CN113608009A - Half-wave voltage measuring device and method - Google Patents
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention relates to the technical field of half-wave voltage measurement, and provides a half-wave voltage measurement device and method. The device comprises an optical fiber coupler, a phase modulator, a spectrum analyzer and a chip; the optical fiber coupler is connected with the phase modulator through the two tail fibers to form the high-birefringence optical fiber loop mirror, the phase modulator modulates the first path of optical signal and the second path of optical signal respectively, so that the modulated first path of optical signal and the modulated second path of optical signal generate a fixed phase difference value, and the output transmittance of the high-birefringence optical fiber loop mirror is changed periodically, so that the half-wave voltage of the phase modulator can be accurately obtained.
Description
Technical Field
The invention relates to the technical field of half-wave voltage measurement, in particular to a half-wave voltage measurement device and method.
Background
Straight waveguide LiNbO3The phase modulator and the PZT optical fiber phase modulator are common optical fiber phase modulators in an optical fiber sensor, and particularly one of important elements in an optical fiber current transformer, so that the modulation of linearly polarized light in a single polarization direction and the modulation of orthogonal linearly polarized light can be realized.
Half-wave voltage: is a straight waveguide LiNbO3The key parameters of the phase modulator and the PZT optical fiber phase modulator refer to modulation voltage required for generating pi phase difference in a modulation optical path. Currently, commonly used methods for measuring half-wave voltage of a phase modulator include a polarization interference method, an amplitude-variable sine wave modulation method, a sawtooth wave modulation method and a step wave (square wave) modulation method, and specifically:
1) polarization interference method: the literature 'measuring phase modulation half-wave voltage by polarization interferometry' discloses a working principle of the polarization interferometry, which is based on the interference of two polarization modes in a waveguide, when sine waves are added to a modulation arm, an output signal changes along with the amplitude of the sine waves, and the half-wave voltage value can be determined through the change of the waveforms;
2) amplitude-variable sine wave modulation method: the document "variable amplitude modulation testing technique of PZT optical fiber phase modulator" discloses a variable amplitude sine wave modulation method, which forms a mach-zehnder (M-Z) interferometer by using a modulator and an optical fiber coupler, adds a variable amplitude sine wave to a modulation arm, measures a voltage value corresponding to a zero point of an output signal through a special modulation and demodulation circuit, and obtains a half-wave voltage through calculation;
3) sawtooth wave modulation method: document "study on half-wave voltage and modulation phase drift of Y waveguide modulator" 3 discloses a sawtooth wave modulation method, which comprises the steps of accessing a modulator into a light path of a Sagnac interferometer, applying sawtooth wave modulation signals at two ends of the modulator, increasing the amplitude of the sawtooth wave from 0, and observing that the amplitude of the sawtooth wave is the half-wave voltage value of the modulator when the output waveform is exactly a straight line;
4) step wave modulation method: patent 'Y waveguide modulator half-wave voltage test method and device' discloses a Sagnac interferometer-based modulator, step waves are added on the modulator, the amplitude of the step waves is increased from 0, and when the output waveform is a straight line, the amplitude of the step waves is 1/2 of the modulator half-wave voltage value.
Although the above-mentioned several measurement methods can realize the measurement of half-wave voltage, there are technical problems of complicated measurement process, difficult test device construction, higher cost and low practicability.
Disclosure of Invention
The invention aims to solve the technical problem of the prior art and provides a half-wave voltage measuring device and method.
The technical scheme of the half-wave voltage measuring device is as follows:
the device comprises an optical fiber coupler, a phase modulator, a spectrum analyzer and a chip;
the fiber coupler is used for: dividing the received original optical signal into a first path of optical signal and a second path of optical signal, and respectively transmitting the first path of optical signal and the second path of optical signal to the phase modulator through two tail fibers;
the phase modulator is configured to: respectively modulating the first path of optical signal and the second path of optical signal to enable the modulated first path of optical signal and the modulated second path of optical signal to generate a fixed phase difference value, and respectively transmitting the modulated first path of optical signal and the modulated second path of optical signal back to the optical fiber coupler through the two tail fibers to enable the modulated first path of optical signal and the modulated second path of optical signal to interfere in the optical fiber coupler to obtain an interference optical signal;
the fiber coupler is further configured to: dividing the interference optical signal into a third optical signal and a fourth optical signal, and sending the third optical signal or the fourth optical signal to the spectrum analyzer;
the spectrum analyzer is used for: analyzing the third optical signal or the fourth optical signal to obtain spectral analysis data, and sending the spectral analysis data to the chip;
the chip is used for calculating the half-wave voltage of the phase modulator according to the spectral analysis data.
The half-wave voltage measuring device has the following beneficial effects:
the optical fiber coupler is connected with the phase modulator through the two tail fibers to form the high-birefringence optical fiber loop mirror, the phase modulator modulates the first path of optical signal and the second path of optical signal respectively, so that the modulated first path of optical signal and the modulated second path of optical signal generate a fixed phase difference value, and the output transmittance of the high-birefringence optical fiber loop mirror is changed periodically, so that the half-wave voltage of the phase modulator can be accurately obtained.
On the basis of the scheme, the half-wave voltage measuring device can be further improved as follows.
Further, a modulation voltage source is included, the modulation voltage source being configured to: and applying a modulation voltage to the phase modulator so that the phase modulator modulates the first path of optical signal and the second path of optical signal respectively.
Further, the optical fiber coupler further comprises an optical source, wherein the optical source is used for transmitting the original optical signal to the optical fiber coupler.
Further, the light source is a wide spectrum light source, a sweep frequency light source or a fiber laser light source.
Further, the phase modulator is a straight waveguide LiNbO3Phase modulators or PZT fiber optic phase modulators.
The technical scheme of the half-wave voltage measuring method is as follows:
a half-wave voltage measuring apparatus using any one of the above, the method comprising:
s1, the optical fiber coupler divides the received original optical signal into a first path of optical signal and a second path of optical signal, and the first path of optical signal and the second path of optical signal are respectively transmitted to the phase modulator through two tail fibers;
s2, the phase modulator modulates the first path of optical signal and the second path of optical signal respectively to make the modulated first path of optical signal and the modulated second path of optical signal generate a fixed phase difference value, and transmits the modulated first path of optical signal and the modulated second path of optical signal back to the optical fiber coupler through the two tail fibers respectively to make the modulated first path of optical signal and the modulated second path of optical signal generate interference in the optical fiber coupler to obtain an interference optical signal;
s3, the optical fiber coupler divides the interference optical signal into a third optical signal and a fourth optical signal, and sends the third optical signal or the fourth optical signal to the optical spectrum analyzer;
s4, analyzing the third optical signal or the fourth optical signal by the spectrum analyzer to obtain spectral analysis data, and sending the spectral analysis data to the chip;
and S5, calculating the half-wave voltage of the phase modulator by the chip according to the spectral analysis data.
The half-wave voltage measuring method has the following beneficial effects:
the optical fiber coupler is connected with the phase modulator through the two tail fibers to form the high-birefringence optical fiber loop mirror, the phase modulator modulates the first path of optical signal and the second path of optical signal respectively, so that the modulated first path of optical signal and the modulated second path of optical signal generate a fixed phase difference value, and the output transmittance of the high-birefringence optical fiber loop mirror is changed periodically, so that the half-wave voltage of the phase modulator can be accurately obtained.
Drawings
Fig. 1 is a schematic structural diagram of a half-wave voltage measurement apparatus according to an embodiment of the present invention;
fig. 2 is a second schematic structural diagram of a half-wave voltage measuring apparatus according to an embodiment of the present invention;
fig. 3 is a third schematic structural diagram of a half-wave voltage measuring apparatus according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of the output transmittance curve of a high birefringence fiber optic ring mirror based on a broad spectrum light source and a spectrum analyzer;
FIG. 5 is a graph of the output transmittance of a high birefringence fiber optic ring mirror with the modulation voltage set to 1V;
FIG. 6 is a spectral plot of an output optical signal of a swept-frequency optical source;
FIG. 7 is a graph of the output spectrum of a fiber laser source;
fig. 8 is a schematic flow chart of a half-wave voltage measurement method according to an embodiment of the present invention.
Detailed Description
As shown in fig. 1, a half-wave voltage measuring apparatus according to an embodiment of the present invention includes an optical fiber coupler 1, a phase modulator 2, a spectrum analyzer 3, and a chip;
the optical fiber coupler 1 is used for: dividing the received original optical signal into a first path of optical signal and a second path of optical signal, and respectively transmitting the first path of optical signal and the second path of optical signal to the phase modulator 2 through two tail fibers;
the two pigtails are respectively a first pigtail 4 and a second pigtail 5, the phase modulator 2 is provided with a first optical fiber port and a second optical fiber port, the optical fiber coupler 1 is connected with the first optical fiber port of the phase modulator 2 through the first pigtail 4, the optical fiber coupler 1 is connected with the second optical fiber port of the phase modulator 2 through the second pigtail 5, or the optical fiber coupler 1 is connected with the first optical fiber port of the phase modulator 2 through the second pigtail 5, and the optical fiber coupler 1 is connected with the second optical fiber port of the phase modulator 2 through the first pigtail 4;
the first path of optical signal is transmitted to the phase modulator 2 through the first tail fiber 4, and the second path of optical signal is transmitted to the phase modulator 2 through the second tail fiber 5, or the first path of optical signal is transmitted to the phase modulator 2 through the second tail fiber 5, and the second path of optical signal is transmitted to the phase modulator 2 through the first tail fiber 4.
The phase modulator 2 is configured to: respectively modulating the first path of optical signal and the second path of optical signal to enable the modulated first path of optical signal and the modulated second path of optical signal to generate a fixed phase difference value, and respectively transmitting the modulated first path of optical signal and the modulated second path of optical signal back to the optical fiber coupler 1 through the two tail fibers to enable the modulated first path of optical signal and the modulated second path of optical signal to interfere in the optical fiber coupler 1 to obtain an interference optical signal;
the fiber coupler 1 is further configured to: dividing the interference optical signal into a third optical signal and a fourth optical signal, and sending the third optical signal or the fourth optical signal to the spectrum analyzer 3;
a third pigtail 6 is connected between the optical fiber coupler 1 and the optical spectrum analyzer 3, and specifically, a third optical signal or a fourth optical signal is sent to the optical spectrum analyzer 3 through the third pigtail 6;
the spectrum analyzer 3 is configured to: analyzing the third optical signal or the fourth optical signal to obtain spectral analysis data, and sending the spectral analysis data to the chip;
the chip is used for calculating the half-wave voltage of the phase modulator 2 according to the spectral analysis data.
The optical fiber coupler 1 is connected with the phase modulator 2 through two tail fibers to form a high birefringence optical fiber ring mirror, namely the optical fiber coupler 1, the first tail fiber 4, the second tail fiber 5 and the phase modulator 2 are connected to form the high birefringence optical fiber ring mirror, the phase modulator 2 modulates the first path of optical signal and the second path of optical signal respectively, so that the modulated first path of optical signal and the modulated second path of optical signal generate a fixed phase difference value, and the output transmittance of the high birefringence optical fiber ring mirror is changed periodically, so that the half-wave voltage of the phase modulator 2 can be accurately obtained, the measuring process is simple, the measuring device is simple to build, the cost is low, and the practicability is high.
As shown in fig. 3, the half-wave voltage measuring apparatus further includes a light source 8, where the light source 8 is configured to send the original optical signal to the optical fiber coupler 1, and the light source 8 is a wide-spectrum light source swept light source or an optical fiber laser light source.
It should be noted that a fourth pigtail 9 is connected between the light source 8 and the optical fiber coupler 1, and the light source 8 sends an original optical signal to the optical fiber coupler 1 through the fourth pigtail 9;
the phase modulator 2 is a straight waveguide LiNbO3 phase modulator or a PZT optical fiber phase modulator.
The following describes a process of calculating the half-wave voltage of the phase modulator 2, specifically:
1) obtaining a fixed phase difference value deltaφThe relationship with the normalized transmittance T' of the high birefringence fiber ring mirror is shown in the formula:
the normalized transmittance T 'is obtained by normalizing the output transmittance T of the high birefringence fiber loop mirror, neglecting the loss introduced by the high birefringence fiber loop mirror and the attenuation coefficient introduced by the azimuth angle relative to the reference coordinate axis when the high birefringence fiber loop mirror is formed by welding the pigtail in the optical path, so as to facilitate high birefringence analysis, and the normalized transmittance T' avoids the influence on the calculated half-wave voltage caused by the splitting ratio of the first path of optical signal and the second path of optical signal, and the splitting ratio of the third path of optical signal and the fourth path of optical signal;
that is, the optical fiber coupler 1 with the splitting ratio of 50:50 is selected, at this time, the splitting ratio of the first optical signal to the second optical signal is 50:50, and the splitting ratio of the third optical signal to the fourth optical signal is 50:50, so as to facilitate subsequent calculation, and since the normalized transmittance T' is obtained after normalization, the measurement of the half-wave voltage is not affected when the splitting ratio of the first optical signal to the second optical signal and the splitting ratio of the third optical signal to the fourth optical signal are other values.
2) When the transmittance T of the high birefringent ring mirror is analyzed, the transmittance T changes periodically with the increase in the wavelength of the optical signal when the phase difference due to birefringence in the high birefringent ring mirror is constant, as shown in fig. 4. Wherein, if the wavelength of the light is lambda = lambda0The transmittance T of the film is observed when the transmittance T | λ is=λ0When the value changes by 1 cycle, the phase difference due to birefringence changes by 2 π. Thus, the calculation of the half-wave voltage to implement the phase modulator 2 can be carried out by two methods, in particular:
phi the modulation voltage of the phase modulator 2 increases from 0 and the recording light wavelength lambda = lambda0The half-wave voltage of the phase modulator 2 can be calculated by the periodic variation of the transmittance T | λ = λ 0 value according to the variation of the modulation voltage;
secondly, the modulation voltage of the phase modulator 2 is increased from 0, the magnitude of the shift value of the extreme value (maximum value or minimum value) in the transmittance T curve on the spectrum is recorded, and the half-wave voltage of the phase modulator 2 can be calculated according to the period value of the transmittance T curve.
Wherein, the first path of modulated optical signal and the second path of modulated optical signal are obtained by calculation to generate a fixed phase difference value deltaφThe process of (2) is as follows:
for a straight waveguide phase modulator: the phase difference value delta phi generated by orthogonal linearly polarized light e light and o light in the straight waveguide phase modulator is as follows:
wherein n ise、noRefractive indices, gamma, of e-light and o-light, respectively, in straight waveguide phase modulators13、γ33Electro-optic coefficients, L, along the transverse and longitudinal directions, respectively, of a straight waveguide phase modulator1Is the waveguide length in a straight waveguide phase modulator, G is the spacing of the planar electrodes in the straight waveguide phase modulator,
v is the overlap integral factor of the electric field and the optical field, and is the applied voltage of the straight waveguide phase modulator. When the applied voltage of the straight waveguide phase modulator is 1V, the transmittance T curve of the high birefringent fiber ring mirror is shown in fig. 5.
For a PZT fiber phase modulator:
wherein, in the step (A),K P to show that the phase change generated by applying the unit modulation voltage to the PZT optical fiber phase modulator is related to the optical signal wavelength lambda,K P and V is applied voltage of the PZT optical fiber phase modulator.
In summary, as the modulation voltage V of the phase modulator 2 increases from 0, when the optical signal wavelength λ = λ0When the optical phase difference value delta phi =2 pi, the output transmittance T' of the high birefringent fiber ring mirror changes periodically, and then the modulation voltage V at the moment is calculated to be 2 times of the half-wave voltage V of the phase modulator 2πI.e. Vπ=V/2。
As shown in fig. 2, preferably, in the above technical solution, the apparatus further includes a modulation voltage source 7, where the modulation voltage source 7 is configured to: and applying a modulation voltage to the phase modulator 2, so that the phase modulator 2 modulates the first optical signal and the second optical signal respectively.
In one embodiment, the phase modulator 2 is a straight waveguide phase modulator, the light source 8 is an SLD light source, and the spectrum analyzer 3 is an AQ6370 spectrum analyzer 3, according to the formula
And
it can be seen that λ = λ for the optical signal wavelength0The relationship between the normalized transmittance T' output from the spectrum analyzer 3 and the modulation voltage V is:
As shown in FIGS. 4 and 5, when the modulation voltage V is increased from 0 to 1V, the transmittance T curve is red-shifted and has a period of 1.324nm, and a transmittance value T | λ with λ 0=1300nm as an observation point0=1300nm from 0 to 0.5.
In another embodiment, the phase modulator 2 is a straight waveguide phase modulator, the light source 8 is a swept-frequency light source, the spectrum analyzer 3 is a photodetector, and the swept-frequency light source outputs an optical signal as shown in fig. 6. If the Trigger signal (Trigger) is controlled to adjust the output optical signal of the swept-frequency light source, the power waveform of the optical signal measured by the Trigger photodetector is similar to the transmittance curve in fig. 4. Similar to the testing method of the testing device based on the broad spectrum light source 8 and the spectrum analyzer 3, the modulation voltage V is increased from 0 by recording the analysis distance trigger time τ0When the light power is periodically changed, the half-wave voltage V of the phase modulator 2 can be calculatedπ。
In another embodiment, the phase modulator 2 is a straight waveguide phase modulator, the light source 8 is a fiber laser light source, and the spectrum analyzer 3 is a photodetector. The output spectrum of the fiber laser light source is shown in fig. 7. Because the-3 dB spectral width of the optical fiber laser light source is narrow (< 2 nm), the filtering action of the phase modulator 2 measuring device is related to the modulation voltage, when the modulation voltage changes, the filtering curve of the phase modulator 2 measuring device drifts, so the output signal of the photoelectric detector periodically changes along with the modulation voltage, and the change period is 2 times of the half-wave voltage Vπ。
As shown in fig. 8, a half-wave voltage measuring method according to an embodiment of the present invention employs any one of the half-wave voltage measuring apparatuses described above, and the method includes:
s1, the optical fiber coupler 1 divides the received original optical signal into a first path of optical signal and a second path of optical signal, and transmits the first path of optical signal and the second path of optical signal to the phase modulator 2 through two tail fibers respectively;
s2, the phase modulator 2 modulates the first optical signal and the second optical signal respectively to generate a fixed phase difference value between the modulated first optical signal and the modulated second optical signal, and transmits the modulated first optical signal and the modulated second optical signal back to the optical fiber coupler 1 through the two pigtails respectively, so that the modulated first optical signal and the modulated second optical signal interfere with each other in the optical fiber coupler 1 to obtain an interference optical signal;
s3, the optical fiber coupler 1 splits the interference optical signal into a third optical signal and a fourth optical signal, and sends the third optical signal or the fourth optical signal to the optical spectrum analyzer 3;
s4, the spectrum analyzer 3 analyzes the third optical signal or the fourth optical signal to obtain spectrum analysis data, and sends the spectrum analysis data to the chip;
and S5, calculating the half-wave voltage of the phase modulator 2 by the chip according to the spectral analysis data.
The optical fiber coupler 1 is connected with the phase modulator 2 through two tail fibers to form a high birefringence optical fiber loop mirror, the phase modulator 2 modulates a first path of optical signal and a second path of optical signal respectively, so that the modulated first path of optical signal and the modulated second path of optical signal generate a fixed phase difference value, and the output transmittance of the high birefringence optical fiber loop mirror is changed periodically, so that the half-wave voltage of the phase modulator 2 can be accurately obtained, the measuring process is simple, the measuring device is simple to build, the cost is low, and the practicability is high.
The above steps for realizing the corresponding functions of the components in the half-wave voltage measurement method of the present invention may refer to the above parameters and steps in the embodiment of the half-wave voltage measurement apparatus, which are not described herein again.
In the present invention, the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (6)
1. A half-wave voltage measuring device is characterized by comprising an optical fiber coupler, a phase modulator, a spectrum analyzer and a chip;
the fiber coupler is used for: dividing the received original optical signal into a first path of optical signal and a second path of optical signal, and respectively transmitting the first path of optical signal and the second path of optical signal to the phase modulator through two tail fibers;
the phase modulator is configured to: respectively modulating the first path of optical signal and the second path of optical signal to enable the modulated first path of optical signal and the modulated second path of optical signal to generate a fixed phase difference value, and respectively transmitting the modulated first path of optical signal and the modulated second path of optical signal back to the optical fiber coupler through the two tail fibers to enable the modulated first path of optical signal and the modulated second path of optical signal to interfere in the optical fiber coupler to obtain an interference optical signal;
the fiber coupler is further configured to: dividing the interference optical signal into a third optical signal and a fourth optical signal, and sending the third optical signal or the fourth optical signal to the spectrum analyzer;
the spectrum analyzer is used for: analyzing the third optical signal or the fourth optical signal to obtain spectral analysis data, and sending the spectral analysis data to the chip;
the chip is used for calculating the half-wave voltage of the phase modulator according to the spectral analysis data.
2. A half-wave voltage measuring device according to claim 1, further comprising a modulation voltage source for: and applying a modulation voltage to the phase modulator so that the phase modulator modulates the first path of optical signal and the second path of optical signal respectively.
3. A half-wave voltage measuring device according to claim 1, further comprising a light source for transmitting said original optical signal to said fiber coupler.
4. A half-wave voltage measuring device according to claim 3, wherein said light source is a broad spectrum light source, a swept frequency light source or a fiber laser light source.
5. A half-wave voltage measuring device according to any one of claims 1 to 4, characterized in that said phase modulator is a straight waveguide LiNbO3Phase modulators or PZT fiber optic phase modulators.
6. A half-wave voltage testing method, characterized in that a half-wave voltage measuring device of any one of claims 1 to 5 is used, the method comprising:
s1, the optical fiber coupler divides the received original optical signal into a first path of optical signal and a second path of optical signal, and the first path of optical signal and the second path of optical signal are respectively transmitted to the phase modulator through two tail fibers;
s2, the phase modulator modulates the first path of optical signal and the second path of optical signal respectively to make the modulated first path of optical signal and the modulated second path of optical signal generate a fixed phase difference value, and transmits the modulated first path of optical signal and the modulated second path of optical signal back to the optical fiber coupler through the two tail fibers respectively to make the modulated first path of optical signal and the modulated second path of optical signal generate interference in the optical fiber coupler to obtain an interference optical signal;
s3, the optical fiber coupler divides the interference optical signal into a third optical signal and a fourth optical signal, and sends the third optical signal or the fourth optical signal to the optical spectrum analyzer;
s4, analyzing the third optical signal or the fourth optical signal by the spectrum analyzer to obtain spectral analysis data, and sending the spectral analysis data to the chip;
and S5, calculating the half-wave voltage of the phase modulator by the chip according to the spectral analysis data.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090290165A1 (en) * | 2006-12-22 | 2009-11-26 | Abb Research Ltd. | Optical high voltage sensor |
| CN105717344A (en) * | 2016-04-01 | 2016-06-29 | 华南师范大学 | Phase-modulator half-wave voltage measuring system and measuring method |
| CN106768867A (en) * | 2017-02-24 | 2017-05-31 | 北京世维通光智能科技有限公司 | LiNbO3Phase-modulator performance detecting system |
| CN213693704U (en) * | 2020-12-02 | 2021-07-13 | 北京世维通光智能科技有限公司 | PZT phase modulator modulation depth measuring system |
| CN214040590U (en) * | 2020-12-30 | 2021-08-24 | 科大国盾量子技术股份有限公司 | Performance index measuring device of polarization maintaining optical fiber device |
-
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- 2021-10-09 CN CN202111173572.6A patent/CN113608009A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090290165A1 (en) * | 2006-12-22 | 2009-11-26 | Abb Research Ltd. | Optical high voltage sensor |
| CN105717344A (en) * | 2016-04-01 | 2016-06-29 | 华南师范大学 | Phase-modulator half-wave voltage measuring system and measuring method |
| CN106768867A (en) * | 2017-02-24 | 2017-05-31 | 北京世维通光智能科技有限公司 | LiNbO3Phase-modulator performance detecting system |
| CN213693704U (en) * | 2020-12-02 | 2021-07-13 | 北京世维通光智能科技有限公司 | PZT phase modulator modulation depth measuring system |
| CN214040590U (en) * | 2020-12-30 | 2021-08-24 | 科大国盾量子技术股份有限公司 | Performance index measuring device of polarization maintaining optical fiber device |
Non-Patent Citations (2)
| Title |
|---|
| 明海主编: "《光子科技创新与产业化——长三角光子科技创新论坛暨2006年安徽博士科技论坛论文集》", 27 November 2006 * |
| 第31卷: "基于萨尼亚克光纤干涉仪的相位调制器半波电压的测量方法", 《光学学报》 * |
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