CN113945788A - Detection method, detection device, detection equipment, electronic equipment and readable storage medium - Google Patents
Detection method, detection device, detection equipment, electronic equipment and readable storage medium Download PDFInfo
- Publication number
- CN113945788A CN113945788A CN202111196094.0A CN202111196094A CN113945788A CN 113945788 A CN113945788 A CN 113945788A CN 202111196094 A CN202111196094 A CN 202111196094A CN 113945788 A CN113945788 A CN 113945788A
- Authority
- CN
- China
- Prior art keywords
- current
- under test
- detection
- extraction
- serial number
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 170
- 238000003860 storage Methods 0.000 title claims abstract description 10
- 238000012545 processing Methods 0.000 claims abstract description 104
- 238000000605 extraction Methods 0.000 claims abstract description 97
- 238000012360 testing method Methods 0.000 claims description 91
- 238000000034 method Methods 0.000 claims description 34
- 239000000463 material Substances 0.000 claims description 15
- 238000004590 computer program Methods 0.000 claims description 9
- 238000009826 distribution Methods 0.000 claims description 9
- 238000007689 inspection Methods 0.000 claims description 8
- 230000008569 process Effects 0.000 description 19
- 238000010586 diagram Methods 0.000 description 10
- 238000004891 communication Methods 0.000 description 5
- 230000003993 interaction Effects 0.000 description 5
- 230000001960 triggered effect Effects 0.000 description 5
- 230000007547 defect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000011664 signaling Effects 0.000 description 2
- 230000026676 system process Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000007619 statistical method Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Facsimiles In General (AREA)
Abstract
According to the detection method, the detection device, the detection equipment, the electronic equipment and the readable storage medium, different identifications are generated by determining whether the current detected device is normal or invalid, namely if the current detected device is invalid, the invalid identification is generated, the invalid identification cannot be sent to an image processing system to obtain a detection result, if the current detected device is normal, an extraction serial number is generated, the detection result can be extracted from the image processing system according to the extraction serial number, and because the extraction serial number of each normal detected device can form a new continuous series, the image processing system can provide the detection result bound with the extraction serial number of the current detected device according to the new continuous series, the problem that the invalid device occupies the detection result of the normal device can be avoided.
Description
Technical Field
The invention relates to the technical field of detection, in particular to a detection method, a detection device, detection equipment, electronic equipment and a readable storage medium.
Background
With the development of semiconductor technology, the demand of basic electronic components such as resistors and capacitors is increased, and the demand of matched detection equipment is also increased.
At present, a sequence method is mostly adopted by a detection Device to label a Device Under Test (DUT), that is, a serial number of each DUT is generated according to a continuous sequence, and accordingly, detection results sequentially correspond to each other according to the sequence of the serial numbers, but this method also often brings fatal defects: once a failed DUT exists in the detection process, since the failed DUT also occupies the corresponding serial number but does not actually have a detection result, the detection result of the normal DUT is mapped to the failed DUT, and so on, thereby causing errors in the detection results of all subsequent DUTs.
Disclosure of Invention
An objective of the present invention is to provide a detection method, an apparatus, a detection device, an electronic device, and a readable storage medium, so as to avoid the problem of detection result dislocation caused by the invalid device occupying the detection result of the normal device.
In a first aspect, the present invention provides a detection method, the method comprising: determining whether a current device under test is failed or normal; if the current tested device fails, generating a corresponding failure identifier according to the classification serial number of the current tested device; the failure identification is not sent to an image processing system to obtain a detection result; if the current tested device is normal, generating an extraction sequence number of the current tested device; wherein, the extraction sequence number of the current tested device and the extraction sequence number of the last normal tested device form a continuous sequence; and obtaining the detection result of the current tested device according to the extraction serial number.
In a second aspect, the present invention provides a detection apparatus comprising: a determining module for determining whether a current device under test is failed or normal; a generating module, configured to generate a corresponding failure identifier according to the classification serial number of the current device under test if the current device under test fails; the failure identification is not sent to an image processing system to obtain a detection result; if the current tested device is normal, generating an extraction sequence number of the current tested device; the extraction sequence number of the current tested device and the extraction sequence number of the last normal tested device form a continuous sequence, and the extraction sequence number is used for indicating the image processing system to provide a detection result according to the continuous sequence.
In a third aspect, an embodiment of the present invention provides a detection apparatus, including the control system and an image processing system, where the control system is configured to determine whether a current device under test is failed or normal; if the current tested device fails, generating a corresponding failure identifier according to the classification serial number of the current tested device; the failure identification is not sent to an image processing system to obtain a detection result; if the current tested device is normal, generating an extraction sequence number of the current tested device; the control system is also used for sending the extraction sequence number to the image processing system; and the image processing system is used for obtaining the detection result of the current tested device according to the extraction serial number and sending the extraction serial number and the detection result to the control system.
In a fourth aspect, an electronic device according to an embodiment of the present invention includes a processor and a memory, where the memory stores a computer program that can be executed by the processor, and the processor can execute the computer program to implement the detection method according to the first aspect.
In a fifth aspect, the present invention provides a readable storage medium, on which a computer program is stored, where the computer program is executed by a processor to implement the detection method of the first aspect.
According to the detection method, the detection device, the detection equipment, the electronic equipment and the readable storage medium provided by the embodiment of the invention, different identifications are generated by determining whether the current detected device is normal or invalid, namely if the current detected device is invalid, the invalid identification is generated, and the invalid identification cannot be sent to an image processing system to obtain a detection result, if the current detected device is normal, an extraction serial number is generated, the extraction serial number can extract the detection result from the image processing system, and because the extraction serial number of each normal detected device can form a new continuous series, the image processing system can provide the detection result bound with the extraction serial number of the current detected device according to the new continuous series, so that the problem that the invalid device occupies the detection result of the normal device can be avoided.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic diagram of a conventional polyhedral AOI device;
FIG. 2 is a flow chart of a conventional detection method;
FIG. 3 is a schematic flow chart of a detection method according to an embodiment of the present invention;
FIG. 4 is a schematic flow chart of another detection method provided by the embodiment of the invention;
FIG. 5 is a schematic flow chart of another detection method provided by the embodiment of the invention;
fig. 6 is a schematic flowchart of an implementation manner of step S301 provided in the embodiment of the present invention;
FIG. 7 is a schematic flow chart of another detection method provided by the embodiment of the invention;
fig. 8 is an interaction process diagram of a detection process according to an embodiment of the present invention;
FIG. 9 is a functional block diagram of a detection apparatus according to an embodiment of the present application;
fig. 10 is a block diagram of an electronic device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that if the terms "upper", "lower", "inside", "outside", etc. indicate an orientation or a positional relationship based on that shown in the drawings or that the product of the present invention is used as it is, this is only for convenience of description and simplification of the description, and it does not indicate or imply that the device or the element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention.
Furthermore, the appearances of the terms "first," "second," and the like, if any, are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
It should be noted that the features of the embodiments of the present invention may be combined with each other without conflict.
Before describing particular aspects of the present application, the terminology referred to herein will be described.
Polyhedral AOI (Automated Optical Inspection, AOI for short) apparatus: the method is applied to industrial detection equipment of basic electronic components, and can judge the size of the basic electronic components and further judge whether the surfaces of the components have defects or not through AOI (automatic optical inspection) and visual recognition technology.
DUT (Device Under Test, DUT for short): devices under test, also referred to as devices under test (EUTs) and Units Under Test (UUTs), are manufactured products that are tested at the time of first manufacture or later in their lifecycle, as part of ongoing functional testing and calibration checks. This may include post repair testing to determine if the product is performing in accordance with the original product specification.
Classification number (ID Label 1): and each DUT is assigned with an ID Label1 when entering the detection flow so as to be distinguished from other DUTs.
Failure identification/extraction number (ID Label 2): for a failed DUT, ID Label2 refers to a failure identifier; for a normal DUT, the ID Label2 refers to an extraction sequence number, and the extraction sequence number can obtain the detection result of the corresponding DUT from the image processing system.
Sequence number: it means that in a sequence, the sequence element corresponds to a number, for example, the sequence is {1,3,2,4}, and 3 corresponds to a sequence number of 2 and 2 corresponds to a sequence number of 3.
With the development of semiconductor technology, the demand of basic electronic components such as resistors and capacitors is increased, and the demand of matched detection equipment is also increased. The size of the basic electronic element can be judged through the detection equipment, and whether the surface of the element has defects can be judged. A conventional DUT detection process is described below by taking a polyhedral AOI device as an example, please refer to fig. 1, and fig. 1 illustrates an architecture diagram of a conventional polyhedral AOI device.
As shown in fig. 1, the inspection apparatus 100 includes an inspection device 110, a control system 120, an encoding device 130, an image processing device 140, image capturing devices 150-1 to 150-n, and a material distribution system 160. Their respective connection relationships are shown in fig. 1. The structure diagram of the inspection apparatus illustrated in fig. 1 is merely an example, and does not limit the scale of the inspection apparatus. Wherein the arrows indicate the direction of signaling transmission.
In the architecture diagram of the detection apparatus shown in fig. 1, as shown in fig. 2, fig. 2 is a conventional detection flow chart, and an information flow interaction flow for detecting any DUT may include:
s1, the coding device sends a coder value to a control system.
The encoder device continuously sends the encoder value to the control system, and the encoder value can be used for the control system to determine whether the DUT reaches the detection position or not according to the encoder value, namely the shooting position of the image acquisition device.
And S2, the detection device sends a DUT signal to the control system.
When the DUT enters the detection flow, the detection device sends a detection signal to the control system to inform that the DUT enters the detection flow.
S3, when the control system receives the signal of the detection device, a unique ID Label1 is generated, and the ID Label1 is stored in the queue.
And S4, the control system sends a trigger signal to the image acquisition device and sends an ID Label1 to the image processing device.
When the control system determines that the DUT reaches the shooting position of the image acquisition device, a trigger signal is sent to the image acquisition device to trigger the image acquisition of the image acquisition device, and meanwhile, the ID Label of the DUT is pushed to the image processing system.
And S5, the image acquisition device sends the shot image to an image processing system.
S6, the image processing system receives the image of the image acquisition device, starts to process and analyze the image, and then binds the processing result with the ID Label 1.
And S7, the image processing system sends the bound processing result and the ID Label1 to the control system.
And S8, the control system sends the comprehensive processing result of the DUT to a material distributing system.
When a plurality of image acquisition devices exist, and the DUT passes through all the image acquisition devices, the control system performs comprehensive judgment by combining the processing results of the plurality of image processing systems, sends the final comprehensive result to the material distribution system, and the material distribution system processes the DUT, so that the process is finished.
For example, taking 6 image capturing devices as an example, assuming that the processing result of each image capturing device is OK, NG, OK for a certain DUT, the control system finally determines the detection result of the DUT as NG by using a statistical method. That is, when there are a plurality of image capturing devices, the detection result of the DUT is OK only if the processing result of each image capturing device is OK.
However, as can be seen from the above detection process, once a failed device occurs, the failed device is often directly classified into a type that needs to be re-detected, so that the control system does not send a trigger signal to the image acquisition device, and a detection result corresponding to the failed device does not naturally exist in the image processing system, if the control system still sends the ID Label1 corresponding to the failed device to the image processing system according to the above implementation process, at this time, the image processing system is likely to bind the detection result of the subsequent normal device with the ID Label1 of the failed device according to the serial sequence of the ID Label1, which causes a misalignment phenomenon that the failed device occupies the detection result of the normal device, and thus the error is always transmitted in the subsequent detected DUTs, and the misalignment result always exists in the system.
For example, assuming that there are 4 consecutive DUTs, i.e., DUT W, DUT X, DUT Y, and DUT Z, whose ID Label1 is k, k +1, k +2, and k +3, respectively, if DUT X is a failed device, there is actually no image processing result corresponding to DUT X in the image processing system, if DUT Y is currently detected, however, there are k +1 corresponding to DUT X, k +2 corresponding to DUT Y, and image processing result of DUT Y in the image processing system, then in sequence order, the image processing system will bind k +1 corresponding to DUT X with the image processing result of DUT Y, and further cause k +2 corresponding to DUT Y with the image processing result of DUT Z, and so on, such an error will be passed through in DUTs that are subsequently detected, and will always exist in the detection process.
In order to solve the above problem, an embodiment of the present invention provides a detection method based on the architecture of the detection device shown in fig. 1, as shown in fig. 3, fig. 3 is a schematic flowchart of a detection method provided by an embodiment of the present invention, where the method includes:
s301, determining whether the current tested device is failed or normal.
It should be noted that, if the current device under test is the first device under test entering the detection flow, the normal device processing is directly performed.
S302, if the current tested device fails, generating a corresponding failure identifier according to the classification serial number of the current tested device.
Wherein the failure flag is not sent to the image processing system to obtain the detection result.
For example, the detection flow shown in fig. 2 is taken as an example, that is, if the current device under test fails, the control system does not send the identification information of the current device under test to the image processing system, so that the detection result and the identification information thereof are not bound, and the dislocation phenomenon caused by the fact that the failed current device under test occupies the subsequent normal detection result of the device under test can be avoided.
And S303, if the current tested device is normal, generating an extraction serial number of the current tested device, and obtaining a detection result of the current tested device according to the extraction serial number.
The extraction sequence number of the current tested device and the extraction sequence number of the last normal tested device form a continuous sequence, and the extraction sequence number is used for indicating the image processing system to provide a detection result corresponding to the current tested device according to the continuous sequence. In one implementation, the extraction sequence number of the current device under test can be generated according to the classification sequence number of the current device under test and the extraction sequence number of the last normal device under test; in another possible implementation manner, the extraction serial number of the current normal device under test can be calculated according to the classification serial number of the current normal device under test and the number of the failed devices under test.
That is, continuing with fig. 2 as an example, the control system does not send the ID Label1 to the image processing system, but forms a new continuous series according to the ID Label2 of each normal device under test, and then sends the ID Label2 of the normal device under test to the image processing system, so that the image processing system provides the detection result bound to the ID Label2 of the current device under test according to the new continuous series, thereby avoiding the problem that the failed device occupies the detection result of the normal device.
The detection method provided by the embodiment of the invention is different from the prior art in that after the classification serial number ID Label1 is generated for each DUT, the ID Label1 is utilized to obtain the detection result from the image processing system, once the failed device under test occurs, because the failed device under test also occupies one ID Label1, the image processing system is caused to associate the detection result of the subsequent device under test to the ID Label1 of the failed device under test, so that the result dislocation phenomenon continues in the system all the time, in order to solve the problem, although the classification serial number ID Label1 is generated for each DUT, in the case of the failed device, the failure Label is generated, the failure Label is not sent to the image processing system to obtain the detection result, but the extraction serial number ID Label2 is generated for the normal device, and the ID Label2 of each normal device under test can form a new continuous series, and then the ID Label2 of the normal tested device is sent to the image processing system, and then the image processing system provides the detection result bound by the ID Label2 of the current tested device according to the new continuous series, so that the problem that the failed device occupies the detection result of the normal device can be avoided.
For the purpose of understanding, taking the 4 continuous DUTs, namely DUT W, DUT X, DUT Y and DUT Z as an example, assuming that DUT W is the last normal device under test, the extraction serial number is n, the image processing system receives the extraction serial number n, and then binds the currently obtained detection result with n and feeds back the detection result to the control system, and further, the current device under test is DUT X, the classification serial number is k +1, if DUT X fails, a corresponding failure identifier is generated, and the failure identifier is not pushed to the image processing system; if the DUT X is normal, generating an extraction serial number n +1 corresponding to the DUT X according to n corresponding to the DUT W, and as can be seen, n and n +1 form a continuous sequence, then pushing n +1 to the image processing system, and the image processing system binding the detection result with n +1 according to the continuous sequence and sending the detection result back to the control system, thereby avoiding the dislocation phenomenon caused by the detection result of the normal device occupied by the failed device.
In some possible embodiments, in step S303, the extraction sequence numbers of each normal device under test are grouped into a continuous sequence, so as to make the extraction sequence numbers pushed by the control system continuous, and thus, the number of times of triggering the image acquisition device is combined to determine whether the image processing system has the problem of missing image, so that the image processing system can process and correct the image in time.
In some possible embodiments, the classification serial number, the extraction serial number, and the form of the revocation identifier appearing in steps S301, S302, and S303 may include, but are not limited to, numbers, letters, special symbols, and combinations thereof.
In one possible embodiment, for step S303, the continuous series of sequences may be replaced by any custom sequence, including but not limited to increasing, decreasing, looping, and the like.
In a possible embodiment, the failure flag may be a number, a letter, a special symbol, or a combination thereof, which is not limited herein, and it is noted that continuity between extraction serial numbers corresponding to normal devices may not be broken in the process of generating the failure flag.
For example, continuing with the example of the 4 consecutive DUTs described above, i.e., DUT W, DUT X, DUT Y, and DUT Z, their ID Label1 are K, K +1, K +2, and K +3, respectively, and their ID Label2 is n, and n +1, respectively, by calculation, wherein the ID Label2 of DUT X and DUT Y may be other values as long as the continuity between DUT W and DUT Z is not affected.
In some possible embodiments, after generating the ID Label2 (including the failure identifier or the extraction serial number) for each device under test, the corresponding relationship between the ID Label2 and the classification serial number ID Label1 may be stored, so that the ID Label2 is subsequently restored to the ID Label1, and the detection result and the restored ID Label1 are sent to the material distribution system for processing.
Optionally, since the process of capturing an image by the image capturing device and transmitting the image to the image processing system is not necessarily reliable, for example, the image capturing is triggered by the camera, but the image processing system does not receive the image, and it is considered that there is no DUT, and at this time, the DUT detection result is also misplaced, in order to solve this problem, an embodiment of the present invention further provides a correction manner to determine whether the image processing system misses the image, please refer to fig. 4, where fig. 4 is a schematic flow chart of another detection method provided by the embodiment of the present invention, and the method may further include:
s304, obtaining the currently generated extraction sequence number and the triggering times of the image acquisition device.
S305, if the sequence number corresponding to the extraction sequence number is not consistent with the triggering frequency, determining that the image processing system fails to receive the image.
S306, correcting the extraction sequence number according to the triggering times.
The image acquisition device is used for acquiring images of the device to be detected and sending the generated images to the image processing system for processing to obtain a detection result.
It can be understood that, every time a DUT is detected, the image capturing device is triggered, the image capturing device receives an image, and since the extraction sequence number of each normal device is a continuous sequence, the sequence number of the currently generated extraction sequence number should be consistent with the trigger number in the case that there is no missed image.
For example, assuming that the DUT W, the DUT X, the DUT Y, and the DUT Z are all normal devices, their corresponding ID labels 1 are divided into n, n +1, n +2, n +3, if the current device under test is the DUT W, and the image acquisition device should trigger 1 time to obtain the image of the DUT W, the sequence number 1 corresponding to the extraction sequence number n is consistent with the trigger 1 time; on the contrary, if the device under test is DUT X, the corresponding sequence number of the extraction number n +1 is 2, and if the number of times of triggering the image capturing device is 1, the two are not consistent, which indicates that there is a problem of missing image.
In step S305, there are two scenarios that the sequence number is not consistent with the trigger number:
in the first scenario, the sequence number is less than the number of triggers, because when the previous DUT is detected, the image capture device is triggered, and although the image processing system receives the image of the current DUT, it does not read the ID Label2 of the previous DUT from the control system, so that the image processing system does not feed back the processing result to the control system, and when the current DUT is detected, the image capture device is triggered again, but when the image processing system reads the ID Label2 of the previous DUT, the serial number is less than the number of triggers.
In this case, the method for correcting the extraction sequence number may be: and continuously reading the ID Label2 from the control system until the sequence number of the read ID Label2 is equal to the number of the current read triggers.
In a second scenario: the reason why the serial number is greater than the number of triggers is that after the image processing system receives the image of the current DUT, more than 1 ID Label2 (for example, 2 ID labels 2) including the ID Label2 of the next DUT is read from the control system for some reason, and thus, the serial number for obtaining the currently generated extraction serial number is greater than the number of triggers.
For the above scenario, the manner of correcting the extraction sequence number may be: the read ID Label2 needs to be temporarily stored, the result is not fed back to the control system, when the image is received next time, the ID Label2 is read from the control system, and then the temporarily stored ID Label2 is compared with the triggering times, so that the serial number of the extracted serial number is equal to the triggering times.
Optionally, an implementation manner for classifying the device under test after obtaining the detection result of the current device under test is further provided below, please refer to fig. 5, where fig. 5 is a schematic flow chart of another detection method provided in the embodiment of the present invention, and the method further includes:
s307, when the extraction sequence number and the detection result corresponding to the extraction sequence number sent by the image processing system are received, the classification sequence number corresponding to the detection result is determined according to the corresponding relation between the extraction sequence number and the classification sequence number.
And S308, sending the detection result and the classification serial number corresponding to the detection result to a material distribution system so that the classification system classifies the tested device corresponding to the classification serial number.
It can be understood that, after the control system generates the extraction sequence number, the control system may store the correspondence between the extraction sequence number and the classification sequence number, so as to restore the extraction sequence number in the following, and determine the DUT corresponding to the detection result. After receiving the extraction serial number and the detection result sent by the image processing system, in order to determine the DUT corresponding to the detection result, the detection result and the classification serial number may be bound according to the restored classification serial number, and sent to the material distribution system for classification.
When the control system needs to transmit the processing information to the material separating system 14, since the material separating system 14 processes each DUT, it is necessary to restore the ID Label2 to the ID Label1 according to the above-mentioned array, for example, to restore the value n +1 of the ID Label2 attached to the result received by the image processing system 9 to the value k +3 of the ID Label1, and finally to feed the result to the material separating system 14, thereby completing the classification processing.
In some possible embodiments, the material separating system may place the DUT corresponding thereto at a designated position according to the sorting sequence number, so as to achieve sorting.
Optionally, since the testing device usually labels the DUT that is too close to the DUT as failure, an embodiment for determining whether the current device under test is normal or failed is provided below, please refer to fig. 6, where fig. 6 is a schematic flow chart of an implementation manner of step S301 provided in the embodiment of the present invention.
S300-1, detecting whether the distance between the current tested device and the last tested device is larger than or equal to a preset distance threshold value.
In some possible embodiments, the preset distance threshold may be defined according to the actual mechanical structure of the detection device, for example, may be determined according to the rotation speed of the detection device turntable, and the preset distance threshold is defined as 250 pulses.
S300-2, if the distance is larger than or equal to the preset distance threshold, determining that the current device under test is normal.
And S300-3, if the distance is smaller than a preset distance threshold, determining that the current device to be tested is invalid.
In the implementation of the present invention, a failed DUT can be determined by determining whether two DUTs are bonded together, where a difference is that 2 DUTs are bonded together, and a distance between the 2 bonded DUTs is smaller than a length of a single DUT; too close means that the distance between 2 DUTs will be greater than the length of a single DUT.
In a possible implementation manner, a preset distance threshold for determining whether two DUTs are too close to each other may be set as a first preset distance threshold, and a preset distance threshold for determining whether two DUTs are bonded together may be set as a second preset distance threshold, where the first preset distance threshold is greater than the second preset distance threshold, if a distance between a current device under test and a last device under test is less than the second preset distance threshold, it is determined that both the current device under test and the last device under test are failed, if a distance between the current device under test and the last device under test is greater than or equal to the second preset distance threshold, it is determined that whether a distance between the current device under test and the last device under test is less than the first preset distance threshold, if so, it is determined that the current device under test is failed, and if not, it is determined that the current device under test is normal.
Optionally, a processing manner for the failed device is further provided below, please refer to fig. 7, and fig. 7 is a schematic flow chart of another detection method provided in the embodiment of the present invention.
S309, if the current device to be tested is determined to be invalid, stopping sending the trigger signal to the image acquisition device.
It can be understood that, if the current device under test fails, the image acquisition device may not be triggered to acquire the image of the current device under test, so that the image processing system naturally does not have the detection result of the current device under test, and the dislocation phenomenon caused by the detection result of the failed device occupying the extraction serial number of the normal device can be prevented.
S310, if the current device under test is determined to be normal, when the current device under test is determined to reach the position of the image acquisition device, a trigger signal is sent to the image acquisition device, so that the image acquisition device acquires an image of the current device under test.
In one possible implementation, for step S310, before sending the trigger signal to the image acquisition apparatus, it may be determined whether the current device under test reaches the position of the image acquisition apparatus by:
and determining whether the current device under test reaches the position of the image acquisition device or not according to the obtained encoder value.
Optionally, when the DUT enters the detection process, a classification sequence number needs to be configured for each DUT, and an implementation manner for generating the classification sequence number is further provided below, that is:
and when receiving a detection signal of the detection sensor, generating a serial number which is continuous with the classification serial number of the last tested device as the classification serial number corresponding to the current tested device.
In some possible embodiments, the detection sensor may be, but is not limited to, a fiber optic sensor, a laser sensor, a vision sensor.
In the following, the polyhedral AOI device shown in fig. 1 is used to introduce the scheme provided in the embodiment of the present application from the perspective of the working principle of the interaction process of each component in fig. 1, please refer to fig. 8, and fig. 8 is an interaction process diagram of a detection flow provided in the embodiment of the present invention.
S801, the encoding device sends the encoder value to the control system.
S802, the detection device sends a DUT signal to the control system.
And S803, when the control system receives the signal of the detection device, generating a unique ID Label1, and storing the ID Label1 in a queue.
S804, whether the DUT is normal or failure is determined. If the process is normal, the following process is executed:
in step S805a, the control system creates an extraction number ID Label2 and stores a correspondence relationship between ID Label2 and ID Label 1.
And S806, the control system sends the extraction serial number ID Label2 to the image processing system and sends a triggering photographing signal to the image acquisition device.
S807, the image acquisition device sends the image to the image processing system.
And S808, the image processing system processes the image and binds the processing result with the ID Label 2.
S809, the image processing system sends the bound ID Label2 and the processing result to the control system.
And S810, the control system restores the ID Label1 according to the corresponding relation between the ID Label2 and the ID Label 1.
S811a, the control system sends the comprehensive test result of the DUT and the ID Label1 to the material distributing system.
If the failure occurs, the following processes are executed:
s805b, the control system generates a failure identifier ID Label2 and stores the corresponding relation between the ID Label2 and the ID Label 1.
S811b, the control system sends the ID Label1 to the material distribution system.
In order to implement the steps in the foregoing embodiments to achieve the corresponding technical effects, the image feature extraction method provided in the embodiments of the present application may be implemented in a hardware device or in a form of a software module, and when the image feature extraction method is implemented in a form of a software module, an image feature extraction apparatus is further provided in the embodiments of the present application, please refer to fig. 9, where fig. 9 is a functional block diagram of a detection apparatus provided in the embodiments of the present application, and the detection apparatus 400 may include:
a determining module 410 for determining whether the current device under test is failed or normal;
a generating module 420, configured to generate a corresponding failure identifier according to the classification serial number of the current device under test if the current device under test fails; the failure identification is not sent to an image processing system to obtain a detection result; if the current tested device is normal, generating an extraction sequence number of the current tested device; the extraction sequence number of the current tested device and the extraction sequence number of the last normal tested device form a continuous sequence, and the extraction sequence number is used for indicating the image processing system to provide a detection result according to the continuous sequence.
It is understood that the determining module 410 and the generating module 420 can cooperatively perform steps S301 to S303 in fig. 3 to achieve corresponding technical effects.
Optionally, the detection apparatus 400 further includes a modification module, configured to: acquiring the currently generated extraction sequence number and the triggering times of the image acquisition device; if the sequence number corresponding to the extraction sequence number is inconsistent with the triggering times, determining that the image processing system fails to receive the image; and correcting the extraction sequence number according to the triggering times. The image acquisition device is used for acquiring an image of a device to be detected and sending the generated image to the image processing system for processing to obtain the detection result.
Optionally, the detection apparatus 400 further includes a restoring module and a sending module, where the restoring module is configured to, when receiving the extraction sequence number sent by the image processing system and the detection result corresponding to the extraction sequence number, determine, according to a correspondence between the extraction sequence number and the classification sequence number, a classification sequence number corresponding to the detection result; and the sending module is used for sending the detection result and the classification serial number corresponding to the detection result to a material distribution system so that the classification system classifies the tested device corresponding to the classification serial number.
Optionally, the determining module 410 is specifically configured to: detecting whether the distance between the current tested device and the last tested device is larger than or equal to a preset distance threshold value or not; if the distance is greater than or equal to the preset distance threshold, determining that the current device under test is normal; and if the distance is smaller than the preset distance threshold, determining that the current device under test is invalid.
Optionally, the sending module is further configured to stop sending a trigger signal to the image acquisition device if it is determined that the current device under test is invalid; if the current device under test is determined to be normal, when the current device under test is determined to reach the position of the image acquisition device, a trigger signal is sent to the image acquisition device, so that the image acquisition device acquires an image of the current device under test.
Optionally, the generating module 420 is further configured to generate, when receiving a detection signal of the detection sensor, a serial number consecutive to the classification serial number of the last device under test as the classification serial number corresponding to the current device under test.
Optionally, the determining module 410 is further configured to: and determining whether the current device under test reaches the position of the image acquisition device according to the obtained encoder value.
The embodiment of the application also provides detection equipment, which comprises a control system and an image processing system.
A control system for determining whether a current device under test is failed or normal; if the current tested device fails, generating a corresponding failure identifier according to the classification serial number of the current tested device; the failure identification is not sent to the image processing system to obtain a detection result; if the current tested device is normal, generating an extraction serial number of the current tested device according to the classification serial number of the current tested device and the extraction serial number of the last normal tested device;
the control system is also used for sending the extraction sequence number to the image processing system;
and the image processing system is used for obtaining the detection result of the current tested device according to the extraction serial number and sending the extraction serial number and the detection result to the control system.
In some possible embodiments, the above-mentioned detection device may be, but is not limited to, a polyhedral AOI device as shown in fig. 1.
It will be appreciated that the detection device described above may be used to perform the steps as shown in the figures to the drawings to achieve the corresponding technical effect.
The embodiment of the present application further provides an electronic device, which may be other terminals with a data processing function, and the present application is not limited thereto.
Referring to fig. 10, fig. 10 is a block schematic diagram of an electronic device according to an embodiment of the present disclosure. The electronic device 50 comprises a communication interface 501, a processor 502 and a memory 503. The processor 502, memory 503 and communication interface 501 are electrically connected to each other, directly or indirectly, to enable the transfer or interaction of data. For example, the components may be electrically connected to each other via one or more communication buses or signal lines. The memory 503 can be used for storing software programs and modules, such as program instructions/modules corresponding to the detection method provided in the embodiments of the present application, and the processor 502 executes various functional applications and data processing by executing the software programs and modules stored in the memory 503. The communication interface 501 may be used for communicating signaling or data with other node devices. The electronic device 50 may have a plurality of communication interfaces 501 in this application.
The Memory 503 may be, but is not limited to, a Random Access Memory (RAM), a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable Read-Only Memory (EPROM), an electrically Erasable Read-Only Memory (EEPROM), and the like.
The processor 502 may be an integrated circuit chip having signal processing capabilities. The Processor may be a general-purpose Processor including a Central Processing Unit (CPU), a Network Processor (NP), etc.; but may also be a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc.
Alternatively, when the detection method is implemented in the form of a software module, each functional module in the detection apparatus 400 according to the embodiment of the present application may be stored in a memory in the form of software or Firmware (Firmware) or be fixed in an Operating System (OS) of the electronic device 50, and may be executed by the processor 502 in the electronic device 50. Meanwhile, data, codes of programs, and the like required to execute the above modules may be stored in the memory 503.
The embodiment of the present application further provides a readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the detection method according to any one of the foregoing embodiments. The computer readable storage medium may be, but is not limited to, various media that can store program codes, such as a U disk, a removable hard disk, a ROM, a RAM, a PROM, an EPROM, an EEPROM, a magnetic or optical disk, etc.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (11)
1. A method of detection, the method comprising:
determining whether a current device under test is failed or normal;
if the current tested device fails, generating a corresponding failure identifier according to the classification serial number of the current tested device; the failure identification is not sent to an image processing system to obtain a detection result;
if the current tested device is normal, generating an extraction serial number of the current tested device, and obtaining a detection result of the current tested device according to the extraction serial number;
wherein, the extraction sequence number of the current device under test and the extraction sequence number of the last normal device under test form a continuous sequence.
2. The detection method according to claim 1, further comprising:
acquiring the currently generated extraction sequence number and the triggering times of the image acquisition device;
if the sequence number corresponding to the extraction sequence number is inconsistent with the triggering times, determining that the image processing system fails to receive the image;
correcting the extraction sequence number according to the triggering times;
the image acquisition device is used for acquiring an image of a device to be detected and sending the generated image to the image processing system for processing to obtain the detection result.
3. The detection method according to claim 1 or 2, characterized in that the method further comprises:
when receiving the extraction sequence number sent by the image processing system and a detection result corresponding to the extraction sequence number, determining a classification sequence number corresponding to the detection result according to the corresponding relation between the extraction sequence number and the classification sequence number;
and sending the detection result and the classification serial number corresponding to the detection result to a material distribution system so that the classification system classifies the tested device corresponding to the classification serial number.
4. The method of claim 1, wherein determining whether the current device under test is faulty or normal comprises:
detecting whether the distance between the current tested device and the last tested device is larger than or equal to a preset distance threshold value or not;
if the distance is greater than or equal to the preset distance threshold, determining that the current device under test is normal;
and if the distance is smaller than the preset distance threshold, determining that the current device under test is invalid.
5. The detection method according to claim 4, further comprising:
if the current device to be tested is determined to be invalid, stopping sending a trigger signal to an image acquisition device;
if the current device under test is determined to be normal, when the current device under test is determined to reach the position of the image acquisition device, a trigger signal is sent to the image acquisition device, so that the image acquisition device acquires an image of the current device under test.
6. The inspection method of claim 1, wherein prior to determining whether the current device under test is faulty or normal, the method further comprises:
and when a detection signal of the detection sensor is received, generating a serial number which is continuous with the classification serial number of the last tested device as the classification serial number corresponding to the current tested device.
7. The detection method according to claim 5, wherein before sending a trigger signal to the image acquisition device, the method further comprises:
and determining whether the current device under test reaches the position of the image acquisition device according to the obtained encoder value.
8. A detection device, comprising:
a determining module for determining whether a current device under test is failed or normal;
a generating module, configured to generate a corresponding failure identifier according to the classification serial number of the current device under test if the current device under test fails; the failure identification is not sent to an image processing system to obtain a detection result; if the current tested device is normal, generating an extraction serial number of the current tested device according to the classification serial number of the current tested device and an extraction serial number of a last normal tested device, and obtaining a detection result of the current tested device according to the extraction serial number;
wherein, the extraction sequence number of the current device under test and the extraction sequence number of the last normal device under test form a continuous sequence.
9. An inspection apparatus, comprising a control system and an image processing system;
the control system is used for determining whether the current tested device is failed or normal; if the current tested device fails, generating a corresponding failure identifier according to the classification serial number of the current tested device; the failure identification is not sent to an image processing system to obtain a detection result; if the current tested device is normal, generating an extraction sequence number of the current tested device;
the control system is also used for sending the extraction sequence number to the image processing system;
and the image processing system is used for obtaining the detection result of the current tested device according to the extraction serial number and sending the extraction serial number and the detection result to the control system.
10. An electronic device, comprising a processor and a memory, the memory storing a computer program executable by the processor, the processor being operable to execute the computer program to implement the detection method of any one of claims 1 to 7.
11. A readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the detection method according to any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111196094.0A CN113945788B (en) | 2021-10-14 | 2021-10-14 | Detection method, detection device, detection apparatus, electronic apparatus, and readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111196094.0A CN113945788B (en) | 2021-10-14 | 2021-10-14 | Detection method, detection device, detection apparatus, electronic apparatus, and readable storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113945788A true CN113945788A (en) | 2022-01-18 |
| CN113945788B CN113945788B (en) | 2024-01-30 |
Family
ID=79329788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111196094.0A Active CN113945788B (en) | 2021-10-14 | 2021-10-14 | Detection method, detection device, detection apparatus, electronic apparatus, and readable storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113945788B (en) |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030069664A1 (en) * | 2001-08-31 | 2003-04-10 | Dirk Caspary | Method and device for sorting wafers |
| CN101140307A (en) * | 2006-09-04 | 2008-03-12 | 中芯国际集成电路制造(上海)有限公司 | Automatically visual inspection method |
| EP1073031B1 (en) * | 1999-07-30 | 2008-07-30 | The Goodyear Tire & Rubber Company | Permanent tamper resistant bar code labels for tires |
| JP2008229883A (en) * | 2007-03-16 | 2008-10-02 | National Printing Bureau | Manufacturing system of sequence number product |
| CN101871981A (en) * | 2010-06-01 | 2010-10-27 | 佛山市中格威电子有限公司 | Automatic detection and regulation method and circuit for air conditioner |
| CN107977626A (en) * | 2017-11-30 | 2018-05-01 | 厦门理工学院 | The group technology of a kind of electronic equipment operational data |
| CN208239579U (en) * | 2018-05-22 | 2018-12-14 | 江阴佳泰电子科技有限公司 | Ink jet type on middle scaffold tower and platform gets marker ready |
| CN109411380A (en) * | 2018-09-29 | 2019-03-01 | 杭州广立微电子有限公司 | A kind of test method of storage medium and wafer scale integrated circuit electrical parameter |
| CN109817538A (en) * | 2019-01-22 | 2019-05-28 | 上海华虹宏力半导体制造有限公司 | SRAM failure on-line testing method |
| CN110381253A (en) * | 2019-07-22 | 2019-10-25 | 银河水滴科技（北京）有限公司 | A kind of control method of quality testing, apparatus and system |
| CN111524845A (en) * | 2020-04-28 | 2020-08-11 | 北京北方华创微电子装备有限公司 | Wafer transfer method of semiconductor processing equipment and semiconductor processing equipment |
| CN112763497A (en) * | 2020-12-24 | 2021-05-07 | 凌云光技术股份有限公司 | Visual inspection image sequence matching system and method based on level coding triggering |
| CN113492114A (en) * | 2021-09-08 | 2021-10-12 | 苏州贝克微电子有限公司 | Semiconductor chip testing method and device for integrated circuit |
-
2021
- 2021-10-14 CN CN202111196094.0A patent/CN113945788B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1073031B1 (en) * | 1999-07-30 | 2008-07-30 | The Goodyear Tire & Rubber Company | Permanent tamper resistant bar code labels for tires |
| US20030069664A1 (en) * | 2001-08-31 | 2003-04-10 | Dirk Caspary | Method and device for sorting wafers |
| CN101140307A (en) * | 2006-09-04 | 2008-03-12 | 中芯国际集成电路制造(上海)有限公司 | Automatically visual inspection method |
| JP2008229883A (en) * | 2007-03-16 | 2008-10-02 | National Printing Bureau | Manufacturing system of sequence number product |
| CN101871981A (en) * | 2010-06-01 | 2010-10-27 | 佛山市中格威电子有限公司 | Automatic detection and regulation method and circuit for air conditioner |
| CN107977626A (en) * | 2017-11-30 | 2018-05-01 | 厦门理工学院 | The group technology of a kind of electronic equipment operational data |
| CN208239579U (en) * | 2018-05-22 | 2018-12-14 | 江阴佳泰电子科技有限公司 | Ink jet type on middle scaffold tower and platform gets marker ready |
| CN109411380A (en) * | 2018-09-29 | 2019-03-01 | 杭州广立微电子有限公司 | A kind of test method of storage medium and wafer scale integrated circuit electrical parameter |
| CN109817538A (en) * | 2019-01-22 | 2019-05-28 | 上海华虹宏力半导体制造有限公司 | SRAM failure on-line testing method |
| CN110381253A (en) * | 2019-07-22 | 2019-10-25 | 银河水滴科技（北京）有限公司 | A kind of control method of quality testing, apparatus and system |
| CN111524845A (en) * | 2020-04-28 | 2020-08-11 | 北京北方华创微电子装备有限公司 | Wafer transfer method of semiconductor processing equipment and semiconductor processing equipment |
| CN112763497A (en) * | 2020-12-24 | 2021-05-07 | 凌云光技术股份有限公司 | Visual inspection image sequence matching system and method based on level coding triggering |
| CN113492114A (en) * | 2021-09-08 | 2021-10-12 | 苏州贝克微电子有限公司 | Semiconductor chip testing method and device for integrated circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113945788B (en) | 2024-01-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104850475B (en) | A kind of test method and device of equipment | |
| CN110874691A (en) | General assembly offline control method and system | |
| KR101044544B1 (en) | Method for monitoring the execution of a program in a micro-computer | |
| CN111221807A (en) | Cloud service-oriented industrial equipment big data quality testing method and architecture | |
| US20040169745A1 (en) | Method and device for recognizing or displaying image defects in image recording systems | |
| JPS63317787A (en) | Inspector for digital circuit | |
| CN107632909B (en) | Method and system for automatically testing device functions | |
| CN113945788B (en) | Detection method, detection device, detection apparatus, electronic apparatus, and readable storage medium | |
| US20210019242A1 (en) | Method, A Diagnosing System And A Computer Program Product For Diagnosing A Fieldbus Type Network | |
| CN112763497B (en) | Visual detection image sequence matching system and method based on level coding triggering | |
| CN112995656B (en) | Abnormality detection method and system for image processing circuit | |
| CN115861161A (en) | Machine learning system, learning data collection method, and storage medium | |
| US20140055160A1 (en) | Apparatus and method for inspection of marking | |
| KR20150104766A (en) | Tracking method for badness history in inspection process | |
| JP2900781B2 (en) | Cable connection abnormality detection circuit and method | |
| CN112907540A (en) | Splicing abnormity detection method, device, equipment and medium | |
| CN114128180A (en) | Electronic device with CRC generator and method for transmitting data from electronic device to control unit | |
| CN117723550B (en) | Detection method and device of product quality detection equipment and electronic equipment | |
| CN116381452B (en) | Chip testing method, device and system and readable storage medium | |
| CN117350319B (en) | Method and system for preventing error of product associated data | |
| EP4276741A1 (en) | Analysis device, analysis system, analysis program, and analysis method | |
| JP7332028B2 (en) | Methods, apparatus, computer programs and media containing computer instructions for performing inspection of items | |
| JP5198040B2 (en) | Control device, inspection device, and control method | |
| EP4254325A1 (en) | Inspection of printed circuit board assemblies | |
| CN113358172B (en) | Method, device, equipment and medium for automatically setting electromechanical synchronization of water meter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |