CN113866532A - Method and device for quantizing maximum amplitude of disturbance voltage of in-situ intelligent measuring equipment - Google Patents
Method and device for quantizing maximum amplitude of disturbance voltage of in-situ intelligent measuring equipment Download PDFInfo
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Abstract
The invention discloses a method and a device for quantizing the maximum amplitude of disturbance voltage of in-situ intelligent measuring equipment. The method for quantizing the maximum amplitude of the disturbance voltage of the in-situ intelligent measuring equipment comprises the following steps: extracting the nth micro-pulse amplitude of the fracture breakdown voltage and the nth port disturbance voltage of the nth breakdown of the VFTO in the same isolation switch operation process; forming event pairs by the extracted breakdown voltage between fractures and the micro-pulse amplitude to form a sample set of a quantile regression model; and training the fractal regression model based on the sample set to generate a corresponding fractal regression equation, wherein the generated fractal regression equation can quantitatively evaluate the port disturbance voltage amplitude of the in-situ intelligent measurement equipment under the operation of the isolating switch. Therefore, the disturbance level of the port of the local intelligent measuring equipment of the specific GIS test loop under the operation of the isolating switch can be quantitatively evaluated, and a targeted immunity test assessment scheme is formulated.
Description
Technical Field
The invention relates to the technical field of electromagnetic compatibility of secondary equipment of a transformer substation, in particular to a method and a device for quantizing the maximum amplitude of disturbance voltage of on-site intelligent measurement equipment, a storage medium and electronic equipment.
Background
Along with the popularization and application of the intelligent substation technology, more and more on-site intelligent measuring devices are installed on a GIS pipeline shell or are installed in a control cubicle in a switch yard nearby. The application mode enables the electronic equipment to be closer to the transient disturbance source and to be easily disturbed by electromagnetism.
Taking the engineering application situation of the electronic transformer of the national power grid as an example, the electronic transformer has exposed a very serious electromagnetic compatibility problem in the popularization and application of the intelligent transformer substation, and the electronic transformer has operation faults, breakdown faults and even explosion events in succession. The secondary electronic equipment is probably influenced by electromagnetic disturbance phenomena such as switching operation, lightning impulse, short-circuit current, insulation breakdown, spark discharge, power frequency electric field and magnetic field, wherein the secondary side signal acquisition unit fault case of the electronic transformer is most prominent under the strong transient electromagnetic disturbance of the switching operation, and related accident cases are reported. Therefore, the transient disturbance level of the signal acquisition port of the electronic transformer under the operation of the disconnecting switch needs to be mastered to ensure the safe and reliable operation of the intelligent substation.
It should be noted that the key of the transient interference source generated by the on-off operation of the isolating switch lies in the arc reignition phenomenon during the on-off process of the isolating switch, and the reignition of the arc has strong randomness and is uncontrollable in the whole process, and the transient interference phenomenon has the problems of difficult reappearance and standardization and the like. Therefore, port disturbance voltage obtained by measurement under a small number of disconnecting and connecting operation tests of the disconnecting and connecting switch is difficult to represent possibly severe working conditions in practical engineering. However, a quantitative quantification method capable of quantitatively evaluating the port disturbance level of the local intelligent measuring equipment under the operation of the isolating switch is lacked at present.
Disclosure of Invention
According to the method, the nth micro-pulse amplitude event pair of the break-to-break breakdown voltage of the nth breakdown of the VFTO and the port disturbance voltage in the same isolating switch operation process is extracted, quantitative evaluation of the secondary side port disturbance voltage amplitude is achieved by applying a fractal regression model, the evaluation result can effectively guide the electromagnetic compatibility protection design, the immunity test and the like of the on-site intelligent measuring equipment under strong transient electromagnetic disturbance, and the technical problem that the port disturbance level of the on-site intelligent measuring equipment under the isolating switch operation cannot be quantitatively evaluated in the prior art is solved.
According to one aspect of the application, a method for quantizing the maximum amplitude of disturbance voltage of local intelligent measuring equipment is provided, and comprises the following steps: extracting the nth micro-pulse amplitude of the fracture breakdown voltage and the nth port disturbance voltage of the nth breakdown of the VFTO in the same isolation switch operation process; forming event pairs by the extracted breakdown voltage between fractures and the micro-pulse amplitude to form a sample set of a quantile regression model; and training the fractal regression model based on the sample set to generate a corresponding fractal regression equation, wherein the generated fractal regression equation can quantitatively evaluate the port disturbance voltage amplitude of the in-situ intelligent measurement equipment under the operation of the isolating switch.
Optionally, the extracting of the inter-fracture breakdown voltage of the nth breakdown of VFTO during the same isolation switch operation includes: according to the edge characteristics of each high-frequency oscillation, the VFTO waveform in the whole process is disassembled into a series of high-frequency oscillation local waveforms; obtaining the amplitude of a voltage extreme value in the high-frequency oscillation local waveform and a power frequency voltage value at the corresponding moment and the high-frequency oscillation finishing moment based on the local waveform characteristics of the high-frequency oscillation local waveform; and calculating the breakdown voltage between fractures of the high-frequency oscillation local waveform according to the amplitude of the voltage extreme value, the power frequency voltage value at the corresponding moment and the high-frequency oscillation ending moment.
Optionally, the decomposing the full-process VFTO waveform into a series of high-frequency oscillation local waveforms according to the edge characteristics of each high-frequency oscillation includes: reading the VFTO waveform in the whole process, selecting a fixed interval according to the duration of the high-frequency oscillation local process, and extracting discrete data points of the VFTO waveform in the whole process to form a new compressed waveform; carrying out differential operation on the discrete data points of the new compressed waveform, solving a first derivative of each discrete data point, and putting the values obtained by solving into a group; searching the maximum value of the absolute value of each discrete data point in the group, if the absolute value of the discrete data point is larger than a preset threshold value, selecting a certain range from the original data by taking the time t corresponding to the maximum value as the center, and storing the data in the selected range as a high-frequency oscillation waveform sequence; setting a plurality of local maximum values before and after the maximum value in the group to 0 to form a new group, repeating the previous step, and extracting a new high-frequency oscillation waveform sequence until the maximum value in the discrete data point value set is not more than a preset threshold value so as to extract all high-frequency oscillation waveform sequences meeting preset conditions.
Optionally, the high frequency oscillator-basedThe method for obtaining the amplitude of the voltage extreme value in the high-frequency oscillation local waveform and the similar direct-current voltage value at the corresponding moment and the high-frequency oscillation ending moment by oscillation of the local waveform characteristics of the local waveform comprises the following steps: reading local high-frequency oscillation waveforms, and searching the maximum value, the minimum value and the corresponding time in each high-frequency oscillation waveform sequence; if the maximum value corresponding time is greater than the minimum value corresponding time, extracting the maximum value and the corresponding time thereof, if the maximum value corresponding time is less than the minimum value corresponding time, extracting the minimum value and the corresponding time thereof, and marking the extracted voltage extreme value and the extracted time thereof as UVFTOAnd TVFTO(ii) a By TVFTOAnd taking the moment as a reference, reading time points with fixed intervals backwards by combining with the duration characteristics of the single high-frequency oscillation waveform, and taking the amplitude corresponding to the read time points as a power frequency voltage value of the ending moment of the single high-frequency oscillation.
Optionally, the calculating, according to the amplitude of the voltage extreme value, the power frequency voltage value at the corresponding time and the high-frequency oscillation ending time, the inter-fracture breakdown voltage of the local waveform of the high-frequency oscillation includes: and calculating the difference between the power frequency voltage value at the high-frequency oscillation ending moment and the power frequency voltage value at the previous high-frequency oscillation ending moment according to the amplitude of the voltage extreme value, the corresponding moment and the power frequency voltage value at the high-frequency oscillation ending moment, and taking the calculated difference as the breakdown voltage between fractures of the high-frequency oscillation local waveform.
Optionally, the extracting an nth micro-pulse amplitude of the port disturbance voltage in the same isolating switch operation process includes: globally partitioning the read port disturbance voltage waveform in the whole process to extract all micro-pulse sequences meeting preset conditions; and reading a single micro-pulse sequence, carrying out global search on the second row, and extracting the maximum value of the global absolute value of the second row as the micro-pulse amplitude of the port disturbance voltage.
Optionally, the globally partitioning the read whole-process port disturbance voltage waveform to extract all micro-pulse sequences meeting preset conditions, including: partitioning the disturbance voltage waveform of the port in the whole process, and disassembling the disturbance voltage waveform into a plurality of partial sequences with equal length; searching the maximum value of the absolute value in each local sequence and the corresponding time thereof, and recording the maximum value and the corresponding time into a group column; searching the maximum value of the sequence in the group, if the maximum value is larger than a preset threshold value, selecting a time sequence corresponding to the maximum value in a certain range, and storing the selected sequence as a new sequence as a micro-pulse sequence; setting a plurality of local maximum values before and after the maximum value in the group row to 0 to form a new group row, repeating the previous step, and extracting a new micro-pulse sequence until the maximum values in the group row are not more than a preset threshold value so as to extract all micro-pulse sequences meeting preset conditions.
According to another aspect of the application, a device for quantizing the maximum amplitude of disturbance voltage of in-situ intelligent measuring equipment is provided, which comprises: the extraction module is used for extracting the nth micro-pulse amplitude of the breakdown voltage between fractures and the port disturbance voltage of the nth breakdown of the VFTO in the same isolation switch operation process; the event pair composition module is used for composing the extracted breakdown voltage between fractures and the micro-pulse amplitude into event pairs so as to form a sample set of the fractal regression model; and the quantile regression equation generation module is used for training the quantile regression model based on the sample set to generate a corresponding quantile regression equation, wherein the generated quantile regression equation can quantitatively evaluate the port disturbance voltage amplitude of the in-situ intelligent measurement equipment under the operation of the isolating switch.
Optionally, the extraction module comprises: the disassembling unit is used for disassembling the VFTO waveform in the whole process into a series of high-frequency oscillation local waveforms according to the edge characteristics of each high-frequency oscillation; the acquisition unit is used for acquiring the amplitude of a voltage extreme value in the high-frequency oscillation local waveform and a power frequency voltage value at a corresponding moment and a high-frequency oscillation ending moment based on the local waveform characteristics of the high-frequency oscillation local waveform; and the calculation unit is used for calculating the breakdown voltage between fractures of the high-frequency oscillation local waveform according to the amplitude of the voltage extreme value, the power frequency voltage value at the corresponding moment and the high-frequency oscillation ending moment.
Optionally, the disassembling unit is specifically configured to read the full-process VFTO waveform, select a fixed interval according to the duration of the high-frequency oscillation local process, and extract discrete data points of the full-process VFTO waveform to form a new compressed waveform; carrying out differential operation on the discrete data points of the new compressed waveform, solving a first derivative of each discrete data point, and putting the values obtained by solving into a group; searching the maximum value of the absolute value of each discrete data point in the group, if the absolute value of the discrete data point is larger than a preset threshold value, selecting a certain range from the original data by taking the time t corresponding to the maximum value as the center, and storing the data in the selected range as a high-frequency oscillation waveform sequence; setting a plurality of local maximum values before and after the maximum value in the group to 0 to form a new group, repeating the previous step, and extracting a new high-frequency oscillation waveform sequence until the maximum value in the discrete data point value set is not more than a preset threshold value so as to extract all high-frequency oscillation waveform sequences meeting preset conditions.
Optionally, the disassembling unit is further specifically configured to read the local high-frequency oscillation waveform, and search a maximum value, a minimum value, and a corresponding time in each high-frequency oscillation waveform sequence; if the maximum value corresponding time is greater than the minimum value corresponding time, extracting the maximum value and the corresponding time thereof, if the maximum value corresponding time is less than the minimum value corresponding time, extracting the minimum value and the corresponding time thereof, and marking the extracted voltage extreme value and the extracted time thereof as UVFTOAnd TVFTO(ii) a By TVFTOAnd taking the moment as a reference, reading time points with fixed intervals backwards by combining with the duration characteristics of the single high-frequency oscillation waveform, and taking the amplitude corresponding to the read time points as a power frequency voltage value of the ending moment of the single high-frequency oscillation.
Optionally, the calculating unit is specifically configured to calculate a difference between the power frequency voltage value at the current high-frequency oscillation ending time and the power frequency voltage value at the last high-frequency oscillation ending time according to the amplitude of the voltage extremum, the power frequency voltage value at the corresponding time, and the high-frequency oscillation ending time, and use the calculated difference as the inter-fracture breakdown voltage of the high-frequency oscillation local waveform.
Optionally, the extraction module further includes: the first extraction unit is used for carrying out global partitioning on the read whole-process port disturbance voltage waveform so as to extract all micro-pulse sequences meeting preset conditions; and the second extraction unit is used for reading the single micro-pulse sequence, carrying out global search on the second row and extracting the maximum value of the global absolute value of the second row as the micro-pulse amplitude of the port disturbance voltage.
Optionally, the first extraction unit is specifically configured to partition the disturbance voltage waveform of the port in the whole process, and disassemble the disturbance voltage waveform into a plurality of partial sequences with equal length; searching the maximum value of the absolute value in each local sequence and the corresponding time thereof, and recording the maximum value and the corresponding time into a group column; searching the maximum value of the sequence in the group, if the maximum value is larger than a preset threshold value, selecting a time sequence corresponding to the maximum value in a certain range, and storing the selected sequence as a new sequence as a micro-pulse sequence; setting a plurality of local maximum values before and after the maximum value in the group row to 0 to form a new group row, repeating the previous step, and extracting a new micro-pulse sequence until the maximum values in the group row are not more than a preset threshold value so as to extract all micro-pulse sequences meeting preset conditions.
According to yet another aspect of the present application, there is provided a computer readable storage medium having stored thereon a computer program for executing the method of any one of the above aspects of the present invention.
According to yet another aspect of the present application, there is provided an electronic device including: a processor; a memory for storing the processor-executable instructions; the processor is configured to read the executable instructions from the memory and execute the instructions to implement the method according to any one of the above aspects of the present invention.
Therefore, quantitative evaluation of secondary side port disturbance voltage amplitude is achieved quantitatively by extracting the nth micro-pulse amplitude event pair of the n breakdown voltage of the VFTO and the port disturbance voltage in the same isolation switch operation process and applying a fractal regression model, and the evaluation result can effectively guide the electromagnetic compatibility protection design, the immunity test and the like of the on-site intelligent measurement equipment under strong transient electromagnetic disturbance. Therefore, the quantification method provided by the invention can effectively mine the practical value of a small amount of test actual measurement data under the field condition of the GIS substation, and can perform data accumulation work under different voltage grades and different test loops according to the method in the future so as to supplement and perfect the EVT relevant assessment standard. And moreover, the disturbance level of the local intelligent measuring equipment port of a specific GIS test loop under the operation of the isolating switch can be quantitatively evaluated, and a targeted immunity test assessment scheme is formulated.
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A more complete understanding of exemplary embodiments of the present invention may be had by reference to the following drawings in which:
FIG. 1 is a schematic flow chart illustrating a method for quantifying a maximum amplitude of disturbance voltage of an in-situ intelligent measurement device according to an exemplary embodiment of the present invention;
fig. 2 is a schematic diagram of a VFTO waveform at closing time according to an exemplary embodiment of the present invention;
fig. 3 is a schematic diagram of a port disturbance voltage waveform at closing according to an exemplary embodiment of the present invention;
fig. 4 is a schematic flow chart of extracting VFTO characteristic parameters in the first stage according to an exemplary embodiment of the present invention;
fig. 5 is a schematic flowchart of extracting VFTO feature parameters in the second stage according to an exemplary embodiment of the present invention;
fig. 6 is a schematic flowchart of extracting a port disturbance voltage characteristic parameter according to an exemplary embodiment of the present invention;
FIG. 7 is a schematic diagram of an actually measured scatter histogram and its fractional regression equation provided by an exemplary embodiment of the present invention;
FIG. 8 is a schematic structural diagram of a device for quantizing a maximum amplitude of disturbance voltage of an in-situ intelligent measurement apparatus according to an exemplary embodiment of the present invention; and
fig. 9 is a structure of an electronic device according to an exemplary embodiment of the present invention.
Detailed Description
Hereinafter, example embodiments according to the present invention will be described in detail with reference to the accompanying drawings. It is to be understood that the described embodiments are merely a subset of embodiments of the invention and not all embodiments of the invention, with the understanding that the invention is not limited to the example embodiments described herein.
It should be noted that: the relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.
It will be understood by those of skill in the art that the terms "first," "second," and the like in the embodiments of the present invention are used merely to distinguish one element, step, device, module, or the like from another element, and do not denote any particular technical or logical order therebetween.
It should also be understood that in embodiments of the present invention, "a plurality" may refer to two or more and "at least one" may refer to one, two or more.
It is also to be understood that any reference to any component, data, or structure in the embodiments of the invention may be generally understood as one or more, unless explicitly defined otherwise or stated to the contrary hereinafter.
In addition, the term "and/or" in the present invention is only one kind of association relationship describing the associated object, and means that there may be three kinds of relationships, for example, a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. In the present invention, the character "/" generally indicates that the preceding and following related objects are in an "or" relationship.
It should also be understood that the description of the embodiments of the present invention emphasizes the differences between the embodiments, and the same or similar parts may be referred to each other, so that the descriptions thereof are omitted for brevity.
Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail, but are intended to be part of the specification where appropriate.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
Embodiments of the invention are operational with numerous other general purpose or special purpose computing system environments or configurations, and with numerous other electronic devices, such as terminal devices, computer systems, servers, etc. Examples of well known terminal devices, computing systems, environments, and/or configurations that may be suitable for use with electronic devices, such as terminal devices, computer systems, servers, and the like, include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients, hand-held or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, networked personal computers, minicomputer systems, mainframe computer systems, distributed cloud computing environments that include any of the above, and the like.
Electronic devices such as terminal devices, computer systems, servers, etc. may be described in the general context of computer system-executable instructions, such as program modules, being executed by a computer system. Generally, program modules may include routines, programs, objects, components, logic, data structures, etc. that perform particular tasks or implement particular abstract data types. The computer system/server may be practiced in distributed cloud computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed cloud computing environment, program modules may be located in both local and remote computer system storage media including memory storage devices.
Exemplary method
FIG. 1 is a flowchart illustrating a method for quantizing a maximum amplitude of disturbance voltage of an in-situ intelligent measurement device according to an exemplary embodiment of the present invention. The embodiment can be applied to an electronic device, as shown in fig. 1, and includes the following steps:
and 101, extracting the nth micro-pulse amplitude of the fracture-to-fracture breakdown voltage and the nth port disturbance voltage of the nth breakdown of the VFTO in the same isolation switch operation process.
Specifically, based on a large amount of test actual measurement data of a 220kV true simulation test platform, statistical analysis finds that: the pulse amplitude of the disturbance voltage of the secondary side port of the in-situ intelligent measurement equipment and the breakdown voltage between the primary side fractures approximately meet the linear relation, and based on the linear relation, a method for quantizing the maximum amplitude of the port disturbance voltage of the in-situ intelligent measurement equipment under the operation of the isolating switch is provided.
Optionally, extracting the inter-fracture breakdown voltage of the nth breakdown of VFTO during the same isolation switch operation comprises: according to the edge characteristics of each high-frequency oscillation, the VFTO waveform in the whole process is disassembled into a series of high-frequency oscillation local waveforms; obtaining the amplitude of a voltage extreme value in the high-frequency oscillation local waveform and a power frequency voltage value at the corresponding moment and the high-frequency oscillation finishing moment based on the local waveform characteristics of the high-frequency oscillation local waveform; and calculating the breakdown voltage between fractures of the high-frequency oscillation local waveform according to the amplitude of the voltage extreme value, the power frequency voltage value at the corresponding moment and the high-frequency oscillation ending moment.
Fig. 1 and 2 show a VFTO waveform and a port disturbance voltage typical waveform obtained by a certain measurement. Referring to fig. 1 and 2, in the normal case, for the nth breakdown, the breakdown voltage is represented by the difference between the voltage value at the end of the present high-frequency oscillation and the voltage value at the end of the n-1 high-frequency oscillation, and the absolute value thereof is denoted as U1n. The port disturbance voltage waveform is composed of a series of discrete micro-pulses, and for the nth micro-pulse, the pulse amplitude is represented by the maximum value of the absolute value in the micro-pulse oscillation process and is marked as U2n。
In the switching-on process, breakdown voltage and port disturbance voltage pulses in the VFTO waveform are gradually reduced, and the switching-off process is opposite to the switching-on process. For comparison, the feature parameter extraction is specified as follows: and when the switch is switched on, taking the first breakdown and the first pulse as n being 1, and extracting the first 20 breakdowns in the transient waveform in the whole process according to the time sequence. And during switching off, taking the last breakdown and the last pulse as n, taking the penultimate breakdown and the penultimate pulse as n-1, and repeating the steps to extract the last 20 breakdowns in the transient waveform in the whole process.
Since the full-process VFTO waveform contains a large amount of discrete sequence data, the present embodiment performs the extraction of its characteristic parameters in two stages: in the first stage, according to the edge characteristics of each high-frequency oscillation, the whole process waveform is disassembled into a series of high-frequency oscillation local waveforms; and in the second stage, summarizing and summarizing local waveform characteristics, acquiring the amplitude of a voltage extreme value in the passing of the local VFTO waveform, a similar direct current voltage value at a corresponding moment and a high-frequency oscillation ending moment, and calculating and acquiring fracture breakdown voltage of the high-frequency oscillation local waveform on the basis.
As a specific example, the decomposition of the full-process VFTO waveform into a series of high-frequency oscillation local waveforms according to the edge characteristics of each high-frequency oscillation includes: reading the VFTO waveform in the whole process, selecting a fixed interval according to the duration of the high-frequency oscillation local process, and extracting discrete data points of the VFTO waveform in the whole process to form a new compressed waveform; carrying out differential operation on the discrete data points of the new compressed waveform, solving a first derivative of each discrete data point, and putting the values obtained by solving into a group; searching the maximum value of the absolute value of each discrete data point in the group, if the absolute value of the discrete data point is larger than a preset threshold value, selecting a certain range from the original data by taking the time t corresponding to the maximum value as the center, and storing the data in the selected range as a high-frequency oscillation waveform sequence; setting a plurality of local maximum values before and after the maximum value in the group to 0 to form a new group, repeating the previous step, and extracting a new high-frequency oscillation waveform sequence until the maximum value in the discrete data point value set is not more than a preset threshold value so as to extract all high-frequency oscillation waveform sequences meeting preset conditions.
Specifically, taking fig. 4 as an example, the full-process waveform of the VFTO actually measured on the load side is represented in the form of a power-frequency voltage waveform, a high-frequency oscillation, and a dc step. Due to the presence of the power frequency voltage and the residual charge voltage, the precise identification of the high-frequency oscillation process can only be based on the edge characteristics of the process. While the extraction of edge characteristics involves a difference operation in a computer, it will consume a lot of computing resources and computing time in case of a large number of data points. Therefore, the whole process needs to be sequenced into a discrete data point sequenceAnd (5) line compression processing. FIG. 4 is a flow chart of the first stage extraction, which includes the following steps: 1) reading the waveform, selecting a fixed interval H according to the duration of the high-frequency oscillation local process1Extracting discrete data points of the whole process waveform to form a new compressed waveform, and recording the new compressed waveform as a matrix H2(ii) a 2) The matrix H2 discrete data points are differentiated to obtain the first derivative, and the calculated value is recorded in the group H3(ii) a 3) In group H3Searching the maximum value of the absolute value, if the absolute value is larger than a preset threshold value, properly selecting a certain range from the original data by taking the time t corresponding to the maximum value as a center, and storing the range as a new sequence, namely a high-frequency oscillation waveform sequence; 4) will be group H3Several local maximums before and after the maximum are set to 0 to form a new group H3And repeating the step 3) to extract a new high-frequency oscillation waveform sequence until H3The maximum values are not larger than the preset threshold value. According to the process, the primary side full time domain VFTO waveform can be disassembled, and all high-frequency oscillation waveform sequences meeting preset conditions are extracted.
As a specific embodiment, acquiring the amplitude of the voltage extremum in the high-frequency oscillation local waveform and the dc-like voltage value at the corresponding time and the high-frequency oscillation ending time based on the local waveform characteristics of the high-frequency oscillation local waveform includes: reading local high-frequency oscillation waveforms, and searching the maximum value, the minimum value and the corresponding time in each high-frequency oscillation waveform sequence; if the maximum value corresponding time is greater than the minimum value corresponding time, extracting the maximum value and the corresponding time thereof, if the maximum value corresponding time is less than the minimum value corresponding time, extracting the minimum value and the corresponding time thereof, and marking the extracted voltage extreme value and the extracted time thereof as UVFTOAnd TVFTO(ii) a By TVFTOAnd taking the moment as a reference, reading time points with fixed intervals backwards by combining with the duration characteristics of the single high-frequency oscillation waveform, and taking the amplitude corresponding to the read time points as a power frequency voltage value of the ending moment of the single high-frequency oscillation.
As a specific embodiment, calculating the inter-fracture breakdown voltage of the local waveform of the high-frequency oscillation according to the amplitude of the voltage extremum, the power frequency voltage value at the corresponding time and the high-frequency oscillation ending time includes: and calculating the difference between the power frequency voltage value at the high-frequency oscillation ending moment and the power frequency voltage value at the previous high-frequency oscillation ending moment according to the amplitude of the voltage extreme value, the corresponding moment and the power frequency voltage value at the high-frequency oscillation ending moment, and taking the calculated difference as the breakdown voltage between fractures of the high-frequency oscillation local waveform.
Specifically, as can be seen from fig. 2, the split high-frequency oscillation waveform sequence mainly includes two types of edge features: 1) the high-frequency oscillation is a rising edge characteristic, and an overvoltage extreme value generated by the high-frequency oscillation is the maximum value of a local waveform; 2) the high-frequency oscillation is the characteristic of falling edge, and the overvoltage extreme value generated by the high-frequency oscillation is the minimum value of the local waveform. In addition, the overvoltage limit to be extracted is accompanied by a typical time characteristic. Therefore, the identification and extraction of the related parameters can be completed according to the relativity of the maximum value and the minimum value of the local waveform and the position of the corresponding time. FIG. 5 is a flow chart of the second stage extraction, which is implemented as follows: 1) reading local high-frequency oscillation waveforms, and searching the maximum value, the minimum value and the corresponding time in each local sequence; 2) if the time corresponding to the maximum value is larger than the time corresponding to the minimum value, extracting the maximum value and the time corresponding to the maximum value; if the corresponding moment of the maximum value is less than the corresponding moment of the minimum value, extracting the minimum value and the corresponding moment thereof, and marking the voltage extreme value extracted in the step and the moment thereof as UVFTOAnd TVFTO(ii) a 3) By TVFTOThe moment is taken as a reference, a fixed interval time point is read backwards by combining the duration characteristic of a single high-frequency oscillation waveform, the corresponding amplitude is taken as a power frequency voltage value of the high-frequency oscillation ending moment, and the fracture breakdown voltage U is calculated according to the difference value of the power frequency voltage value and the last power frequency voltage value1n。
Optionally, the extracting an nth micro-pulse amplitude of the port disturbance voltage in the same isolating switch operation process includes: globally partitioning the read port disturbance voltage waveform in the whole process to extract all micro-pulse sequences meeting preset conditions; and reading a single micro-pulse sequence, carrying out global search on the second row, and extracting the maximum value of the global absolute value of the second row as the micro-pulse amplitude of the port disturbance voltage.
Generally, the whole process port disturbance voltage waveform also contains a large amount of discrete sequence data, and the extraction of the characteristic parameters of the whole process port disturbance voltage waveform is also divided into two stages: the first stage, according to the relevant characteristics, the full time domain waveform is disassembled and extracted into a series of micro-pulse sequences; and in the second stage, extracting the pulse amplitude of the port disturbance voltage from the micro-pulse sequence.
As a specific embodiment, the globally partitioning the read whole-process port disturbance voltage waveform to extract all micro-pulse sequences meeting preset conditions includes: partitioning the disturbance voltage waveform of the port in the whole process, and disassembling the disturbance voltage waveform into a plurality of partial sequences with equal length; searching the maximum value of the absolute value in each local sequence and the corresponding time thereof, and recording the maximum value and the corresponding time into a group column; searching the maximum value of the sequence in the group, if the maximum value is larger than a preset threshold value, selecting a time sequence corresponding to the maximum value in a certain range, and storing the selected sequence as a new sequence as a micro-pulse sequence; setting a plurality of local maximum values before and after the maximum value in the group row to 0 to form a new group row, repeating the previous step, and extracting a new micro-pulse sequence until the maximum values in the group row are not more than a preset threshold value so as to extract all micro-pulse sequences meeting preset conditions.
Specifically, taking the example shown in fig. 2 as an example, the actually measured macro pulse waveform includes several tens to hundreds of micro pulse waveforms. Wherein, the duration of a single micro-pulse is microsecond, and the interval time of adjacent micro-pulses is far more than microsecond. Based on the characteristics, all the micro-pulse sequence extraction work meeting the conditions can be completed according to the logics of the local maximum value and the global maximum value. Referring to fig. 6, the specific implementation flow is as follows: 1) partitioning the full sequence, and disassembling into a plurality of partial sequences with equal length; 2) searching the maximum value of the absolute value in each local sequence and the corresponding time, and recording a new group column M1In group M1Searching the maximum value if the maximum value is larger than a preset threshold value TH1(Here TH1Set to 0.2), select the maximum value of the proper range corresponding to the time sequence, and save it as a new sequence, which is a micro-pulse sequence; 3) will be group M1Several local maximums before and after the maximum are set to 0 to form new group M1Repeating the second step to extract a new micro-pulse sequence until M1The maximum values are not larger than the preset threshold value. According to the process, the full-time-domain waveform can be disassembled, and all micro-pulse sequences meeting preset conditions are extracted.
In addition, in the second stage, a single micro-pulse sequence is read, global search is conducted on the second row, the maximum value of the global absolute value of the second row is extracted, and the amplitude of the port disturbance voltage pulse can be obtained.
And 102, forming an event pair by the extracted inter-fracture breakdown voltage and the micro-pulse amplitude to form a sample set of the quantile regression model.
Specifically, break down voltage U of primary side ultra-fast transient overvoltage (VFTO)1nDisturbance voltage U with secondary side port2nForm an event pair (U)1n，U2n) Thus all event pairs (U) will be composed1n，U2n) A sample set of the fractal regression model is constructed.
103, training the fractal regression model based on the sample set to generate a corresponding fractal regression equation, wherein the generated fractal regression equation can quantitatively evaluate the port disturbance voltage amplitude of the in-situ intelligent measurement equipment under the operation of the isolating switch.
Specifically, considering that the distribution of the data events obtained by actual measurement is unknown to the function, a quantile regression model based on the data-driven modeling idea without specific assumption on random error terms can be selected to solve the function expression. The expression of the unary linear quantile regression model is as follows:
y(τ|x)＝β0(τ)+β1(τ)x
wherein y (τ | x) is a dependent variable, x is an independent variable, and β0(τ)、β1(tau) is the unknown parameter to be estimated, tau is the quantile, tau is the (0, 1).
With respect to the parameter β to be estimated in the formula0(τ)、β1(τ) solution, which can be converted to an objective function Q [ beta ]1(τ),β0(τ)]To the optimization problem ofThe expression is shown in the following equation:
in the formula, xi、yiRespectively represent the i-th independent variable and dependent variable, beta0(τ)、β1(tau) is the unknown parameter to be estimated, tau is the quantile, tau belongs to (0, 1)
As a specific example, a small amount of measurement results in a certain GIS test loop are taken as an example, the loop carries out the opening and closing operations of the isolating switch for 4 groups in total, and 80 (U) in total are extracted1Adn，U2Adn) The data pairs, their measured scatter histograms and regression equations are shown in FIG. 7.
As can be seen from FIG. 7, the measured scatter points have one or two slightly deviated quantile regression equation containing intervals, and most (more than 90% of scatter points) are distributed in the interval contained by two straight lines of the 0.05 quantile regression equation and the 0.95 quantile regression equation, which is proved in a plurality of GIS test loops. Therefore, it can be concluded that the quantile regression equation trained based on the sample set of actual points can accurately predict the assigned U for other test times1nLower U2nThe interval distribution of (2). Based on the method, the pulse amplitude distribution of the secondary side port disturbance voltage under the theoretical maximum breakdown voltage of 2.0pu is quantized to [1779.9,1987.9 ]]V。
Therefore, according to the method for quantizing the maximum amplitude of the disturbance voltage of the in-situ intelligent measurement equipment provided by the embodiment, quantitative evaluation of the amplitude of the disturbance voltage of the secondary side port is realized by extracting the nth micro-pulse amplitude event pair of the port disturbance voltage and the nth breakdown inter-fracture breakdown voltage of the VFTO in the same isolation switch operation process and applying a fractal regression model, and the evaluation result can effectively guide electromagnetic compatibility protection design, disturbance rejection test and the like of the in-situ intelligent measurement equipment under strong transient electromagnetic disturbance. The quantification method provided by the invention can effectively mine the practical value of a small amount of test actual measurement data under the field condition of the GIS substation, and can perform data accumulation work under different voltage grades and different test loops according to the method in the future so as to supplement and perfect the EVT relevant assessment standard. And moreover, the disturbance level of the local intelligent measuring equipment port of a specific GIS test loop under the operation of the isolating switch can be quantitatively evaluated, and a targeted immunity test assessment scheme is formulated.
Exemplary devices
Fig. 8 is a schematic structural diagram of a device for quantizing a maximum amplitude of disturbance voltage of an in-situ intelligent measurement apparatus according to an exemplary embodiment of the present invention. As shown in fig. 8, the present embodiment includes:
the extraction module 81 is used for extracting the nth micro-pulse amplitude of the breakdown voltage between fractures and the port disturbance voltage of the nth breakdown of the VFTO in the same isolation switch operation process; an event pair composing module 82, configured to compose the extracted inter-fracture breakdown voltage and the micro-pulse amplitude into an event pair to form a sample set of the fractal regression model; and a quantile regression equation generation module 83, configured to train the quantile regression model based on the sample set to generate a corresponding quantile regression equation, where the generated quantile regression equation is capable of quantitatively evaluating a port disturbance voltage amplitude of the in-situ smart measurement device under the operation of the disconnecting switch.
Optionally, the extraction module 81 includes: the disassembling unit is used for disassembling the VFTO waveform in the whole process into a series of high-frequency oscillation local waveforms according to the edge characteristics of each high-frequency oscillation; the acquisition unit is used for acquiring the amplitude of a voltage extreme value in the high-frequency oscillation local waveform and a power frequency voltage value at a corresponding moment and a high-frequency oscillation ending moment based on the local waveform characteristics of the high-frequency oscillation local waveform; and the calculation unit is used for calculating the breakdown voltage between fractures of the high-frequency oscillation local waveform according to the amplitude of the voltage extreme value, the power frequency voltage value at the corresponding moment and the high-frequency oscillation ending moment.
Optionally, the disassembling unit is specifically configured to read the full-process VFTO waveform, select a fixed interval according to the duration of the high-frequency oscillation local process, and extract discrete data points of the full-process VFTO waveform to form a new compressed waveform; carrying out differential operation on the discrete data points of the new compressed waveform, solving a first derivative of each discrete data point, and putting the values obtained by solving into a group; searching the maximum value of the absolute value of each discrete data point in the group, if the absolute value of the discrete data point is larger than a preset threshold value, selecting a certain range from the original data by taking the time t corresponding to the maximum value as the center, and storing the data in the selected range as a high-frequency oscillation waveform sequence; setting a plurality of local maximum values before and after the maximum value in the group to 0 to form a new group, repeating the previous step, and extracting a new high-frequency oscillation waveform sequence until the maximum value in the discrete data point value set is not more than a preset threshold value so as to extract all high-frequency oscillation waveform sequences meeting preset conditions.
Optionally, the disassembling unit is further specifically configured to read the local high-frequency oscillation waveform, and search a maximum value, a minimum value, and a corresponding time in each high-frequency oscillation waveform sequence; if the maximum value corresponding time is greater than the minimum value corresponding time, extracting the maximum value and the corresponding time thereof, if the maximum value corresponding time is less than the minimum value corresponding time, extracting the minimum value and the corresponding time thereof, and marking the extracted voltage extreme value and the extracted time thereof as UVFTOAnd TVFTO(ii) a By TVFTOAnd taking the moment as a reference, reading time points with fixed intervals backwards by combining with the duration characteristics of the single high-frequency oscillation waveform, and taking the amplitude corresponding to the read time points as a power frequency voltage value of the ending moment of the single high-frequency oscillation.
Optionally, the calculating unit is specifically configured to calculate a difference between the power frequency voltage value at the current high-frequency oscillation ending time and the power frequency voltage value at the last high-frequency oscillation ending time according to the amplitude of the voltage extremum, the power frequency voltage value at the corresponding time, and the high-frequency oscillation ending time, and use the calculated difference as the inter-fracture breakdown voltage of the high-frequency oscillation local waveform.
Optionally, the extracting module 81 further includes: the first extraction unit is used for carrying out global partitioning on the read whole-process port disturbance voltage waveform so as to extract all micro-pulse sequences meeting preset conditions; and the second extraction unit is used for reading the single micro-pulse sequence, carrying out global search on the second row and extracting the maximum value of the global absolute value of the second row as the micro-pulse amplitude of the port disturbance voltage.
Optionally, the first extraction unit is specifically configured to partition the disturbance voltage waveform of the port in the whole process, and disassemble the disturbance voltage waveform into a plurality of partial sequences with equal length; searching the maximum value of the absolute value in each local sequence and the corresponding time thereof, and recording the maximum value and the corresponding time into a group column; searching the maximum value of the sequence in the group, if the maximum value is larger than a preset threshold value, selecting a time sequence corresponding to the maximum value in a certain range, and storing the selected sequence as a new sequence as a micro-pulse sequence; setting a plurality of local maximum values before and after the maximum value in the group row to 0 to form a new group row, repeating the previous step, and extracting a new micro-pulse sequence until the maximum values in the group row are not more than a preset threshold value so as to extract all micro-pulse sequences meeting preset conditions.
Exemplary electronic device
Fig. 9 is a structure of an electronic device according to an exemplary embodiment of the present invention. The electronic device may be either or both of the first device and the second device, or a stand-alone device separate from them, which stand-alone device may communicate with the first device and the second device to receive the acquired input signals therefrom. FIG. 9 illustrates a block diagram of an electronic device in accordance with an embodiment of the disclosure. As shown in fig. 9, the electronic device includes one or more processors 91 and memory 92.
The processor 91 may be a Central Processing Unit (CPU) or other form of processing unit having data processing capabilities and/or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.
The input device 93 may also include, for example, a keyboard, a mouse, and the like.
The output device 94 can output various information to the outside. The output devices 94 may include, for example, a display, speakers, a printer, and a communication network and remote output devices connected thereto, among others.
Of course, for simplicity, only some of the components of the electronic device relevant to the present disclosure are shown in fig. 9, omitting components such as buses, input/output interfaces, and the like. In addition, the electronic device may include any other suitable components, depending on the particular application.
Exemplary computer program product and computer-readable storage Medium
In addition to the above-described methods and apparatus, embodiments of the present disclosure may also be a computer program product comprising computer program instructions that, when executed by a processor, cause the processor to perform the steps in the method of information mining of historical change records according to various embodiments of the present disclosure described in the "exemplary methods" section above of this specification.
The computer program product may write program code for carrying out operations for embodiments of the present disclosure in any combination of one or more programming languages, including an object oriented programming language such as Java, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server.
Furthermore, embodiments of the present disclosure may also be a computer-readable storage medium having stored thereon computer program instructions that, when executed by a processor, cause the processor to perform steps in a method of information mining of historical change records according to various embodiments of the present disclosure described in the "exemplary methods" section above in this specification.
The computer-readable storage medium may take any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may include, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium include: an electrical connection having one or more wires, a portable disk, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
The foregoing describes the general principles of the present disclosure in conjunction with specific embodiments, however, it is noted that the advantages, effects, etc. mentioned in the present disclosure are merely examples and are not limiting, and they should not be considered essential to the various embodiments of the present disclosure. Furthermore, the foregoing disclosure of specific details is for the purpose of illustration and description and is not intended to be limiting, since the disclosure is not intended to be limited to the specific details so described.
In the present specification, the embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts in the embodiments are referred to each other. For the system embodiment, since it basically corresponds to the method embodiment, the description is relatively simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
The block diagrams of devices, apparatuses, systems referred to in this disclosure are only given as illustrative examples and are not intended to require or imply that the connections, arrangements, configurations, etc. must be made in the manner shown in the block diagrams. These devices, apparatuses, devices, systems may be connected, arranged, configured in any manner, as will be appreciated by those skilled in the art. Words such as "including," "comprising," "having," and the like are open-ended words that mean "including, but not limited to," and are used interchangeably therewith. The words "or" and "as used herein mean, and are used interchangeably with, the word" and/or, "unless the context clearly dictates otherwise. The word "such as" is used herein to mean, and is used interchangeably with, the phrase "such as but not limited to".
The methods and apparatus of the present disclosure may be implemented in a number of ways. For example, the methods and apparatus of the present disclosure may be implemented by software, hardware, firmware, or any combination of software, hardware, and firmware. The above-described order for the steps of the method is for illustration only, and the steps of the method of the present disclosure are not limited to the order specifically described above unless specifically stated otherwise. Further, in some embodiments, the present disclosure may also be embodied as programs recorded in a recording medium, the programs including machine-readable instructions for implementing the methods according to the present disclosure. Thus, the present disclosure also covers a recording medium storing a program for executing the method according to the present disclosure.
It is also noted that in the devices, apparatuses, and methods of the present disclosure, each component or step can be decomposed and/or recombined. These decompositions and/or recombinations are to be considered equivalents of the present disclosure. The previous description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present disclosure. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the disclosure. Thus, the present disclosure is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
The foregoing description has been presented for purposes of illustration and description. Furthermore, this description is not intended to limit embodiments of the disclosure to the form disclosed herein. While a number of example aspects and embodiments have been discussed above, those of skill in the art will recognize certain variations, modifications, alterations, additions and sub-combinations thereof.
Claims (10)
1. A method for quantizing the maximum amplitude of disturbance voltage of in-situ intelligent measuring equipment is characterized by comprising the following steps:
extracting the nth micro-pulse amplitude of the fracture breakdown voltage and the nth port disturbance voltage of the nth breakdown of the VFTO in the same isolation switch operation process;
forming event pairs by the extracted breakdown voltage between fractures and the micro-pulse amplitude to form a sample set of a quantile regression model; and
and training the fractal regression model based on the sample set to generate a corresponding fractal regression equation, wherein the generated fractal regression equation can quantitatively evaluate the port disturbance voltage amplitude of the in-situ intelligent measurement equipment under the operation of the isolating switch.
2. The method of claim 1, wherein said extracting the inter-fracture breakdown voltage of the nth breakdown of VFTO during the same isolation switch operation comprises:
according to the edge characteristics of each high-frequency oscillation, the VFTO waveform in the whole process is disassembled into a series of high-frequency oscillation local waveforms;
obtaining the amplitude of a voltage extreme value in the high-frequency oscillation local waveform and a power frequency voltage value at the corresponding moment and the high-frequency oscillation finishing moment based on the local waveform characteristics of the high-frequency oscillation local waveform; and
and calculating the breakdown voltage between fractures of the high-frequency oscillation local waveform according to the amplitude of the voltage extreme value, the power frequency voltage value at the corresponding moment and the high-frequency oscillation ending moment.
3. The method of claim 2, wherein the decomposing of the full process VFTO waveform into a series of high frequency oscillating partial waveforms according to the edge characteristics of each high frequency oscillation comprises:
reading the VFTO waveform in the whole process, selecting a fixed interval according to the duration of the high-frequency oscillation local process, and extracting discrete data points of the VFTO waveform in the whole process to form a new compressed waveform;
carrying out differential operation on the discrete data points of the new compressed waveform, solving a first derivative of each discrete data point, and putting the values obtained by solving into a group;
searching the maximum value of the absolute value of each discrete data point in the group, if the absolute value of the discrete data point is larger than a preset threshold value, selecting a certain range from the original data by taking the time t corresponding to the maximum value as the center, and storing the data in the selected range as a high-frequency oscillation waveform sequence;
setting a plurality of local maximum values before and after the maximum value in the group to 0 to form a new group, repeating the previous step, and extracting a new high-frequency oscillation waveform sequence until the maximum value in the discrete data point value set is not more than a preset threshold value so as to extract all high-frequency oscillation waveform sequences meeting preset conditions.
4. The method according to claim 3, wherein the obtaining of the amplitude of the voltage extreme value in the high-frequency oscillation local waveform and the dc-like voltage value at the corresponding time and the end time of the high-frequency oscillation based on the local waveform characteristics of the high-frequency oscillation local waveform comprises:
reading local high-frequency oscillation waveforms, and searching the maximum value, the minimum value and the corresponding time in each high-frequency oscillation waveform sequence;
if the maximum value corresponding time is greater than the minimum value corresponding time, extracting the maximum value and the corresponding time thereof, if the maximum value corresponding time is less than the minimum value corresponding time, extracting the minimum value and the corresponding time thereof, and recording the extracted voltage extreme value and the extracted time thereof as the voltage extreme valueUVFTOAndTVFTO；
to be provided withTVFTOAnd taking the moment as a reference, reading time points with fixed intervals backwards by combining with the duration characteristics of the single high-frequency oscillation waveform, and taking the amplitude corresponding to the read time points as a power frequency voltage value of the ending moment of the single high-frequency oscillation.
5. The method of claim 4, wherein the calculating the inter-fracture breakdown voltage of the sub-hf oscillation local waveform according to the amplitude of the voltage extremum and the power frequency voltage value at the corresponding time and the hf oscillation ending time comprises:
and calculating the difference between the power frequency voltage value at the high-frequency oscillation ending moment and the power frequency voltage value at the previous high-frequency oscillation ending moment according to the amplitude of the voltage extreme value, the corresponding moment and the power frequency voltage value at the high-frequency oscillation ending moment, and taking the calculated difference as the breakdown voltage between fractures of the high-frequency oscillation local waveform.
6. The method of claim 1, wherein the extracting of the nth micro-pulse amplitude of the port disturbance voltage during the same operation of the isolating switch comprises:
globally partitioning the read port disturbance voltage waveform in the whole process to extract all micro-pulse sequences meeting preset conditions; and
and reading a single micro-pulse sequence, carrying out global search on the second row, and extracting the maximum value of the global absolute value of the second row as the micro-pulse amplitude of the port disturbance voltage.
7. The method of claim 6, wherein globally partitioning the read full process port disturbance voltage waveform to extract all micro-pulse sequences satisfying a preset condition comprises:
partitioning the disturbance voltage waveform of the port in the whole process, and disassembling the disturbance voltage waveform into a plurality of partial sequences with equal length;
searching the maximum value of the absolute value in each local sequence and the corresponding time thereof, and recording the maximum value and the corresponding time into a group column;
searching the maximum value of the sequence in the group, if the maximum value is larger than a preset threshold value, selecting a time sequence corresponding to the maximum value in a certain range, and storing the selected sequence as a new sequence as a micro-pulse sequence;
setting a plurality of local maximum values before and after the maximum value in the group row to 0 to form a new group row, repeating the previous step, and extracting a new micro-pulse sequence until the maximum values in the group row are not more than a preset threshold value so as to extract all micro-pulse sequences meeting preset conditions.
8. The utility model provides a maximum amplitude quantization device of harassing voltage of intelligent measuring equipment of spot ization which characterized in that includes:
the extraction module is used for extracting the nth micro-pulse amplitude of the breakdown voltage between fractures and the port disturbance voltage of the nth breakdown of the VFTO in the same isolation switch operation process;
the event pair composition module is used for composing the extracted breakdown voltage between fractures and the micro-pulse amplitude into event pairs so as to form a sample set of the fractal regression model; and
and the quantile regression equation generation module is used for training the quantile regression model based on the sample set to generate a corresponding quantile regression equation, wherein the generated quantile regression equation can quantitatively evaluate the port disturbance voltage amplitude of the in-situ intelligent measurement equipment under the operation of the isolating switch.
9. A computer-readable storage medium, characterized in that the storage medium stores a computer program for performing the method of any of the preceding claims 1-7.
10. An electronic device, characterized in that the electronic device comprises:
a processor;
a memory for storing the processor-executable instructions;
the processor is configured to read the executable instructions from the memory and execute the instructions to implement the method of any one of claims 1 to 7.
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