CN113970551A - Material surface quality detection method and system and storage device - Google Patents
Material surface quality detection method and system and storage device Download PDFInfo
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Abstract
The invention is suitable for the related field of detecting instruments, and provides a material surface quality detecting method, a system and a storage device, wherein a signal is confirmed by receiving a position where a material reaches a detection position; then, according to the position confirmation signal, projecting an optical phase detection light wave to the surface of the material, detecting the reflection condition of the optical wave by utilizing the difference of the influence degree of the material surface defect on the optical phase, constructing three-dimensional shape model data of the material according to the optical phase information captured by the sensor, analyzing the three-dimensional shape data, displaying the defect position, the defect depth and the like, and marking the quality defect of the surface of the material; and finally, sending the three-dimensional shape data with the marks to a display end. The problem that the specific shape of the defect and the specific position of the defect cannot be accurately displayed in the prior art is solved.
Description
Technical Field
The invention belongs to the related field of detection instruments, and particularly relates to a material surface quality detection method, a material surface quality detection system and storage equipment.
Background
With the deep fusion of the new generation information technology and the manufacturing industry, the manufacturing industry is greatly changed, and the change from the quantity amplification to the quality improvement is gradually carried out. The product with high added value and high profit is produced by improving the product quality, and the jump of the product competitiveness can be realized. The thinking of improving the product quality includes quality enhancement inspection, technical level improvement, production specification and the like, wherein the quality enhancement inspection is the most common mode in the manufacturing industry.
As an essential step in the manufacturing process, surface defect detection is widely used in various industrial fields, and generally undergoes three stages, namely, manual visual inspection, single electromechanical or optical technology inspection, and machine vision inspection.
The existing detection process for the surface quality of the material needs a plurality of human intervention steps, and although the defect on the surface of the material can be detected, the specific shape and the specific position of the defect cannot be accurately displayed, so that the inconvenience is caused for the production improvement of the material and the popularization and use of the material.
Disclosure of Invention
The embodiment of the invention provides a method, a system and storage equipment for detecting the surface quality of a material, and aims to solve the problems that the specific shape and the specific position of a defect cannot be accurately displayed, and the production improvement and the popularization and the use of the material are inconvenient in the prior art.
The embodiment of the invention is realized in such a way that, on one hand, a method for detecting the surface quality of a material comprises the following steps:
receiving a position confirmation signal of the material reaching the detection position;
projecting an optical phase detection light wave to the surface of the material according to the position confirmation signal;
capturing optical phase information according to the reflection condition of the detection optical wave, and constructing three-dimensional shape model data of the material according to the optical phase information;
analyzing the three-dimensional shape data and marking the quality defect of the surface of the material;
and sending the three-dimensional shape data with the marks to a display end.
As a modified scheme of the invention: the position confirmation signal of the receiving material reaching the detection position specifically includes:
sending a starting signal to a corresponding position sensor according to the type and the type of the material, so that the position sensor is in a starting monitoring state; the position of the position sensor corresponds to the size of the material, so that the central position of the material is just opposite to the emission position of the detection light wave after the material reaches the detection position;
and receiving a position confirmation signal of the material which is uploaded by the position sensor and reaches the detection position.
As a further improvement of the invention: the projecting the optical phase detection light wave to the material surface according to the position confirmation signal specifically includes:
adjusting the area of the detected light wave radiation according to position confirmation signals sent by the position sensors at different positions;
after adjustment, projecting light phase detection light waves to the surface of the material; the detection light wave covers the surface of the material.
As another improvement of the invention: the capturing optical phase information according to the reflection condition of the detection optical wave, and constructing the three-dimensional shape model data of the material according to the optical phase information specifically include:
receiving reflected light waves refracted back after the detection light waves reach the surface of the material;
reconstructing the light intensity of the reflected light wave through an algorithm and converting the light intensity into optical phase information;
establishing three-dimensional appearance model units with different heights according to different optical phase information at different positions;
and fitting the three-dimensional shape model units at different positions to form three-dimensional shape model data.
As a further scheme of the invention: the analyzing the three-dimensional shape data and marking the quality defect of the material surface specifically comprises the following steps:
superposing the three-dimensional appearance model data and the material standard model data, and detecting the superposed area between the appearance surface of the superposed three-dimensional appearance model and the appearance surface of the material standard model;
obtaining a coincidence value according to the coincidence area and the appearance surface of the material standard model;
judging whether the coincidence value is smaller than a preset coincidence value or not;
and when the coincidence value is smaller than the preset coincidence value, marking the outer surface area of the three-dimensional outer shape model which is not coincident with the outer surface of the material standard model.
As a further scheme of the invention: after marking the outer shape surface area of the three-dimensional outer shape model which is not coincident with the outer shape surface of the material standard model when the coincidence value is smaller than the preset coincidence value, the method further comprises the following steps:
extracting the highest point coordinate and the lowest point coordinate in a continuous area in the surface area of the shape of the non-coincident three-dimensional shape model;
calculating the roughness value of the surface of the material according to the extracted coordinates of the plurality of highest points and the extracted coordinates of the lowest points;
judging whether the surface roughness value is larger than a preset roughness value or not;
and when the surface roughness value is larger than the preset roughness value, marking the highest point and the lowest point on the three-dimensional shape model.
As an optimization scheme of the invention: the sending of the three-dimensional shape data with the mark to the display end specifically comprises:
respectively marking and displaying a superposed region and a non-superposed region between the three-dimensional appearance model and the material standard model;
highlighting the highest point and the lowest point in the misaligned region with the surface roughness value larger than the preset roughness value;
sending the three-dimensional appearance model with the mark and the highlight to a display end;
and receiving the operation data uploaded from the display terminal.
In another aspect, a material surface quality detection system includes:
the signal receiving module is used for receiving a position confirmation signal of the material reaching the detection position;
the detection control module is used for projecting optical phase detection light waves to the surface of the material according to the position confirmation signal;
the model building module is used for capturing optical phase information according to the reflection condition of the detection optical wave and building three-dimensional shape model data of the material according to the optical phase information;
the defect analysis module is used for analyzing the three-dimensional shape data and marking the quality defect of the surface of the material;
and the model data sending module is used for sending the three-dimensional shape data with the marks to the display end.
A storage device comprising one or more processors, the storage device storing a computer program which, when executed by the processors, implements the material surface quality detection method described above.
The invention has the beneficial effects that: confirming a signal by receiving a position where the material reaches the detection position; then, according to the position confirmation signal, projecting an optical phase detection light wave to the surface of the material, detecting the reflection condition of the optical wave by utilizing the difference of the influence degree of the material surface defect on the optical phase, constructing three-dimensional shape model data of the material according to the optical phase information captured by the sensor, analyzing the three-dimensional shape data, displaying the defect position, the defect depth and the like, and marking the quality defect of the surface of the material; and finally, sending the three-dimensional shape data with the marks to a display end. The problem that the specific shape of the defect and the specific position of the defect cannot be accurately displayed in the prior art is solved.
Drawings
FIG. 1 is a schematic diagram of an operating environment of a material surface quality detection method;
FIG. 2 is a main flow chart of a material surface quality inspection method;
FIG. 3 is a flow chart of three-dimensional shape model data construction in a material surface quality inspection method;
FIG. 4 is a flow chart of a method for marking defects on a surface of a material in a method for inspecting the surface quality of the material;
fig. 5 is a schematic diagram of the internal structure of a material surface quality detection system.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The invention confirms the signal by receiving the position of the material reaching the detection position; then, according to the position confirmation signal, projecting an optical phase detection light wave to the surface of the material, detecting the reflection condition of the optical wave by utilizing the difference of the influence degree of the material surface defect on the optical phase, constructing three-dimensional shape model data of the material according to the optical phase information captured by the sensor, analyzing the three-dimensional shape data, displaying the defect position, the defect depth and the like, and marking the quality defect of the surface of the material; and finally, sending the three-dimensional shape data with the marks to a display end. The problem that the specific shape of the defect and the specific position of the defect cannot be accurately displayed in the prior art is solved.
Fig. 1 is a schematic view showing an operating environment structure of a material surface quality detection method according to an embodiment of the present invention, in which a position sensor 1 sends an in-place signal to a material surface quality detection system after sensing a material, and then the material surface quality detection system sends a start signal to a detection optical wave generator 3, the detection optical wave generator 3 emits an optical wave, and when the optical wave reaches a material surface, the optical wave is reflected, and after an optical phase sensor 4 senses the optical wave, the sensed optical wave is reconstructed by an algorithm to convert into optical phase information; three-dimensional shape model units with different heights are established according to different optical phase information at different positions, and after the material surface quality detection system analyzes and marks the three-dimensional shape data, the three-dimensional shape data with marks are sent to the display end 2.
Quantitative phase imaging techniques are used to determine the relationship between light phase and brightness during detection. The phase information is used to measure and display the optical phase properties of the sample by a specific phase imaging device. By converting the phase information into the material surface appearance information, the fine shapes on the material surface can be converted and projected to form the three-dimensional graph of the electronic plate, so that the electronic plate is convenient to enlarge and observe.
Fig. 2 shows a main flow chart of a material surface quality detection method according to an embodiment of the present invention, the material surface quality detection method includes:
step S10: and receiving a position confirmation signal of the material reaching the detection position. According to the types and the sizes of different materials, the corresponding position sensor 1 is started in advance, and when the position sensor 1 senses that the material reaches a specified position, a position confirmation signal is sent out.
Step S11: and projecting an optical phase detection light wave to the surface of the material according to the position confirmation signal. And after the system receives the position confirmation signal, controlling the detection light wave generator 3 to work, projecting detection light waves and irradiating the surface of the material.
Step S12: and capturing optical phase information according to the reflection condition of the detection optical wave, and constructing three-dimensional shape model data of the material according to the optical phase information. The optical phase sensor component 4 receives the light wave reflected by the surface of the material by utilizing different influences of the surface defects of the material on the phase of the light, outputs corresponding optical phase information according to the intensity of the light wave, and constructs three-dimensional shape model data of the material according to the optical phase information.
Step S13: and analyzing the three-dimensional shape data, and marking the quality defect of the material surface. The defect position, the defect depth, the material surface defect, the surface granularity and the like are analyzed, the material can be further classified, and the application range of good and bad materials can be better distributed.
Step S14: the three-dimensional shape data with the mark is sent to the display terminal 2.
In one aspect of this embodiment, the position confirmation signal of the receiving material reaching the detection position specifically includes:
step S100: according to the type and type of the material, sending a starting signal to the corresponding position sensor 1 to enable the position sensor 1 to be in a starting monitoring state; the position sensor 1 is arranged at a position corresponding to the size of the material so as to ensure that the central position of the material is just opposite to the emission position of the detection light wave after the material reaches the detection position.
Step S101: receiving a position confirmation signal of the material which is uploaded by the position sensor 1 and reaches the detection position.
In another aspect of this embodiment, the projecting the optical phase detection light wave to the material surface according to the position confirmation signal specifically includes:
step S110: the area of the detection light wave radiation is adjusted according to the position confirmation signals sent by the position sensors 1 at different positions.
Step S111: after adjustment, projecting light phase detection light waves to the surface of the material; the detection light wave covers the surface of the material. Because the surface areas of different materials are different, if the illumination area is too large, the reflected light waves are not necessarily reflected from the surface of the material completely, so that the reflected light waves received by the optical phase sensor 4 are interfered, and the result is wrong, therefore, the illumination area of the detection optical wave generator 3 is adjusted according to the sizes of different materials.
Fig. 3 shows a flow chart of three-dimensional shape model data construction in a material surface quality detection method according to an embodiment of the present invention, where the capturing optical phase information according to a reflection condition of a detection optical wave and constructing three-dimensional shape model data of a material according to the optical phase information specifically include:
step S120: and receiving the reflected light wave refracted back after the detection light wave reaches the surface of the material.
Step S121: and converting the light intensity of the reflected light waves into optical phase information through algorithm reconstruction. The optical phase sensor 4 is composed of a plurality of small photosensitive sensor elements, no gap is left in the splicing place, the splicing is tight, and when the photosensitive sensor elements are small enough, the sensed reflected light waves are continuously changed.
Step S122: and establishing three-dimensional appearance model units with different heights according to the difference of the optical phase information at different positions.
Step S123: and fitting the three-dimensional shape model units at different positions to form three-dimensional shape model data. A three-dimensional shape model with a smooth surface can be constructed from the continuously varying current.
Fig. 4 shows a material surface defect marking flowchart in the material surface quality inspection method according to the embodiment of the present invention, where analyzing three-dimensional shape data and marking a quality defect on a material surface specifically includes:
step S130: and (4) superposing the three-dimensional shape model data and the material standard model data, and detecting the superposed area between the shape surface of the superposed three-dimensional shape model and the shape surface of the material standard model.
Step S131: and obtaining the coincidence value according to the coincidence area and the appearance surface of the material standard model.
Step S132: and judging whether the coincidence value is smaller than a preset coincidence value or not.
Step S134: and when the coincidence value is smaller than the preset coincidence value, the material surface is better, and the outer surface area of the three-dimensional appearance model which is not coincident with the outer surface of the material standard model is marked. When the coincidence value is not less than the preset coincidence value, the difference between the quality of the surface of the material being detected and the quality of the surface of the standard material is larger, and even if the surface of the material is smooth or regular, the overall size of the material is larger than the standard material, and the material cannot be considered as a good material.
Step S135: and extracting the highest point coordinate and the lowest point coordinate in a continuous area in the shape surface area of the non-coincident three-dimensional shape model. It is only necessary to monitor the waviness of the material surface, which is obviously a defective material if larger protrusions or deeper depressions are present on the material surface, although the material surface has a higher degree of matching in terms of degree of coincidence with standard materials.
Step S136: and calculating the roughness value of the material surface according to the extracted coordinates of the plurality of highest points and the coordinate of the lowest point.
Step S137: and judging whether the surface roughness value is larger than a preset roughness value or not.
Step S138: and when the surface roughness value is larger than the preset roughness value, indicating that more unqualified defects appear on the surface of the material, and marking the highest point and the lowest point on the three-dimensional shape model. And when the surface roughness value is not greater than the preset roughness value, the surface of the material is smooth and meets the requirement.
In a case of this embodiment, the sending the three-dimensional shape data with the mark to the display end 2 specifically includes:
step S140: and respectively marking and displaying the overlapped area and the non-overlapped area between the three-dimensional appearance model and the material standard model. The non-coincident regions are marked, a plurality of detected materials can be counted in the later period, whether the distribution positions of the non-coincident regions are consistent or not is observed, when the non-coincident regions are all concentrated at a certain position, the problem of the regions of the manufacturing equipment corresponding to the position in the manufacturing process is shown, if the distribution of the non-coincident regions is uniform and random, the material manufacturing equipment is shown not to be damaged at a specific position, the equipment precision is possibly insufficient, and the random non-coincident regions generated on the surfaces of the materials are caused.
Step S141: highlighting the highest point and the lowest point in the misaligned region with the surface roughness value greater than the preset roughness value. Through the highlighted positions, the grain size of the surface of the material can be obviously observed, if the grain size distribution is uniform, the surface of the material is smooth, and if the height and the quantity distribution of the grain size are not uniform, the surface of the material is not smooth enough.
Step S142: the marked and highlighted three-dimensional appearance model is sent to the display end 2.
Step S143: and receiving the operation data uploaded from the display terminal 2. And the quality testing personnel observe the returned three-dimensional appearance model and classify the materials according to the positions and the number of the defects. In addition, the system can also add the function of automatically classifying the materials according to the positions and the number of the defects.
Fig. 5 is a schematic diagram illustrating an internal structure of a material surface quality inspection system according to an embodiment of the present invention, where the material surface quality inspection system includes:
the signal receiving module 100 is configured to receive a position confirmation signal indicating that the material reaches the detection position.
And the detection control module 200 is used for projecting the optical phase detection light wave to the surface of the material according to the position confirmation signal.
And a model building module 300, configured to capture optical phase information according to the reflection condition of the detection optical wave, and build three-dimensional shape model data of the material according to the optical phase information.
And the defect analysis module 400 is used for analyzing the three-dimensional shape data and marking the quality defects on the surface of the material.
And a model data sending module 500, configured to send the three-dimensional shape data with the mark to the display end 2.
In addition, in order to be able to store a computer program for implementing the method, a storage device is provided, which comprises one or more processors, and the storage device stores a computer program, and the computer program is executed by the processors to implement the material surface quality detection method.
In order to load the above method and system to operate successfully, the system may include more or less components than those described above, or combine some components, or different components, in addition to the various modules described above, for example, input/output devices, network access devices, buses, processors, memories, and the like.
The Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like that is the control center for the system and that connects the various components using various interfaces and lines.
The memory may be used to store computer and system programs and/or modules, and the processor may implement various functions of the system by executing or executing the computer programs and/or modules stored in the memory and calling data stored in the memory. The memory mainly comprises a storage program area and a storage data area, wherein the storage program area can store an operating system, application programs (such as an information acquisition template display function, a product information publishing function and the like) required by at least one function and the like; the storage data area may store data created according to the use of the berth-state display system (e.g., product information acquisition templates corresponding to different product types, product information that needs to be issued by different product providers, etc.), and the like. In addition, the memory may include high speed random access memory, and may also include non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), at least one magnetic disk storage device, a Flash memory device, or other volatile solid state storage device.
It should be understood that, although the steps in the flowcharts of the embodiments of the present invention are shown in sequence as indicated by the arrows, the steps are not necessarily executed in sequence as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a portion of the steps in various embodiments may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (9)
1. A method for detecting the surface quality of a material, the method comprising:
receiving a position confirmation signal of the material reaching the detection position;
projecting an optical phase detection light wave to the surface of the material according to the position confirmation signal;
capturing optical phase information according to the reflection condition of the detection optical wave, and constructing three-dimensional shape model data of the material according to the optical phase information;
analyzing the three-dimensional shape data and marking the quality defect of the surface of the material;
and sending the three-dimensional shape data with the marks to a display end.
2. The method for detecting the surface quality of a material according to claim 1, wherein the receiving of the position confirmation signal of the arrival of the material at the detection position specifically comprises:
sending a starting signal to a corresponding position sensor according to the type and the type of the material, so that the position sensor is in a starting monitoring state; the position of the position sensor corresponds to the size of the material, so that the central position of the material is just opposite to the emission position of the detection light wave after the material reaches the detection position;
and receiving a position confirmation signal of the material which is uploaded by the position sensor and reaches the detection position.
3. The method for detecting the quality of the surface of the material according to claim 2, wherein the projecting the optical phase detection light wave to the surface of the material according to the position confirmation signal specifically comprises:
adjusting the area of the detected light wave radiation according to position confirmation signals sent by the position sensors at different positions;
after adjustment, projecting light phase detection light waves to the surface of the material; the detection light wave covers the surface of the material.
4. The method for detecting the surface quality of the material according to claim 1, wherein the capturing the optical phase information according to the reflection condition of the detection optical wave and the constructing the three-dimensional shape model data of the material according to the optical phase information specifically comprises:
receiving reflected light waves refracted back after the detection light waves reach the surface of the material;
reconstructing the light intensity of the reflected light wave through an algorithm and converting the light intensity into optical phase information;
establishing three-dimensional appearance model units with different heights according to different optical phase information at different positions;
and fitting the three-dimensional shape model units at different positions to form three-dimensional shape model data.
5. The method for detecting the quality of the surface of the material according to any one of claims 1 to 4, wherein the analyzing the three-dimensional shape data and marking the quality defect of the surface of the material specifically comprises:
superposing the three-dimensional appearance model data and the material standard model data, and detecting the superposed area between the appearance surface of the superposed three-dimensional appearance model and the appearance surface of the material standard model;
obtaining a coincidence value according to the coincidence area and the appearance surface of the material standard model;
judging whether the coincidence value is smaller than a preset coincidence value or not;
and when the coincidence value is smaller than the preset coincidence value, marking the outer surface area of the three-dimensional outer shape model which is not coincident with the outer surface of the material standard model.
6. The method for inspecting the surface quality of a material according to claim 5, wherein after marking the outer shape surface area of the three-dimensional outer shape model which is not coincident with the outer shape surface of the material standard model when the coincidence value is smaller than the preset coincidence value, the method further comprises:
extracting the highest point coordinate and the lowest point coordinate in a continuous area in the surface area of the shape of the non-coincident three-dimensional shape model;
calculating the roughness value of the surface of the material according to the extracted coordinates of the plurality of highest points and the extracted coordinates of the lowest points;
judging whether the surface roughness value is larger than a preset roughness value or not;
and when the surface roughness value is larger than the preset roughness value, marking the highest point and the lowest point on the three-dimensional shape model.
7. The method for detecting the surface quality of the material according to claim 6, wherein the step of sending the three-dimensional shape data with the mark to a display terminal specifically comprises the steps of:
respectively marking and displaying a superposed region and a non-superposed region between the three-dimensional appearance model and the material standard model;
highlighting the highest point and the lowest point in the misaligned region with the surface roughness value larger than the preset roughness value;
sending the three-dimensional appearance model with the mark and the highlight to a display end;
and receiving the operation data uploaded from the display terminal.
8. A material surface quality inspection system, the system comprising:
the signal receiving module is used for receiving a position confirmation signal of the material reaching the detection position;
the detection control module is used for projecting optical phase detection light waves to the surface of the material according to the position confirmation signal;
the model building module is used for capturing optical phase information according to the reflection condition of the detection optical wave and building three-dimensional shape model data of the material according to the optical phase information;
the defect analysis module is used for analyzing the three-dimensional shape data and marking the quality defect of the surface of the material;
and the model data sending module is used for sending the three-dimensional shape data with the marks to the display end.
9. A storage device comprising one or more processors, the storage device storing a computer program, wherein the computer program when executed by the processors implements the method of material surface quality inspection of any one of claims 1-7.
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Application publication date: 20220125 |