CN113566973B - Temperature correction method and assembly and infrared temperature measurement detector - Google Patents
Temperature correction method and assembly and infrared temperature measurement detector Download PDFInfo
- Publication number
- CN113566973B CN113566973B CN202110837930.2A CN202110837930A CN113566973B CN 113566973 B CN113566973 B CN 113566973B CN 202110837930 A CN202110837930 A CN 202110837930A CN 113566973 B CN113566973 B CN 113566973B
- Authority
- CN
- China
- Prior art keywords
- temperature measurement
- infrared temperature
- time
- measurement detector
- infrared
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000009529 body temperature measurement Methods 0.000 title claims abstract description 227
- 238000012937 correction Methods 0.000 title claims abstract description 95
- 238000000034 method Methods 0.000 title claims abstract description 52
- 239000003990 capacitor Substances 0.000 claims description 69
- 230000008569 process Effects 0.000 claims description 15
- 238000004364 calculation method Methods 0.000 claims description 12
- 238000004590 computer program Methods 0.000 claims description 12
- 238000012360 testing method Methods 0.000 claims description 11
- 238000004861 thermometry Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 claims description 3
- 230000000694 effects Effects 0.000 abstract description 3
- 230000008859 change Effects 0.000 description 6
- 239000002699 waste material Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 238000004422 calculation algorithm Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
Abstract
The application discloses a temperature correction method and a component, and relates to an infrared temperature measurement detector. After the infrared temperature detector measures a target temperature value, whether the infrared temperature detector is in a stable state is judged; if the infrared temperature measurement detector is in an unstable state, calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector; determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on moment and the power-on time length of the infrared temperature measurement detector after the infrared temperature measurement detector is powered on at the current time; the instability degrees corresponding to the time difference, the reference temperature value and the power-on time length are inquired in a preset multi-dimensional correction table, and the target temperature value is corrected according to the instability degree, so that the temperature value measured by the infrared temperature measurement detector in the instability state is corrected, and the temperature measurement precision is improved. Correspondingly, the application provides a temperature correction subassembly and an infrared temperature measurement detector, also has above-mentioned technological effect.
Description
Technical Field
The application relates to the technical field of infrared temperature measurement, in particular to a temperature correction method and a temperature correction assembly, and discloses an infrared temperature measurement detector.
Background
After the infrared detector for measuring temperature is electrified, the temperature of components such as the barrel wall of the machine core, the shutter and the like is not uniformly distributed due to the heating of a circuit of the machine core, and the infrared detector is poor in stability, namely in an unstable state. In the process of the transition of the infrared detector from the state to the stable state, the fluctuation range of the measured temperature value is large, and the temperature measurement is inaccurate. In order to ensure the temperature measurement accuracy, generally, the infrared detector waits for a period of time (namely, does not measure the temperature in an unstable state) after being powered on, and then the temperature is measured, but the waste of time and resources is caused.
Therefore, how to measure an accurate temperature value in an unstable state of the infrared detector is a problem to be solved by those skilled in the art.
Disclosure of Invention
In view of the above, an object of the present invention is to provide a temperature correction method and a component thereof, an infrared temperature measurement detector, for measuring an accurate temperature value in an unstable state of the infrared detector. The specific scheme is as follows:
in a first aspect, the present application provides a temperature correction method, including:
acquiring a target temperature value measured by an infrared temperature measurement detector;
judging whether the infrared temperature measurement detector is in a stable state;
if not, calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector;
determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on time and the power-on time length of the infrared temperature measurement detector after the infrared temperature measurement detector is powered on;
and inquiring the instability degrees corresponding to the time difference, the reference temperature value and the electrifying time length in a preset multi-dimensional correction table, and correcting the target temperature value according to the instability degree.
Preferably, the determining whether the infrared temperature measurement detector is in a stable state includes:
judging whether a capacitor connected with a machine core controller of the infrared temperature measurement detector is in a full-power state or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state;
or
Judging whether a first timer connected with the infrared temperature measurement detector is overtime or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state;
or
Judging whether the temperature measurement index value of the infrared temperature measurement detector is unchanged within a preset time period; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state.
Preferably, the calculating a time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector includes:
calculating the electric quantity stored in the capacitor at the current power-on moment, and calculating the time difference based on the electric quantity at the power-on moment and the full electric quantity of the capacitor; the core controller of the infrared temperature measurement detector is connected with the capacitor;
or
Taking the time counted by a second timer connected with the infrared temperature measurement detector as the time difference; and the second timer starts to time at the last power-off time of the infrared temperature measurement detector and stops timing at the current power-on time.
Preferably, the determining the power-on duration of the infrared temperature measurement detector after being powered on at this time includes:
calculating the electric quantity at the moment of measuring the target temperature value and the temperature measuring moment stored by the capacitor, and the electric quantity at the current electrifying moment and the electrifying moment stored by the capacitor; calculating the electrifying time length based on the electrifying time electric quantity and the temperature measuring time electric quantity; the core controller of the infrared temperature measurement detector is connected with the capacitor;
or
Taking the time counted by a first timer connected with the infrared temperature measurement detector as the electrifying duration; and the first timer starts timing at the current power-on time of the infrared temperature measurement detector.
Preferably, the querying, in a preset multi-dimensional correction table, an unsteady degree corresponding to the time difference, the reference temperature value, and the energization time period, and correcting the target temperature value according to the unsteady degree includes:
taking the time difference, the reference temperature value and the electrifying duration as query dimensions;
based on the query dimension, locating the unstable degree and the corresponding correction coefficient in the multi-dimensional correction table;
and taking the quotient of the target temperature value and the correction coefficient as a corrected target temperature value.
Preferably, the generating process of the preset correction table comprises:
determining and recording the actual temperature value of the object measured by the infrared temperature measurement detector;
setting N power-off durations, and executing the following test steps for each power-off duration:
s1, powering off the infrared temperature measurement detector in a stable state;
s2, after any power-off time period, powering on the infrared temperature measurement detector;
s3, acquiring and recording temperature values of the infrared temperature measurement detector at a plurality of moments and electric quantity stored by the capacitor at the corresponding temperature measurement moment according to a preset time interval; the core controller of the infrared temperature measurement detector is connected with the capacitor;
s4, carrying out N-order polynomial fitting or exponential fitting on the temperature values measured at all the moments and the electric quantity stored by the capacitor at the corresponding temperature measuring moment to calibrate the instability degree and the corresponding correction coefficient of all the moments and obtain a correction table with the current power-off time length, the current actual temperature value and all the temperature measuring moments after the infrared temperature measuring detector is powered on as dimensions; and the instability degree of each moment is represented by the offset between the measured temperature value and the actual temperature value at each moment.
Preferably, the method further comprises the following steps:
and (4) executing S1-S4 after adjusting the actual temperature value of the object measured by the infrared temperature measurement detector.
Preferably, the method further comprises the following steps:
and if the test step is executed according to any power-off time length, the infrared temperature detectors are multiple, the infrared temperature detectors are tested in parallel, the temperature values measured by the infrared temperature detectors at the same time and the electric quantity stored by the capacitor at the corresponding temperature measuring time are averaged, the average value is used as the temperature value measured at each time and the electric quantity stored by the capacitor at the corresponding temperature measuring time, and S4 is executed.
In a second aspect, the present application provides a temperature correction apparatus comprising:
the acquisition module is used for acquiring a target temperature value measured by the infrared temperature measurement detector;
the judging module is used for judging whether the infrared temperature measuring detector is in a stable state or not;
the calculation module is used for calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector if the infrared temperature measurement detector is in an unstable state;
the determining module is used for determining a reference temperature value measured by the infrared temperature measuring detector at the current power-on time and the power-on time length of the infrared temperature measuring detector after the infrared temperature measuring detector is powered on;
and the correction module is used for inquiring the unstable degree corresponding to the time difference, the reference temperature value and the electrifying time length in a preset multi-dimensional correction table and correcting the target temperature value according to the unstable degree.
In a third aspect, the application provides an infrared temperature detector, a movement controller of the infrared temperature detector is connected with a timing component, and the timing component is used for recording the time difference between the power-off time and the next power-on time of the infrared temperature detector.
Preferably, the timing means is a capacitive circuit or a timer.
In a fourth aspect, the present application provides an electronic device, comprising:
a memory for storing a computer program;
a processor for executing the computer program to implement the temperature correction method disclosed in the foregoing.
In a fifth aspect, the present application provides a readable storage medium for storing a computer program, wherein the computer program, when executed by a processor, implements the temperature correction method disclosed above.
According to the scheme, the temperature correction method comprises the following steps: acquiring a target temperature value measured by an infrared temperature measurement detector; judging whether the infrared temperature measurement detector is in a stable state; if not, calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector; determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on moment and power-on duration of the infrared temperature measurement detector after the infrared temperature measurement detector is powered on at the current time; and inquiring the unsteady degree corresponding to the time difference, the reference temperature value and the electrifying time length in a preset multi-dimensional correction table, and correcting the target temperature value according to the unsteady degree.
Therefore, after the infrared temperature measurement detector measures the target temperature value, whether the infrared temperature measurement detector is in a stable state is judged; if the infrared temperature measurement detector is in an unstable state, the target temperature value can be corrected, and the specific correction process is as follows: calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector; determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on time and the power-on time length of the infrared temperature measurement detector after the power-on; and inquiring the unsteady degree corresponding to the time difference, the reference temperature value and the power-on time in a preset multi-dimensional correction table, and correcting the target temperature value according to the unsteady degree. Therefore, the unstable degree of the infrared temperature measurement detector can be quantified, the temperature value measured by the infrared temperature measurement detector in the unstable state is corrected, the temperature measurement precision is improved, and the accurate temperature value can be measured in the unstable state of the infrared detector. Therefore, the infrared temperature measurement detector does not need to wait after being electrified, can directly measure the temperature, and avoids the waste of time and resources.
Accordingly, the temperature correction assembly (namely, the device, the equipment and the readable storage medium) and the infrared temperature measurement detector provided by the application have the technical effects.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a flow chart of a temperature correction method disclosed herein;
FIG. 2 is a schematic diagram of a capacitor and an infrared temperature detector according to the present disclosure;
FIG. 3 is a schematic illustration of information recorded during a test process as disclosed herein;
FIG. 4 is a schematic view of an unsteady-state fit curve disclosed herein;
FIG. 5 is a diagram illustrating a fitting function and a related correction result corresponding to the curve shown in FIG. 4;
FIG. 6 is a schematic illustration of a temperature modification scheme disclosed herein;
FIG. 7 is a schematic comparison of the temperature correction disclosed herein before and after;
FIG. 8 is a schematic view of a temperature correction apparatus according to the present disclosure;
fig. 9 is a schematic diagram of an electronic device disclosed in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
At present, after the infrared detector for temperature measurement is electrified, the temperature of components such as a barrel wall and a shutter of a machine core are not uniformly distributed due to the heat generated by a circuit of the machine core, and the infrared detector is poor in stability, namely in an unstable state. In the process of the transition of the infrared detector from the state to the stable state, the fluctuation range of the measured temperature value is large, and the temperature measurement is inaccurate. In order to ensure the temperature measurement accuracy, the infrared detector generally waits for a period of time (i.e., does not measure the temperature in an unstable state) after being powered on, and then measures the temperature, but this causes waste of time and resources. Therefore, the temperature correction scheme is provided, and the accurate temperature value can be measured in the unstable state of the infrared detector.
Referring to fig. 1, an embodiment of the present application discloses a temperature correction method, including:
s101, obtaining a target temperature value measured by the infrared temperature measurement detector.
Any object can spontaneously radiate electromagnetic waves outwards, mainly infrared radiation is generated near normal temperature, and the higher the temperature of the object is, the stronger the infrared radiation is. Infrared has a strong thermal effect and is therefore called thermal radiation. The infrared temperature measuring detector in this embodiment is any type of infrared temperature measuring instrument, such as: a non-refrigeration type infrared detector using a thermistor. The infrared detector absorbs the emitted infrared rays, the temperature rises, and the resistance value changes to cause voltage change, so that the thermal signal is converted into an electric signal to detect the temperature.
The detector chip can be an infrared focal plane array integrated by hundreds of thousands or even millions of pixel units, and can present infrared images in real time, but the temperature distribution of components such as the cylinder wall and the shutter of the movement is uneven, so that the response of each pixel is different, and the temperature measurement is inaccurate. Therefore, in the process of using the infrared detector in the prior art, the temperature measurement needs to be carried out after the infrared detector reaches a steady state.
S102, judging whether the infrared temperature measurement detector is in a stable state; if yes, outputting the target temperature value; if not, S103 is executed.
Wherein, the steady state refers to: the current and voltage and other physical quantities in the electronic circuit system reach a stable state, and meanwhile, the thermodynamic system also reaches a stable state. The current and voltage of a core circuit in the infrared temperature measurement detector are not changed any more, and the temperature of each hardware part of the infrared temperature measurement detector is equal. The non-steady state is the exact opposite of the steady state described above, in which the thermodynamic state (e.g., various physical quantities) at any point in the thermodynamic system changes with time, and a thermodynamic device is typically in a non-steady state during start-up or shut-down.
It can be seen that, for the infrared temperature measurement detector, the unstable state generally refers to the unstable state of the movement circuit, and the state does not express a formula very accurately. However, because the mass and the structure of the movement are fixed, and after the movement is electrified, the voltage and the power tend to be stable, the time from the beginning of heating to the final stabilization of the movement is basically stabilized near a numerical value, that is: the unsteady state of the movement has strong correlation with the length of the power-on time. The longer the period of energization, the lower the degree of instability. Therefore, the unsteadiness of the movement can be quantitatively analyzed. The non-specific fuzzy factor of the unsteady state degree is expressed by specific data, so as to achieve the purpose of analysis and comparison.
In this embodiment, if the infrared temperature measurement detector measures the target temperature value in an unstable state, it indicates that the target temperature value is inaccurate and needs to be corrected; if the infrared temperature measurement detector measures the target temperature value in a stable state, the target temperature value is accurate, and therefore the target temperature value is directly output, for example: and displaying by using a display.
S103, calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector.
S104, determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on time and the power-on time length of the infrared temperature measurement detector after the power-on.
It should be noted that the temperature value measured by the infrared temperature measurement detector at the moment of starting is relatively accurate, which is called as a reference temperature value in this embodiment, but the measured temperature value fluctuates (measured in an unsteady state) and then tends to be stable (measured in a steady state) along with the uneven temperature distribution of each component.
S105, inquiring the instability degree corresponding to the time difference, the reference temperature value and the power-on time length in a preset multi-dimensional correction table, and correcting the target temperature value according to the instability degree.
In this embodiment, a preset multi-dimensional correction table is used to record the degree of instability, so after the time difference, the reference temperature value and the power-on duration are obtained, the corresponding degree of instability can be queried in the multi-dimensional correction table based on the three dimensions, and the target temperature value is corrected accordingly. The final temperature value obtained by correction can be displayed by a display and/or be broadcasted by voice.
In one embodiment, the searching a preset multidimensional correction table for the instability degree corresponding to the time difference, the reference temperature value and the power-on time length, and correcting the target temperature value according to the instability degree includes: taking the time difference, the reference temperature value and the power-on duration as query dimensions; based on the query dimension, positioning the instability degree and the corresponding correction coefficient in a multidimensional correction table; and taking the quotient of the target temperature value and the correction coefficient as the corrected target temperature value. Therefore, the correction coefficient corresponding to each unstable degree is recorded in the multidimensional correction table, and the temperature value can be directly corrected according to the correction coefficient.
Wherein the correction factor is used to represent the difference between the true temperature value and the current measured temperature value. Such as: the actual temperature value is 100 ℃, and the current measured temperature value is 98 ℃, then the correction factor may be: 98 ℃/100 ℃=0.98, so that the current measured temperature value is 98 ℃ divided by 0.98, and the real temperature value of 100 ℃ can be obtained.
In this embodiment, after the infrared temperature detector measures the target temperature value, it is first determined whether the infrared temperature detector is in a stable state; if the infrared temperature measurement detector is in an unstable state, the target temperature value can be corrected by the method, and the specific correction process is as follows: calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector; determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on moment and the power-on time length of the infrared temperature measurement detector after the infrared temperature measurement detector is powered on at the current time; and querying the instability degrees corresponding to the time difference, the reference temperature value and the power-on time in a preset multi-dimensional correction table, and correcting the target temperature value according to the instability degree, so as to measure an accurate temperature value in the unstable state of the infrared detector.
Therefore, the embodiment can quantify the unstable degree of the infrared temperature measurement detector, so that the temperature value measured by the infrared temperature measurement detector in the unstable state is corrected, the temperature measurement precision is improved, and the accurate temperature value can be measured in the unstable state of the infrared temperature measurement detector. Therefore, the infrared temperature measurement detector does not need to wait after being electrified, can directly measure the temperature, and avoids the waste of time and resources.
Based on any of the above embodiments, it should be noted that, since the infrared temperature measurement detector is in an unstable state during the starting or stopping process, the state of the infrared temperature measurement detector during temperature measurement can be determined based on the length of the power-on time of the infrared temperature measurement detector. The power-on time of the infrared temperature measuring detector can be determined by utilizing a capacitor or a timer.
For example: a capacitor is connected with a machine core controller of the infrared temperature measurement detector, as shown in figure 2, after the infrared temperature measurement detector is electrified, the capacitor can be continuously charged until the infrared temperature measurement detector is fully charged. Therefore, whether the infrared temperature measurement detector reaches a stable state after being electrified can be determined by calculating the electric quantity stored in the capacitor.
Of course, a timer can be connected to the core controller of the infrared temperature detector, and the timer is set to start timing at the power-on time of the infrared temperature detector and to end when the infrared temperature detector reaches a steady state. Therefore, whether the infrared temperature measurement detector reaches a stable state after being electrified or not can be determined according to the length of the time counted by the timer.
In addition, the infrared temperature measurement detector can also be provided with a temperature measurement index value which indicates whether the infrared temperature measurement detector is stable or not, the temperature measurement index value is in a fluctuation state in an unsteady state, the temperature measurement index value does not change after the infrared temperature measurement detector reaches the steady state, and then if the temperature measurement index value does not change in a period of time, the infrared temperature measurement detector can be determined to reach the steady state after being electrified.
From the above, the following embodiments can be identified, namely: judge whether infrared temperature measurement detector is in stable state, include: judging whether a capacitor connected with a machine core controller of the infrared temperature measurement detector is in a full-charge state or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state; or judging whether a first timer connected with the infrared temperature measurement detector is overtime or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state; or judging whether the temperature measurement index value of the infrared temperature measurement detector is unchanged within a preset time period; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state.
Referring to fig. 2, the deck circuit generally includes: the computer comprises a computing unit, a storage unit, a machine core controller, a display interface and the like, wherein the capacitor is generally connected with the machine core controller. Of course, the circuit can be connected with other components in the core circuit as long as the core circuit can receive the voltage signal and/or the current signal.
The principle of capacitance-based calculation can be referred to as follows: assuming that E is the external voltage, V is the capacitor voltage, C is the capacitance, R is the circuit resistance, and t is the charging time, then ideally, the equation for calculating the capacitor voltage and the charging/discharging time is as follows:
during charging, the calculation formula comprises:
dQ＝Idt
dQ＝CdV
Idt＝CdV
after full charge and during discharge, the calculation formula comprises the following steps:
therefore, the time length of charging/discharging can be calculated according to the capacitor voltage.
Based on any of the above embodiments, it should be noted that the time interval between the power-off and the power-on of the infrared temperature measurement detector may also be determined by a capacitor or a timer, and the specific principle of the capacitor may refer to the above related contents. Therefore, in a specific embodiment, calculating a time difference between a last power-off time and a current power-on time of the infrared temperature measurement detector includes: calculating the electric quantity stored in the capacitor at the current power-on time, and calculating the time difference based on the electric quantity at the power-on time and the full-charged electric quantity of the capacitor; the core controller of the infrared temperature measurement detector is connected with a capacitor; or the time counted by a second timer connected with the infrared temperature measurement detector is used as the time difference; the second timer starts to time at the last power-off time of the infrared temperature measurement detector and stops timing at the current power-on time.
Based on any of the above embodiments, it should be noted that the energization time after the infrared temperature measurement detector is energized may also be determined by a capacitor or a timer, and the specific principle of the capacitor may refer to the above related contents. Therefore, in a specific embodiment, determining the power-on duration of the infrared temperature measurement detector after the infrared temperature measurement detector is powered on this time includes: calculating the electric quantity at the moment of measuring the target temperature value and the temperature measuring moment stored by the capacitor, and the electric quantity at the current power-on moment and the power-on moment stored by the capacitor; calculating the electrifying time length based on the electric quantity at the electrifying moment and the electric quantity at the temperature measuring moment; the core controller of the infrared temperature measurement detector is connected with a capacitor; or taking the time counted by a first timer connected with the infrared temperature measurement detector as the electrifying duration; the first timer starts timing at the current power-on time of the infrared temperature measurement detector.
Based on any of the above embodiments, it should be noted that, in a specific implementation, the generating process of the preset correction table includes:
determining and recording the actual temperature value of the object measured by the infrared temperature measurement detector; the actual temperature value is set by a tester;
setting N power-off time lengths, such as 10 seconds, 20 seconds and 30 seconds \8230
The following test steps are performed for each power-off duration:
s1, powering off an infrared temperature measurement detector in a stable state;
s2, after any power-off duration, powering on the infrared temperature measurement detector;
s3, acquiring and recording temperature values of the infrared temperature measurement detector at a plurality of moments and electric quantity stored by the capacitor at the corresponding temperature measurement moment according to a preset time interval; the core controller of the infrared temperature measurement detector is connected with a capacitor;
s4, carrying out N-order polynomial fitting or exponential fitting on the temperature values measured at all the moments and the electric quantity stored by the capacitor at the corresponding temperature measuring moment to calibrate the instability degree and the corresponding correction coefficient of all the moments and obtain a correction table with the current power-off time length, the current actual temperature value and all the temperature measuring moments after the infrared temperature measuring detector is powered on as dimensions; wherein the degree of instability at each time is represented by the offset between the measured temperature value and the actual temperature value at each time.
For example: the actual temperature value of the measured object is set to be 320 ℃, the power-off time is set to be 10 seconds, 20 seconds and 30 seconds respectively, and the power-off time can also be in minutes.
First S1-S4 are performed for 10 seconds. Assuming that the predetermined time interval is 15 seconds and the capacitor is fully charged after 3 minutes, the temperature and the capacitance at a plurality of time points as shown in fig. 3 can be measured. One temperature measuring moment corresponds to one temperature value and one capacitance electric quantity value, and then data in the graph 3 can be fitted or exponentially fitted according to an N-order polynomial, so that the instability degree of each temperature measuring moment is determined under the conditions that the power-off time is 10 seconds and the actual temperature value is 320 ℃, and a correction table is obtained.
The correction table may be converted into a corresponding fitting curve, specifically, referring to fig. 4, the fitting curve shown in fig. 4 is fitted by using a polynomial of 4 th order. The abscissa is the capacitance (the capacitance and the temperature measurement time correspond to each other, and therefore the capacitance and the temperature measurement time can be replaced with each other), and the capacitance is 0.1F. The ordinate is the temperature decay coefficient curve under cold start-up conditions (i.e., the infrared temperature measurement probe is sufficiently long in power-off time and has discharged the capacitance) when the actual temperature is observed to be 320 ℃ blackbody, and the curve is the result of dividing the measured temperature value by 320 ℃. The corresponding fitting function of the curve is shown in f (x) in fig. 5, where P1, P2, P3, P4, and P5 are fitting coefficients. The attenuation coefficient, like the correction coefficient, is used to represent the difference between the true temperature value and the measured temperature value.
After the infrared temperature measurement detector is powered on, the unsteady state degree is monotonically decreased along with the increase of the capacitance electric quantity, so that the corresponding unsteady state degree can be given to each capacitance electric quantity, and finally a calibration curve is given, as shown in fig. 4. The fitting calculation shown in fig. 4 is: and finding out a functional relation between the capacitance electric quantity and the corresponding unsteady state degree in a undetermined coefficient mode. Meanwhile, the longer the energization time is, the larger the capacitance electric quantity is until the capacitance electric quantity reaches the maximum value, and a specific calculation formula is part of the principle. This is a prerequisite for calibration. In the temperature rise process of the machine core, the measured temperature value of an object with the same temperature is gradually reduced. The curve shape of the descending curve is approximately an exponential curve, and the change of the descending curve also has no accurate calculation formula, so that after data are collected, an approximate calculation curve is obtained in a fitting mode.
In a specific embodiment, the method further comprises the following steps:
and (5) executing S1-S4 after adjusting the actual temperature value of the object measured by the infrared temperature measurement detector. Namely: after the actual temperature value of the measured object is changed, the test and the record are repeated. The measured object is generally a temperature-controllable black body.
In a specific embodiment, the method further comprises the following steps:
if the test step is executed according to any power-off duration, and the number of the infrared temperature detectors is multiple, the infrared temperature detectors are tested in parallel, the temperature values measured by the infrared temperature detectors at the same time and the electric quantity stored by the capacitor at the corresponding temperature measuring time are averaged, the average value is used as the temperature value measured at each time and the electric quantity stored by the capacitor at the corresponding temperature measuring time, and S4 is executed. Therefore, when a plurality of infrared temperature measuring detectors are tested in parallel, a plurality of temperature values and a plurality of capacitance electric quantities measured at any moment are respectively averaged, and N-order polynomial fitting or exponential fitting is carried out on the average values based on the temperature values and the capacitance electric quantities.
Based on the above, correction tables at a plurality of actual temperatures, a plurality of power-off durations and each power-on time can be obtained, the correction tables are all burnt into the machine core, and the corresponding correction tables can be inquired to correct the temperature when the temperature is measured in an unsteady state.
Referring to fig. 6, the embodiment of the application discloses a temperature correction scheme, and the scheme can calculate how long the infrared temperature measurement detector needs to reach a stable state in a mode of externally hanging a large capacitor, and does not need manual judgment, so that the efficiency is greatly improved. When the unsteady infrared temperature detector is used, the measured temperature value can be corrected from the aspect of an algorithm, so that the temperature measurement precision is improved, and the infrared temperature detector can be started and used immediately.
In this embodiment, a capacitor is connected to the infrared temperature measurement detector according to fig. 2, after the actual temperature value of the measured object and each power-off duration are set, the measurement record is performed according to S1 to S4, and the unsteady state degree is fitted and calibrated.
Specifically, a time point corresponding to each capacitance electric quantity is recorded with a non-steady state degree, and a variation curve of the non-steady state degree relative to time can be obtained through fitting calculation, so that a temperature measurement result can be corrected. A comparison of the temperature before and after correction is shown in FIG. 7. In fig. 7, the curve with the triangle as the connection point is the corrected temperature curve, and the curve with the circle as the connection point is the temperature curve before correction, so that the finally measured temperature value is more stable and closer to the actual value through temperature correction.
When the movement is in unsteady temperature measurement, the measured temperature has the same change trend, so that the change of the measured temperature can be predicted, and the unsteady degree can be quantitatively analyzed. This embodiment can judge how long the core has been cut off the power supply according to how much of electric quantity that the electric capacity was stored, consequently can do a quantitative calculation to the unsteady state degree to quantify the unsteady state degree, improve the temperature measurement precision. Meanwhile, the cost of the capacitor is low, and the cost of the scheme is low. The electric quantity stored by the capacitor can be calculated by the machine core controller based on the voltage signal and/or the current signal.
A temperature correction device provided in an embodiment of the present application is described below, and a temperature correction device described below and a temperature correction method described above may be referred to with each other.
Referring to fig. 8, an embodiment of the present application discloses a temperature correction device, including:
an obtaining module 801, configured to obtain a target temperature value measured by an infrared temperature measurement detector;
the judging module 802 is configured to judge whether the infrared temperature measurement detector is in a stable state;
the calculating module 803 is configured to calculate a time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector if the infrared temperature measurement detector is in an unstable state;
the determining module 804 is configured to determine a reference temperature value measured by the infrared temperature measurement detector at the current power-on time, and a power-on duration of the infrared temperature measurement detector after the current power-on;
the correcting module 805 is configured to query the unstable degree corresponding to the time difference, the reference temperature value and the power-on duration in a preset multi-dimensional correction table, and correct the target temperature value according to the unstable degree.
In one embodiment, the determining module includes:
the first judgment unit is used for judging whether a capacitor connected with a machine core controller of the infrared temperature measurement detector is in a full-power state or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state;
or
The second judgment unit is used for judging whether a first timer connected with the infrared temperature measurement detector is overtime or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state;
or
The third judgment unit is used for judging whether the temperature measurement index value of the infrared temperature measurement detector is unchanged within a preset time period; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state.
In one embodiment, the computing module comprises:
the first calculation unit is used for calculating the electric quantity stored by the capacitor at the current power-on time and calculating the time difference based on the electric quantity at the power-on time and the full electric quantity of the capacitor; the core controller of the infrared temperature measurement detector is connected with a capacitor;
or
The second calculating unit is used for taking the time counted by a second timer connected with the infrared temperature measuring detector as a time difference; the second timer starts to time at the last power-off time of the infrared temperature measurement detector and stops timing at the power-on time.
In one embodiment, the determining module comprises:
the first determining unit is used for calculating the electric quantity at the moment of measuring the target temperature value and the temperature measuring moment stored by the capacitor, and the electric quantity at the current electrifying moment and the electrifying moment stored by the capacitor; calculating the electrifying time length based on the electric quantity at the electrifying moment and the electric quantity at the temperature measuring moment; the core controller of the infrared temperature measurement detector is connected with a capacitor;
or
The second determining unit is used for taking the time counted by the first timer connected with the infrared temperature measuring detector as the electrifying duration; the first timer starts timing at the power-on time of the infrared temperature measurement detector.
In an embodiment, the modification module is specifically configured to:
taking the time difference, the reference temperature value and the power-on duration as query dimensions;
based on the query dimension, positioning the unstable degree and the corresponding correction coefficient in a multi-dimensional correction table;
and taking the quotient of the target temperature value and the correction coefficient as the corrected target temperature value.
In one embodiment, the generating of the preset correction table includes:
determining and recording the actual temperature value of the object measured by the infrared temperature measurement detector;
setting N power-off durations, and executing the following test steps for each power-off duration:
s1, powering off an infrared temperature measurement detector in a stable state;
s2, after any power-off duration, powering on the infrared temperature measurement detector;
s3, acquiring and recording temperature values of the infrared temperature measurement detector at a plurality of moments and electric quantity stored by the capacitor at the corresponding temperature measurement moment according to a preset time interval; the core controller of the infrared temperature measurement detector is connected with a capacitor;
s4, carrying out N-order polynomial fitting or exponential fitting on the temperature values measured at all the moments and the electric quantity stored by the capacitor at the corresponding temperature measuring moment to calibrate the instability degree and the corresponding correction coefficient of each moment and obtain a correction table with the current power-off duration, the current actual temperature value and each temperature measuring moment after the infrared temperature measuring detector is powered on as dimensions; wherein the degree of instability at each time is represented by the offset between the measured temperature value and the actual temperature value at each time.
In a specific embodiment, the generating of the preset correction table further includes:
and (5) executing S1-S4 after adjusting the actual temperature value of the object measured by the infrared temperature measurement detector.
In one embodiment, the generating of the preset correction table further includes:
if the test step is executed according to any power-off duration, and the number of the infrared temperature detectors is multiple, the infrared temperature detectors are tested in parallel, the temperature values measured by the infrared temperature detectors at the same time and the electric quantity stored by the capacitor at the corresponding temperature measuring time are averaged, the average value is used as the temperature value measured at each time and the electric quantity stored by the capacitor at the corresponding temperature measuring time, and S4 is executed.
For more specific working processes of each module and unit in this embodiment, reference may be made to corresponding contents disclosed in the foregoing embodiments, and details are not described here again.
Therefore, the embodiment provides a temperature correction device, which can quantify the unstable degree of the infrared temperature detector, so as to correct the temperature value measured by the infrared temperature detector in an unstable state, improve the temperature measurement precision, and measure the accurate temperature value in the unstable state of the infrared detector. Therefore, the infrared temperature measuring detector does not need to wait after being electrified, can directly measure the temperature and avoids the waste of time and resources.
In the following, an infrared temperature measurement detector provided by an embodiment of the present application is introduced, and the infrared temperature measurement detector described below and the temperature correction method and apparatus described above may refer to each other.
A movement controller of the infrared temperature detector is connected with a timing component, and the timing component is used for recording the time difference between the power-off time and the next power-on time of the infrared temperature detector.
In one embodiment, the timing component is a capacitive circuit or a timer (i.e., the second timer described above).
In one embodiment, the infrared thermometry probe is specifically configured to: acquiring a target temperature value measured by an infrared temperature measurement detector; judging whether the infrared temperature measurement detector is in a stable state; if not, calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector; determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on time and the power-on time length of the infrared temperature measurement detector after the power-on; and inquiring the unsteady degree corresponding to the time difference, the reference temperature value and the power-on time in a preset multi-dimensional correction table, and correcting the target temperature value according to the unsteady degree.
In the following, an electronic device provided by an embodiment of the present application is introduced, and an electronic device described below and a temperature correction method and apparatus described above may be referred to with each other.
Referring to fig. 9, an embodiment of the present application discloses an electronic device, including:
a memory 901 for storing a computer program;
a processor 902 for executing the computer program to implement the method disclosed by any of the embodiments described above.
A readable storage medium provided by an embodiment of the present application is introduced below, and a readable storage medium described below and a temperature correction method, apparatus, and device described above may be referred to with each other.
A readable storage medium for storing a computer program, wherein the computer program when executed by a processor implements the temperature correction method disclosed in the foregoing embodiments. For the specific steps of the method, reference may be made to corresponding contents disclosed in the foregoing embodiments, and details are not repeated here.
References to "first," "second," "third," "fourth," etc. (if any) in this application are intended to distinguish between similar elements and not necessarily to describe a particular sequential or chronological order. It will be appreciated that the data so used may be interchanged under appropriate circumstances such that the embodiments described herein may be practiced otherwise than as specifically illustrated or described herein. Moreover, the terms "comprises" and "comprising," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, or apparatus.
It should be noted that the descriptions in this application referring to "first", "second", etc. are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in Random Access Memory (RAM), memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of readable storage medium known in the art.
The principle and the implementation of the present application are explained herein by applying specific examples, and the above description of the embodiments is only used to help understand the method and the core idea of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (12)
1. A temperature correction method, comprising:
acquiring a target temperature value measured by an infrared temperature measurement detector;
judging whether the infrared temperature measurement detector is in a stable state;
if not, calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector;
determining a reference temperature value measured by the infrared temperature measurement detector at the current power-on time and the power-on time length of the infrared temperature measurement detector after the infrared temperature measurement detector is powered on;
inquiring the unsteady degree corresponding to the time difference, the reference temperature value and the electrifying time length in a preset multi-dimensional correction table, and correcting the target temperature value according to the unsteady degree;
wherein, the generating process of the multidimensional correction table comprises the following steps:
determining and recording the actual temperature value of the object measured by the infrared temperature measurement detector;
setting N power-off durations, and executing the following test steps for each power-off duration:
s1, powering off the infrared temperature measurement detector in a stable state;
s2, after any power-off duration, powering on the infrared temperature measurement detector;
s3, acquiring and recording temperature values of the infrared temperature measurement detector at a plurality of moments and electric quantity stored by the capacitor at the corresponding temperature measurement moment according to a preset time interval; the core controller of the infrared temperature measurement detector is connected with the capacitor;
s4, carrying out N-order polynomial fitting or exponential fitting on the temperature values measured at all the moments and the electric quantity stored by the capacitor at the corresponding temperature measuring moment to calibrate the instability degree and the corresponding correction coefficient of each moment and obtain a correction table with the current power-off duration, the current actual temperature value and each temperature measuring moment after the infrared temperature measuring detector is powered on as dimensions; and the instability degree of each moment is represented by the offset between the measured temperature value and the actual temperature value at each moment.
2. The method of claim 1, wherein said determining whether the infrared thermometry detector is in a steady state comprises:
judging whether a capacitor connected with a machine core controller of the infrared temperature measurement detector is in a full-electricity state or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state;
or
Judging whether a first timer connected with the infrared temperature measurement detector is overtime or not; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state;
or
Judging whether the temperature measurement index value of the infrared temperature measurement detector is unchanged within a preset time period; if so, determining that the infrared temperature measurement detector is in a stable state; otherwise, determining that the infrared temperature measurement detector is in an unstable state.
3. The method of claim 1, wherein calculating the time difference between the last power-off time and the current power-on time of the infrared thermometry detector comprises:
calculating the electric quantity stored in the capacitor at the current power-on moment, and calculating the time difference based on the electric quantity at the power-on moment and the full electric quantity of the capacitor; the core controller of the infrared temperature measurement detector is connected with the capacitor;
or
Taking the time counted by a second timer connected with the infrared temperature measurement detector as the time difference; and the second timer starts to time at the last power-off moment of the infrared temperature measurement detector and stops timing at the current power-on moment.
4. The method according to claim 1, wherein the determining the power-on duration of the infrared temperature measurement detector after the power-on comprises:
calculating the electric quantity at the moment of measuring the target temperature value and the temperature measuring moment stored by the capacitor, and the electric quantity at the current power-on moment and the power-on moment stored by the capacitor; calculating the electrifying time length based on the electrifying time electric quantity and the temperature measuring time electric quantity; the core controller of the infrared temperature measurement detector is connected with the capacitor;
or
Taking the time counted by a first timer connected with the infrared temperature measurement detector as the electrifying time length; and the first timer starts to time at the current power-on time of the infrared temperature measurement detector.
5. The method according to claim 1, wherein said looking up the instability degrees corresponding to the time difference, the reference temperature value and the energization time period in a preset multi-dimensional correction table and correcting the target temperature value according to the instability degree comprises:
taking the time difference, the reference temperature value and the electrifying duration as query dimensions;
based on the query dimension, locating the unstable degree and the corresponding correction coefficient in the multi-dimensional correction table;
and taking the quotient of the target temperature value and the correction coefficient as a corrected target temperature value.
6. The method of any of claims 1 to 5, further comprising:
and (4) executing S1-S4 after adjusting the actual temperature value of the object measured by the infrared temperature measurement detector.
7. The method of any of claims 1 to 5, further comprising:
and if the test step is executed according to any power-off duration, the infrared temperature detectors are multiple, the infrared temperature detectors are tested in parallel, the temperature values measured by the infrared temperature detectors at the same time and the electric quantity stored by the capacitor at the corresponding temperature measuring time are averaged, the average value is used as the temperature value measured at each time and the electric quantity stored by the capacitor at the corresponding temperature measuring time, and S4 is executed.
8. A temperature correction device, characterized by comprising:
the acquisition module is used for acquiring a target temperature value measured by the infrared temperature measurement detector;
the judging module is used for judging whether the infrared temperature measuring detector is in a stable state or not;
the calculation module is used for calculating the time difference between the last power-off time and the current power-on time of the infrared temperature measurement detector if the infrared temperature measurement detector is in an unstable state;
the determining module is used for determining a reference temperature value measured by the infrared temperature measuring detector at the current power-on time and the power-on time length of the infrared temperature measuring detector after the infrared temperature measuring detector is powered on;
the correction module is used for inquiring the instability degree corresponding to the time difference, the reference temperature value and the electrifying time length in a preset multidimensional correction table and correcting the target temperature value according to the instability degree;
wherein, the generating process of the multidimensional correction table comprises the following steps:
determining and recording the actual temperature value of the object measured by the infrared temperature measurement detector;
setting N power-off durations, and executing the following test steps for each power-off duration:
s1, powering off the infrared temperature measurement detector in a stable state;
s2, after any power-off duration, powering on the infrared temperature measurement detector;
s3, acquiring and recording temperature values measured by the infrared temperature measurement detector at a plurality of moments and electric quantity stored by a capacitor at corresponding temperature measurement moments according to a preset time interval; the core controller of the infrared temperature measurement detector is connected with the capacitor;
s4, carrying out N-order polynomial fitting or exponential fitting on the temperature values measured at all the moments and the electric quantity stored by the capacitor at the corresponding temperature measuring moment to calibrate the instability degree and the corresponding correction coefficient of all the moments and obtain a correction table with the current power-off time length, the current actual temperature value and all the temperature measuring moments after the infrared temperature measuring detector is powered on as dimensions; and the instability degree of each moment is represented by the offset between the measured temperature value and the actual temperature value at each moment.
9. An infrared temperature measurement detector is characterized in that a machine core controller of the infrared temperature measurement detector is connected with a timing component, and the timing component is used for recording the time difference between the power-off time and the next power-on time of the infrared temperature measurement detector;
wherein the infrared thermometry probe is used to implement the method of any one of claims 1 to 7.
10. The infrared thermometric detector of claim 9, wherein said timing component is a capacitive circuit or a timer.
11. An electronic device, comprising:
a memory for storing a computer program;
a processor for executing the computer program to implement the method of any one of claims 1 to 7.
12. A readable storage medium for storing a computer program, wherein the computer program when executed by a processor implements the method of any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110837930.2A CN113566973B (en) | 2021-07-23 | 2021-07-23 | Temperature correction method and assembly and infrared temperature measurement detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110837930.2A CN113566973B (en) | 2021-07-23 | 2021-07-23 | Temperature correction method and assembly and infrared temperature measurement detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113566973A CN113566973A (en) | 2021-10-29 |
| CN113566973B true CN113566973B (en) | 2022-12-09 |
Family
ID=78166778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110837930.2A Active CN113566973B (en) | 2021-07-23 | 2021-07-23 | Temperature correction method and assembly and infrared temperature measurement detector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113566973B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112595767B (en) * | 2020-12-14 | 2022-10-04 | 深圳市豪恩安全科技有限公司 | Calibration method, system and equipment of semiconductor type gas sensor |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5080850B2 (en) * | 2007-04-24 | 2012-11-21 | パナソニック株式会社 | Infrared detector |
| CN102564598B (en) * | 2012-01-06 | 2013-09-25 | 电子科技大学 | Method for calibrating and correcting temperature measurement of infrared probe as well as corresponding temperature measuring method |
| CN105157852A (en) * | 2015-06-26 | 2015-12-16 | 青岛海尔股份有限公司 | Refrigerator and temperature measurement error correction method for infrared sensor |
| CN105300923B (en) * | 2015-11-19 | 2018-02-13 | 江南大学 | Without measuring point model of temperature compensation modification method during a kind of near-infrared spectrometers application on site |
| CN107976255B (en) * | 2017-11-24 | 2020-05-15 | 烟台艾睿光电科技有限公司 | Method and device for correcting non-uniformity correction coefficient of infrared detector |
| CN110631710B (en) * | 2019-10-18 | 2020-12-04 | 海视英科光电（苏州）有限公司 | Barrier-free infrared temperature measurement method and device |
| CN111024238B (en) * | 2019-11-28 | 2021-10-15 | 天津津航技术物理研究所 | Radiation calibration and temperature measurement method for uncooled temperature measurement thermal imager |
-
2021
- 2021-07-23 CN CN202110837930.2A patent/CN113566973B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN113566973A (en) | 2021-10-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11346888B2 (en) | System and method for sensing battery capacity | |
| US10989761B2 (en) | Method for estimating the state of health of a battery | |
| US6441585B1 (en) | Apparatus and method for testing rechargeable energy storage batteries | |
| US10261136B2 (en) | Battery degradation degree estimation device and battery degradation degree estimation method | |
| CN107228719B (en) | Temperature calibration method, module to be tested and temperature calibration device | |
| CN112986842B (en) | Method, device and equipment for estimating state of charge of battery | |
| JP5367604B2 (en) | Method and apparatus for measuring internal impedance of secondary battery | |
| US20110098966A1 (en) | Electronic clinical thermometer and operation control method | |
| US20090248334A1 (en) | Method for estimating the charge of a motor vehicle battery | |
| CN113566973B (en) | Temperature correction method and assembly and infrared temperature measurement detector | |
| CN105527038A (en) | Error correction method for platinum thermal resistance sensor and calorimeter measuring temperature using the same method | |
| CN114253317B (en) | Heating temperature calibration method and device for heating element and readable storage medium | |
| JP2009234557A (en) | Open voltage value estimation method and open voltage value estimation device | |
| JP2008096328A (en) | Charging rate estimation method, charging rate estimating device, and secondary battery power supply system | |
| CN109633451B (en) | Energy storage system self-track parameter calibration method and SOC estimation method | |
| JP2016065844A (en) | Battery system control apparatus and control method of battery system | |
| CN111487467B (en) | Method and device for obtaining initial resistance of heating element | |
| CN112595983B (en) | Charging electric quantity determination method and device, processor and storage medium | |
| JP5768160B1 (en) | Secondary battery capacity evaluation method and evaluation apparatus | |
| TW201814318A (en) | A method for estimating a battery power percentage of a battery and a power management apparatus | |
| US20020128791A1 (en) | Integrated circuit of an electronic thermometer | |
| JP3305403B2 (en) | Battery capacity testing device | |
| CN115167573B (en) | Liquid processing apparatus, control method and apparatus thereof, and readable storage medium | |
| US20140114593A1 (en) | Apparatus and method for calculating electrical charge quantity or electrical discharge quantity for battery unit according to calibration parameter used for adjusting time interval of electrical charge/discharge calculation, and method for calibrating integral time interval | |
| CN113218527B (en) | Thermistor-based temperature detection method, device, equipment, medium and system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |