CN113626302B - Information processing method, device and equipment for hardware in loop test - Google Patents
Information processing method, device and equipment for hardware in loop test Download PDFInfo
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- CN113626302B CN113626302B CN202010376631.9A CN202010376631A CN113626302B CN 113626302 B CN113626302 B CN 113626302B CN 202010376631 A CN202010376631 A CN 202010376631A CN 113626302 B CN113626302 B CN 113626302B
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- 238000012360 testing method Methods 0.000 title claims abstract description 111
- 230000010365 information processing Effects 0.000 title claims abstract description 15
- 238000003672 processing method Methods 0.000 title abstract description 10
- 230000007547 defect Effects 0.000 claims abstract description 8
- 238000012545 processing Methods 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 20
- 238000012790 confirmation Methods 0.000 claims description 18
- 238000011161 development Methods 0.000 claims description 14
- 238000004590 computer program Methods 0.000 claims description 6
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000013589 supplement Substances 0.000 description 2
- 108010015780 Viral Core Proteins Proteins 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000003208 petroleum Substances 0.000 description 1
- 238000007619 statistical method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F40/00—Handling natural language data
- G06F40/10—Text processing
- G06F40/166—Editing, e.g. inserting or deleting
- G06F40/186—Templates
Abstract
The invention provides an information processing method, device and equipment for hardware in loop test, and relates to the field of hardware in loop test. The information processing method of the hardware in the loop test comprises the following steps: obtaining a defect BUG template of a failure test case selected by a test user side; and determining first field information of the BUG template according to the association relation between the BUG template and the failure test case, and automatically filling in the fields of the BUG template. By extracting information from the test cases, automatic filling of the BUG template is realized, and meanwhile, because field information in the BUG template is directly extracted from the failed test cases, the efficiency and the accuracy are improved.
Description
Technical Field
The present invention relates to the field of hardware-in-loop testing, and in particular, to a method, an apparatus, and a device for processing information in hardware-in-loop testing.
Background
With the increasing tension of petroleum energy and the increasing worsening of the atmospheric environment, electric automobiles are favored by people because of the advantages of high efficiency and zero pollution. An electric vehicle has three major core controllers, namely a whole vehicle controller (Vehicle Control Unit, VCU) unit, a motor controller (Motor Control Unit, MCU) unit, and a battery management (Battery Management System, BMS) unit. At present, the electric control test is performed by a hardware-in-loop test system. The templates of the test cases are basically fixed, and almost all bugs are associated with the test cases because of the specificity of the business. When a test engineer submits a bug, a significant portion of the effort is to repeatedly fill out the test case field information. Thus, in order to reduce the workload of engineers, a method for automating this part of the work is needed.
Disclosure of Invention
The embodiment of the invention provides an information processing method, device and equipment of hardware in loop test, which are used for solving the problem of how to automatically fill in field information in a BUG template.
In order to solve the above technical problems, an embodiment of the present invention provides an information processing method of hardware in a ring test, the method including:
obtaining a defect BUG template of a failure test case selected by a test user side;
and determining first field information of the BUG template according to the association relation between the BUG template and the failure test case, and automatically filling in the fields of the BUG template.
Further, the determining the first field information of the BUG template according to the association relationship between the BUG template and the failure test case, and automatically filling the fields of the BUG template, includes:
acquiring a field to be set of the BUG template;
grouping the fields to be set to obtain an associated field group associated with the failure test case;
extracting associated field information of the associated field group from the failure test case, and determining the associated field information as first field information;
and filling the first field information in a field to be set of the BUG template.
Further, after the automatically filling in the fields of the but template, the method further includes:
acquiring confirmation information fed back by the test user side after confirming the fields of the BUG template;
if the confirmation information indicates that the field of the BUG template is correct, submitting the BUG template with the field;
and if the confirmation information indicates that the field of the BUG template is wrong, acquiring the field of the BUG template modified by the test user side, and submitting the BUG template with the field.
Further, the method further comprises:
receiving a BUG template with the fields;
acquiring a problem type parameter selected by a development user side according to the BUG template;
determining a field to be set of the problem type parameter according to the corresponding relation between the preset problem type and the field to be set;
acquiring second field information fed back by the development user side according to the field to be set;
and filling in the field of the problem template according to the second field information.
The embodiment of the invention also provides an information processing device of hardware in loop test, which comprises:
the first acquisition module is used for acquiring a defect BUG template of the failed test case selected by the test user side;
the first processing module is used for determining first field information of the BUG template according to the association relation between the BUG template and the failure test case and automatically filling in the fields of the BUG template.
Further, the first processing module includes:
the first acquisition unit is used for acquiring a field to be set of the BUG template;
the second acquisition unit is used for grouping the fields to be set and acquiring an associated field group associated with the failure test case;
the extracting unit is used for extracting the associated field information of the associated field group from the failure test case and determining the associated field information as the first field information;
and the processing unit is used for filling the first field information in the field to be set of the BUG template.
Further, the apparatus further comprises:
the second acquisition module is used for acquiring confirmation information fed back after the testing user side confirms the fields of the BUG template;
the first submitting module is used for submitting the BUG template with the field if the confirmation information indicates that the field of the BUG template is correct; and if the confirmation information indicates that the field of the BUG template is wrong, acquiring the field of the BUG template modified by the test user side, and submitting the BUG template with the field.
Further, the apparatus further comprises:
the receiving module is used for receiving the BUG template with the fields;
the third acquisition module is used for acquiring the problem type parameters selected by the development user side according to the BUG template;
the determining module is used for determining the field to be set of the problem type parameter according to the corresponding relation between the preset problem type and the field to be set;
a fourth obtaining module, configured to obtain second field information that is fed back by the development user side according to the field to be set;
and the second processing module is used for filling in the field of the problem template according to the second field information.
The embodiment of the invention also provides a processing device, which comprises: the device comprises a memory, a processor and a computer program stored in the memory and capable of running on the processor, wherein the processor realizes the information processing method of the hardware in the loop test when executing the computer program.
The beneficial effects of the invention are as follows:
according to the scheme, the automatic filling of the BUG template is realized by extracting the information from the test cases, and meanwhile, the field information in the BUG template is directly extracted from the failed test cases, so that the efficiency and the accuracy are improved.
Drawings
FIG. 1 is a flow chart of a method for processing information in loop test by hardware according to an embodiment of the present invention;
FIG. 2 is a second flow chart of the method for processing information in loop test of the hardware according to the embodiment of the invention;
FIG. 3 is a third flow chart of the method for processing information in loop test of the hardware according to the embodiment of the invention;
FIG. 4 is a flow chart of a method for processing information in loop test by hardware according to an embodiment of the invention;
fig. 5 is a schematic diagram showing the structure of an information processing apparatus in which hardware is used in a loop test according to an embodiment of the present invention.
Detailed Description
The present invention will be described in detail below with reference to the drawings and the specific embodiments thereof in order to make the objects, technical solutions and advantages of the present invention more apparent.
The invention provides an information processing method, device and equipment of hardware in loop test, aiming at the problem of how to automatically fill in field information in a BUG template.
As shown in fig. 1, an embodiment of the present invention provides a method for processing information in a ring test by using hardware, where the method includes:
step 11, obtaining a defect BUG template of a failure test case selected by a test user side;
and step 12, determining first field information of the BUG template according to the association relation between the BUG template and the failure test case, and automatically filling in the fields of the BUG template.
It should be noted that when the user submits the BUG, the user fills in the field information in the BUG, and part of the field information is from the test case, so that in order to improve the working efficiency of the user submitting the BUG, the part of the field information can be directly extracted from the test case and filled in the BUG template, thereby reducing the workload of the tester.
According to the embodiment of the invention, the automatic filling of the BUG template is realized by extracting the information from the test case, and the accuracy and efficiency of an engineer submitting the BUG are improved.
Specifically, as shown in fig. 2, the step 12 of determining the first field information of the BUG template according to the association relationship between the BUG template and the failed test case, and automatically filling in the fields of the BUG template includes:
step 121, obtaining a field to be set of the BUG template;
step 122, grouping the fields to be set to obtain an associated field group associated with the failed test case;
step 123, extracting associated field information of the associated field group from the failure test case, and determining the associated field information as first field information;
and 124, filling in the field to be set of the BUG template according to the first field information.
It should be noted that, based on the existing business flow, the field information to be set in the BUG template is counted, and the fields to be set are grouped, specifically, the method further includes: and setting the association relation between each field in the BUG template and each attribute value in the test case, so that when the band setting fields are grouped, the field information which can be extracted from the failed test case in the BUG template is determined according to the association relation between each field in the BUG template and each attribute value in the test case, thereby determining the association field group. Alternatively, the redundant field may be set in a different packet, satisfying future service expansion. After the fields to be set are grouped, an associated field group associated with the test case can be obtained, and field information of fields in the associated field group can be extracted from the failed test case.
Specifically, in order to further ensure accuracy of field information in the BUG template, after automatically filling out the fields of the BUG template in step 12, the method further includes:
acquiring confirmation information fed back by the test user side after confirming the fields of the BUG template;
if the confirmation information indicates that the field of the BUG template is correct, submitting the BUG template with the field;
and if the confirmation information indicates that the field of the BUG template is wrong, acquiring the field of the BUG template modified by the test user side, and submitting the BUG template with the field.
As shown in FIG. 3, when a test engineer submits a BUG, the test engineer needs to select a failed test case requiring the BUG submission first, then select a corresponding BUG template, and the system automatically fills field information of the BUG template according to the BUG template selected by the user, optionally, the user needs to set an association relationship between the BUG template and the test case in the system, that is, binding a certain attribute of the test case with a certain field of the BUG template. After fields of the BUG template are automatically filled, a user is required to confirm the accuracy of field information in the BUG, the field information after the user is changed is acquired when the field information is wrong, and meanwhile, the fields in the BUG template are required to be supplemented by the user in consideration of the fact that some field information which cannot be extracted from a failure test case exists in the BUG template, and the BUG template can be submitted after the supplement is completed.
Specifically, considering that when a development engineer needs to feed back a solution and a problem cause to a test engineer, the problem types including a connection error, a document error, a software error, etc. need to be filled in first, the embodiment of the invention can set preset fields and preset values of the solution and the problem cause according to different problem types. If the file is wrong, the name, sequence, sub-function ID and the like of the changed file need to be set, and the values can be directly bound with and obtained from the test case. Thus, the method further comprises:
receiving a BUG template with the fields;
acquiring a problem type parameter selected by a development user side according to the BUG template;
determining a field to be set of the problem type parameter according to the corresponding relation between the preset problem type and the field to be set;
acquiring second field information fed back by the development user side according to the field to be set;
and filling in the field of the problem template according to the second field information.
It should be noted that, as shown in fig. 4, when a development engineer feeds back a solution and a problem reason to a test engineer, a problem type is selected, the system obtains a field to be filled according to the problem type selected by the user, preferably, the field to be filled is obtained according to a corresponding relation between a preset problem type and a field to be set, at this time, the user only needs to fill in information of the field to be set, and the system supplements the field information filled by the user to a corresponding problem type template and submits the problem type template for the test engineer to view.
According to the embodiment of the invention, the automatic filling of the BUG template is realized by extracting the information from the test case, and the accuracy and efficiency of submitting the BUG and feeding back the solution to the problem are improved. Meanwhile, the BUG template can be adjusted according to the service, so that the maintenance cost is low, and the user only needs to adjust at a setting interface, so that the operation is simple. And because the field information in the BUG template is directly extracted from the failed test case, the efficiency and the accuracy are improved.
It should be noted that, the embodiment of the invention combines the existing hardware-in-the-loop test service in the electric control test, does not need to change the existing flow, sets a customized template, can automatically extract information from the test case, greatly liberates the workload and accuracy of engineers when submitting BUG, and also provides powerful data support for further project statistical analysis.
As shown in fig. 5, an embodiment of the present invention further provides an information processing apparatus for hardware in loop test, where the apparatus includes:
the first obtaining module 51 is configured to obtain a defect BUG template of a failed test case selected by the test user side;
the first processing module 52 is configured to determine first field information of the BUG template according to an association relationship between the BUG template and the failed test case, and automatically fill in a field of the BUG template.
Specifically, the first processing module 52 includes:
the first acquisition unit is used for acquiring a field to be set of the BUG template;
the second acquisition unit is used for grouping the fields to be set and acquiring an associated field group associated with the failure test case;
the extracting unit is used for extracting the associated field information of the associated field group from the failure test case and determining the associated field information as the first field information;
and the processing unit is used for filling the first field information in the field to be set of the BUG template.
Specifically, the device further comprises:
the second acquisition module is used for acquiring confirmation information fed back after the testing user side confirms the fields of the BUG template;
the first submitting module is used for submitting the BUG template with the field if the confirmation information indicates that the field of the BUG template is correct; and if the confirmation information indicates that the field of the BUG template is wrong, acquiring the field of the BUG template modified by the test user side, and submitting the BUG template with the field.
Specifically, the device further comprises:
the receiving module is used for receiving the BUG template with the fields;
the third acquisition module is used for acquiring the problem type parameters selected by the development user side according to the BUG template;
the determining module is used for determining the field to be set of the problem type parameter according to the corresponding relation between the preset problem type and the field to be set;
a fourth obtaining module, configured to obtain second field information that is fed back by the development user side according to the field to be set;
and the second processing module is used for filling in the field of the problem template according to the second field information.
The embodiment of the invention also provides a processing device, which comprises: the device comprises a memory, a processor and a computer program stored in the memory and capable of running on the processor, wherein the processor realizes the information processing method of the hardware in the loop test when executing the computer program. The implementation embodiments of the hardware-in-loop test defect processing method are applicable to the embodiment of the processing equipment, and the same technical effects can be achieved.
While the foregoing is directed to the preferred embodiments of the present invention, it will be appreciated by those skilled in the art that various modifications and changes can be made without departing from the principles of the present invention, and such modifications and changes are intended to be within the scope of the present invention.
Claims (5)
1. A method for processing information of hardware in a loop test, the method comprising:
obtaining a defect BUG template of a failure test case selected by a test user side;
according to the association relation between the BUG template and the failure test case, determining first field information of the BUG template, and automatically filling in fields of the BUG template;
the step of determining the first field information of the BUG template according to the association relation between the BUG template and the failure test case and automatically filling the fields of the BUG template comprises the following steps:
counting field information to be set in a BUG template, and acquiring a field to be set of the BUG template;
grouping the fields to be set, determining field information in the BUG template from the failed test case according to the association relation between each field in the BUG template and each attribute value in the test case, and obtaining an association field group associated with the failed test case;
extracting associated field information of the associated field group from the failure test case, and determining the associated field information as first field information;
filling the first field information in a field to be set of the BUG template;
the method further comprises the steps of:
receiving a BUG template with the fields;
acquiring a problem type parameter selected by a development user side according to the BUG template;
determining a field to be set of the problem type parameter according to the corresponding relation between the preset problem type and the field to be set;
acquiring second field information fed back by the development user side according to the field to be set;
and filling in the field of the problem template according to the second field information.
2. The method for processing information of hardware in loop test according to claim 1, wherein after the automatically filling out the fields of the BUG template, the method further comprises:
acquiring confirmation information fed back by the test user side after confirming the fields of the BUG template;
if the confirmation information indicates that the field of the BUG template is correct, submitting the BUG template with the field;
and if the confirmation information indicates that the field of the BUG template is wrong, acquiring the field of the BUG template modified by the test user side, and submitting the BUG template with the field.
3. An information processing apparatus of hardware-in-loop test, the apparatus comprising:
the first acquisition module is used for acquiring a defect BUG template of the failed test case selected by the test user side;
the first processing module is used for determining first field information of the BUG template according to the association relation between the BUG template and the failure test case and automatically filling in the fields of the BUG template;
the first processing module includes:
the first acquisition unit is used for counting field information needing to be set in the BUG template and acquiring a field to be set of the BUG template;
the second acquisition unit is used for grouping the fields to be set, determining that field information is extracted from the failure test case in the BUG template according to the association relation between each field in the BUG template and each attribute value in the test case, and acquiring an association field group associated with the failure test case;
the extracting unit is used for extracting the associated field information of the associated field group from the failure test case and determining the associated field information as the first field information;
the processing unit is used for filling the first field information in a field to be set of the BUG template;
the apparatus further comprises:
the receiving module is used for receiving the BUG template with the fields;
the third acquisition module is used for acquiring the problem type parameters selected by the development user side according to the BUG template;
the determining module is used for determining the field to be set of the problem type parameter according to the corresponding relation between the preset problem type and the field to be set;
a fourth obtaining module, configured to obtain second field information that is fed back by the development user side according to the field to be set;
and the second processing module is used for filling in the field of the problem template according to the second field information.
4. An information processing apparatus in a loop test of hardware according to claim 3, the apparatus further comprising:
the second acquisition module is used for acquiring confirmation information fed back after the testing user side confirms the fields of the BUG template;
the first submitting module is used for submitting the BUG template with the field if the confirmation information indicates that the field of the BUG template is correct; and if the confirmation information indicates that the field of the BUG template is wrong, acquiring the field of the BUG template modified by the test user side, and submitting the BUG template with the field.
5. A processing apparatus, comprising: memory, a processor and a computer program stored on the memory and executable on the processor, which processor implements the method for information processing in a loop test of hardware according to any of claims 1 to 2 when executing the computer program.
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| CN202010376631.9A CN113626302B (en) | 2020-05-07 | 2020-05-07 | Information processing method, device and equipment for hardware in loop test |
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| CN105068935A (en) * | 2015-09-01 | 2015-11-18 | 北京金山安全软件有限公司 | Method and device for processing software test result |
| CN107133178A (en) * | 2017-05-24 | 2017-09-05 | 郑州云海信息技术有限公司 | A kind of different-format method for automatically leading in test cases |
| CN109299002A (en) * | 2018-08-24 | 2019-02-01 | 平安科技（深圳）有限公司 | Generation method, computer readable storage medium and the terminal device of test report |
| CN109933509A (en) * | 2017-12-15 | 2019-06-25 | 北京京东尚科信息技术有限公司 | A kind of method and apparatus for realizing automatic test defect management |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10268570B2 (en) * | 2016-05-05 | 2019-04-23 | Oracle International Corporation | Methods, systems, and computer readable media for automated generation of test files and testing network equipment using same |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105068935A (en) * | 2015-09-01 | 2015-11-18 | 北京金山安全软件有限公司 | Method and device for processing software test result |
| CN107133178A (en) * | 2017-05-24 | 2017-09-05 | 郑州云海信息技术有限公司 | A kind of different-format method for automatically leading in test cases |
| CN109933509A (en) * | 2017-12-15 | 2019-06-25 | 北京京东尚科信息技术有限公司 | A kind of method and apparatus for realizing automatic test defect management |
| CN109299002A (en) * | 2018-08-24 | 2019-02-01 | 平安科技（深圳）有限公司 | Generation method, computer readable storage medium and the terminal device of test report |
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