CN113608521A - TRICON automatic simulation test system - Google Patents
TRICON automatic simulation test system Download PDFInfo
- Publication number
- CN113608521A CN113608521A CN202110910168.6A CN202110910168A CN113608521A CN 113608521 A CN113608521 A CN 113608521A CN 202110910168 A CN202110910168 A CN 202110910168A CN 113608521 A CN113608521 A CN 113608521A
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- rack
- card
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- cards
- analog
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- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 238000004088 simulation Methods 0.000 title claims abstract description 8
- 238000004891 communication Methods 0.000 claims abstract description 22
- 239000013307 optical fiber Substances 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B17/00—Systems involving the use of models or simulators of said systems
- G05B17/02—Systems involving the use of models or simulators of said systems electric
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B9/00—Safety arrangements
- G05B9/02—Safety arrangements electric
- G05B9/03—Safety arrangements electric with multiple-channel loop, i.e. redundant control systems
Abstract
The invention discloses a TRICON automatic simulation test system, which comprises a first rack, a second rack and a third rack, wherein the first rack is connected with the second rack through a first connecting rod; the first rack comprises a main processor, a plurality of types of analog input cards of the communication card and a plurality of types of analog output cards; the second machine frame is connected with the first main machine frame through an RS-485 cable, and comprises a remote communication card, a plurality of types of logic output clamping pieces, a thermocouple input card and an analog input card; the third rack is in communication connection with the second rack through optical fibers, and the third rack is configured with a remote communication card, a plurality of types of logic input cards, a logic output card and a pulse input card. The invention covers 90% of card types of the TRICON system, arranges the slot positions, integrates the ELCO cable and the corresponding ETP, and arranges the corresponding signal source for each type of card, thereby greatly saving the test time of the card, achieving that the average test of one card only needs 10 minutes, having clear test results and needing no much professional knowledge.
Description
Technical Field
The invention relates to the technical field of TRICON system testing, in particular to a TRICON automatic simulation test system.
Background
The existing test system only comprises a test rack part, so that the test system is too simple to test only part of the functions of the card, such as the detection of the minimum system and the communication function with the MP. And TRICON fastener is various, and every time complete test a card all needs to reconfigure, reconfigures ELCO cable ETP to select suitable signal source, and this has consumed a large amount of time, and on average every test a card takes probably an hour to complete the complete test, and needs professional engineer to accomplish.
Disclosure of Invention
Aiming at the defects of the prior art, the invention aims to provide a TRICON automatic simulation test system.
In order to achieve the purpose, the invention adopts the following technical scheme:
a TRICON automatic simulation test system comprises a first rack, a second rack and a third rack; the first rack is a main rack and comprises a main processor, a plurality of types of analog quantity input cards of the communication cards and a plurality of types of analog quantity output cards, wherein the communication cards, the analog quantity input cards and the analog quantity output cards are all connected with the main processor; the second rack is a local end of the high-density remote rack and is connected with the first main rack through an RS-485 cable, and the second rack comprises a remote communication card, a plurality of types of logic output clamping pieces, a thermocouple input card and an analog input card; the third rack is a far end of a high-density remote rack and is in communication connection with the second rack through an optical fiber, and the third rack is configured with a remote communication card, a plurality of types of logic quantity input cards, a logic output card and a pulse input card; each clamping piece on the first rack, the second rack and the third rack is provided with a corresponding ETP for connecting an external load signal; each clamping piece of the first rack, the second rack and the third rack is connected to an analog signal testing box through an ELCO cable, and various types of signals are simulated through the analog signal testing box to carry out channel testing; the logic input signal is a switching value, the logic output signal is an LED alarm lamp, the analog input signal is an input potentiometer, the analog output signal is a 4-20mA acquisition display, and the pulse input signal is a pulse signal generator.
Further, the model of the main processor is 3008 or 3009.
Further, the model of the communication card is 4351B.
Further, in the first rack, the models of the analog input cards comprise 3700A, 3704E and 3721, and the models of the analog output cards comprise 3805E and 3806E.
Further, in the second rack, the model of the telecommunication card is 4210 or 4201.
Further, in the second rack, the model of the thermocouple input card is 3706A, and the model of the analog input card is 3721.
Further, in rack number two, the models of the logic output cards include 3604E, 3625, 3636R and 3664.
Further, in the third rack, the model of the telecommunication card is 4211 or 4201.
Further, in rack three, the model numbers of the logic quantity input cards include 3503E and 3504E with high usage rates.
Further, in rack three, the logic output card has a model number 3625, and the pulse input card has a model number 3511.
The invention has the beneficial effects that: the invention not only covers 90% of card types of the TRICON system, arranges the slot position, integrates the ELCO cable and the corresponding ETP, but also arranges a corresponding signal source for each type of card, thereby greatly saving the test time of the card, and achieving that the average test of one card only needs 10 minutes, the test result is clear at a glance, and much professional knowledge is not needed.
Drawings
Fig. 1 is a schematic view of a first rack according to embodiment 1 of the present invention;
fig. 2 is a schematic view of the structure of a second rack in embodiment 1 of the present invention;
fig. 3 is a schematic view of the structure of a third rack in embodiment 1 of the present invention;
fig. 4 is a schematic view of a rack fastener configuration in embodiment 2 of the present invention;
fig. 5 is a schematic diagram of a configuration of card test logic in embodiment 2 of the present invention.
Detailed Description
The present invention will be further described with reference to the accompanying drawings, and it should be noted that the present embodiment is based on the technical solution, and the detailed implementation and the specific operation process are provided, but the protection scope of the present invention is not limited to the present embodiment.
Example 1
The embodiment provides a TRICON automatic simulation test system, which comprises a first rack, a second rack and a third rack; the first rack is a main rack, and as shown in fig. 1, the first rack includes a main processor 3008 or 3009, a communication card 4351B, a plurality of types of analog input cards, and a plurality of types of analog output cards, and the communication card, the analog input cards, and the analog output cards are all connected to the main processor; the second rack is a local end of the high-density remote rack and is connected with the first main rack by three RS-485 cables, and as shown in FIG. 2, the second rack comprises a remote communication card 4210 or 4201, a plurality of types of logic output cards, a thermocouple input card 3706A and an analog input card 3721; the third rack is a far end of a high-density remote rack and is in communication connection with the second rack through an optical fiber, as shown in fig. 3, the third rack is configured to include a remote communication card 4211 or 4201, a logic input card, a logic output card 3625 and a pulse input card 3511; each clamping piece on the first rack, the second rack and the third rack is provided with a corresponding ETP (external terminal board) for connecting an external load signal; each clamping piece of the first rack, the second rack and the third rack is provided with a corresponding type of test signal source, namely, the test signal source is connected to an analog signal test box through an ELCO cable, and various types of signals are simulated through the analog signal test box to carry out channel test; the logic input signal is a switching value, the logic output signal is an LED alarm lamp, the analog input signal is an input potentiometer, the analog output signal is a 4-20mA acquisition display, and the pulse input signal is a pulse signal generator.
In the embodiment, in the rack I, the models of the analog quantity input cards comprise 3700A, 3704E and 3721, and the models of the analog quantity output cards comprise 3805E and 3806E.
In this embodiment, in rack number two, the models of the logical output cards include 3604E, 3625, 3636R and 3664.
In this embodiment, in rack three, the model numbers of the logic quantity input cards include 3503E and 3504E with high usage rates.
Example 2
The present embodiment provides a method for performing an analog output channel test by using the system described in embodiment 1, which includes the following specific steps:
s1, firstly, configuring a card in TS1131 configuration software; for example, the cartridge configuration of rack one is shown in fig. 4;
s2, configuring a test logic for the card channel, as shown in FIG. 5;
s3, downloading all test logics after editing into a control system, and forcing an analog quantity output channel to output a 4-20mA signal;
and S4, the output signal can be seen in the analog quantity acquisition display, and the display channel output function is completely normal. And finishing the analog quantity output channel test.
Various corresponding changes and modifications can be made by those skilled in the art based on the above technical solutions and concepts, and all such changes and modifications should be included in the protection scope of the present invention.
Claims (10)
1. A TRICON automatic simulation test system is characterized by comprising a first rack, a second rack and a third rack; the first rack is a main rack and comprises a main processor, a plurality of types of analog quantity input cards of the communication cards and a plurality of types of analog quantity output cards, wherein the communication cards, the analog quantity input cards and the analog quantity output cards are all connected with the main processor; the second rack is a local end of the high-density remote rack and is connected with the first main rack through an RS-485 cable, and the second rack comprises a remote communication card, a plurality of types of logic output clamping pieces, a thermocouple input card and an analog input card; the third rack is a far end of a high-density remote rack and is in communication connection with the second rack through an optical fiber, and the third rack is configured with a remote communication card, a plurality of types of logic quantity input cards, a logic output card and a pulse input card; each clamping piece on the first rack, the second rack and the third rack is provided with a corresponding ETP for connecting an external load signal; each clamping piece of the first rack, the second rack and the third rack is connected to an analog signal testing box through an ELCO cable, and various types of signals are simulated through the analog signal testing box to carry out channel testing; the logic input signal is a switching value, the logic output signal is an LED alarm lamp, the analog input signal is an input potentiometer, the analog output signal is a 4-20mA acquisition display, and the pulse input signal is a pulse signal generator.
2. The system of claim 1, wherein the host processor is model 3008 or model 3009.
3. The system of claim 1, wherein the communication card has a model number of 4351B.
4. The system according to claim 1, wherein in the first rack, the models of the analog quantity input cards comprise 3700A, 3704E and 3721, and the models of the analog quantity output cards comprise 3805E and 3806E.
5. The system of claim 1, wherein the telecommunications card is model number 4210 or 4201 in rack two.
6. The system of claim 1, wherein in rack two, the thermocouple input card is model 3706A and the analog input card is model 3721.
7. The system of claim 1, wherein in bay number two, the model numbers of the logical output cards include 3604E, 3625, 3636R, and 3664.
8. The system of claim 1, wherein the telecommunications card is model 4211 or 4201 in rack three.
9. The system of claim 1, wherein in rack three, the model number of the logic quantity input card comprises 3503E and 3504E with high usage rate.
10. The system of claim 1, wherein in bay three, the logic output card has a model number 3625 and the pulse input card has a model number 3511.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110910168.6A CN113608521A (en) | 2021-08-09 | 2021-08-09 | TRICON automatic simulation test system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110910168.6A CN113608521A (en) | 2021-08-09 | 2021-08-09 | TRICON automatic simulation test system |
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| CN113608521A true CN113608521A (en) | 2021-11-05 |
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Citations (6)
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| CN105179156A (en) * | 2015-09-18 | 2015-12-23 | 中国南方电网有限责任公司调峰调频发电公司 | Offline control program testing system and method of pump storage group |
| CN105258964A (en) * | 2015-11-02 | 2016-01-20 | 哈尔滨电机厂有限责任公司 | Ventilation simulated test system of large-scale water turbine generator set |
| CN106406262A (en) * | 2016-11-25 | 2017-02-15 | 王少勇 | Monitoring system for backwashing filter |
| WO2018137147A1 (en) * | 2017-01-24 | 2018-08-02 | 北京广利核系统工程有限公司 | Self-diagnosis method for communication protocol of security-level instrumentation and control system of nuclear power plant |
| CN108922641A (en) * | 2018-05-31 | 2018-11-30 | 北京广利核系统工程有限公司 | The routine test device and method of high temperature reactor of nuclear power plant protection system |
| CN109587015A (en) * | 2019-01-28 | 2019-04-05 | 大连交通大学 | A kind of TCN-CAN network communication test platform |
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2021
- 2021-08-09 CN CN202110910168.6A patent/CN113608521A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105179156A (en) * | 2015-09-18 | 2015-12-23 | 中国南方电网有限责任公司调峰调频发电公司 | Offline control program testing system and method of pump storage group |
| CN105258964A (en) * | 2015-11-02 | 2016-01-20 | 哈尔滨电机厂有限责任公司 | Ventilation simulated test system of large-scale water turbine generator set |
| CN106406262A (en) * | 2016-11-25 | 2017-02-15 | 王少勇 | Monitoring system for backwashing filter |
| WO2018137147A1 (en) * | 2017-01-24 | 2018-08-02 | 北京广利核系统工程有限公司 | Self-diagnosis method for communication protocol of security-level instrumentation and control system of nuclear power plant |
| CN108922641A (en) * | 2018-05-31 | 2018-11-30 | 北京广利核系统工程有限公司 | The routine test device and method of high temperature reactor of nuclear power plant protection system |
| CN109587015A (en) * | 2019-01-28 | 2019-04-05 | 大连交通大学 | A kind of TCN-CAN network communication test platform |
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Application publication date: 20211105 |