CN113628945B - High-frequency structure of band-shaped beam klystron and method for testing and adjusting characteristic parameters of resonant cavity of high-frequency structure - Google Patents
High-frequency structure of band-shaped beam klystron and method for testing and adjusting characteristic parameters of resonant cavity of high-frequency structure Download PDFInfo
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- CN113628945B CN113628945B CN202110900373.4A CN202110900373A CN113628945B CN 113628945 B CN113628945 B CN 113628945B CN 202110900373 A CN202110900373 A CN 202110900373A CN 113628945 B CN113628945 B CN 113628945B
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- 238000005259 measurement Methods 0.000 claims description 56
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J25/00—Transit-time tubes, e.g. klystrons, travelling-wave tubes, magnetrons
- H01J25/02—Tubes with electron stream modulated in velocity or density in a modulator zone and thereafter giving up energy in an inducing zone, the zones being associated with one or more resonators
- H01J25/10—Klystrons, i.e. tubes having two or more resonators, without reflection of the electron stream, and in which the stream is modulated mainly by velocity in the zone of the input resonator
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J23/00—Details of transit-time tubes of the types covered by group H01J25/00
- H01J23/16—Circuit elements, having distributed capacitance and inductance, structurally associated with the tube and interacting with the discharge
- H01J23/18—Resonators
- H01J23/20—Cavity resonators; Adjustment or tuning thereof
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Abstract
The present disclosure relates to a method for testing and adjusting characteristic parameters of a high-frequency structure and a resonant cavity of a band-shaped beam klystron. The high-frequency structure of the ribbon beam klystron comprises: the main part is formed by combining two components of a whole that can function independently, is equipped with at least a set of tuning unit in every components of a whole that can function independently, and every tuning unit includes: a drift channel extending in a lateral direction through the body portion; at least one waveguide slot extending in the longitudinal direction within the drift channel; and a straight waveguide cavity formed at the first end of the waveguide slot and communicating with the waveguide slot; a diaphragm cover plate assembly comprising: a diaphragm movably mounted at a second end of the waveguide slot opposite the first end; and a tuning mechanism assembly configured to adjust a distance between the diaphragm and the waveguide slot; and an attenuating porcelain assembly comprising: the base is arranged on one side of the straight waveguide cavity opposite to the waveguide groove, is arranged on the split part and seals the straight waveguide cavity; and an attenuation porcelain body mounted in the base and at least partially inserted into the straight waveguide cavity.
Description
Technical Field
The present disclosure relates to microwave and millimeter wave electric vacuum devices, and in particular to a high-frequency structure of a band-shaped beam klystron for microwave and millimeter wave electric vacuum devices and a method for testing and adjusting characteristic parameters of a resonant cavity thereof.
Background
The klystron has been developed from the original simple dual-cavity klystron to the currently commonly adopted multi-gap multi-cavity structural scheme, wherein cavity forms comprise a re-entry cavity, a coaxial cavity, a dumbbell-shaped cavity, an expansion interaction cavity, a filter loading multi-gap cavity and the like, the klystron is suitable for the multi-gap cavity, a basic mode or a high-order mode can be selected in the working mode, and an electron beam form relates to single-beam, multi-beam, hollow beam and strip beam schemes.
The klystron can produce high frequency pulse or continuous wave power output, and has high power capacity and reliability due to the separation of the electron gun, the high frequency circuit and the collector. The klystron is used as a microwave and millimeter wave amplifying device with high power, high gain and high efficiency, and has the advantages of compact structure, stability, reliability and long service life, so that the klystron is widely applied.
At present, with the progress of three-dimensional electromagnetic simulation software and precision machining technology, the aim of further improving the output power of millimeter wave and sub-millimeter wave band devices is to develop a band-shaped beam klystron with high power capacity. Unlike the traditional axisymmetric resonant cavity with circular electron beam, the resonant cavity of the band-shaped beam klystron is different into a plane symmetric structure with subchambers on two sides and rectangular waveguide in the middle, and is matched with flat beam with large aspect ratio. Its advantages mainly include two aspects: firstly, the interaction area of the cavity is larger, and correspondingly, the heat radiating area and the power capacity are also larger; secondly, in the high frequency band, the planar structure is easy to realize high-precision processing and assembly welding, and accords with the trend of the vacuum electronic device towards the planarization and integration direction.
The resonant cavity of the klystron exchanges energy with the electron beam by establishing a mode electric field in the gap, and in addition to the input and output cavities being used for beam modulation and power extraction, respectively, without loading, the quality factor of the intermediate cavity needs to be calculated by a large signal program to select a reasonable value, which is generally lower than the inherent quality factor of the cavity after machining, in order to more effectively enhance beam bunching, suppress oscillations, and increase the fundamental component in the motion current as much as possible. The characteristic parameters of the cavity have important influence on the wave injection interaction of the klystron, and further determine the overall performance of the device. Wherein the characteristic impedance of the resonant cavity is dependent on the cavity structure and is substantially determined at the design stage.
According to the method, firstly, a three-dimensional model of a resonant cavity is built in electromagnetic analysis software, the resonant frequency of the cavity working mode and the frequency interval between the resonant frequency and an adjacent mode are calculated by the software, then probes are inserted into drift channels and are arranged on two sides of the cavity, peak positions on a transmission curve are recorded, the frequency interval between actually measured peaks is compared with a calculated value, and then the working mode is screened out and the frequency of the working mode is determined.
By using the method, only the resolution of the working mode in the plane multi-gap dumbbell cavity and the measurement of the resonant frequency and the quality factor thereof can be completed, the compensation of the frequency offset caused by the machining error and the brazing deformation cannot be realized, and a solution for adjusting the frequency and the quality factor of the dumbbell cavity to the design values at the same time is not provided. In addition, for the klystron with smaller drift channel size and working in a high frequency band (more than 100 GHz), the processing and manufacturing difficulty of the fine probe is very high, and the requirement on the insertion positioning precision of the probe is high, so that the measurement of the resonant frequency and the quality factor of the klystron cavity by using the probe cannot be realized.
Disclosure of Invention
The disclosure provides a high-frequency structure of a ribbon beam klystron and a method for testing and adjusting characteristic parameters of a resonant cavity thereof, so as to solve the problem that frequency offset caused by machining errors and brazing deformation cannot be compensated in the prior art.
According to one aspect of the present disclosure, there is provided a ribbon beam klystron high frequency structure including:
the main part is formed by combining two components of a whole that can function independently, is equipped with at least a set of tuning unit in each above-mentioned components of a whole that can function independently, and every tuning unit includes:
a drift passage extending in a lateral direction through the main body;
at least one waveguide slot extending in the longitudinal direction within the drift channel; and
a straight waveguide cavity formed at a first end of the waveguide slot and communicating with the waveguide slot;
a diaphragm cover plate assembly comprising:
a diaphragm movably mounted at a second end of the waveguide slot opposite the first end; and
a tuning mechanism assembly configured to adjust a distance between the diaphragm and the waveguide slot; and
an attenuated porcelain assembly comprising:
a base which is mounted on the split part on a side of the straight waveguide cavity opposite to the waveguide groove and seals the straight waveguide cavity; and
and the attenuation porcelain body is arranged in the base and is at least partially inserted into the straight waveguide cavity.
According to an embodiment of the present disclosure, wherein the first and second ends of the waveguide groove are provided with a first sub-chamber and a second sub-chamber, respectively, and the split portion is formed with a mounting groove,
the diaphragm cover plate assembly further comprises:
a cover plate installed in the installation groove;
and a tuning rod passing through the cover plate movably in the longitudinal direction, and the diaphragm being mounted at a first end of the tuning rod.
According to an embodiment of the present disclosure, the tuning mechanism assembly includes:
a support base mounted on the split part;
and a driving rod installed on the supporting seat and combined with the tuning rod to drive the tuning rod to move the diaphragm in the longitudinal direction.
According to an embodiment of the present disclosure, the tuning mechanism assembly further includes:
a pressing plate mounted on one side of the support base opposite to the split part, wherein the driving rod passes through the pressing plate and the support base;
the driving rod is provided with a limit bulge, the supporting seat is provided with a limit groove matched with the limit bulge,
the tuning rod is non-rotatably inserted through the cover plate of the diaphragm cover plate assembly, and the driving rod is screw-coupled with the tuning rod such that the rotation of the driving rod is converted into the linear movement of the tuning rod.
According to the embodiment of the disclosure, a boss surrounding the second subchamber and a positioning groove surrounding the boss are arranged in the mounting groove;
the cover plate is provided with a containing groove matched with the boss and containing the membrane, and a matching boss matched with the positioning groove.
According to an embodiment of the present disclosure, the two split parts comprise mirror image structures and are bonded together by means of pressure welding.
According to an embodiment of the present disclosure, the membrane comprises a composite elastic sheet rolled by bonding metal.
According to an embodiment of the present disclosure, wherein a fixing groove is provided in the base of the damping porcelain assembly, the damping porcelain body is fixed in the fixing groove by a metallization layer,
the attenuating porcelain has a generally wedge-shaped outer contour and/or one surface of the attenuating porcelain has a contour with a gradual curve.
According to another aspect of the present disclosure, there is provided a method for testing and adjusting a characteristic parameter of a resonant cavity, including:
a cold measurement plugging pressing plate is arranged on the main body part to plug the second end of the waveguide slot;
installing a cold measurement flange connector on one side of the straight waveguide cavity of the main body part, which is opposite to the waveguide slot, wherein the cold measurement flange connector comprises:
the cold measurement flange plate is connected with a waveguide flange of the vector network analyzer;
the cold measurement straight waveguide section is connected to the cold measurement flange plate;
a cold measurement support connected to the cold measurement straight waveguide section and mounted on the main body portion; and
the cold measurement end socket seals the straight waveguide cavity on one side, opposite to the cold measurement straight waveguide section, of the cold measurement support seat, so that the straight waveguide cavity is communicated with a through hole of a waveguide flange of the vector network analyzer;
and measuring the resonant frequency and the quality factor of the resonant cavity in the main body part by adopting a single-port group delay method, and selecting the main body part under the condition of ensuring that the detection standard is met.
According to an embodiment of the present disclosure, the method for testing and adjusting the characteristic parameters of the resonant cavity of the high-frequency structure of the ribbon beam klystron further includes:
disassembling the cold test plugging pressing plate;
installing the diaphragm cover plate assembly on the main body part to block the second end of the waveguide slot;
measuring the resonant frequency and the quality factor of the resonant cavity in the main body part by adopting a single-port group delay method, and selecting the diaphragm cover plate assembly under the condition of ensuring to meet detection standards; and/or
Disassembling the cold testing flange connector and the diaphragm cover plate assembly;
retaining the attenuating porcelain assembly on the body portion with an attenuating porcelain assembly pressure plate to block the straight waveguide cavity;
a cold pressure measuring plate suitable for sealing the second subchamber is arranged on the main body part, and the cold measuring flange connecting piece is arranged on the cold pressure measuring plate, so that the resonant cavity is communicated with the through hole of the waveguide flange of the vector network analyzer through the waveguide hole on the cold pressure measuring plate;
and measuring the resonant frequency and the quality factor of the resonant cavity in the main body part by adopting a single-port group delay method, and selecting the attenuation porcelain body of the attenuation porcelain component under the condition of ensuring to meet detection standards.
According to the setting of the diaphragm cover plate assembly and the attenuation porcelain assembly, the resonant frequency of the cavity working mode can be adjusted, so that the frequency and the quality factor of the dumbbell-shaped resonant cavity are adjusted to design values, the quality factor of the working mode can be effectively reduced through the setting of the attenuation porcelain assembly, the high-frequency circuit is optimized, the electron beam clustering is enhanced, and further the beam interaction efficiency and the output power are improved.
Drawings
The foregoing and other objects, features and advantages of the disclosure will be more apparent from the following description of embodiments of the disclosure with reference to the accompanying drawings, in which:
fig. 1 schematically illustrates a partially cut-away perspective view of a high frequency structure of a ribbon beam klystron of an exemplary embodiment of the present disclosure;
fig. 2 schematically illustrates a perspective view of a split part of a high-frequency structure of a ribbon beam klystron according to an exemplary embodiment of the present disclosure;
fig. 3 schematically shows another perspective view of the split part shown in fig. 2;
FIG. 4 schematically illustrates a partial cutaway perspective view of a diaphragm cover plate assembly of an exemplary embodiment of the present disclosure;
FIG. 5 schematically illustrates a cross-sectional view of the diaphragm cover plate assembly illustrated in FIG. 4;
fig. 6 schematically illustrates a perspective cross-sectional view of a tuning mechanism assembly of an exemplary embodiment of the present disclosure;
fig. 7 schematically illustrates a cross-sectional view of the tuning mechanism assembly shown in fig. 6;
FIG. 8 schematically illustrates a perspective view of an attenuating porcelain assembly of an exemplary embodiment of the present disclosure;
FIG. 9 schematically illustrates a cross-sectional view of the attenuating porcelain assembly illustrated in FIG. 8;
FIG. 10 schematically illustrates an assembly schematic of a selected body portion for performing a method of tuning a resonant cavity characteristic parameter test of an exemplary embodiment of the present disclosure;
FIG. 11 schematically illustrates a perspective view of a cold flange connection of an exemplary embodiment of the present disclosure;
FIG. 12 schematically illustrates a perspective view of a cold shut off platen according to an exemplary embodiment of the present disclosure;
FIG. 13 schematically illustrates an assembly schematic of a selected diaphragm cover plate assembly for performing a resonant cavity characteristic parameter test adjustment method of an exemplary embodiment of the present disclosure;
fig. 14 schematically illustrates an assembly schematic of a selected damping porcelain for performing a method of tuning a resonant cavity characteristic parameter test of a ribbon beam klystron of an exemplary embodiment of the present disclosure;
FIG. 15 schematically illustrates a perspective view of a cold measurement platen of an exemplary embodiment of the present disclosure; and
fig. 16 schematically illustrates a perspective view of an attenuating porcelain assembly platen according to an exemplary embodiment of the present disclosure.
In the figure: 1-main body part, 111-split part, 112-split part, 11-first sub-chamber, 113-mounting groove, 12-waveguide groove, 13-drift channel, 14-second sub-chamber, 15-boss, 16-positioning groove, 17-fixing hole, 18-limit countersink, 19-straight waveguide cavity, 2-diaphragm cover plate component, 21-tuning rod, 22-cover plate, 23-diaphragm, 211-screw hole, 212-first end of tuning rod, 221-limit hole, 222-accommodation groove, 223-fitting boss, 3-tuning mechanism component, 31-driving rod, 311-square head structure, 312-limit boss, 313-fine tooth screw, 32-pressing plate, 33-supporting seat, 34-locking screw, 321-pressing plate through hole, 322-locking through holes, 331-tuning seat through holes, 332-limit grooves, 333-locking holes, 334-folding feet, 4-attenuating porcelain components, 41-bases, 42-attenuating porcelain bodies, 411-fixing grooves, 421-wedges, 422-metallization layers, 5-fixing screws, 6-cold measuring flange connectors, 61-cold measuring flange plates, 62-cold measuring straight waveguide sections, 63-bolt holes, 64-cold measuring seal heads, 65-cold measuring support seats, 7-cold measuring sealing pressing plates, 71-cold measuring sealing positioning grooves, 72-cold measuring sealing bosses, 73-bolt holes, 74-cold measuring sealing pressing plate plates, 8-cold pressure measuring plates, 81-wave guide holes, 82-cold pressure measuring plate limiting grooves, 83-bolt holes, 84-cold pressure measuring plate boss, 9-damping porcelain component pressing plate, 91-bolt hole and 92-damping porcelain component limit groove.
Detailed Description
Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It should be understood that the description is only exemplary and is not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. In addition, in the following description, descriptions of well-known structures and techniques are omitted so as not to unnecessarily obscure the concepts of the present disclosure.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and/or the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, steps, operations, or components.
All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art unless otherwise defined. It should be noted that the terms used herein should be construed to have meanings consistent with the context of the present specification and should not be construed in an idealized or overly formal manner.
Where expressions like at least one of "A, B and C, etc. are used, the expressions should generally be interpreted in accordance with the meaning as commonly understood by those skilled in the art (e.g.," a system having at least one of A, B and C "shall include, but not be limited to, a system having a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.).
As shown in fig. 1 to 9, a high-frequency structure of a ribbon beam klystron according to an embodiment of the present disclosure includes: a main body 1, a diaphragm cover plate assembly 2 and an attenuation porcelain assembly 4.
The main body 1 is formed by combining two split parts (111, 112), and at least one group of tuning units are arranged in each split part (111, 112), and each tuning unit comprises: a drift channel 13 extending in the lateral direction through the body portion 1; at least one waveguide slot 12 extending in the longitudinal direction within the drift channel 13; and a straight waveguide cavity 19 formed at a first end of the waveguide groove 12 and communicating with the waveguide groove 12.
The diaphragm cover plate assembly 2 includes: a diaphragm 23 and a tuning mechanism assembly 3, the diaphragm 23 being movably mounted at a second end of the waveguide slot 12 opposite the first end; the tuning mechanism assembly 3 is configured to adjust the distance between the diaphragm 23 and the waveguide slot 12.
The damping porcelain assembly 4 comprises: a base 41 and an attenuation porcelain 42, the base 41 being mounted on the main body portion 1 on a side of the straight waveguide cavity 19 opposite to the waveguide groove 12 and sealing the straight waveguide cavity 19; the attenuating porcelain 42 is mounted within the base 41 and is at least partially inserted into the straight waveguide cavity 19.
According to the setting of the diaphragm cover plate assembly 2 and the attenuation porcelain assembly 4, the resonant frequency of the cavity working mode can be adjusted, so that the frequency and the quality factor of the dumbbell-shaped resonant cavity are adjusted to design values, the quality factor of the working mode can be effectively reduced through the setting of the attenuation porcelain assembly 4, the high-frequency circuit is optimized, the electron beam clustering is enhanced, and further the beam interaction efficiency and the output power are improved.
The diaphragm cover plate component 2 and the attenuation porcelain component 4 are respectively arranged on two sides of the main body part 1, and the adjustment of the quality factor and the resonance frequency of the working mode can be separately carried out, so that the processing problem and the signal interference problem of using a probe for testing are avoided, and the test adjustment of the characteristic parameters of the planar multi-gap dumbbell-shaped resonant cavity is realized.
The hollow portion in the main body 1 forms a multi-gap resonant cavity, the high-frequency circuit of the actual device generally includes a plurality of resonant cavities, and the number of gaps in each resonant cavity may be less or more than five, and in this embodiment, only a structure including five-gap (specifically, 5 gaps are provided in the waveguide slot 12) resonant cavities is described as an example, and in this embodiment, the planar five-gap resonant cavity corresponds to an intermediate cavity of the high-frequency structure of the actual ribbon beam klystron, and the principle and the device are the same as those described in this embodiment when the planar high-frequency structure having two or more multi-gap intermediate cavities is subjected to cold measurement adjustment.
For better conductivity, the main body 1 may be made of oxygen-free copper material, the drift channel 13 may be designed as a rectangular drift channel for accommodating a band-shaped electron beam, the waveguide slot 12 may be designed as a rectangular waveguide slot periodically arranged to connect the subchambers (the first subchamber 11 and the second subchamber 14) on both sides of the multi-gap resonator, the number of waveguide slots 12 is usually odd based on the symmetrical design requirement, and the width of the waveguide slot 12 parallel to the direction of the drift channel and the period length between adjacent waveguide slots 12 depend on the operating parameters of the klystron.
As shown in fig. 1 to 5, according to the high frequency structure of the ribbon beam klystron according to the embodiment of the present disclosure, the first and second ends of the waveguide groove 12 are provided with the first sub-chamber 11 and the second sub-chamber 14, respectively, and the mounting groove 113 is formed on the split part. The first sub-chamber 11 and the second sub-chamber 14 may be provided in the same structure, i.e. the same shape and size. The side wall of the second subchamber 14 is removed during processing, and the second subchamber 14 is subsequently blocked by a diaphragm 23 pressed against the plane of the boss 15, forming a completely closed resonant cavity structure.
The waveguide groove 12, the first sub-chamber 11 and the second sub-chamber 14 have the same sinking depth from the surfaces of the split parts (111, 112), so that the processing and forming can be performed by one feeding, and the influence of the dimension processing error on the cavity frequency can be reduced.
The diaphragm cover plate assembly 2 further includes: a cover plate 22 and a tuning rod 21, the cover plate 22 being mounted in the mounting groove 113; the tuning rod 21 is movably passed through the cover plate 22 in the longitudinal direction, the diaphragm 23 is mounted at a first end 212 of the tuning rod 21, and a screw hole 211 is provided at the top of the tuning rod 21.
Specifically, the diaphragm 23 may be fixed at the first end of the tuning rod 21 and the first end of the cover plate 22 by means of brazing, and the diaphragm 23 is deformed and displaced in a certain range under the pulling of the tuning mechanism assembly 3, the cover plate 22 is placed into the positioning slot 16 in the mounting slot 113, and after being bonded and pressed with the surface of the boss 15 including the second subchamber 14, the diaphragm 23 serves as a movable side wall to seal the second subchamber 14, and the rotatable driving rod 31 drives the tuning rod 21 in the diaphragm cover plate assembly 2 to move, so that the distance between the waveguide slot 12 and the diaphragm 23 is changed, thereby realizing the adjustment of the resonant cavity frequency.
As shown in fig. 6 to 7, the tuning mechanism assembly 3 according to the high-frequency structure of the ribbon beam klystron according to the embodiment of the present disclosure includes: a support base 33, a driving rod 31 and a pressing plate 32.
The support base 33 is mounted on the split parts (111, 112); a driving rod 31 is installed on the support base 33 and combined with the tuning rod 21 to drive the tuning rod 21 to move the diaphragm 23 in the longitudinal direction, a pressing plate 32 is installed on the opposite side of the support base 33 from the split parts (111, 112), and the driving rod 31 passes through the pressing plate 32 and the support base 33; the driving rod 31 is provided with a limiting protrusion 312, the supporting seat 33 is provided with a limiting groove 332 matched with the limiting protrusion 312, the supporting seat 33 is also provided with a tuning seat through hole 331, and the tuning seat through hole 331 is communicated with the limiting groove 332. The platen 32 is provided with a platen through hole 321.
The tuning rod 21 is non-rotatably passed through the cover 22 of the diaphragm cover assembly 2 and the drive rod 31 is threadedly coupled with the tuning rod 21 such that rotation of the drive rod 31 is translated into linear movement of the tuning rod 21. I.e. the tuning rod 21 and the diaphragm 23 are driven to rise or fall together by the rotation of the driving rod 31, so as to change the volume of the second subchamber 14 in the multi-gap resonant cavity, thereby realizing fine tuning of the resonant frequency of the cavity.
The shape of the limiting boss 312 comprises a cylindrical shape, the driving rod 31 can freely rotate around the central axis, the upper part of the driving rod 31 can be milled into a square head-shaped structure 311, the external rotating wheel is conveniently sleeved to amplify the angular travel to realize fine adjustment, and the lower part of the driving rod 31 can be designed into a fine tooth screw 313.
The pressing plate 32 is provided with a locking through hole 322, the supporting seat 33 is provided with a locking hole 333, and the locking screw 34 sequentially passes through the locking through hole 322 and the locking hole 333 to fix the pressing plate 32 on the supporting seat 33, so that the driving rod 31 is limited to only rotate.
The side of the supporting seat 33 is provided with a folding leg 334, the side wall of the main body part 1 is provided with a fixing hole 17, and the fixing screw 5 sequentially passes through the folding leg 334 and the fixing hole 17 to fix the supporting seat 33 on the main body part 1.
As shown in fig. 2 to 5, in the high-frequency structure of the ribbon beam klystron according to the embodiment of the present disclosure, the mounting groove 113 is provided therein with a boss 15 surrounding the second sub-chamber 14, and a positioning groove 16 surrounding the boss; the cover plate 22 is provided with a receiving groove 222 that mates with the boss 15 and receives the diaphragm 23, and a mating boss 223 that mates with the positioning groove 16.
The shape of the mating boss 223 includes a "back" shape, which can make the structure of the mating boss 223 mounted to the positioning groove 16 more stable.
In the test adjustment device for the characteristic parameters of the planar multi-gap resonant cavity of the present embodiment, only one middle cavity is taken as an example, and the number of resonant cavities included in the high-frequency system of the actual ribbon beam klystron is two or more, so that the boss 15 on the high-frequency cavity will have a plurality of rectangular openings, which respectively correspond to the second subchambers 14 of the plurality of serial resonant cavities. To close these subchambers, a plurality of through limiting holes 221 are correspondingly formed in the cover plate 22 of the diaphragm cover plate assembly 2 to accommodate tuning rods 21 corresponding to different subchambers, and the tuning rods 21 are welded on a single diaphragm 23, and one resonant cavity corresponds to one tuning rod 21, so that independent tuning of the frequencies of the cavities can be ensured.
As shown in fig. 2-3, the ribbon beam klystron high frequency structure according to the embodiments of the present disclosure, the two split parts (111, 112) comprise mirror image structures and are bonded together by pressure welding.
The inner surfaces of the two split parts (111, 112) to be joined (i.e. the upper surfaces comprising the cavity structure in fig. 2 and 3) need to have a good flatness to ensure an air-tightness after being effectively bonded together by pressure welding.
As shown in fig. 4-5, according to the high-frequency structure of the ribbon beam klystron according to the embodiment of the disclosure, the diaphragm 23 includes a layer of composite elastic sheet rolled by bonding metal, and the side of the diaphragm 23 facing the second subchamber 14 of the multi-gap resonant cavity can be designed to be copper material with good conductivity, but does not exclude other materials that can achieve this function.
As shown in fig. 8-9, according to the high-frequency structure of the band-shaped beam klystron according to the embodiment of the disclosure, a fixing slot 411 is provided in the base of the attenuation porcelain assembly 4, the attenuation porcelain body 42 is fixed in the fixing slot 411 through a metallization layer 422, the attenuation porcelain body 42 has a substantially wedge-shaped outer contour and/or one surface of the attenuation porcelain body has a contour with a gradual curve, the narrow side dimension of the attenuation porcelain body 42 is kept constant, the wide side dimension is linearly changed, and the angle of the wedge 421 can be obtained through simulation optimization, so as to ensure that electromagnetic waves transmitted in the straight waveguide cavity 19 on the main body 1 are absorbed as non-reflectively as possible.
The cross section of the fixing slot 411 includes a square shape, and in order to avoid the damage of the damping porcelain body by extrusion, the four right angles of the square shape are replaced by small circular arcs which are expanded outwards, and the damping porcelain body 42 and the base 41 are welded into a whole through the metallization layer 422.
The main body 1 is provided with a limiting sink groove 18, the limiting sink groove 18 is positioned on one side of the straight waveguide cavity 19 opposite to the waveguide groove 12, the base 41 of the attenuation porcelain assembly 4 can be fixed in the limiting sink groove 18 in a brazing mode, and the quality factor of the resonant cavity is reduced to a design value in a mode of absorbing a traveling wave electromagnetic field in the straight waveguide cavity 19.
In order to increase the absorption power capacity, the limiting sink 18 of the high-frequency cavity can be externally connected with a gradual change waveguide with gradually increased inner holes, and the attenuation ceramic component 4 with increased volume is placed in a larger waveguide space, so that the attenuation ceramic component is applicable to the high-frequency cavity with a submillimeter wave band.
As shown in fig. 10 to 16, a method for testing and adjusting a characteristic parameter of a resonant cavity of a ribbon beam klystron according to an embodiment of the disclosure includes:
a cold test plugging pressure plate 7 is mounted on the main body part 1 to plug the second end of the waveguide slot 12.
The cold measurement plugging pressure plate 7 comprises a cold measurement plugging pressure plate body 74, a cold measurement plugging boss 72 and a cold measurement plugging positioning groove 71 formed in the cold measurement plugging boss 72 are arranged on one side of the cold measurement plugging pressure plate body 74, a bolt hole 73 is further formed in the cold measurement plugging pressure plate body 74, and the cold measurement plugging pressure plate body 74 can be fixed on the main body 1 through a bolt.
A cold-measuring flange connector 6 is mounted on a side of the straight waveguide cavity 19 of the main body portion 1 opposite to the waveguide groove 12, and the cold-measuring flange connector 6 includes: the cold testing flange plate 61, the cold testing straight waveguide section 62, the cold testing supporting seat 65 and the cold testing seal head 64.
The cold measurement flange plate 61 is connected with a waveguide flange of the vector network analyzer; the cold measurement straight waveguide section 62 is connected to the cold measurement flange 61; the cold measurement support base 65 is connected to the cold measurement straight waveguide section 62 and is mounted on the main body part 1; the cold measurement seal head 64 seals the straight waveguide cavity 19 on one side of the cold measurement support seat 65 opposite to the cold measurement straight waveguide section 62, so that the straight waveguide cavity 19 is communicated with the through hole of the waveguide flange of the vector network analyzer, the straight waveguide cavity 19 is aligned with the through hole of the waveguide flange and tight butt joint is realized, and measurement errors can be effectively reduced; the cold measurement support base 65 is provided with a bolt hole 63, and the cold measurement support base 65 can be fixed on the main body part 1 through bolts.
The resonance frequency and the quality factor of the resonant cavity in the main body part 1 are measured by adopting a single-port group delay method, and the main body part 1 meeting the detection standard is selected under the condition of ensuring the meeting of the detection standard.
And disassembling the cold test plugging pressing plate 7.
A diaphragm cover plate assembly 2 is mounted on the body portion 1 to close off the second end of the waveguide slot.
The resonance frequency and the quality factor of the resonant cavity in the main body part 1 are measured by adopting a single-port group delay method, and the diaphragm cover plate component 2 meeting the detection standard is selected under the condition of ensuring the meeting of the detection standard.
The cold-testing flange connection 6 and the diaphragm cover plate assembly 2 are disassembled.
The damping porcelain assembly 4 is held on the main body portion 1 by the damping porcelain assembly pressing plate 9 to block the straight waveguide cavity 19.
The damping porcelain assembly pressing plate 9 is provided with a damping porcelain assembly limiting groove 92 and a bolt hole 91, the tail part of the damping porcelain assembly 4 is positioned in the damping porcelain assembly limiting groove 92, and the damping porcelain assembly pressing plate 9 can be fixed on the main body part 1 through bolts.
A cold measurement pressing plate 8 suitable for sealing the second subchamber 14 is arranged on the main body part, and a cold measurement flange connecting piece 6 is arranged on the cold measurement pressing plate 8, so that the resonant cavity is communicated with a through hole of a waveguide flange of the vector network analyzer through a waveguide hole 81 on the cold measurement pressing plate 8; the inboard of cold pressure measurement board 8 is equipped with cold pressure measurement board boss 84, and cold pressure measurement board boss 84 cooperatees with constant head tank 16, and the outside of cold pressure measurement board 8 is equipped with cold pressure measurement board spacing groove 82, and cold measurement head 64 is located cold pressure measurement board spacing groove 82, is equipped with waveguide hole 81 in the cold pressure measurement board 8, and waveguide hole 81 communicates with each other with cold pressure measurement board spacing groove 82, still is equipped with bolt hole 83 on the cold pressure measurement board 8, and cold pressure measurement board 8 can be fixed on main part 1 through the bolt.
And the single-port group delay method is adopted to measure the resonant frequency and the quality factor of the resonant cavity in the main body part, and the attenuation porcelain component 4 meeting the detection standard is selected under the condition of ensuring the meeting of the detection standard.
The damping porcelain assembly 4, the damping porcelain assembly pressing plate 9, the cold measurement pressing plate 8 and the cold measurement flange connecting piece 6 are disassembled.
For the input and output cavities, the attenuation porcelain body 42 is not required to be placed in a standard straight waveguide on the high-frequency cavity, so that the testing process of the characteristic parameters of the planar multi-gap cavity can be further simplified, the external quality factor of the working mode mainly depends on the shape of the coupling port, the external quality factor is basically determined in the design stage, the mode resonance frequency is regulated by changing the position of the diaphragm 23, and the step of selecting a proper attenuation porcelain component 4 can be omitted in the testing process.
The principle of the resonant cavity characteristic parameter test and adjustment method of the ribbon beam klystron according to the embodiment of the disclosure is as follows: the characteristic impedance of the planar multi-gap resonant cavity depends on the shape of the cavity, and is determined based on a high-frequency structural design process, so that in order to adjust the resonant frequency and the quality factor of the actual cavity to design values, adjustment is needed through a cold measurement process. The method comprises the steps of selecting machined and formed split parts (111, 112), firstly measuring and checking the internal structural dimensions of the split parts in detail to ensure that machining errors are within a reasonable range, and then combining the two split parts (111, 112) meeting requirements and welding the split parts into a main body part 1 through pressure diffusion welding. Aiming at the problems of structural deformation and poor contact of welding surfaces which possibly exist in the high-frequency cavity, whether the resonance frequency and the quality factor of the main body part 1 formed by welding two split parts (111, 112) are in a reasonable range or not is evaluated according to the cold measurement result of the cavity of the planar multi-gap resonant cavity. In an acceptable case, the diaphragm cover plate assembly 2 is tried to be loaded and cold measurement is carried out again, the resonant frequency of the cavity is measured by adopting a single-port group delay method, and the resonant frequency of the cavity is adjusted to a design value by rotating the driving rod 31 on the tuning mechanism assembly 3. If the cavity frequency cannot be adjusted to the design value in the whole travel range of the tuning rod 21 during the cold measurement process, different diaphragm cover plate assemblies 2 can be replaced for trial. Then, by replacing different attenuation porcelain components 4, the quality factor of the cavity is brought into the allowable range, and simulation calculation shows that the existence of the attenuation porcelain 42 in a wider frequency band has little influence on the resonant frequency of the cavity, so that the adjustment of the quality factor and the resonant frequency of the cavity can be carried out separately. After the cold testing process is completed, a set of attenuation porcelain component 4 and a set of diaphragm cover board component 2 matched with the high-frequency cavity can be screened out, the attenuation porcelain component and the diaphragm cover board component are fixed on the main body part 1 through brazing, and after the tuning mechanism component 3 is installed, the plane multi-gap dumbbell-shaped sealing cavity with the cavity characteristic parameters meeting the design requirements as shown in figure 1 can be obtained.
The planar multi-gap cavity of the band-shaped beam klystron usually works in a 2 pi mode, and the external quality factors of other non-working modes are smaller, so that the working modes can be easily distinguished from the group delay curve measured by the waveguide ports.
The embodiments of the present disclosure have been described above for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although the embodiments are described above separately, this does not mean that the measures in the embodiments cannot be used advantageously in combination. The scope of the disclosure is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be made by those skilled in the art without departing from the scope of the disclosure, and such alternatives and modifications are intended to fall within the scope of the disclosure.
Claims (10)
1. A high frequency structure of a ribbon beam klystron for microwave and millimeter wave electric vacuum devices, comprising:
the main part is formed by combining two components of a whole that can function independently, every be equipped with at least a set of tuning unit in the components of a whole that can function independently, every tuning unit includes:
a drift channel extending in a lateral direction through the body portion;
at least one waveguide slot extending in a longitudinal direction within the drift channel; and
a straight waveguide cavity formed at a first end of the waveguide slot and communicating with the waveguide slot; a diaphragm cover plate assembly comprising:
a diaphragm movably mounted at a second end of the waveguide slot opposite the first end; and
a tuning mechanism assembly configured to adjust a distance between the diaphragm and the waveguide slot; and
an attenuated porcelain assembly comprising:
a base which is arranged on the split part at one side of the straight waveguide cavity opposite to the waveguide groove and seals the straight waveguide cavity; and
and the attenuation porcelain body is arranged in the base and is at least partially inserted into the straight waveguide cavity.
2. The high-frequency structure of a ribbon beam klystron as defined in claim 1, wherein the first and second ends of the waveguide slot are provided with a first subchamber and a second subchamber, respectively, and a mounting slot is formed in the split portion,
the diaphragm cover plate assembly further comprises:
the cover plate is installed in the installation groove;
a tuning rod movably passing through the cover plate in the longitudinal direction, the diaphragm being mounted at a first end of the tuning rod.
3. The ribbon beam klystron high frequency structure of claim 2, wherein the tuning mechanism assembly comprises:
the support seat is arranged on the split part;
and the driving rod is arranged on the supporting seat and combined with the tuning rod to drive the tuning rod to move the diaphragm in the longitudinal direction.
4. A ribbon beam klystron high frequency structure as defined in claim 3, wherein the tuning mechanism assembly further comprises:
the pressing plate is arranged on one side of the supporting seat opposite to the split part, and the driving rod penetrates through the pressing plate and the supporting seat;
the driving rod is provided with a limiting protrusion, and the supporting seat is provided with a limiting groove matched with the limiting protrusion;
the tuning rod is non-rotatably passed through the cover plate of the diaphragm cover plate assembly, and the driving rod is in threaded engagement with the tuning rod such that rotation of the driving rod is converted into linear movement of the tuning rod.
5. The high-frequency structure of the ribbon beam klystron according to claim 4, wherein a boss surrounding the second subchamber and a positioning groove surrounding the boss are arranged in the mounting groove;
the cover plate is provided with an accommodating groove matched with the boss and accommodating the diaphragm, and a matching boss matched with the positioning groove.
6. The high frequency structure of a ribbon beam klystron as set forth in claim 5, wherein the two split parts comprise mirror image structures and are bonded together by pressure welding.
7. The high frequency structure of a ribbon beam klystron as set forth in claim 1, wherein the diaphragm comprises a layer of composite elastic sheet rolled by an adhesive metal.
8. The high-frequency structure of a band-shaped beam klystron as defined in claim 1, wherein a fixing groove is provided in the base of the damping porcelain assembly, the damping porcelain body is fixed in the fixing groove by a metallization layer,
the attenuating porcelain has a generally wedge-shaped outer contour and/or one surface of the attenuating porcelain has a contour with a gradual curve.
9. A method for testing and adjusting a resonant cavity characteristic parameter of a high-frequency structure of a strip-type beam klystron according to any one of claims 1 to 8, comprising:
a cold measurement plugging pressing plate is arranged on the main body part to plug the second end of the waveguide slot;
installing a cold measurement flange connector on one side of the straight waveguide cavity of the main body part, which is opposite to the waveguide slot, wherein the cold measurement flange connector comprises:
the cold measurement flange plate is connected with a waveguide flange of the vector network analyzer;
the cold measurement straight waveguide section is connected to the cold measurement flange plate;
a cold measurement support connected to the cold measurement straight waveguide section and mounted on the main body portion; and
the cold measurement end socket seals the straight waveguide cavity on one side, opposite to the cold measurement straight waveguide section, of the cold measurement support seat, so that the straight waveguide cavity is communicated with a through hole of a waveguide flange of the vector network analyzer;
and measuring the resonant frequency and the quality factor of the resonant cavity in the main body part by adopting a single-port group delay method, and selecting the main body part under the condition of ensuring that the detection standard is met.
10. The method for testing and adjusting the characteristic parameters of the resonant cavity of the high-frequency structure of the ribbon beam klystron according to claim 9, further comprising:
disassembling the cold test plugging pressing plate;
installing the diaphragm cover plate assembly on the main body part to block the second end of the waveguide slot;
measuring the resonant frequency and the quality factor of the resonant cavity in the main body part by adopting a single-port group delay method, and selecting the diaphragm cover plate assembly under the condition of ensuring to meet detection standards; and/or
Disassembling the cold testing flange connector and the diaphragm cover plate assembly;
retaining the attenuating porcelain assembly on the body portion with an attenuating porcelain assembly pressure plate to block the straight waveguide cavity;
a cold pressure measuring plate suitable for sealing the second subchamber is arranged on the main body part, and the cold measuring flange connecting piece is arranged on the cold pressure measuring plate, so that the resonant cavity is communicated with the through hole of the waveguide flange of the vector network analyzer through the waveguide hole on the cold pressure measuring plate;
and measuring the resonant frequency and the quality factor of the resonant cavity in the main body part by adopting a single-port group delay method, and selecting the attenuation porcelain body of the attenuation porcelain component under the condition of ensuring to meet detection standards.
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| DE1296271B (en) * | 1960-08-11 | 1969-05-29 | Varian Associates | Klystron |
| US5504393A (en) * | 1994-04-29 | 1996-04-02 | Litton Systems, Inc. | Combination tuner and second harmonic suppressor for extended interaction klystron |
| CN103632907A (en) * | 2012-08-23 | 2014-03-12 | 中国科学院电子学研究所 | Band-shaped beam klystron multi-gap cavity output apparatus |
| CN103681176A (en) * | 2013-10-28 | 2014-03-26 | 中国科学院电子学研究所 | Band-shaped beam klystron outer tuning apparatus |
| CN106001893A (en) * | 2016-06-23 | 2016-10-12 | 中国科学院电子学研究所 | Tuning assembly, manufacturing method thereof and high-frequency assembly |
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2021
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| DE1296271B (en) * | 1960-08-11 | 1969-05-29 | Varian Associates | Klystron |
| US3226662A (en) * | 1961-01-24 | 1965-12-28 | Int Standard Electric Corp | Mechanical frequency control in a klystron tube comprising a directly attached rectangular cavity resonator |
| FR1497089A (en) * | 1965-10-22 | 1967-10-06 | Varian Associates | Advanced high frequency electronic discharge device of the klystron type |
| US5504393A (en) * | 1994-04-29 | 1996-04-02 | Litton Systems, Inc. | Combination tuner and second harmonic suppressor for extended interaction klystron |
| CN103632907A (en) * | 2012-08-23 | 2014-03-12 | 中国科学院电子学研究所 | Band-shaped beam klystron multi-gap cavity output apparatus |
| CN103681176A (en) * | 2013-10-28 | 2014-03-26 | 中国科学院电子学研究所 | Band-shaped beam klystron outer tuning apparatus |
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| CN113628945A (en) | 2021-11-09 |
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