method may include the following steps:
101. acquiring depth information of an object to be detected, and acquiring a collected image of the object to be detected;
the depth information of the object to be detected can be detected through the infrared camera, and the collected image of the object to be detected can be collected through the RGB camera.
Optionally, before the step 101, the method may further include:
a1, emitting composite light to the object to be detected through an optical emitter;
a2, receiving reflected light received by the object to be detected through a light receiver;
a3, determining a target detection area of the object to be detected according to the reflected light;
and A4, focusing the target detection area through a camera.
The composite light emitted by the light emitter can comprise light with various colors, and considering that the colors of a defect area and a non-defect area on an object to be detected can be different, so that the composite light can be emitted, the colors of the defect area and the non-defect area are different, the reflected light of the defect area and the reflected light of the non-defect area are also different, a target detection area of the object to be detected can be determined according to the reflected light, the target detection area can be a defect area, then the camera is controlled to focus on the target detection area, the defect area can be determined quickly and accurately, and therefore the defect can be detected quickly.
Optionally, the step of determining the target detection area of the object to be detected according to the reflected light in the step a3 includes:
a31, determining light in a first wavelength range or light in a second wavelength range absorbed by the object to be detected according to reflected light with different wavelengths in the reflected light;
a32, determining the area of the object to be detected, which absorbs the light in the first wavelength range, according to the light in the first wavelength range absorbed by the object to be detected, and taking the area which absorbs the light in the first wavelength range as a target detection area.
In specific implementation, the optical signals of different colors correspond to different wavelength ranges, so that the reflected light of the defective region may be light in a first wavelength range, and the reflected light of the non-defective region may be light in a second wavelength range, so that a region on the object to be detected, which absorbs the light in the first wavelength range, can be determined according to the light in the first wavelength range absorbed by the object to be detected, and the region which absorbs the light in the first wavelength range is taken as a target detection region, so that the defective region can be determined quickly and accurately, and the defect can be detected quickly.
Or, optionally, the composite light includes a plurality of signal lights with different wavelengths, and in the step a3, the step of determining the target detection area of the object to be detected according to the reflected light includes:
a33, determining light in a first wavelength range or light in a second wavelength range absorbed by the object to be detected according to reflected light with different wavelengths in the reflected light;
a34, determining the region of the object to be detected which absorbs the light of the second wavelength range according to the light of the second wavelength range absorbed by the object to be detected, and setting the region surrounded by the region other than the region which absorbs the light of the second wavelength range or the region which absorbs the light of the second wavelength range as the target detection region.
In a specific implementation, the reflected light of the defective region may be light in the second wavelength range, and the reflected light of the non-defective region may be light in the first wavelength range, so that a region on the object to be detected, which absorbs light in the second wavelength range, may be determined according to the light in the second wavelength range absorbed by the object to be detected, and the region absorbing light in the second wavelength range may be used as a target detection region, so that the defective region may be determined quickly and accurately, and the defect may be detected quickly.
102. Dividing the collected image into a plurality of image partitions according to the depth information, wherein the image partitions correspond to different image depths;
the depth distribution corresponding to the collected image can be analyzed according to the depth information, the depth distribution of different areas is different, the collected image is divided into a plurality of image subareas according to the depth distribution, and the image depth between the adjacent subareas is different.
Specifically, the pixel points of the collected image can be traversed, the image depth of the pixel point can be compared with the image depth of each pixel point of the neighborhood aiming at any pixel point which is not traversed, and if the depth difference value between the image depths of continuous several pixel points is smaller than a preset difference value, the continuous pixel points can be divided into one image partition.
103. And determining the defect information of the object to be detected according to the area parameters of the image partitions.
Wherein the region parameter may include at least one of: area outline, size, etc.
Specifically, the plurality of image partitions can be analyzed according to at least one parameter of the area outline and the size, so that the defect information of the object to be detected can be obtained.
Optionally, in step 103, the area parameters include an area profile, and the step of determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions includes:
matching the area contour of each image partition in the plurality of image partitions with a preset contour sample to obtain a successfully matched target area contour;
and extracting the defect information of the object to be detected from the image partition corresponding to the target area outline.
In specific implementation, the defect of the object to be detected presents a specific contour, and the contour of the target region can be quickly determined by matching the contour of the region, so that the defect information can be accurately extracted.
Optionally, in step 103, the area parameter includes a size, and the step of determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions includes:
determining a target image partition in the plurality of image partitions, wherein the size corresponding to the target image partition is within a preset size range;
and extracting the defect information of the object to be detected from the target image partition.
In specific implementation, the defect size of the object to be detected can be in a certain size range, the target image partition can be quickly determined through the size, the target image partition can be quickly found, and therefore defect information can be quickly extracted.
Optionally, in step 103, the area parameters include an area outline and a size, and the step of determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions includes:
matching the area outline of each image partition in the plurality of image partitions with a preset outline sample;
if the matching fails, screening more than two adjacent image partitions of which the sizes are smaller than a preset size threshold value from the multiple image partitions;
splicing the more than two adjacent image partitions to obtain a combined image partition;
matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition;
and extracting the defect information of the object to be detected from the successfully matched combined image partition.
When the matching through the outline fails, the image partitions with smaller sizes can be spliced, and then the combined image partitions after splicing are subjected to outline matching, so that the probability of successful matching can be improved, image acquisition is not required to be carried out newly, and the defect detection efficiency can be improved.
Optionally, the step of matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition may include:
extracting image feature information of the combined image partition, wherein the image feature information comprises a plurality of sub-features;
and matching the sub-features with the sample features corresponding to the preset contour sample according to a preset matching sequence, accumulating the matching values of the matching of the sub-features, stopping matching when the accumulated value is larger than a preset matching threshold, and taking the combined image partition corresponding to the larger than the preset matching threshold as the combined image partition which is successfully matched.
Specifically, whether the combined image partition is successfully matched or not can be judged in a mode of accumulating the matching values, if the matching is successful, other sub-features are not continuously matched, so that the data processing amount can be reduced, the combined image which is successfully matched is rapidly determined, and the defect detection efficiency is improved.
By acquiring the depth information of the object to be detected, the depth information can present the distance or the surface height of different positions of the object to be detected, and the acquired image of the object to be detected is acquired; the defect area and the non-defect area on the object to be detected may have different depths, the collected image is divided into a plurality of image partitions according to the depth information, and the plurality of image partitions correspond to different image depths; and determining the defect information of the object to be detected according to the area parameters of the image partitions, so that the defect of the object to be detected can be detected relatively quickly.
Referring to fig. 2, fig. 2 is a schematic flow chart of another defect detection method according to an embodiment of the present invention, which includes the following steps:
Step 203: and determining a target detection area of the object to be detected according to the reflected light.
And step 204, focusing the target detection area through the camera.
And 206, dividing the acquired image into a plurality of image partitions according to the depth information, wherein the image partitions correspond to different image depths.
And step 207, matching the area contour of each image partition in the plurality of image partitions with a preset contour sample.
And 208, if the matching fails, screening more than two adjacent image partitions of which the sizes are smaller than a preset size threshold value from the plurality of image partitions.
And 209, splicing the more than two adjacent image partitions to obtain a combined image partition.
And step 210, matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition.
And step 211, extracting the defect information of the object to be detected from the successfully matched combined image partition.
It can be seen that the composite light is emitted to the object to be detected through the light emitter; receiving, by a light receiver, reflected light received by an object to be detected; determining a target detection area of the object to be detected according to the reflected light; focusing a target detection area through a camera; acquiring a collected image of the object to be detected by acquiring depth information of the object to be detected, wherein the depth information can present the distance or the surface height of different positions of the object to be detected; the defect area and the non-defect area on the object to be detected may have different depths, the collected image is divided into a plurality of image partitions according to the depth information, and the plurality of image partitions correspond to different image depths; matching the area outline of each image partition in the plurality of image partitions with a preset outline sample; if the matching fails, screening more than two adjacent image partitions of which the sizes are smaller than a preset size threshold value from the multiple image partitions; splicing more than two adjacent image partitions to obtain a combined image partition; matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition; and extracting the defect information of the object to be detected from the successfully matched combined image partition, so that the defect of the object to be detected can be detected relatively quickly.
Referring to fig. 3, fig. 3 is a schematic structural diagram of a detection apparatus according to an embodiment of the present invention, where the detection apparatus 300 includes a processor 310, a memory 320 and a communication interface 330, the memory is used for storing one or more programs 321 and is configured to be executed by the processor, and the program includes steps for:
acquiring depth information of an object to be detected, and acquiring a collected image of the object to be detected;
dividing the collected image into a plurality of image partitions according to the depth information, wherein the image partitions correspond to different image depths;
and determining the defect information of the object to be detected according to the area parameters of the image partitions.
Optionally, before the acquiring the acquired image of the object to be detected, the method further includes:
transmitting composite light to the object to be detected through a light transmitter;
receiving, by a light receiver, reflected light received by the object to be detected;
determining a target detection area of the object to be detected according to the reflected light;
and focusing the target detection area through a camera.
Optionally, the composite light includes a plurality of signal lights with different wavelengths, and determining the target detection area of the object to be detected according to the reflected light includes:
determining light in a first wavelength range or light in a second wavelength range absorbed by the object to be detected according to reflected light with different wavelengths in the reflected light;
determining a region on the object to be detected, which absorbs the light in the first wavelength range, according to the light in the first wavelength range absorbed by the object to be detected, and taking the region which absorbs the light in the first wavelength range as a target detection region;
or determining a region on the object to be detected, which absorbs the light in the second wavelength range, according to the light in the second wavelength range absorbed by the object to be detected, and setting a region outside the region absorbing the light in the second wavelength range or a region surrounded by the region absorbing the light in the second wavelength range as a target detection region.
Optionally, the determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions includes:
matching the area contour of each image partition in the plurality of image partitions with a preset contour sample to obtain a successfully matched target area contour;
and extracting the defect information of the object to be detected from the image partition corresponding to the target area outline.
Optionally, the determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions includes:
determining a target image partition in the plurality of image partitions, wherein the size corresponding to the target image partition is within a preset size range;
and extracting the defect information of the object to be detected from the target image partition.
Optionally, the determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions includes:
matching the area outline of each image partition in the plurality of image partitions with a preset outline sample;
if the matching fails, screening more than two adjacent image partitions of which the sizes are smaller than a preset size threshold value from the multiple image partitions;
splicing the more than two adjacent image partitions to obtain a combined image partition;
matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition;
and extracting the defect information of the object to be detected from the successfully matched combined image partition.
Optionally, the matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition includes:
extracting image feature information of the combined image partition, wherein the image feature information comprises a plurality of sub-features;
and matching the sub-features with the sample features corresponding to the preset contour sample according to a preset matching sequence, accumulating the matching values of the matching of the sub-features, stopping matching when the accumulated value is larger than a preset matching threshold, and taking the combined image partition corresponding to the larger than the preset matching threshold as the combined image partition which is successfully matched.
It can be seen that, in the embodiment of the present invention, by obtaining the depth information of the object to be detected, the depth information may present the distances or surface heights of different positions of the object to be detected, and obtain the collected image of the object to be detected; the defect area and the non-defect area on the object to be detected may have different depths, the collected image is divided into a plurality of image partitions according to the depth information, and the plurality of image partitions correspond to different image depths; and determining the defect information of the object to be detected according to the area parameters of the image partitions, so that the defect of the object to be detected can be detected relatively quickly.
Referring to fig. 4, fig. 4 is a schematic structural diagram of a defect detection apparatus according to an embodiment of the present invention, where the defect detection apparatus 400 includes:
an obtaining unit 401, configured to obtain depth information of an object to be detected, and obtain a collected image of the object to be detected;
a dividing unit 402, configured to divide the acquired image into a plurality of image partitions according to the depth information, where the image partitions correspond to different image depths;
the determining unit 403 determines the defect information of the object to be detected according to the area parameters of the plurality of image partitions.
Optionally, the apparatus further comprises a focusing unit for:
transmitting composite light to the object to be detected through a light transmitter;
receiving, by a light receiver, reflected light received by the object to be detected;
determining a target detection area of the object to be detected according to the reflected light;
and focusing the target detection area through a camera.
Optionally, the composite light includes a plurality of signal lights with different wavelengths, and when the step of determining the target detection area of the object to be detected according to the reflected light is executed, the focus determining unit is specifically configured to:
determining light in a first wavelength range or light in a second wavelength range absorbed by the object to be detected according to reflected light with different wavelengths in the reflected light;
determining a region on the object to be detected, which absorbs the light in the first wavelength range, according to the light in the first wavelength range absorbed by the object to be detected, and taking the region which absorbs the light in the first wavelength range as a target detection region;
or determining a region on the object to be detected, which absorbs the light in the second wavelength range, according to the light in the second wavelength range absorbed by the object to be detected, and setting a region outside the region absorbing the light in the second wavelength range or a region surrounded by the region absorbing the light in the second wavelength range as a target detection region.
Optionally, in an implementation embodiment, the area parameter includes an area outline, and when the step of determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions is executed, the determining unit is specifically configured to:
matching the area contour of each image partition in the plurality of image partitions with a preset contour sample to obtain a successfully matched target area contour;
and extracting the defect information of the object to be detected from the image partition corresponding to the target area outline.
Optionally, the area parameters include an area profile, and when the step of determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions is performed, the determining unit is specifically configured to:
determining a target image partition in the plurality of image partitions, wherein the size corresponding to the target image partition is within a preset size range;
and extracting the defect information of the object to be detected from the target image partition.
Optionally, the area parameters include an area profile, and when the step of determining the defect information of the object to be detected according to the area parameters of the plurality of image partitions is performed, the determining unit is specifically configured to:
matching the area outline of each image partition in the plurality of image partitions with a preset outline sample;
if the matching fails, screening more than two adjacent image partitions of which the sizes are smaller than a preset size threshold value from the multiple image partitions;
splicing the more than two adjacent image partitions to obtain a combined image partition;
matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition;
and extracting the defect information of the object to be detected from the successfully matched combined image partition.
Optionally, when the step of matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition is executed, the determining unit is specifically configured to:
extracting image feature information of the combined image partition, wherein the image feature information comprises a plurality of sub-features;
and matching the sub-features with the sample features corresponding to the preset contour sample according to a preset matching sequence, accumulating the matching values of the matching of the sub-features, stopping matching when the accumulated value is larger than a preset matching threshold, and taking the combined image partition corresponding to the larger than the preset matching threshold as the combined image partition which is successfully matched.
It can be seen that, in the embodiment of the application, by acquiring the depth information of the object to be detected, the depth information can present the distances or the surface heights of different positions of the object to be detected, and the acquired image of the object to be detected is acquired; the defect area and the non-defect area on the object to be detected may have different depths, the collected image is divided into a plurality of image partitions according to the depth information, and the plurality of image partitions correspond to different image depths; and determining the defect information of the object to be detected according to the area parameters of the image partitions, so that the defect of the object to be detected can be detected relatively quickly.
It should be noted that, for the specific implementation process of this embodiment, reference may be made to the specific implementation process described in the above method embodiment, and details are not described here.
According to the embodiment of the present invention, the electronic device may be divided into the functional units according to the method example, for example, each functional unit may be divided corresponding to each function, or two or more functions may be integrated into one processing unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit. It should be noted that the division of the unit in the embodiment of the present invention is schematic, and is only a logic function division, and there may be another division manner in actual implementation.
Embodiments of the present invention also provide a computer storage medium, where the computer storage medium stores a computer program for electronic data exchange, the computer program enables a computer to execute part or all of the steps of any one of the methods described in the above method embodiments, and the computer includes an electronic device.
Embodiments of the present invention also provide a computer program product comprising a non-transitory computer readable storage medium storing a computer program operable to cause a computer to perform some or all of the steps of any of the methods as described in the above method embodiments. The computer program product may be a software installation package, the computer comprising an electronic device.
It should be noted that, for simplicity of description, the above-mentioned method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present invention is not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the invention. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required by the invention.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus can be implemented in other manners. For example, the above-described embodiments of the apparatus are merely illustrative, and for example, the above-described division of the units is only one type of division of logical functions, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of some interfaces, devices or units, and may be an electric or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit may be stored in a computer readable memory if it is implemented in the form of a software functional unit and sold or used as a stand-alone product. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a memory and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the above methods according to the embodiments of the present invention. And the aforementioned memory comprises: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by associated hardware instructed by a program, which may be stored in a computer-readable memory, which may include: an internal flash disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, etc.
The above embodiments of the present invention are described in detail, and the principle and the implementation of the present invention are explained by applying specific embodiments, and the above description of the embodiments is only used to help understanding the method of the present invention and the core idea thereof; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
Claims (10)
1. A defect detection method, comprising:
acquiring depth information of an object to be detected, and acquiring a collected image of the object to be detected;
dividing the collected image into a plurality of image partitions according to the depth information, wherein the image partitions correspond to different image depths;
and determining the defect information of the object to be detected according to the area parameters of the image partitions.
2. The method according to claim 1, further comprising, before said acquiring the acquired image of the object to be detected, the steps of:
transmitting composite light to the object to be detected through a light transmitter;
receiving, by a light receiver, reflected light received by the object to be detected;
determining a target detection area of the object to be detected according to the reflected light;
and focusing the target detection area through a camera.
3. The method of claim 2, wherein the composite light comprises a plurality of signal lights of different wavelengths, and the step of determining the target detection area of the object to be detected from the reflected light comprises:
determining light in a first wavelength range or light in a second wavelength range absorbed by the object to be detected according to reflected light with different wavelengths in the reflected light;
determining a region on the object to be detected, which absorbs the light in the first wavelength range, according to the light in the first wavelength range absorbed by the object to be detected, and taking the region which absorbs the light in the first wavelength range as a target detection region;
or determining a region on the object to be detected, which absorbs the light in the second wavelength range, according to the light in the second wavelength range absorbed by the object to be detected, and setting a region outside the region absorbing the light in the second wavelength range or a region surrounded by the region absorbing the light in the second wavelength range as a target detection region.
4. The method according to any one of claims 1 to 3, wherein the region parameters comprise a region profile, and the step of determining defect information of the object to be detected from the region parameters of the plurality of image partitions comprises:
matching the area contour of each image partition in the plurality of image partitions with a preset contour sample to obtain a successfully matched target area contour;
and extracting the defect information of the object to be detected from the image partition corresponding to the target area outline.
5. The method according to any one of claims 1 to 3, wherein the region parameters include a size, and the step of determining the defect information of the object to be detected based on the region parameters of the plurality of image partitions includes:
determining a target image partition in the plurality of image partitions, wherein the size corresponding to the target image partition is within a preset size range;
and extracting the defect information of the object to be detected from the target image partition.
6. The method according to any one of claims 1 to 3, wherein the region parameters include a region outline and a size, and the step of determining the defect information of the object to be detected according to the region parameters of the plurality of image partitions includes:
matching the area outline of each image partition in the plurality of image partitions with a preset outline sample;
if the matching fails, screening more than two adjacent image partitions of which the sizes are smaller than a preset size threshold value from the multiple image partitions;
splicing the more than two adjacent image partitions to obtain a combined image partition;
matching the combined image partition with a preset profile sample to obtain a successfully matched combined image partition;
and extracting the defect information of the object to be detected from the successfully matched combined image partition.
7. The method of claim 6, wherein the step of matching the combined image partition with a preset contour sample to obtain a successfully matched combined image partition comprises:
extracting image feature information of the combined image partition, wherein the image feature information comprises a plurality of sub-features;
and matching the sub-features with the sample features corresponding to the preset contour sample according to a preset matching sequence, accumulating the matching values of the matching of the sub-features, stopping matching when the accumulated value is larger than a preset matching threshold, and taking the combined image partition corresponding to the larger than the preset matching threshold as the combined image partition which is successfully matched.
8. A defect detection apparatus, characterized in that the defect detection apparatus comprises:
the device comprises an acquisition unit, a processing unit and a display unit, wherein the acquisition unit is used for acquiring the depth information of an object to be detected and acquiring an acquired image of the object to be detected;
the dividing unit is used for dividing the acquired image into a plurality of image partitions according to the depth information, and the image partitions correspond to different image depths;
and the determining unit is used for determining the defect information of the object to be detected according to the area parameters of the image partitions.
9. A detection device comprising a processor, a memory, a communication interface, and one or more programs stored in the memory and configured to be executed by the processor, the programs including instructions for performing the steps in the method of any of claims 1-7.
10. A computer-readable storage medium, characterized in that a computer program for electronic data exchange is stored, wherein the computer program causes a computer to perform the method according to any one of claims 1-7.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114623764A (en) * | 2022-03-14 | 2022-06-14 | 业成科技（成都）有限公司 | Non-planar lens group defect detection method and device, computer equipment and storage medium |
| CN116571410A (en) * | 2023-07-14 | 2023-08-11 | 杭州百子尖科技股份有限公司 | Defect region repairing method, device, equipment and medium based on machine vision |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114623764A (en) * | 2022-03-14 | 2022-06-14 | 业成科技（成都）有限公司 | Non-planar lens group defect detection method and device, computer equipment and storage medium |
| CN116571410A (en) * | 2023-07-14 | 2023-08-11 | 杭州百子尖科技股份有限公司 | Defect region repairing method, device, equipment and medium based on machine vision |
| CN116571410B (en) * | 2023-07-14 | 2023-09-26 | 杭州百子尖科技股份有限公司 | Defect region repairing method, device, equipment and medium based on machine vision |
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