CN113805218A - Sesquioxide transparent ceramic scintillation screen for X-ray imaging detector and application thereof - Google Patents
Sesquioxide transparent ceramic scintillation screen for X-ray imaging detector and application thereof Download PDFInfo
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- CN113805218A CN113805218A CN202010531788.4A CN202010531788A CN113805218A CN 113805218 A CN113805218 A CN 113805218A CN 202010531788 A CN202010531788 A CN 202010531788A CN 113805218 A CN113805218 A CN 113805218A
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- 239000000919 ceramic Substances 0.000 title claims abstract description 40
- 238000003384 imaging method Methods 0.000 title claims abstract description 35
- 229910052692 Dysprosium Inorganic materials 0.000 claims abstract description 12
- 229910052693 Europium Inorganic materials 0.000 claims abstract description 12
- 229910052771 Terbium Inorganic materials 0.000 claims abstract description 12
- 229910052727 yttrium Inorganic materials 0.000 claims abstract description 8
- 229910052746 lanthanum Inorganic materials 0.000 claims abstract description 5
- 238000001514 detection method Methods 0.000 claims abstract description 4
- 229910052706 scandium Inorganic materials 0.000 claims abstract description 4
- 239000000463 material Substances 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 9
- 230000001105 regulatory effect Effects 0.000 claims description 4
- 229910002076 stabilized zirconia Inorganic materials 0.000 claims description 4
- 238000004020 luminiscence type Methods 0.000 claims description 3
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 3
- 230000001276 controlling effect Effects 0.000 claims description 2
- 238000002059 diagnostic imaging Methods 0.000 claims description 2
- 238000009659 non-destructive testing Methods 0.000 claims description 2
- 238000000465 moulding Methods 0.000 claims 1
- 238000005192 partition Methods 0.000 claims 1
- 238000010521 absorption reaction Methods 0.000 abstract description 7
- 239000013078 crystal Substances 0.000 abstract description 5
- 230000000694 effects Effects 0.000 abstract description 3
- 239000010410 layer Substances 0.000 description 70
- 239000000306 component Substances 0.000 description 7
- 229910010293 ceramic material Inorganic materials 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- HYXGAEYDKFCVMU-UHFFFAOYSA-N scandium(III) oxide Inorganic materials O=[Sc]O[Sc]=O HYXGAEYDKFCVMU-UHFFFAOYSA-N 0.000 description 3
- 239000002356 single layer Substances 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910003443 lutetium oxide Inorganic materials 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 238000013170 computed tomography imaging Methods 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- 229910001233 yttria-stabilized zirconia Inorganic materials 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
Abstract
The application discloses a sesquioxide transparent ceramic scintillation screen for an X-ray imaging detector and application thereof, wherein the scintillation screen comprises at least two layers of scintillators; the scintillator comprises the following components: (M1xM2yM3zRE1‑x‑y‑z)2O3(ii) a Wherein: x is more than or equal to 0, y and z is less than 1; m represents Lu, Gd, Y, La or Sc; RE represents Eu, Tb, Pr, Tm or Dy. According to the invention, the absorption efficiency of different energy X-rays is optimized through the adjustment of the mixed crystal component of the sesquioxide, so that the double-layer bicolor or multi-layer multicolor transparent ceramic scintillation screen is obtained, the imaging effect of the dual-energy or multi-energy X-ray detection is favorably improved, and the large-area preparation is relatively easy.
Description
Technical Field
The application relates to the field of X-ray imaging, in particular to a sesquioxide transparent ceramic scintillation screen for an X-ray imaging detector and application thereof.
Background
The scintillation screen is a core component of an X-ray imaging detector, a single-energy-spectrum X-ray and a single-layer scintillation screen are adopted in the traditional X-ray tomography (CT) technology to image an object, a reconstruction result is only attenuation coefficient imaging, sometimes, the imaging of two different materials is completely the same, and dual-energy or multi-energy CT utilizes the X-ray of different energy spectrums to image, so that the information such as the atomic number of the object can be obtained, and the development of the CT technology is an important direction.
The layered scintillation screen is an imaging mode of dual-energy or multi-energy CT, and the basic method is to adopt a multi-layer structure, for example, the upper layer scintillation screen in the double-layer structure has low density and mainly absorbs low-energy X-rays, and the lower layer scintillation screen has high density and mainly absorbs high-energy X-rays, and then the image reconstruction is carried out by a computer, so that the imaging quality is improved, and the identification of material components is realized. The scintillators in different layers are required to absorb X-rays in a specific energy range as much as possible, and the absorption of rays in other energy ranges is reduced, for example, the scintillator in the upper layer absorbs low-energy X-rays as much as possible, but transmits high-energy X-rays, and the scintillator in the lower layer absorbs high-energy X-rays as much as possible.
At present, the layered scintillation screen is constructed by selecting materials from the existing scintillation materials, for example, ZnSe or CsI is adopted as the upper layer, Gd is adopted as the lower layer2O2Tb or LYSO Ce, the limitation of this approach is that only a limited selection of scintillators can be made, with a smaller range of choices. On the other hand, due to the limited number of scintillators that can be selected, the choice of the energy of the X-ray source is also somewhat limited.
Disclosure of Invention
It is an object of the present application to overcome the above problems or to at least partially solve or mitigate the above problems.
According to one aspect of the application, the invention provides a sesquioxide transparent ceramic scintillation screen for an X-ray imaging detector, aiming at the problems that the selection of scintillators in the current dual-energy or multi-energy X-ray imaging system is limited and the absorption of X-rays with different energies cannot be accurately optimized, and the sesquioxide transparent ceramic scintillation screen comprises at least two layers of scintillators;
the scintillator comprises the following components: (M1xM2yM3zRE1-x-y-z)2O3;
Wherein: x is more than or equal to 0, y and z is less than 1;
m represents Lu, Gd, Y, La or Sc;
RE represents Eu, Tb, Pr, Tm or Dy.
Optionally, a split layer disposed between the two layers of scintillators, the split layer being YSZ; the YSZ represents yttrium stabilized zirconia.
Optionally, the scintillator is two layers, and the structure is expressed as:
(M1xM2yM3zRE1-x-y-z)2O3/YSZ/(M1′aM2′bM3′cRE′1-a-b-c)2O3;
wherein: a is more than or equal to 0, b and c are less than 1;
RE' represents Eu, Tb, Pr, Tm or Dy.
Optionally, the scintillator is three layers, and the structure is expressed as:
(M1xM2yM3zRE1-x-y-z)2O3/YSZ/(M1′aM2′bM3′cRE′1-a-b-c)2O3/YSZ/M1″uM2″vM3″wRE″1-u-v-w)2O3;
wherein: u is more than or equal to 0, v and w is less than 1;
RE' represents Eu, Tb, Pr, Tm or Dy.
Optionally, RE' and RE ″ of each layer of scintillator are selected from the same elements or different elements for color control.
Optionally, a transparent ceramic process is adopted, and the transparent ceramic scintillation screen is prepared through one-step forming according to the structure, or scintillator materials are respectively adopted to prepare each layer of scintillators, and then each layer of scintillators are combined into the transparent ceramic scintillation screen according to the structure.
Optionally, the thickness of the dividing layer is 0-1 mm.
Optionally, the thickness of each layer of scintillator ranges from 1 μm to 5 cm.
Optionally, the cross-sectional area of the scintillator is not less than 1 × 1mm2。
In another aspect of the application, the application of the sesquioxide transparent ceramic scintillation screen for the X-ray imaging detector in the X-ray dual-energy or multi-energy detection field of medical imaging and industrial nondestructive testing is provided.
By Lu2O3Radical and Sc2O3The sesquioxide scintillator represented by the group has a wide density range (L)u2O3:9.7g/cm3,Sc2O3:3.9g/cm3) High light yield (Lu)2O3:Eu97000ph/MeV,Sc2O3Eu is Lu2O3About 54% of Eu), and the ionic radii between the sesquioxide are relatively close (e.g., the Eu is relatively close to the Eu)) The optimized mixed crystal component can be designed according to the characteristics of different energy spectrums, and the optimization of selective absorption of X-rays with different energies is realized.
According to the invention, the absorption efficiency of different energy X-rays is optimized through the adjustment of the mixed crystal component of the sesquioxide, so that the double-layer bicolor or multi-layer multicolor transparent ceramic scintillation screen is obtained, the imaging effect of the dual-energy or multi-energy X-ray detection is favorably improved, and the large-area preparation is relatively easy.
Drawings
Fig. 1 is a schematic diagram of a component structure design of a transparent ceramic scintillation screen for a dual-energy or multi-energy X-ray imaging detector according to an embodiment of the present invention.
Detailed Description
Referring to fig. 1, a schematic structural diagram of the transparent ceramic scintillation screen of the present invention is shown, and the specific structure is sequentially (M1)xM2yM3zRE1-x-y-z)2O3101/YSZ102/(M1′aM2′bM3′cRE′1-a-b-c)2O3103/YSZ102/M1″uM2″vM3″wRE″1-u-v-w)2 O 3104 …. Wherein: x, y and z (a, b, c, u, v and w) are less than or equal to 1 and less than or equal to 0. M represents Lu, Gd, Y, La or Sc, RE (RE' ) represents Eu, Tb, Pr, Tm or Dy, and YSZ represents yttrium-stabilized zirconia.
The invention provides a sesquioxide transparent ceramic scintillation screen for an X-ray imaging detector, which comprises at least two layers of scintillators;
the scintillator comprises the following components: (M1xM2yM3zRE1-x-y-z)2O3;
Wherein: x is more than or equal to 0, y and z is less than 1;
m represents Lu, Gd, Y, La or Sc;
RE represents Eu, Tb, Pr, Tm or Dy.
The transparent ceramic scintillator has the advantages of uniform concentration doping, easy large-size formation, more excellent mechanical property and the like, and the preparation cost is relatively low, so that the transparent ceramic scintillator is an important form of a scintillation screen for X-ray imaging. And the material design is flexible, the multilayer compounding can be conveniently realized, and the design and the preparation of the multilayer scintillation screen are realized.
Optionally, a split layer disposed between the two layers of scintillators, the split layer being YSZ; the YSZ represents yttrium stabilized zirconia.
The YSZ split layer can increase the ray hardening degree of the scintillator below the YSZ split layer and increase the energy difference. The regulation and control of the ray hardening degree of the lower layer scintillator and the energy difference between the lower layer scintillator and the upper layer scintillator can be realized by regulating and controlling the thickness of YSZ.
Preferably, the scintillator is two layers, and the structure is expressed as:
(M1xM2yM3zRE1-x-y-z)2O3/YSZ/(M1′aM2′bM3′cRE′1-a-b-c)2O3;
wherein: a is more than or equal to 0, b and c are less than 1;
RE' represents Eu, Tb, Pr, Tm or Dy.
Optionally, the scintillator is three layers, and the structure is expressed as:
(M1xM2yM3zRE1-x-y-z)2O3/YSZ/(M1′aM2′bM3′cRE′1-a-b-c)2O3/YSZ/M1″uM2″vM3″wRE″1-u-v-w)2O3;
wherein: u is more than or equal to 0, v and w is less than 1;
RE' represents Eu, Tb, Pr, Tm or Dy.
By adopting the structure of the invention, the problem of absorption of X-rays with different energies can be optimized by selecting and adjusting the mixed crystal component of the sesquioxide.
Optionally, RE' and RE ″ of each layer of scintillator are selected from the same elements or different elements for color control.
The scintillation luminescence color of the invention can be regulated and controlled by one or more choices of RE (RE' ) ions (Eu, Tb, Pr, Tm or Dy, etc.), and the luminescence color of each layer of scintillator can be the same or different.
Optionally, a transparent ceramic process is adopted, and the transparent ceramic scintillation screen is prepared through one-step forming according to the structure, or scintillator materials are respectively adopted to prepare each layer of scintillators, and then each layer of scintillators are combined into the transparent ceramic scintillation screen according to the structure.
Optionally, the thickness of the dividing layer is 0-1 mm.
Optionally, each layer of scintillator has a thickness of 1 μm to 5 cm. The absorption of X-ray energy can be regulated and controlled by adjusting the thickness of each layer of scintillator, and when a pure geometric amplification mode is adopted for imaging, the thickness of each layer needs to be determined according to the requirement of spatial resolution; when the imaging mode of geometric plus optical magnification is adopted, the thickness of each layer of the scintillation screen needs to be matched with the depth of field of the objective lens. Therefore, the thickness of each layer may be the same or different according to specific needs.
Optionally, the scintillator cross-sectional area is 1 × 1mm2~50×50cm2. The specific area is determined according to the field size of the objective lens. The cross-sectional area of the scintillator, i.e. the imaging screen, is not less than 1X 1mm2Preferably at 1X 1mm2~50×50cm2In the meantime.
The invention is further illustrated by the following specific examples:
example 1:
(Gd0.2Y0.75Tb0.05)2O3(200μm)/YSZ(200μm)/(Lu0.85La0.1Eu0.05)2O3(600 μm) scintillation screen
The upper scintillator layer is 200 μm thick (Gd)0.2Y0.75Tb0.05)2O3The split layer is 200 μm YSZ, and the lower layer scintillator is 600 μm (Lu)0.85La0.1Eu0.05)2O3Cross section of 100X 100mm2The ceramic material is integrally formed by adopting a transparent ceramic process.
The scintillation vial of the present example was tested with a microscope objective nikoncfiplan fluor with a numerical aperture NA of 0.13 and a W-target (160KeV) as the X-ray source, and the spatial resolution of the system reached 10 μm. The imaging system performs CT imaging of the metal material mixture of gold (Z79) and lead (Z82) with similar density, and can better distinguish the two materials.
Example 2:
(Lu0.1Gd0.1Sc0.75Tb0.05)2O3(1mm)/(Lu0.85Gd0.1Eu0.05)2O3(2mm) scintillation screen
The upper layer scintillator is 1mm thick (Lu)0.1Gd0.1Sc0.75Tb0.05)2O3Without a split layer, the lower scintillator layer was 2mm thick (Lu)0.85Gd0.1Eu0.05)2O3Cross section of 100X 100mm2The upper layer scintillator and the lower layer scintillator are respectively formed by adopting a transparent ceramic process and then are combined to prepare the composite scintillator.
Example 3:
(Lu0.1Gd0.1Y0.75Tm0.05)2O3(1mm)/YSZ(400μm)(Lu0.5La0.35Gd0.1Tb0.05)2O3(2mm)/YSZ(400μm)/(Lu0.8La0.05Sc0.1Eu0.05)2O3(2.5mm)
the first layer of scintillator is 1mm thick (Lu)0.1Gd0.1Y0.75Tm0.05)2O3The first split layer was 400 μm thick YSZ and the second scintillator layer was 2mm thick (Lu)0.5La0.35Gd0.1Tb0.05)2O3Second layer divisionA layer of 400 μm thick YSZ and a third layer of 2.5mm thick (Lu)0.8La0.05Sc0.1Eu0.05)2O3The cross section is 3000 multiplied by 3000mm2The ceramic material is integrally formed and prepared by adopting a transparent ceramic process.
Example 4:
(Y0.95Eu0.05)2O3(2mm)/(Lu0.95Tb0.05)2O3(2mm)
the first layer of scintillator is 2mm thick (Y)0.95Eu0.05)2O3Without a split layer, the second layer of scintillator is 2mm thick (Lu)0.95Tb0.05)2O3Cross section of 100X 100mm2The ceramic material is integrally formed and prepared by adopting a transparent ceramic process.
Example 5:
(Y0.85Tm0.05)2O3(1mm)/(Lu0.5La0.45Tb0.05)2O3(2mm)/(Lu0.85Sc0.1Eu0.05)2O3(2.5mm)
the first layer of scintillator is 1mm thick (Y)0.85Tm0.05)2O3The second layer of scintillator is 2mm thick (Lu)0.5La0.45Tb0.05)2O3(2mm), third layer scintillator 2.5mm thick (Lu)0.85Sc0.1Eu0.05)2O3Cross section of 200X 200mm2The transparent ceramic technology is adopted for preparing and recombining respectively.
Example 6:
(Gd0.2Sc0.75Pr0.05)2O3(20μm)/YSZ(10μm)/(Lu0.85La0.1Dy0.05)2O3(30 μm) scintillation screen
The upper scintillator layer was 50 μm thick (Gd)0.2Sc0.75Pr0.05)2O3The split layer is YSZ of 10 μm, and the lower layer scintillator is 50 μm (Lu)0.85La0.1Dy0.05)2O3Cross section of 10X 10mm2The ceramic material is integrally formed by adopting a transparent ceramic process.
Example 7:
(Y0.85Tb0.05)2O3(5cm)/(Lu0.5La0.45Eu0.05)2O3(5cm)
the first layer of scintillator is 5cm thick (Y)0.85Tb0.05)2O3The second layer of scintillator is 5cm thick (Lu)0.5La0.45Eu0.05)2O3Without a dividing layer, the cross section is 500X 500mm2The transparent ceramic technology is adopted for preparing and recombining respectively.
The scintillation screen of the embodiment 2-7 of the invention is used for dual-energy CT or X-ray imaging, the spatial resolution can reach 2 microns, and the imaging effect is good. The imaging system can also distinguish well for solid materials with close densities.
When the single-layer scintillating screens are prepared separately, each single-layer scintillating layer can be in the form of a single crystal or a thin film. All falling within the scope of the present invention.
It is to be noted that, unless otherwise specified, technical or scientific terms used herein shall have the ordinary meaning as understood by those skilled in the art to which this application belongs.
The above description is only for the preferred embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A sesquioxide transparent ceramic scintillation screen for an X-ray imaging detector is characterized by comprising at least two layers of scintillators;
the scintillator comprises the following components: (M1xM2yM3zRE1-x-y-z)2O3;
Wherein: x is more than or equal to 0, y and z is less than 1;
m represents Lu, Gd, Y, La or Sc;
RE represents Eu, Tb, Pr, Tm or Dy.
2. The sesquioxide transparent ceramic scintillator screen for an X-ray imaging detector as set forth in claim 1, further comprising a splitting layer disposed between two layers of scintillators, the splitting layer being YSZ; the YSZ represents yttrium stabilized zirconia.
3. The sesquioxide transparent ceramic scintillator screen for an X-ray imaging detector as set forth in claim 2, wherein the scintillator is two layers and has a structure expressed as:
(M1xM2yM3zRE1-x-y-z)2O3/YSZ/(M1′aM2′bM3′cRE′1-a-b-c)2O3;
wherein: a is more than or equal to 0, b and c are less than 1;
RE' represents Eu, Tb, Pr, Tm or Dy.
4. The sesquioxide transparent ceramic scintillator screen for an X-ray imaging detector as set forth in claim 3, wherein the scintillator has three layers, and the structure is expressed as:
(M1xM2yM3zRE1-x-y-z)2O3/YSZ/(M1′aM2′bM3′cRE′1-a-b-c)2O3/YSZ/M1″uM2″vM3″wRE″1-u-v-w)2O3;
wherein: u is more than or equal to 0, v and w is less than 1;
RE' represents Eu, Tb, Pr, Tm or Dy.
5. The sesquioxide transparent ceramic scintillating screen for an X-ray imaging detector according to claim 4, wherein RE, RE 'and RE' of each layer of scintillators are the same elements or different elements for regulating and controlling the luminescence wavelength.
6. The sesquioxide transparent ceramic scintillator screen for an X-ray imaging detector as set forth in claim 4, wherein the transparent ceramic scintillator screen is manufactured by a transparent ceramic process through one-step molding according to a structure, or each layer of scintillator is manufactured by using a scintillator material respectively and then each layer of scintillator is combined into the transparent ceramic scintillator screen according to a structure.
7. The sesquioxide transparent ceramic scintillator screen for an X-ray imaging detector as set forth in claim 4, wherein the thickness of the partition layer is 0 to 1 mm.
8. The sesquioxide transparent ceramic scintillator screen for an X-ray imaging detector as set forth in any one of claims 1 to 7, wherein each layer of scintillator has a thickness of 1 μm to 5 cm.
9. Sesquioxide transparent ceramic scintillation screen for an X-ray imaging detector according to any of claims 1 to 8, characterized in that the cross-sectional area of each layer of scintillator is 1X 1mm2~50×50cm2。
10. An application of a sesquioxide transparent ceramic scintillation screen for an X-ray imaging detector in the field of X-ray dual-energy or multi-energy detection of medical imaging and industrial nondestructive testing.
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Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN88103386A (en) * | 1987-06-08 | 1988-12-28 | 通用电气公司 | Solid scintillator and processing method thereof |
US4870279A (en) * | 1988-06-20 | 1989-09-26 | General Electric Company | High resolution X-ray detector |
US20060145085A1 (en) * | 2003-09-24 | 2006-07-06 | Kabushiki Kaisha Toshiba | Ceramic scintillator, and radiation detector and radiographic examination apparatus using same |
US20080213151A1 (en) * | 2004-11-08 | 2008-09-04 | Tohoku Techno Arch Co., Ltd | Pr-Containing Scintillator Single Crystal, Method of Manufacturing the Same, Radiation Detector, and Inspection Apparatus |
CN103374351A (en) * | 2012-04-17 | 2013-10-30 | 通用电气公司 | Rare earth garnet scintillator and method of making same |
WO2014128957A1 (en) * | 2013-02-25 | 2014-08-28 | 株式会社日立製作所 | Scintillator and radiation detector |
CN203849188U (en) * | 2014-03-21 | 2014-09-24 | 烟台华科检测设备有限公司 | Double-energy X-ray imaging detector |
CN104803670A (en) * | 2015-04-10 | 2015-07-29 | 中国科学院宁波材料技术与工程研究所 | Scintillation ceramic for double-layer detector and preparation method of scintillation ceramic |
US20170146671A1 (en) * | 2014-07-07 | 2017-05-25 | Toray Industries, Inc. | Scintillator panel, radiation detector, and manufacturing method therefor |
CN109881251A (en) * | 2019-02-25 | 2019-06-14 | 上海大学 | Rear-earth-doped sesquichloride sub-micron x-ray imaging monocrystal thin films scintillation screen and preparation method thereof |
CN110308475A (en) * | 2019-08-01 | 2019-10-08 | 深圳市安健科技股份有限公司 | A kind of X-ray detector and preparation method thereof |
-
2020
- 2020-06-11 CN CN202010531788.4A patent/CN113805218A/en active Pending
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN88103386A (en) * | 1987-06-08 | 1988-12-28 | 通用电气公司 | Solid scintillator and processing method thereof |
US4870279A (en) * | 1988-06-20 | 1989-09-26 | General Electric Company | High resolution X-ray detector |
US20060145085A1 (en) * | 2003-09-24 | 2006-07-06 | Kabushiki Kaisha Toshiba | Ceramic scintillator, and radiation detector and radiographic examination apparatus using same |
US20080213151A1 (en) * | 2004-11-08 | 2008-09-04 | Tohoku Techno Arch Co., Ltd | Pr-Containing Scintillator Single Crystal, Method of Manufacturing the Same, Radiation Detector, and Inspection Apparatus |
CN103374351A (en) * | 2012-04-17 | 2013-10-30 | 通用电气公司 | Rare earth garnet scintillator and method of making same |
WO2014128957A1 (en) * | 2013-02-25 | 2014-08-28 | 株式会社日立製作所 | Scintillator and radiation detector |
CN203849188U (en) * | 2014-03-21 | 2014-09-24 | 烟台华科检测设备有限公司 | Double-energy X-ray imaging detector |
US20170146671A1 (en) * | 2014-07-07 | 2017-05-25 | Toray Industries, Inc. | Scintillator panel, radiation detector, and manufacturing method therefor |
CN104803670A (en) * | 2015-04-10 | 2015-07-29 | 中国科学院宁波材料技术与工程研究所 | Scintillation ceramic for double-layer detector and preparation method of scintillation ceramic |
CN109881251A (en) * | 2019-02-25 | 2019-06-14 | 上海大学 | Rear-earth-doped sesquichloride sub-micron x-ray imaging monocrystal thin films scintillation screen and preparation method thereof |
CN110308475A (en) * | 2019-08-01 | 2019-10-08 | 深圳市安健科技股份有限公司 | A kind of X-ray detector and preparation method thereof |
Non-Patent Citations (1)
Title |
---|
刘阳;郭庐阵;刘哲;骆志平;陈凌;: "基于波长转换光纤和ZnS(Ag)/H_3~(10)BO_3闪烁屏的中子位置灵敏探测器初步研究", 中国辐射卫生, no. 06 * |
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