CN113654509B - Detection layout control method and device for measuring wheel-rail contact attitude, and medium - Google Patents
Detection layout control method and device for measuring wheel-rail contact attitude, and medium Download PDFInfo
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Abstract
The invention provides a detection layout control method, a device and a medium for measuring wheel rail contact attitude, wherein the method comprises the following steps: step one, determining a layout space which can be covered by wheel-rail contact attitude measurement; determining pose parameters of the structured light projector and the camera required by the layout space according to the candidate binocular vision model pool; in the second step, the candidate binocular vision model pool is established according to the following steps: step S10: determining a correlation factor in a layout space which can be covered by measurement, and performing discretization processing on the correlation factor; step S20: establishing a candidate binocular vision model according to the physical parameters of the structured light projector and the camera; step S30: and establishing a candidate binocular vision model pool in the feasible region of the layout space based on the candidate binocular vision model. The method based on the invention can realize high-precision measurement of the wheel rail contact attitude by using a minimum number of binocular camera systems.
Description
Technical Field
The invention relates to the technical field of network layout of a visual sensor, in particular to a detection layout control method and device for measuring wheel-rail contact attitude, a control device and a computer readable storage medium.
Background
The construction scale and the construction level of the railway in China all belong to leading positions in the world, wherein the operation mileage of the high-speed railway reaches 3.79 kilometers, and the mileage is the first place in the world. With the continuous operation of the train, the wheels of the train and the running rails of the train are inevitably worn, which affects the driving safety of the high-speed railway to some extent. The available solutions are: a binocular vision system consisting of a structured light projector and a camera is used for carrying out real-time monitoring on the whole surface range of a wheel (wheel) rail contact area, so that the conditions of impact, stress, abrasion and the like of a wheel rail are researched and determined in a mode of dynamically acquiring the wheel rail contact posture.
However, in the process of detecting the whole surface of the wheel rail contact area by using the binocular vision system, the following problems exist: the measurement accuracy of the binocular vision system is influenced by the constraints of objectivity such as wheel track shielding, complex structure of a target observation area, limited deployment position of the binocular vision system and the like.
Accordingly, there is a need in the art for a new solution to the above problems.
Disclosure of Invention
Technical problem
The present invention aims to solve at least partially or to some extent the aforementioned technical problems, namely: the technical problem that the measurement accuracy of the binocular vision system is influenced due to the fact that the measurement accuracy is limited by objective constraints such as wheel track shielding, complex structure of a target observation area, limited deployment position of the binocular vision system (limited by a bogie structure) and the like is solved at least partially or to a certain extent.
Means for solving the problems
In view of this, the present invention provides a detection layout control method for wheel-rail contact attitude measurement using detection components including a structured light projector and a camera, the layout control method including the steps of:
step one, determining a layout space which can be covered by wheel-rail contact attitude measurement;
determining pose parameters of the structured light projector and the camera required by the layout space according to the candidate binocular vision model pool;
in the second step, the candidate binocular vision model pool is established according to the following steps:
step S10: determining a correlation factor in a layout space which can be covered by measurement, and performing discretization processing on the correlation factor;
wherein the correlation factors include a size of the layout space, objects included in the layout space, environmental constraints related to the layout space, and a target measurement space having a wheel-rail contact attitude in the layout space;
step S20: establishing a candidate binocular vision model according to the physical parameters of the structured light projector and the camera;
step S30: and establishing a candidate binocular vision model pool in the feasible region of the layout space based on the candidate binocular vision model.
With regard to the above-mentioned detection layout control method, in one possible implementation, the step S10 includes:
discretizing a local space with the size of m x n x k by using a sampling frequency f, wherein the size of the discretized layout space is represented as S x ×S y ×S z ,
Wherein m, n and k are the dimensions of the layout space along the direction of the X, Y, Z axis in the three-dimensional coordinate system where the layout space is located; sampling frequency means that a sampling point is taken every other dimension f in the layout space, and the points in the local space are sampled along the X, Y, Z axis based on the sampling frequency, S x 、S y 、S z Respectively, the number of points of the sampling points in the X, Y, Z-axis direction, (x, y, z) represents any point in the layout space,
based on this, the discretization processing of the object contained in the layout space, the environmental constraint related to the layout space, and the target measurement space having the wheel-rail contact attitude in the layout space includes:
1): discretizing the object contained in the layout space by using the sampling frequency f, wherein the discretization is represented as S x ×S y ×S z 0-1 matrix of size env ,
Wherein, if an object occupies a space at any point (x, y, z) in the layout space,matrix is then env (x, y, z) is 1, otherwise it is 0;
2): defining the layout-space-dependent environmental constraint, denoted as S, using the sampling frequency f x ×S y ×S z 0-1 matrix of size forbidden ,
Wherein a matrix if any point (x, y, z) in the layout space prohibits placement of the camera and/or the structured light projector forbidden (x, y, z) is 1, otherwise it is 0;
3): defining a target measurement space with a wheel-rail contact attitude in the layout space by using the sampling frequency f, and representing the target measurement space as S x ×S y ×S z 0-1 matrix of size target ,
Wherein if the target measurement space includes any point (x, y, z) in the layout space, the matrix target (x, y, z) is 1, and vice versa is 0.
With regard to the above-described detection layout control method, in one possible embodiment, the physical parameters include a front field depth, a rear field depth, a horizontal field angle, and a vertical field angle.
With regard to the above-mentioned detection layout control method, in one possible implementation, the step S20 includes:
discretizing the front field depth, the rear field depth, the horizontal field angle and the vertical field angle of the structured light projector and the camera according to the sampling frequency f, and respectively representing results as near dist ,far dist ,FoV 1 ,FoV 2 ;
Treating the structured light projector and the camera as a particle having a position in the layout space of (x) 0 ,y 0 ,z 0 ) The optical axis of the particles are oriented at angles to the x-axis and y-axis, respectivelyThe field of view that the particle can cover is denoted as S x ×S y ×S z Size and breadth0-1 matrix of single ,
Wherein matrix if the field of view of the structured light projector or the camera can cover to a point (x, y, z) in the layout space single (x, y, z) is 1, otherwise it is 0;
based on the near dist ,far dist ,FoV 1 ,FoV 2 And the matrix single And establishing a binocular vision model of the particles.
With regard to the above-mentioned detection layout control method, in one possible implementation, the step S30 includes:
step S301: the position of the structured light projector and the camera in the layout space is (x) 1 ,y 1 ,z 1 ) And (x) 2 ,y 2 ,z 2 ),
The directions of the optical axes of the structured light projector and the camera form angles with the x-axis and the y-axis, respectivelyAnd
the fields of view that the structured light projector and the camera can cover are respectively denoted as S x ×S y ×S z 0-1 matrix of size single Wherein matrix if the field of view of the structured light projector or the camera can cover to a point (x, y, z) in the layout space single (x, y, z) is 1, otherwise it is 0;
the structured light projector is shown as one position being (x) 1 ,y 1 ,z 1 ) The direction of the optical axis is an angleMatrix of s1 The camera is represented as a position of (x) 2 ,y 2 ,z 2 ) The direction of the optical axis is an angleMatrix of s2 Binocular vision system consisting of structured light projector and camera, through matrix double It is shown that,
wherein, matrix double =matrix s1 &matrix s2 ;
Step S302: the point that can put the binocular vision system in the layout space passes matrix feasible The representation of the matrix is carried out,
matrix feasible =~(matrix forbidden &matrix env )
wherein, the matrix forbidden The point in which the binocular vision system is forbidden to be placed is contained in a matrix env The points which are determined by environmental constraints and should not put the binocular vision system are included;
step S303: using a structured light projector and camera as a particle in matrix feasible At every feasible point, the included angle between the mass point and the x-axis and the y-axis is respectively generatedThe candidate binocular vision model of (a) is,
whereinThe candidate binocular vision model comprises potential and possible particle layout modes of the particles, wherein the values are between 0 degrees and 360 degrees;
assuming that N candidate binocular vision models are generated in total, all the candidate binocular vision models form a candidate binocular vision model pool expressed as NxS x ×S y ×S z 0-1 matrix a.
With regard to the above-described detection layout control method, in one possible embodiment, the prohibiting the placement of the points of the binocular vision system in the layout space includes: points of binocular vision systems are prohibited due to train bogie structural limitations.
For the above method for controlling layout detection, in a possible implementation, the determining pose parameters of the structured light projector and the camera required by the layout space according to the candidate binocular vision model pool includes:
according to the candidate binocular vision model pool A and the target measurement space matrix target Using a binary integer linear optimization solution, the objective function:
s.t.Ax>=matrix target ,x i ∈{0,1}
thereby determining the pose parameters of the structured light projector and the camera required by the object measurement space,
where, i ═ 1, 2., N, i denotes the ith binocular vision model candidate, N denotes the number of binocular vision models candidate, and variable x denotes i Indicates whether the ith candidate binocular vision model is selected, specifically, if x i 1, indicating that the ith candidate binocular vision model is selected, and otherwise, indicating that the ith candidate binocular vision model is not selected; ax is the linear combination of the coverage matrices of all possible binocular vision models consisting of structured light projectors and cameras.
Technical effects
It can be seen that on the premise that the wheel rail contact area is clarified, a plurality of candidate binocular vision models are selected from the N candidate binocular vision models through one-time optimization solution based on the detection layout control method for measuring the wheel rail contact attitude provided by the invention to serve as actual binocular vision models. Since the pose parameter of each selected candidate binocular vision model has been determined, the binocular camera system pose parameters that can cover the target wheel-rail contact area with the least number of binocular camera systems can be calculated by simply inputting the wheel-rail model corresponding to the wheel-rail contact area, the structured light projector corresponding to the binocular vision system, and the parameters of the camera, and designating the area where the binocular camera system is prohibited from being placed.
A second aspect of the present invention provides a computer-readable storage medium adapted to store a plurality of program codes, the program codes adapted to be loaded and executed by a processor to perform the method of detecting a layout of a wheel-rail contact attitude measurement according to any one of the preceding claims.
It is understood that the computer-readable storage medium has all the technical effects of any one of the foregoing wheel-rail contact attitude measurement detection layout control methods, and the details are not repeated herein.
It will be understood by those skilled in the art that all or part of the processes of the detection layout control method for implementing the wheel-rail contact attitude measurement according to the present invention can be implemented by instructing relevant hardware through a computer program, which can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned method embodiments when being executed by a processor. Wherein the computer program comprises computer program code, it is understood that the program code comprises, but is not limited to, program code for performing the above-described method of detecting layout control for wheel-rail contact attitude measurement. For convenience of explanation, only portions related to the present invention are shown. The computer program code may be in source code form, object code form, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying said computer program code, media, usb disk, removable hard disk, magnetic diskette, optical disk, computer memory, read-only memory, random access memory, electrical carrier wave signals, telecommunication signals, software distribution media, etc. It should be noted that the computer readable medium may contain content that is subject to appropriate increase or decrease as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media does not include electrical carrier signals and telecommunications signals as is required by legislation and patent practice.
A third aspect of the present invention provides a control apparatus comprising a memory and a processor, the memory being adapted to store a plurality of program codes, the program codes being adapted to be loaded and run by the processor to perform the method of detecting a layout of a wheel-rail contact attitude measurement according to any one of the preceding claims.
It can be understood that the control device has all the technical effects of any one of the above-mentioned wheel-rail contact attitude measurement detection layout control methods, and details are not repeated herein. The control device may be a control device apparatus formed including various electronic apparatuses.
A fourth aspect of the present invention provides a wheel-rail contact attitude measurement detection layout control apparatus including a control module configured to execute the wheel-rail contact attitude measurement detection layout control method of any one of the foregoing.
It can be understood that the control device has all the technical effects of the detection layout control method for measuring the wheel-rail contact attitude described in any one of the foregoing, and details are not repeated here.
In the description of the invention, a "control module" may comprise hardware, software, or a combination of both. A module may comprise hardware circuitry, various suitable sensors, communication ports, memory, may comprise software components such as program code, and may be a combination of software and hardware. The processor may be a central processing unit, microprocessor, image processor, digital signal processor, or any other suitable processor. The processor has data and/or signal processing functionality. The processor may be implemented in software, hardware, or a combination thereof. Non-transitory computer readable storage media include any suitable medium that can store program code, such as magnetic disks, hard disks, optical disks, flash memory, read-only memory, random-access memory, and the like.
Further, it should be understood that, since the setting of the control module is only for explaining the functional units in the system corresponding to the detection layout control method for wheel-rail contact attitude measurement of the present invention, the physical device corresponding to the control module may be the processor itself, or a part of software, a part of hardware, or a part of a combination of software and hardware in the processor. Thus, the number of control modules is only exemplary. Those skilled in the art will appreciate that the control module may be adaptively split according to actual situations. The specific splitting of the control module does not cause the technical solution to deviate from the principle of the present invention, and therefore, the technical solution after splitting will fall into the protection scope of the present invention.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a flowchart illustrating a detection layout control method for measuring a wheel-rail contact attitude according to an embodiment of the present invention.
Detailed Description
Preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are only for explaining the technical principle of the present invention, and are not intended to limit the scope of protection of the present invention and the like. The positions where the placement of cameras and/or structured light projectors is prohibited in the layout space can be flexibly defined according to the actual situation, etc. As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or modules, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, modules, and/or groups thereof.
It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
For the convenience of understanding of the embodiments of the present invention, the following description will be further explained by taking specific embodiments as examples with reference to the drawings, and the embodiments are not to be construed as limiting the embodiments of the present invention. While numerous specific details are set forth in the following description, it will be apparent to one skilled in the art that the present invention may be practiced without some of these specific details. In some instances, principles and the like well known to those skilled in the art have not been described in detail in order to not unnecessarily obscure the present invention. Referring to fig. 1, fig. 1 is a schematic flow chart illustrating a detection layout control method for measuring a wheel-rail contact attitude according to an embodiment of the present invention. As shown in fig. 1, the present invention provides a layout control method for detecting wheel-rail contact attitude measurement, wherein a detecting component used for measurement at least comprises a structured light projector and a camera, and the layout control method mainly comprises the following two steps:
step one, determining a layout space which can be covered by wheel rail contact attitude measurement;
and secondly, determining pose parameters of the structured light projector and the camera required by the layout space according to the candidate binocular vision model pool.
The candidate binocular vision model pool required in the step two is established according to the following steps:
step S10: determining a correlation factor in a layout space which can be covered by measurement, and performing discretization processing on the correlation factor; wherein the correlation factors include a size of the layout space, objects included in the layout space, environmental constraints associated with the layout space, and a target measurement space in the layout space having a wheel-rail contact pose.
In a possible implementation, step S10 specifically includes:
discretizing a local space with the size of m x n x k by using a sampling frequency f, wherein the size of the discretized layout space is expressed asS x ×S y ×S z ;
Wherein m, n and k are respectively the size of the layout space along the X, Y, Z axis direction in the three-dimensional coordinate system where the layout space is located; sampling frequency means that a sampling point is taken every other dimension f in the layout space, and the points in the local space are sampled along the X, Y, Z axis based on the sampling frequency, S x 、S y 、S z The number of points of the sample points in the X, Y, Z-axis direction (x, y, z) indicates an arbitrary point in the layout space.
Based on this, the discretization processing of the object contained in the layout space, the environmental constraint related to the layout space, and the target measurement space having the wheel-rail contact attitude in the layout space includes:
1): discretizing the object contained in the layout space with the sampling frequency f, denoted as S x ×S y ×S z 0-1 matrix of size env ;
Wherein if an object occupies a space at any point (x, y, z) in the layout space, matrix env (x, y, z) is 1, otherwise it is 0;
2): defining the layout-space-dependent environmental constraint, denoted as S, using the sampling frequency f x ×S y ×S z 0-1 matrix of size forbidden 。
Wherein a matrix if any point (x, y, z) in the layout space prohibits placement of the camera and/or the structured light projector forbidden (x, y, z) is 1, otherwise it is 0;
3): defining a target measurement space with a wheel-rail contact attitude in the layout space by using the sampling frequency f, and representing the target measurement space as S x ×S y ×S z 0-1 matrix of size target If the target measurement space includes any point (x, y, z) in the layout space, matrix target And (x, y, z) is 1, and otherwise is 0.
Step S20: candidate binocular vision models are built based on physical parameters of the structured light projector and the camera including, but not limited to, front depth of field, back depth of field, horizontal field of view, and vertical field of view.
In one possible implementation, step S20 includes:
discretizing the front depth of field, the rear depth of field, the horizontal field of view and the vertical field of view of the structured light projector and the camera according to the sampling frequency f, and respectively representing the results as near dist ,far dist ,FoV 1 ,FoV 2 ;
Treating the structured light projector and the camera as a particle having a position in the layout space of (x) 0 ,y 0 ,z 0 ) The optical axis of the particles is oriented at an angle to the x-axis and the y-axis, respectivelyThe field of view that the particle can cover is denoted as S x ×S y ×S z 0-1 matrix of size single Matrix if the field of view of the structured light projector or the camera can cover to a point (x, y, z) in the layout space single (x, y, z) is 1, and vice versa is 0.
Based on the near dist ,far dist ,FoV 1 ,FoV 2 And the matrix single And establishing a binocular vision model of the particles.
Step S30: and establishing a candidate binocular vision model pool in the feasible region of the layout space based on the candidate binocular vision model.
In one possible implementation, step S30 includes:
step S301: the position of the structured light projector and the camera in the layout space is (x) 1 ,y 1 ,z 1 ) And (x) 2 ,y 2 ,z 2 ),
The directions of the optical axes of the structured light projector and the camera form angles with the x-axis and the y-axis, respectivelyAnd
the fields of view that the structured light projector and the camera can cover are respectively denoted as S x ×S y ×S z 0-1 matrix of size single Wherein matrix if the field of view of the structured light projector or the camera can cover to a point (x, y, z) in the layout space single (x, y, z)1, otherwise 0;
the structured light projector is shown as one position being (x) 1 ,y 1 ,z 1 ) The direction of the optical axis is an angleMatrix of S1 The camera is represented as a position of (x) 2 ,y 2 ,z 2 ) The direction of the optical axis is an angleMatrix of s2 Binocular vision system consisting of structured light projector and camera, through matrix double It is shown that,
wherein, matrix double =matrix s1 &matrix s2 ;
Step S302: points which can put the binocular vision system in the layout space pass matrix feasible The representation of the matrix is carried out,
matrix feasible =~(matrix forbidden &matrix env )
wherein, the matrix forbidden The point in which the binocular vision system is forbidden to be placed is contained in a matrix env Including points that should not pose the binocular vision system, as determined by environmental constraints. The points where the binocular vision system is prohibited from being laid out in the layout space include points where the binocular vision system is prohibited from being laid out due to structural restrictions of a bogie of the train, and the like。
Step S303: using a structured light projector and camera as a particle in matrix feasible At every feasible point, the included angle between the mass point and the x-axis and the y-axis is respectively generatedThe candidate binocular vision model of (3).
WhereinFor values between 0 ° and 360 °, each candidate binocular vision model contains potential and possible particle placement patterns for the particles. Assuming that N candidate binocular vision models are generated in total, all the candidate binocular vision models form a candidate binocular vision model pool expressed as NxS x ×S y ×S z 0-1 matrix a.
Thus, the aforementioned "determining pose parameters of the structured light projector and the camera required for the target measurement space according to the candidate binocular vision model pool" specifically includes:
according to the candidate binocular vision model pool A and the target measurement space matrix target Using a binary integer linear optimization solution, the objective function:
s.t.Ax>=matrix target ,x i ∈{0,1}
thereby determining the pose parameters of the structured light projector and the camera required by the object measurement space,
where, i ═ 1, 2., N, i denotes the ith binocular vision model candidate, N denotes the number of binocular vision models candidate, and variable x denotes i Indicates whether the ith candidate binocular vision model is selected, specifically, if x i 1, indicating that the ith candidate binocular vision model is selected, and otherwise, indicating that the ith candidate binocular vision model is not selected;ax is the linear combination of all possible coverage matrices of a binocular vision model consisting of a structured light projector and a camera, exemplarily: ax is a1 a1 a2 a2+ … a ak Ak. + aN a1, … a ak a.an is aN n-dimensional vector, each of the n-dimensional vectors has a value indicating whether the binocular vision model is selected in that dimension, a value of 0 indicates that the binocular vision model is selected, and a value of 1 indicates that the binocular vision model is not selected.
Therefore, in the wheel-rail contact attitude measurement detection layout control method, the pose parameters of the structured light projector and the camera required by the layout space can be determined based on the binocular vision model pool, so that a layout scheme of the structured light projector and the camera serving as sensing components in the layout space for high-precision wheel-rail contact attitude measurement is realized.
It should be noted that, although the foregoing embodiments describe each step in a specific sequence, those skilled in the art may understand that, in order to achieve the effect of the present invention, different steps do not have to be executed in such a sequence, and may be executed simultaneously or in other sequences, and some steps may be added, replaced or omitted, and these changes are within the protection scope of the present invention.
It should be noted that, although the detection layout control method configured in the above-described specific manner is described as an example, those skilled in the art will understand that the present invention should not be limited thereto. In fact, the related steps can be flexibly adjusted according to situations such as actual application scenes.
So far, the technical solutions of the present invention have been described in connection with the preferred embodiments shown in the drawings, but it is easily understood by those skilled in the art that the scope of the present invention is obviously not limited to these specific embodiments. Equivalent changes or substitutions of related technical features can be made by those skilled in the art without departing from the principle of the invention, and the technical scheme after the changes or substitutions can fall into the protection scope of the invention.
Claims (9)
1. A method for controlling a layout of a wheel-rail contact attitude measurement, wherein the wheel-rail contact attitude measurement uses detection components including a structured light projector and a camera, the method comprising the steps of:
step one, determining a layout space which can be covered by wheel-rail contact attitude measurement;
determining pose parameters of the structured light projector and the camera required by the layout space according to the candidate binocular vision model pool;
in the second step, the candidate binocular vision model pool is established according to the following steps:
step S10: determining a correlation factor in a layout space which can be covered by measurement, and performing discretization processing on the correlation factor;
wherein the correlation factors include a size of the layout space, objects included in the layout space, environmental constraints associated with the layout space, and a target measurement space in the layout space having a wheel-rail contact pose;
the step S10 includes:
discretizing a local space with the size of m x n x k by using a sampling frequency f, wherein the size of the discretized layout space is represented as S x ×S y ×S z ,
Wherein m, n and k are the dimensions of the layout space along the direction of the X, Y, Z axis in the three-dimensional coordinate system where the layout space is located; sampling frequency means that a sampling point is taken every dimension f in the layout space, and a point in the local space is sampled along the X, Y, Z axis based on the sampling frequency, S x 、S y 、S z Respectively, the number of points of the sampling points in the direction of the X, Y, Z axis, (x, y, z) represents an arbitrary point in the layout space,
based on this, the discretization processing of the object contained in the layout space, the environmental constraint related to the layout space, and the target measurement space having the wheel-rail contact attitude in the layout space includes:
1): discretizing the object contained in the layout space with said sampling frequency f, represented as oneS x ×S y ×S z 0-1 matrix of size env ,
Wherein matrix if an object occupies space at any point (x, y, z) in the layout space env (x, y, z) is 1, otherwise it is 0;
2): defining the layout-space-dependent environmental constraint, denoted as S, using the sampling frequency f x ×S y ×S z 0-1 matrix of size forbidden ,
Wherein matrix if any point (x, y, z) in the layout space prohibits placement of the camera and/or the structured light projector forbidden (x, y, z) is 1, otherwise it is 0;
3): defining a target measurement space with a wheel-rail contact attitude in the layout space by using the sampling frequency f, and representing the target measurement space as S x ×S y ×S z 0-1 matrix of size target ,
Wherein if the target measurement space includes any point (x, y, z) in the layout space, the matrix target (x, y, z) is 1, otherwise it is 0;
step S20: establishing a candidate binocular vision model according to the physical parameters of the structured light projector and the camera;
step S30: and establishing a candidate binocular vision model pool in the feasible region of the layout space based on the candidate binocular vision model.
2. The detection layout control method for wheel-rail contact attitude measurement according to claim 1, characterized in that the physical parameters include a front field depth, a rear field depth, a horizontal field angle, and a vertical field angle.
3. The method for detecting a layout control of a wheel-rail contact attitude measurement according to claim 2, wherein said step S20 includes:
the front depth of field, the back depth of field, the horizontal field of view, and the sampling frequency f for the structured light projector and the cameraDiscretizing the vertical field angle, and respectively representing the results as near dist ,far dist ,FoV 1 ,FoV 2 ;
Treating the structured light projector and the camera as a particle having a position in the layout space of (x) 0 ,y 0 ,z 0 ) The optical axis of the particles are oriented at angles to the x-axis and y-axis, respectivelyThe field of view that the particle can cover is denoted as S x ×S y ×S z 0-1 matrix of size single ,
Wherein matrix if the field of view of the structured light projector or the camera can cover to a point (x, y, z) in the layout space single (x, y, z) is 1, otherwise it is 0;
based on the near dist ,far dist ,FoV 1 ,FOV 2 And the matrix single And establishing a binocular vision model of the particles.
4. The method for detecting a layout control of a wheel-rail contact attitude measurement according to claim 3, wherein said step S30 includes:
step S301: the position of the structured light projector and the camera in the layout space is (x) 1 ,y 1 ,z 1 ) And (x) 2 ,y 2 ,z 2 ),
The directions of the optical axes of the structured light projector and the camera form angles with the x-axis and the y-axis, respectivelyAnd
the fields of view that the structured light projector and the camera can cover are respectively denoted as S x ×S y ×S z 0-1 matrix of size single Wherein matrix if the field of view of the structured light projector or the camera can cover to a point (x, y, z) in the layout space single (x, y, z) is 1, otherwise it is 0;
the structured light projector is shown as one position being (x) 1 ,y 1 ,z 1 ) The direction of the optical axis is an angleMatrix of s1 The camera is represented as a position of (x) 2 ,y 2 ,z 2 ) The direction of the optical axis is an angleMatrix of (2) s2 Binocular vision system consisting of structured light projector and camera, through matrix double It is shown that,
wherein, matrix double =matrix s1 &matrix s2 ;
Step S302: the point that can put the binocular vision system in the layout space passes matrix feasible The representation of the matrix is carried out,
matrix feasible =~(matrix forbidden &matrix env )
wherein, the matrix forbidden The point in which the binocular vision system is forbidden to be placed is contained in a matrix env The points which are determined by environmental constraints and should not put the binocular vision system are included;
step S303: using a structured light projector and camera as a particle in matrix feasible At every feasible point, the included angle between the mass point and the x-axis and the y-axis is respectively generatedThe candidate binocular vision model of (1), whereinThe candidate binocular vision model comprises potential and possible particle layout modes of the particles, wherein the values are between 0 degrees and 360 degrees;
assuming that N candidate binocular vision models are generated in total, all the candidate binocular vision models form a candidate binocular vision model pool expressed as NxS x ×S y ×S z 0-1 matrix a.
5. The method for controlling a wheel-rail contact attitude measurement detection layout according to claim 4, wherein the prohibiting the placement of the points of the binocular vision system in the layout space includes: points of binocular vision systems are prohibited due to train bogie structural limitations.
6. The method as claimed in claim 5, wherein the determining pose parameters of the structured light projector and the camera required for the layout space according to the candidate binocular vision model pool includes:
according to the candidate binocular vision model pool A and the target measurement space matrix target Using a binary integer linear optimization solution, the objective function:
s.t.Ax>=matrix target ,x i ∈{0,1}
thereby determining the pose parameters of the structured light projector and the camera required by the object measurement space,
where i is 1,2, …, N, i represents the ith candidate binocular vision model, N represents the number of candidate binocular vision models, and variable x i Indicates whether the ith candidate binocular vision model is selected, specifically, if x i 1, indicating that the ith candidate binocular vision model is selected, and otherwise, indicating that the ith candidate binocular vision model is not selected; ax is all possible structured lightLinear combinations of the coverage matrices of the binocular vision model consisting of the projector and the camera.
7. A computer-readable storage medium, characterized in that the storage medium is adapted to store a plurality of program codes adapted to be loaded and run by a processor to perform the method of detecting a layout control for a wheel-rail contact attitude measurement according to any one of claims 1 to 6.
8. A control apparatus, characterized in that it comprises a memory and a processor, said memory being adapted to store a plurality of program codes, said program codes being adapted to be loaded and run by said processor to perform the method of detecting layout control of wheel-rail contact attitude measurement according to any one of claims 1 to 6.
9. A detection layout control apparatus of a wheel-rail contact attitude measurement, characterized by comprising a control module configured to execute the detection layout control method of a wheel-rail contact attitude measurement according to any one of claims 1 to 6.
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