CN113568958A - Intelligent manufacturing data processing method and device for industrial intelligent equipment - Google Patents
Intelligent manufacturing data processing method and device for industrial intelligent equipment Download PDFInfo
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Abstract
The invention provides an intelligent manufacturing data processing method and device of industrial intelligent equipment. Therefore, the production state fault analysis of the second industrial intelligent device can be realized, and the fault detection of the device is realized to avoid production accidents.
Description
Technical Field
The invention relates to the technical field of intelligent manufacturing, in particular to an intelligent manufacturing data processing method and device of industrial intelligent equipment.
Background
With the development of big data, the development of intelligent manufacturing is more and more mature. However, how to implement fault detection of equipment to avoid production accidents during the operation of an automated factory is a technical problem that needs to be considered at present.
Disclosure of Invention
In order to solve the problems, the invention provides an intelligent manufacturing data processing method and device of industrial intelligent equipment.
An intelligent manufacturing data processing method of an industrial intelligent device comprises the following steps:
obtaining first manufacturing data of a first industrial smart device in a first smart manufacturing index state;
obtaining second production and manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device, wherein the second production and manufacturing data are matched with the first production and manufacturing data;
and performing production state fault analysis on the second industrial intelligent device according to the first production manufacturing data and the second production manufacturing data.
Preferably, the first and second liquid crystal materials are,
the obtaining first manufacturing data of a first industrial smart device in a first smart manufacturing index state comprises: obtaining first dynamic production manufacturing data of a first industrial intelligent device in a first intelligent manufacturing index state;
the obtaining second production manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device includes: obtaining second dynamic production manufacturing data of the first industrial intelligent equipment in a second intelligent manufacturing index state corresponding to second industrial intelligent equipment;
the analyzing the production state fault of the second industrial intelligent device according to the first production manufacturing data and the second production manufacturing data comprises: and performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data.
Preferably, the first and second liquid crystal materials are,
the performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data includes:
acquiring information attribute labels of at least two state indexes on the first dynamic production manufacturing data;
obtaining quality inspection evaluation information of at least two pieces of product quality inspection information on the second dynamic production manufacturing data;
and performing production state fault analysis on the second industrial intelligent equipment according to the information attribute labels of the at least two state indexes, the quality inspection evaluation information of the at least two product quality inspection information and the fault analysis model corresponding to the second dynamic production manufacturing data.
An intelligent manufacturing data processing apparatus for an industrial intelligent device, comprising:
a first obtaining module to obtain first manufacturing data of a first industrial smart device in a first smart manufacturing index state;
a second obtaining module, configured to obtain second manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device, where the second manufacturing data matches the first manufacturing data;
and the fault analysis module is used for carrying out production state fault analysis on the second industrial intelligent equipment according to the first production manufacturing data and the second production manufacturing data.
Preferably, the first and second liquid crystal materials are,
the first obtaining module is configured to: obtaining first dynamic production manufacturing data of a first industrial intelligent device in a first intelligent manufacturing index state;
the second obtaining module is configured to: obtaining second dynamic production manufacturing data of the first industrial intelligent equipment in a second intelligent manufacturing index state corresponding to second industrial intelligent equipment;
the fault analysis module is configured to: and performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data.
Preferably, the first and second liquid crystal materials are,
the fault analysis module is configured to:
acquiring information attribute labels of at least two state indexes on the first dynamic production manufacturing data;
obtaining quality inspection evaluation information of at least two pieces of product quality inspection information on the second dynamic production manufacturing data;
and performing production state fault analysis on the second industrial intelligent equipment according to the information attribute labels of the at least two state indexes, the quality inspection evaluation information of the at least two product quality inspection information and the fault analysis model corresponding to the second dynamic production manufacturing data.
By executing the intelligent manufacturing data processing method and device of the industrial intelligent equipment, first production manufacturing data of the first industrial intelligent equipment in a first intelligent manufacturing index state are obtained, second production manufacturing data of the first industrial intelligent equipment in a second intelligent manufacturing index state corresponding to the second industrial intelligent equipment are obtained, the second production manufacturing data are matched with the first production manufacturing data, and finally, according to the first production manufacturing data and the second production manufacturing data, production state fault analysis is carried out on the second industrial intelligent equipment. Therefore, the production state fault analysis of the second industrial intelligent device can be realized, and the fault detection of the device is realized to avoid production accidents.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a flowchart of an intelligent manufacturing data processing method for an industrial intelligent device according to an embodiment of the present invention.
Fig. 2 is a functional block diagram of an intelligent manufacturing data processing apparatus of an industrial intelligent device according to an embodiment of the present invention.
Fig. 3 is a schematic diagram of a hardware structure of an electronic device according to an embodiment of the present invention.
Detailed Description
In order to better understand the technical solutions of the present invention, the following detailed descriptions of the technical solutions of the present invention are provided with the accompanying drawings and the specific embodiments, and it should be understood that the specific features in the embodiments and the examples of the present invention are the detailed descriptions of the technical solutions of the present invention, and are not limitations of the technical solutions of the present invention, and the technical features in the embodiments and the examples of the present invention may be combined with each other without conflict.
Referring to fig. 1, a flow chart of a method for processing intelligent manufacturing data of an industrial intelligent device is shown, which includes the following steps S110 to S130.
Step S110, obtain first manufacturing data of the first industrial smart device in the first smart manufacturing index state.
Step S120, obtaining second manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device, where the second manufacturing data matches the first manufacturing data.
Step S130, according to the first production manufacturing data and the second production manufacturing data, carrying out production state fault analysis on the second industrial intelligent device.
By executing the above steps S110 to S130, first manufacturing data of a first industrial smart device in a first smart manufacturing index state is obtained, second manufacturing data of the first industrial smart device in a second smart manufacturing index state corresponding to a second industrial smart device is obtained, the second manufacturing data matches with the first manufacturing data, and finally, a production state fault analysis is performed on the second industrial smart device according to the first manufacturing data and the second manufacturing data. Therefore, the production state fault analysis of the second industrial intelligent device can be realized, and the fault detection of the device is realized to avoid production accidents.
Preferably, the first and second liquid crystal materials are,
the obtaining first manufacturing data of a first industrial smart device in a first smart manufacturing index state comprises: obtaining first dynamic production manufacturing data of a first industrial intelligent device in a first intelligent manufacturing index state;
the obtaining second production manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device includes: obtaining second dynamic production manufacturing data of the first industrial intelligent equipment in a second intelligent manufacturing index state corresponding to second industrial intelligent equipment;
the analyzing the production state fault of the second industrial intelligent device according to the first production manufacturing data and the second production manufacturing data comprises: and performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data.
Preferably, the first and second liquid crystal materials are,
the performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data includes:
acquiring information attribute labels of at least two state indexes on the first dynamic production manufacturing data;
obtaining quality inspection evaluation information of at least two pieces of product quality inspection information on the second dynamic production manufacturing data;
and performing production state fault analysis on the second industrial intelligent equipment according to the information attribute labels of the at least two state indexes, the quality inspection evaluation information of the at least two product quality inspection information and the fault analysis model corresponding to the second dynamic production manufacturing data.
Referring to fig. 2, an intelligent manufacturing data processing apparatus 200 for an industrial intelligent device is provided, which includes:
a first obtaining module 210 for obtaining first manufacturing data of a first industrial smart device in a first smart manufacturing index state;
a second obtaining module 220, configured to obtain second manufacturing data of the first industrial smart device in a second smart manufacturing index state corresponding to a second industrial smart device, where the second manufacturing data matches the first manufacturing data;
and a fault analysis module 230, configured to perform a production state fault analysis on the second industrial intelligent device according to the first production manufacturing data and the second production manufacturing data.
Preferably, the first and second liquid crystal materials are,
the first obtaining module 210 is configured to: obtaining first dynamic production manufacturing data of a first industrial intelligent device in a first intelligent manufacturing index state;
the second obtaining module 220 is configured to: obtaining second dynamic production manufacturing data of the first industrial intelligent equipment in a second intelligent manufacturing index state corresponding to second industrial intelligent equipment;
the fault analysis module 230 is configured to: and performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data.
Preferably, the first and second liquid crystal materials are,
the fault analysis module 230 is configured to:
acquiring information attribute labels of at least two state indexes on the first dynamic production manufacturing data;
obtaining quality inspection evaluation information of at least two pieces of product quality inspection information on the second dynamic production manufacturing data;
and performing production state fault analysis on the second industrial intelligent equipment according to the information attribute labels of the at least two state indexes, the quality inspection evaluation information of the at least two product quality inspection information and the fault analysis model corresponding to the second dynamic production manufacturing data.
Referring to fig. 3, a hardware structure diagram of the electronic device 110 is provided.
Fig. 3 is a block diagram illustrating an electronic device 110 according to an embodiment of the present invention. An electronic device 110 in the embodiment of the present invention may be a server with data storage, transmission, and processing functions, as shown in fig. 3, the electronic device 110 includes: memory 111, processor 112, network module 113, and intelligent manufacturing data processing apparatus 200 for industrial intelligent devices.
The memory 111, the processor 112, and the network module 113 are electrically connected directly or indirectly to enable transmission or interaction of data. For example, the components may be electrically connected to each other via one or more communication buses or signal lines. The memory 111 stores therein an intelligent manufacturing data processing apparatus 200 of an industrial intelligent device, the intelligent manufacturing data processing apparatus 200 of the industrial intelligent device includes at least one software function module which can be stored in the memory 111 in the form of software or firmware (firmware), and the processor 112 executes various function applications and data processing by running a software program and a module stored in the memory 111, for example, the intelligent manufacturing data processing apparatus 200 of the industrial intelligent device in the embodiment of the present invention, so as to implement the intelligent manufacturing data processing method of the industrial intelligent device in the embodiment of the present invention.
The Memory 111 may be, but is not limited to, a Random Access Memory (RAM), a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable Read-Only Memory (EPROM), an electrically Erasable Read-Only Memory (EEPROM), and the like. The memory 111 is used for storing a program, and the processor 112 executes the program after receiving the execution instruction.
The processor 112 may be an integrated circuit chip having data processing capabilities. The Processor 112 may be a general-purpose Processor including a Central Processing Unit (CPU), a Network Processor (NP), and the like. The various methods, steps and logic blocks disclosed in embodiments of the present invention may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The network module 113 is used for establishing a communication connection between the electronic device 110 and other communication terminal devices through a network, so as to implement transceiving operations of network signals and data. The network signal may include a wireless signal or a wired signal.
It will be appreciated that the configuration shown in FIG. 3 is merely illustrative and that an electronic device 110 may include more or fewer components than shown in FIG. 3 or have a different configuration than shown in FIG. 3. The components shown in fig. 3 may be implemented in hardware, software, or a combination thereof.
An embodiment of the present invention also provides a computer-readable storage medium, which includes a computer program. The computer program is operative to control an electronic device 110, on which the readable storage medium is located, to perform the following intelligent manufacturing data processing method for an industrial intelligent device.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus and method can be implemented in other ways. The apparatus and method embodiments described above are illustrative only, as the flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In addition, the functional modules in the embodiments of the present invention may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention or a part thereof, which essentially contributes to the prior art, can be embodied in the form of a software product stored in a storage medium and including instructions for causing a computer device (which may be a personal computer, an electronic device 10, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes. It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The above are merely examples of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (6)
1. An intelligent manufacturing data processing method for industrial intelligent equipment is characterized by comprising the following steps:
obtaining first manufacturing data of a first industrial smart device in a first smart manufacturing index state;
obtaining second production and manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device, wherein the second production and manufacturing data are matched with the first production and manufacturing data;
and performing production state fault analysis on the second industrial intelligent device according to the first production manufacturing data and the second production manufacturing data.
2. The method of claim 1,
the obtaining first manufacturing data of a first industrial smart device in a first smart manufacturing index state comprises: obtaining first dynamic production manufacturing data of a first industrial intelligent device in a first intelligent manufacturing index state;
the obtaining second production manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device includes: obtaining second dynamic production manufacturing data of the first industrial intelligent equipment in a second intelligent manufacturing index state corresponding to second industrial intelligent equipment;
the analyzing the production state fault of the second industrial intelligent device according to the first production manufacturing data and the second production manufacturing data comprises: and performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data.
3. The method of claim 2, wherein the performing production state fault analysis on the second industrial smart device from the first dynamic production manufacturing data and the second dynamic production manufacturing data comprises:
acquiring information attribute labels of at least two state indexes on the first dynamic production manufacturing data;
obtaining quality inspection evaluation information of at least two pieces of product quality inspection information on the second dynamic production manufacturing data;
and performing production state fault analysis on the second industrial intelligent equipment according to the information attribute labels of the at least two state indexes, the quality inspection evaluation information of the at least two product quality inspection information and the fault analysis model corresponding to the second dynamic production manufacturing data.
4. An intelligent manufacturing data processing apparatus for industrial intelligent devices, comprising:
a first obtaining module to obtain first manufacturing data of a first industrial smart device in a first smart manufacturing index state;
a second obtaining module, configured to obtain second manufacturing data of the first industrial intelligent device in a second intelligent manufacturing index state corresponding to a second industrial intelligent device, where the second manufacturing data matches the first manufacturing data;
and the fault analysis module is used for carrying out production state fault analysis on the second industrial intelligent equipment according to the first production manufacturing data and the second production manufacturing data.
5. The apparatus of claim 4,
the first obtaining module is configured to: obtaining first dynamic production manufacturing data of a first industrial intelligent device in a first intelligent manufacturing index state;
the second obtaining module is configured to: obtaining second dynamic production manufacturing data of the first industrial intelligent equipment in a second intelligent manufacturing index state corresponding to second industrial intelligent equipment;
the fault analysis module is configured to: and performing production state fault analysis on the second industrial intelligent device according to the first dynamic production manufacturing data and the second dynamic production manufacturing data.
6. The apparatus of claim 5, wherein the fault analysis module is configured to:
acquiring information attribute labels of at least two state indexes on the first dynamic production manufacturing data;
obtaining quality inspection evaluation information of at least two pieces of product quality inspection information on the second dynamic production manufacturing data;
and performing production state fault analysis on the second industrial intelligent equipment according to the information attribute labels of the at least two state indexes, the quality inspection evaluation information of the at least two product quality inspection information and the fault analysis model corresponding to the second dynamic production manufacturing data.
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| CN202110901779.4A CN113568958A (en) | 2021-08-06 | 2021-08-06 | Intelligent manufacturing data processing method and device for industrial intelligent equipment |
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| CN202110901779.4A CN113568958A (en) | 2021-08-06 | 2021-08-06 | Intelligent manufacturing data processing method and device for industrial intelligent equipment |
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