CN113704037A - Equipment testing method and device, computer equipment and storage medium - Google Patents
Equipment testing method and device, computer equipment and storage medium Download PDFInfo
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- CN113704037A CN113704037A CN202111014443.2A CN202111014443A CN113704037A CN 113704037 A CN113704037 A CN 113704037A CN 202111014443 A CN202111014443 A CN 202111014443A CN 113704037 A CN113704037 A CN 113704037A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2268—Logging of test results
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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Abstract
The application relates to the field of test management, and the target test type corresponding to each target device in the target device group is determined according to the selection operation of the group option and the test type option in the test interface, so that the device can be tested in batches, and the test efficiency of the device is improved. A method, an apparatus, a computer device and a storage medium for testing a device are provided, the method comprising: when a first selection operation on group options in a preset test page is detected, determining a target equipment group to be tested; when a second selection operation of the test type options in the test page is detected, determining a target test type of each target device in the target device group; generating a test task of each target device according to the target test type, and controlling each target device to execute the test task; and acquiring the test result of each target device, and displaying the test result on the test page. In addition, the application also relates to a block chain technology, and the test result can be stored in the block chain.
Description
Technical Field
The present application relates to the field of test management, and in particular, to a device testing method and apparatus, a computer device, and a storage medium.
Background
In a test environment, a large number of devices need to be maintained, and due to business requirements or security problems, a start-up test or a shutdown test needs to be performed on a part of the devices. In an actual application scenario, a device to be tested is generally manually turned on or turned off; however, when the number of the devices to be tested is large, the devices to be tested cannot be tested in a unified manner only by manual operation, which results in low testing efficiency of the devices.
Therefore, how to improve the device testing efficiency becomes an urgent problem to be solved.
Disclosure of Invention
The application provides a device testing method, a device, computer equipment and a storage medium, and the target testing type corresponding to each target device in a target device group is determined according to the selection operation of a group option and a testing type option in a testing page, so that the device can be tested in batches, and the testing efficiency of the device is improved.
In a first aspect, the present application provides a device testing method, including:
when a first selection operation of group options in a preset test page is detected, determining a target equipment group to be tested according to the first selection operation;
when second selection operation of the test type options in the test page is detected, determining a target test type corresponding to each target device in the target device group according to the second selection operation;
generating a test task corresponding to each target device according to the target test type, and controlling each target device to execute the test task;
and acquiring a test result corresponding to each target device, and displaying the test result on the test page.
In a second aspect, the present application also provides an apparatus for testing devices, the apparatus comprising:
the device group determination module is used for determining a target device group to be tested according to a first selected operation when the first selected operation on the group option in a preset test page is detected;
the test type determining module is used for determining a target test type corresponding to each target device in the target device group according to a second selected operation when the second selected operation of the test type option in the test page is detected;
the test task execution module is used for generating a test task corresponding to each target device according to the target test type and controlling each target device to execute the test task;
and the test result display module is used for acquiring the test result corresponding to each target device and displaying the test result on the test page.
In a third aspect, the present application further provides a computer device comprising a memory and a processor;
the memory for storing a computer program;
the processor is configured to execute the computer program and to implement the device testing method as described above when executing the computer program.
In a fourth aspect, the present application also provides a computer-readable storage medium storing a computer program which, when executed by a processor, causes the processor to implement the device testing method as described above.
The application discloses a device testing method, a device, computer equipment and a storage medium, wherein when a first selection operation of a group option in a preset testing page is detected, a target device group to be tested is determined according to the first selection operation, and then a plurality of devices in the target device group can be conveniently and uniformly tested; when a second selection operation of the test type options in the test page is detected, determining a target test type corresponding to each target device in the target device group according to the second selection operation, and flexibly setting the target test type of each target device; the test task corresponding to each target device is generated according to the target test type, and each target device is controlled to execute the test task, so that the device can be tested in batches, and the test efficiency of the device is improved; by acquiring the test result corresponding to each target device and displaying the test result on the test page, the user can check the test result of each target device more intuitively, and the user can conveniently position and investigate the device with abnormal test.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic flow chart diagram of a device testing method provided by an embodiment of the present application;
FIG. 2 is a schematic diagram of a test page provided in an embodiment of the present application;
FIG. 3 is a schematic diagram of another test page provided by an embodiment of the present application;
FIG. 4 is a schematic diagram of determining a target device group to be tested according to an embodiment of the present application;
FIG. 5 is a schematic diagram of determining a target test type according to an embodiment of the present disclosure;
FIG. 6 is a schematic diagram of another method for determining a target test type provided by an embodiment of the present application;
FIG. 7 is a schematic flow chart diagram of a sub-step of setting a test task start time point according to an embodiment of the present application;
FIG. 8 is a schematic block diagram of an apparatus testing device provided in an embodiment of the present application;
fig. 9 is a schematic block diagram of a structure of a computer device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The flow diagrams depicted in the figures are merely illustrative and do not necessarily include all of the elements and operations/steps, nor do they necessarily have to be performed in the order depicted. For example, some operations/steps may be decomposed, combined or partially combined, so that the actual execution sequence may be changed according to the actual situation.
It is to be understood that the terminology used in the description of the present application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the specification of the present application and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
The embodiment of the application provides a device testing method and device, computer equipment and a storage medium. The device testing method can be applied to a management server, and the target testing type corresponding to each target device in the target device group is determined according to the selection operation of the group option and the testing type option in the testing page, so that the device can be tested in batches, and the testing efficiency of the device is improved.
The management server is a server for collectively managing or controlling the test of the devices. Illustratively, the device under test may include a generic server and a terminal.
The management server and the common server may be independent servers, or may be cloud servers providing basic cloud computing services such as cloud services, a cloud database, cloud computing, a cloud function, cloud storage, Network services, cloud communication, middleware services, domain name services, security services, a Content Delivery Network (CDN), a big data and artificial intelligence platform, and the like. The terminal can be an electronic device such as a smart phone, a tablet computer, a notebook computer, a desktop computer and the like.
Some embodiments of the present application will be described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.
As shown in fig. 1, the device testing method includes steps S10 through S40.
Step S10, when a first selection operation of the group option in the preset test page is detected, determining a target device group to be tested according to the first selection operation.
It should be noted that the preset test page refers to a page on the management server. In the embodiment of the application, a user can design a test page for uniformly managing or controlling the equipment on the management server.
For example, the test page may include group category options corresponding to a plurality of device groups and a test type option corresponding to each device in each device group. The test type options may include a power-off test option and a power-on test option.
In some embodiments, the device testing method provided in the embodiments of the present application may further include: grouping the devices according to multiple test environment types corresponding to the device clusters to obtain multiple device groups; the target device group is at least one device group in a plurality of device groups.
It should be noted that the device cluster is a cluster composed of a plurality of devices. In the test environment, each device has a corresponding test environment type, so that the device cluster has multiple test environment types.
It is understood that the Testing environment (Testing environment) refers to a general term for computer hardware, software, network devices, and historical data necessary to complete software Testing work. In the embodiment of the application, the test environment types can be divided according to actual situations. For example, the stg1 test environment, the stg2 test environment, and the stg3 test environment.
In some embodiments, after grouping the devices according to the multiple test environment types corresponding to the device cluster to obtain multiple device groups, the method may further include: and displaying a group option corresponding to each equipment group on the test page, and displaying a test type option corresponding to each equipment in each equipment group.
For example, a uniform test type option may be set for all devices in each device group, or a corresponding test type option may be set for each device in each device group.
In the embodiment of the application, the user can test the equipment according to the service requirement or the safety requirement. For example, a group option corresponding to a target device group to be tested is selected in the test page, and a test type option corresponding to each device in the target device group is selected. The user may test some devices in the target device group, or may test all devices in the target device group. The test types corresponding to each device in the target device group may be the same or different.
Referring to fig. 2, fig. 2 is a schematic view of a test page according to an embodiment of the present disclosure. As shown in fig. 2, device group a corresponds to group option a, device group B corresponds to group option B, device group C corresponds to group option C, and device group D corresponds to group option D. The test type options include a power-off test option and a power-on test option. The test type options act on all the devices in the device group, so that the shutdown test or the startup test can be uniformly performed on all the devices in the device group.
Referring to fig. 3, fig. 3 is a schematic view of another test page provided in the embodiment of the present application. As shown in fig. 3, each device in the device group has a separate test type option, so that a shutdown test or a startup test can be performed on a certain device in the device group in a targeted manner.
In some embodiments, when a first selection operation of a group option in a preset test page is detected, a target device group to be tested is determined according to the first selection operation.
Referring to fig. 4, fig. 4 is a schematic diagram illustrating a method for determining a target device group to be tested according to an embodiment of the present application. As shown in fig. 4, if the group option a is selected, it may be determined that the device group a is the target device group, and the device 1, the device 2, the device 3, and the device 4 in the device group a are all target devices.
Illustratively, the target device group may also include multiple device groups. For example, after selecting device group a, the user may also select device group B, so that the target device group may include device group a and device group B.
When the first selection operation of the group option in the preset test page is detected, the target equipment group to be tested is determined according to the first selection operation, and then a plurality of pieces of equipment in the target equipment group can be tested conveniently and uniformly.
Step S20, when a second selection operation for the test type option in the test page is detected, determining a target test type corresponding to each target device in the target device group according to the second selection operation.
It should be noted that, the user selects a group option corresponding to the target device group to be tested in the test page, and also needs to select a test type option corresponding to each device in the target device group.
For example, when detecting a second selection operation on the test type option in the test page, the management server may determine, according to the second selection operation, a target test type corresponding to each target device in the target device group.
Referring to fig. 5, fig. 5 is a schematic diagram illustrating a method for determining a target test type according to an embodiment of the present disclosure. As shown in fig. 5, after the user selects the device group a as the target device group, if the user further selects the shutdown test option, it may be determined that the target test type corresponding to each target device group in the device group a is the shutdown test.
Referring to fig. 6, fig. 6 is a schematic diagram of another method for determining a target test type according to an embodiment of the present application. As shown in fig. 6, after the user selects the device group a as the target device group, the user may also select a test type option corresponding to each target device in the device group a; the target test types corresponding to each target device may be the same or different. For example, the target test type corresponding to the device 1 is a shutdown test, the target test type corresponding to the device 2 is a shutdown test, the target test type corresponding to the device 3 is a startup test, and the target test type corresponding to the device 4 is a startup test.
When a second selection operation of the test type options in the test page is detected, the target test type corresponding to each target device in the target device group is determined according to the second selection operation, and the target test type of each target device is flexibly set.
And step S30, generating a test task corresponding to each target device according to the target test type, and controlling each target device to execute the test task.
In some embodiments, if the target test type is a shutdown test, a shutdown test task is generated. It should be noted that the shutdown test is to control the target device to perform a shutdown operation, and detect whether a shutdown abnormality occurs in the target device.
In other embodiments, if the target test type is a boot test, a boot test task is generated. It should be noted that the boot test is to control the target device to execute a boot operation and detect whether the target device is abnormal in boot.
For example, after the test task corresponding to each target device is generated according to the target test type, each target device may be controlled to execute the test task. In the embodiment of the present application, how to control each target device to perform a test task will be described in detail.
In some embodiments, before controlling each target device to perform the test task, the method may further include: and setting a test task starting time point of each target device.
It should be noted that the test task starting time point refers to a time for triggering the target device to execute the test task.
By setting the test task starting time point of each target device, each target device can execute the test task when the test task starting time point is reached, and the target device is tested at regular time.
Referring to fig. 7, fig. 7 is a schematic flowchart of a sub-step of setting a test task starting time point according to an embodiment of the present application, which may specifically include the following steps S301 to S303.
Step S301, according to the identification number corresponding to each target device, obtaining address information and login permission information corresponding to each target device from a preset device information list, where the device information list includes association relationships between the identification number corresponding to the device and the address information, and the login permission information.
In the embodiment of the present application, when a test task start time point of each target device is set, a communication connection needs to be established with each target device, and each target device is logged in.
In some embodiments, the identification number corresponding to each target device may be obtained, and the address information and the login authority information corresponding to each target device may be obtained from a preset device information list according to the identification number corresponding to each target device.
The identification number may be a device number, a device name, or the like, which can identify the uniqueness of the device. The address information may be an IP address of the device for locating the device and for the communication connection. The login authority information may include a login account and a login password of the device, for logging in the device.
Illustratively, the preset device information list includes an association relationship between an identification number corresponding to the device and the address information and the login authority information. In the embodiment of the application, the identification number, the address information and the login authority information corresponding to each device can be obtained in advance; and then, associating the identification number corresponding to each device with the address information and the login authority information, and adding the identification number to a preset data table to obtain a device information list.
Step S302, establishing communication connection with each target device according to the address information corresponding to each target device, and executing login operation on each target device after communication connection is established according to the login authority information corresponding to each target device.
Illustratively, a communication connection may be established with each target device according to the IP address corresponding to each target device. Thus, the management server can be caused to perform data transmission with each target device. The specific process of establishing the communication connection is not limited herein.
For example, after the communication connection is established with each target device, a login operation may be performed on each target device after the communication connection is established according to the login authority information corresponding to each target device. For example, each target device is logged in according to the login account and the login password of each target device.
And logging in each target device according to the address information and the login authority information corresponding to each target device, so that the test task time point of each target device can be set from a background.
Step S303, after logging in each target device, setting a test task start time point of each target device.
In some embodiments, after logging in each target device, setting a test task start time point of each target device may include: when the test task is a shutdown test task, detecting whether a target device has a to-be-processed event; if the target equipment has the event to be processed, determining the total processing time length corresponding to the event to be processed; and determining the starting time point of the test task according to the current time and the total processing time.
For example, when the total processing time corresponding to the events to be processed is determined, the total processing time may be determined according to the number of the events to be processed and the processing time of each event to be processed.
For example, the test task starting time point may be determined according to the current time and the total processing time. For example, if the current time is T1 and the total processing time is T2, the test task start time point T3 may be equal to T1+ T2 or greater than T1+ T2. The test task starting time point T3 may be set according to actual conditions, and specific values are not limited herein.
In other embodiments, after logging in each target device, setting a test task start time point of each target device may include: and when the test task is a starting test task, determining a starting time point of the test task according to the current time.
For example, if the current time is T4, the test task start time point T5 may be greater than the current time T4; the test task starting time point T5 may be set according to actual conditions, and specific values are not limited herein.
In some embodiments, controlling each target device to perform a test task may include: and sending the test task to each target device so that each target device executes the test task when the starting time point of the test task is reached.
For example, the shutdown test task may include a shutdown test instruction, where the shutdown test instruction may be denoted shutdown. The power-on test task may include a power-on test command, wherein the power-on test command may be denoted as turn on.
For example, if the test task is a shutdown test task, the shutdown test instruction may be sent to each target device, so that each target device executes the shutdown test instruction when the test task starting time point is reached.
For example, if the test task is a boot test task, the boot test instruction may be sent to each target device, so that each target device executes the boot test instruction when the test task is started.
By generating the test task corresponding to each target device according to the target test type and controlling each target device to execute the test task, the device can be tested in batches, and the test efficiency of the device is improved.
And step S40, obtaining a test result corresponding to each target device, and displaying the test result on the test page.
For example, the log information of each target device may be obtained, and the test result corresponding to each target device may be determined according to the log information. The test result may include a shutdown success, a shutdown failure, a startup success, and a startup failure.
For example, the test result corresponding to each target device may be rendered to a test page, so as to display the test result on the test page. By acquiring the test result corresponding to each target device and displaying the test result on the test page, the user can more intuitively check the test result of each target device.
To further ensure privacy and security of the test results, the test results may be stored in nodes of a blockchain.
In some embodiments, after obtaining the test result corresponding to each target device, the method may further include: determining test abnormal equipment in the target equipment group and an abnormal type corresponding to the test abnormal equipment according to the test result; and outputting corresponding abnormal prompt information according to the abnormal test equipment and the abnormal type.
It should be noted that the abnormal test device refers to a device that fails to be powered off or powered on. The abnormal type refers to the reason of the shutdown failure or the startup failure of the device. Because the equipment is the equipment which needs to be maintained in the test environment, in order to avoid influencing the normal use of the test environment, the corresponding abnormal prompt information needs to be output according to the abnormal test equipment and the abnormal type, so that a user can conveniently perform abnormal positioning and troubleshooting according to the abnormal prompt information.
For example, corresponding exception prompt information may be displayed on the test page. For example, an exception flag is added to the test exception device.
Illustratively, the abnormal prompt information can be output by means of short messages, mails and the like. For example, the identification number and the abnormal type of the abnormal test device are sent to the terminal of the user through short messages, mails and the like.
By outputting the corresponding abnormal prompt information according to the abnormal test equipment and the abnormal type, the user can perform abnormal positioning and troubleshooting according to the abnormal prompt information, the troubleshooting time of the user is shortened, and the influence of the abnormal test equipment on the normal use of the test environment can be further avoided.
According to the device testing method provided by the embodiment, when the first selection operation on the group option in the preset testing page is detected, the target device group to be tested is determined according to the first selection operation, and then a plurality of devices in the target device group can be conveniently and uniformly tested; when a second selection operation of the test type options in the test page is detected, determining a target test type corresponding to each target device in the target device group according to the second selection operation, and flexibly setting the target test type of each target device; by setting the starting time point of the test task of each target device, each target device can execute the test task when the starting time point of the test task is reached, so that the target device can be tested at regular time; each target device is logged in according to the address information and the login authority information corresponding to each target device, so that the test task time point of each target device can be set from a background; the test task corresponding to each target device is generated according to the target test type, and each target device is controlled to execute the test task, so that the device can be tested in batches, and the test efficiency of the device is improved; by outputting the corresponding abnormal prompt information according to the abnormal test equipment and the abnormal type, the user can perform abnormal positioning and troubleshooting according to the abnormal prompt information, the troubleshooting time of the user is shortened, and the influence of the abnormal test equipment on the normal use of the test environment can be further avoided.
Referring to fig. 8, fig. 8 is a schematic block diagram of a device testing apparatus 1000 for performing the device testing method according to an embodiment of the present application. Wherein, the device testing apparatus can be configured in the management server.
As shown in fig. 8, the device testing apparatus 1000 includes: a device group determination module 1001, a test type determination module 1002, a test task execution module 1003, and a test result display module 1004.
The device group determining module 1001 is configured to determine, when a first selection operation on a group option in a preset test page is detected, a target device group to be tested according to the first selection operation.
The test type determining module 1002 is configured to determine, when a second selection operation on the test type option in the test page is detected, a target test type corresponding to each target device in the target device group according to the second selection operation.
A test task execution module 1003, configured to generate a test task corresponding to each target device according to the target test type, and control each target device to execute the test task.
The test result display module 1004 is configured to obtain a test result corresponding to each target device, and display the test result on the test page.
It should be noted that, as will be clear to those skilled in the art, for convenience and brevity of description, the specific working processes of the apparatus and the modules described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
The apparatus described above may be implemented in the form of a computer program which is executable on a computer device as shown in fig. 9.
Referring to fig. 9, fig. 9 is a schematic block diagram of a computer device according to an embodiment of the present disclosure.
Referring to fig. 9, the computer device includes a processor and a memory connected by a system bus, wherein the memory may include a nonvolatile storage medium and an internal memory.
The processor is used for providing calculation and control capability and supporting the operation of the whole computer equipment.
The internal memory provides an environment for the execution of a computer program on a non-volatile storage medium, which when executed by the processor, causes the processor to perform any of the device testing methods.
It should be understood that the Processor may be a Central Processing Unit (CPU), and the Processor may be other general purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components, etc. Wherein a general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
Wherein, in one embodiment, the processor is configured to execute a computer program stored in the memory to implement the steps of:
when a first selection operation of group options in a preset test page is detected, determining a target equipment group to be tested according to the first selection operation; when second selection operation of the test type options in the test page is detected, determining a target test type corresponding to each target device in the target device group according to the second selection operation; generating a test task corresponding to each target device according to the target test type, and controlling each target device to execute the test task; and acquiring a test result corresponding to each target device, and displaying the test result on the test page.
In one embodiment, the processor is further configured to implement:
and grouping the devices according to a plurality of test environment types corresponding to the device cluster to obtain a plurality of device groups, wherein the target device group is at least one device group in the plurality of device groups.
In an embodiment, when the processor implements generating a test task corresponding to each target device according to the target test type, the processor is configured to implement:
if the target test type is a shutdown test, generating a shutdown test task; and if the target test type is a starting test, generating a starting test task.
In one embodiment, before the implementation of controlling each of the target devices to execute the test task, the processor is further configured to implement:
and setting a test task starting time point of each target device.
In one embodiment, the processor, when being configured to control each of the target devices to execute the test task, is configured to:
and sending the test task to each target device so that each target device executes the test task when the starting time point of the test task is reached.
In one embodiment, the processor, when implementing setting of the test task start time point of each target device, is configured to implement:
acquiring address information and login authority information corresponding to each target device from a preset device information list according to the identification number corresponding to each target device, wherein the device information list comprises association relations between the identification number corresponding to the device and the address information and between the identification number corresponding to the device and the login authority information; establishing communication connection with each target device according to the address information corresponding to each target device, and executing login operation on each target device after communication connection is established according to the login authority information corresponding to each target device; and after logging in each target device, setting the starting time point of the test task of each target device.
In one embodiment, the processor is configured to, when setting the test task start time point of each target device after logging in each target device, implement:
when the test task is a shutdown test task, detecting whether the target equipment has a to-be-processed event; if the target equipment has the event to be processed, determining the total processing time length corresponding to the event to be processed; and determining the starting time point of the test task according to the current time and the total processing time.
In one embodiment, after the obtaining of the test result corresponding to each target device is implemented, the processor is further configured to implement:
determining test abnormal equipment in the target equipment group and an abnormal type corresponding to the test abnormal equipment according to the test result; and outputting corresponding abnormal prompt information according to the abnormal test equipment and the abnormal type.
The embodiment of the application further provides a computer-readable storage medium, wherein a computer program is stored in the computer-readable storage medium, the computer program comprises program instructions, and the processor executes the program instructions to implement any one of the device testing methods provided by the embodiment of the application.
For example, the program is loaded by a processor and may perform the following steps:
when a first selection operation of group options in a preset test page is detected, determining a target equipment group to be tested according to the first selection operation; when second selection operation of the test type options in the test page is detected, determining a target test type corresponding to each target device in the target device group according to the second selection operation; generating a test task corresponding to each target device according to the target test type, and controlling each target device to execute the test task; and acquiring a test result corresponding to each target device, and displaying the test result on the test page.
The computer-readable storage medium may be an internal storage unit of the computer device described in the foregoing embodiment, for example, a hard disk or a memory of the computer device. The computer readable storage medium may also be an external storage device of the computer device, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital Card (SD Card), a Flash memory Card (Flash Card), and the like provided on the computer device.
Further, the computer-readable storage medium may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function, and the like; the storage data area may store data created according to the use of the blockchain node, and the like.
The block chain referred by the application is a novel application mode of computer technologies such as distributed data storage, point-to-point transmission, a consensus mechanism, an encryption algorithm and the like. A block chain (Blockchain), which is essentially a decentralized database, is a series of data blocks associated by using a cryptographic method, and each data block contains information of a batch of network transactions, so as to verify the validity (anti-counterfeiting) of the information and generate a next block. The blockchain may include a blockchain underlying platform, a platform product service layer, an application service layer, and the like.
While the invention has been described with reference to specific embodiments, the scope of the invention is not limited thereto, and those skilled in the art can easily conceive various equivalent modifications or substitutions within the technical scope of the invention. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A method for testing a device, comprising:
when a first selection operation of group options in a preset test page is detected, determining a target equipment group to be tested according to the first selection operation;
when second selection operation of the test type options in the test page is detected, determining a target test type corresponding to each target device in the target device group according to the second selection operation;
generating a test task corresponding to each target device according to the target test type, and controlling each target device to execute the test task;
and acquiring a test result corresponding to each target device, and displaying the test result on the test page.
2. The device testing method of claim 1, further comprising:
and grouping the devices according to a plurality of test environment types corresponding to the device cluster to obtain a plurality of device groups, wherein the target device group is at least one device group in the plurality of device groups.
3. The device testing method according to claim 1, wherein the generating a test task corresponding to each of the target devices according to the target test type includes:
if the target test type is a shutdown test, generating a shutdown test task;
and if the target test type is a starting test, generating a starting test task.
4. The device testing method according to claim 1, wherein before said controlling each of said target devices to perform said test task, further comprising:
setting a test task starting time point of each target device;
the controlling each target device to execute the test task comprises:
and sending the test task to each target device so that each target device executes the test task when the starting time point of the test task is reached.
5. The device testing method according to claim 4, wherein the setting of the test task start time point of each target device comprises:
acquiring address information and login authority information corresponding to each target device from a preset device information list according to the identification number corresponding to each target device, wherein the device information list comprises association relations between the identification number corresponding to the device and the address information and between the identification number corresponding to the device and the login authority information;
establishing communication connection with each target device according to the address information corresponding to each target device, and executing login operation on each target device after communication connection is established according to the login authority information corresponding to each target device;
and after logging in each target device, setting the starting time point of the test task of each target device.
6. The device testing method according to claim 5, wherein the setting of the test task start time point of each of the target devices after logging in each of the target devices comprises:
when the test task is a shutdown test task, detecting whether the target equipment has a to-be-processed event;
if the target equipment has the event to be processed, determining the total processing time length corresponding to the event to be processed;
and determining the starting time point of the test task according to the current time and the total processing time.
7. The device testing method according to any one of claims 1 to 6, wherein after obtaining the test result corresponding to each of the target devices, the method further comprises:
determining test abnormal equipment in the target equipment group and an abnormal type corresponding to the test abnormal equipment according to the test result;
and outputting corresponding abnormal prompt information according to the abnormal test equipment and the abnormal type.
8. An apparatus testing device, comprising:
the device group determination module is used for determining a target device group to be tested according to a first selected operation when the first selected operation on the group option in a preset test page is detected;
the test type determining module is used for determining a target test type corresponding to each target device in the target device group according to a second selected operation when the second selected operation of the test type option in the test page is detected;
the test task execution module is used for generating a test task corresponding to each target device according to the target test type and controlling each target device to execute the test task;
and the test result display module is used for acquiring the test result corresponding to each target device and displaying the test result on the test page.
9. A computer device, wherein the computer device comprises a memory and a processor;
the memory for storing a computer program;
the processor for executing the computer program and implementing the device testing method of any one of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program which, when executed by a processor, causes the processor to implement the device testing method according to any one of claims 1 to 7.
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