CN113721066A - Conduction current measuring device and method - Google Patents
Conduction current measuring device and method Download PDFInfo
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- CN113721066A CN113721066A CN202111062235.XA CN202111062235A CN113721066A CN 113721066 A CN113721066 A CN 113721066A CN 202111062235 A CN202111062235 A CN 202111062235A CN 113721066 A CN113721066 A CN 113721066A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
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- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
The application belongs to the technical field of electrical materials, and particularly relates to a conduction current measuring device and method. The electrode structure in the existing measuring scheme is a flat-plate structure electrode, and the uniformity degree of the corresponding electric field is a uniform field. However, in the GIS/GIL, the electrodes are coaxial, and the corresponding electric fields are less uniform fields. The application provides a conduction current measuring device, including direct current high pressure generating system, high atmospheric pressure seal chamber, current measurement system and the signal acquisition system that connects gradually, high atmospheric pressure seal chamber is connected with air intake and exhaust system, high atmospheric pressure seal chamber, faint light measurement system with the signal acquisition system is connected, be provided with coaxial structure electrode in the high atmospheric pressure seal chamber. And a photoelectric joint monitoring means is adopted to synchronously measure the conduction current and the optical signal of the coaxial structure electrode, and the test result is not influenced by external interference.
Description
Technical Field
The application belongs to the technical field of electrical materials, and particularly relates to a conduction current measuring device and method.
Background
The gas insulated fully-closed switch-Gear (GIS) and the gas insulated metal-closed transmission lines (GIL) have the advantages of small floor area, small influence by external interference, high reliability and the like, so the GIS and the GIS have wide application prospects in the fields of urban power transmission and distribution systems, long-distance high-voltage power transmission, offshore wind power access and the like. The direct-current transmission has the advantages of small occupied area, small loss, easiness in realizing interconnection of power grids and the like, and is widely applied, so that the direct-current GIS and the GIL become an important direction for the development of the field of high-voltage electrical equipment at present. However, compared to ac devices, the basin insulators in dc GIS and GIL face a serious problem of surface charge accumulation due to the constant direction of the dc voltage.
The electrode structure in the existing measuring scheme is a flat-plate structure electrode, and the uniformity degree of the corresponding electric field is a uniform field. However, in the GIS/GIL, the electrodes are coaxial, and the corresponding electric fields are less uniform fields.
Disclosure of Invention
1. Technical problem to be solved
The application provides a self-conduction current measuring device and a self-conduction current measuring method, wherein the self-conduction current is influenced by various factors such as electric field strength, the magnitude of the self-conduction current is extremely small under a low field, the requirement on the precision of a measuring system is extremely high, and a test result is easily influenced by external interference.
2. Technical scheme
In order to achieve the purpose, the application provides a conduction current measuring device which comprises a direct-current high-voltage generating system, a high-pressure sealed cavity, a current measuring system and a signal collecting system which are sequentially connected, wherein the high-pressure sealed cavity is connected with an air inlet and exhaust system, the high-pressure sealed cavity and a weak light measuring system are connected with the signal collecting system, and a coaxial structure electrode is arranged in the high-pressure sealed cavity.
Another embodiment provided by the present application is: the direct-current high-voltage generation system comprises a high-voltage direct-current power supply and a ceramic sleeve which are sequentially connected, the ceramic sleeve is connected with the coaxial structure electrode through a high-voltage connecting rod, and the high-voltage connecting rod is arranged in the high-pressure sealed cavity.
Another embodiment provided by the present application is: the current measuring system comprises an electrometer, and the electrometer is connected with the coaxial structure electrode through a shielding wire.
Another embodiment provided by the present application is: the high-pressure sealed cavity is provided with a vacuum pump valve and an inflation valve, the air intake and exhaust system comprises a mechanical pump and an air bottle, the mechanical pump is connected with the vacuum pump valve, and the air bottle is connected with the inflation valve.
Another embodiment provided by the present application is: and a humidity regulator is arranged between the gas cylinder and the inflation valve.
Another embodiment provided by the present application is: the coaxial structure electrode comprises an epoxy end cover, a first shielding electrode, a first epoxy connecting part, a measuring electrode, a second epoxy connecting part, a second shielding electrode and an epoxy light intensity measuring end cover which are sequentially connected, a high-voltage electrode is arranged between the first epoxy connecting part and the second epoxy connecting part, the measuring electrode is connected with the electrometer through a shielding wire, the first shielding electrode is connected with the high-pressure sealed cavity through a ground wire, and the second shielding electrode is connected with the high-pressure sealed cavity through a ground wire.
Another embodiment provided by the present application is: first shielding electrode with epoxy end cover junction is loudspeaker form opening, second shielding electrode with epoxy light intensity measurement end cover junction is loudspeaker form opening, loudspeaker form opening diameter does 3 times of measuring electrode diameter.
Another embodiment provided by the present application is: the surface roughness of the high-voltage electrode can be changed, the surface roughness of the measuring electrode can be changed, an insulating adhesive tape is arranged on the outer side of the measuring electrode, and the diameters of the first shielding electrode, the high-voltage electrode, the measuring electrode and the second shielding electrode can be adjusted.
Another embodiment provided by the present application is: the weak light measuring system comprises an observation window and a light signal acquisition component which are sequentially connected, wherein the observation window is arranged on the high-pressure sealed cavity and is right opposite to the epoxy light intensity measuring end cover.
The application also provides a measuring method adopting the conduction current measuring device, which is characterized in that: the method comprises the following steps:
step 1: after the coaxial structure electrode is assembled, the coaxial structure electrode is arranged in a high-pressure sealed cavity;
step 2: vacuumizing the high-pressure sealed cavity, and filling gas to be detected with corresponding pressure;
and step 3: applying high voltage to the coaxial structure electrode, changing the voltage amplitude, and measuring the conduction current and the optical signal under different voltage grades;
and 4, step 4: and acquiring the conductive current signal and the optical signal, and analyzing and processing the acquired signals.
3. Advantageous effects
Compared with the prior art, the conduction current measuring device and the conduction current measuring method have the advantages that:
the application of the conduction current measuring device provided by the application can better reflect the actual situation in the GIS/GIL by utilizing the coaxial structure electrode to test the conduction current and the optical signal.
The application provides a conduction current measuring device, because the production of gas conduction current is corresponding to processes such as natural ionization and collision ionization, these processes homoenergetic produce light signal, consequently this application simultaneous measurement optical signal can provide more data support for analyzing gas survey carrier source when judging conduction current test accuracy in an auxiliary way.
The application provides a conduction current measuring device, gaseous conduction current can divide into three regions along with field intensity change: the critical field intensity of the saturation region and the critical field intensity of the index region can be more accurately distinguished by using an optical measurement method. It is generally believed that the linear and saturation region currents of the gas conduction current are induced by natural ionization, while the exponential region current is induced by microdischarges formed by impact ionization. The optical signal corresponding to the natural ionization process is weak, the optical signal is obviously enhanced when micro-discharge occurs, and the critical field intensity of the micro-discharge can be definitely judged by measuring the optical signal.
The application provides a conduction current measuring device adopts the photoelectricity to unite the monitoring means, synchronous measurement coaxial structure electrode conduction current and optical signal, and the test result does not receive external disturbance influence.
According to the conduction current measuring device, the current testing precision is improved by means of arranging the shielding electrode and the like; through reasonable arrangement of the optical path, the capability of capturing weak light by the system is improved.
Drawings
FIG. 1 is a schematic view of a conduction current measurement apparatus of the present application;
fig. 2 is a schematic view of the coaxial structure electrode of the present application.
Detailed Description
Hereinafter, specific embodiments of the present application will be described in detail with reference to the accompanying drawings, and it will be apparent to those skilled in the art from this detailed description that the present application can be practiced. Features from different embodiments may be combined to yield new embodiments, or certain features may be substituted for certain embodiments to yield yet further preferred embodiments, without departing from the principles of the present application.
Relevant researches show that carriers generated by factors such as natural ionization and micro-discharge in insulating gas are important sources of surface charge accumulated by the insulator, so that the researches on the conduction current and optical signals under the coaxial structure electrode to analyze the generation and the transportation of the carriers in the insulating gas have important significance for solving the problem of surface charge accumulation faced by direct current equipment.
Referring to fig. 1-2, the present application provides a conduction current measuring device, which includes a direct current high voltage generating system, a high pressure sealed cavity 1, a current measuring system and a signal collecting system 15, which are connected in sequence, wherein the high pressure sealed cavity is connected with an air intake and exhaust system, the high pressure sealed cavity and a weak light measuring system are connected with the signal collecting system 15, and a coaxial structure electrode is arranged in the high pressure sealed cavity 1.
The direct-current high-voltage generating system provides direct-current high voltage for the coaxial structure electrode, the high-pressure sealed cavity 1 is used for measuring different gas types and different air pressures, the high-pressure sealed cavity 1 can bear the air pressure of 0.6Mpa at most, the current measuring system measures the conduction current collected by the electrode and transmits a current signal to the signal collecting system 15, and the weak light measuring system is used for measuring an optical signal; the signal acquisition system 15 is used for acquiring current signals and optical signals, and the air intake and exhaust system is used for exhausting air into the high-pressure sealed cavity 1.
The reason for inaccurate test result of conduction current is mainly partial discharge caused by poor contact or introduced metal particles and defects existing on the surface of the electrode when the electrode is installed, and the amplitude and fluctuation of optical signals can be obviously increased due to the partial discharge, so that current measurement error caused by the partial discharge can be eliminated by measuring the optical signals.
Further, the direct-current high-voltage generation system comprises a high-voltage direct-current power supply 7 and a ceramic sleeve 3 which are sequentially connected, the ceramic sleeve 3 is connected with the coaxial structure electrode through a high-voltage connecting rod 11, and the high-voltage connecting rod 11 is arranged in the high-pressure sealed cavity 1.
The high-voltage direct-current power supply 7 can provide 100kV direct-current voltage at most; the ceramic sleeve 3 is used as a high-voltage path of the coaxial structure electrode 12 in the direct-current high-voltage lead-in cavity, the surface flashover can be prevented when high voltage is led into the high-pressure sealed cavity 1, the ceramic sleeve 3 can bear 60kV of voltage at most, and a voltage-equalizing ball is arranged at the connection position of the ceramic sleeve 3 and the outlet wire of the direct-current power supply 7, so that the corona discharge can be prevented; the high voltage connection rod 11 leads the dc high voltage from the ceramic bushing 3 to the high voltage electrode 22 in the coaxial structure electrode.
Further, the current measuring system comprises an electrometer 14, and the electrometer 14 is connected with the coaxial structure electrode through a shielding wire 13. The conduction current is transmitted to the electrometer 14 through the shield wire 13 and then collected by a computer, and the signal collection system 15 here adopts a computer.
The shielding wire 13 is adopted to prevent external charges from interfering the transmission signal; the electrometer 14 is a keithley6517B electrometer, and can be used in cooperation with a current measuring system to achieve a minimum of 10-13Measurement of class a current.
Further, a vacuum pump valve 4 and an inflation valve 5 are arranged on the high-pressure sealed cavity 1, the air intake and exhaust system comprises a mechanical pump 8 and an air bottle 9, the mechanical pump 8 is connected with the vacuum pump valve 4, and the air bottle 9 is connected with the inflation valve 5.
The mechanical pump 8 is connected to the vacuum pump valve 4 through a pipe, and the gas cylinder 9 is connected to the gas charging valve 5 through a pipe.
Further, a humidity regulator is arranged between the gas cylinder 9 and the charging valve 5. The humidity regulator can change the humidity in the cavity by mixing water.
Further, the coaxial structure electrode comprises an epoxy end cap 18, a first shielding electrode 19, a first epoxy connecting part 20, a measuring electrode 21, a second epoxy connecting part, a second shielding electrode and an epoxy light intensity measuring end cap 23 which are connected in sequence, a high voltage electrode 22 is arranged between the first epoxy connecting part 20 and the second epoxy connecting part, and the high voltage electrode 22 penetrates through the first shielding electrode 19, the first epoxy connecting part 20, the measuring electrode 21, the second epoxy connecting part and the second shielding electrode; the measuring electrode 21 is connected with the electrometer 14 through the shielding wire 13, the first shielding electrode 19 is connected with the high-pressure sealed cavity 1 through the ground wire 12, and the second shielding electrode is connected with the high-pressure sealed cavity 1 through the ground wire 12.
The first shielding electrode 19 here is of the same construction as the second shielding electrode, with the first and second being added for the sake of distinction; the first epoxy connection member 20 has the same structure as the second epoxy connection member, and the first and second are added for distinction.
Furthermore, the surface roughness of the high-voltage electrode can be changed, the surface roughness of the measuring electrode can be changed, an insulating adhesive tape is arranged on the outer side of the measuring electrode, and the diameters of the first shielding electrode, the high-voltage electrode, the measuring electrode and the second shielding electrode can be adjusted.
The high-voltage electrode 22 is applied with direct-current high voltage, the two ends of the high-voltage electrode are provided with threads and can be respectively fixed to the epoxy end cover 18 and the epoxy light intensity measuring end cover 23, and the high-voltage electrode 22 with different surface roughness can be replaced to study the influence of the roughness on the conduction current and the optical signal; the first shielding electrode 19 is a hollow structure, and two ends of the first shielding electrode are respectively clamped into the first epoxy connecting part 20 and the epoxy end cover 18 and connected to the cavity through the ground wire 12 to form grounding; the second shielding electrode is of a hollow structure, two ends of the second shielding electrode are respectively clamped into the second epoxy connecting part and the epoxy light intensity measuring end cover 23 and are connected to the cavity through the ground wire 12 to form grounding, the first shielding electrode 19 can absorb leakage current, conduction current and the like generated in the epoxy end cover 18, the second shielding electrode can absorb leakage current, conduction current and the like generated in the epoxy light intensity measuring end cover 23, and the second shielding electrode is prevented from flowing into the measuring electrode 21 to cause interference on a measurement result of gas conduction current. A horn-shaped opening is formed in one side, close to the epoxy end cover 18, of the first shielding electrode 19, a horn-shaped opening is formed in one side, close to the epoxy light intensity measuring end cover 23, of the second shielding electrode, the diameter of the horn-shaped opening is three times of that of the measuring electrode 21, and therefore corona discharge and surface discharge along the connection portion of the high-voltage electrode 22, the epoxy end cover 18 and the epoxy light intensity measuring end cover 23 can be prevented; the two ends of the measuring electrode 21 are respectively clamped into the first epoxy connecting part 20 and the second epoxy connecting part and used for collecting conduction currents between the first epoxy connecting part 20 and the high-voltage electrode 22, the conduction currents are transmitted to the electrometer 14 through the shielding wire 13 and the outlet flange 6 on the high-pressure experiment cavity 1, the outer layer of the measuring electrode 21 is wrapped by an insulating adhesive tape, charges in the cavity can be prevented from being diffused to the insulating adhesive tape to influence a measuring result, and the diameters of the high-voltage electrode 22, the first shielding electrode 19 and the measuring electrode 21 can be adjusted to study influences of the distance between the high-voltage electrode 22 and the measuring electrode 21 and field intensity unevenness on the conduction currents and optical signals.
Further, the weak light measuring system comprises an observation window 2 and a light signal acquisition component which are sequentially connected, wherein the observation window 2 is arranged on the high-pressure sealed cavity 1, and the observation window 2 is over against the epoxy light intensity measuring end cover 23.
The epoxy light intensity measuring end cap 23 and the observation window 2 form an optical path, and the optical signal acquisition component can be composed of a photomultiplier tube 16 and a photon counter 17. The epoxy light intensity measuring end cap 23 is made of epoxy resin insulating material, except for a thin plate-shaped structure which is raised from the edge inwards and used for fixing the right thread of the high-voltage electrode 22, the corresponding right second shielding electrode part is of an open structure, so that an optical path for transmitting a light-emitting signal in the coaxial structure electrode to optical measuring equipment is formed; the right side of the high-pressure experimental cavity 1 is provided with an observation window 2, which is opposite to an opening of the epoxy light intensity measuring end cover 23 and is made of optical glass, so that the attenuation of light during passing can be reduced; the models of the photomultiplier tube 16 and the photon counter 17 are H8259-01 and C8855-01 of HAMAMATSU respectively, and a testing device formed by the photomultiplier tube and the photon counter can capture weak signals at the single photon level at the lowest. A monochromator can be additionally arranged in front of the photomultiplier 16, or the photomultiplier 16 and the photon counter 17 can be integrally replaced by a spectrometer to obtain the corresponding spectrum information when the optical signal is stronger. The signals measured by the current measuring system and the weak light measuring system are finally transmitted to the signal acquisition system 15 for analysis and processing.
According to the conduction current measuring device, the influence of solid side leakage current and conduction current is eliminated by arranging the shielding electrode; the influence of the external carriers of the coaxial structure electrode is eliminated by arranging the insulating adhesive tape outside the measuring electrode 21; interference between external carriers and electromagnetic signals in the transmission process is eliminated by using the shielding wire 13, and the accuracy of current testing is further improved. The proportion of transmitting the optical signal generated in the coaxial structure electrode to the observation window 2 is improved by arranging the epoxy light intensity measuring end cover 23; the attenuation of the optical signal when passing through the observation window 2 is reduced by using the optical glass; by applying the high-sensitivity photomultiplier 16, the capability of capturing weak light by optical equipment is improved; through the setting of darkroom, reduced external light and disturbed, and then promoted optical testing accuracy.
The application also provides a measuring method adopting the conduction current measuring device, which is characterized in that: the method comprises the following steps: step 1: after the coaxial structure electrode is assembled, the coaxial structure electrode is arranged in a high-pressure sealed cavity; step 2: vacuumizing the high-pressure sealed cavity, and filling gas to be detected with corresponding pressure; and step 3: applying high voltage to the coaxial structure electrode, changing the voltage amplitude, and measuring the conduction current and the optical signal under different voltage grades; and 4, step 4: and collecting the conductive current signals and the optical signals, and analyzing and processing the collected signals.
And judging the conduction current test accuracy and providing data support for analyzing the gas test carrier source.
Replacing the high-voltage electrode 22, the grounding electrode and the measuring electrode 21 with different sizes, and repeating the processes in the steps 1-3, so that the influence of different distances and the uniformity degree of an electric field can be researched; replacing the high-voltage electrode and the measuring electrode with different roughness, and repeating the processes of the steps 1-3 to study the influence of different roughness; and (3) changing the humidity of the charged gas, and repeating the process of the step 1-2, so that the influence of different humidities can be researched.
Specifically, after the epoxy connection end cap 18, the first shielding electrode 19, the second shielding electrode, the first epoxy connection part 20, the second epoxy connection part, the measurement electrode 21, the high-voltage electrode 22, the epoxy light intensity measurement end cap 23, the high-voltage connection rod 11 and the inner wall of the high-pressure experiment cavity 1 are wiped with alcohol, the coaxial structure electrode is assembled and then placed in the high-pressure experiment cavity 1, and the ground wire 12 is connected with the shielding wire 13.
After a cavity cover of the high-pressure experiment cavity 1 is closed, the air extraction valve 4 is opened, then the mechanical pump 8 is opened, the cavity is vacuumized, and then the mechanical pump 8 and the air extraction valve 4 are closed; then the gas bottle 9 is opened for gas washing, then the gas charging valve 5 is opened, the gas to be measured is charged into the cavity to an atmospheric pressure, and the gas charging valve 5 and the gas bottle 9 are closed. Repeating the steps for 2 to 3 times to remove the impurity gas in the cavity as much as possible. And finally, vacuumizing, and then filling the gas to be tested with the pressure required by the experiment.
And (3) opening the photomultiplier tube 16 and the photon counter 17 to continuously measure optical signals, opening the direct current power supply 7, applying voltage with certain amplitude to the coaxial structure electrode, and opening the electrometer 14 to measure conduction current signals after a period of time. And simultaneously, synchronously acquiring the measured conduction current and the optical signal to a computer by using a corresponding acquisition program. The conduction current and the optical signal under different field strengths can be tested by changing the amplitude of the output voltage of the direct current power supply 7.
The above procedure was repeated using the high voltage electrodes 22 of different surface roughness to study the effect of surface roughness on the conduction current and optical signal.
The above steps are repeated by using the high voltage electrode 22 and the measuring electrode 21 with different diameters, and the influence of the electrode distance and the uniformity degree of the electric field on the conduction current and the optical signal is researched.
In the process of inflation, the humidity of the gas to be measured is changed, the subsequent steps are repeated, and the influence of the humidity on the conduction current and the optical signal is researched.
Although the present application has been described above with reference to specific embodiments, those skilled in the art will recognize that many changes may be made in the configuration and details of the present application within the principles and scope of the present application. The scope of protection of the application is determined by the appended claims, and all changes that come within the meaning and range of equivalency of the technical features are intended to be embraced therein.
Claims (10)
1. A conduction current measuring device, characterized by: the high-pressure gas-tight cavity and the weak light measuring system are connected with the signal acquisition system, and a coaxial structure electrode is arranged in the high-pressure gas-tight cavity.
2. A conduction current measuring apparatus as claimed in claim 1, wherein: the direct-current high-voltage generation system comprises a high-voltage direct-current power supply and a ceramic sleeve which are sequentially connected, the ceramic sleeve is connected with the coaxial structure electrode through a high-voltage connecting rod, and the high-voltage connecting rod is arranged in the high-pressure sealed cavity.
3. A conduction current measuring apparatus as claimed in claim 1, wherein: the current measuring system comprises an electrometer, and the electrometer is connected with the coaxial structure electrode through a shielding wire.
4. A conduction current measuring apparatus as claimed in claim 1, wherein: the high-pressure sealed cavity is provided with a vacuum pump valve and an inflation valve, the air intake and exhaust system comprises a mechanical pump and an air bottle, the mechanical pump is connected with the vacuum pump valve, and the air bottle is connected with the inflation valve.
5. A conduction current measuring apparatus as claimed in claim 4, wherein: and a humidity regulator is arranged between the gas cylinder and the inflation valve.
6. A conduction current measuring apparatus as claimed in claim 3, wherein: the coaxial structure electrode comprises an epoxy end cover, a first shielding electrode, a first epoxy connecting part, a measuring electrode, a second epoxy connecting part, a second shielding electrode and an epoxy light intensity measuring end cover which are sequentially connected, a high-voltage electrode is arranged between the first epoxy connecting part and the second epoxy connecting part, the measuring electrode is connected with the electrometer through a shielding wire, the first shielding electrode is connected with the high-pressure sealed cavity through a ground wire, and the second shielding electrode is connected with the high-pressure sealed cavity through a ground wire.
7. A conduction current measuring apparatus as claimed in claim 6, wherein: first shielding electrode with epoxy end cover junction is loudspeaker form opening, second shielding electrode with epoxy light intensity measurement end cover junction is loudspeaker form opening, loudspeaker form opening diameter does 3 times of measuring electrode diameter.
8. A conduction current measuring apparatus as claimed in claim 6, wherein: the surface roughness of the high-voltage electrode can be changed, the surface roughness of the measuring electrode can be changed, an insulating adhesive tape is arranged on the outer side of the measuring electrode, and the diameters of the first shielding electrode, the high-voltage electrode, the measuring electrode and the second shielding electrode can be adjusted.
9. A conduction current measuring apparatus as claimed in claim 6, wherein: the weak light measuring system comprises an observation window and a light signal acquisition component which are sequentially connected, wherein the observation window is arranged on the high-pressure sealed cavity and is right opposite to the epoxy light intensity measuring end cover.
10. A measuring method using the conduction current measuring apparatus according to any one of claims 1 to 9, characterized in that: the method comprises the following steps:
step 1: after the coaxial structure electrode is assembled, the coaxial structure electrode is arranged in a high-pressure sealed cavity;
step 2: vacuumizing the high-pressure sealed cavity, and filling gas to be detected with corresponding pressure;
and step 3: applying high voltage to the coaxial structure electrode, changing the voltage amplitude, and measuring the conduction current and the optical signal under different voltage grades;
and 4, step 4: and acquiring the conductive current signal and the optical signal, and analyzing and processing the acquired signals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111062235.XA CN113721066B (en) | 2021-09-10 | 2021-09-10 | Conduction current measuring device and method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111062235.XA CN113721066B (en) | 2021-09-10 | 2021-09-10 | Conduction current measuring device and method |
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| CN113721066A true CN113721066A (en) | 2021-11-30 |
| CN113721066B CN113721066B (en) | 2022-12-27 |
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Citations (13)
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