CN113791297A - Multifunctional test equipment with thermal stress test function and test method thereof - Google Patents
Multifunctional test equipment with thermal stress test function and test method thereof Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 284
- 230000008646 thermal stress Effects 0.000 title claims abstract description 63
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- 230000032683 aging Effects 0.000 claims abstract description 38
- 239000003292 glue Substances 0.000 claims abstract description 14
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- 238000009662 stress testing Methods 0.000 claims description 26
- 239000002184 metal Substances 0.000 claims description 22
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
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Abstract
The invention discloses a multifunctional test device with a thermal stress test function, which comprises an upper computer PC, an electric controller, a test cabinet, a load, a data acquisition device and a carrying manipulator, wherein the test cabinet comprises a workbench, a test box, a test tool and a thermal stress test assembly, and the test box is provided with temperature color-changing glue. The invention also discloses a test method. According to the invention, through realizing the full-automatic test of the power electronic product, the synchronous test of current stress, voltage stress and thermal stress can be realized, the test time is shortened, the efficiency of the aging process test of the power electronic product is improved, and the quality of the product is predicted according to the thermal stress allowance, so that the time is short, the accuracy is high, the defective product can be predicted in advance, more influences caused by the defective product are avoided, the test efficiency is improved and the test cost is reduced while the test precision is ensured.
Description
Technical Field
The invention relates to the technical field of electronic hardware environmental stress test equipment, in particular to multifunctional test equipment with a thermal stress test function and a test method thereof.
Background
Aging of power electronic products belongs to Environmental Stress Screening (ESS), which is called ESS for short, and is a popular quality and reliability guarantee method for modern high-tech electronic products. As the name suggests, environmental stress screening utilizes the applied environmental stress to expose the defects caused by weak components, poor processes and other factors which are latent in electronic hardware, and is mainly applied to the test of the power electronic hardware such as a circuit board, a relay, a fuse resistor and the like, thereby achieving the effects of prolonging the service life and improving the performance of the power electronic hardware. At present, the common method is to operate the product at the upper limit of the working environment temperature, and observe whether the product operating state is within the rated range in real time under the condition of low pressure and full load for a long time. If the product has poor manufacturing process or other hidden troubles, the product can be aged and eliminated according to the bathtub effect curve, so that the service life and the aging process of the product can be estimated, the estimated maintenance and replacement time of the product in subsequent use is convenient, and the reliability of the actual work of the power electronic product is ensured.
The existing power electronic product aging belongs to environmental stress screening, and a testing device such as an aging cabinet is mostly adopted to test the power electronic product, the traditional testing device can only provide current stress and voltage stress testing and data acquisition so as to be used for judging the aging testing, the power electronic product often generates extra heat in the using process, the heat release also influences the aging process of the power electronic product, so the temperature of the power electronic product is also one of important judging data of the existing aging process, the existing testing device has no thermal stress testing function, after the current stress and voltage stress testing and data acquisition are usually finished, the product to be tested is transferred to a temperature detecting device for detection and analysis or manual temperature measurement detection, because the temperature of the product to be tested is influenced by external factors in the carrying process, the manual temperature measurement has manual errors, the two modes can cause errors in the detection data, influence the subsequent judgment precision, and cause long time consumption in the whole testing process and influence the testing and screening efficiency; the existing testing equipment is low in automation degree, manual loading and unloading actions of products to be tested are required, connection, conduction and fixation operations are required, labor intensity of workers is high, steps are multiple, impurities are attached to the surfaces of the products to be tested due to manual carrying, cleanliness of the products to be tested is affected, accuracy of a test result is affected, the existing testing equipment cannot provide multiple testing environments according to requirements, and testing requirements of existing power electronic products cannot be met.
Disclosure of Invention
The invention provides a multifunctional test device with a thermal stress test function, aiming at the defects of the prior art.
The invention also discloses a test method.
The technical scheme adopted by the invention for realizing the purpose is as follows:
a multifunctional test device with a thermal stress test function comprises an upper computer PC, an electric controller, a test cabinet, a load and data acquisition device, wherein cables are arranged among the upper computer PC, the electric controller, the test cabinet, the load and the data acquisition device to form electric connection, one end of the upper computer PC is electrically connected with an electric controller, the electric controller is connected with the test cabinet, the test cabinet is connected with the load, the load is connected with the data acquisition device, the data acquisition device is connected with the other end of the upper computer PC, the multifunctional test device is further provided with a carrying manipulator, the test cabinet comprises a workbench, a test box, a test tool and a thermal stress test assembly, and the test box is provided with temperature color changing glue;
the test tool comprises a moving assembly and a vertical moving assembly, the test box is arranged at the tail end of the workbench, the carrying manipulator is arranged at the front end of the workbench, the vertical moving assembly is arranged in the test box, the moving assembly is arranged below the vertical moving assembly, the moving assembly is provided with a placing platform deck, the placing platform deck is provided with a clamping assembly, elastic contact metal blocks are further arranged on two sides of the placing platform deck, contact metal sheets are arranged on two inner sides of the test box, and the contact metal sheets are provided with wiring ports;
the upper computer PC plays a role in control, setting and data processing analysis, is used for setting the test parameters of the electric controller, so as to control the test cabinet to test the test product in the test cabinet, controls the data acquisition device, is used for setting the electric parameters of the load and collecting the data obtained by the data acquisition device, and is also used for setting and collecting the temperature parameters of the thermal stress test assembly;
the data acquisition device is used for setting and detecting the voltage, current, power and other electrical parameters output by the load and feeding the detected data back to the PC.
The improved structure is characterized in that the moving assembly comprises two sliding rails, a motor and a screw rod, a driving shaft of the motor is connected with the screw rod, the two sliding rails are respectively provided with a sliding block, the screw rod is provided with a connecting block with a screw rod nut, and the bottom of the placing carrier is fixed on the two sliding blocks and the connecting block with the screw rod nut.
The improved thermal stress testing device is characterized in that the vertical moving assembly comprises two supporting rods, a transverse rod and a cylinder, the transverse rod is arranged between the two supporting rods, the transverse rod is provided with a mounting seat, the cylinder is arranged on the mounting seat, the two supporting rods are both provided with corner blocks, the corner blocks are both provided with guide pillars, the cylinder is provided with a driving rod, the driving rod is provided with a mounting plate, the mounting plate is provided with two guide sleeves, the two guide sleeves are respectively sleeved outside the guide pillars, the thermal stress testing assembly is arranged below the mounting plate, and a buckle connecting structure is arranged between the mounting plate and the thermal stress testing assembly.
The cylinder is provided with a pressing pressure monitoring meter, the pressing pressure monitoring meter is electrically connected with the electric controller, the thermal stress testing assembly comprises a first mounting plate, a contact temperature probe set and a non-contact temperature probe set, the buckle connecting structure comprises a plurality of buckles and a plurality of buckle holes, the buckles are arranged on the first mounting plate, and the buckle holes are arranged on the mounting plate.
The improved humidity testing device is characterized in that a temperature adjusting assembly and a humidity adjusting assembly are arranged in the testing box, the temperature adjusting assembly comprises a heater, a cooler, a temperature sensor and a controller I, the humidity adjusting assembly comprises a controller II and a humidifier, the testing box is further provided with a box door and an observation window, the box door is provided with a feeding port, and the feeding port is provided with a detection grating.
The improved structure comprises a placing carrier, a rectangular plate, a placing groove, a clamping assembly and a lifting cylinder, wherein the placing carrier is the rectangular plate, the rectangular plate is provided with the placing groove, the clamping assembly comprises a plurality of clamping cylinders, the clamping cylinders are provided with clamping blocks, the clamping cylinders are arranged on the inner side surface of the placing groove respectively, the clamping cylinders arranged on the left inner side and the right inner side of the placing groove are provided with a first wire and a second metal sheet, one end of the first wire is connected with the elastic contact metal block, the other end of the first wire is connected with the second metal sheet, the second metal sheet is arranged on the clamping blocks, the bottom of the placing groove is further provided with a groove, the lifting cylinder is arranged in the groove, the lifting cylinder is provided with a platform, and the platform is provided with a first contact temperature probe set and a first non-contact temperature probe set.
The temperature sensor is characterized in that the temperature sensor comprises a contact temperature probe group and a non-contact temperature probe group, the contact temperature probe group and the contact temperature probe group are respectively composed of a plurality of temperature probes, and the non-contact temperature probe group are respectively composed of a plurality of infrared temperature sensors.
Further improvement is made, the transport manipulator includes base, rotation axis, horizontal axle and vertical axle, the rotation axis sets up on the base, the rotation axis includes rotating electrical machines and installation pole, horizontal axle includes horizontal cylinder, horizontal cylinder is equipped with mount pad one, vertical axle sets up on the mount pad one, vertical axle includes vertical cylinder, vertical cylinder is equipped with mount pad two, mount pad two is equipped with anchor clamps, anchor clamps comprise a plurality of sucking discs and clamping jaw.
In a further development, a test method for implementing a multifunctional test apparatus with thermal stress testing comprises the following steps:
(1) selecting a thermal stress test assembly: selecting a contact temperature probe group, a first contact temperature probe group or a non-contact temperature probe group or a first non-contact temperature probe group according to the material of the product to be detected by an upper computer PC;
(2) setting test parameters: setting environmental parameters in the test cabinet through an upper computer and a PC2, setting upper limit and lower limit of temperature parameter indexes, setting aging test time, and setting upper limit and lower limit ranges of voltage, current, power and other electrical parameters of the data acquisition device 6;
(3) starting the test: the method comprises the following steps that a conveying manipulator conveys a product to be tested into a placing carrier, a clamping assembly in the placing carrier clamps and electrically connects the product to be tested, a moving assembly conveys the product to be tested to the lower part of a testing tool, a thermal stress testing assembly on the testing tool is in contact with or is not in contact with the upper surface of the product to be tested in the placing carrier, meanwhile, a bottom lifting cylinder enables a contact type temperature probe group I to be in contact with the bottom of the product to be tested or a non-contact type temperature probe group I to be in non-contact with the bottom of the product to be tested, and aging testing starts;
(4) testing and judging: the method comprises the following steps that a product to be tested is subjected to aging test for a certain time length in a test cabinet, then the product is connected with and drives a load to output electrical parameter data, a data acquisition device detects and judges electrical parameters such as voltage, current and power output by the load and feeds detected data back to an upper computer PC, meanwhile, temperature parameters detected by a thermal stress test assembly 11 and a contact type temperature probe group I/non-contact type temperature probe group I are fed back to the upper computer PC, the upper computer PC processes and judges the electrical parameters and the temperature parameter data, and the test step is completed;
(5) product blanking and replacement: the test tool resets, the moving assembly moves the tested product out of the test cabinet, the clamping assembly is loosened, the carrying manipulator carries out blanking of the tested product and replacement and test of another product to be tested, and the whole test procedure is completed.
In a further improvement, the testing method of the multifunctional testing device with the thermal stress test is characterized in that the step (4) comprises the following steps:
detecting and judging the electrical parameters of voltage, current and power by the data acquisition device, and judging the temperature parameter of the next step if the electrical parameters of the voltage, the current, the power and the like output by the load are in the set upper and lower limit ranges; if the voltage, current, power and other electrical parameters output by the load are not within the set upper and lower limit ranges, the obtained product to be detected is a defective product;
step (4.2), the upper computer PC judges the temperature parameter, whether the temperature parameter is lower than the upper temperature limit or not, and judges the aging time length if the temperature parameter of the product to be detected is lower than the upper temperature limit; if the temperature parameter of the product to be detected is not lower than the upper temperature limit, the product to be detected is a defective product;
step (4.3) the PC judges the aging duration, if the aging duration reaches a set value, the aging test is finished, and the product to be tested is a good product; and if the aging duration does not reach the set value, repeating the steps (4.1) to (4.3) until the aging test is finished.
The invention has the beneficial effects that: the invention realizes full-automatic test of power electronic products by arranging the PC, the electric controller, the test cabinet and the load and data acquisition device, thereby improving the test efficiency and reducing the test cost while ensuring the test precision; by arranging the load, the data acquisition device, the thermal stress testing assembly, the contact temperature probe group I and the non-contact temperature probe group I, the multifunctional testing equipment can synchronously realize the testing of current stress, voltage stress and thermal stress, the testing time is shortened, the efficiency of the aging process testing of the power electronic product is greatly improved, the quality of the product is predicted according to the thermal stress allowance, the time is short, the accuracy is high, the defective product can be predicted in advance, and more influences caused by the defective product are avoided; the test box is arranged to prevent external factors from influencing the test of the test station, so that the test accuracy is ensured; the temperature adjusting assembly can provide testing environments with different temperatures for the product to be tested according to requirements, so that data such as performance and effect of the product to be tested in different temperature environments can be obtained, the humidity adjusting assembly can provide different humidity environments for the product to be tested according to requirements, so that data such as performance and effect of the product to be tested in different humidity environments can be obtained, the setting requirements of various environments can be met without replacing testing equipment, and the applicability is improved; the temperature change inside the test box is converted into visible color change by the temperature color change glue and fed back to people in time, when an element module in the test box is used, the generated heat flows to the temperature color change glue, the color change can be generated by the temperature color change glue along with the rise of the temperature, the temperature inside the test box is fed back in time, so that people can control the temperature inside the test box in time, the use effect and the test effect of the element module in the test box are prevented from being influenced by abnormal high temperature, and the safety is improved; the automatic efficiency of the multifunctional testing equipment is improved by arranging the moving assembly, the vertical moving assembly and the carrying manipulator, the labor intensity of workers is reduced, the testing efficiency is improved, and the influence of the following testing precision caused by artificial factors is greatly reduced; by arranging the contact temperature probe group, the first non-contact temperature probe group and the first non-contact temperature probe group, contact testing or non-contact testing can be freely selected according to the material of the product to be tested, so that the multifunctional testing equipment can be used for testing the product to be tested with various materials, and the applicability is improved; the clamping assembly is used for clamping, fixing and conducting the product to be tested, and can be used for fixing the product to be tested with various specifications, so that the applicability is improved.
The invention is further described with reference to the following detailed description and accompanying drawings.
Drawings
FIG. 1 is a schematic diagram of an overall structure of a multifunctional testing apparatus with thermal stress testing according to an embodiment;
FIG. 2 is an exploded view of the multifunctional testing apparatus with thermal stress testing of the present embodiment;
FIG. 3 is a schematic structural diagram of the test fixture of the present embodiment;
fig. 4 is a schematic cross-sectional view of the placing stage of the present embodiment;
fig. 5 is a flowchart illustrating a testing method of the multifunctional testing apparatus with thermal stress testing according to this embodiment.
Detailed Description
The following description is only a preferred embodiment of the present invention, and does not limit the scope of the present invention.
In the embodiment, referring to fig. 1 to 5, a multifunctional testing device 1 with a thermal stress test includes an upper computer PC2, an electrical controller 3, a testing cabinet 4, a load 5 and a data acquisition device 6, wherein cables are arranged among the upper computer PC2, the electrical controller 3, the testing cabinet 4, the load 5 and the data acquisition device 6 to form an electrical connection, one end of an upper computer PC2 is electrically connected with the electrical controller 3, the electrical controller 3 is connected with the testing cabinet 4, the testing cabinet 4 is connected with the load 5, the load 5 is connected with the data acquisition device 6, the data acquisition device 6 is connected with the other end of the upper computer PC2, the multifunctional testing device 1 is further provided with a carrying manipulator 7, the testing cabinet 4 includes a workbench 8, a testing box 9, a testing tool 10 and a thermal stress testing component 11, the testing box 9 is provided with a temperature color-changing glue 90, the temperature color-changing glue 90 is made of a temperature color-changing material, the temperature color-changing glue 90 converts the temperature change inside the test box 9 into a visible color change and feeds the visible color change back to people, when an element module in the test box is used, the generated heat flows to the temperature color-changing glue 90, the temperature color-changing glue 90 also generates a color change along with the rise of the temperature, and the temperature inside the test box 90 is fed back in time, so that people can control the temperature inside the test box 90 in time, the use effect and the test effect of the element module in the test box 90 are prevented from being influenced by abnormal high temperature, the safety is improved, the test box 9 is used for ensuring that the test action is not influenced by external factors, and the stability of a test environment is ensured;
the test tool 10 comprises a moving assembly 100 and a vertical moving assembly 101, the test box 9 is arranged at the tail end of the workbench 8, the carrying manipulator 7 is arranged at the front end of the workbench 8, the vertical moving assembly 101 is arranged in the test box 9, the moving assembly 100 is arranged below the vertical moving assembly 101, the moving assembly 100 is provided with a placing platform 102, the placing platform 102 is provided with a clamping assembly 103, two sides of the placing platform 102 are also provided with elastic contact metal blocks 1025, two inner sides of the test box 9 are both provided with contact metal sheets 1020 which are used for contacting with the contact metal sheets so as to form electrical conduction, the contact metal sheets are both provided with wiring ports 91, the wiring ports 91 are used for forming electrical connection with the electrical controller 3 and the load 5, and the test box 9 is used for preventing the influence of external factors, the test tool 10 is used for realizing automatic transportation and transportation of a product to be tested and automatic pressing test action of the test assembly, so that the automation efficiency is improved;
the upper computer PC2 has the functions of control, setting and data processing and analysis, is used for setting the test parameters of the electric controller 3, so as to control the test cabinet 4 to test the test product in the test cabinet, and controls the data acquisition device 6, so as to set the electric parameters of the load and collect the data obtained by the data acquisition device 6, and the upper computer PC2 is also used for setting and collecting the temperature parameters of the thermal stress test assembly 11;
the data acquisition device 6 is used for setting and detecting the voltage, current, power and other electrical parameters output by the load, and feeding the detected data back to the PC 2.
The moving assembly 100 comprises two sliding rails 1000, a motor 1001 and a screw rod 1002, a driving shaft of the motor 1001 is connected with the screw rod 1002, the two sliding rails 1000 are respectively provided with a sliding block 1003, the screw rod 1002 is provided with a nut connecting block with the screw rod, the bottom of the placing carrying platform 102 is fixed on the two sliding blocks 1003 and the nut connecting block with the screw rod, the moving assembly 100 is used for carrying the placing carrying platform 102 into a test box 9, the vertical moving assembly 101 comprises two supporting rods 1010, a cross rod 1011 and a cylinder 1012, the cross rod 1011 is arranged between the two supporting rods 1010, the cross rod 1011 is provided with a mounting seat 1013, the cylinder 1012 is arranged on the mounting seat 1013, the two supporting rods 1010 are also provided with angle blocks 1014, the angle blocks 1014 are respectively provided with guide posts 1015, the cylinder 1012 is provided with a driving rod, the driving rod is provided with a mounting plate 1016, the mounting plate 1016 is provided with two guide sleeves, the two guide sleeves are respectively sleeved outside the guide posts 1015, the guide pillar 1015 and the guide sleeve are used for ensuring the up-and-down movement stability of the mounting plate 1016, the vertical moving assembly 101 is used for automatically pressing and contacting the thermal stress testing assembly 11 to a product to be tested in the placing carrier 102, so as to perform testing, the thermal stress testing assembly 11 is arranged below the mounting plate 1016, and a buckle connecting structure 12 is arranged between the mounting plate 1016 and the thermal stress testing assembly 11.
The cylinder 1012 is provided with a pressing pressure monitoring meter 1017, the pressing pressure monitoring meter 1017 is electrically connected with the electric controller 3, the pressing pressure monitoring meter 1017 is used for adjusting the pressing air pressure of the air cylinder 1012 to prevent the embossing of the product to be measured, the thermal stress testing assembly 11 comprises a first mounting plate 110, a contact temperature probe group 111 and a non-contact temperature probe group 112, the snap connection structure 12 includes a plurality of hooks 120 and a plurality of fastening holes 121, the plurality of hooks 120 are disposed on the first mounting plate 110, the plurality of fastening holes 121 are disposed on the mounting plate 1016, the snap connection 12 facilitates quick connection or disconnection between the thermal stress testing assembly 11 and the vertically moving assembly 101, therefore, the maintenance and replacement actions of the thermal stress testing assembly 11 are facilitated, the disassembling and assembling time and steps are saved, and the normal use of the multifunctional testing equipment 1 is ensured.
A temperature adjusting component 13 and a humidity adjusting component 14 are arranged in the testing box 9, the temperature adjusting component 13 comprises a heater 130, a cooler 131, a temperature sensor and a first controller, the humidity adjusting component 14 comprises a second controller and a humidifier, the temperature adjusting component 13 can provide testing environments with different temperatures for the product to be tested according to requirements, so as to obtain the data of the performance, effect and the like of the product to be measured under different temperature environments, the humidity adjusting component 14 can provide different humidity environments for the product to be measured according to the requirements, thereby obtaining the data of the performance, the effect and the like of the product to be measured under different humidity environments, improving the applicability, the test box 9 is further provided with a box door 92 and an observation window 93, the box door 92 is provided with a feed port 920, the feed inlet is provided with a detection grating 921, and the detection grating 921 is used for detecting the placing carrier 102, so that the multifunctional testing equipment 1 is automatically controlled to start testing.
The placing carrier 102 is a rectangular plate, the rectangular plate is provided with a placing groove 1020, the clamping assembly 103 comprises a plurality of clamping cylinders, the clamping cylinders are provided with clamping blocks 1030 and are respectively arranged on the inner side surfaces of the placing groove 1020, the clamping cylinders arranged on the left inner side and the right inner side of the placing groove 1020 are respectively provided with a first lead and a second metal sheet 1031, one end of the first lead is respectively connected with the elastic contact metal block 1025, the other end of the first lead is connected with the second metal sheet 1031, the second metal sheet is arranged on the clamping blocks 1030, a groove is further formed in the bottom of the placing groove 1020, a lifting cylinder 17 is arranged in the groove, the lifting cylinder 17 is provided with a platform 18, the platform 18 is provided with a first contact temperature probe group 180 and a first non-contact temperature probe group 181, and both the first contact temperature probe group 111 and the first contact temperature probe group 180 are composed of a plurality of temperature probes, the multifunctional testing equipment comprises a non-contact temperature probe group 112, a non-contact temperature probe group 181, an electrical appliance controller 3, a clamping assembly 103, a plurality of infrared temperature sensors, a contact temperature probe group 111, a contact temperature probe group 180, a non-contact temperature probe group 112 and a non-contact temperature probe group 181, wherein the non-contact temperature probe group and the non-contact temperature probe group can freely select contact testing or non-contact testing according to materials of a product to be tested, so that the multifunctional testing equipment 1 can be used for testing various electronic hardware, the applicability is improved, the contact temperature probe group 180 and the non-contact temperature probe group 181 are respectively provided with a connecting wire, the connecting wires are electrically connected with the electrical appliance controller 3, the clamping assembly 103 is used for clamping, fixing and conducting the product to be tested, and the clamping assembly 103 can be used for fixing various products to be tested with different specifications, and the applicability is improved.
The carrying manipulator 7 comprises a base 70, a rotating shaft 71, a transverse shaft 72 and a vertical shaft 73, the rotating shaft 71 is arranged on the base 70, the rotating shaft 71 comprises a rotating motor and an installation rod, the transverse shaft 72 comprises a transverse cylinder, the transverse cylinder is provided with a first installation seat, the vertical shaft 73 is arranged on the first installation seat, the vertical shaft 73 comprises a vertical cylinder, the vertical cylinder is provided with a second installation seat, the second installation seat is provided with a clamp 73, the clamp 74 comprises a plurality of suckers and clamping jaws, the carrying manipulator 7 is used for automatically carrying products to be tested, automatic feeding and discharging actions are achieved, the labor intensity is reduced, the automation efficiency is improved, the cleanness of the products to be tested is guaranteed, and the test precision of the products to be tested is improved.
The clamp cylinder, cylinder 1012 and clamp 74 are all provided with connecting pipes which are connected with external air compression equipment.
A test method of implementing a multifunctional test apparatus 1 with thermal stress test, comprising the steps of:
(1) selection of the thermal stress test assembly 11: selecting a contact temperature probe group 111, a contact temperature probe group I180 or a non-contact temperature probe group 112 or a non-contact temperature probe group I181 according to the material of the product to be detected by an upper computer PC 2;
(2) setting test parameters: setting environmental parameters in the test cabinet 4 through an upper computer and a PC2, setting upper and lower limits of temperature parameter indexes, setting aging test time, and setting upper and lower limit ranges of voltage, current, power and other electrical parameters of the data acquisition device 6;
(3) starting the test: the conveying manipulator 7 conveys a product to be tested into the placing carrier 102, the clamping assembly 103 in the placing carrier 102 clamps and electrically connects the product to be tested, the moving assembly 100 conveys the product to be tested to the lower part of the testing tool 10, the thermal stress testing assembly 11 on the testing tool 10 contacts or does not contact with the upper surface of the product to be tested in the placing carrier 102, meanwhile, the bottom lifting cylinder 17 enables the contact type temperature probe group I180 to contact the bottom of the product to be tested or the non-contact type temperature probe group I181 to be non-contact with the bottom of the product to be tested, and the aging test starts;
(4) testing and judging: the product to be tested is subjected to aging test for a certain time length in the test cabinet 4, then the aging test is carried out on the product to be tested, the product is connected with and drives the load 5 to output electrical parameter data, the data acquisition device 6 is used for detecting and judging electrical parameters such as voltage, current and power output by the load 5 and feeding back the detected data to the upper computer PC2, meanwhile, temperature parameters detected by the thermal stress test assembly 11 and the first contact-type temperature probe assembly 180/the first non-contact-type temperature probe assembly 181 are fed back to the upper computer PC2, the upper computer PC2 is used for processing and judging the electrical parameters and the temperature parameter data, and the test step is completed;
(5) product blanking and replacement: the test tool 10 is reset, the moving assembly 100 moves the tested product out of the test cabinet 4, the clamping assembly 103 is loosened, the carrying manipulator 7 carries out blanking of the tested product and replacement and test of another product to be tested, and the whole test procedure is completed.
In a further improvement, the testing method of the multifunctional testing device with thermal stress test 1 is characterized in that the step (4) comprises the following steps:
the data acquisition device 6 in the step (4.1) detects and judges the electrical parameters of voltage, current and power, and if the electrical parameters of voltage, current, power and the like output by the load are in the set upper and lower limit ranges, the next temperature parameter judgment is carried out; if the voltage, current, power and other electrical parameters output by the load are not within the set upper and lower limit ranges, the obtained product to be detected is a defective product;
step (4.2), the upper computer PC2 judges temperature parameters, whether the temperature parameters are lower than the upper temperature limit or not, and judges the aging time length if the temperature parameters of the product to be detected are lower than the upper temperature limit; if the temperature parameter of the product to be detected is not lower than the upper temperature limit, the product to be detected is a defective product;
step (4.3), the PC2 of the upper computer judges the aging duration, if the aging duration reaches a set value, the aging test is finished, and the product to be tested is a good product; and if the aging duration does not reach the set value, repeating the steps (4.1) to (4.3) until the aging test is finished.
The invention realizes full-automatic test of power electronic products by arranging the PC, the electric controller, the test cabinet and the load and data acquisition device, thereby improving the test efficiency and reducing the test cost while ensuring the test precision; by arranging the load, the data acquisition device, the thermal stress testing assembly, the contact temperature probe group I and the non-contact temperature probe group I, the multifunctional testing equipment can synchronously realize the testing of current stress, voltage stress and thermal stress, the testing time is shortened, the efficiency of the aging process testing of the power electronic product is greatly improved, the quality of the product is predicted according to the thermal stress allowance, the time is short, the accuracy is high, the defective product can be predicted in advance, and more influences caused by the defective product are avoided; the test box is arranged to prevent external factors from influencing the test of the test station, so that the test accuracy is ensured; the temperature adjusting assembly can provide testing environments with different temperatures for the product to be tested according to requirements, so that data such as performance and effect of the product to be tested in different temperature environments can be obtained, the humidity adjusting assembly can provide different humidity environments for the product to be tested according to requirements, so that data such as performance and effect of the product to be tested in different humidity environments can be obtained, the setting requirements of various environments can be met without replacing testing equipment, and the applicability is improved; the temperature change inside the test box is converted into visible color change by the temperature color change glue and fed back to people in time, when an element module in the test box is used, the generated heat flows to the temperature color change glue, the color change can be generated by the temperature color change glue along with the rise of the temperature, the temperature inside the test box is fed back in time, so that people can control the temperature inside the test box in time, the use effect and the test effect of the element module in the test box are prevented from being influenced by abnormal high temperature, and the safety is improved; the automatic efficiency of the multifunctional testing equipment is improved by arranging the moving assembly, the vertical moving assembly and the carrying manipulator, the labor intensity of workers is reduced, the testing efficiency is improved, and the influence of the following testing precision caused by artificial factors is greatly reduced; by arranging the contact temperature probe group, the first non-contact temperature probe group and the first non-contact temperature probe group, contact testing or non-contact testing can be freely selected according to the material of the product to be tested, so that the multifunctional testing equipment can be used for testing the product to be tested with various materials, and the applicability is improved; the clamping assembly is used for clamping, fixing and conducting the product to be tested, and can be used for fixing the product to be tested with various specifications, so that the applicability is improved.
The present invention is not limited to the above embodiments, and other multifunctional testing devices and testing methods thereof for testing thermal stress using the same or similar structures, devices, processes or methods as those of the above embodiments of the present invention are within the scope of the present invention.
Claims (10)
1. A multifunctional test equipment with thermal stress test, its characterized in that: the multifunctional testing equipment comprises an upper computer PC, an electric controller, a testing cabinet, a load and data acquisition device, wherein cables are arranged among the upper computer PC, the electric controller, the testing cabinet, the load and the data acquisition device to form electric connection, one end of the upper computer PC is electrically connected with the electric controller, the electric controller is connected with the testing cabinet, the testing cabinet is connected with the load, the load is connected with the data acquisition device, the data acquisition device is connected with the other end of the upper computer PC, the multifunctional testing equipment is further provided with a carrying manipulator, the testing cabinet comprises a workbench, a testing box, a testing tool and a thermal stress testing assembly, and the testing box is provided with temperature color changing glue;
the test tool comprises a moving assembly and a vertical moving assembly, the test box is arranged at the tail end of the workbench, the carrying manipulator is arranged at the front end of the workbench, the vertical moving assembly is arranged in the test box, the moving assembly is arranged below the vertical moving assembly, the moving assembly is provided with a placing platform deck, the placing platform deck is provided with a clamping assembly, elastic contact metal blocks are further arranged on two sides of the placing platform deck, contact metal sheets are arranged on two inner sides of the test box, and the contact metal sheets are provided with wiring ports;
the upper computer PC plays a role in control, setting and data processing analysis, is used for setting the test parameters of the electric controller, so as to control the test cabinet to test the test product in the test cabinet, controls the data acquisition device, is used for setting the electric parameters of the load and collecting the data obtained by the data acquisition device, and is also used for setting and collecting the temperature parameters of the thermal stress test assembly;
the data acquisition device is used for setting and detecting the voltage, current, power and other electrical parameters output by the load and feeding the detected data back to the PC.
2. The multifunctional test equipment with thermal stress test of claim 1, wherein: the moving assembly comprises two sliding rails, a motor and a lead screw, a driving shaft of the motor is connected with the lead screw, the two sliding rails are respectively provided with a sliding block, the lead screw is provided with a connecting block with a lead screw nut, and the bottom of the placing platform deck is fixed on the two sliding blocks and the connecting block with the lead screw nut.
3. The multifunctional test equipment with thermal stress test of claim 2, wherein: the vertical moving assembly comprises two supporting rods, a transverse rod and a cylinder, the transverse rod is arranged between the two supporting rods, the transverse rod is provided with a mounting seat, the cylinder is arranged on the mounting seat, the two supporting rods are provided with angle blocks, the angle blocks are provided with guide pillars, the cylinder is provided with a driving rod, the driving rod is provided with a mounting plate, the mounting plate is provided with two guide sleeves, the two guide sleeves are respectively sleeved outside the guide pillars, the thermal stress testing assembly is arranged below the mounting plate, and a buckle connecting structure is arranged between the mounting plate and the thermal stress testing assembly.
4. The multifunctional test equipment with thermal stress test of claim 3, wherein: the cylinder is equipped with down-pressure monitoring table, down-pressure monitoring table with electric controller electric connection, thermal stress test assembly includes mounting panel one, contact temperature probe group and non-contact temperature probe group, buckle connection structure includes a plurality of clips and a plurality of knot hole, and is a plurality of the clip sets up mounting panel one is last, and is a plurality of it is in to detain the hole setting on the mounting panel.
5. The multifunctional test equipment with thermal stress test of claim 4, wherein: the testing box is characterized in that a temperature adjusting assembly and a humidity adjusting assembly are arranged in the testing box, the temperature adjusting assembly comprises a heater, a cooler, a temperature sensor and a controller I, the humidity adjusting assembly comprises a controller II and a humidifier, the testing box is further provided with a box door and an observation window, the box door is provided with a feed inlet, and the feed inlet is provided with a detection grating.
6. The multifunctional test equipment with thermal stress test of claim 5, wherein: the carrying platform is a rectangular plate, the rectangular plate is provided with a placing groove, the clamping assembly comprises a plurality of clamping cylinders, the clamping cylinders are provided with clamping blocks, the clamping cylinders are arranged on the inner side surface of the placing groove respectively, the clamping cylinders arranged on the left inner side and the right inner side of the placing groove are provided with a first wire and a second metal sheet, one end of the first wire is connected with the elastic contact metal block, the other end of the first wire is connected with the second metal sheet, the second metal sheet is arranged on the clamping blocks, the bottom of the placing groove is further provided with a groove, a lifting cylinder is arranged in the groove, the lifting cylinder is provided with a platform, and the platform is provided with a first contact temperature probe set and a first non-contact temperature probe set.
7. The multifunctional test equipment with thermal stress test of claim 6, wherein: the first contact temperature probe group and the first contact temperature probe group are both composed of a plurality of temperature probes, and the first non-contact temperature probe group are both composed of a plurality of infrared temperature measurement sensors.
8. The multifunctional test equipment with thermal stress test of claim 7, wherein: the carrying manipulator comprises a base, a rotating shaft, a transverse shaft and a vertical shaft, wherein the rotating shaft is arranged on the base, the rotating shaft comprises a rotating motor and an installation rod, the transverse shaft comprises a transverse cylinder, the transverse cylinder is provided with a first installation seat, the vertical shaft is arranged on the first installation seat, the vertical shaft comprises a vertical cylinder, the vertical cylinder is provided with a second installation seat, the second installation seat is provided with a clamp, and the clamp is composed of a plurality of suckers and clamping jaws.
9. A testing method implementing a multifunctional testing apparatus with thermal stress test according to claims 1-8, characterized in that it comprises the following steps:
(1) selecting a thermal stress test assembly: selecting a contact temperature probe group, a first contact temperature probe group or a non-contact temperature probe group or a first non-contact temperature probe group according to the material of the product to be detected by an upper computer PC;
(2) setting test parameters: setting environmental parameters in the test cabinet through an upper computer and a PC2, setting upper limit and lower limit of temperature parameter indexes, setting aging test time, and setting upper limit and lower limit ranges of voltage, current, power and other electrical parameters of the data acquisition device 6;
(3) starting the test: the method comprises the following steps that a conveying manipulator conveys a product to be tested into a placing carrier, a clamping assembly in the placing carrier clamps and electrically connects the product to be tested, a moving assembly conveys the product to be tested to the lower part of a testing tool, a thermal stress testing assembly on the testing tool is in contact with or is not in contact with the upper surface of the product to be tested in the placing carrier, meanwhile, a bottom lifting cylinder enables a contact type temperature probe group I to be in contact with the bottom of the product to be tested or a non-contact type temperature probe group I to be in non-contact with the bottom of the product to be tested, and aging testing starts;
(4) testing and judging: the method comprises the following steps that a product to be tested is subjected to aging test for a certain time length in a test cabinet, then the product is connected with and drives a load to output electrical parameter data, a data acquisition device detects and judges electrical parameters such as voltage, current and power output by the load and feeds detected data back to an upper computer PC, meanwhile, temperature parameters detected by a thermal stress test assembly 11 and a contact type temperature probe group I/non-contact type temperature probe group I are fed back to the upper computer PC, the upper computer PC processes and judges the electrical parameters and the temperature parameter data, and the test step is completed;
(5) product blanking and replacement: the test tool resets, the moving assembly moves the tested product out of the test cabinet, the clamping assembly is loosened, the carrying manipulator carries out blanking of the tested product and replacement and test of another product to be tested, and the whole test procedure is completed.
10. The method for testing a multifunctional test equipment with thermal stress test according to claim 9, wherein the step (4) comprises the steps of:
detecting and judging the electrical parameters of voltage, current and power by the data acquisition device, and judging the temperature parameter of the next step if the electrical parameters of the voltage, the current, the power and the like output by the load are in the set upper and lower limit ranges; if the voltage, current, power and other electrical parameters output by the load are not within the set upper and lower limit ranges, the obtained product to be detected is a defective product;
step (4.2), the upper computer PC judges the temperature parameter, whether the temperature parameter is lower than the upper temperature limit or not, and judges the aging time length if the temperature parameter of the product to be detected is lower than the upper temperature limit; if the temperature parameter of the product to be detected is not lower than the upper temperature limit, the product to be detected is a defective product;
step (4.3) the PC judges the aging duration, if the aging duration reaches a set value, the aging test is finished, and the product to be tested is a good product; and if the aging duration does not reach the set value, repeating the steps (4.1) to (4.3) until the aging test is finished.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115047926A (en) * | 2022-05-30 | 2022-09-13 | 上海飞奥燃气设备有限公司 | Automatic testing system and method for reliability of electric edge environment |
| CN115078868A (en) * | 2022-06-10 | 2022-09-20 | 杭州中安电子有限公司 | Method and device for testing thermal parameters of device in aging test |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115047926A (en) * | 2022-05-30 | 2022-09-13 | 上海飞奥燃气设备有限公司 | Automatic testing system and method for reliability of electric edge environment |
| CN115078868A (en) * | 2022-06-10 | 2022-09-20 | 杭州中安电子有限公司 | Method and device for testing thermal parameters of device in aging test |
| CN115078868B (en) * | 2022-06-10 | 2023-11-28 | 杭州中安电子有限公司 | Method and device for testing thermal parameters of device in aging test |
| CN115371718A (en) * | 2022-07-12 | 2022-11-22 | 江苏智源自动化技术有限公司 | Automatic meter calibration software system |
| CN116698255A (en) * | 2023-08-01 | 2023-09-05 | 江苏欣战江纤维科技股份有限公司 | Full-automatic filament thermal stress test equipment |
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| CN118244045A (en) * | 2024-05-28 | 2024-06-25 | 水发能源集团有限公司 | Testing device and testing method for AI intelligent control cabinet |
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