CN113590393A - Intelligent equipment testing method and device, electronic equipment and storage medium - Google Patents
Intelligent equipment testing method and device, electronic equipment and storage medium Download PDFInfo
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- CN113590393A CN113590393A CN202110771765.5A CN202110771765A CN113590393A CN 113590393 A CN113590393 A CN 113590393A CN 202110771765 A CN202110771765 A CN 202110771765A CN 113590393 A CN113590393 A CN 113590393A
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The embodiment of the application discloses an intelligent device testing method, an intelligent device testing device, electronic equipment and a storage medium; the method and the device for testing the intelligent device can acquire the testing configuration information aiming at the intelligent device; sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction; sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction; receiving test state information sent by intelligent equipment and test feedback information sent by a tester; and a test report of the intelligent equipment is generated according to the test state information and the test feedback information, so that the efficiency of carrying out complete machine test on the intelligent equipment is improved.
Description
Technical Field
The application relates to the technical field of communication, in particular to an intelligent device testing method and device, electronic equipment and a storage medium.
Background
After a type of intelligent equipment is developed, the developed intelligent equipment can be put into production and use after the intelligent equipment is subjected to complete machine testing. When the intelligent device is subjected to the complete machine test, due to the particularity of the intelligent device (for example, the intelligent device depends on more manual actions and has high dependence on a test environment, and the like), the complete machine test on the intelligent device can be realized only by manually simulating the real use condition of the intelligent device when the intelligent device is tested, and the automatic test cannot be realized by means of scripts like the software test. And the whole machine test is carried out on the intelligent equipment manually, so that the efficiency of the whole machine test on the intelligent equipment is reduced.
Disclosure of Invention
The embodiment of the application provides an intelligent device testing method and device, an electronic device and a storage medium, and the efficiency of complete machine testing on the intelligent device can be improved.
The embodiment of the application provides an intelligent device testing method, which comprises the following steps:
acquiring test configuration information aiming at the intelligent equipment;
sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction;
sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction;
receiving test state information sent by intelligent equipment and test feedback information sent by the tester;
and generating a test report of the intelligent equipment according to the test state information and the test feedback information.
Correspondingly, this application embodiment still provides an intelligent equipment testing arrangement, includes:
the intelligent device comprises a first receiving unit, a second receiving unit and a control unit, wherein the first receiving unit is used for acquiring test configuration information aiming at the intelligent device;
the first sending unit is used for sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction;
the second sending unit is used for sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction;
the second receiving unit is used for receiving test state information sent by the intelligent equipment and test feedback information sent by the tester;
and the generating unit is used for generating a test report of the intelligent equipment according to the test state information and the test feedback information.
In an embodiment, the first sending unit may include:
the information analysis subunit is used for analyzing the test configuration information to obtain at least one piece of operation mode test information, wherein one piece of operation mode test information comprises information configured for one operation mode of the intelligent equipment;
the instruction generating subunit is configured to generate at least one test starting instruction according to the at least one operation mode test information, where one operation mode test information corresponds to one test starting instruction;
and the instruction sending subunit is configured to send the at least one test starting instruction to the intelligent device according to a preset operation mode test sequence.
In one embodiment, the instruction generation subunit may include:
the coding module is used for coding the running mode test information by utilizing a preset communication protocol according to the running mode test information to obtain target format test information;
and the packaging module is used for packaging the target format test information to obtain the test starting instruction.
In an embodiment, the second sending unit may include:
the information identification subunit is used for carrying out information identification on the running mode test information to obtain the test attribute of the running mode test information;
the screening subunit is used for screening a target tester from the at least one tester according to the test attributes;
the instruction generating subunit is used for generating a test monitoring instruction according to the test attribute and the target tester;
and the instruction sending subunit is used for sending the test monitoring instruction to the target tester.
In an embodiment, the screening subunit may include:
the acquisition module is used for acquiring the functional attribute of each tester;
the matching module is used for matching the test attribute with the function attribute to obtain a matching result;
and the screening module is used for screening the target tester from the at least one tester according to the matching result.
In one embodiment, the instruction generation subunit may include:
the attribute association module is used for performing attribute association processing on the test attribute and the functional attribute to obtain test monitoring information;
and the format conversion module is used for carrying out format conversion processing on the test monitoring information to obtain a test monitoring instruction.
In an embodiment, the generating unit may include:
the information identification subunit is used for respectively carrying out information identification processing on the test state information and the test feedback information to obtain test state parameters of the test state information and test feedback parameters of the test feedback information;
the parameter association subunit is used for associating the test state parameter with the test feedback parameter to obtain an association relation between the test state parameter and the test feedback parameter;
and the generating subunit is used for generating a test report of the intelligent equipment according to the incidence relation.
Correspondingly, the embodiment of the application also provides an electronic device, which comprises a memory and a processor; the memory stores a computer program, and the processor is used for operating the computer program in the memory to execute the intelligent device testing method provided by any one of the embodiments of the application.
Correspondingly, an embodiment of the present application further provides a storage medium, where the storage medium stores a computer program, and the computer program, when executed by a processor, implements the intelligent device testing method provided in any embodiment of the present application.
The method and the device for testing the intelligent device can acquire the testing configuration information aiming at the intelligent device; sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction; sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction; receiving test state information sent by intelligent equipment and test feedback information sent by a tester; and generating a test report of the intelligent equipment according to the test state information and the test feedback information, so that the efficiency of carrying out complete machine test on the intelligent equipment can be improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic view of a scenario of an intelligent device testing method provided in an embodiment of the present application;
fig. 2 is a schematic flowchart of an intelligent device testing method provided in an embodiment of the present application;
FIG. 3 is a schematic structural diagram of a testing apparatus provided in an embodiment of the present application;
FIG. 4 is a schematic structural diagram of a testing apparatus provided in the present application;
FIG. 5 is a schematic structural diagram of a testing apparatus provided in the present application;
FIG. 6 is a schematic structural diagram of a testing apparatus provided in the present application;
fig. 7 is a schematic structural diagram of an electronic device provided in an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, however, the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the application provides an intelligent device testing method, which can be executed by a testing device, and the testing device can be integrated in electronic equipment. The electronic device may include a terminal, a server, and the like. For example, the intelligent device testing method may be executed by a terminal or a server.
The terminal may include a smart phone, a tablet Computer, a notebook Computer, a Personal Computer (PC), and the like.
The server may be an interworking server among a plurality of heterogeneous systems or a background server of a product verification test system, may be an independent physical server, may also be a server cluster or distributed system formed by a plurality of physical servers, and may also be a cloud server providing basic cloud computing services such as cloud service, a cloud database, cloud computing, cloud functions, cloud storage, network service, cloud communication, middleware service, domain name service, security service, big data, an artificial intelligence platform, and the like.
The intelligent terminal can comprise various internet of things devices. For example, the smart terminal may include a smart home or the like. The smart home may include an intelligent washing machine, an intelligent microwave oven, an intelligent refrigerator, an intelligent oven, an intelligent air conditioner, and the like.
In an embodiment, as shown in fig. 1, the testing apparatus may be integrated on an electronic device such as a terminal or a server, so as to implement the intelligent device testing method provided in the embodiment of the present application. Specifically, the electronic device may obtain test configuration information for the smart device; sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction; sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction; receiving test state information sent by intelligent equipment and test feedback information sent by a tester; and generating a test report of the intelligent equipment according to the test state information and the test feedback information.
The following are detailed below, and it should be noted that the order of description of the following examples is not intended to limit the preferred order of the examples.
The embodiments of the present application will be described from the perspective of a test apparatus, which may be integrated in an electronic device, which may include a terminal or a server, etc.
As shown in fig. 2, a method for testing an intelligent device is provided, which comprises the following specific processes:
101. test configuration information for the intelligent device is obtained.
The smart device may include a device having a sensitive and accurate sensing function, a correct judging function, and an effective execution function. For example, a smart device may include a smart home or the like. For example, the smart device may include a smart washer, a smart microwave, a smart refrigerator, a smart oven, a smart air conditioner, and the like.
The test configuration information comprises information configured on the electronic equipment by a tester before the tester tests the intelligent equipment through the electronic equipment. According to the test configuration information, the electronic device can know the flow steps according to which the intelligent device is tested.
In one embodiment, when the electronic device is a terminal, a tester may configure test configuration information through a test platform on the terminal.
The test platform can be used for resource management and analysis of tests, including test project information management, test laboratory resource management, data management, and the like. Through the test platform, the tester can associate information such as the tester, test items, a responsible person, an instrument used in the test process, when to test and the like together, thereby forming test configuration information.
Optionally, the test platform may include functional components such as test configuration, resource allocation, progress display, and data management.
The test configuration component can acquire test configuration information input by a tester. For example, a test configuration table may be included in the test configuration component, and the format configuration table may provide test configuration information input by a tester, so that the test configuration component obtains the test configuration information input by the tester. For example, the test configuration component may obtain the test project name, test scope, etc. entered by the tester.
The resource allocation component may schedule a test time and resources required in the test process according to the test configuration information, and the like. For example, after receiving the test configuration information sent by the test configuration component, the test allocation component may schedule the testing time and the resources required in the testing process for the tester in combination with the test configuration information and the current testing resources.
The progress display component can collect information generated in the testing process and store the information generated in the testing process. When a tester needs to check the test progress and the information generated in the test process, the progress display component can display the information generated in the test process on the test platform.
Wherein, the data management component can manage the data depended on in the test process. For example, the data management module may manage test specifications, test logs, test reports, and the like. When the tester needs to check the test data, the data management component can display the test data so as to be checked by the tester.
In an embodiment, when a tester needs to test a certain type of intelligent device, the tester can input test configuration information through a test platform on a terminal, so that the terminal can acquire the test configuration information for the intelligent device.
For example, when a tester needs to test the intelligent washing machine, the tester can input test configuration information through a test platform on the terminal. Then, the terminal can acquire the test configuration information for the intelligent washing machine. For another example, when a tester needs to test the intelligent air conditioner, the tester may input test configuration information through a test platform on the terminal. Then, the terminal can acquire test configuration information for the intelligent air conditioner.
102. And sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction.
In an embodiment, after receiving the test configuration information, the electronic device may send a test start instruction to the intelligent device according to the test configuration information, so that the intelligent device executes a corresponding test operation according to the test start instruction.
For example, after the notebook computer receives the test configuration information, the notebook computer may send a test start instruction to the intelligent device according to the test configuration information, so that the intelligent device executes a corresponding test operation according to the test start instruction.
The test starting instruction comprises an instruction which can control the intelligent equipment to execute corresponding test operation according to the test configuration information.
For example, the test configuration information sets that the intelligent device performs the test operation according to step 1, step 2 and step 3. According to the test starting instruction, the intelligent device can execute the test operation according to the step 1, the step 2 and the step 3.
Wherein the test operation comprises an operation for the smart device to perform its function.
For example, when the intelligent device is an intelligent washing machine, if the functions of the intelligent washing machine include functions of washing, dewatering, temperature control, reminding, and the like, the test operation may be an operation for causing the intelligent washing machine to perform the functions of washing, dewatering, temperature control, reminding, and the like.
For another example, when the smart device is a smart air conditioner, if the functions of the smart air conditioner include functions of cooling, dehumidifying, heating, purifying air, and increasing the concentration of negative ions in air, the test operation may be an operation of causing the smart washing machine to perform the functions of cooling, dehumidifying, heating, purifying air, and increasing the concentration of negative ions in air.
In an embodiment, since the application scenarios of the smart device may be different, in order to enable the smart device to adapt to various different application scenarios, the smart device may often have a plurality of operation modes.
For example, when the smart device is a smart air conditioner, the operation modes of the smart air conditioner may include a heating mode, a cooling mode, an automatic mode, a dehumidifying mode, and a sleep mode, etc.
For another example, when the smart device is a smart washing machine, the operation mode of the smart washing machine may include a hybrid washing mode, a quick washing mode, a bulk washing mode, a wool washing mode, a smart washing mode, an immersion washing mode, an energy saving mode, and the like.
For another example, when the smart device is a smart oven, the operation mode of the smart oven may include a fast heating mode, a baking mode, and the like.
Each operation mode of the intelligent device is composed of a plurality of functions of the intelligent device, and only the mode of function composition between each operation mode may be different.
For example, both the hybrid wash mode and the quick wash mode of an intelligent washing machine may consist of two steps of washing and dewatering. Among them, in the mixed washing mode, the washing time may be 1 hour, and in the quick washing mode, the washing time may be 10 minutes.
In an embodiment, when a tester configures a test process of the intelligent device, the tester may configure the test process of the intelligent device according to an operation mode of the intelligent device. Therefore, when the terminal sends a test starting instruction to the intelligent device according to the test configuration information, the terminal can analyze the test configuration information so as to obtain the running mode test information. Then, the terminal can send a test starting instruction to the intelligent device according to the running mode test information. Specifically, the step of sending a test start instruction to the intelligent device according to the test configuration information may include:
analyzing the test configuration information to obtain at least one operation mode test information, wherein one operation mode test information comprises information configured for one operation mode of the intelligent equipment;
generating at least one test starting instruction according to at least one piece of operation mode test information, wherein one piece of operation mode test information corresponds to one test starting instruction;
and sending at least one test starting instruction to the intelligent equipment according to a preset running mode test sequence.
In an embodiment, after the terminal receives the test configuration information for the intelligent washing machine, the terminal may parse the test configuration information to obtain at least one operation mode test information.
When the terminal analyzes the test configuration information, the terminal can perform traversal identification on the test configuration information, so that at least one operation mode test information for the intelligent washing machine is obtained. For example, the terminal may perform traversal recognition on the test configuration information, thereby obtaining 5 pieces of operation mode test information for the intelligent washing machine. For example, the 5 operation mode test information may include hybrid wash mode test information, quick wash mode test information, bulk wash mode test information, wool wash mode test information, smart wash mode test information, and the like.
In an embodiment, after the terminal obtains the at least one operation mode test information, the terminal may generate at least one test start instruction according to the at least one operation mode test information. Wherein, one piece of operation mode test information corresponds to one test starting instruction.
For example, the operation mode test information of the intelligent washing machine may include hybrid washing mode test information, quick washing mode test information, bulk washing mode test information, wool washing mode test information, and intelligent washing mode test information.
Then, after the terminal obtains the intelligent mode test information of the intelligent washing machine, a corresponding mode test instruction can be generated according to each mode test information. For example, the terminal may generate a mixed washing mode test instruction according to the mixed washing mode test information; generating a quick washing mode test instruction according to the quick washing mode test information; generating a large workpiece washing mode test instruction according to the large workpiece washing mode test information; generating a wool mode test instruction according to the wool washing mode test information; and generating an intelligent washing mode test instruction according to the intelligent washing mode test information.
In an embodiment, in order to enable the intelligent device to recognize the test start instruction and correctly execute the test operation according to the test instruction, when the terminal generates the test start instruction according to the operation mode test information, the terminal may generate the test start instruction according to a preset communication protocol. Specifically, the step of generating at least one operation starting instruction according to at least one operation mode test information may include:
according to the running mode test information, coding the running mode test information by using a preset communication protocol to obtain target format test information;
and packaging the target format test information to obtain a test starting instruction.
The preset communication protocol comprises rules to be followed when the intelligent equipment communicates with the terminal. For example, the preset communication protocol may include an object model.
Wherein the object model may comprise a digitized description of the device. The object model describes, digitally, what a device is, what it can do, what information can be provided externally, and the like, from three dimensions of the device's attributes, functions, and events.
Wherein the attributes of the device are generally used to describe the state of the device.
The method of the device may include, among other things, capabilities or methods that the device may be called externally.
The event of the device comprises an event for describing the report cloud server.
For example, the object model may include a digital description corresponding to each operating mode of the smart device. For example, when the smart device is a smart washer, the digital description of the hybrid wash mode may be "1235982", the digital description of the quick wash mode may be "7589624", the digital description of the bulk wash mode may be "4265469", and so on.
In an embodiment, when the object model is used to encode the operation mode test information, the operation mode test information may be encoded by using the digital description of the operation mode of the intelligent device in the object model, so as to obtain the target format test information.
For example, the operation mode test information and the digital description of the operation mode in the object model may be spliced to obtain the target format test information.
For another example, the running mode test information and the digital description of the running mode in the object model can be subjected to complex logic operation, so as to obtain the target format test information.
In an embodiment, after obtaining the target format test information, the terminal may perform package processing on the target format test information, so as to obtain the test start instruction.
For example, the communication address of the intelligent device can be added to the target format test information, and the target format test information is subjected to information filling, so that the test starting instruction conforms to the transmission format, and can be accurately transmitted to the intelligent device. When the target format test information is filled with information, a value of 0 can be added to the target format test information, so that the target format test information conforms to the transmission format.
In an embodiment, after the terminal generates the test start instruction, the test start instruction may be sent to the intelligent device according to a preset operation mode test sequence, so that the intelligent device may execute a corresponding test operation according to the preset operation mode test sequence.
For example, when the smart device is a smart washing machine, since the test sequence in which the operation modes are specified in the preset operation mode test sequence is a mixed washing mode, a quick washing mode, a large piece washing mode, a wool washing mode, and a smart washing mode. Therefore, the terminal can firstly send the mixed washing mode test instruction to the intelligent device according to the preset operation mode test sequence. And then, sending the quick washing mode test instruction to the intelligent equipment. And then, sending the large piece washing mode test instruction to the intelligent equipment. And then, sending the wool pattern test instruction to the intelligent equipment. And finally, sending the intelligent washing mode test instruction to the intelligent equipment.
Then, the intelligent washing machine can execute corresponding test operation according to the sequence of receiving the test starting instruction. For example, the intelligent washing machine receives the mixed washing mode test instruction and the quick washing mode test instruction in sequence, so that the intelligent washing machine automatically executes the operation corresponding to the mixed washing mode first. After the intelligent washing machine executes the operation corresponding to the mixed washing mode, the intelligent washing machine executes the operation corresponding to the quick washing mode.
In one embodiment, before the terminal sends the test start instruction to the intelligent device, a communication link can be established between the terminal and the intelligent device. For example, a Wifi link, a bluetooth link, etc. may be established between the terminal and the smart device. For example, when the terminal sends a test starting instruction to the intelligent device, the terminal can send the test starting instruction to the cloud server through the Wifi link, so that the cloud server forwards the test starting instruction to the intelligent device. For another example, when the terminal sends the test start instruction to the smart device, the terminal may send the test start instruction to the smart device through the bluetooth link.
103. Sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction;
the tester comprises an instrument capable of monitoring the testing process of the intelligent equipment and acquiring information. For example, the test instruments may include power meters, tachometers, and thermocouples, among others.
The power meter may include a meter that measures and collects electrical power of the smart device. For example, a power meter may be connected to the smart device such that the power meter measures and collects the electrical power of the smart device. Wherein, the power meter can be various brands of power meters. For example, the power meter may be a wisdom 8775B1, and so on.
The tachometer comprises an instrument capable of measuring and collecting the rotation speed of the intelligent device. For example, a tachometer may be used to connect to the smart device, such that the tachometer measures and collects the rotational speed of the smart device. Wherein, the tachometer can be various brands' tachometers. For example, the tachometer may be a flying enrhol S12 single chip microcomputer speed measurement system, and the like.
The thermocouple comprises an instrument which can measure and collect the vibration frequency and temperature data of the intelligent equipment. For example, a thermocouple may be used to connect to the smart device, such that the thermocouple measures and collects the vibration frequency and temperature data of the smart device. Wherein, the thermocouple can be tachometers of various brands. For example, the thermocouple may include a bonner shock and temperature sensor QM42VT1/2, and so on.
The test monitoring instruction comprises an instruction which can start the test monitoring of the intelligent equipment by the tester. For example, when the power meter receives a test monitoring command, the power meter starts to measure and collect the electric power of the intelligent device. For another example, when the tachometer receives the test monitoring command, the tachometer starts to measure and collect the rotation speed of the smart device.
In one embodiment, the smart device may include at least one operating mode, and different operating modes may require different testers to be activated for test monitoring. Therefore, when the test monitoring instruction is sent to the tester according to the test configuration information, the information identification can be carried out on the operation mode test information of the intelligent equipment, and the test attribute of the operation mode test information can be obtained. And then, generating a test monitoring instruction according to the test attribute. Specifically, the step of sending the test monitoring instruction to the at least one tester according to the test configuration information may include:
performing information identification on the running mode test information to obtain the test attribute of the running mode test information;
screening a target tester from at least one tester according to the test attributes;
generating a test monitoring instruction according to the test attribute and the target tester;
and sending the test monitoring instruction to the target tester.
The test attributes include measured test parameters required by the smart device in the current operating mode.
For example, when the intelligent device is an intelligent washing machine, the test attributes of the intelligent washing machine in the heavy-duty washing mode are electric power and rotation speed, and a power meter and a tachometer are needed when the intelligent device is tested and monitored. For another example, the test attributes of the intelligent washing machine in the wool washing mode are electric power, rotation speed, vibration frequency and temperature, so that a power meter, a tachometer and a thermocouple are required when the intelligent equipment is tested and monitored.
Therefore, when the terminal sends a test monitoring instruction to the at least one tester according to the test configuration information, the terminal can perform information identification on the operation mode test information to obtain the test attribute of the operation mode test information, and screen out the target tester from the at least one tester according to the test attribute.
For example, when the terminal recognizes that the test attributes of the intelligent washing machine are electric power and rotation speed, the terminal may screen out the power meter and the tachometer as target testers. For another example, when the terminal recognizes that the test attributes of the intelligent washing machine are electric power, rotation speed, vibration frequency, and temperature, the terminal may screen out a power meter, a tachometer, and a thermocouple as target testers.
In an embodiment, according to the test attributes, when a target tester is screened from at least one tester, the functional attributes of each tester can be obtained, then the test attributes of the intelligent device are matched with the functional attributes of the testers, so that a matching result is obtained, and finally, the target tester can be screened according to the matching result. Specifically, the step of screening out a target tester from at least one tester according to the test attribute may include:
acquiring the functional attribute of each tester;
matching the test attribute with the functional attribute to obtain a matching result;
and screening out the target tester from the at least one tester according to the matching result.
Functional attributes of a tester may include, among other things, what data the tester can measure. For example, the tachometer has a functional property that the tachometer can measure and acquire the rotation speed of the smart device. As another example, the functional property of the power meter is that the power meter can measure and collect the electrical power of the smart device. For another example, the functional attribute of the thermocouple is that the thermocouple can measure and collect the vibration frequency and temperature of the smart device.
Therefore, when the functional attribute of each tester is acquired, the test attribute and the functional attribute can be matched, so that a matching result is obtained. And then, screening out the target tester from the at least one tester according to the matching result.
For example, test attributes of an intelligent washing machine in a heavy-duty wash mode are electric power and rotational speed. When the terminal matches the test attribute of the intelligent washing machine with the functional attribute of the tachometer, the test attribute of the intelligent washing machine and the functional attribute of the tachometer both comprise the rotating speed, so that the test attribute of the intelligent washing machine is matched with the functional attribute of the tachometer, and the terminal can determine the tachometer as the target tester.
And when the terminal matches the test attribute of the intelligent washing machine with the functional attribute of the thermocouple, the test attribute of the intelligent washing machine does not match with the functional attribute of the thermocouple because the test attribute of the intelligent washing machine does not include the vibration frequency and the temperature, and the terminal cannot determine the thermocouple as the target tester.
In one embodiment, after the target tester is determined, the test monitoring command may be generated according to the target tester and the test attribute information. Specifically, the step of generating the test monitoring instruction according to the test attribute and the target tester may include:
performing attribute association processing on the test attribute and the functional attribute to obtain test monitoring information;
and carrying out format conversion processing on the test monitoring information to obtain a test monitoring instruction.
When the test attribute and the function attribute are subjected to attribute association processing, a mapping relation can be established between the test attribute and the function attribute, so that test monitoring information is obtained.
For example, the same identification information may be added to both the test attribute and the functional attribute, and the test attribute, the functional attribute, and the identification information may be encoded to generate the test monitoring information.
In an embodiment, in order to enable the tester to recognize the test monitoring information, format conversion processing is further performed on the test monitoring information to obtain the test monitoring instruction. For example, when the test monitoring information is 8-ary information, the test monitoring information may be converted into 16-ary information, thereby obtaining a test monitoring instruction.
In an embodiment, before the electronic device sends the test monitoring instruction to the tester, the tester may connect the intelligent device to the tester, so that the tester may perform test monitoring on the intelligent device.
In an embodiment, it should be noted that there is no limitation in execution timing between the step "sending a test start instruction to the intelligent device according to the test configuration information to enable the intelligent device to execute a corresponding test operation according to the test start instruction" and the step "sending a test monitoring instruction to at least one tester according to the test configuration information to enable the tester to perform test monitoring on the intelligent device according to the test monitoring instruction". The terminal may first perform the step of "sending a test start instruction to the intelligent device according to the test configuration information so that the intelligent device performs a corresponding test operation according to the test start instruction", or may first perform the step of "sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent device according to the test monitoring instruction".
104. Receiving test state information sent by intelligent equipment and test feedback information sent by a tester;
in an embodiment, after the terminal sends the test start instruction to the intelligent device and sends the test monitoring instruction to the tester, the terminal may receive test state information sent by the intelligent device and test feedback information sent by the tester.
The test state information includes information that can indicate the current test state of the intelligent device.
For example, when the intelligent device is an intelligent washing machine, the test status information may indicate that the intelligent washing machine is currently in an on state, a washing state, a dehydration state, a water filling state, a suspension state, an off-line state, a fault state, an end state, a standby state, and the like.
For another example, when the smart device is a smart air conditioner, the test status information may indicate that the smart air conditioner is currently in a cooling state, a heating state, an on state, a suspension state, a fault state, an air-out state, and the like.
The test state information also comprises various parameters which can explain the washing machine of the intelligent equipment in the current test state.
For example, the test status information may indicate a water level, a laundry weight, a washing machine amount, and the like of the intelligent washing machine when the intelligent washing machine is in a washing status.
The test feedback information comprises information detected by the tester in different states of the intelligent device. For example, the test feedback information may include power, rotation speed, vibration frequency, and temperature data detected by the tester in a washing state of the intelligent washing machine. For another example, the test feedback information may include power detected by the tester in a water filling state of the intelligent washing machine.
105. And generating a test report of the intelligent equipment according to the test state information and the test feedback information.
The test report comprises the test condition which can feed back the intelligent equipment. For example, various tables and graphs may be included in the test report. For example, tables, graphs, line graphs, histograms, pie charts, and the like may be included in the test report. Wherein, the table can record the test state information and the test feedback information. Statistical graphs such as graphs, line graphs, histograms, and pie charts may illustrate the relationship between test status information and test feedback information.
In an embodiment, when the terminal receives the test state information sent by the smart device, the terminal may record the test state information in the test state information recording area of the table. Wherein the terminal may record the test state information in the test state information recording area of the table according to the information generation time.
For example, the terminal receives test state information 1, test state information 2, and test state information 3 sent by the smart device. Wherein the test status information 1 is 13/6/20/2021: 20-13: test status information 2 generated during 40 was 13/6/20/2021: 41-14: test status information 3 generated during 40 was 14/6/20/2021: 41-15: 10, the terminal can record test state information 1, test state information 2, and test state information 3 in the test state information recording area of the table according to the information generation time.
In an embodiment, when the terminal receives the test feedback information sent by the tester, the terminal may record the test feedback information in the test feedback information recording area of the table. The terminal may record the test feedback information in the test feedback information recording area of the table according to the test feedback time.
In an embodiment, after the terminal receives the test state information sent by the intelligent device and the test feedback information sent by the tester, the terminal may generate a test report of the intelligent device according to the test state information and the test feedback information. Specifically, the step of generating a test report of the smart device according to the test state information and the test feedback information may include:
respectively carrying out information identification processing on the test state information and the test feedback information to obtain a test state parameter of the test state information and a test feedback parameter of the test feedback information;
performing correlation processing on the test state parameters and the test feedback parameters to obtain an incidence relation between the test state parameters and the test feedback parameters;
and generating a test report of the intelligent equipment according to the association relation.
The test state parameters include parameters that can describe the test state of the smart device. For example, the test state parameters may include "001", "010", "011", and "100", among others. Wherein, 001 may indicate that the intelligent washing machine is in an on state. "010" may indicate that the intelligent washing machine is in a washing state. "011" can indicate that the intelligent washing machine is in a dehydration state. "100" may indicate that the intelligent washing machine is in a water filling state.
The test state parameters may also include other parameters that indicate that the intelligent device is in the current test state. For example, when the intelligent washing machine is in a washing state, the test state parameters may further include a water level of the intelligent washing machine, a laundry weight, a washing machine amount, and the like.
The test feedback parameters include parameters that can indicate that the tester intelligent device detects in various different states.
For example, the test feedback parameters may include the power detected by the power meter in various different states of the smart device. As another example, the test feedback parameters may include power detected by the tachometer in various different states of the smart device. As another example, the test feedback parameters may include a vibration frequency and a temperature detected by the thermocouple in various different states of the smart device.
In an embodiment, the terminal may perform association processing on the test state parameter and the test feedback parameter to obtain an association relationship between the test state parameter and the test feedback parameter.
For example, the terminal may associate the test state parameter with the test feedback parameter according to the information generation time, so as to obtain an association relationship between the test state parameter and the test feedback parameter.
For example, the terminal may associate the test state parameters and the test feedback parameters generated in the same time period, so that an association relationship is generated between the test state parameters and the test feedback parameters.
For example, the test status parameter "010" of the intelligent washing machine is 13/6/20/2021: 20-13: generated during 40. No. 13 at 2021, 6/month 20: 20-13: during the 40 th period, the generated test feedback parameters included a power of 1000 hz and a temperature of 40 degrees celsius. Then, the terminal can associate the test state parameters with the test feedback parameters according to the information generation time, and obtain that the intelligent washing machine has a status of 13/6/20/2021: 20-13: the test state during 40 is a washing state in which the power of the washing machine during washing is 1000 hz and the temperature is 40 degrees celsius.
In an embodiment, the terminal may generate a test report of the smart device according to an association relationship between the test state parameter and the test feedback parameter.
For example, the terminal may generate at least one of a graph, a line graph, a bar graph, a pie graph, and other statistical graphs according to the correlation between the test state parameter and the test feedback parameter.
For example, the intelligent washing machine is No. 13 at 6 months and 20 months in 2021: 20-13: the test state during 40 is a washing state, wherein during washing, the power of the intelligent washing machine is 1000 hz and the temperature is 40 degrees celsius. The terminal can generate a histogram of the intelligent washing machine according to the data.
For another example, the intelligent washing machine is No. 13 at 6 months and 20 months in 2021: 20-13: the test state during 40 is a washing state. Wherein, during the washing period, the power changes of the intelligent washing machine are respectively 800 Hz, 1000 Hz, 1150 Hz, 1300 Hz and 900 Hz. Then, the terminal can generate a line graph of the intelligent washing machine according to the data.
In an embodiment, the terminal may further generate a corresponding statistical chart according to the test feedback parameters of the intelligent device in each of the different test states.
For example, the terminal may generate corresponding statistical graphs according to the power of the intelligent washing machine in different test states. For another example, the terminal may generate corresponding statistical graphs according to the temperatures of the intelligent washing machine in different test states, and the like.
For example, the terminal may generate a corresponding statistical map according to the power of the intelligent washing machine in an on state, a washing state, a dehydration state, a water filling state and a suspension state.
In an embodiment, further, the terminal may generate a corresponding statistical chart according to the test feedback information of each parameter of the intelligent washing machine in each test state.
For example, the terminal may generate a statistical graph according to the corresponding power of the intelligent washing machine under different water levels in the washing state. For another example, the terminal may generate a statistical map according to the corresponding temperature and power of the intelligent washing machine under different clothes weights in the washing state, and the like.
The embodiment of the application provides an intelligent device testing method, which can comprise the steps of obtaining test configuration information aiming at intelligent devices; sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction; sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction; receiving test state information sent by intelligent equipment and test feedback information sent by a tester; and generating a test report of the intelligent equipment according to the test state information and the test feedback information. According to the intelligent equipment testing method provided by the embodiment of the application, manual testing is not needed in the testing process, automatic testing can be achieved, and the efficiency of overall testing of intelligent equipment is improved.
Moreover, the embodiment of the application can automatically test various operation modes of the intelligent equipment without testing various operation modes respectively by means of manual work, so that manpower and material resources are saved, and the efficiency of testing the whole intelligent equipment is improved.
In addition, the intelligent equipment testing method provided by the embodiment of the application can automatically generate the test report according to the test state information and the test feedback information, so that a tester can quickly determine whether the intelligent equipment has functional defects through the test report, and the efficiency of performing complete machine testing on the intelligent equipment is improved.
In order to better implement the intelligent device testing method provided by the embodiment of the application, an embodiment of the invention further provides an intelligent device testing apparatus, and the intelligent device testing apparatus can be integrated in an electronic device. The meaning of the terms is the same as that in the intelligent device testing method of the product, and specific implementation details can refer to the description in the method embodiment.
In an embodiment, an intelligent device testing apparatus is provided, where the intelligent device testing apparatus may be specifically integrated in an electronic device, such as a terminal or a server, as shown in fig. 3, and the intelligent device testing apparatus includes: the first receiving unit 201, the first transmitting unit 202, the second transmitting unit 203, the second receiving unit 204, and the generating unit 205 are specifically as follows:
a first receiving unit 201, configured to obtain test configuration information for an intelligent device;
a first sending unit 202, configured to send a test start instruction to the intelligent device according to the test configuration information, so that the intelligent device executes a corresponding test operation according to the test start instruction;
a second sending unit 203, configured to send a test monitoring instruction to at least one tester according to the test configuration information, so that the tester performs test monitoring on the intelligent device according to the test monitoring instruction;
a second receiving unit 204, configured to receive test state information sent by the intelligent device and test feedback information sent by the tester;
a generating unit 205, configured to generate a test report of the intelligent device according to the test state information and the test feedback information.
In an embodiment, as shown in fig. 4, the first sending unit 202 may include:
the information analysis subunit 2021 is configured to analyze the test configuration information to obtain at least one operation mode test information, where one operation mode test information includes information configured for one operation mode of the intelligent device;
the instruction generating subunit 2022 is configured to generate at least one test starting instruction according to the at least one operation mode test information, where one operation mode test information corresponds to one test starting instruction;
the instruction sending subunit 2023 is configured to send the at least one test start instruction to the intelligent device according to a preset test sequence of the operation mode.
In an embodiment, the instruction generating subunit 2022 may include:
the coding module is used for coding the running mode test information by utilizing a preset communication protocol according to the running mode test information to obtain target format test information;
and the packaging module is used for packaging the target format test information to obtain the test starting instruction.
In an embodiment, as shown in fig. 5, the second sending unit 203 may include:
an information identification subunit 2031, configured to perform information identification on the operation mode test information to obtain a test attribute of the operation mode test information;
a screening subunit 2032, configured to screen a target test instrument from the at least one test instrument according to the test attribute;
an instruction generating subunit 2033, configured to generate a test monitoring instruction according to the test attribute and the target tester;
the instruction sending subunit 2034 is configured to send the test monitoring instruction to the target tester.
In an embodiment, the screening subunit 2032 may include:
the acquisition module is used for acquiring the functional attribute of each tester;
the matching module is used for matching the test attribute with the function attribute to obtain a matching result;
and the screening module is used for screening the target tester from the at least one tester according to the matching result.
In an embodiment, the instruction generating subunit 2033 may include:
the attribute association module is used for performing attribute association processing on the test attribute and the functional attribute to obtain test monitoring information;
and the format conversion module is used for carrying out format conversion processing on the test monitoring information to obtain a test monitoring instruction.
In an embodiment, as shown in fig. 6, the generating unit 205 may include:
an information identification subunit 2051, configured to perform information identification processing on the test state information and the test feedback information, respectively, to obtain a test state parameter of the test state information and a test feedback parameter of the test feedback information;
a parameter association subunit 2052, configured to perform association processing on the test state parameter and the test feedback parameter to obtain an association relationship between the test state parameter and the test feedback parameter;
and a generating subunit 2053, configured to generate a test report of the intelligent device according to the association relationship.
In a specific implementation, the above units may be implemented as independent entities, or may be combined arbitrarily to be implemented as the same or several entities, and the specific implementation of the above units may refer to the foregoing method embodiments, which are not described herein again.
By the testing device, the efficiency of testing the whole intelligent equipment can be improved
The embodiment of the application further provides an electronic device, which may include a terminal or a server, for example, the electronic device may be an intelligent device test terminal, and the intelligent device test terminal may be a computer or the like; for another example, the electronic device may be a server, such as an intelligent device testing server. As shown in fig. 7, it shows a schematic structural diagram of a terminal according to an embodiment of the present application, specifically:
the electronic device may include components such as a processor 401 of one or more processing cores, memory 402 of one or more computer-readable storage media, a power supply 403, and an input unit 404. Those skilled in the art will appreciate that the electronic device configuration shown in fig. 7 does not constitute a limitation of the electronic device and may include more or fewer components than shown, or some components may be combined, or a different arrangement of components. Wherein:
the processor 401 is a control center of the electronic device, connects various parts of the whole electronic device by various interfaces and lines, performs various functions of the electronic device and processes data by running or executing software programs and/or modules stored in the memory 402 and calling data stored in the memory 402, thereby performing overall monitoring of the electronic device. Optionally, processor 401 may include one or more processing cores; preferably, the processor 401 may integrate an application processor and a modem processor, wherein the application processor mainly handles operating systems, user pages, application programs, and the like, and the modem processor mainly handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into the processor 401.
The memory 402 may be used to store software programs and modules, and the processor 401 executes various functional applications and data processing by operating the software programs and modules stored in the memory 402. The memory 402 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required by at least one function (such as a sound playing function, an image playing function, etc.), and the like; the storage data area may store data created according to use of the computer device, and the like. Further, the memory 402 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid state storage device. Accordingly, the memory 402 may also include a memory controller to provide the processor 401 access to the memory 402.
The electronic device further comprises a power supply 403 for supplying power to the various components, and preferably, the power supply 403 is logically connected to the processor 401 through a power management system, so that functions of managing charging, discharging, and power consumption are realized through the power management system. The power supply 403 may also include any component of one or more dc or ac power sources, recharging systems, power failure detection circuitry, power converters or inverters, power status indicators, and the like.
The electronic device may further include an input unit 404, and the input unit 404 may be used to receive input numeric or character information and generate keyboard, mouse, joystick, optical or trackball signal inputs related to user settings and function control.
Although not shown, the electronic device may further include a display unit and the like, which are not described in detail herein. Specifically, in this embodiment, the processor 401 in the electronic device loads the executable file corresponding to the process of one or more application programs into the memory 402 according to the following instructions, and the processor 401 runs the application program stored in the memory 402, thereby implementing various functions as follows:
acquiring test configuration information aiming at the intelligent equipment;
sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction;
sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction;
receiving test state information sent by intelligent equipment and test feedback information sent by the tester;
and generating a test report of the intelligent equipment according to the test state information and the test feedback information.
The above operations can be implemented in the foregoing embodiments, and are not described in detail herein.
According to an aspect of the application, a computer program product or computer program is provided, comprising computer instructions, the computer instructions being stored in a computer readable storage medium. The processor of the computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions to cause the computer device to perform the method provided in the various alternative implementations of the above embodiments.
It will be understood by those skilled in the art that all or part of the steps of the methods of the above embodiments may be performed by a computer program, which may be stored in a computer-readable storage medium and loaded and executed by a processor, or by related hardware controlled by the computer program.
To this end, embodiments of the present application further provide a storage medium, where a computer program is stored, where the computer program can be loaded by a processor to execute the steps in any one of the intelligent device testing methods provided in the embodiments of the present application. For example, the computer program may perform the steps of:
acquiring test configuration information aiming at the intelligent equipment;
sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction;
sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction;
receiving test state information sent by intelligent equipment and test feedback information sent by the tester;
and generating a test report of the intelligent equipment according to the test state information and the test feedback information.
The above operations can be implemented in the foregoing embodiments, and are not described in detail herein.
Since the computer program stored in the storage medium can execute the steps in any of the intelligent device testing methods provided in the embodiments of the present application, the beneficial effects that can be achieved by any of the intelligent device testing methods provided in the embodiments of the present application can be achieved, which are detailed in the foregoing embodiments and will not be described again here.
The intelligent device testing method, the intelligent device testing device, the electronic device and the storage medium provided by the embodiment of the application are introduced in detail, a specific example is applied in the description to explain the principle and the implementation of the application, and the description of the embodiment is only used for helping to understand the method and the core idea of the application; meanwhile, for those skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (10)
1. An intelligent device testing method is characterized by comprising the following steps:
acquiring test configuration information aiming at the intelligent equipment;
sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction;
sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction;
receiving test state information sent by the intelligent equipment and test feedback information sent by the tester;
and generating a test report of the intelligent equipment according to the test state information and the test feedback information.
2. The intelligent device testing method of claim 1, wherein the sending a test initiation instruction to the intelligent device according to the test configuration information comprises:
analyzing the test configuration information to obtain at least one operation mode test information, wherein one operation mode test information comprises information configured for one operation mode of the intelligent equipment;
generating at least one test starting instruction according to the at least one running mode test information, wherein one running mode test information corresponds to one test starting instruction;
and sending the at least one test starting instruction to the intelligent equipment according to a preset running mode test sequence.
3. The intelligent device testing method of claim 2, wherein generating at least one operation initiation instruction according to the at least one operation mode test information comprises:
according to the running mode test information, coding the running mode test information by using a preset communication protocol to obtain target format test information;
and packaging the target format test information to obtain the test starting instruction.
4. The smart device testing method of claim 1, wherein the test configuration information includes at least one run mode test information; the sending of the test monitoring instruction to at least one tester according to the test configuration information includes:
performing information identification on the running mode test information to obtain the test attribute of the running mode test information;
screening a target tester from the at least one tester according to the test attributes;
generating a test monitoring instruction according to the test attribute and the target tester;
and sending the test monitoring instruction to the target tester.
5. The smart device testing method of claim 4, wherein said screening out target testers among said at least one tester based on said test attributes comprises:
acquiring the functional attribute of each tester;
matching the test attribute with the function attribute to obtain a matching result;
and screening out a target tester from the at least one tester according to the matching result.
6. The intelligent device testing method of claim 5, wherein generating a test monitoring instruction based on the test attributes and the target tester comprises:
performing attribute association processing on the test attribute and the functional attribute to obtain test monitoring information;
and carrying out format conversion processing on the test monitoring information to obtain a test monitoring instruction.
7. The intelligent device testing method of claim 1, wherein generating the test report for the intelligent device based on the test state information and the test feedback information comprises:
respectively carrying out information identification processing on the test state information and the test feedback information to obtain a test state parameter of the test state information and a test feedback parameter of the test feedback information;
performing association processing on the test state parameters and the test feedback parameters to obtain an association relation between the test state parameters and the test feedback parameters;
and generating a test report of the intelligent equipment according to the incidence relation.
8. An intelligent device testing apparatus, comprising:
the intelligent device comprises a first receiving unit, a second receiving unit and a control unit, wherein the first receiving unit is used for acquiring test configuration information aiming at the intelligent device;
the first sending unit is used for sending a test starting instruction to the intelligent equipment according to the test configuration information so that the intelligent equipment executes corresponding test operation according to the test starting instruction;
the second sending unit is used for sending a test monitoring instruction to at least one tester according to the test configuration information so that the tester performs test monitoring on the intelligent equipment according to the test monitoring instruction;
the second receiving unit is used for receiving the test state information sent by the intelligent equipment and the test feedback information sent by the tester;
and the generating unit is used for generating a test report of the intelligent equipment according to the test state information and the test feedback information.
9. An electronic device comprising a memory and a processor; the memory stores a computer program, and the processor is configured to execute the computer program in the memory to perform the intelligent device testing method of any one of claims 1 to 7.
10. A storage medium storing a plurality of computer programs adapted to be loaded by a processor to perform the smart device testing method of any one of claims 1 to 7.
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| CN116659782B (en) * | 2022-11-22 | 2023-12-12 | 荣耀终端有限公司 | Motor testing method and apparatus |
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