CN113866533A - Method and device for detecting electrical performance of power grid equipment, computer equipment and medium - Google Patents

Method and device for detecting electrical performance of power grid equipment, computer equipment and medium Download PDF

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Publication number
CN113866533A
CN113866533A CN202110981203.3A CN202110981203A CN113866533A CN 113866533 A CN113866533 A CN 113866533A CN 202110981203 A CN202110981203 A CN 202110981203A CN 113866533 A CN113866533 A CN 113866533A
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power grid
determining
corresponding relation
time
electrical performance
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杜钢
杨杰
刘宇
莫文雄
李光茂
蔡汉贤
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Guangzhou Power Supply Bureau of Guangdong Power Grid Co Ltd
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Guangzhou Power Supply Bureau of Guangdong Power Grid Co Ltd
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    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract

The application relates to a method and a device for detecting the electrical performance of power grid equipment, computer equipment and a storage medium; the method comprises the following steps: determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; acquiring a third corresponding relation between the electrical performance and time of the target power grid equipment in an indoor simulation environment; determining an acceleration multiplying power related to the environmental change according to the first corresponding relation and the second corresponding relation; determining a fourth corresponding relation between the electrical performance and the time of the target power grid equipment in the actual operation environment according to the third corresponding relation and the acceleration multiplying factor; determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation; the method can improve the convenience and accuracy of the electrical performance detection of the power grid equipment.

Description

Method and device for detecting electrical performance of power grid equipment, computer equipment and medium
Technical Field
The present application relates to the field of power system technologies, and in particular, to a method and an apparatus for detecting electrical performance of a power grid device, a computer device, and a storage medium.
Background
In recent years, power system technology has been rapidly developed. In order to ensure stable and reliable operation of the power system, the electrical performance of the grid equipment in the power system needs to be detected. At present, in order to accurately obtain the current electrical performance of the power grid equipment in real time, the current electrical performance of the power grid equipment is generally determined according to a correspondence between the electrical performance of the power grid equipment in an operating environment where the power grid equipment is located and time, and the current electrical performance of the power grid equipment is determined according to the correspondence and the current service time of the power grid equipment. In a conventional technical scheme, when determining a corresponding relationship between electrical performance of a power grid device and time, the corresponding relationship is determined by obtaining the electrical performance of the power grid device corresponding to each time in a full life cycle in an operating environment. However, in this way, on one hand, the electrical performance of the electrical equipment is directly detected in the operating environment, and the detection result is not accurate enough due to the influence of the operating environment factors; on the other hand, the corresponding relation between the electrical performance and the time is determined according to the full life cycle of the power grid equipment, the required time is long, and the efficiency of detecting the electrical performance of the power grid equipment is low.
Therefore, how to conveniently and accurately determine the corresponding relationship between the electrical performance of the power grid equipment and the time in the actual operation environment, and further improve the convenience and accuracy of the detection of the electrical performance of the power grid equipment is a technical problem which needs to be solved by technical personnel in the field.
Disclosure of Invention
Therefore, it is necessary to provide a method, an apparatus, a computer device, and a storage medium for detecting electrical performance of a power grid device, which can conveniently and accurately determine a corresponding relationship between electrical performance of the power grid device and time in an actual operating environment, and further improve convenience and accuracy of detecting electrical performance of the power grid device.
A method of electrical performance detection of a power grid device, the method comprising:
determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
acquiring a third corresponding relation between the electrical performance of the target power grid equipment in the indoor simulation environment and the time;
determining an acceleration multiplying power related to environmental change according to the first corresponding relation and the second corresponding relation;
determining a fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time according to the third corresponding relation and the acceleration multiplying power;
and determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
In one embodiment, the process of obtaining the current usage time includes:
acquiring a current resistance value of the target power grid equipment;
and determining the current service time of the target power grid equipment according to the current resistance value and the second corresponding relation.
In one embodiment, the method further comprises:
acquiring an electrical performance extreme value of the target power grid equipment;
determining the service life of the target power grid equipment according to the electrical performance extreme value and the fourth corresponding relation;
and determining the remaining service life of the target power grid equipment according to the current service time and the service life of the target power grid equipment.
In one embodiment, the process of determining an acceleration rate related to an environmental change according to the first corresponding relationship and the second corresponding relationship includes:
determining a first time and a second time corresponding to the target sample wafer reaching the same resistance value under the indoor simulation environment and the actual operation environment respectively according to the first corresponding relation and the second corresponding relation;
and determining the acceleration multiplying power related to the environmental change according to the ratio of the first time to the second time.
In one embodiment, the determining, by using the target sample, a first corresponding relationship between the resistance value and the time of the target power grid device in the indoor simulation environment, and determining, by using the target sample, a second corresponding relationship between the resistance value and the time of the target power grid device in the actual operating environment includes:
determining an orthogonal test condition according to the type, temperature, relative humidity, concentration of deposited salt and concentration of chemical medium of the environment atmosphere, and determining the first corresponding relation between the resistance value and the time of the target power grid equipment in the indoor simulation environment by using the target sample wafer after setting the indoor simulation environment according to the orthogonal test condition;
and determining the second corresponding relation between the resistance value and the time of the target power grid equipment in the actual operation environment by using the target sample wafer.
In one embodiment, the target sample is a rectangular sheet, one surface of the rectangular sheet is attached by an insulating tape, and the other surface is an effective test surface.
In one embodiment, the process of obtaining the electrical performance extreme value of the target grid device includes:
acquiring an initial electrical performance value and an electrical performance variation extreme value of the target power grid equipment;
and determining the electrical performance extreme value according to the initial electrical performance value and the electrical performance variation extreme value.
An electrical performance detection apparatus of a power grid device, the apparatus comprising:
the first determining module is used for determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
the acquisition module is used for acquiring a third corresponding relation between the electrical performance of the target power grid equipment in the indoor simulation environment and the time;
the second determining module is used for determining the acceleration multiplying power related to the environmental change according to the first corresponding relation and the second corresponding relation;
a third determining module, configured to determine, according to the third corresponding relationship and the acceleration rate, a fourth corresponding relationship between the electrical performance of the target power grid device in the actual operating environment and the time;
and the performance determining module is used for determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
A computer device comprising a memory and a processor, the memory storing a computer program, the processor implementing the following steps when executing the computer program:
determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
acquiring a third corresponding relation between the electrical performance of the target power grid equipment in the indoor simulation environment and the time;
determining an acceleration multiplying power related to environmental change according to the first corresponding relation and the second corresponding relation;
determining a fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time according to the third corresponding relation and the acceleration multiplying power;
and determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
A computer-readable storage medium, on which a computer program is stored which, when executed by a processor, carries out the steps of:
determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
acquiring a third corresponding relation between the electrical performance of the target power grid equipment in the indoor simulation environment and the time;
determining an acceleration multiplying power related to environmental change according to the first corresponding relation and the second corresponding relation;
determining a fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time according to the third corresponding relation and the acceleration multiplying power;
and determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
According to the method and the device for detecting the electrical performance of the power grid equipment, the computer equipment and the storage medium, the acceleration multiplying factor is determined by utilizing the change rules of the resistance value of the target sample wafer in the indoor simulation environment and the actual operation environment, namely the first corresponding relation and the second corresponding relation, and then the fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time is determined according to the third corresponding relation between the electrical performance of the target power grid equipment in the indoor simulation environment and the time and the acceleration multiplying factor; therefore, the method avoids directly measuring the electrical performance of the target power equipment in the actual operation environment, so that the accuracy of obtaining the fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time can be improved; in addition, the method determines the fourth corresponding relation between the electrical performance of the target power grid equipment and the time in the actual operation environment by using the acceleration rate, and can determine the fourth corresponding relation in a shorter period, so that the convenience and accuracy of the electrical performance detection of the power grid equipment can be improved.
Drawings
Fig. 1 is a schematic flow chart of a method for detecting electrical performance of a power grid device according to an embodiment;
fig. 2 is a block diagram showing an electrical performance detection apparatus of a power grid device according to an embodiment;
FIG. 3 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
Fig. 1 is a flowchart of a method for detecting electrical performance of a power grid device according to an embodiment of the present invention, and as shown in fig. 1, the method for detecting electrical performance of a power grid device includes the following steps:
102, determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; and the material of the target sample wafer is the same as that of the target power grid equipment.
Specifically, the target sample refers to a sample which is made of the same material as the target power grid device and used for determining the corresponding relation between the resistance value of the target power grid device and time. In the embodiment, a first corresponding relation between the resistance value of the target sample wafer and the time in the indoor simulation environment is determined, and the first corresponding relation is set as a first corresponding relation between the resistance value of the target power grid equipment and the time in the indoor simulation environment; and determining a second corresponding relation between the resistance value of the target sample wafer and the time in the actual operation environment, and setting the second corresponding relation as a second corresponding relation between the resistance value of the target power grid equipment and the time in the actual operation environment.
It should be noted that the actual operating environment in this embodiment is an atmospheric environment in which the target power grid device actually operates, and the indoor simulation environment is a simulation environment established according to the actual operating environment of the target power grid device.
In addition, in this embodiment, the material of the target sample wafer is selected according to the same material as the main functional metal components of the corresponding target power grid device; for example, when the target grid device is a disconnecting switch, the material of the target sample wafer should be the same as the material of the switch knife-switch and the contact of the disconnecting switch.
And 104, acquiring a third corresponding relation between the electrical performance of the target power grid equipment and time in the indoor simulation environment.
Specifically, the electrical performance refers to the performance of the target power grid equipment affected by a chemical medium in an indoor simulation environment or an actual operating environment, and the influence is a negative influence, namely the influence that the performance of the target power grid equipment has a degradation trend compared with the initial state; for example, when the target grid device is an electric lamp, its electrical property may be brightness.
It should be noted that, in actual operation, considering that the types, models, and sizes of the power grid devices are different from each other greatly, when the electrical performance of a special large-scale power grid device needs to be detected, the local important component of the power grid device can be disassembled to be detected, so as to obtain a third corresponding relationship between the electrical performance and time.
And 106, determining the acceleration multiplying power related to the environmental change according to the first corresponding relation and the second corresponding relation.
Specifically, because the environment difference between the indoor simulation environment and the actual operating environment results in a certain rate correspondence between the first correspondence and the second correspondence, the acceleration rate related to the environmental change is determined according to the first correspondence and the second correspondence in this step.
And 108, determining a fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time according to the third corresponding relation and the acceleration rate.
Specifically, for the correspondence between the resistance value and the time, a relationship of acceleration rate exists between a first correspondence under an indoor simulation environment and a second correspondence under an actual operation environment; equivalently, for the corresponding relation between the electrical performance and the time, a relation of acceleration multiplying power should exist between the third corresponding relation in the indoor simulation environment and the fourth corresponding relation in the actual operation environment; that is, the ratio of the first corresponding relationship to the second corresponding relationship is equal to the ratio of the third corresponding relationship to the fourth corresponding relationship, and the ratio is the acceleration magnification.
In this step, after a third corresponding relationship between the electrical performance and the time of the target power grid device in the indoor simulation environment and an acceleration rate related to the environmental change are obtained, a fourth corresponding relationship between the electrical performance and the time of the target power grid device in the actual operation environment is determined according to the third corresponding relationship and the acceleration rate.
And step 110, determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
Specifically, under the condition that the fourth corresponding relation is obtained, the corresponding relation between the electrical performance and the service time of the target power grid equipment in the actual operation environment is obtained; therefore, in this step, the current service time of the target power grid device is obtained, and the current service time is input into the fourth corresponding relationship, so as to determine the current electrical performance corresponding to the current service time. It should be noted that the current use time may be determined by obtaining the operation duration of the target power grid device from the time of putting into use to the current time, or the current use time of the target power grid device may be determined according to the loss condition by measuring the loss condition of the target power grid device, or other manners may be used as long as the current use time of the target power grid device can be obtained, which is not limited in this embodiment.
The method for detecting the electrical performance of the power grid equipment provided by the embodiment of the invention determines the acceleration multiplying factor by utilizing the change rules of the resistance value of the target sample wafer in the indoor simulation environment and the actual operation environment respectively, namely the first corresponding relation and the second corresponding relation, and then determines the fourth corresponding relation between the electrical performance and the time of the target power grid equipment in the actual operation environment according to the third corresponding relation between the electrical performance and the time of the target power grid equipment in the indoor simulation environment and the acceleration multiplying factor; therefore, the method avoids directly measuring the electrical performance of the target power equipment in the actual operation environment, so that the accuracy of obtaining the fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time can be improved; in addition, the method determines the fourth corresponding relation between the electrical performance of the target power grid equipment and the time in the actual operation environment by using the acceleration rate, and can determine the fourth corresponding relation in a shorter period, so that the convenience and accuracy of the electrical performance detection of the power grid equipment can be improved.
On the basis of the foregoing embodiment, this embodiment further describes and optimizes the technical solution, and specifically, in this embodiment, the process of obtaining the current service time includes:
acquiring a current resistance value of the target power grid equipment;
and determining the current service time of the target power grid equipment according to the current resistance value and the second corresponding relation.
It will be appreciated that as the usage time of the target grid device changes, the resistance value will change accordingly, and generally the resistance value will gradually increase as the usage time increases. In this embodiment, to obtain the current service time of the target power grid device, specifically, the current service time of the target power grid device corresponding to the current resistance value is determined by measuring the current resistance value of the target power grid device, and then inputting the current resistance value into a second corresponding relationship according to the predetermined second corresponding relationship.
The method determines the current service time according to the embodiment, and compared with a mode that the corresponding current service time is determined directly according to the service time of the target power grid equipment, the method considers the actual loss condition of the target power grid equipment, so that the obtained current service time is more accurate.
On the basis of the foregoing embodiment, the present embodiment further describes and optimizes the technical solution, and specifically, in the present embodiment, the method further includes:
acquiring an electrical performance extreme value of target power grid equipment;
determining the service life of the target power grid equipment according to the electrical performance extreme value and the fourth corresponding relation;
and determining the remaining service life of the target power grid equipment according to the current service time and service life of the target power grid equipment.
Generally, a power grid device has a certain service life, and when the service life is reached, the electrical performance of the power grid device reaches an electrical performance extreme value, at this time, the power grid device cannot stably and reliably operate, and an unstable operation state such as poor contact or increased electric shock temperature occurs. In a traditional technical scheme, a merchant usually gives the service life of the power grid equipment when the power grid equipment leaves a factory, but due to different factors such as the use strength and the operating environment of the power grid equipment in the actual use process, the loss degree of the power grid equipment is different, namely the given service life is inaccurate.
In this embodiment, an electrical performance extreme value of the target power grid device is further obtained, and the longest service time of the target power grid device, that is, the service life of the target power grid device, is determined according to the electrical performance extreme value and a predetermined fourth corresponding relationship.
Further, under the condition that the service life and the current service life of the target power grid equipment are determined, the remaining service life of the target power grid equipment is determined by using the current service life and the current service life of the target power grid equipment; generally, the remaining service life of the target power grid equipment is obtained by subtracting the current service time from the service life.
Therefore, the service life and the remaining service life of the target power grid equipment are further determined, so that a user can conveniently and timely operate and maintain the target power grid equipment, and the stable and reliable operation of the power system where the target power grid equipment is located is further promoted and guaranteed.
As a preferred embodiment, the process of obtaining the electrical performance extreme of the target grid device includes:
acquiring an initial electrical performance value and an electrical performance variation extreme value of target power grid equipment;
and determining an electrical performance extreme value according to the initial electrical performance value and the electrical performance variation extreme value.
Specifically, when the electrical performance variation of the target power grid device reaches a certain degree, that is, when the electrical performance variation extremum is reached, the stable and reliable operation of the target electrical device is affected. In this embodiment, the electrical performance extreme value is determined by obtaining the initial electrical performance value and the electrical performance variation extreme value of the target power grid device and according to the initial electrical performance value and the electrical performance variation extreme value.
For example, for a disconnector, its electrical properties are the value of the isolation resistance; when the variation of the contact resistance value of the disconnector exceeds 15% of the initial contact resistance value M, that is, when the degraded electrical performance Mp is equal to (1+ 15%) M, that is, when the electrical performance value reaches the electrical performance limit value Mp, the disconnector may not be operated stably and reliably, and an unstable operation state such as a contact failure or an increase in the electric shock temperature may occur.
Therefore, in the embodiment, the electrical performance extreme value of the target power grid device is further determined, and in actual operation, the operation condition of the target power grid device is determined by comparing whether the current electrical performance reaches the electrical performance extreme value.
As a preferred embodiment, the process of determining the acceleration rate related to the environmental change according to the first corresponding relationship and the second corresponding relationship includes:
determining a first time and a second time corresponding to the target sample wafer when the target sample wafer reaches the same resistance value under the indoor simulation environment and the actual operation environment respectively according to the first corresponding relation and the second corresponding relation;
and determining the acceleration multiplying power related to the environmental change according to the ratio of the first time to the second time.
Specifically, in this embodiment, a preset resistance value is obtained, then a first time required for the target sample to reach the preset resistance value in the indoor simulation environment is determined according to the first corresponding relationship, and a second time required for the target sample to reach the preset resistance value in the actual operation environment is determined according to the second corresponding relationship; the preset resistance value is a preset same resistance value that needs to be achieved according to the first corresponding relationship or the second corresponding relationship, and the preset resistance value is a resistance value set according to practical experience. In actual operation, a plurality of preset resistance values can be set, a plurality of groups of corresponding first time and second time are obtained, the ratio of the first time to the second time of each group is respectively determined, and the acceleration multiplying power is obtained according to the average value of the ratios; and (3) building the correlation between the actual operation environment and the indoor simulation environment level by using the acceleration multiplying power.
Therefore, the acceleration multiplying power is determined according to the method of the embodiment, and the operation mode is convenient and easy to implement.
On the basis of the foregoing embodiment, this embodiment further describes and optimizes the technical solution, and specifically, in this embodiment, the process of determining a first corresponding relationship between the resistance value and the time of the target power grid device in the indoor simulation environment by using the target sample, and determining a second corresponding relationship between the resistance value and the time of the target power grid device in the actual operating environment by using the target sample includes:
determining an orthogonal test condition according to the type, temperature, relative humidity, concentration of deposited salt and concentration of chemical medium of the environment atmosphere, and determining the first corresponding relation between the resistance value and the time of the target power grid equipment in the indoor simulation environment by using the target sample wafer after setting the indoor simulation environment according to the orthogonal test condition;
and determining the second corresponding relation between the resistance value and the time of the target power grid equipment in the actual operation environment by using the target sample wafer.
Specifically, when the power grid equipment is made of metal materials or the main functions of the power grid equipment are mainly conducted by metal parts, the electrical performance change of the power grid equipment is related to atmospheric corrosion, the atmospheric corrosion starts from deposition of sea salt particles on the surface of a material, deliquescence/condensation occurs on the surface of the metal due to changes of climatic environments (rainfall, temperature and humidity changes and the like) to generate an electrolyte liquid film, and further electrochemical corrosion occurs to cause the operation failure of the power grid equipment. The atmospheric corrosion rate is closely related to the type, temperature, relative humidity and soluble corrosion media of the environment atmosphere, and the soluble corrosion media comprise salt deposit amount and chemical media of marine salt spray particle chloride (NaCl); the chemical media include sulfur dioxide, nitrogen oxides, ammonia, and the like. The actual operation environment types of the power grid equipment are complex and various, and mainly comprise types such as rural atmosphere, urban atmosphere, industrial atmosphere and marine atmosphere, typical operation environment characteristic conditions of the power grid equipment are collected, the chemical medium type usually existing in the atmospheric environment is determined, the orthogonal test conditions are determined by using parameter level extreme values such as the environmental atmosphere type, temperature, relative humidity, concentration of deposited salt and concentration of chemical medium, the orthogonal environment simulation test is designed, and different indoor simulation environments are established; it should be noted that the extreme high-low values refer to extreme high-low values of the levels of environmental parameters such as corrosion or reliability degradation of the power grid equipment in the operating environment, and are not extreme values of the climate conditions in a broad sense.
TABLE 1 multiple indoor simulation environments
Figure BDA0003229083220000111
Figure BDA0003229083220000121
In a specific implementation mode, at least more than 5 actual operation environments of the target power grid equipment are selected, the selected actual operation environments cover the environment types suffered by the target power grid equipment in actual operation as much as possible, a target sample wafer field exposure test is carried out, the exposure area at least does not exceed a space area of 50 meters with the target power grid equipment, the exposure duration period is at least more than 1 year, the sampling frequency is not less than 5 times, and the sampling number is not less than 3 pieces each time. For example, the actual operating environments at the positions of certain types of isolating switches 5, namely A, B, C, D and E, are selected, and the target sample field exposure test is carried out.
More specifically, the target swatch specifically requires the following:
1) the target sample wafer is a rectangular wafer, the material of the target sample wafer is the same as that of the metal part with the main function of the target power grid equipment, and the method also comprises the same surface treatment process. For example, the disconnecting switch and the contact of the isolating switch are made of red copper, so that a rectangular piece of red copper with the same purity is used as a target sample piece, and the size of the target sample piece is (40 +/-2) mmX (40 +/-2) mm multiplied by 2.5 mm; for each actual operating environment, each sampling frequency is a group of 3 parallel samples, 5 sampling frequencies are provided, and the number of sample wafers is 75 in total;
2) if the target sample wafer has a surface treatment process, the surface needs to be simply and lightly wiped, and dirt on the surface is removed; if the target sample wafer has no surface treatment process, performing wet grinding on the surface of the target sample wafer by using silicon carbide abrasive paper until no obvious scratch exists, cleaning the surface of the experimental wafer by using deionized water, absolute ethyl alcohol and acetone one by one, drying the experimental wafer by cold air, and standing for later use after 24 hours;
3) for accurate target sample piece corruption law of confirming, carry out the front cover to the target sample piece: tightly adhering one surface of a target sample with an insulating adhesive tape such as polytetrafluoroethylene, and defining the other surface of the target sample as an effective test surface, i.e. the effective test surface of the target sample is a single surface of the target sample, and the area of the effective test surface is not less than 10cm2
4) When measuring the resistance value of the target sample wafer, fixing two end points according to the diagonal line of the effective test surface of the target sample wafer for measurement.
Specifically, according to the corrosion resistance change rule of the target sample wafer in the exposure test process, the resistance values of the target sample wafer are respectively R in 5 actual operating environmentsA1~A5、RB1~B5、RC1~C5、RD1~D5、RE1~E5Determining a first corresponding relation between the sample corrosion resistance value R and the exposure test time t of the target sample wafer under the actual operation environment, namely determining that the target power grid equipment is inA first correspondence relationship f (t) R between the resistance value and time in an actual operating environment.
Based on various indoor simulation environments shown in table 1, an indoor environment simulation test is performed on the target power grid device.
At least 1 group of different test conditions are respectively selected to carry out the test in different environmental atmosphere types, for example, 10 groups of indoor simulation environments with single atmosphere number of 1-1 to 1-4, double-atmosphere mixed number of 2-1 to 2-3 and triple-atmosphere mixed number of 3-1 to 3-3 are selected from the indoor simulation environments shown in table 1 to be used for carrying out the test on the isolating switch, as shown in table 2:
TABLE 2 indoor simulation environment of isolating switch
Figure BDA0003229083220000131
Specifically, a target sample wafer is placed in an indoor simulation environment, the sampling quantity is not less than 3 samples at each time, and a first corresponding relation between the resistance value of the target sample wafer and the time in the indoor environment is obtained. Placing at least one isolating switch in each indoor simulation environment; the test time of each indoor simulated environment is not less than 28 days, and the measurement frequency during the test period is not less than 5 times. The initial electrical performance of the disconnector was measured before the start of the test. After the indoor environment simulation test is carried out in the indoor simulation environment, the contact resistance value M of the 10 groups of isolating switches can be obtained0~M10Respectively as a function of the test time t1-x(t’)=M,x=4;f2-y(t’)=M,y=3;f3-Z(t') M, Z3; and determining a third corresponding relation between the electrical performance of the isolating switch in the indoor environment and the time according to the relation.
Therefore, the indoor simulation environment is built according to the method of the embodiment, and the first corresponding relation and the second corresponding relation can be conveniently and accurately determined.
It should be understood that, although the steps in the flowcharts related to the above embodiments are shown in sequence as indicated by the arrows, the steps are not necessarily executed in sequence as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a part of the steps in each flowchart related to the above embodiments may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of performing the steps or stages is not necessarily sequential, but may be performed alternately or alternately with other steps or at least a part of the steps or stages in other steps.
In one embodiment, as shown in fig. 2, there is provided an electrical performance detection apparatus of a power grid device, including: a first determination module 202, an acquisition module 204, a second determination module 206, a third determination module 208, and a performance determination module 210, wherein:
the first determining module 202 is configured to determine a first corresponding relationship between a resistance value and time of the target power grid device in an indoor simulation environment by using the target sample, and determine a second corresponding relationship between the resistance value and time of the target power grid device in an actual operating environment by using the target sample; the material of the target sample wafer is the same as that of the target power grid equipment;
an obtaining module 204, configured to obtain a third corresponding relationship between the electrical performance of the target power grid device in the indoor simulation environment and the time;
a second determining module 206, configured to determine an acceleration rate related to an environmental change according to the first corresponding relationship and the second corresponding relationship;
a third determining module 208, configured to determine a fourth corresponding relationship between the electrical performance of the target power grid device in the actual operating environment and the time according to the third corresponding relationship and the acceleration rate;
a performance determining module 210, configured to determine a current electrical performance of the target power grid device according to the current service time and the fourth corresponding relationship. The device for detecting the electrical performance of the power grid equipment, provided by the embodiment of the invention, has the same beneficial effect as the method for detecting the electrical performance of the power grid equipment.
In one embodiment, the performance determination module includes:
the first obtaining submodule is used for obtaining the current resistance value of the target power grid equipment;
and the first determining submodule is used for determining the current service time of the target power grid equipment according to the current resistance value and the second corresponding relation.
In one embodiment, the electrical performance detection apparatus of the power grid device further includes:
the second obtaining submodule is used for obtaining an electrical performance extreme value of the target power grid equipment;
the second determining submodule is used for determining the service life of the target power grid equipment according to the electrical performance extreme value and the fourth corresponding relation;
and the third determining submodule is used for determining the residual service life of the target power grid equipment according to the current service time and the service life of the target power grid equipment.
In one embodiment, the second determining module includes:
the fourth determining submodule is used for determining corresponding first time and second time when the target sample wafer reaches the same resistance value under the indoor simulation environment and the actual operation environment respectively according to the first corresponding relation and the second corresponding relation;
and the fifth determining submodule is used for determining the acceleration multiplying power related to the environmental change according to the ratio of the first time to the second time.
In one embodiment, the first determining module comprises:
the setting submodule is used for determining an orthogonal test condition according to the type, the temperature, the relative humidity, the concentration of deposited salt and the concentration of a chemical medium of an environment atmosphere, and determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using a target sample wafer after the indoor simulation environment is set according to the orthogonal test condition;
and the sixth determining submodule is used for determining a second corresponding relation between the resistance value and the time of the target power grid equipment in the actual operating environment by using the target sample wafer.
In one embodiment, the second obtaining sub-module includes:
the information acquisition unit is used for acquiring an initial electrical performance value and an electrical performance variation extreme value of the target power grid equipment;
and the extreme value determining unit is used for determining the electrical performance extreme value according to the initial electrical performance value and the electrical performance variation extreme value.
For specific limitations of the electrical performance detection apparatus of the power grid device, reference may be made to the above limitations of the electrical performance detection method of the power grid device, and details are not described here. The modules in the electrical performance detection device of the power grid equipment can be wholly or partially realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 3. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, an operator network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a method of electrical performance detection of a power grid device. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 3 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory and a processor, the memory having a computer program stored therein, the processor implementing the following steps when executing the computer program:
determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
acquiring a third corresponding relation between the electrical performance and time of the target power grid equipment in an indoor simulation environment;
determining an acceleration multiplying power related to the environmental change according to the first corresponding relation and the second corresponding relation;
determining a fourth corresponding relation between the electrical performance and the time of the target power grid equipment in the actual operation environment according to the third corresponding relation and the acceleration multiplying factor;
and determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
The computer equipment provided by the embodiment of the invention has the same beneficial effects as the electric performance detection method of the power grid equipment.
In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:
determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
acquiring a third corresponding relation between the electrical performance and time of the target power grid equipment in an indoor simulation environment;
determining an acceleration multiplying power related to the environmental change according to the first corresponding relation and the second corresponding relation;
determining a fourth corresponding relation between the electrical performance and the time of the target power grid equipment in the actual operation environment according to the third corresponding relation and the acceleration multiplying factor;
and determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
The computer-readable storage medium provided by the embodiment of the invention has the same beneficial effects as the electrical performance detection method of the power grid equipment.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include at least one of non-volatile and volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical storage, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A method of detecting electrical performance of a power grid device, the method comprising:
determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
acquiring a third corresponding relation between the electrical performance of the target power grid equipment in the indoor simulation environment and the time;
determining an acceleration multiplying power related to environmental change according to the first corresponding relation and the second corresponding relation;
determining a fourth corresponding relation between the electrical performance of the target power grid equipment in the actual operation environment and the time according to the third corresponding relation and the acceleration multiplying power;
and determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
2. The method of claim 1, wherein obtaining the current usage time comprises:
acquiring a current resistance value of the target power grid equipment;
and determining the current service time of the target power grid equipment according to the current resistance value and the second corresponding relation.
3. The method of claim 1, further comprising:
acquiring an electrical performance extreme value of the target power grid equipment;
determining the service life of the target power grid equipment according to the electrical performance extreme value and the fourth corresponding relation;
and determining the remaining service life of the target power grid equipment according to the current service time and the service life of the target power grid equipment.
4. The method according to any one of claims 1 to 3, wherein the process of determining the acceleration rate related to the environmental change according to the first corresponding relationship and the second corresponding relationship includes:
determining a first time and a second time corresponding to the target sample wafer reaching the same resistance value under the indoor simulation environment and the actual operation environment respectively according to the first corresponding relation and the second corresponding relation;
and determining the acceleration multiplying power related to the environmental change according to the ratio of the first time to the second time.
5. The method according to claim 4, wherein the step of determining a first corresponding relationship between the resistance value and the time of the target power grid device in the indoor simulation environment by using the target sample, and determining a second corresponding relationship between the resistance value and the time of the target power grid device in the actual operation environment by using the target sample comprises:
determining an orthogonal test condition according to the type, temperature, relative humidity, concentration of deposited salt and concentration of chemical medium of the environment atmosphere, and determining the first corresponding relation between the resistance value and the time of the target power grid equipment in the indoor simulation environment by using the target sample wafer after setting the indoor simulation environment according to the orthogonal test condition;
and determining the second corresponding relation between the resistance value and the time of the target power grid equipment in the actual operation environment by using the target sample wafer.
6. The method of claim 4, wherein the target sample is a rectangular sheet, and one side of the rectangular sheet is attached by an insulating tape and the other side is a valid test side.
7. The method of claim 3, wherein the process of obtaining the electrical performance extremum of the target grid device comprises:
acquiring an initial electrical performance value and an electrical performance variation extreme value of the target power grid equipment;
and determining the electrical performance extreme value according to the initial electrical performance value and the electrical performance variation extreme value.
8. An electrical performance detection apparatus of a power grid device, the apparatus comprising:
the first determining module is used for determining a first corresponding relation between the resistance value and the time of the target power grid equipment in an indoor simulation environment by using the target sample wafer, and determining a second corresponding relation between the resistance value and the time of the target power grid equipment in an actual operation environment by using the target sample wafer; the material of the target sample wafer is the same as that of the target power grid equipment;
the acquisition module is used for acquiring a third corresponding relation between the electrical performance of the target power grid equipment in the indoor simulation environment and the time;
the second determining module is used for determining the acceleration multiplying power related to the environmental change according to the first corresponding relation and the second corresponding relation;
a third determining module, configured to determine, according to the third corresponding relationship and the acceleration rate, a fourth corresponding relationship between the electrical performance of the target power grid device in the actual operating environment and the time;
and the performance determining module is used for determining the current electrical performance of the target power grid equipment according to the current service time and the fourth corresponding relation.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 7.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 7.
CN202110981203.3A 2021-08-25 2021-08-25 Method and device for detecting electrical performance of power grid equipment, computer equipment and medium Pending CN113866533A (en)

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JPH10267976A (en) * 1997-03-27 1998-10-09 Matsushita Electric Ind Co Ltd Acceleration reliability test
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