CN113645162B - Hardware testing method, system, equipment and medium of switch - Google Patents

Abstract

The invention discloses a hardware testing method of a switch, which comprises the following steps: acquiring a configuration file and factory attribute parameters of a switch to be tested; determining a plurality of hardware to be tested in the switch to be tested according to the configuration file; obtaining test files corresponding to the plurality of hardware to be tested respectively; calling a plurality of interfaces in a predefined data interface layer to acquire attribute parameters of the hardware to be tested, which are defined in each test file; and comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result. The invention also discloses a system, a computer device and a readable storage medium. The scheme provided by the invention simplifies and unifies the switch test through the data interface layer, thereby being capable of rapidly positioning the switch fault.

Description

Hardware testing method, system, device and medium of a switch

technical field

The invention relates to the testing field, in particular to a hardware testing method, system, equipment and storage medium of a switch.

Background technique

When the switch is produced and shipped, it needs to pass the test of the production line production test program, and all test items can be delivered to the customer. The design of the switch production test program needs to fully cover the switch functionality.

At present, switch manufacturers on the market have their own set of switch production test suites. Switch manufacturers develop diagnostic test programs suitable for their own products according to their own product characteristics; and for different types of switches, there are some differences in diagnostic test programs. Customers can get a detailed factory test report at the same time as they get the delivered product, but the customer cannot get involved in the specific functional test details.

The production test procedures of each switch manufacturer are only aimed at their own products, and the diagnostic test procedures do not have a unified test process and judgment rules. For example, how to test the normal function of the switch chip on the switch and how to formulate the conditions for passing the test are not uniform for each manufacturer.

Contents of the invention

In view of this, in order to overcome at least one aspect of the above problems, an embodiment of the present invention proposes a hardware testing method for a switch, including the following steps:

Obtain the configuration file and factory attribute parameters of the switch to be tested;

determining a plurality of hardware to be tested in the switch to be tested according to the configuration file;

Acquiring test files respectively corresponding to the plurality of hardware to be tested;

calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file;

Comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result.

In some embodiments, also include:

A master service is deployed on the test server, and a slave service with a first interface is deployed on the switch to be tested, wherein the master service and the slave service interact through the first interface.

In some embodiments, also include:

Obtain the configuration file and factory attribute parameters by using the main service, and obtain the corresponding test file according to the configuration file.

In some embodiments, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file, further comprising:

The master service uses the first interface to send a request to the slave service to acquire the attribute parameters of the hardware to be tested defined in the test file.

In some embodiments, also include:

In response to receiving the request from the service, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters.

In some embodiments, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison results, further comprising:

The slave service returns the acquired attribute parameters to the master service through the first interface;

The main service compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result.

In some embodiments, also include:

Create a database;

Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database.

Based on the same inventive concept, according to another aspect of the present invention, an embodiment of the present invention also provides a hardware test system for a switch, including:

The first obtaining module is configured to obtain configuration files and factory attribute parameters of the switch to be tested;

A determination module configured to determine a plurality of hardware to be tested in the switch to be tested according to the configuration file;

The second obtaining module is configured to obtain test files respectively corresponding to the plurality of hardware to be tested;

The calling module is configured to call several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each of the test files;

The comparison module is configured to compare the acquired attribute parameters with the factory attribute parameters, and generate a test report based on the comparison result.

Based on the same inventive concept, according to another aspect of the present invention, an embodiment of the present invention also provides a computer device, including:

at least one processor; and

A memory, the memory stores a computer program that can run on the processor, wherein the processor performs the following steps when executing the program:

Obtain the configuration file and factory attribute parameters of the switch to be tested;

determining a plurality of hardware to be tested in the switch to be tested according to the configuration file;

Acquiring test files respectively corresponding to the plurality of hardware to be tested;

calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file;

Comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result.

In some embodiments, also include:

A master service is deployed on the test server, and a slave service with a first interface is deployed on the switch to be tested, wherein the master service and the slave service interact through the first interface.

In some embodiments, also include:

Obtain the configuration file and factory attribute parameters by using the main service, and obtain the corresponding test file according to the configuration file.

In some embodiments, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file, further comprising:

The master service uses the first interface to send a request to the slave service to acquire the attribute parameters of the hardware to be tested defined in the test file.

In some embodiments, also include:

In response to receiving the request from the service, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters.

In some embodiments, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison results, further comprising:

The slave service returns the acquired attribute parameters to the master service through the first interface;

The main service compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result.

In some embodiments, also include:

Create a database;

Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database.

Based on the same inventive concept, according to another aspect of the present invention, an embodiment of the present invention also provides a computer-readable storage medium, the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor Perform the following steps:

Obtain the configuration file and factory attribute parameters of the switch to be tested;

determining a plurality of hardware to be tested in the switch to be tested according to the configuration file;

Acquiring test files respectively corresponding to the plurality of hardware to be tested;

calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file;

Comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result.

In some embodiments, also include:

A master service is deployed on the test server, and a slave service with a first interface is deployed on the switch to be tested, wherein the master service and the slave service interact through the first interface.

In some embodiments, also include:

Obtain the configuration file and factory attribute parameters by using the main service, and obtain the corresponding test file according to the configuration file.

In some embodiments, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file, further comprising:

The master service uses the first interface to send a request to the slave service to acquire the attribute parameters of the hardware to be tested defined in the test file.

In some embodiments, also include:

In response to receiving the request from the service, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters.

In some embodiments, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison results, further comprising:

The slave service returns the acquired attribute parameters to the master service through the first interface;

The main service compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result.

In some embodiments, also include:

Create a database;

Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database.

The present invention has one of the following beneficial technical effects: the scheme proposed by the present invention simplifies and unifies the test of the switch through the data interface layer, and then can quickly locate the fault of the switch.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention, and those skilled in the art can obtain other embodiments according to these drawings without any creative effort.

Fig. 1 is the schematic flow chart of the hardware test method of the switch that the embodiment of the present invention provides;

Fig. 2 is the flowchart of the hardware testing method of the switch that the embodiment of the present invention provides;

Fig. 3 is a schematic structural diagram of a hardware testing system provided by an embodiment of the present invention;

FIG. 4 is a schematic structural diagram of a computer device provided by an embodiment of the present invention;

FIG. 5 is a schematic structural diagram of a computer-readable storage medium provided by an embodiment of the present invention.

Detailed ways

In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.

According to one aspect of the present invention, the embodiment of the present invention proposes a kind of hardware testing method of switch, as shown in Figure 1, it may comprise steps:

S1, obtaining the configuration file and factory attribute parameters of the switch to be tested;

S2. Determine a plurality of hardware to be tested in the switch to be tested according to the configuration file;

S3. Obtain test files respectively corresponding to the plurality of hardware to be tested;

S4, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each of the test files;

S5, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result.

The solution proposed by the invention simplifies and unifies the test of the switch through the data interface layer, and then can quickly locate the fault of the switch.

In some embodiments, also include:

A master service is deployed on the test server, and a slave service with a first interface is deployed on the switch to be tested, wherein the master service and the slave service interact through the first interface.

Specifically, as shown in Figure 2, the main service (i.e. the main test program) deployed on the test server is a set of standardized diagnostic test programs, deployed on the server server, and realizes the test process of each device of the switch; The core of the slave service (that is, the client program) deployed on the test switch with the first interface is the restful server service.

In some embodiments, also include:

Obtain the configuration file and factory attribute parameters by using the main service, and obtain the corresponding test file according to the configuration file.

In some embodiments, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison results, further comprising:

The slave service returns the acquired attribute parameters to the master service through the first interface;

The main service compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result.

Specifically, the configuration file configures which test items the switch to be tested performs. After the main service obtains the configuration file of the switch to be tested, it can know the test items performed by the switch, and then obtain the corresponding test file. The test file includes According to the corresponding test process, the test process can be executed to obtain the test result of the corresponding hardware of the switch to be tested, and then compare it with the factory default configuration. The testing process for each device is performed in accordance with the testing guidelines in the switch industry. The test main program will first access the test database to obtain data such as the IP address and factory configuration of the device under test; then initiate a request through the restful network service to obtain the hardware information of the device under test, and wait for the return; after the device under test returns the data, The test main program checks whether the returned data is correct, matches with the test database, and generates a test report.

The test main program is a complete set of switch test procedures, including the test items of all components of the switch, mainly including PSU power supply, FAN fan, Sensor sensor, CPU processor, MEMORY memory, SSD storage, Firmware firmware, PORT port, FRU replaceable unit , LED light, SFP optical module, USB, etc., the test process of these test items is based on the test guidelines in the switch industry. The standard test process of the PSU test item is as follows, and the test process of other device test items can refer to the PSU.

(1) Check the PSU presence status and power supply status, if abnormal, report an error, otherwise go to the next step;

(2) Access the firmware information of the PSU, whether it conforms to the factory configuration, if abnormal, report an error, otherwise go to the next step;

(3) Access the PSU input and output current, voltage, power and temperature, whether it exceeds the threshold, if abnormal, report an error, otherwise go to the next step;

(4) Generate test results.

In some embodiments, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file, further comprising:

The master service uses the first interface to send a request to the slave service to acquire the attribute parameters of the hardware to be tested defined in the test file.

Specifically, as shown in FIG. 2 , the slave service listens to the restful request initiated by the server-side test main program through the first interface (ie, the restful interface), calls the data interface layer, and returns the attribute parameters of the hardware to be tested.

In some embodiments, the Restful interface definition is a set of C/S communication interfaces customized by the present invention. For example, the interface can be defined as follows:

In this way, the switch production workshop builds an environment according to the diagnostic test device designed in the present invention, and executes the test main program on the server server to perform factory inspection on the switches in batches.

In some embodiments, also include:

Create a database;

Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database.

Specifically, the test database configures the IP address range of the switch to be tested, which test items need to be executed for the test, and the factory default configuration of the switch.

In some embodiments, also include:

In response to receiving the request from the service, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters.

Specifically, as shown in Figure 2, the data interface layer is a set of hardware access interfaces, which are defined and implemented in Python language. The implementation of the interface can be to obtain data, set parameters, etc. from the driver or SDK. In this way, the switch manufacturer only needs to realize the interface of this layer to satisfy the execution of the client program.

As shown in Figure 2, the data interface layer defines the data access interfaces of various devices, covering PSU power supply, FAN fan, Sensor sensor, CPU, memory, hard disk, firmware, etc. For example, the data access interface of the PSU power supply can be defined as follows:

The scheme proposed by the present invention runs the main test program through the server, the client runs the client program and the data interface layer, and the data interface layer formulated. As long as the manufacturer implements the data interface layer, the test to the switch can be realized, so that the switch The test is simplified and unified. Customers can also download the diagnostic test program and run it to quickly locate switch faults.

Based on the same inventive concept, according to another aspect of the present invention, an embodiment of the present invention also provides a switch hardware testing system 400, as shown in FIG. 3 , including:

The first obtaining module 401 is configured to obtain the configuration file and factory attribute parameters of the switch to be tested;

A determination module 402 configured to determine a plurality of hardware to be tested in the switch to be tested according to the configuration file;

The second obtaining module 403 is configured to obtain test files respectively corresponding to the plurality of hardware to be tested;

The calling module 404 is configured to call several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each of the test files;

The comparison module 405 is configured to compare the acquired attribute parameters with the factory attribute parameters, and generate a test report based on the comparison result.

In some embodiments, also include:

A master service is deployed on the test server, and a slave service with a first interface is deployed on the switch to be tested, wherein the master service and the slave service interact through the first interface.

In some embodiments, also include:

Obtain the configuration file and factory attribute parameters by using the main service, and obtain the corresponding test file according to the configuration file.

In some embodiments, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file, further comprising:

The master service uses the first interface to send a request to the slave service to acquire the attribute parameters of the hardware to be tested defined in the test file.

In some embodiments, also include:

In response to receiving the request from the service, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters.

In some embodiments, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison results, further comprising:

The slave service returns the acquired attribute parameters to the master service through the first interface;

The main service compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result.

In some embodiments, also include:

Create a database;

Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database.

The scheme proposed by the present invention runs the main test program through the server, the client runs the client program and the data interface layer, and the data interface layer formulated. As long as the manufacturer implements the data interface layer, the test to the switch can be realized, so that the switch The test is simplified and unified. Customers can also download the diagnostic test program and run it to quickly locate switch faults.

Based on the same inventive concept, according to another aspect of the present invention, as shown in FIG. 4 , an embodiment of the present invention also provides a computer device 501, including:

at least one processor 520; and

Memory 510, the memory 510 stores a computer program 511 that can run on the processor, and the processor 520 performs the following steps when executing the program:

S1, obtaining the configuration file and factory attribute parameters of the switch to be tested;

S2. Determine a plurality of hardware to be tested in the switch to be tested according to the configuration file;

S3. Obtain test files respectively corresponding to the plurality of hardware to be tested;

S4, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each of the test files;

S5, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result.

In some embodiments, also include:

A master service is deployed on the test server, and a slave service with a first interface is deployed on the switch to be tested, wherein the master service and the slave service interact through the first interface.

In some embodiments, also include:

Obtain the configuration file and factory attribute parameters by using the main service, and obtain the corresponding test file according to the configuration file.

In some embodiments, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file, further comprising:

The master service uses the first interface to send a request to the slave service to acquire the attribute parameters of the hardware to be tested defined in the test file.

In some embodiments, also include:

In response to receiving the request from the service, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters.

In some embodiments, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison results, further comprising:

The slave service returns the acquired attribute parameters to the master service through the first interface;

The main service compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result.

In some embodiments, also include:

Create a database;

Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database.

The scheme proposed by the present invention runs the main test program through the server, the client runs the client program and the data interface layer, and the data interface layer formulated. As long as the manufacturer implements the data interface layer, the test to the switch can be realized, so that the switch The test is simplified and unified. Customers can also download the diagnostic test program and run it to quickly locate switch faults.

Based on the same inventive concept, according to another aspect of the present invention, as shown in FIG. 5 , the embodiment of the present invention also provides a computer-readable storage medium 601, the computer-readable storage medium 601 stores a computer program 610, and the computer program When 610 is executed by the processor, the following steps are performed:

S1, obtaining the configuration file and factory attribute parameters of the switch to be tested;

S2. Determine a plurality of hardware to be tested in the switch to be tested according to the configuration file;

S3. Obtain test files respectively corresponding to the plurality of hardware to be tested;

S4, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each of the test files;

S5, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result.

In some embodiments, also include:

A master service is deployed on the test server, and a slave service with a first interface is deployed on the switch to be tested, wherein the master service and the slave service interact through the first interface.

In some embodiments, also include:

Obtain the configuration file and factory attribute parameters by using the main service, and obtain the corresponding test file according to the configuration file.

In some embodiments, calling several interfaces in the predefined data interface layer to obtain the attribute parameters of the hardware to be tested defined in each test file, further comprising:

The master service uses the first interface to send a request to the slave service to acquire the attribute parameters of the hardware to be tested defined in the test file.

In some embodiments, also include:

In response to receiving the request from the service, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters.

In some embodiments, comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison results, further comprising:

The slave service returns the acquired attribute parameters to the master service through the first interface;

The main service compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result.

In some embodiments, also include:

Create a database;

Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database.

The scheme proposed by the present invention runs the main test program through the server, the client runs the client program and the data interface layer, and the data interface layer formulated. As long as the manufacturer implements the data interface layer, the test to the switch can be realized, so that the switch The test is simplified and unified. Customers can also download the diagnostic test program and run it to quickly locate switch faults.

Finally, it should be noted that those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be implemented by instructing related hardware through computer programs, and the programs can be stored in a computer-readable storage medium. When the program is executed, it may include the processes of the embodiments of the above-mentioned methods.

In addition, it should be appreciated that a computer readable storage medium (eg, memory) herein can be either volatile memory or nonvolatile memory, or can include both volatile memory and nonvolatile memory.

Those of skill would also appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the disclosure herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described generally in terms of their functionality. Whether such functionality is implemented as software or as hardware depends upon the particular application and design constraints imposed on the overall system. Those skilled in the art may implement the functions in various ways for each specific application, but such implementation decisions should not be interpreted as causing a departure from the scope disclosed in the embodiments of the present invention.

The above are the exemplary embodiments disclosed in the present invention, but it should be noted that various changes and modifications can be made without departing from the scope of the disclosed embodiments of the present invention defined in the claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. In addition, although the elements disclosed in the embodiments of the present invention may be described or required in an individual form, they may also be understood as a plurality unless explicitly limited to a singular number.

It should be understood that as used herein, the singular form "a" and "an" are intended to include the plural forms as well, unless the context clearly supports an exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items.

The serial numbers of the embodiments disclosed in the above-mentioned embodiments of the present invention are only for description, and do not represent the advantages and disadvantages of the embodiments.

Those of ordinary skill in the art can understand that all or part of the steps for implementing the above-mentioned embodiments can be completed by hardware, or can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium. The above-mentioned The storage medium can be read-only memory, magnetic disk or optical disk and so on.

Those of ordinary skill in the art should understand that: the discussion of any of the above embodiments is exemplary only, and is not intended to imply that the scope (including claims) disclosed by the embodiments of the present invention is limited to these examples; under the idea of the embodiments of the present invention , the technical features in the above embodiments or different embodiments can also be combined, and there are many other changes in different aspects of the above embodiments of the present invention, which are not provided in details for the sake of brevity. Therefore, within the spirit and principle of the embodiments of the present invention, any omissions, modifications, equivalent replacements, improvements, etc., shall be included in the protection scope of the embodiments of the present invention.

Claims (10)

1. a hardware testing method of switch, is characterized in that, comprises the following steps: Obtain the configuration file and factory attribute parameters of the switch to be tested; determining a plurality of hardware to be tested in the switch to be tested according to the configuration file; Acquiring test files respectively corresponding to the plurality of hardware to be tested; Call several interfaces in the data interface layer defined in the switch to be tested in advance to obtain the attribute parameters of the hardware to be tested defined in each test file; Comparing the acquired attribute parameters with the factory attribute parameters, and generating a test report based on the comparison result. 2. The method of claim 1, further comprising: A master service module is deployed on the test server, and a slave service module with a first interface is deployed on the switch to be tested, wherein the master service module and the slave service module interact through the first interface. 3. The method of claim 2, further comprising: Using the main service module to obtain the configuration file and factory attribute parameters, and obtain the corresponding test file according to the configuration file. 4. The method according to claim 3, characterized in that, calling several interfaces in the data interface layer defined in the switch to be tested in advance to obtain the attribute parameters of the hardware to be tested defined in each said test file , further including: The master service module uses the first interface to send a request to the slave service module to acquire the attribute parameters of the hardware under test defined in the test file. 5. The method of claim 4, further comprising: In response to receiving the request from the service module, calling several interfaces in the data interface layer defined in advance in the switch under test to obtain the attribute parameters. 6. The method according to claim 5, characterized in that, comparing the obtained attribute parameters with the ex-factory attribute parameters, and generating a test report based on the comparison results, further comprising: The slave service module returns the acquired attribute parameters to the master service module through the first interface; The main service module compares the received attribute parameters with the factory attribute parameters to generate a test report based on the comparison result. 7. The method of claim 3, further comprising: Create a database; Pre-save the configuration file and factory attribute parameters of the switch to be tested in the database. 8. A hardware testing system for a switch, comprising: The first obtaining module is configured to obtain configuration files and factory attribute parameters of the switch to be tested; A determination module configured to determine a plurality of hardware to be tested in the switch to be tested according to the configuration file; The second obtaining module is configured to obtain test files respectively corresponding to the plurality of hardware to be tested; The calling module is configured to call several interfaces in the data interface layer defined in the switch to be tested in advance to obtain the attribute parameters of the hardware to be tested defined in each test file; The comparison module is configured to compare the acquired attribute parameters with the factory attribute parameters, and generate a test report based on the comparison result. 9. A computer device comprising: at least one processor; and A memory, the memory stores a computer program operable on the processor, wherein the processor executes the steps of the method according to any one of claims 1-7 when executing the program. 10. A computer-readable storage medium, the computer-readable storage medium storing a computer program, characterized in that, when the computer program is executed by a processor, the method according to any one of claims 1-7 is executed step.

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