CN113640613A - Electrolytic capacitor aging test method - Google Patents
Electrolytic capacitor aging test method Download PDFInfo
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- CN113640613A CN113640613A CN202010394018.XA CN202010394018A CN113640613A CN 113640613 A CN113640613 A CN 113640613A CN 202010394018 A CN202010394018 A CN 202010394018A CN 113640613 A CN113640613 A CN 113640613A
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- aging
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- 239000003990 capacitor Substances 0.000 title claims abstract description 60
- 230000032683 aging Effects 0.000 title claims abstract description 58
- 238000010998 test method Methods 0.000 title claims abstract description 12
- 238000012360 testing method Methods 0.000 claims abstract description 88
- 238000000034 method Methods 0.000 claims abstract description 8
- 238000004519 manufacturing process Methods 0.000 claims abstract description 3
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000011156 evaluation Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 7
- 238000003466 welding Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000007599 discharging Methods 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses an electrolytic capacitor aging test method, which comprises the following steps: A. manufacturing a feeding aging plug board; placing a capacitor on the aging plugboard; B. the inserting plate is guided into an aging oven by a mechanical arm or a manual work; C. aging treatment; D. placing the aged plugboard on a testing machine by a manipulator or a worker, and carrying out uncharged testing; E. putting the capacitors on the plugboards down to a testing machine for feeding; F. testing the capacity loss; G. placing the test charging bent frame for charging; H. entering a leakage current test; i, superposing alternating current test, overvoltage test, overcurrent test, voltage fluctuation pattern recording and evaluation and other tests. The invention can increase the efficiency of capacitance detection, reduce the probability of inaccurate test, and simultaneously have the functions of recording, storing, controlling and judging the detection process.
Description
Technical Field
The invention relates to the technical field of electronic element testing, in particular to an electrolytic capacitor aging testing method.
Background
The existing full-automatic aging tester for electrolytic capacitors has the defects of aging, such as equipment cost, maintenance, power consumption, efficiency waste and the like on an all-in-one machine due to long aging time, and the problems of poor manual efficiency, high aging rework rate and the like of manual aging.
The existing full-automatic electrolytic capacitor testing machine generally adopts intermittent charging in order to increase the testing speed and be suitable for single station movement, and products with implosion and other hidden dangers cannot be judged due to the fact that the testing time is too short because of the rapid movement of the testing station, and the leakage current testing of the intermittent charging is different from the national standard testing method.
The traditional aging machine has the defects of difficult maintenance, low test efficiency, nonstandard test, time consumption for replacing different foot-shaped test products, incapability of testing potential hazard products such as implosion and the like.
The traditional aging test method and the related equipment aging part are as follows: 1. feeding inserting plates (placing capacitors on an aging bent frame) → 2, entering a tunnel or an equal-temperature oven for aging → discharging (connecting a testing machine), wherein feeding and the oven are integrated, and the bent frame moves in the oven.
The traditional testing method of the full-automatic testing machine comprises the following steps: feeding → placing the capacitor on the clamp, the clamp starts moving → capacity loss test → uncharged test → charging → leakage 1 test → leakage 2 test, as the similarly moving station in fig. 2, the circle can represent the station or the capacitor which has entered the station, the arrow → represents the moving direction of the whole chain, the stations are generally between 120 and 200, fig. 2 is a simplified schematic diagram.
The station is driven by the chain to move and is fixed on the chain.
Disclosure of Invention
The present invention is directed to a method for testing aging of an electrolytic capacitor, so as to solve the problems mentioned in the background art.
In order to achieve the purpose, the invention provides the following technical scheme:
an electrolytic capacitor aging test method comprises the following steps:
A. manufacturing a feeding aging plug board; placing a capacitor on the aging plugboard;
B. the inserting plate is guided into an aging oven by a mechanical arm or a manual work;
C. aging treatment;
D. placing the aged plugboard on a testing machine by a manipulator or a worker, and carrying out uncharged testing;
E. putting the capacitors on the plugboards down to a testing machine for feeding;
F. testing the capacity loss;
G. placing the test charging bent frame for charging;
H. and entering a leakage current test.
I, overlapping alternating current test, overvoltage and overcurrent test and voltage fluctuation pattern recording and judgment;
as a further technical scheme of the invention: the self-service feeding plugboard is a strip-shaped plugboard, and a plurality of different types of capacitor slots can be designed on the strip-shaped plugboard, and can be arranged on the same board or not.
As a further technical scheme of the invention: in the aging process, each plug board unit is provided with voltage and current acquisition.
As a further technical scheme of the invention: and the step C comprises three steps of normal temperature aging, high temperature aging and secondary normal temperature aging.
As a further technical scheme of the invention: the collected voltage and current can be stored and judged by an upper microcomputer and a lower microcomputer, and the charging voltage and current of the electrolytic capacitor can be controlled and automatically adjusted;
as a further technical scheme of the invention: the superposition of alternating current test, overvoltage and overcurrent test and voltage fluctuation pattern recording and judgment are also the simultaneous tests of the capacitors on a support.
As a further technical scheme of the invention: the charging in step G may also adopt a voltage-doubling line charging mode.
As a further technical scheme of the invention: the capacitors with different lead-out angle types can be tested by only replacing the bent frames on the tester and selecting different bent frames.
Compared with the prior art, the invention has the beneficial effects that: the invention can increase the efficiency of capacitor aging detection, reduce the probability of inaccurate test, eliminate recessive defective products, and simultaneously have the functions of recording, storing, controlling and judging the detection process.
Drawings
Figure 1 is a schematic diagram of an aging feed insert plate.
FIG. 2 is a prior art button angle; a simplified moving schematic diagram of Korean chip capacitor automatic testing machine.
Fig. 3 is a schematic diagram of voltage testing.
Fig. 4 is a schematic diagram of a first embodiment of the movement of a capacitor on a device.
Fig. 5 is a schematic diagram of a second embodiment of the movement of a capacitor on a device.
In fig. 1: 1-plug board and 2-capacitor.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, embodiment 1: an electrolytic capacitor aging test method comprises the following steps:
firstly, a multi-station capacitor plugboard is manufactured, the plane is shown in figure 1, different sockets and contact methods can be designed according to capacitors with different foot shapes, the number of stations is more than or equal to 3, and 10 stations are taken as an example in the scheme.
The automatic feeding board inserting machine is designed as the front feeding of the full-automatic aging testing machine.
An intelligent aging oven with the functions of fixing, charging and detecting each plug board is designed. The difference from the fully automatic aging machine is that the capacitor is static in the oven. However, the aging bent is integrally designed on a post-process testing machine, and the design of positive and negative electrodes of the bent is covered, which is one of the biggest differences from manual aging.
The design is automatic, and the test machine is different from the traditional capacitance test machine, and the charging is one-row charging, and the leakage current is one-row test. The charging board can be the same as the capacitor aging board, and the movement diagram of the capacitor on the device can be as shown in fig. 4 as an example.
Unlike conventional fully automatic weatherometer, the weathered partial feed card and the weathering oven are completely independent of each other and may not be in a 1:1 relationship, for example: it is possible to have one feeder with three aging ovens.
Different from the traditional full-automatic aging tester, in an aging partial aging oven, an aging bent frame is fixed, and different from manual aging, the bent frame can be designed for automatic feeding and automatic discharging of equipment.
Different from the traditional full-automatic aging tester, the voltage and current of all bent frames during aging are recorded, stored, controlled and judged in the detection process.
Unlike a traditional full-automatic burn-in tester, the oven and the tester are completely independent from each other, but the burn-in shelving mechanism and the tester are integrated.
The burn-in bay may also be converted to a charging bay of the tester.
The testing method of the full-automatic testing machine comprises the following steps: as shown in fig. 4
Feeding → capacity loss test → charging → multiple leakage test of one bent frame capacitor → other test → lower frame
The number of capacitors n on the bent is more than or equal to 3, in this case, 10, the number of allowed bent m in the charging area is more than or equal to 2, and in this case, 4 is set as 4-support in the representative example of fig. 4.
②
The whole charging bent frame can only move integrally.
Secondly, the single charging bent frame can be simply and integrally replaced. Can be suitable for testing different lead-out angle-shaped capacitors
And the electrodes of the single charging bent are generally arranged at two ends of the charging bent.
The speed of the traditional full-automatic testing machine depends on the charging time and the charging speed of each capacitor and the testing speed, the moving speed is too fast, poor charging can be caused, the improved full-automatic testing machine only depends on the charging and discharging time, and the charging and testing time is enough due to the charging of the whole row.
Each capacitor of the traditional full-automatic testing machine moves along with an automatic chain on the equipment, a charging brush is in contact charging, the intermittent charging test time is short, if the test time is t1, the moving speed t2, t is t1+ t2, the machine speed is 60/t, and if the test time is too long, the machine speed is reduced, but the invention charges the whole row without power interruption and tests the leakage of N capacitors at one time, if the N capacitors need to be tested for t1 seconds, the moving speed t2, t is t1+ t2, the equipment speed per minute is (60/t) x N, and as long as the feeding can reach the speed, the equipment speed is (60/t). The invention can accept longer t if at the same speed, which allows more time to test multiple leakage and other tests.
The invention relates to a button-angle welding sheet type electrolytic capacitor which has a plurality of leading-out modes, including a two-pin button angle, a three-pin button angle, a four-pin button angle, a cross welding sheet, a parallel welding sheet and a double-U welding sheet.
For example, in the overvoltage test, the probes may be simultaneously contacted with two ends of the capacitor, and the other two ends of the probes are the voltage test modules, so that theoretically, there may be enough test time to adjust the voltage of the capacitor to the highest voltage V that can rise at the normal temperature of the capacitor, as shown in fig. 3, so that V1 ═ V-IR may have a longer time to detect the voltage and the current many times, and finally, a curve is formed to determine whether the capacitor has defects.
If the capacitor has flashover and hidden short circuit under the condition of V1, and the I rising V1 falls, the condition of the flashover inside the capacitor can be determined by judging the voltage change of V1, and whether the capacitor is poor or not can be judged.
The laser and code-spraying printing of the capacitor outer skin can be added, and the capacitor outer skin is connected with a computer to lead in data retention.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (8)
1. An electrolytic capacitor aging test method is characterized by comprising the following steps:
A. manufacturing a feeding aging plug board; placing a capacitor on the aging plugboard;
B. the inserting plate is guided into an aging oven by a mechanical arm or a manual work;
C. aging treatment;
D. placing the aged plugboard on a testing machine by a manipulator or a worker, and carrying out uncharged testing;
E. putting the capacitors on the plugboards down to a testing machine for feeding;
F. testing the capacity loss;
G. placing the test charging bent frame for charging;
H. entering a leakage current test;
I. and carrying out superposition alternating current test, overvoltage and overcurrent test and voltage fluctuation pattern recording and judgment.
2. The electrolytic capacitor aging test method according to claim 1, wherein the self-service feeding plugboard is a strip plugboard, and a plurality of different types of capacitor slots are arranged on the strip plugboard.
3. The electrolytic capacitor aging test method according to claim 1, wherein during the aging process, each plug board unit has voltage and current collection.
4. The aging test method for the electrolytic capacitor as recited in claim 1, wherein the step C comprises three steps of normal temperature aging, high temperature aging and secondary normal temperature aging.
5. The aging test method for electrolytic capacitors as claimed in claim 3, wherein the collected voltage and current are stored and determined by the upper microcomputer and the lower microcomputer, and the charging voltage of the electrolytic capacitor is controlled and automatically adjusted.
6. The method of claim 1, wherein the leakage test charging is performed by charging the capacitors on a rack simultaneously while testing the leakage current multiple times.
7. The method as claimed in claim 1, wherein the superimposed AC test, the over-voltage over-current test and the recording and determining of the voltage fluctuation pattern are also performed simultaneously on a rack.
8. The electrolytic capacitor aging test method according to any one of claims 1 to 7, wherein a plurality of different lead-out angle types of capacitors can be tested by replacing the bent frames on the tester and selecting different bent frames.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010394018.XA CN113640613A (en) | 2020-05-11 | 2020-05-11 | Electrolytic capacitor aging test method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010394018.XA CN113640613A (en) | 2020-05-11 | 2020-05-11 | Electrolytic capacitor aging test method |
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| CN113640613A true CN113640613A (en) | 2021-11-12 |
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| CN202010394018.XA Pending CN113640613A (en) | 2020-05-11 | 2020-05-11 | Electrolytic capacitor aging test method |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207586341U (en) * | 2017-10-31 | 2018-07-06 | 深圳中元电子有限公司 | A kind of automatic detection of unaged capacitor and discharger |
| CN109143139A (en) * | 2018-07-04 | 2019-01-04 | 南通天禾机械科技有限公司 | Ageing framed bent fault self-checking system |
| CN109946488A (en) * | 2019-03-28 | 2019-06-28 | 江苏伊施德创新科技有限公司 | A kind of miniature chip ceramic condenser batch aging and test method |
| CN110947648A (en) * | 2019-12-18 | 2020-04-03 | 广东恩慈智能科技有限公司 | Full-automatic ox horn capacitor aging data monitoring and testing method |
-
2020
- 2020-05-11 CN CN202010394018.XA patent/CN113640613A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207586341U (en) * | 2017-10-31 | 2018-07-06 | 深圳中元电子有限公司 | A kind of automatic detection of unaged capacitor and discharger |
| CN109143139A (en) * | 2018-07-04 | 2019-01-04 | 南通天禾机械科技有限公司 | Ageing framed bent fault self-checking system |
| CN109946488A (en) * | 2019-03-28 | 2019-06-28 | 江苏伊施德创新科技有限公司 | A kind of miniature chip ceramic condenser batch aging and test method |
| CN110947648A (en) * | 2019-12-18 | 2020-04-03 | 广东恩慈智能科技有限公司 | Full-automatic ox horn capacitor aging data monitoring and testing method |
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