CN113804962B - Metering chip and measuring system - Google Patents
Metering chip and measuring system Download PDFInfo
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- CN113804962B CN113804962B CN202110912872.5A CN202110912872A CN113804962B CN 113804962 B CN113804962 B CN 113804962B CN 202110912872 A CN202110912872 A CN 202110912872A CN 113804962 B CN113804962 B CN 113804962B
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- 238000001514 detection method Methods 0.000 claims abstract description 49
- 230000007246 mechanism Effects 0.000 claims abstract description 42
- 238000004364 calculation method Methods 0.000 claims abstract description 10
- 238000004891 communication Methods 0.000 claims description 13
- 238000006243 chemical reaction Methods 0.000 claims description 9
- 238000005259 measurement Methods 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 6
- 238000000691 measurement method Methods 0.000 description 6
- 238000005070 sampling Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000010355 oscillation Effects 0.000 description 4
- 239000013078 crystal Substances 0.000 description 2
- 230000005347 demagnetization Effects 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 239000002156 adsorbate Substances 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
- G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
- G01R22/061—Details of electronic electricity meters
- G01R22/063—Details of electronic electricity meters related to remote communication
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
- G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
- G01R22/10—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods using digital techniques
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- Engineering & Computer Science (AREA)
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
The invention discloses a metering chip and a measuring system, wherein the metering chip comprises: the calculation module is used for calculating the target current of the equipment to be detected according to the detection result of the current detection mechanism; the calibration module is used for calibrating the current detection mechanism; and the address bit pin is used for generating a corresponding chip address according to the externally connected configuration resistor. According to the metering chip, the target current of the equipment to be measured can be calculated through the calculation module, and the automatic calibration of an external current detection mechanism connected with the metering chip can be realized through the calibration module, so that errors in the current detection mechanism are eliminated, and the detection precision is improved; in addition, when a plurality of metering chips are integrated to the same interface of the MCU at the same time, the chip address of each metering chip can be automatically identified through the arrangement of the address bit pins, so that the MCU can conveniently acquire the metering result of each metering chip.
Description
Technical Field
The present invention relates to the field of integrated circuits, and in particular, to a metering chip and a measurement system.
Background
Currently, a sampling resistance measurement method and a closed loop hall measurement method are generally adopted to measure direct current electric energy. However, although the sampling resistance measurement method has a simple structure and is very easy to realize, the current direction of the direct current is not changed, the sampling resistance can adsorb charged ions or adsorbates in the surrounding air, the current sampling has errors, and the measurement accuracy is low.
The closed-loop Hall measurement method is to sample current by replacing a sampling resistor with a compensation type sensor, so that the problem of metering misalignment caused by precision error drift caused by the sampling resistor measurement method can be avoided, but the function of a metering chip matched with the existing closed-loop Hall measurement method is single, and each metering chip cannot be identified when a plurality of metering chips are connected to the same interface of an MCU.
Disclosure of Invention
The invention aims to overcome the defects that in the prior art, the function of a metering chip is single, and each metering chip cannot be identified when a plurality of metering chips are connected to the same interface of an MCU, and provides the metering chip and a measuring system.
The invention solves the technical problems by the following technical scheme:
in a first aspect, the present invention provides a metrology chip comprising:
the calculation module is used for calculating the target current of the equipment to be detected according to the detection result of the current detection mechanism;
the calibration module is used for calibrating the current detection mechanism;
and the address bit pin is used for generating a corresponding chip address according to the externally connected configuration resistor.
Preferably, the calibration module comprises: a current output circuit, an enable control circuit and a logic circuit;
the enabling control circuit is used for enabling the current output circuit to output a calibration current to the current detection mechanism;
the logic circuit is used for receiving a feedback signal of the current detection mechanism responding to the calibration current, and calibrating the current detection mechanism based on the calibration current and the feedback signal.
Preferably, the current detection mechanism comprises a magnetic core, a Hall element, a secondary compensation coil, a secondary driving module and a calibration lead penetrating through the magnetic core;
the current output circuit is used for outputting the calibration current to the calibration lead;
the secondary side driving module is used for outputting a calibration secondary side compensation current according to the calibration current value and inputting the calibration secondary side compensation current to the logic circuit;
the logic circuit is used for acquiring a feedback signal output by the secondary side driving module when the current of the calibration lead is the calibration current, generating a control instruction based on the feedback signal and sending the control instruction to the enabling control circuit, so that the enabling control circuit controls the current output circuit to output corresponding current to the input end of the secondary side compensation coil according to the control instruction.
Preferably, the calibration module further comprises: and the reference circuit is used for generating the calibration current and transmitting the calibration current to the current output circuit.
Preferably, the metering chip further comprises:
and the analog-to-digital conversion module is used for performing analog-to-digital conversion on the detection result before the calculation module calculates the target current according to the detection result of the current detection mechanism.
Preferably, the calculating module is further configured to calculate a performance parameter of the device under test according to the target current and the target voltage of the device under test.
Preferably, the metering chip further comprises a power circuit for providing power.
Preferably, the metering chip further comprises a communication interface for communication connection with an external controller.
Preferably, the metering chip further comprises a clock circuit connected with the communication interface.
In a second aspect, the invention provides a measurement system comprising a metering chip according to the first aspect and a current detection mechanism.
The invention has the positive progress effects that: the metering chip can calculate the target current of the equipment to be measured through the calculation module, and can realize automatic calibration of an external current detection mechanism connected with the metering chip through the calibration module, so that errors in the current detection mechanism are eliminated, and the detection precision is improved; in addition, when a plurality of metering chips are integrated to the same interface of the MCU at the same time, the chip address of each metering chip can be automatically identified through the arrangement of the address bit pins, so that the MCU can conveniently acquire the metering result of each metering chip.
Drawings
Fig. 1 is a schematic structural diagram of a metering chip in embodiment 1 of the present invention.
Fig. 2 is a schematic structural diagram of a metering chip in embodiment 2 of the present invention.
Fig. 3 is a schematic structural diagram of a current detecting mechanism connected to a metering chip in embodiment 2 of the present invention.
Fig. 4 is a schematic structural diagram of a measurement system according to embodiment 2 of the present invention.
Detailed Description
The invention is further illustrated by means of the following examples, which are not intended to limit the scope of the invention.
Example 1
The present embodiment provides a metering chip, as shown in fig. 1, the metering chip 100 includes: a calculation module 1, a calibration module 2 and an address bit pin 3.
Wherein, the calculating module 1 is configured to calculate a target current of the device to be tested according to a detection result of the current detecting mechanism 200;
a calibration module 2 for calibrating the current detection mechanism;
and the address bit pin 3 is used for generating a corresponding chip address according to the externally connected configuration resistor.
In this embodiment, by setting the address bit pin 3 in the metering chip 100, the resistor may be configured by external access or suspended, so that each metering chip 100 has a different chip address. For example, when a certain address bit pin is connected to the configuration resistor, the value corresponding to the pin is 1, and otherwise, the pin corresponds to 0. Taking the example of setting three address bit pins 3 on the metering chip 100, by connecting or disconnecting resistors to each pin, one of eight different addresses of the chip address 000, 001, 010, …, 111 of the chip can be obtained.
The multiple metering chips 100 can be used for realizing the access of the multiple paths of devices to be tested, for example, in the scene of a multi-path direct current charging automobile charging pile, two or more vehicles can be simultaneously accessed through the two or more metering chips 100 so as to realize the metering of the performance parameters of each vehicle. When a plurality of metering chips 100 are integrated to the same interface of the MCU at the same time, the chip address of each metering chip can be automatically identified according to whether the address bit pins of each chip are connected to the configuration resistor, so that the acquisition and the management are convenient.
According to the embodiment, the target current of the equipment to be detected can be calculated through the calculation module, and the automatic calibration of the external current detection mechanism connected with the metering chip can be realized through the calibration module, so that errors in the current detection mechanism are eliminated, and the detection precision is improved; in addition, when a plurality of metering chips are integrated to the same interface of the MCU at the same time, the chip address of each metering chip can be automatically identified through the arrangement of the address bit pins, so that the MCU can conveniently acquire the metering result of each metering chip.
Example 2
On the basis of embodiment 1, this embodiment provides a metering chip, as shown in fig. 2, which is an improvement over embodiment 1, specifically, the calibration module 2 includes: a current output circuit 21, an enable control circuit 22, and a logic circuit 23.
The enable control circuit 22 is for enabling the current output circuit 21 to output the calibration current to the current detection mechanism 200.
The logic circuit 23 is configured to receive a feedback signal of the current detection mechanism in response to the calibration current and calibrate the current detection mechanism 200 based on the calibration current and the feedback signal.
Specifically, a standard value of current (for example, 10 mA) is output by the current output current 21 before metering, and if the current returned to the metering chip 100 after passing through the current detection mechanism 200 is still the standard value of current (for example, 10 mA), the entire current detection mechanism 200 is accurate. If the current returned to the measuring chip 100 is analyzed by the logic circuit 23 and judged to be a current which is not the standard value, the correction is performed.
As shown in fig. 3, an example of the current detection mechanism 200 may include a magnetic core 201, a hall element 202, a secondary compensation coil 203, a secondary driving module 204, and a calibration wire disposed through the magnetic core 201. The secondary side compensation coil is wound on the magnetic core, and the secondary side driving module is used for generating a target secondary side compensation current according to the Hall current output by the Hall element and inputting the target secondary side compensation current to the secondary side compensation coil; the magnetic core is provided with an open slot, and the Hall element is arranged in the open slot; the input end of the secondary side driving module is electrically connected with the Hall element, and the output end of the secondary side driving module is electrically connected with the input end of the secondary side compensation wire; the target secondary side compensation current is used for keeping the Hall element in a zero-flux working state. Since the hall closed loop sensor is used for a period of time, the calibrated zero point can shift, which is called magnetizing, and once magnetizing is formed, metering errors always exist without demagnetizing.
In order to perform demagnetization so as to achieve calibration, the current output circuit 21 of the present embodiment is specifically configured to output a calibration current to a calibration wire. The logic circuit 23 is specifically configured to obtain a feedback signal output by the secondary side driving module when the current of the calibration wire is the calibration current, generate a control instruction based on the feedback signal, and send the control instruction to the enabling control circuit, so that the enabling control circuit controls the current output circuit to output a corresponding setting current to the input end of the secondary side compensation coil according to the control instruction until the calibration current is matched with the corresponding feedback signal.
The process of judging whether the calibration current is matched with the corresponding feedback signal in this embodiment is as follows: and if the difference value between the two currents is smaller than a preset threshold value, the calibration current is considered to be matched with the corresponding feedback signal.
Specifically, when the calibration current and the corresponding feedback signal are not matched, the metering chip 100 may perform forward or reverse current output through the current output circuit 21 to output currents with different directions or magnitudes to the secondary side compensation coil 203 of the current detection mechanism 200, so as to cause the coil to generate a reverse or forward magnetic field with a specific magnitude to cancel the magnetizing magnetic field, and when the calibration current and the corresponding feedback signal are matched, it indicates that the metering chip 100 controls the magnetic field generated in the secondary side compensation coil 203 to cancel the magnetizing magnetic field, so that the error is eliminated.
The calibration module 2 further comprises: a reference circuit 24 for generating a calibration current and delivering it to the current output circuit.
In this embodiment, the reference circuit 24 is electrically connected to the current output circuit 21, and a standard is set in the metering chip 100 to ensure that the metering chip 100 has a certain accuracy, and is calibrated by the chip manufacturing company before leaving the factory. Specifically, the reference circuit 24 internally provides a standard voltage source that generates a fixed 1.25V voltage signal that can be used as a reference voltage for current metering purposes.
The metering chip further comprises: the analog-to-digital conversion module 4 is configured to perform analog-to-digital conversion on the detection result before the calculation module 1 calculates the target current according to the detection result of the current detection mechanism 200.
In this embodiment, after the voltage and current of the device to be tested enter the metering chip 100 through the analog-to-digital conversion module 4, the analog quantity of the voltage and current is automatically converted into a digital quantity. The analog-to-digital conversion module 4 utilizes a variety of cured digital algorithm programs, such as multiplication, average error, integration, etc.
The calculating module 1 is further configured to calculate a performance parameter of the device under test according to the target current and the target voltage of the device under test.
In particular, performance parameters include, but are not limited to, power, electrical energy.
The meter chip 100 further comprises a power circuit 5 for providing power.
In this embodiment, the power supply circuit 5 is electrically connected to other modules in the metering chip 100, and is configured to provide a stable power supply voltage to the computing module 1, the calibration module 2, the address bit pin 3, the analog-to-digital conversion module 4, and the like.
The metering chip 100 further comprises a communication interface 6 for communication connection with an external controller.
In this embodiment, the communication interface 6 may include, but is not limited to, SPI (Serial Peripheral Interface ) and UART (Universal Asynchronous Receiver/Transmitter, universal asynchronous receiver Transmitter) connected to the MCU, and the communication interface 6 is used for the communication between the metering chip 100 and the MCU, so as to implement command interaction or data transmission.
The metering chip further comprises a clock circuit 7 connected to the communication interface.
In this embodiment, the clock circuit 7 may include, but is not limited to, an internal oscillating circuit and a crystal or external clock source, providing a stable clock signal when the metering chip 100 is communicatively interacted with the MCU microcontroller. Specifically, the metrology chip 100 may itself generate an oscillation frequency at a frequency. The oscillation signal can be used as a clock source for communication by dividing and multiplying the frequency. Through the frequency adaptation rule, the metering chip 100 uses an SPI interface or a UART interface to achieve data interaction with the MCU. And when the user needs a very accurate oscillation frequency, the internal oscillation circuit can be calibrated by an external crystal or an external clock source.
Example 3
In this embodiment, there is also provided a measurement system, as shown in fig. 4, including the meter chip 100 and the current detection mechanism 200 in embodiments 1-2.
In this embodiment, a metering chip 100 is connected to a current detecting mechanism 200, and when a calibration current is generated by a current output circuit 21 and is input to the current detecting mechanism 200, the metering chip 100 receives a feedback signal from the current detecting mechanism 200, and calibrates the current detecting mechanism 200 according to the feedback signal.
The embodiment provides a measuring system, realizes the automatic calibration of a current detection mechanism through a reference circuit and a voltage output circuit in a metering chip, automatically completes demagnetization, eliminates errors existing in the current detection mechanism, and improves measuring precision.
While specific embodiments of the invention have been described above, it will be appreciated by those skilled in the art that this is by way of example only, and the scope of the invention is defined by the appended claims. Various changes and modifications to these embodiments may be made by those skilled in the art without departing from the principles and spirit of the invention, but such changes and modifications fall within the scope of the invention.
Claims (8)
1. A metering chip, comprising:
the calculation module is used for calculating the target current of the equipment to be detected according to the detection result of the current detection mechanism;
the calibration module is used for calibrating the current detection mechanism;
an address bit pin for generating a corresponding chip address according to the externally connected configuration resistor;
the calibration module includes: a current output circuit, an enable control circuit and a logic circuit;
the enabling control circuit is used for enabling the current output circuit to output a calibration current to the current detection mechanism;
the logic circuit is used for receiving a feedback signal of the current detection mechanism responding to the calibration current and calibrating the current detection mechanism based on the calibration current and the feedback signal;
the current detection mechanism comprises a magnetic core, a Hall element, a secondary side compensation coil, a secondary side driving module and a calibration lead which is arranged through the magnetic core;
the current output circuit is used for outputting the calibration current to the calibration lead;
the logic circuit is used for acquiring a feedback signal output by the secondary side driving module when the current of the calibration lead is the calibration current, generating a control instruction based on the feedback signal and sending the control instruction to the enabling control circuit, so that the enabling control circuit controls the current output circuit to output corresponding current to the input end of the secondary side compensation coil according to the control instruction.
2. The metrology chip of claim 1, wherein the calibration module further comprises: and the reference circuit is used for generating the calibration current and transmitting the calibration current to the current output circuit.
3. The metrology chip of claim 1, further comprising:
and the analog-to-digital conversion module is used for performing analog-to-digital conversion on the detection result before the calculation module calculates the target current according to the detection result of the current detection mechanism.
4. The metering chip of claim 1, wherein the computing module is further for computing a performance parameter of the device under test based on the target current and a target voltage of the device under test.
5. The metering chip of claim 1, further comprising a power circuit for providing power.
6. The metering chip of claim 1, further comprising a communication interface for communication connection with an external controller.
7. The metering chip of claim 6, further comprising a clock circuit coupled to the communication interface.
8. A measurement system comprising a meter chip according to any one of the preceding claims 1-7 and a current detection mechanism.
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| CN202110912872.5A CN113804962B (en) | 2021-08-10 | 2021-08-10 | Metering chip and measuring system |
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| CN202110912872.5A CN113804962B (en) | 2021-08-10 | 2021-08-10 | Metering chip and measuring system |
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| CN113804962B true CN113804962B (en) | 2024-04-02 |
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2021
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