CN113933740A - Pulse xenon lamp testing method - Google Patents
Pulse xenon lamp testing method Download PDFInfo
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- CN113933740A CN113933740A CN202111028412.2A CN202111028412A CN113933740A CN 113933740 A CN113933740 A CN 113933740A CN 202111028412 A CN202111028412 A CN 202111028412A CN 113933740 A CN113933740 A CN 113933740A
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- China
- Prior art keywords
- xenon lamp
- pulse xenon
- power supply
- flash
- state
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Links
- 229910052724 xenon Inorganic materials 0.000 title claims abstract description 74
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 title claims abstract description 74
- 238000012360 testing method Methods 0.000 title claims abstract description 54
- 238000001514 detection method Methods 0.000 claims abstract description 19
- 239000003990 capacitor Substances 0.000 claims description 14
- 238000005070 sampling Methods 0.000 claims description 5
- 230000001360 synchronised effect Effects 0.000 abstract description 3
- 230000002159 abnormal effect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000001105 regulatory effect Effects 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/44—Testing lamps
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
Abstract
The invention discloses a pulse xenon lamp testing method, which comprises the following steps: s100, respectively connecting a plurality of pulse xenon lamps to corresponding test stations, wherein each test station is provided with an independent power supply assembly; s200, the controller sequentially sends trigger signals to the power supply assembly corresponding to each test station according to a preset trigger time point and a preset trigger sequence, the pulse xenon lamp on each test station is sequentially lightened, and the detection assembly generates a state signal according to a flash signal of the corresponding pulse xenon lamp and feeds the state signal back to the controller; and S300, judging the flash state of the pulse xenon lamp by the controller according to the received state signal and transmitting the flash state to a display unit for displaying. The synchronous triggering of a plurality of pulse xenon lamps can be avoided to generate larger signal interference, the flash signal which influences the detection of the detection assembly is prevented, the state signal is effective, and the accuracy of the detection result is ensured.
Description
Technical Field
The invention relates to the field of lamp testing, in particular to a pulse xenon lamp testing method.
Background
The pulse xenon lamp is a xenon lamp which generates high-intensity flash in a very short time by using stored electric energy or chemical energy. The spectral characteristics of the pulse xenon lamp are close to sunlight, and the pulse xenon lamp adopts a quartz glass tube with high light transmittance and has the characteristics of high brightness and long service life.
At present, a single power supply assembly and a plurality of pulse xenon lamp test stations are adopted in a pulse xenon lamp test system, the number of the pulse xenon lamp stations is increased, the shortest flash interval time of each pulse xenon lamp is increased, the test efficiency is low, and the accuracy of a detection result is influenced due to the fact that a plurality of pulse xenon lamps are synchronously triggered to cause large signal interference.
Disclosure of Invention
The present invention is directed to solving at least one of the problems of the prior art. Therefore, the invention provides a pulse xenon lamp testing method which can avoid interference among pulse xenon lamps in the testing process.
According to the embodiment of the first aspect of the invention, the pulse xenon lamp testing method comprises the following steps:
s100, respectively connecting a plurality of pulse xenon lamps to corresponding test stations, wherein each test station is provided with an independent power supply assembly;
s200, the controller sequentially sends trigger signals to the power supply assembly corresponding to each test station according to a preset trigger time point and a preset trigger sequence, the pulse xenon lamps on each test station are lightened one by one, and the detection assembly generates state signals according to the flash signals of the corresponding pulse xenon lamps and feeds the state signals back to the controller;
and S300, judging the flash state of the pulse xenon lamp by the controller according to the received state signal and transmitting the flash state to a display unit for displaying.
The pulse xenon lamp testing method according to the embodiment of the first aspect of the invention has at least the following technical effects: according to the invention, the power supply assembly is arranged on each test station, the shortest flashing interval time of each pulse xenon lamp is determined by the corresponding power supply assembly, the influence of the number of test modules is avoided, the shortest flashing interval time is shorter, and the test efficiency can be improved; each pulse xenon lamp is a flash time unit from being turned on to being turned off, the number of the test modules for receiving the trigger signals in the flash time unit is regulated by the preset trigger time points and the preset trigger sequence, the pulse xenon lamps on each test station are sequentially turned on by the controller, large signal interference caused by synchronous triggering of the pulse xenon lamps is avoided, the flash signals detected by the detection assembly are prevented from being influenced, the state signals are effective, and the accuracy of the detection result is ensured.
According to some embodiments of the present invention, the power supply component in step S200 controls the flash interval time of each pulsed xenon lamp by switching the number of built-in discharge capacitors.
According to some embodiments of the present invention, the specific steps of the controller sequentially sending the trigger signal to the power supply assembly corresponding to each test station according to the preset trigger time point and the preset trigger sequence in step S200 are as follows:
s201, the controller controls all power supply components to charge the built-in capacitors;
s202, the controller sequentially sends trigger signals to power supply components on the appointed test station according to preset parameters;
s203, the power supply assembly receiving the trigger signal enables the built-in capacitor to discharge, meanwhile, trigger voltage is provided for the lamp tube trigger plate of the pulse xenon lamp, lamp tube voltage is provided for the high-voltage wrapping plate of the pulse xenon lamp, and the pulse xenon lamps on different test stations can flicker in sequence.
According to some embodiments of the present invention, the detection module in step S200 obtains the flash signal by collecting a signal of a sampling resistor in the power supply module.
According to some embodiments of the present invention, the flashing state in the step S300 includes a number of times of flashing and a number of times of non-flashing of the pulsed xenon lamp.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a flowchart of a pulsed xenon lamp testing method according to an embodiment of the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
Referring to fig. 1, a pulsed xenon lamp testing method includes the following steps:
s100, connecting the pulse xenon lamps to corresponding test stations respectively, wherein each test station is provided with an independent power supply assembly and a detection assembly, the power supply assembly is used for lighting the pulse xenon lamps, and the detection assembly is used for detecting flash signals of the pulse xenon lamps.
S200, the controller sequentially sends trigger signals to the power supply assembly corresponding to each test station according to a preset trigger time point and a preset trigger sequence, the pulse xenon lamps on each test station are lightened one by one, the lightening sequence can be lightened sequentially in sequence, and random numbers can also be added into the controller to realize random lightening of the stations, and the method specifically comprises the following steps:
s201, the controller controls all power supply components to charge the built-in capacitors;
s202, the controller sequentially sends trigger signals to power supply components on the appointed test station according to preset parameters;
s203, the power supply assembly receiving the trigger signal enables the built-in capacitor to discharge, meanwhile, trigger voltage is provided for the lamp tube trigger plate of the pulse xenon lamp, lamp tube voltage is provided for the high-voltage wrapping plate of the pulse xenon lamp, and the pulse xenon lamps on different test stations can flicker in sequence.
The power supply assembly controls the flash interval time of each pulse xenon lamp by switching the number of the built-in discharge capacitors through the jumper wires, for example, when the number of the discharge capacitors is 8, the flash interval time of each pulse xenon lamp is 3S, when the number of the discharge capacitors is 2, the flash interval time of each pulse xenon lamp is 0.9S, the number of the discharge capacitors is set to be 8 or 2, the number of the discharge capacitors in the power supply assembly is not limited, and a tester can set the capacity of the discharge capacitors according to the required flash interval time.
The detection assembly generates a state signal according to the flash signal corresponding to the pulse xenon lamp and feeds the state signal back to the controller, wherein the detection assembly acquires the flash signal through collecting the signal of the sampling resistor in the power supply assembly, and the element damage caused by the detection signal at the pin of the pulse xenon lamp is avoided.
S300, the controller judges the flash state of the pulse xenon lamp according to the received state signal and transmits the flash state to the display unit for displaying, wherein the flash state comprises the flash times and the non-flash times of the pulse xenon lamp, and the method comprises the following specific steps:
after the controller sends a trigger signal to the current test station, if the controller detects that the sampling resistor has voltage through the detection assembly, the lamp tube is considered to flicker, the flicker frequency is increased on the display unit, if the sampling resistor has no voltage, the lamp tube is considered not to flicker, and the non-flicker frequency is increased on the display unit.
In a specific practice, the display unit uses two indicator lights, emitting green light and red light, respectively; the pulse xenon lamp is in a lighting and abnormal state, and the indicating lamp has corresponding indication, so that the state of the pulse xenon lamp can be obtained in time; two indicator lights are configured to: when the pulse xenon lamp is in a non-lighting state, the green light indicator lamp keeps normally on; when the pulse xenon lamp is in a lighting state, the green light indicator lamp keeps being extinguished; when the pulse xenon lamp is in an abnormal state, the red light indicator lamp is kept normally on until the abnormal state is manually relieved.
In conclusion, the power supply assembly is arranged on each test station, the shortest flashing interval time of each pulse xenon lamp is determined by the corresponding power supply assembly, the influence of the number of test modules is avoided, the shortest flashing interval time is shorter, and the test efficiency can be improved; each pulse xenon lamp is a flash time unit from being turned on to being turned off, the number of the test modules for receiving the trigger signals in the flash time unit is regulated by the preset trigger time points and the preset trigger sequence, the pulse xenon lamps on each test station are sequentially turned on by the controller, large signal interference caused by synchronous triggering of the pulse xenon lamps is avoided, the flash signals detected by the detection assembly are prevented from being influenced, the state signals are effective, and the accuracy of the detection result is ensured.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of those skilled in the art without departing from the gist of the present invention.
Claims (5)
1. A pulse xenon lamp testing method is characterized by comprising the following steps:
s100, respectively connecting a plurality of pulse xenon lamps to corresponding test stations, wherein each test station is provided with an independent power supply assembly;
s200, the controller sequentially sends trigger signals to the power supply assembly corresponding to each test station according to a preset trigger time point and a preset trigger sequence, the pulse xenon lamps on each test station are lightened one by one, and the detection assembly generates state signals according to the flash signals of the corresponding pulse xenon lamps and feeds the state signals back to the controller;
and S300, judging the flash state of the pulse xenon lamp by the controller according to the received state signal and transmitting the flash state to a display unit for displaying.
2. The pulsed xenon lamp testing method according to claim 1, wherein: in the step S200, the power supply module controls the flash interval time of each pulse xenon lamp by switching the number of the built-in discharge capacitors.
3. The pulsed xenon lamp testing method according to claim 1, wherein: the specific steps of the controller sequentially sending the trigger signals to the power supply assembly corresponding to each test station according to the preset trigger time point and the preset trigger sequence in the step S200 are as follows:
s201, the controller controls all power supply components to charge the built-in capacitors;
s202, the controller sequentially sends trigger signals to power supply components on the appointed test station according to preset parameters;
s203, the power supply assembly receiving the trigger signal enables the built-in capacitor to discharge, meanwhile, trigger voltage is provided for the lamp tube trigger plate of the pulse xenon lamp, lamp tube voltage is provided for the high-voltage wrapping plate of the pulse xenon lamp, and the pulse xenon lamps on different test stations can flicker in sequence.
4. The pulsed xenon lamp testing method according to claim 1, wherein: and in the step S200, the detection assembly acquires a flash signal by acquiring a signal of a sampling resistor in the power supply assembly.
5. The pulsed xenon lamp testing method according to claim 1, wherein: the flash state in step S300 includes the number of times of flashing and the number of times of non-flashing of the pulse xenon lamp.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111028412.2A CN113933740A (en) | 2021-09-02 | 2021-09-02 | Pulse xenon lamp testing method |
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| CN202111028412.2A CN113933740A (en) | 2021-09-02 | 2021-09-02 | Pulse xenon lamp testing method |
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| CN113933740A true CN113933740A (en) | 2022-01-14 |
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Citations (11)
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|---|---|---|---|---|
| US5315607A (en) * | 1993-03-09 | 1994-05-24 | Hughes Aircraft Company | Dual use power supply configuration for the double pulsed flashlamp pumped dye laser |
| CN103424718A (en) * | 2013-08-08 | 2013-12-04 | 广州市光机电技术研究院 | Multi-lamp on-line automatic integrated test system and method |
| CN205120938U (en) * | 2015-11-17 | 2016-03-30 | 东莞理工学院 | LED pilot lamp light decay detector |
| CN106061086A (en) * | 2016-07-20 | 2016-10-26 | 常州市兰诺光电科技有限公司 | Pulsed high light device with plurality of lamps lightened sequentially |
| CN106404348A (en) * | 2016-08-27 | 2017-02-15 | 天津大学 | Comprehensive purifier pulse xenon lamp performance test method and device |
| CN206573662U (en) * | 2017-03-29 | 2017-10-20 | 厦门华信安电子科技有限公司 | A kind of patch capacitor pulse ageing tester |
| CN107346004A (en) * | 2017-08-09 | 2017-11-14 | 安徽科力信息产业有限责任公司 | A kind of signal lamp failure detection means based on voltage effective value |
| CN108037395A (en) * | 2017-12-26 | 2018-05-15 | 华测检测认证集团股份有限公司 | Multitask electronic apparatus xenon lamp test device |
| CN109142930A (en) * | 2018-09-02 | 2019-01-04 | 华域视觉科技(上海)有限公司 | Headlamp LED drive module design and verification method |
| CN111443299A (en) * | 2019-12-16 | 2020-07-24 | 中国计量大学上虞高等研究院有限公司 | L ED refrigerator lamp testing and aging screening device, system and method |
| CN212660273U (en) * | 2020-09-18 | 2021-03-05 | 广东安居宝数码科技股份有限公司 | Testing device |
-
2021
- 2021-09-02 CN CN202111028412.2A patent/CN113933740A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5315607A (en) * | 1993-03-09 | 1994-05-24 | Hughes Aircraft Company | Dual use power supply configuration for the double pulsed flashlamp pumped dye laser |
| CN103424718A (en) * | 2013-08-08 | 2013-12-04 | 广州市光机电技术研究院 | Multi-lamp on-line automatic integrated test system and method |
| CN205120938U (en) * | 2015-11-17 | 2016-03-30 | 东莞理工学院 | LED pilot lamp light decay detector |
| CN106061086A (en) * | 2016-07-20 | 2016-10-26 | 常州市兰诺光电科技有限公司 | Pulsed high light device with plurality of lamps lightened sequentially |
| CN106404348A (en) * | 2016-08-27 | 2017-02-15 | 天津大学 | Comprehensive purifier pulse xenon lamp performance test method and device |
| CN206573662U (en) * | 2017-03-29 | 2017-10-20 | 厦门华信安电子科技有限公司 | A kind of patch capacitor pulse ageing tester |
| CN107346004A (en) * | 2017-08-09 | 2017-11-14 | 安徽科力信息产业有限责任公司 | A kind of signal lamp failure detection means based on voltage effective value |
| CN108037395A (en) * | 2017-12-26 | 2018-05-15 | 华测检测认证集团股份有限公司 | Multitask electronic apparatus xenon lamp test device |
| CN109142930A (en) * | 2018-09-02 | 2019-01-04 | 华域视觉科技(上海)有限公司 | Headlamp LED drive module design and verification method |
| CN111443299A (en) * | 2019-12-16 | 2020-07-24 | 中国计量大学上虞高等研究院有限公司 | L ED refrigerator lamp testing and aging screening device, system and method |
| CN212660273U (en) * | 2020-09-18 | 2021-03-05 | 广东安居宝数码科技股份有限公司 | Testing device |
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