CN113866657A - Lithium battery internal resistance test system - Google Patents

Lithium battery internal resistance test system Download PDF

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Publication number
CN113866657A
CN113866657A CN202111166365.8A CN202111166365A CN113866657A CN 113866657 A CN113866657 A CN 113866657A CN 202111166365 A CN202111166365 A CN 202111166365A CN 113866657 A CN113866657 A CN 113866657A
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unit
resistor
operational amplifier
voltage
capacitor
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CN113866657B (en
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万乐
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Jinan Yaorui Electronic Technology Co ltd
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Jinan Yaorui Electronic Technology Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/389—Measuring internal impedance, internal conductance or related variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Secondary Cells (AREA)

Abstract

The application provides a lithium battery internal resistance test system, which comprises a filtering input unit for filtering voltage to be tested, a first input amplification unit for amplifying the amplitude of the voltage to be tested, a second input amplification unit for removing the common-mode voltage of the preset waveform voltage in an alternating current constant current module, a test switch unit, a filtering amplification anti-aliasing unit for respectively performing band-pass filtering processing, variable amplification processing and anti-aliasing processing on the output voltage of the first input amplification unit and the output voltage of the second input amplification unit, and an analog-to-digital conversion unit. The second input amplifying unit is connected with the alternating current constant current module. The filtering, amplifying and anti-aliasing unit is connected with the first input amplifying unit or the second input amplifying unit through the test switch unit. The filtering amplification anti-aliasing unit is connected with the control module through the analog-to-digital conversion unit so as to send the voltage at two ends of the lithium battery to be tested to the control module, so that the control module outputs the internal resistance of the lithium battery to be tested.

Description

Lithium battery internal resistance test system
Technical Field
The application relates to the technical field of batteries, in particular to a lithium battery internal resistance testing system.
Background
With the large-scale marketing of electric automobiles, the use of large-capacity single lithium batteries is more and more, and the performance of the lithium batteries is good and bad, so that the overall performance of the electric automobiles is directly influenced. The internal resistance of a battery is a very important parameter for the performance of a lithium battery. In order to improve the use safety and use experience of a user, the internal resistance of the battery is detected in the process that the lithium battery is put into use. At present, a lithium battery internal resistance test circuit is usually connected in a Kelvin mode, and due to the fact that induced alternating voltage can be generated on a voltage line in the test mode, errors are brought to battery internal resistance test. Therefore, the prior art eliminates the components of the induced alternating voltage by arranging a phase-locked amplifier. However, in the phase-locked amplifier, during the test, the phase-locked amplifier requires that the voltage signal be accurately amplified, and thus a voltage signal matching the phase difference of the excitation signal provided by the kelvin connection is obtained. This approach results in the inability to perform filtering of the voltage signal before the lock-in amplifier performs phase detection. If the voltage signal is not filtered, an interference signal in the voltage signal may bring an error to a test result of the internal resistance of the battery, and the accuracy of the detected internal resistance of the battery is affected.
Disclosure of Invention
The embodiment of the application provides a lithium battery internal resistance testing system, which is used for improving the lithium battery internal resistance testing precision and accurately testing the lithium battery internal resistance.
On the one hand, this application provides a lithium cell internal resistance test system, and this system includes: the device comprises an alternating current constant current module for generating constant test current, a signal conditioning module for detecting voltages at two ends of the battery and connected with the alternating current constant current module, and a control module respectively connected with the signal conditioning module and the alternating current constant current module. The signal conditioning module includes: the device comprises a filtering input unit for filtering the voltage to be detected, a first input amplification unit for amplifying the voltage to be detected, a second input amplification unit for removing the common-mode voltage of the preset waveform voltage in the alternating current constant current module, a test switch unit, a filtering amplification anti-aliasing unit for respectively performing band-pass filtering processing, variable amplification processing and anti-aliasing processing on the output voltage of the first input amplification unit and the output voltage of the second input amplification unit, and an analog-to-digital conversion unit. The filtering input unit is respectively connected with the anode and the cathode of the lithium battery to be tested, and the filtering input unit is connected with the first input amplification unit. The second input amplifying unit is connected with the alternating current constant current module. The filtering, amplifying and anti-aliasing unit is connected with the first input amplifying unit or the second input amplifying unit through the test switch unit. The filtering amplification anti-aliasing unit is connected with the control module through the analog-to-digital conversion unit so as to send the voltage at two ends of the lithium battery to be tested to the control module, so that the control module outputs the internal resistance of the lithium battery to be tested.
The application provides a lithium cell internal resistance test system compares in prior art to the circuit of lithium cell internal resistance test, error that appears when can reduce the test lithium cell internal resistance.
Drawings
The accompanying drawings, which are described herein to provide a further understanding of the application, are included in the following description:
FIG. 1 is a schematic diagram of a system for testing internal resistance of a lithium battery according to an embodiment of the present disclosure;
fig. 2 is a schematic circuit diagram of a test switch unit in the internal resistance test system of the lithium battery according to the embodiment of the present application;
fig. 3 is a schematic circuit diagram of a master control single chip microcomputer of the lithium battery internal resistance testing system in the embodiment of the application;
fig. 4 is a schematic circuit diagram of a first input amplifying unit of a lithium battery internal resistance testing system according to an embodiment of the present application;
fig. 5 is a schematic circuit diagram of a second input amplifying unit of the lithium battery internal resistance testing system according to the embodiment of the present application;
FIG. 6 is a schematic circuit diagram of a band-pass filter subunit of the internal resistance test system of the lithium battery according to the embodiment of the present application;
FIG. 7 is a schematic circuit diagram of a variable amplification subunit of the internal resistance test system of the lithium battery according to the embodiment of the present application;
fig. 8 is a schematic circuit diagram of an anti-aliasing filtering subunit of the internal resistance testing system of the lithium battery according to the embodiment of the present application;
fig. 9 is a schematic circuit diagram of an analog-to-digital conversion unit of the lithium battery internal resistance testing system according to the embodiment of the present application;
FIG. 10 is a schematic circuit diagram of a photoelectric isolation unit of a lithium battery internal resistance testing system according to an embodiment of the present application;
fig. 11 is a schematic circuit diagram of a waveform generating unit of the internal resistance testing system of the lithium battery according to the embodiment of the present application;
fig. 12 is a schematic circuit diagram of a low-pass filtering unit of the internal resistance testing system of the lithium battery according to the embodiment of the present application;
fig. 13 is a schematic circuit diagram of a comparison unit and a power amplification unit of the internal resistance test system of the lithium battery according to the embodiment of the present application;
fig. 14 is a schematic circuit diagram of a reference resistance unit of a lithium battery internal resistance testing system according to an embodiment of the present application;
FIG. 15 is a schematic circuit diagram of a voltage follower unit of the internal resistance testing system of a lithium battery according to the embodiment of the present application;
FIG. 16 is a schematic circuit diagram of a meter amplifying unit of the internal resistance testing system of the lithium battery according to the embodiment of the present application;
FIG. 17 is a schematic circuit diagram of an arc prevention unit of the lithium battery internal resistance test system according to the embodiment of the present application;
fig. 18 is a schematic circuit diagram of a second blocking capacitor, a protection circuit unit, a positive current input terminal and a negative current input terminal of the internal resistance testing system of the lithium battery in the embodiment of the present application;
FIG. 19 is a schematic circuit diagram of an external power supply of the internal resistance test system of a lithium battery according to an embodiment of the present application;
fig. 20 is a schematic circuit diagram of an isolated power supply unit of the internal resistance test system of the lithium battery according to the embodiment of the present application;
FIG. 21 is a schematic circuit diagram of a display screen unit of a lithium battery internal resistance testing system in an embodiment of the present application;
fig. 22 is a schematic circuit diagram of a power supply chip for a display screen unit and a main control single chip in the internal resistance test system of the lithium battery in the embodiment of the present application;
fig. 23 is a schematic circuit diagram of an input unit of a lithium battery internal resistance testing system in an embodiment of the present application;
fig. 24 is a schematic circuit diagram of a variable voltage dividing unit of the internal resistance testing system of the lithium battery according to the embodiment of the present application;
fig. 25 is a schematic circuit diagram of an analog-to-digital conversion subunit of the lithium battery internal resistance testing system according to the embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings.
At present, a circuit system for testing the internal resistance of a lithium battery generally adopts a phase-locked amplifier to amplify voltage signals at two ends of the internal resistance of the lithium battery. The requirement of using a lock-in amplifier is that the voltage signal cannot be filtered when phase detection is performed. The voltage signal is detected by using the phase-locked amplifier without filtering, and if the voltage signal has no interference signal, the voltages at two ends of the internal resistance of the battery can be accurately detected by using the phase-locked amplifier, so that the accurate internal resistance of the battery is obtained.
However, in the actual use process of the circuit for measuring the internal resistance of the battery, the voltages at the two ends of the internal resistance of the battery usually have interference signals, and if the voltages at the two ends of the internal resistance of the battery are not filtered, the internal resistance of the battery obtained by the lock-in amplifier may have considerable errors. Therefore, a lithium battery internal resistance testing system is needed to solve the problem of interference signals existing when testing the internal resistance of the battery and accurately obtain the internal resistance of the lithium battery.
Based on this, the embodiment of the application provides a lithium battery internal resistance test system for accurately testing the internal resistance of a lithium battery, and improves the lithium battery internal resistance test precision.
The embodiment of the application provides a lithium battery internal resistance test system, as shown in fig. 1, this system includes: the constant current testing device comprises an alternating current constant current module 100 for generating constant testing current, a signal conditioning module 200 for detecting voltages at two ends of a battery and connected with the alternating current constant current module 100, and a control module 300 respectively connected with the signal conditioning module 200 and the alternating current constant current module 100.
The signal conditioning module 200 includes: the device comprises a filtering input unit 210 for filtering a voltage to be detected, a first input amplification unit 220 for amplifying the voltage to be detected, a second input amplification unit 230 for removing a common-mode voltage of a preset waveform voltage in an alternating current constant current module, a test switch unit 240, a filtering amplification anti-aliasing unit 250 for respectively performing band-pass filtering processing, variable amplification processing and anti-aliasing processing on an output voltage of the first input amplification unit and an output voltage of the second input amplification unit, and an analog-to-digital conversion unit 260. The input end of the filter input unit 210 is connected to the positive and negative electrodes of the lithium battery to be tested, respectively, and the output end of the filter input unit 210 is connected to the input end of the first input amplifying unit 220. The filtering input unit 210 may transmit the voltage across the lithium battery to be tested to the first input amplifying unit 220.
The input end of the second input amplifying unit 230 is connected to the ac constant current module 100, and is configured to amplify the voltage across the reference resistor provided by the ac constant current module 100. The filtering amplification anti-aliasing unit 250 is connected to the first input amplification unit 220 or the second input amplification unit 230 through the test switch unit 240. The filtering amplification anti-aliasing unit 250 is connected to the control module 300 through the analog-to-digital conversion unit 260 to send the voltage at the two ends of the lithium battery to be tested to the control module 300, so that the control module 300 outputs the internal resistance of the lithium battery to be tested. The filtering, amplifying and anti-aliasing unit can sequentially perform band-pass filtering processing, variable amplifying processing and anti-aliasing processing.
In addition, the control module 300 is connected to the ac constant current module 100, and is configured to control the ac constant current module 100 to generate a constant test current. The control module 300 may be in isolated communication with the ac constant current module 100.
The test switch unit 240 of the present application may sequentially switch the connection to the first input amplification unit 220 or the second input amplification unit 230 through a plurality of cycles of the voltage waveform during the test. In the prior art, the electronic switch used by the lock-in amplifier has high switching speed requirement, and must obtain a complete waveform period, and the test switch unit 240 of the present application can obtain voltages of a plurality of waveform periods to determine the internal resistance of the lithium battery, thereby reducing the requirement on the equipment.
In the embodiment of the present application, as shown in fig. 1, the filtering input unit 210 includes: the voltage testing device comprises a voltage positive access terminal 211, a voltage negative access terminal 212, a protection subunit 213 for protecting a circuit, a passive filtering subunit 214 for removing high-frequency noise in the voltage to be tested, and a first blocking capacitor 215 for blocking a direct current signal.
The positive voltage access end 211 and the negative voltage access end 212 are used as input ends of the filter input unit 210, and the positive voltage access end 211 and the negative voltage access end 212 are respectively connected to the protection subunit 213 and are used for collecting a voltage to be measured of a lithium battery to be measured. The protection subunit 213 is connected to the input end of the passive filtering subunit 214, and is configured to remove high-frequency noise in the voltage to be measured of the lithium battery to be measured. The output end of the passive filtering subunit 214 is connected to the first dc blocking capacitor 215, and is used to remove the dc component from the voltage to be measured. The first blocking capacitor 215 is connected to the first input amplifying unit 220 for amplifying the ac portion of the voltage to be measured.
In the embodiment of the present application, the filtering, amplifying and anti-aliasing unit 250 includes: a band-pass filtering subunit 251, a variable amplifying subunit 252, and an anti-aliasing filtering subunit 253, as shown in fig. 1. The input terminal of the band-pass filtering subunit 251 is connected to the fifteenth pin of an analog switch chip U39 (as shown in fig. 2, the model may be CD4053, and for convenience of description, the analog switch chip U39 of the test switch unit is referred to as the first analog switch chip of the present application), and the output terminal of the band-pass filtering subunit 251 is connected to the input terminal of the variable amplifying subunit 252. Wherein, the center frequency of the band-pass filtering subunit 251 is 1 KHz. The output end of the variable amplification subunit 252 is connected to the anti-aliasing filtering subunit 253, and is configured to filter out frequency components of the voltage to be measured of the lithium battery, where the sampling frequency does not meet the preset condition.
Because the international standard of the battery internal resistance test is that 1KHz alternating current is used, voltage drop is generated at two ends of the internal resistance of the battery, and therefore the center frequency of the band-pass filtering subunit 251 in the application adopts 1 KHz. The anti-aliasing filtering subunit 253 is used for filtering frequency components, of the voltage to be detected, of which the sampling frequency is higher than one half of the sampling rate, and because the under-sampling is moved to a useful frequency section, the sampling time is distorted, and errors are brought to the lithium battery internal resistance test, the anti-aliasing filtering subunit 253 can filter the frequency components of which the sampling frequency does not meet the preset conditions, and the influence caused by the high frequency of the under-sampling is avoided.
In the embodiment of the present application, the ac constant current module 100 is used to generate a constant test current, as shown in fig. 1, the ac constant current module 100 includes: the voltage-based constant-voltage power supply comprises a comparison unit 101 for generating constant voltage, a power amplification unit 102, a reference resistance unit 103, a voltage following unit 104 for enhancing the driving capability of preset waveform voltage, and an instrument amplification unit 105.
The output end of the comparing unit 101 is connected to the input end of the power amplifying unit 102, and is used for improving the load capacity of the constant voltage. A second input terminal of the comparing unit 101 is connected to the output terminal of the meter amplifying unit 105, and is configured to compare the preset waveform voltage with the voltage across the selected reference resistor in the reference resistor unit 103. The reference resistance unit 103 is connected to the output end of the power amplifying unit 102 and the input end of the voltage following unit 104, and is used for transmitting the voltage across the selected reference resistance to the comparing unit 101 and generating a constant alternating current. The output end of the voltage following unit 104 is connected to the input end of the instrument amplification unit 105 and the input end of the second input amplification unit 230 respectively.
According to the voltage control circuit, the comparison unit 101, the power amplification unit 102, the reference resistance unit 103, the voltage following unit 104 and the instrument amplification unit 105 are arranged, the voltages at two ends of the reference resistance are compared with the preset waveform voltage to form a negative feedback loop, and the voltages at two ends of the reference resistance are constantly equal to the preset waveform voltage. The power of the constant voltage output from the comparison unit 101 is amplified by the power amplification unit 102, thereby enhancing the load capacity. The voltage following unit 104 also plays a role in isolating the reference resistor from the signal conditioning circuit, and if the signal conditioning circuit is directly connected to the reference resistor through the blocking capacitor, a shunt function may be generated, so that the constant test current generated by the ac constant current module cannot pass through the reference resistor, and the current magnitude of the constant test current is changed.
As shown in fig. 1, the ac constant current module 100 further includes: the high-frequency signal processing circuit comprises a waveform generating unit 106 for generating a preset waveform voltage, a low-pass filtering unit 107 for removing a high-frequency signal, an arc preventing unit 108, a second blocking capacitor 109, a protection circuit unit 110, a current positive connecting end 111 and a current negative connecting end 112.
The waveform generating unit 106 is connected to an input terminal of the low-pass filtering unit 107, and is configured to transmit the preset waveform voltage to the low-pass filtering unit 107 to remove a high-frequency interference signal in the preset waveform voltage. The waveform generating unit 106 is configured to generate a preset waveform voltage. The output of the low-pass filtering unit 107 is connected to the input of the comparing unit 101. The input end of the arc-proof unit 108 is connected with the reference resistance unit 103, and the output end of the arc-proof unit 108 is connected with one end of the second dc blocking capacitor 109, so as to remove the dc part in the constant test current generated by the ac constant current module 100. The other end of the second dc blocking capacitor 109 is connected to the protection circuit unit 110. The protection circuit unit 110 is connected to a current positive input terminal 111 and a current negative input terminal 112. The current positive access terminal 111 and the current negative access terminal 112 are used for connecting the positive electrode and the negative electrode of the lithium battery to be tested so as to transmit the constant test current to the internal resistance of the lithium battery to be tested.
In the embodiment of the present application, the control module 300 and the waveform generating unit 106 in the ac constant current module 100 control the waveform generating unit 100 to generate the preset waveform voltage. The waveform of the preset waveform voltage corresponds to the waveform of the analog signal in the conversion standard of the analog-to-digital conversion unit 260.
Further, the control module 300 includes a main control single chip microcomputer U47 (as shown in fig. 3, the model may be HC32L170170JATA)310, a photoelectric isolation unit 320, and a display unit 330. Fig. 1 is a schematic structural diagram of a control module 300, and the main control single chip microcomputer 310 is connected to the analog-to-digital conversion unit 260, and is configured to receive the digital signal sent by the analog-to-digital conversion unit 260 and determine the internal resistance of the battery of the lithium battery to be tested according to the digital signal. The main control single chip microcomputer 310 is further connected to the photoelectric isolation unit 320, and is configured to send a pulse signal corresponding to an integer multiple of the frequency of the preset waveform voltage to the photoelectric isolation unit 320. The main control singlechip 310 is connected with the display screen unit 330 and is used for outputting the internal resistance of the battery.
The photoelectric isolation unit 320 is connected with the waveform generation unit 106, so that the alternating current constant current module 100 and the signal conditioning module 200 are electrically isolated, and the common-mode signal rejection capability of the lithium battery internal resistance test system is improved.
In addition, the control module 300 may further be connected to an input unit 340, and the input unit 340 may be configured to select reference resistors with different resistance values, so that the ac constant current module 100 generates different constant test currents, or is configured to adjust the output accuracy of the lithium battery internal resistance test system.
In the embodiment of the application, the lithium battery internal resistance testing system supplies power through the isolation power supply unit and the external power supply. The isolation power supply unit is respectively connected with the alternating current constant current module and the control module and used for supplying power to the alternating current constant current module. And the external power supply is respectively connected with the signal conditioning module and the control module and is used for supplying power to the signal conditioning module and the control module. The alternating current constant current module and the signal conditioning module are respectively isolated for power supply, so that the inhibition capability of common-mode signals in the lithium battery internal resistance test system is further improved.
The above-mentioned module units are described in detail according to the detailed circuit diagram, so that those skilled in the art can further understand the technical solution of the present application.
In the circuit diagram of the present application, VCC is a positive power supply of the signal conditioning module, VEE is a negative power supply of the signal conditioning module, and GND is a ground of the signal conditioning module. SVCC is the positive supply of the AC constant current module. SVEE is the negative supply of alternating current constant current module, and SGND is the ground connection of alternating current constant current module.
In the embodiment of the present application, as shown in fig. 4, a schematic diagram of the first input amplifying unit 220 includes: the circuit comprises a first resistor R149, a second resistor R152, a third resistor R155, a fourth resistor R156, a fifth resistor R73, a first diode D11, a second diode D24, a first capacitor C52, a second capacitor C66 and a first operational amplifier U27A.
One end of the first resistor R149 serves as an input end of the first input amplifying unit 220, and the other end of the first resistor R149 is connected to an anode of the first diode D11, a cathode of the second diode D24, and a non-inverting input end of the first operational amplifier U27A, respectively. The negative phase input terminal of the first operational amplifier U27A is connected to one end of the second resistor R152 and one end of the third resistor R155, respectively. The other end of the third resistor R155 is connected to the output terminal of the first operational amplifier U27A as the output terminal of the first input amplifying unit 220. A positive power terminal of the first operational amplifier U27A is connected to one end of the first capacitor C52 and one end of the fourth resistor R156, respectively. A negative power supply terminal of the first operational amplifier U27A is connected to one end of the second capacitor C66 and one end of the fifth resistor R73, respectively.
The other end of the second resistor R152, the other end of the first capacitor C52, and the other end of the second capacitor C66 are connected to a power ground, respectively. The cathode of the first diode D11 is connected with the positive power supply, the anode of the second diode D24 is connected with the negative power supply, the other end of the fourth resistor R156 is connected with the positive power supply, and the other end of the fifth resistor R73 is connected with the negative power supply.
The first resistor R149, the first diode D11 and the second diode D24 form a clamping circuit to prevent voltage overshoot. The first operational amplifier U27A, the second resistor R152 and the third resistor R155 form an in-phase amplifying circuit for amplifying the amplitude of the voltage to be measured.
In fig. 4, the voltage regulator further includes a filter input unit portion, a voltage positive connection terminal J3, a voltage negative connection terminal J10, a first fuse F2, a first voltage dependent resistor RV2, a first inductor L2, a seventh capacitor C32, a sixteenth resistor R146, and a first dc blocking capacitor C2.
The positive voltage input terminal J3 is connected to the input terminal of the first fuse F2, and the output terminal of the first fuse F2 is connected to one end of the first varistor RV2 and one end of the first inductor L2, respectively. The other end of the first inductor L2 is connected to one end of the seventh capacitor C32 and one end of the first dc blocking capacitor C2, respectively. The other end of the first dc blocking capacitor C2 is connected to one end of the sixteenth resistor R146 and one end of the first resistor R149. The voltage negative access terminal J10 is connected to the other end of the first voltage dependent resistor RV2, the other end of the seventh capacitor C32, and the other end of the sixteenth resistor R146, respectively, and is grounded.
The first fuse F2 and the first piezoresistor RV2 form a protection subunit, and the first inductor L2 and the seventh capacitor C32 form a passive filtering subunit. The sixteenth resistor R146 is a ground resistor.
A schematic diagram of a second input amplification unit, as shown in fig. 5, includes: the circuit comprises a second operational amplifier U21A, a third operational amplifier U21B, a fourth operational amplifier U21C, a fifth operational amplifier U21D, a sixth resistor R49, a seventh resistor R11, an eighth resistor R60, a ninth resistor R63, a tenth resistor R48, an eleventh resistor R12, a twelfth resistor R126, a thirteenth resistor R125, a fourteenth resistor R127, a fifteenth resistor R128, a third capacitor C3, a fourth capacitor C4, a fifth capacitor C116, a sixth capacitor C117, a third diode D9, a fourth diode D10, a fifth diode D25 and a sixth diode D32. The second operational amplifier U21A, the third operational amplifier U21B, the fourth operational amplifier U21C, and the fifth operational amplifier U21D are packaged as a four-operational amplifier U21. The model of the operational amplifier composed of the second operational amplifier U21A, the third operational amplifier U21B, the fourth operational amplifier U21C and the fifth operational amplifier U21D may be TL 084.
The third capacitor C3 and the fourth capacitor C4 are dc blocking capacitors. The sixth resistor R49 and the tenth resistor R48 are ground resistors, and the 1 st, 2 nd and 3 rd units (the second operational amplifier U21A, the third operational amplifier U21B and the fourth operational amplifier U21C) in the operational amplifier U21 constitute an instrumentation operational amplifier.
One end of the third capacitor C3 and one end of the fourth capacitor C4 are respectively used as input ends of the second input amplifying unit. The other end of the third capacitor C3 is connected to one end of the sixth resistor R49 and one end of the seventh resistor R11, respectively. The other end of the seventh resistor R11 is connected to the cathode of the third diode D9, the anode of the fourth diode D10, and the non-inverting input terminal of the second operational amplifier U21A, respectively. The negative input of the second operational amplifier U21A is connected to the output of the second operational amplifier U21A. The second operational amplifier U21A is connected to the positive power supply terminal and the negative power supply terminal of the third operational amplifier U21B, the fourth operational amplifier U21C, and the fifth operational amplifier U21D, respectively.
The output terminal of the second operational amplifier U21A is connected to one terminal of an eighth resistor R60. The other end of the eighth resistor R60 is connected to one end of the ninth resistor R63 and the negative input terminal of the fourth operational amplifier U21C, respectively. The other end of the ninth resistor R63 is connected to the output end of the fourth operational amplifier U21C and serves as the output end of the second input amplifying unit. The other end of the fourth capacitor C4 is connected to one end of the tenth resistor R48 and one end of the eleventh resistor R12, respectively. The other end of the eleventh resistor R12 is connected to the cathode of the fifth diode D25, the anode of the sixth diode D32, and the non-inverting input terminal of the third operational amplifier U21B, respectively. The negative input of the third operational amplifier U21B is connected to the output of the third operational amplifier U21B. The output terminal of the third operational amplifier U21B is connected to one terminal of the twelfth resistor R126.
The other end of the twelfth resistor R126 is connected to one end of the thirteenth resistor R125 and the non-inverting input terminal of the fourth operational amplifier U21C, respectively. One end of the fourteenth resistor R127 is connected to one end of the fifth capacitor C116 and the positive power terminal of the fifth operational amplifier U21D, respectively. One end of the fifteenth resistor R128 is connected to one end of the sixth capacitor C117 and the negative power supply end of the fifth operational amplifier U21D, respectively. The negative input terminal of the fifth operational amplifier U21D is connected to the output terminal of the fifth operational amplifier U21D.
The other end of the sixth resistor R49 is grounded, the anode of the third diode D9 is connected to the negative power supply, and the cathode of the third diode D10 is connected to the positive power supply. The other end of the tenth resistor R48 is grounded, the anode of the fifth diode D25 is connected to the negative power supply, and the cathode of the sixth diode D32 is connected to the positive power supply. The non-inverting input terminal of the fifth operational amplifier U21D is grounded, the other terminal of the fifth capacitor C116 is grounded, and the other terminal of the fourteenth resistor R127 is connected to the positive power supply. The other end of the fifteenth resistor R128 is connected to the negative power supply, and the other end of the sixth capacitor C117 is grounded.
The schematic diagram of the test switch unit, as shown in fig. 2, includes: the circuit comprises a first analog switch chip U39, a sixteenth resistor R157, a seventeenth resistor R82, a seventh capacitor C68 and an eighth capacitor C88.
The first pin BY of the first analog switch chip U39 is used for connecting the output terminal of the first input amplifying unit, and the second pin BX of the first analog switch chip U39 is used for connecting the output terminal of the second input amplifying unit. The test switch unit is switched and connected with the signal conditioning module and the alternating current constant current module through a first pin BY and a second pin BX of the first analog switch chip U39.
The third pin CY, the fourth pin COUT/IN, the fifth pin CX, and the sixth pin INH of the first analog switch chip U39 are respectively connected to one end of the seventh capacitor C68. The other end of the seventh capacitor C68 is connected to the seventh pin VEE of the first analog switch chip U39 and one end of the sixteenth resistor R157, respectively. The eighth pin GND of the first analog switch chip U39 is connected to the other end of the seventh capacitor C68. The tenth pin B of the first analog switch chip U39 is connected to the control module (the forty-second pin PB06 of the master control single chip microcomputer U47) and is configured to receive a control signal sent by the control module (the master control single chip microcomputer). The fifteenth pin BOUT/IN of the first analog switch chip U39 is connected with a filtering amplification anti-aliasing unit. The sixteenth pin VCC of the first analog switch chip U39 is connected to one end of the eighth capacitor C88 and one end of the seventeenth resistor R82, respectively.
The eighth pin GND of the first analog switch chip U39 is grounded, the other end of the sixteenth resistor R157 is connected to a negative power supply, the ninth pin C of the first analog switch chip U39 is grounded, and the eleventh pin a, the twelfth pin AX, the thirteenth pin AY, and the fourteenth pin AOUT/IN of the first analog switch chip U39 are respectively connected to and grounded. The other end of the seventeenth resistor R82 is connected to the positive power supply, and the other end of the eighth capacitor C88 is grounded.
The test switch unit is connected to the band-pass filtering subunit, and the schematic diagram of the band-pass filtering subunit is shown in fig. 6, and includes: a sixth operational amplifier U27B, a seventh operational amplifier U33B, an eighth operational amplifier U33A, a ninth operational amplifier U36B, a tenth operational amplifier U36A, an eighteenth resistor R77, a nineteenth resistor R164, a twentieth resistor R81, a twenty-first resistor R165, a twenty-second resistor R166, a twenty-third resistor R169, a twenty-fourth resistor R170, a twenty-fifth resistor R171, a twenty-sixth resistor R83, a twenty-seventh resistor R84, a twenty-eighth resistor R176, a twenty-ninth resistor R177, a thirty-third resistor R181, a thirty-eleventh resistor R182, a thirty-second resistor R183, a thirty-third resistor R88, a thirty-fourth resistor R89, a ninth capacitor C111, a tenth capacitor C112, an eleventh capacitor C134, a twelfth capacitor C143, a thirteenth capacitor C137, a fourteenth capacitor C144, a fifteenth capacitor C96, a sixteenth capacitor C97, a seventeenth capacitor C136, a seventeenth capacitor C138, a nineteenth capacitor C139, a, A twenty-first capacitor C140, a twenty-second capacitor C141, a twenty-third capacitor C102, a twenty-fourth capacitor C100, and a twenty-fifth capacitor C103.
The sixth operational amplifier U27B and the first operational amplifier U27A are packaged as a dual operational amplifier, and the type of the dual operational amplifier may be TL 082. The type of the dual operational amplifier formed by the seventh operational amplifier U33B and the eighth operational amplifier U33A may be TL 082. The model of the dual operational amplifier formed by the ninth operational amplifier U36B and the tenth operational amplifier U36A may be TL 082.
The positive phase input end of the sixth operational amplifier U27B is connected to the test switch unit, the negative phase input end of the sixth operational amplifier U27B is connected to the output end of the sixth operational amplifier U27B and one end of a nineteenth resistor R164, the positive power supply end of the sixth operational amplifier U27B is connected to one end of a ninth capacitor C111, one end of an eighteenth resistor R77, the other end of the ninth capacitor C111 is grounded, and the other end of the eighteenth resistor R77 is connected to the positive power supply. The negative power supply end of the sixth operational amplifier is respectively connected with one end of a tenth capacitor C112 and one end of a twentieth resistor R81, the other end of the tenth capacitor C112 is grounded, and the other end of the twentieth resistor R81 is connected with a negative power supply.
The other end of the nineteenth resistor R164 is connected to one end of the eleventh capacitor C134, one end of the twenty-first resistor R165, and one end of the twenty-second resistor R166, respectively, and the other end of the eleventh capacitor C134 is connected to the non-inverting input terminal of the seventh operational amplifier U33B and grounded. The other end of the twenty-first resistor R165 is connected to one end of the twelfth capacitor C143, the output end of the seventh operational amplifier U33B, and one end of the twenty-third resistor R169, and the other end of the twenty-second resistor R166 is connected to the negative input end of the seventh operational amplifier U33B and the other end of the twelfth capacitor C143. The positive power supply terminal of the seventh operational amplifier U33B is connected to the positive power supply terminal of the eighth operational amplifier U33A, and the negative power supply terminal of the seventh operational amplifier U33B is connected to the negative power supply terminal of the eighth operational amplifier U33A.
An output end of the seventh operational amplifier U33B is connected to one end of a twenty-third resistor R169, and the other end of the twenty-third resistor R169 is connected to one end of a thirteenth capacitor C135, one end of a twenty-fourth resistor R170, and one end of a twenty-fifth resistor R171, respectively. The other end of the thirteenth capacitor C135 is connected to the non-inverting input terminal of the eighth operational amplifier U33A and to ground, and the other end of the twenty-fourth resistor R170 is connected to one end of the fourteenth capacitor C144, the output terminal of the eighth operational amplifier U33A, and one end of the seventeenth capacitor C136, respectively. The other end of the twenty-fifth resistor R171 is connected to the other end of the fourteenth capacitor C144 and the negative-phase input end of the eighth operational amplifier U33A, respectively.
The positive power supply end of the eighth operational amplifier U33A is connected to one end of a fifteenth capacitor C96 and one end of a twenty-sixth resistor R83, respectively, the other end of the fifteenth capacitor C96 is grounded, and the other end of the twenty-sixth resistor R83 is connected to the positive power supply. The negative power supply end of the eighth operational amplifier U33A is connected to one end of a sixteenth capacitor C97 and one end of a twenty-seventh resistor R84, respectively, the other end of the sixteenth capacitor C97 is grounded, and the other end of the twenty-seventh resistor R84 is connected to a negative power supply.
The other end of the seventeenth capacitor C136 is connected to one end of the twenty-eighth resistor R176, one end of the eighteenth capacitor C137, and one end of the nineteenth capacitor C138, respectively, and the other end of the twenty-eighth resistor R176 is connected to the non-inverting input terminal of the ninth operational amplifier U36B and grounded. The other end of the eighteenth capacitor C137 is connected to one end of the twenty-ninth resistor R177, the output end of the ninth operational amplifier U36B, and one end of the twentieth capacitor C139, respectively, and the other end of the nineteenth capacitor C138 is connected to the other end of the twenty-ninth resistor R177 and the negative input end of the ninth operational amplifier U36B, respectively. The positive power supply terminal of the ninth operational amplifier U36B is connected to the positive power supply terminal of the tenth operational amplifier U36A, and the negative power supply terminal of the ninth operational amplifier U36B is connected to the negative power supply terminal of the tenth operational amplifier U36A.
The other end of the twentieth capacitor C139 is connected to one end of the twenty-first capacitor C140, one end of the twenty-second capacitor C141, and one end of the thirtieth resistor R181, respectively. The other end of the thirtieth resistor R181 is grounded, and connected to one end of the twenty-fourth capacitor C100 and one end of the thirty-first resistor R182, respectively.
The other end of the twenty-first capacitor C140 is connected to one end of the thirty-second resistor R183 and the output end of the tenth operational amplifier U36A, respectively, and serves as the output end of the band-pass filtering subunit. The other end of the twenty-second capacitor C141 is connected to the other end of the thirty-second resistor R183 and the negative-phase input end of the tenth operational amplifier U36A, respectively. A non-inverting input terminal of the tenth operational amplifier U36A is connected to the other terminal of the twenty-fourth capacitor C100 and the other terminal of the thirty-first resistor R182, respectively. A positive power terminal of the tenth operational amplifier U36A is connected to one end of the twenty-third capacitor C102 and one end of the thirty-third resistor R88, respectively, the other end of the twenty-third capacitor C102 is grounded, and the other end of the thirty-third resistor R88 is connected to the positive power supply. The negative power supply end of the tenth operational amplifier U36A is connected to one end of the twenty-fifth capacitor C103 and one end of the thirty-fourth resistor R89, respectively, the other end of the twenty-fifth capacitor C103 is grounded, and the other end of the thirty-fourth resistor R89 is connected to the negative power supply.
The sixth operational amplifier U27B is used as a voltage follower, the seventh operational amplifier U33B and the eighth operational amplifier U33A form a 4-order low-pass filter, the ninth operational amplifier U36B and the tenth operational amplifier U36A form a 4-order high-pass filter, and the high-pass filter and the low-pass filter are connected in series to form a band-pass filter.
The band-pass filtering subunit is connected to the variable amplifying subunit, and the connection relationship of each element of the schematic diagram of the variable amplifying subunit is as shown in fig. 7, where the elements specifically include: an eleventh operational amplifier U34A, a twelfth operational amplifier U34B, a thirty-fifth resistor R168, a thirty-sixth resistor R167, a thirty-seventh resistor R153, a thirty-eighth resistor R172, a thirty-ninth resistor R154, a forty-fourth resistor R158, a forty-first resistor R159, a forty-second resistor R160, a forty-third resistor R161, a twenty-sixth capacitor C89, a twenty-seventh capacitor C94, a twenty-eighth capacitor C95, a twenty-ninth capacitor C107 and a second analog switch chip U42. The eleventh operational amplifier U34A and the twelfth operational amplifier U34B are dual-operational amplifiers, and may be of the type TL 082. The model of the second analog switch chip U42 may be CD 4053.
A positive phase input terminal of the eleventh operational amplifier U34A is used as an input terminal of the variable amplification subunit, a negative phase input terminal of the eleventh operational amplifier U34A is connected to the fourth pin COUT/IN of the second analog switch chip U42, and one end of the thirty-fifth resistor R168 is connected to one end of the thirty-sixth resistor R167 and the third pin CY of the second analog switch chip U42, respectively. The other end of one end of the thirty-sixth resistor R167 is connected to the thirty-seventh resistor R153 and the fifth pin CX of the second analog switch chip U42, respectively. The negative phase input end of the twelfth operational amplifier U34B is connected to the fourteenth pin AOUT/IN of the second analog switch chip U42, and one end of the thirty-ninth resistor R154 is connected to one end of the thirty-eighth resistor R172 and the twelfth pin AX of the second analog switch chip U42, respectively. The other end of the thirty-eighth resistor R172 is connected to the output terminal of the twelfth operational amplifier U34B and the thirteenth pin AO of the second analog switch chip U42, respectively, and serves as the output terminal of the variable amplification subunit. An eleventh pin A of the second analog switch chip U42 is connected with a forty-third pin PB07 of the main control singlechip U47, and a ninth pin C of the second analog switch chip U42 is connected with a forty-first pin PB05 of the main control singlechip U47.
The second analog switch chip U42 selects different resistance voltage division to control the amplification factor of the eleventh operational amplifier U34A and the twelfth operational amplifier U34B, and a variable multiple amplifier is formed.
A schematic diagram of an anti-aliasing filtering subunit connected to the output of the variable amplification subunit, as shown in fig. 8, includes: a forty-fourth resistor R173, a forty-fifth resistor R174, a forty-sixth resistor R175, a forty-seventh resistor R85, a forty-eighth resistor R86, a forty-ninth resistor R178, a fifty-fifth resistor R179, a fifty-first resistor R180, a thirty-third capacitor C145, a thirty-eleventh capacitor C147, a thirty-second capacitor C98, a thirty-third capacitor C99, a thirty-fourth capacitor C142, a thirty-fifth capacitor C148, a thirteenth operational amplifier U1B, and a fourteenth operational amplifier U1A. The thirteenth operational amplifier U1B and the fourteenth operational amplifier U1A may be a dual-operational amplifier model TL 082.
One end of a forty-fourth resistor R173 is used as an input end of the anti-aliasing filtering subunit, and one end of a fifty-fifth resistor R179 is connected to one end of the thirty-fifth capacitor C148 and the output end of the fourteenth operational amplifier U1A, respectively, and is used as an output end of the anti-aliasing filtering subunit, and is connected to the analog-to-digital conversion unit. The thirteenth operational amplifier U1B and the fourteenth operational amplifier U1A form a 4 th order low pass filter for filtering out signals with a sampling frequency of more than one half.
As shown in fig. 9, a circuit diagram of the analog-to-digital conversion unit in the signal conditioning module includes: a fifty-second resistor R129, a thirty-sixth capacitor C118, a thirty-seventh capacitor C119, a thirty-eighth capacitor C120, a thirty-ninth capacitor C121, a forty-fourth capacitor C122, a forty-first capacitor C123, and a first analog-to-digital conversion chip U48. The model of the first analog-to-digital conversion chip U48 may be ADC 8689.
And a seventh pin AIN _ P of the first analog-to-digital conversion chip U48 is used as an input end of the analog-to-digital conversion unit and is connected with an output end of the anti-aliasing filtering subunit. The tenth pin SDI of the first analog-to-digital conversion chip U48 is connected to the seventeenth pin PA07 of the main control single chip microcomputer U47, the eleventh pin CONVST/NCS of the first analog-to-digital conversion chip U48 is connected to the fourteenth pin PA04 of the main control single chip microcomputer U47, the twelfth pin SCLK of the first analog-to-digital conversion chip U48 is connected to the fifteenth pin PA05 of the main control single chip microcomputer U47, and the thirteenth pin SDO0 of the first analog-to-digital conversion chip U48 is connected to the sixteenth pin PA06 of the main control single chip microcomputer U47.
In the embodiment of the application, the control module is connected with the alternating current constant current module through the photoelectric isolation unit, so that the synchronous operation of the signal conditioning module and the alternating current constant current module is realized.
The schematic diagram of the optoelectronic isolation unit is shown in fig. 10, and specifically includes the following components: fifty-third resistor R136, fifty-fourth resistor R143, fifty-fifth resistor R135, fifty-sixth resistor R200, fifty-seventh resistor R145, fifty-eighth resistor R201, high-speed optical coupler chip U57, first optical coupler chip U53 and second optical coupler chip U54. The model of the high-speed optical coupler chip U57 can be HCPL-060L, and the models of the first optical coupler chip U53 and the second optical coupler chip U54 can be LTV 217.
One end of a fifty-third resistor R136 is connected with a thirteenth pin PA03 of the main control singlechip U47, and a sixth pin of the high-speed optocoupler chip U57 is respectively connected with one end of a fifty-fourth resistor R143 and the input end of the waveform generating unit. One end of a fifty-fifth resistor R135 is connected with a thirty-seventh pin PA14/SWCLK of the main control singlechip U47, and a fourth pin of the first optocoupler chip U53 is respectively connected with one end of a fifty-sixth resistor R200 and the reference resistor unit. One end of the fifty-seventh resistor R145 is connected with a thirty-eighth pin PA15 of the main control singlechip U47, and a fourth pin of the second optical coupling chip U54 is respectively connected with the fifty-eighth resistor R201 and the reference resistor unit.
A circuit diagram of the waveform generating unit is shown in fig. 11, and includes: the waveform generation single chip microcomputer U52, a digital-to-analog conversion chip U55, a fifty-ninth resistor R198, a sixteenth resistor R197, a forty-second capacitor C27, a forty-third capacitor C146, a forty-fourth capacitor C162, a forty-fifth capacitor C163, a forty-sixth capacitor C124 and a voltage stabilizing diode U51 serving as a reference voltage chip. The model of the waveform generation singlechip U52 can be HC32F003C4PA, and the model of the digital-to-analog conversion chip U55 can be TPC112S 1. The zener diode U51 may be model TL431 with pin 1 being the regulation terminal, pin 2 being the anode, and pin 3 being the cathode.
The fifth pin of the digital-to-analog conversion chip U55 is used as the input end of the waveform generation unit, the sixth pin of the digital-to-analog conversion chip U55 is connected with the nineteenth pin P32/AIN2/VCIN2 of the waveform generation singlechip U52, and the seventh pin of the digital-to-analog conversion chip U55 is connected with the twentieth pin P33/AIN3/VCIN3 of the waveform generation singlechip U52.
The second pin of the digital-to-analog conversion chip U55 is connected to the anode of the zener diode U51, the adjustment terminal of the zener diode U51, one end of the sixteenth resistor R197, and one end of the forty-fifth capacitor C163, respectively. The third pin and the fourth pin of the digital-to-analog conversion chip U55 output preset waveform voltages. The third pin of the digital-to-analog conversion chip U55 is connected to the fourth pin of the digital-to-analog conversion chip U55, and is used as the output end of the waveform generation circuit and connected to the low-pass filtering unit.
The schematic diagram of the low-pass filter unit is shown in fig. 12, and its internal components include: sixty-first resistor R202, sixty-second resistor R203, sixty-third resistor R204, forty-seventh capacitor C168, forty-eighth capacitor C169, and fifteenth operational amplifier U26D.
The fifteenth operational amplifier U26D, the eighteenth operational amplifier U26A, the nineteenth operational amplifier U26B, and the twentieth operational amplifier U26C may be TL084 model packaged quad-op-amp operational amplifiers, wherein the 4 pins of the fifteenth operational amplifier U26D are respectively connected to the 4 pins of the eighteenth operational amplifier U26A, the 4 pins of the nineteenth operational amplifier U26B, and the 4 pins of the twentieth operational amplifier U26C, and the 11 pins of the fifteenth operational amplifier U26D are respectively connected to the 11 pin of the eighteenth operational amplifier U26A, the 11 pin of the nineteenth operational amplifier U26B, and the 11 pin of the twentieth operational amplifier U26C.
One end of the sixty-first resistor R202 serves as an input end of the low-pass filtering unit, and an output end of the fifteenth operational amplifier is connected with one end of the sixty-second resistor R203 and one end of the forty-eighth capacitor C169 respectively and serves as an output end of the low-pass filtering unit.
In the embodiment of the present application, a schematic diagram of the comparing unit and the power amplifying unit is shown in fig. 13, and the comparing unit has two input ends, which are respectively connected to the low-pass filtering unit and the meter amplifying unit. The comparison unit specifically comprises: sixty-fourth resistor R184, sixty-fifth resistor R185, sixty-sixth resistor R188, sixty-seventh resistor R189, forty-ninth capacitor C106, fifty-fifth capacitor C105, fifty-first capacitor C153, fifty-second capacitor C154, sixteenth operational amplifier U43, seventeenth operational amplifier U28A. The model of the sixteenth operational amplifier U43 may be OP07, and the model of the seventeenth operational amplifier U28A may be TL082 with dual operational amplifiers.
One end of a forty-ninth capacitor C106 is used as the input end of the comparison unit and is connected with the low-pass filtering unit, and one end of a fifty-fifth capacitor C105 is used as the input end of the comparison unit and is connected with the instrument amplification unit. The output terminal of the seventeenth operational amplifier U28A serves as the output terminal of the power amplification unit.
And the sixteenth operational amplifier U43 forms a comparison circuit, the sine wave voltage signal S filtered by the low-pass filtering unit and the voltage signal SE at two ends of the reference resistor output by the instrument amplifying unit respectively enter the comparison circuit, and a comparison result is output after comparison, and an analog signal is stably output through a negative feedback loop. Pins 1 and 5 of the sixteenth operational amplifier U43 are floating. The seventeenth operational amplifier U28A is a follower circuit, and can increase the current output without amplifying the voltage amplitude, thereby enhancing the on-load capability.
The power amplifying unit is connected with a reference resistance unit, and in the embodiment of the present application, a schematic diagram of the reference resistance unit is shown in fig. 14. The method specifically comprises the following elements:
a first reference resistor R190, a second reference resistor R191, a third reference resistor R192, a fourth reference resistor R193, and a third analog switch chip U46. Among them, the model of the third analog switch chip U46 may be TPW 4052.
The third pin YOUT/IN of the third analog switch chip U46 is connected to the thirteenth pin XOUT/IN of the third analog switch chip U46, and serves as an input terminal of the reference resistor unit, and is connected to the power amplifying unit. One end of the first reference resistor R190 is connected to the first pin 0Y of the third analog switch chip U46 and the twelfth pin 0X of the third analog switch chip U46, one end of the second reference resistor R191 is connected to the fifth pin 1Y of the third analog switch chip U46 and the fourteenth pin 1X of the third analog switch chip U46, one end of the third reference resistor R192 is connected to the second pin 2Y of the third analog switch chip U46 and the fifteenth pin 2X of the third analog switch chip U46, and one end of the fourth reference resistor R193 is connected to the fourth pin 3Y of the third analog switch chip U46 and the eleventh pin 3X of the third analog switch chip U46. The ninth pin B and the tenth pin a of the third analog switch chip U46 are both connected to the voltage follower unit. The other end of the first reference resistor R190 is connected to the other end of the second reference resistor R191, the other end of the third reference resistor R192 and the other end of the fourth reference resistor R193 respectively, and is connected to the arc-proof unit as the output end of the reference resistor unit.
The third analog switch chip U46 may select to switch on the reference resistor to control the magnitude of the output constant test current.
In the embodiment of the present application, the elements in the voltage follower unit are specifically connected, as shown in fig. 15, the voltage follower unit specifically includes the following elements: a fourth analog switch chip U44, a seventh diode D35, an eighth diode D36, a ninth diode D37, a twelfth diode D38, an eighteenth operational amplifier U26A, and a nineteenth operational amplifier U26B. The model of the fourth analog switch chip U44 may be CD 4052.
A first pin 0Y of the fourth analog switch chip U44 is connected to a first pin 0Y of the third analog switch chip U46 and a twelfth pin 0X of the third analog switch chip U46, a fifth pin 1Y of the fourth analog switch chip U44 is connected to a fifth pin 1Y of the third analog switch chip U46 and a fourteenth pin 1X of the third analog switch chip U46, respectively, a second pin 2Y of the fourth analog switch chip U44 is connected to a second pin 2Y of the third analog switch chip U46 and a fifteenth pin 2X of the third analog switch chip U46, respectively, and a fourth pin 3Y of the fourth analog switch chip U44 is connected to a fourth pin 3Y of the third analog switch chip U46 and an eleventh pin 3X of the third analog switch chip U46, respectively.
The ninth pin B of the fourth analog switch chip U44 is connected to the ninth pin B of the third analog switch chip U46, and the tenth pin a of the fourth analog switch chip U44 is connected to the tenth pin a of the third analog switch chip U46. An eleventh pin 3X of the fourth analog switch chip U44 is connected to the other end of the fourth reference resistor R193, a twelfth pin 0X of the fourth analog switch chip U44 is connected to the other end of the third reference resistor R192, a fourteenth pin 1X of the fourth analog switch chip U44 is connected to the other end of the second reference resistor R191, and a fifteenth pin 2X of the fourth analog switch chip U44 is connected to the other end of the first reference resistor R190.
The output end of the eighteenth operational amplifier U26A and the output end of the nineteenth operational amplifier U26B are used as the output ends of the voltage following unit and are connected with the instrument amplifying unit.
The fourth analog switch chip U44 may select a reference resistor to pick up a signal, and the eighteenth operational amplifier U26A, the nineteenth operational amplifier U26B operate as voltage followers for enhancing the load-carrying capability of the signal after passing through the fourth analog switch chip U44.
Fig. 16 is a circuit diagram of a meter amplifying unit, which specifically includes: a twentieth operational amplifier U26C, a sixty-seventh resistor R137, a sixty-eight resistor R141, a sixty-nine resistor R142, and a seventy resistor R138.
One end of the sixty-eight resistor R141 is connected to the output terminal of the eighteenth operational amplifier U26A, and the sixty-nine resistor R142 is connected to the output terminal of the nineteenth operational amplifier U26B. The output end of the twentieth operational amplifier U26C is used as the output end of the instrumentation amplifier and is connected with the comparison unit.
Fig. 17 is a circuit diagram of an arc-preventing unit connected to a reference resistance unit, the arc-preventing unit including elements: an eleventh diode D45, a twelfth diode D46, a thirteenth diode D47, a fourteenth diode D48, a fifteenth diode D49, a sixteenth diode D50, a fifty-third capacitor C155, a seventy-first resistor R147, a seventy-second resistor R52, a seventy-third resistor R150, a seventy-fourth resistor R151, a seventy-fifth resistor R194, a seventy-sixth resistor R148, a seventy-seventh resistor R53, a first fet Q15, a second fet Q16, a seventy-seventh diode D43, and an eighteenth diode D44.
One end of a seventeenth diode D43 is connected to one end of the fifty-third capacitor C155, the source of the first field effect transistor Q15, one end of the seventy-third resistor R150, one end of the seventy-fourth resistor R151, the anode of the fifteenth diode D49, and the cathode of the sixteenth diode D50, respectively, and serves as the input end of the arc prevention unit. The drain of the second field effect transistor Q16 is connected to the other end of the seventy-third resistor R150, the other end of the seventy-fourth resistor R151 and one end of the seventy-fifth resistor R194 respectively, and is used as the output end of the arc preventing unit and connected to the second dc blocking capacitor.
Fig. 18 is a circuit diagram of the second blocking capacitor, the protection circuit unit, the current positive access terminal, and the current negative access terminal provided in the embodiment of the present application, which specifically includes:
a nineteenth diode D51, a twentieth diode D52, a second piezoresistor RV4, a second fuse F3, a first electrolytic capacitor C1-1, a second electrolytic capacitor C1-2, a seventy-eight resistor R187, a seventy-nine resistor R186, a current positive access terminal J11 and a current negative access terminal J12.
The cathode of the nineteenth diode D51 is connected with one end of the first electrolytic capacitor D52 and the output end of the arc-proof unit. The first electrolytic capacitor C1-1 and the second electrolytic capacitor C1-2 are connected in series to form a second DC blocking capacitor C1. One end of the seventy-eighth resistor R187 is connected to the current positive terminal J11, and the other end of the seventy-eighth resistor R187 is connected to the voltage positive terminal J3. One end of the seventy-ninth resistor R186 is connected to the negative current connection J12 and grounded, and the other end of the seventy-ninth resistor R186 is connected to the negative voltage connection J10.
The nineteenth diode D51 and the twentieth diode D52 are anti-reverse voltage diodes and are connected in parallel to prevent reverse voltage from being connected. The second piezoresistor RV4 and the second fuse F3 form a protection circuit unit. When high voltage occurs, the second voltage dependent resistor RV4 conducts the clamping voltage, and the second fuse F3 fuses the protection circuit. The seventy-eight resistor R187 and the seventy-nine resistor R186 are pull-up and pull-down resistors, when the positive current access terminal J11 and the negative current access terminal J12 are not connected with the positive electrode and the negative electrode of the battery, an alternating current signal can be supplied to the input terminals, and when the battery is connected, the normal measurement is not influenced due to the fact that the seventy-eight resistor R187 and the seventy-nine resistor R186 are high in resistance value.
In the embodiment of the present application, an external power supply supplies power to the control module and the signal conditioning module, and a circuit diagram of the external power supply is shown in fig. 19. The isolation power supply unit can supply power to the alternating current constant current module, so that the isolation of the alternating current constant current module and the signal conditioning module on a signal and a power supply is realized, and the common-mode signal rejection capability of the lithium battery internal resistance test system is improved.
The circuit diagram of the isolated power supply unit is shown in fig. 20, and its elements include: an eighty resistor R56, an eighty-first resistor R59, a fifty-fourth capacitor C164, a fifty-fifth capacitor C165, a fifty-sixth capacitor C166, a fifty-seventh capacitor C125, a fifty-eighth capacitor C129, a second inductor L4, a third inductor L7, a fourth inductor L8, a first switching triode Q11, a second switching triode Q12 and a transformer T2.
One end of the eighty-first resistor R56 is connected to the base of the first switching transistor Q11 and the twenty-first pin PB10 of the main control single chip microcomputer U47, and one end of the eighty-first resistor R59 is connected to the base of the second switching transistor Q12 and the twenty-second pin PB11 of the main control single chip microcomputer U47.
As shown in fig. 21, a circuit diagram of a display screen unit of the control module, the display screen unit J17 includes: sixty-second capacitor C127, sixty-third capacitor C128, and eighty-ninth resistor R3. The model of the display screen unit J17 can be a dot matrix liquid crystal screen of COG 12864. The first pin of the display screen unit J17 is connected with the thirty-sixth pin PF07 of the main control singlechip U47, the second pin of the display screen unit J17 is connected with the thirty-fourth pin PA13/SWDIO of the main control singlechip U47, the third pin of the display screen unit J17 is connected with the thirty-fifth pin PF06 of the main control singlechip U47, the fourth pin of the display screen unit J17 is connected with the twenty-sixth pin PB13 of the main control singlechip U47, and the fifth pin of the display screen unit J17 is connected with the twenty-eighth pin PB15 of the main control singlechip U47.
The main control single chip microcomputer U47 and the power supply chip U58 of the display screen unit J17 are used for supplying power to the main control single chip microcomputer U47 and the display screen unit J17 as shown in FIG. 22, and 3.3V pins of the power supply chip U58 are respectively connected with 3.3V pins in circuits of the main control single chip microcomputer U47 and the display screen unit J17. The power supply chip U58 also supplies power to the first analog-to-digital conversion chip U48.
In the embodiment of the present application, the control module may further be connected with an input unit, and a circuit diagram of the input unit is shown in fig. 23. The input unit includes a first button S1, a second button S2, a third button S3, and a fourth button S4. One end of the first button S1 is connected with a thirty-second pin PA11 of the main control single chip microcomputer U47, one end of the second button S2 is connected with a thirty-first pin PA10 of the main control single chip microcomputer U47, one end of the third button S3 is connected with a thirty-third pin PA09 of the main control single chip microcomputer U47, and one end of the fourth button S4 is connected with a twenty-ninth pin PA08 of the main control single chip microcomputer U47.
In addition, in order to meet the functional perfection of the lithium battery internal resistance test system, a voltage division analog-to-digital conversion unit 400 (as shown in fig. 1) can be further arranged in the lithium battery internal resistance test system, so that the voltages at two ends of the lithium battery to be tested are collected and output, and the diversified requirements of users are met.
The voltage division analog-to-digital conversion unit 400 includes: a variable voltage division subunit 410, an analog-to-digital conversion subunit 420. As shown in fig. 24, the circuit diagram of the variable voltage divider subunit includes the following specific elements: a twenty-first operational amplifier U61A, a twenty-second operational amplifier U61B, a twenty-third diode D33, a twenty-fourth diode D34, an eighty-second resistor R205, an eighty-third resistor R209, an eighty-fourth resistor R211, an eighty-fifth resistor R212, a fifty-ninth capacitor C157, and a fifth analog switch chip U62. The model of the twenty-first operational amplifier U61A and the model of the twenty-second operational amplifier U61B may be a dual operational amplifier TL082, and the model of the fifth analog switch chip U62 may be a CD 4053.
One end of an eighty-second resistor R205 is connected with one end of the first blocking capacitor C2, a ninth pin B of a fifth analog switch chip U62 is connected with a thirty-ninth pin PB03 of the main control singlechip U47, and a tenth pin A of the fifth analog switch chip U62 is connected with a forty-fourth pin PB04 of the main control singlechip U47. The output end of the twenty-second operational amplifier U61B is used as the output end of the variable voltage division subunit and is connected with the analog-digital conversion subunit.
In the embodiment of the present application, a circuit diagram of the analog-to-digital conversion subunit, as shown in fig. 25, specifically includes: eighty-seventh resistor R162, eighty-eighth resistor R163, sixty capacitor C109, sixty-first capacitor C110 and second analog-to-digital conversion chip U63.
A first pin of the second analog-to-digital conversion chip U63 is connected to an output end of the variable voltage-dividing subunit, a third pin of the second analog-to-digital conversion chip U63 is connected to a nineteenth pin PB01 of the main control single chip microcomputer U47, and a fourth pin of the second analog-to-digital conversion chip U63 is connected to an eighteenth pin PB00 of the main control single chip microcomputer U47.
In this embodiment, the pin that does not describe the connection relationship in the schematic circuit diagram of the main control single chip is a floating pin, and is not connected to other components.
The application provides a lithium cell internal resistance test system, at first produce the invariable test current that is used for arousing the lithium cell at the positive negative pole both ends of lithium cell, gather lithium cell both ends voltage again, the system carries out filtering, enlargies the operation to lithium cell both ends voltage, and then obtains accurate lithium cell internal resistance both ends voltage. Furthermore, the internal resistance of the lithium battery can be accurately tested, the circuit provided by the application is simple and high in fault tolerance rate, and compared with the circuit for testing the internal resistance of the lithium battery in the prior art, the error generated in the process of testing the internal resistance of the lithium battery can be reduced.
In addition, the lithium battery internal resistance testing system improves the suppression capability of the system on common-mode signals and reduces internal resistance testing errors by power isolation and signal isolation of the alternating current constant current module and the signal conditioning module. The preset waveform voltage of the alternating current constant current module and the voltage to be tested at two ends of the lithium battery to be tested are switched by the test switch unit, so that the two voltages enter the control module through the same circuit, and the error is further reduced. Therefore, the common-mode signal in the system has very small occupation ratio, and the lithium battery internal resistance can be accurately tested without a phase-locked amplifier, so that the accurate lithium battery internal resistance is obtained.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

Claims (10)

1. The utility model provides a lithium cell internal resistance test system which characterized in that, the system includes: the device comprises an alternating current constant current module, a signal conditioning module and a control module, wherein the alternating current constant current module is used for generating constant test current, the signal conditioning module is used for detecting voltages at two ends of a battery and is connected with the alternating current constant current module, and the control module is respectively connected with the signal conditioning module and the alternating current constant current module;
the signal conditioning module comprises: the device comprises a filtering input unit for filtering a voltage to be detected, a first input amplification unit for amplifying the amplitude of the voltage to be detected, a second input amplification unit for removing the common-mode voltage of a preset waveform voltage in the alternating current constant current module, a test switch unit, a filtering amplification anti-aliasing unit for respectively performing band-pass filtering processing, variable amplification processing and anti-aliasing processing on the output voltage of the first input amplification unit and the output voltage of the second input amplification unit, and an analog-to-digital conversion unit;
the filtering input unit is respectively connected with the anode and the cathode of the lithium battery to be tested and is connected with the first input amplification unit;
the second input amplification unit is connected with the alternating current constant current module;
the filtering, amplifying and anti-aliasing unit is connected with the first input amplifying unit or the second input amplifying unit through the test switch unit;
the filtering amplification anti-aliasing unit is connected with the control module through the analog-to-digital conversion unit so as to send the voltage at two ends of the lithium battery to be tested to the control module, so that the control module outputs the internal resistance of the lithium battery to be tested.
2. The system of claim 1, wherein the filtering input unit comprises: the device comprises a voltage positive access end, a voltage negative access end, a protection subunit for protecting a circuit, a passive filter subunit for removing high-frequency noise in the voltage to be measured and a first blocking capacitor;
the voltage positive access end and the voltage negative access end are both used as the filtering input unit, and are respectively connected with the protection subunit and used for collecting the voltage to be tested of the lithium battery to be tested;
the protection subunit is connected with the passive filtering subunit and is used for removing high-frequency noise in the voltage to be tested of the lithium battery to be tested;
the passive filter subunit is connected with the first blocking capacitor and is used for removing a direct current part in the voltage to be measured;
the first blocking capacitor is connected with the first input amplification unit and used for amplifying the alternating current part of the voltage to be measured.
3. The system of claim 1, wherein the ac constant current module comprises: the voltage-controlled power amplifier comprises a comparison unit for generating constant voltage, a power amplification unit, a reference resistance unit, a voltage following unit for enhancing the driving capability of the preset waveform voltage and an instrument amplification unit;
the comparison unit is connected with the power amplification unit and used for improving the load capacity of the constant voltage;
the comparison unit is connected with the instrument amplification unit and used for comparing the preset waveform voltage with the voltage at two ends of a selected reference resistor in the reference resistor unit;
the reference resistance unit is connected with the power amplification unit and the voltage following unit and used for transmitting the voltages at two ends of the selected reference resistance to the comparison unit and generating a constant alternating current;
the voltage following unit is respectively connected with the instrument amplifying unit and the second input amplifying unit.
4. The system of claim 3, wherein the AC constant current module further comprises: the device comprises a waveform generating unit for generating the preset waveform voltage, a low-pass filtering unit for removing high-frequency signals, an arc preventing unit, a second blocking capacitor, a protection circuit unit, a current positive access end and a current negative access end;
the waveform generating unit is connected with the low-pass filtering unit and used for transmitting the preset waveform voltage to the low-pass filtering unit so as to remove high-frequency interference signals in the preset waveform voltage; the waveform generating unit is used for generating the preset waveform voltage;
the low-pass filtering unit is connected with the comparing unit;
the arc preventing unit is connected with the reference resistance unit and one end of the second blocking capacitor and is used for removing a direct current part in the constant test current generated by the alternating current constant current module;
the other end of the second blocking capacitor is connected with the protection circuit unit;
the protection circuit unit is connected with the current positive access end and the current negative access end;
the current positive access end and the current negative access end are used for connecting the positive electrode and the negative electrode of the lithium battery to be tested so as to convey the constant test current to the internal resistance of the lithium battery to be tested.
5. The system of claim 1, wherein the first input amplification unit comprises: the circuit comprises a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a first diode, a second diode, a first capacitor, a second capacitor and a first operational amplifier;
one end of the first resistor is used as the first input amplification unit, and the other end of the first resistor is respectively connected with the anode of the first diode, the cathode of the second diode and the positive-phase input end of the first operational amplifier;
the negative phase input end of the first operational amplifier is respectively connected with one end of the second resistor and one end of the third resistor;
the other end of the third resistor is connected with the first operational amplifier and used as the first input amplification unit;
a positive power supply end of the first operational amplifier is respectively connected with one end of the first capacitor and one end of the fourth resistor;
and the negative power supply end of the first operational amplifier is respectively connected with one end of the second capacitor and one end of the fifth resistor.
6. The system of claim 1, wherein the second input amplification unit comprises: the second operational amplifier, the third operational amplifier, the fourth operational amplifier, the fifth operational amplifier, the sixth resistor, the seventh resistor, the eighth resistor, the ninth resistor, the tenth resistor, the eleventh resistor, the twelfth resistor, the thirteenth resistor, the fourteenth resistor, the fifteenth resistor, the third capacitor, the fourth capacitor, the fifth capacitor, the sixth capacitor, the third diode, the fourth diode, the fifth diode and the sixth diode;
one end of the third capacitor and one end of the fourth capacitor are respectively used as the second input amplification unit;
the other end of the third capacitor is connected with one end of the sixth resistor and one end of the seventh resistor respectively;
the other end of the seventh resistor is respectively connected with the cathode of the third diode, the anode of the fourth diode and the positive-phase input end of the second operational amplifier;
the negative phase input end of the second operational amplifier is connected with the second operational amplifier;
the second operational amplifier is respectively connected with the positive power supply end and the negative power supply end of the third operational amplifier, the fourth operational amplifier and the fifth operational amplifier;
the second operational amplifier is connected with one end of the eighth resistor;
the other end of the eighth resistor is connected with one end of the ninth resistor and the negative-phase input end of the fourth operational amplifier respectively;
the other end of the ninth resistor is connected with the fourth operational amplifier and is used as the second input amplification unit;
the other end of the fourth capacitor is connected with one end of the tenth resistor and one end of the eleventh resistor respectively;
the other end of the eleventh resistor is connected to the cathode of the fifth diode, the anode of the sixth diode and the positive-phase input end of the third operational amplifier respectively;
the negative phase input end of the third operational amplifier is connected with the third operational amplifier;
the third operational amplifier is connected with one end of the twelfth resistor;
the other end of the twelfth resistor is connected with one end of the thirteenth resistor and the positive-phase input end of the fourth operational amplifier respectively;
one end of the fourteenth resistor is connected to one end of the fifth capacitor and the positive power supply end of the fifth operational amplifier respectively;
one end of the fifteenth resistor is connected with one end of the sixth capacitor and the negative power supply end of the fifth operational amplifier respectively;
and the negative phase input end of the fifth operational amplifier is connected with the fifth operational amplifier.
7. The system of claim 1, wherein the test switch unit comprises: the analog switch chip, the sixteenth resistor, the seventeenth resistor, the seventh capacitor and the eighth capacitor;
a first pin of the analog switch chip is used for connecting the first input amplification unit, and a second pin of the analog switch chip is used for connecting the second input amplification unit;
a third pin, a fourth pin, a fifth pin and a sixth pin of the analog switch chip are respectively connected with one end of the seventh capacitor;
the other end of the seventh capacitor is connected with a seventh pin of the analog switch chip and one end of a sixteenth resistor respectively;
an eighth pin of the analog switch chip is connected with the other end of the seventh capacitor;
a tenth pin of the analog switch chip is connected with the control module and used for receiving a control signal sent by the control module;
a fifteenth pin of the analog switch chip is connected with the filtering amplification anti-aliasing unit;
and a sixteenth pin of the analog switch chip is respectively connected with one end of the eighth capacitor and one end of the seventeenth resistor.
8. The system of claim 7, wherein the filter-amplifier anti-aliasing unit comprises: the device comprises a band-pass filtering subunit, a variable amplification subunit and an anti-aliasing filtering subunit;
the band-pass filtering subunit is connected with a fifteenth pin of the analog switch chip and is connected with the variable amplification subunit; wherein, the center frequency of the band-pass filtering subunit is 1 KHz;
the variable amplification subunit is connected with the anti-aliasing filtering subunit and is used for filtering frequency components of the voltage to be measured of the lithium battery, wherein the sampling frequency does not meet the preset conditions.
9. The system of claim 1, wherein the control module comprises: the system comprises a main control singlechip, a photoelectric isolation unit and a display screen unit;
the master control single chip microcomputer is connected with the analog-to-digital conversion unit and used for receiving the digital signals sent by the analog-to-digital conversion unit and determining the internal resistance of the lithium battery to be tested according to the digital signals;
the master control single chip microcomputer is also connected with the photoelectric isolation unit and used for sending a pulse signal corresponding to the integral multiple frequency of the preset waveform voltage to the photoelectric isolation unit;
the main control single chip microcomputer is connected with the display screen unit and used for outputting the internal resistance of the battery.
10. The system of claim 1, further comprising: isolating the power supply unit and the external power supply;
the isolation power supply unit is respectively connected with the alternating current constant current module and the control module and used for supplying power to the alternating current constant current module;
the external power supply is respectively connected with the signal conditioning module and the control module and is used for supplying power to the signal conditioning module and the control module.
CN202111166365.8A 2021-09-30 2021-09-30 Lithium battery internal resistance test system Active CN113866657B (en)

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