CN113922915A - Automatic wavelength deviation rectifying method for DML optical module, DML optical module and DWDM system - Google Patents

Abstract

The invention discloses a DML optical module wavelength automatic deviation rectifying method, a DML optical module and a DWDM system, and relates to the technical field of optical communication. The method comprises the following steps: setting a wavelength deviation rectifying parameter configuration table; periodically acquiring an LOL/LOS state from a laser driving unit of a DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in a sending direction; according to the judgment result of whether a TX LOL/TX LOS alarm is generated or not, inquiring in a wavelength deviation correction parameter configuration table by taking the current emission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the acquired TEC target temperature ADC value. The invention solves the problem of DML TOSA emission wavelength deviation caused by the change of the modulation current of the DML TOSA, realizes the quick, accurate and convenient automatic deviation correction of the wavelength of the DML optical module, and ensures the smooth data transmission of the optical link.

Description

Automatic wavelength deviation rectifying method for DML optical module, DML optical module and DWDM system

Technical Field

The invention relates to the technical field of optical communication, in particular to a wavelength automatic deviation rectifying method for a DML (digital multiplex) optical module, the DML optical module and a DWDM (dense wavelength division multiplexing) system.

Background

As the 5G deployment process accelerates, operators begin to scale up 5G bearer networks. Compared with 4G and 5G, the method has higher requirements on the aspects of bandwidth, time delay, synchronization, reliability, flexibility and the like of the bearer network. The 5G fronthaul network, as an important component of the bearer network, not only needs to meet the above requirements, but also needs to face the difficult problem of laying fiber resources required by the deployment of the multiplied number of 5G base stations.

Dense Wavelength Division Multiplexing (DWDM) is a technique that combines a set of optical wavelengths and transmits them through a single optical fiber. This is a laser technique used to increase bandwidth over existing fiber backbones. More specifically, the technique is to multiplex the tight spectral spacing of individual fiber carriers in a given fiber to take advantage of the achievable transmission performance (e.g., to achieve minimal dispersion or attenuation). In this way, the total number of optical fibers required can be reduced for a given information transmission capacity.

The DWDM wavelength tunable optical module can be applied to DWDM systems, and lasers of the DWDM wavelength tunable optical module have two types: direct-Modulated lasers (DML) and electro-absorption Modulated lasers (EML). Compared with the DML, the EML has the advantages of large extinction ratio, small chirp and small dispersion cost, but has high cost and large power consumption. Therefore, compared with the DWDM wavelength tunable optical module of the EML type, the DWDM wavelength tunable optical module of the DML type with low cost and low power consumption is more suitable for large-scale commercial use.

When there is a modulation signal (data transmission) and no modulation signal (no data transmission) in the TX (transmission) direction, the modulation current of the DML TOSA (Transmitter Optical Subassembly) changes, and the change of the modulation current causes the transmission wavelength shift of the DML TOSA.

As shown in fig. 1, in a DWDM wavelength multiplexing/demultiplexing application scenario, a DML optical module is inserted into an SNI (Service Node Interface) side device (such as a distribution unit DU/baseband processing unit BBU) and a UNI (User Network Interface ) side device (such as an active antenna unit AAU/radio frequency processing unit RRU) for use, and the SNI side device and the UNI side device are connected by a DWDM wavelength multiplexing/demultiplexing device and a long-distance optical fiber. A DWDM wavelength multiplexing demultiplexer contains a plurality of wavelength channels, each of which has a different center wavelength. When the wavelength value of the optical signal transmitted by the DML optical module is in the wavelength bandwidth of the DWDM wavelength channel, the optical signal transmitted by the DML optical module can pass through the DWDM wavelength channel; otherwise, it cannot pass. The wavelength bandwidth of the wavelength channels of the DWDM wavelength multiplexing demultiplexer and the wavelength interval between different wavelength channels are smaller than 1nm, if the emission wavelength of the DML optical module is greatly deviated and exceeds the wavelength channel bandwidth range of the DWDM wavelength multiplexing demultiplexer, an optical signal cannot pass through the corresponding DWDM wavelength channel.

More specifically, as shown in fig. 2, a typical DML Optical module includes a high-speed transceiver interface, a laser driving unit, a TOSA, and a ROSA (Receiver Optical Subassembly). In a DWDM wavelength multiplexing and demultiplexing application scenario, before SNI side equipment and UNI side equipment send data to an opposite end through a DML optical module, it needs to detect whether an optical signal sent by the opposite end equipment is received. If the optical signal is not received, the data cannot be sent to the opposite terminal through the DML optical module; and if the optical signal is received, sending data to the opposite terminal through the DML optical module. In an application scenario, when the DML optical module changes from a data transmission stop state to a data transmission state, a modulation signal is generated in the TX direction, and a modulation current of the DML TOSA increases, so that a transmission wavelength of the DML TOSA shifts, and a value of the transmission wavelength increases, as shown in fig. 3, the transmission wavelength of the DML TOSA shifts from an original λ to λ', where λ is a transmission wavelength when there is no modulation signal in the TX direction of the DML optical module, and the wavelength value is equal to a central wavelength value of a currently connected channel in the TX direction of the DML optical module. In another application scenario, when the DML optical module changes from the data transmission state to the data transmission stop state, no modulation signal is generated in the TX direction, and the modulation current of the DML TOSA decreases, so that the transmission wavelength of the DML TOSA shifts, and the value of the transmission wavelength decreases, as shown in fig. 4, the transmission wavelength of the DML TOSA shifts from the original λ to λ ″. And λ is a transmission wavelength when a modulation signal exists in the direction of the DML optical module TX, and the wavelength value is equal to a central wavelength value of a channel currently connected in the direction of the DML optical module TX. When the offset of the transmission wavelength of the DML TOSA exceeds the bandwidth of the DWDM wavelength channel, an optical signal sent when the DML TOSA sends data cannot pass through the wavelength channel of the DWDM wavelength multiplexing demultiplexer connected to the DML TOSA, and finally, data sent to an opposite end by the SNI-side device and the UNI-side device cannot reach the opposite end device through the wavelength channel of the DWDM wavelength multiplexing demultiplexer, and communication fails.

Therefore, when the emission wavelength of the DML optical module shifts, how to implement automatic deviation rectification is an urgent technical problem to be solved by those skilled in the art.

Disclosure of Invention

The invention aims to overcome the defects of the background technology, and provides a DML optical module wavelength automatic deviation correction method, a DML optical module and a DWDM system, which solve the problem of DML TOSA emission wavelength deviation caused by the change of the modulation current of the DML TOSA and realize the quick, accurate and convenient automatic deviation correction of the wavelength of the DML optical module.

In order to achieve the above object, in a first aspect, an embodiment of the present invention provides an automatic wavelength deviation rectifying method for a DML optical module, where the method is based on a dense optical wavelength multiplexing DWDM system, and the method includes:

setting a wavelength deviation rectifying parameter configuration table, wherein the wavelength deviation rectifying parameter configuration table is used for storing ADC values of TEC target temperatures corresponding to all emission wavelengths of an optical module when TX LOL/TX LOS alarm does not exist;

periodically acquiring an LOL/LOS state from a laser driving unit of a DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in a sending direction;

according to the judgment result of whether a TX LOL/TX LOS alarm is generated or not, inquiring in a wavelength deviation correction parameter configuration table by taking the current emission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

As a preferred embodiment, the wavelength deviation rectifying parameter configuration table includes: a sub-table with alarm parameters and a sub-table without alarm parameters; the sub-table with alarm parameters comprises: when a TX LOL/TX LOS alarm exists, the optical module can tune N TEC target temperature ADC values corresponding to the N emission wavelengths respectively; the no-alarm parameter sub-table includes: and when no TX LOL/TX LOS alarm exists, the optical module can tune N TEC target temperature ADC values corresponding to the N emission wavelengths respectively.

As a preferred embodiment, according to a determination result of whether a TX LOL/TX LOS alarm is generated, querying in a wavelength deviation correction parameter configuration table by using a current transmission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current transmission wavelength, specifically including:

when a TX LOL/TX LOS alarm is judged to be generated, the current emission wavelength of the DML optical module is obtained, the wavelength is used as an index to query the sub-table with the alarm parameter, and an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength is obtained;

and when the TX LOL/TX LOS alarm is judged not to be generated, acquiring the current emission wavelength of the DML optical module, inquiring the alarm-free parameter sub-table by taking the wavelength as an index, and acquiring the ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength.

As a preferred embodiment, in the wavelength deviation correction parameter configuration table, ADC values of TEC target temperatures corresponding to respective emission wavelengths of the optical module are obtained by a test mode or a program automatic calculation mode.

As a preferred embodiment, obtaining an ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module by a test method specifically includes:

respectively testing ADC values of the TEC target temperature corresponding to the current emission wavelength when no modulation signal exists and when a modulation signal exists by using a test instrument and a test tool under the condition that the emission wavelength of the DML optical module is not changed;

if the DML optical module can tune out N different emission wavelengths, respectively testing the ADC values of the TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and when a modulation signal exists for the N different emission wavelengths.

As a preferred embodiment, obtaining the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module by automatic calculation with a program specifically includes:

according to the corresponding relation between the modulation current value and the DML TOSA emission wavelength value and the corresponding relation between the TEC target temperature value and the DML TOSA emission wavelength value, under the condition that the DML optical module emission wavelength is not changed, an ADC value of the TEC target temperature corresponding to the current emission wavelength is calculated by using an automatic calculation program when no modulation signal exists and when a modulation signal exists respectively;

if the DML optical module can tune out N different emission wavelengths, respectively calculating ADC values of the TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and when a modulation signal exists for the N different emission wavelengths.

As a preferred embodiment, the method further comprises the steps of: and after the TEC temperature control ADC value is successfully set, the emission wavelength of the TOSA in the DML optical module is automatically adjusted to a target value consistent with the wavelength of the currently connected channel.

As a preferred embodiment, the set wavelength deviation rectification parameter configuration table is stored in a memory of the DML optical module as a factory configuration.

In a second aspect, an embodiment of the present invention further provides a DML optical module applying the method in the first aspect, including:

a wavelength deviation correction parameter configuration table for: when TX LOL/TX LOS alarm is stored or not, ADC (analog to digital converter) values of TEC target temperatures corresponding to all emission wavelengths of the optical module are stored;

the state acquisition and alarm judgment module is used for: periodically acquiring an LOL/LOS state from a laser driving unit of a DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in a sending direction;

a deviation rectification processing module for: according to the judgment result of whether a TX LOL/TX LOS alarm is generated or not, inquiring in a wavelength deviation correction parameter configuration table by taking the current emission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

In a third aspect, an embodiment of the present invention further provides a DWDM system, where the SNI side and/or UNI side of the system includes the DML optical module according to the embodiment of the second aspect.

The invention has the beneficial effects that:

(1) according to the invention, a wavelength deviation correction parameter configuration table is established to store ADC (Analog-to-Digital Converter) values of TEC (semiconductor Cooler) target temperatures corresponding to each emission wavelength of an optical module when TX LOL (TX CDR Loss of Lock)/TX LOS (TX Loss of Signal) alarm is given, and ADC values of TEC target temperatures corresponding to each emission wavelength of the optical module when TX LOL/TX LOS alarm is absent. When the emission wavelength of the subsequent DML TOSA generates deviation, the LOL (Loss of Lock)/LOS (Loss of Signal) state is obtained from a laser driving unit of the DML optical module in real time, whether a TX LOL/TX LOS alarm is generated in the sending direction is judged, ADC values corresponding to the required TEC target temperature under different alarm states in a wavelength deviation correction parameter configuration table are inquired, and the TEC temperature control ADC value is set as the inquired required TEC target temperature ADC value, so that the TOSA emission wavelength of the DML optical module can be automatically adjusted to a target value consistent with the wavelength of a currently connected channel, the DML emission wavelength can be quickly, accurately and conveniently and automatically corrected, and the smoothness of optical link data transmission is ensured.

(2) In the invention, the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module can be obtained through a test mode or a program automatic calculation mode, the obtaining mode is more flexible and various, and various choices are provided for the implementation of the invention.

Drawings

FIG. 1 is a schematic diagram of a DWDM system in the prior art;

FIG. 2 is a schematic diagram of a conventional DML optical module applied to a DWDM system;

fig. 3 is a schematic diagram of emission wavelength shift of a DML optical module when changing from a data transmission stop state to a data transmission state in an application scenario;

fig. 4 is a schematic diagram of emission wavelength shift when a DML optical module changes from a data transmission state to a data transmission stop state in another application scenario;

FIG. 5 is a schematic diagram illustrating an implementation of automatic deviation rectification according to an embodiment of the present invention in an application scenario;

FIG. 6 is a schematic diagram illustrating an implementation of automatic deviation rectification according to an embodiment of the present invention in another application scenario;

fig. 7 is a flowchart of an automatic wavelength deviation correction method for a DML optical module according to an embodiment of the present invention.

Detailed Description

The problem that in an existing DWDM system, when a modulation current of a DML TOSA changes, an emission wavelength of the DML TOSA shifts is solved, as shown in fig. 3 or fig. 4. The invention aims to provide a DML optical module wavelength automatic deviation rectifying method, a DML optical module and a DWDM system, which can realize quick, accurate and convenient automatic deviation rectification of the wavelength of the DML optical module, so that the DML optical module can quickly, accurately and conveniently automatically rectify the deviation when the emission wavelength of the DML optical module deviates. For example, referring to fig. 5, when the emission wavelength of the DML TOSA is shifted as shown in fig. 3 (i.e. from the original λ to λ '), the method of the present invention can quickly and effectively correct the shifted λ' to the original λ, thereby implementing automatic deviation correction; also, referring to FIG. 6, when the emission wavelength of the DML TOSA is shifted as shown in FIG. 4 (i.e., from the original λ to λ "), the method of the present invention can also quickly and effectively correct the shifted λ" to the original λ, thereby achieving automatic deskewing. In a word, as can be seen from fig. 5 and fig. 6, when there is a modulation signal or no modulation signal, as long as the transmission wavelength of the DML optical module is shifted, automatic deviation correction can be performed quickly, so that smooth data transmission of the optical link is ensured, and the actual application requirements are met.

In order to achieve the purpose, the main design idea of the invention is as follows: by establishing a wavelength deviation rectifying parameter configuration table, ADC values of TEC target temperatures corresponding to all transmitting wavelengths of the optical module when TX LOL/TX LOS alarm occurs and ADC values of TEC target temperatures corresponding to all transmitting wavelengths of the optical module when TX LOL/TX LOS alarm does not occur are stored. Also, the LOL/LOS status is used inventively to determine if the TX direction generates a TX LOL/TX LOS alarm. When the emission wavelength needs to be automatically corrected, ADC values corresponding to the required TEC target temperatures under different alarm conditions can be inquired by using a wavelength correction parameter configuration table, and the TEC temperature control ADC values are set to the inquired required TEC target temperature ADC values, so that the TOSA emission wavelength of the DML optical module can be automatically adjusted to a target value consistent with the wavelength of a currently connected channel, the emission wavelength of the DML optical module is quickly, accurately and conveniently automatically corrected, and the smoothness of optical link data transmission is ensured.

In order to make the technical problems, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be described in detail with reference to the accompanying drawings and specific embodiments.

However, it should be noted that: the examples to be described next are only some specific examples, and are not intended to limit the embodiments of the present invention necessarily to the following specific steps, values, conditions, data, orders, and the like. Those skilled in the art can, upon reading this specification, utilize the concepts of the present invention to construct more embodiments than those specifically described herein.

Example one

Referring to fig. 5, the embodiment provides an automatic wavelength deviation rectifying method for a DML optical module, which can be applied to a dense optical wavelength multiplexing DWDM system, and the method includes the following steps:

s1, setting a wavelength deviation rectifying parameter configuration table, wherein the wavelength deviation rectifying parameter configuration table is used for storing ADC values of TEC target temperatures corresponding to all emission wavelengths of the optical module when a TX LOL/TX LOS alarm is not generated. In practical application, the wavelength deviation rectifying parameter configuration table can be stored in a FLASH memory of the DML optical module as factory configuration.

It can be understood that the DML optical module supports tunable emission wavelength, and the DML TOSA emission wavelength is affected by two factors, namely TEC operating temperature and modulation current. Under the condition that the modulation current is the same, the DML TOSA can emit different emission wavelengths by changing the working temperature of the TEC, and the working temperature of the TEC corresponds to the emission wavelengths of the DML TOSA one by one; under the condition that the TEC working temperatures are the same, the DML TOSA can emit different emission wavelengths by changing the modulation current value, and the modulation current value corresponds to the DML TOSA emission wavelengths one by one. Because the modulation current value is different when the DML optical module has a modulation signal and does not have the modulation signal, when the DML optical module automatically corrects the deviation, the condition that the modulation signal exists and the modulation signal does not exist needs to be distinguished, namely whether a TX LOL/TX LOS alarm is generated or not needs to be distinguished (when the DML optical module does not have the modulation signal, the TX LOL or TX LOS alarm is generated, and when the DML optical module has the modulation signal, the TX LOL or TX LOS alarm is not generated).

In this embodiment, a wavelength deviation correction parameter configuration table is established to store ADC values of TEC target temperatures corresponding to each emission wavelength of the optical module when a TX LOL/TX LOS alarm is issued, and ADC values of TEC target temperatures corresponding to each emission wavelength of the optical module when no TX LOL/TX LOS alarm is issued. When the subsequent DML TOSA emission wavelength generates deviation, the wavelength deviation correction parameter configuration table can be used for inquiring ADC values corresponding to the required TEC target temperatures under different conditions, and the TEC temperature control ADC value is set as the inquired required TEC target temperature ADC value, so that the TOSA emission wavelength of the DML optical module can be automatically adjusted to a target value consistent with the wavelength of the currently connected channel, and the DML optical module emission wavelength can be quickly, accurately and conveniently and automatically corrected.

S2, periodically acquiring LOL/LOS state from a laser driving unit of the DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in the sending direction.

For example, after the DML optical module is successfully powered on and initialized, an MCU (Microcontroller Unit) of the DML optical module may periodically acquire an LOL state or an LOS state in real time in a transmitting direction from the laser driving Unit through a communication interface (e.g., a serial peripheral interface SPI, an integrated circuit bus interface IIC, a management data input/output interface MDIO, and the like). And if the MCU of the DML optical module successfully acquires the real-time LOL or LOS state in the transmitting direction from the laser driving unit, whether a TX LOL alarm or a TX LOS alarm is generated or not is continuously judged. The acquisition period may be set and modified as needed, and this example is not limited specifically.

S3, according to the judgment result of whether a TX LOL/TX LOS alarm is generated, inquiring in a wavelength deviation correction parameter configuration table by taking the current emission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

Specifically, when a TX LOL/TX LOS alarm is determined to be generated, the current emission wavelength is used as an index to be inquired in a wavelength deviation correction parameter configuration table, and a TEC target temperature ADC value corresponding to the current emission wavelength is obtained when the TX LOL/TX LOS alarm is generated; and when the TX LOL/TX LOS alarm is judged not to be generated, inquiring the current emission wavelength as an index in a wavelength deviation correction parameter configuration table to obtain the TEC target temperature ADC value corresponding to the current emission wavelength when the TX LOL/TX LOS alarm is not generated.

In addition, it is understood that, in practical applications, after the step S3 is implemented, the following operations may be further included: when the TEC temperature control ADC value is successfully set, the emission wavelength of the TOSA in the DML optical module can be automatically adjusted to a target value consistent with the wavelength of the currently connected channel, namely, the error wavelength value after the wavelength is shifted is automatically corrected and adjusted to a correct working wavelength value corresponding to the wavelength channel. For example, after the DML optical module successfully sets the ADC value corresponding to the TEC temperature control target temperature, a TEC temperature control PID algorithm (a contribution Integral Differential algorithm, which is a control algorithm integrating three links of a proportional contribution, an Integral and a Differential) program in the MCU of the DML optical module may be used to automatically adjust the TEC working temperature to the target temperature, and keep the current working temperature stable at the target temperature. When the current working temperature of the DML optical module TEC is changed, the transmitting wavelength of the DML TOSA is changed at the same time, and the transmitting wavelength can be automatically adjusted to a target value consistent with the wavelength of a channel connected at present, so that the automatic deviation correction of the transmitting wavelength is realized.

Further, as an optional implementation manner, in step S1, the wavelength deviation rectification parameter configuration table includes: there is a warning parameter sub-table and a no warning parameter sub-table.

Wherein, there is the sub-table of alarm parameter to include: and when a TX LOL/TX LOS alarm exists, the optical module can tune N TEC target temperature ADC values corresponding to the N emission wavelengths respectively. It can be understood that when the DML optical module does not have a modulation signal, a TX LOL or TX LOS alarm may be generated.

The no-alarm parameter sub-table includes: and when no TX LOL/TX LOS alarm exists, the optical module can tune N TEC target temperature ADC values corresponding to the N emission wavelengths respectively. It can be understood that when the DML optical module has a modulation signal, no TX LOL or TX LOS alarm is generated.

Furthermore, on the basis of the above embodiment, a wavelength information sub-table may be further set in the wavelength deviation rectification parameter configuration table, and the current emission wavelength of the DML optical module may be quickly queried by using the wavelength information sub-table. In specific design, the wavelength information sub-table may include: n, N wavelength values of different emission wavelengths including the current emission wavelength and the tunable emission wavelength mesh number of the DML optical module; and all the parameters stored in the wavelength information sub-table can be modified according to requirements.

However, in actual operation, in addition to the setting of the wavelength information sub-table to obtain the current emission wavelength of the DML optical module, the current emission wavelength of the DML optical module may also be obtained in other various manners (e.g., directly reading from a register of the DML optical module). That is, the above alternative embodiments are merely illustrative and not restrictive in any way.

It is understood that, in the above alternative embodiment, a plurality of sub-tables are adopted in the wavelength deviation rectifying parameter configuration table. Namely, the method comprises an alarm parameter sub-table and a non-alarm parameter sub-table, or further comprises a wavelength information sub-table. When no modulation signal is found, a TX LOL or TX LOS alarm is generated by utilizing the sub-table with the alarm parameters, and each emission wavelength of the optical module corresponds to an ADC value of the TEC set temperature; when a modulation signal is found, the TX LOL or the TX LOS is not generated, and each emission wavelength of the optical module corresponds to an ADC value of the TEC set temperature; the current emission wavelength of the DML optical module can be quickly inquired by using the wavelength information sub-table. Through the design of the sub-tables, targeted query can be realized, useless data are prevented from being searched, the searching efficiency is effectively improved, and the purpose of automatic deviation correction can be quickly and conveniently realized.

On this basis, as a preferred embodiment, in step S3, according to a determination result of whether a TX LOL/TX LOS alarm is generated, the current emission wavelength is used as an index to query in a wavelength deviation rectification parameter configuration table, so as to obtain a TEC target temperature ADC value corresponding to the current emission wavelength, which specifically includes the following steps:

step S301, when a TX LOL/TX LOS alarm is determined to be generated, acquiring the current emission wavelength of the DML optical module (for example, the current emission wavelength can be acquired from a set wavelength information sub-table or read from a register of the DML optical module), and inquiring the alarm parameter sub-table by using the wavelength as an index to acquire an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength;

step S302, when it is determined that the TX LOL/TX LOS alarm is not generated, obtaining a current emission wavelength of the DML optical module (for example, the current emission wavelength may be obtained from a set wavelength information sub-table or read from a register of the DML optical module), and querying the non-alarm parameter sub-table using the wavelength as an index, and obtaining an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength.

Further, as an optional implementation manner, in step S1, in the wavelength deviation rectification parameter configuration table, the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module may be obtained through a test manner or a program automatic calculation manner.

Specifically, the method for obtaining the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module through a test mode comprises the following steps: and respectively testing the ADC value of the TEC target temperature corresponding to the current emission wavelength when no modulation signal exists and when a modulation signal exists by using the test instrument and the test tool under the condition that the emission wavelength of the DML optical module is not changed. Then, if the DML optical module can tune out N different emission wavelengths, the ADC value of the TEC target temperature corresponding to each emission wavelength when there is no modulation signal or there is a modulation signal needs to be respectively tested for the N different emission wavelengths.

The method for obtaining the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module in an automatic program calculation mode comprises the following steps: according to the corresponding relation between the modulation current value and the DML TOSA emission wavelength value and the corresponding relation between the TEC target temperature value and the DML TOSA emission wavelength value, under the condition that the DML optical module emission wavelength is not changed, the ADC value of the TEC target temperature corresponding to the current emission wavelength when no modulation signal exists and a modulation signal exists is calculated by an automatic calculation program. Then, if the DML optical module can tune out N different emission wavelengths, the ADC value of the TEC target temperature corresponding to each emission wavelength when there is no modulation signal and there is a modulation signal needs to be calculated for the N different emission wavelengths respectively.

Example two

Based on the same inventive concept, the embodiment of the invention also provides a DML optical module applying the method for automatically correcting the wavelength of the DML optical module of the first embodiment. The DML optical module specifically comprises a wavelength deviation correction parameter configuration table, a state acquisition and alarm judgment module and a deviation correction processing module.

Wherein, the wavelength deviation rectification parameter configuration table is used for: and when the TX LOL/TX LOS alarm is stored or not, the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module.

The state acquisition and alarm judgment module is used for: and periodically acquiring an LOL/LOS state from a laser driving unit of the DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in the transmitting direction.

The deviation rectifying module is used for: according to the judgment result of whether a TX LOL/TX LOS alarm is generated or not, inquiring in a wavelength deviation correction parameter configuration table by taking the current emission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

It should be noted that various changes and specific examples in the foregoing embodiments of the method for automatically correcting a wavelength deviation of a DML optical module are also applicable to the DML optical module of the present embodiment, and those skilled in the art can clearly know the implementation method of the DML optical module in the present embodiment through the detailed description of the foregoing methods, so that the detailed description is omitted here for the sake of brevity of the description.

EXAMPLE III

Based on the same inventive concept, the embodiment of the present invention further provides a DWDM system, and the SNI side and/or UNI side of the DWDM system includes the DML optical module of the second embodiment.

Note that: the above-described embodiments are merely examples and are not intended to be limiting, and those skilled in the art can combine and combine some steps and devices from the above-described separately embodiments to achieve the effects of the present invention according to the concept of the present invention, and such combined and combined embodiments are also included in the present invention, and such combined and combined embodiments are not described herein separately.

Advantages, effects, and the like, which are mentioned in the embodiments of the present invention, are only examples and are not limiting, and they cannot be considered as necessarily possessed by the various embodiments of the present invention. Furthermore, the foregoing specific details disclosed herein are merely for purposes of example and for purposes of clarity of understanding, and are not intended to limit the embodiments of the invention to the particular details which may be employed to practice the embodiments of the invention.

The block diagrams of devices, apparatuses, systems involved in the embodiments of the present invention are only given as illustrative examples, and are not intended to require or imply that the connections, arrangements, configurations, etc. must be made in the manner shown in the block diagrams. These devices, apparatuses, devices, systems may be connected, arranged, configured in any manner, as will be appreciated by those skilled in the art. Words such as "including," "comprising," "having," and the like are open-ended words that mean "including, but not limited to," and are used interchangeably therewith. As used in connection with embodiments of the present invention, the terms "or" and "refer to the term" and/or "and are used interchangeably herein unless the context clearly dictates otherwise. The word "such as" is used in connection with embodiments of the present invention to mean, and is used interchangeably with, the word "such as but not limited to".

The flow charts of steps in the embodiments of the present invention and the above description of the methods are merely illustrative examples and are not intended to require or imply that the steps of the various embodiments must be performed in the order presented. As will be appreciated by those skilled in the art, the order of the steps in the above embodiments may be performed in any order. Words such as "thereafter," "then," "next," etc. are not intended to limit the order of the steps; these words are only used to guide the reader through the description of these methods. Furthermore, any reference to an element in the singular, for example, using the articles "a," "an," or "the" is not to be construed as limiting the element to the singular.

In addition, the steps and devices in the embodiments of the present invention are not limited to be implemented in a certain embodiment, and in fact, some steps and devices in the embodiments of the present invention may be combined according to the concept of the present invention to conceive new embodiments, and these new embodiments are also included in the scope of the present invention.

The respective operations in the embodiments of the present invention may be performed by any appropriate means capable of performing the corresponding functions. The means may comprise various hardware and/or software components and/or modules including, but not limited to, hardware circuitry or a processor.

The method of an embodiment of the invention includes one or more acts for implementing the method described above. The methods and/or acts may be interchanged with one another without departing from the scope of the claims. In other words, unless a specific order of actions is specified, the order and/or use of specific actions may be modified without departing from the scope of the claims.

The functions in the embodiments of the present invention may be implemented in hardware, software, firmware, or any combination thereof. If implemented in software, the functions may be stored as one or more instructions on a tangible computer-readable medium. A storage media may be any available tangible media that can be accessed by a computer. By way of example, and not limitation, such computer-readable media can comprise RAM, ROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other tangible medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer. As used herein, disk (disk) and Disc (Disc) include Compact Disc (CD), laser Disc, optical Disc, DVD (Digital Versatile Disc), floppy disk and blu-ray Disc where disks reproduce data magnetically, while discs reproduce data optically with lasers.

Accordingly, a computer program product may perform the operations presented herein. For example, such a computer program product may be a computer-readable tangible medium having instructions stored (and/or encoded) thereon that are executable by one or more processors to perform the operations described herein. The computer program product may include packaged material.

Other examples and implementations are within the scope and spirit of the embodiments of the invention and the following claims. For example, due to the nature of software, the functions described above may be implemented using software executed by a processor, hardware, firmware, hard-wired, or any combination of these. Features implementing functions may also be physically located at various locations, including being distributed such that portions of functions are implemented at different physical locations.

Various changes, substitutions and alterations to the techniques described herein may be made by those skilled in the art without departing from the techniques of the teachings as defined by the appended claims. Moreover, the scope of the claims of the present disclosure is not limited to the particular aspects of the process, machine, manufacture, composition of matter, means, methods and acts described above. Processes, machines, manufacture, compositions of matter, means, methods, or acts, presently existing or later to be developed that perform substantially the same function or achieve substantially the same result as the corresponding aspects described herein may be utilized. Accordingly, the appended claims are intended to include within their scope such processes, machines, manufacture, compositions of matter, means, methods, or acts.

The previous description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the invention. Thus, the present invention is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

The foregoing description has been presented for purposes of illustration and description. Furthermore, the description is not intended to limit embodiments of the invention to the form disclosed herein. While a number of example aspects and embodiments have been discussed above, those of skill in the art will recognize certain variations, modifications, alterations, additions and sub-combinations thereof. And those not described in detail in this specification are within the skill of the art.

Claims (10)

1. A DML optical module wavelength automatic deviation rectification method is characterized in that based on a dense optical wavelength multiplexing DWDM system, the method comprises the following steps:

setting a wavelength deviation rectifying parameter configuration table, wherein the wavelength deviation rectifying parameter configuration table is used for storing ADC values of TEC target temperatures corresponding to all emission wavelengths of an optical module when TX LOL/TX LOS alarm does not exist;

periodically acquiring an LOL/LOS state from a laser driving unit of a DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in a sending direction;

according to the judgment result of whether a TX LOL/TX LOS alarm is generated or not, inquiring in a wavelength deviation correction parameter configuration table by taking the current emission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

2. The method for automatically correcting the wavelength of the DML optical module according to claim 1, wherein the wavelength correction parameter configuration table comprises: a sub-table with alarm parameters and a sub-table without alarm parameters;

the sub-table with alarm parameters comprises: when a TX LOL/TX LOS alarm exists, the optical module can tune N TEC target temperature ADC values corresponding to the N emission wavelengths respectively;

the no-alarm parameter sub-table includes: and when no TX LOL/TX LOS alarm exists, the optical module can tune N TEC target temperature ADC values corresponding to the N emission wavelengths respectively.

3. The method for automatically correcting the wavelength of the DML optical module according to claim 2, wherein the query is performed in a wavelength correction parameter configuration table by using the current transmission wavelength as an index according to the determination result of whether the TX LOL/TX LOS alarm is generated, so as to obtain the TEC target temperature ADC value corresponding to the current transmission wavelength, which specifically comprises:

when a TX LOL/TX LOS alarm is judged to be generated, the current emission wavelength of the DML optical module is obtained, the wavelength is used as an index to query the sub-table with the alarm parameter, and an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength is obtained;

and when the TX LOL/TX LOS alarm is judged not to be generated, acquiring the current emission wavelength of the DML optical module, inquiring the alarm-free parameter sub-table by taking the wavelength as an index, and acquiring the ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength.

4. The method for automatically correcting the wavelength of the DML optical module according to claim 1, wherein in the wavelength correction parameter configuration table, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is obtained through a test mode or a program automatic calculation mode.

5. The method for automatically correcting the wavelength of the DML optical module according to claim 4, wherein obtaining the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module through a test mode specifically comprises:

respectively testing ADC values of the TEC target temperature corresponding to the current emission wavelength when no modulation signal exists and when a modulation signal exists by using a test instrument and a test tool under the condition that the emission wavelength of the DML optical module is not changed;

if the DML optical module can tune out N different emission wavelengths, respectively testing the ADC values of the TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and when a modulation signal exists for the N different emission wavelengths.

6. The method for automatically correcting the wavelength of the DML optical module according to claim 4, wherein the obtaining of the ADC value of the TEC target temperature corresponding to each emission wavelength of the optical module by automatic calculation of a program specifically comprises:

according to the corresponding relation between the modulation current value and the DML TOSA emission wavelength value and the corresponding relation between the TEC target temperature value and the DML TOSA emission wavelength value, under the condition that the DML optical module emission wavelength is not changed, an ADC value of the TEC target temperature corresponding to the current emission wavelength is calculated by using an automatic calculation program when no modulation signal exists and when a modulation signal exists respectively;

if the DML optical module can tune out N different emission wavelengths, respectively calculating ADC values of the TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and when a modulation signal exists for the N different emission wavelengths.

7. The method for automatically rectifying the wavelength of the DML optical module according to claim 1, wherein the method further comprises the following steps:

and after the TEC temperature control ADC value is successfully set, the emission wavelength of the TOSA in the DML optical module is automatically adjusted to a target value consistent with the wavelength of the currently connected channel.

8. The method for automatically rectifying the wavelength deviation of the DML optical module according to claim 1, wherein: and the set wavelength deviation rectifying parameter configuration table is stored in a memory of the DML optical module as factory configuration.

9. A DML light module to which the method of any of claims 1 to 8 is applied, characterized in that it comprises:

a wavelength deviation correction parameter configuration table for: when TX LOL/TX LOS alarm is stored or not, ADC (analog to digital converter) values of TEC target temperatures corresponding to all emission wavelengths of the optical module are stored;

the state acquisition and alarm judgment module is used for: periodically acquiring an LOL/LOS state from a laser driving unit of a DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in a sending direction;

a deviation rectification processing module for: according to the judgment result of whether a TX LOL/TX LOS alarm is generated or not, inquiring in a wavelength deviation correction parameter configuration table by taking the current emission wavelength as an index to obtain a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

10. A DWDM system, characterized by: in the SNI side and/or UNI side of the system, a DML light module according to claim 9 is included.

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