CN113551585B - Jig for detecting parallelism of sample and method for detecting parallelism of sample - Google Patents

Jig for detecting parallelism of sample and method for detecting parallelism of sample Download PDF

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Publication number
CN113551585B
CN113551585B CN202010337018.6A CN202010337018A CN113551585B CN 113551585 B CN113551585 B CN 113551585B CN 202010337018 A CN202010337018 A CN 202010337018A CN 113551585 B CN113551585 B CN 113551585B
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sample
height
parallelism
jig
detecting
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CN113551585A (en
Inventor
韩泽
孙文峰
邱惊龙
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Guangdong Oppo Mobile Telecommunications Corp Ltd
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Guangdong Oppo Mobile Telecommunications Corp Ltd
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Priority to CN202010337018.6A priority Critical patent/CN113551585B/en
Publication of CN113551585A publication Critical patent/CN113551585A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/24Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
    • G01B5/061Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness height gauges
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57Improving the yield, e-g- reduction of reject rates

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

The application discloses a jig for detecting sample parallelism and a method for detecting sample parallelism, the jig for detecting sample parallelism comprises a positioning block, the bottom surface of the positioning block is provided with a first reference surface, a plurality of grooves with open tops are arranged on the positioning block, a supporting piece and a height column are arranged in each groove, the supporting piece is arranged on the bottom wall of each groove, the height columns are supported on the supporting piece, under the detection condition, the supporting piece can be subjected to plastic deformation, under the initial form of the supporting piece, the upper surfaces of the height columns in all the grooves are positioned in a second reference surface, the second reference surface is parallel to the first reference surface, and the connection line between the geometric centers of the upper surfaces of the plurality of height columns is formed into a polygon. According to the jig for detecting the parallelism of the sample, provided by the embodiment of the application, the structure is simple, the detection process is simple and convenient and is easy to operate, the time for detecting the parallelism of the sample is greatly shortened, the detection efficiency is improved, and the detection difficulty is reduced.

Description

Jig for detecting parallelism of sample and method for detecting parallelism of sample
Technical Field
The application relates to the technical field of jigs, in particular to a jig for detecting parallelism of a sample and a method for detecting parallelism of the sample.
Background
In the related art, the jig for detecting the parallelism of the sample is complex in structure, and the method for detecting the parallelism of the sample is complex, long in time consumption and not convenient enough. For example, when detecting the parallelism of a template of a glass hot bending machine, a piece of glass is usually placed in a concave-convex mold, and is hot-pressed into a 3D shape, and then CAV computer-aided detection (CAV computer-aided detection means that the accurate point cloud data obtained after 3D shape scanning of a detected workpiece is compared with an originally designed CAD drawing file), and the obtained error color drawing can quickly and effectively help us to judge the parallelism of the template by judging the errors of the workpiece and CAD and other analysis, and the template of the hot bending machine is correspondingly adjusted according to a detection structure. And (3) after adjustment, putting new glass again, and repeating the steps until the CAV deviation of the pressed glass is within an acceptable tolerance range.
However, it takes thirty minutes to heat-press a piece of glass on average, and thirty minutes to perform CAV scanning after heat-pressing, so that it takes at least one more hour to debug a hot bending machine, and it takes a long time.
Content of the application
The present application aims to solve at least one of the technical problems existing in the prior art. Therefore, an object of the present application is to provide a jig for detecting parallelism of a sample, which has a simple structure and can detect parallelism of a sample conveniently and rapidly.
The application also provides a method for detecting the parallelism of the sample by adopting the jig for detecting the parallelism of the sample.
According to an embodiment of the first aspect of the present application, a jig for detecting parallelism of a sample includes: the bottom surface of locating piece has first reference surface, be equipped with a plurality of open recesses in top on the locating piece, every be equipped with support piece and high post in the recess, support piece establishes on the diapire of recess, gao Duzhu support on the support piece, under the detection condition, the support piece can take place plastic deformation, under the initial form of support piece, all the upper surface of high post in the recess all is located the second reference surface, the second reference surface with first reference surface is parallel, and the line between the geometric center of gravity of a plurality of high post's upper surface forms the polygon.
According to the jig for detecting the parallelism of the sample, the groove is formed in the positioning block, the height column and the supporting piece capable of generating plastic deformation under the detection condition are arranged in the groove, so that the supporting piece can be deformed under the detection condition (for example, at a proper temperature), the parallelism of the sample can be detected and corrected by measuring the height difference of the plurality of height columns after the supporting piece is deformed, the structure of the jig is simple, the detection process is simple and convenient, the operation is easy, the time for detecting the parallelism of the sample is greatly shortened, the detection efficiency is improved, and the detection difficulty is reduced.
According to some embodiments of the application, the positioning block is provided with a plurality of through channels, the through channels are in one-to-one correspondence with the grooves, one end of each through channel extends to a bottom wall penetrating through the groove to form a first communication port, and the other end of each through channel extends to a bottom surface penetrating through the positioning block to form a second communication port.
According to some embodiments of the application, the support is formed in the initial state in a spherical, ellipsoidal, cylindrical, rectangular, square or irregular shape.
According to some embodiments of the application, a portion of the orthographic projection of the support member on the groove bottom wall overlies the first communication port.
According to some embodiments of the application, the first reference plane extends in a horizontal direction.
In some embodiments of the present application, the positioning block is formed in a square or rectangular parallelepiped shape.
In some embodiments of the application, the positioning block is a die steel piece or a graphite piece.
In some embodiments of the application, the height column is a die steel piece or a graphite piece.
According to some embodiments of the application, the support is a plasticine member, a plastic member, a metal member, or a glass member.
According to a second aspect of the present application, a method for detecting parallelism of a sample, the sample including a first plate and a second plate, includes the steps of:
s10: moving the first plate downwards to enable the first plate to be in contact with the upper surface of the height column;
s20: pressing down the first plate body to plastically deform the support member;
s30: and measuring the height difference of the height column.
According to the method for detecting the parallelism of the sample, the groove is formed in the positioning block, the height column and the supporting piece capable of generating plastic deformation under the detection condition are arranged in the groove, so that the supporting piece can be deformed under the detection condition (for example, at a proper temperature), the parallelism of the sample can be detected and corrected by measuring the height difference of the plurality of height columns after the supporting piece is deformed, the structure of the jig is simple, the detection process is simple and convenient to operate, the time for detecting the parallelism of the sample is greatly shortened, the detection efficiency is improved, and the detection difficulty is reduced.
According to some embodiments of the application, the method of detecting parallelism of a sample further comprises the steps of:
s40: and adjusting the position of the first plate body according to the height difference to enable the first plate body to be parallel to the second plate body.
According to some embodiments of the application, in step S30, the height difference of the height column is measured using a height gauge.
According to some embodiments of the present application, the first plate body is provided with a plurality of fixing holes, the plurality of fixing holes are in one-to-one correspondence with the plurality of height columns, and in step S10, at least a part of central axes of the fixing holes are coincident with central axes of the height columns corresponding to the fixing holes.
According to some embodiments of the application, the sample is a template of a glass heat bender, the first plate is an upper template of the template, and the second plate is a lower template of the template.
Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application.
Drawings
The foregoing and/or additional aspects and advantages of the application will become apparent and may be better understood from the following description of embodiments taken in conjunction with the accompanying drawings in which:
fig. 1 is a perspective view of a jig for detecting parallelism of a sample according to an embodiment of the application;
FIG. 2 is a top view of a fixture for detecting parallelism of a sample according to an embodiment of the application;
FIG. 3 is a side view of a fixture for detecting parallelism of a sample according to an embodiment of the application;
FIG. 4 is a cross-sectional view of a jig for detecting parallelism of a sample according to an embodiment of the application, wherein a support is in an initial state;
FIG. 5 is another cross-sectional view of a fixture for detecting parallelism of a sample, with a support in a deformed state, according to an embodiment of the application;
fig. 6 is a perspective view of a positioning block of a jig for detecting parallelism of a sample according to an embodiment of the present application;
FIG. 7 is a schematic diagram of a fixture for detecting parallelism of a sample in accordance with an embodiment of the present application mated with a detection sample;
fig. 8 is another schematic diagram of the fixture for detecting parallelism of a sample and the sample according to an embodiment of the application.
Reference numerals:
the jig (100) is used for the treatment of the skin,
the positioning block 1, the groove 11, the through passage 12, the first communication port 121, the second communication port 122,
the support 2, the height column 3,
the first plate 200, the second plate 300, the driving member 400, the spacer 500.
Detailed Description
Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the application.
A jig 100 for detecting parallelism of a sample according to an embodiment of the present application is described below with reference to the drawings. Wherein the test sample may include a first plate 200 and a second plate 300. The jig 100 may be used to detect whether the first and second plates 200 and 300 are parallel. For example, the sample to be tested may be a template of a glass heat bender. That is, the jig 100 of the present application may be used to detect parallelism of a template of a glass heat bender. Specifically, the jig 100 may detect whether the upper and lower templates (i.e., the first and second plate bodies 200 and 300) are parallel. Of course, the sample to be detected is not limited thereto, and may be other objects requiring parallelism detection.
The jig 100 for detecting parallelism of a sample according to the embodiment of the first aspect of the application includes a positioning block 1, wherein a bottom surface of the positioning block 1 has a first reference surface. The positioning block 1 is provided with a plurality of grooves 11 with open tops. Here, "a plurality of" in the present application means three or more, that is, at least three.
Each groove 11 is internally provided with a support 2 and a height column 3, the support 2 is arranged on the bottom wall of the groove 11, the height column 3 is supported on the support 2, under the detection condition, the support 2 can be plastically deformed, and in the initial form of the support 2, the upper surfaces of the height columns 3 in all the grooves 11 are positioned in a second reference plane, and the second reference plane is parallel to the first reference plane.
In the present application, "plastic deformation" is to be understood in a broad sense as long as it has the ability to undergo plastic deformation (deformation that is not self-restorable) under the detection conditions. For example, glass is a brittle material at normal temperature, but glass can soften and collapse at high temperature, and therefore, glass has a plastic deformation capability at high temperature. Thus, when the detection condition is a high temperature condition, the support 2 may be a glass member. The "initial state" refers to a state when the support 2 is not plastically deformed.
In the initial form of the support 2, the line between the geometric centers of gravity of the upper surfaces of the plurality of height posts 3 is formed as a polygon. For example, when the grooves 11 are three, the geometric centers of gravity of the upper surfaces of the height posts 3 in the three grooves 11 may enclose a triangle, and when the grooves 11 are four, the geometric centers of gravity of the upper surfaces of the height posts 3 in the four grooves 11 may enclose a square or rectangle. That is, in the initial configuration of the support 2, the geometric centers of gravity of the upper surfaces of the plurality of height posts 3 are not collinear. Thereby, a second reference plane may be defined by the upper surfaces of the plurality of height posts 3. Wherein the geometric center of gravity refers to the mathematical center of gravity, e.g., the intersection of the three centerlines of the triangle is the geometric center of gravity of the triangle.
When the jig 100 is used to detect parallelism of a sample, the jig 100 may be sandwiched between the first and second plates 200 and 300 of the sample. For example, referring to fig. 7 and 8, the first plate 200 and the second plate 300 are disposed at an upper and lower interval, the second plate 300 may be attached to the first reference surface, and the first plate 200 may be disposed above the elevation column 3. In the detection process, the first plate 200 can be pressed down to deform the supporting member 2 (for example, the supporting member 2 can be flattened), then the height difference of the plurality of height posts 3 is measured to determine whether the first plate 200 and the second plate 300 are parallel, and the position of the first plate 200 can be adjusted through the measured height difference to enable the first plate 200 and the second plate 300 to be parallel, so that the parallelism of the sample is corrected.
In some embodiments of the present application, the distance between the upper surface of each height post 3 and the first reference surface may be measured to calculate the height difference of the height posts 3. For example, the height difference of the height posts 3 may be obtained by measuring the distance between the upper surface of each height post 3 and the first reference surface using a height gauge, whereby the accuracy of detection may be improved.
According to the jig 100 for detecting parallelism of a sample, according to the embodiment of the application, the groove 11 is formed in the positioning block 1, the height column 3 and the support 2 which can be plastically deformed under the detection condition are arranged in the groove 11, so that the support 2 can be deformed under the detection condition (for example, at a proper temperature) by pressing down the height column 3, and then the parallelism of the sample can be detected and corrected by measuring the height difference of the plurality of height columns 3 after the support 2 is deformed, the structure of the jig 100 is simple, the detection process is simple and easy to operate, the time for detecting the parallelism of the sample is greatly shortened, the detection efficiency is improved, and the detection difficulty is reduced.
According to some embodiments of the present application, the positioning block 1 is provided with a plurality of through channels 12, the through channels 12 are in one-to-one correspondence with the grooves 11, one end of the through channel 12 (for example, an upper end of the through channel 12 in fig. 4) extends to a bottom wall of the through groove 11 to form a first communication opening 121, and the other end of the through channel 12 (for example, a lower end of the through channel 12 in fig. 4) extends to a bottom surface of the through positioning block 1 to form a second communication opening 122. Therefore, after the parallelism of the sample is detected, the deformed support piece 2 can be ejected out by means of a tool through the through channel 12, so that the support piece 2 is separated from the bottom wall of the groove 11, and the support piece 2 can be conveniently taken out, thereby being convenient for reusing the jig 100.
Alternatively, the through passage 12 extends in the vertical direction. Thereby, the resistance of the tool passing through the through passage 12 can be reduced, facilitating the tool to pass out from the first communication port 121 to jack up the support 2.
According to some embodiments of the present application, the support 2 is formed in an initial state in a spherical, ellipsoidal, cylindrical, rectangular, square or irregular shape. Thus, the supporting piece 2 is easy to be flattened and deformed, and has simple structure and convenient processing.
According to some embodiments of the application, a portion of the orthographic projection of the support 2 on the bottom wall of the recess 11 is overlaid on the first communication opening 121. That is, the area of the orthographic projection of the support member 2 on the bottom wall is larger than the sectional area of the first communication port 121. Therefore, the support piece 2 can be prevented from falling into the through channel 12 completely, and the accuracy of the detection result of the jig 100 is ensured. Meanwhile, after the support member 2 is deformed, it is ensured that the first communication port 121 is covered by the support member 2, thereby facilitating the ejection of the deformed support member 2 by a tool through the through passage 12.
According to some embodiments of the application, the first reference plane extends in a horizontal direction. It will be appreciated that a portion of the bottom surface of the positioning block 1 may be configured as the first reference surface, or the entire bottom surface of the positioning block 1 may be configured as the first reference surface.
In the inspection process, when the first plate 200 is pressed down, an external force extending along the normal line of the first plate 200 may be applied to the first plate 200 in order to ensure the accuracy of the inspection result. The first reference surface is provided as a plane extending in the horizontal direction, and an external force extending in the vertical direction may be applied to the first plate body 200 at the time of detection. Therefore, the direction of the external force is convenient to control, and the accuracy of the detection result is improved.
In some embodiments of the present application, the positioning block 1 is formed in a square or rectangular parallelepiped shape. Simple structure and convenient processing.
In some embodiments of the application, the positioning block 1 is a die steel piece or a graphite piece. The die steel has high structural strength and low material cost, and the positioning block 1 is arranged as a die steel piece, so that the structural strength of the positioning block 1 can be improved, and the material cost is reduced. The graphite has good high temperature resistance, and the positioning block 1 is arranged as a graphite piece, so that the applicable temperature range of the positioning block 1 can be enlarged, and the application range of the jig 100 can be enlarged.
In some embodiments of the application, the height column 3 is a die steel piece or a graphite piece. The die steel has high structural strength and low material cost, and the height column 3 is arranged as a die steel part, so that the structural strength of the height column 3 can be improved, and the material cost is reduced. The high temperature resistance of graphite is good, and the height column 3 is set to be a graphite piece, so that the applicable temperature range of the height column 3 can be enlarged, and the application range of the jig 100 can be enlarged.
According to some embodiments of the application, the support 2 is a plasticine, plastic, metal or glass piece. Wherein, the plasticine and the plastic can be plastically deformed under the action of external force at normal temperature. Metals and glass can undergo plastic deformation under the influence of external forces at high temperatures. The user can reasonably select the material of the supporting member 2 according to the detection condition of the jig 100.
According to the method for detecting parallelism of a sample according to the embodiment of the second aspect of the present application, the sample includes a first plate 200 and a second plate 300, and the method for detecting parallelism of the sample includes the steps of:
s10: moving the first plate 200 downward to bring the first plate 200 into contact with the upper surface of the elevation column 3;
s20: depressing the first plate 200 to plastically deform the support 2;
s30: the difference in height of the height column 3 is measured.
Specifically, during the detection process, the first plate 200 may be gradually moved down, and when the first plate 200 contacts the upper surface of the height column 3, the first plate 200 is pressed down, and the support column will be gradually flattened as the first plate 200 gradually moves down. And then the parallelism of the sample can be judged by measuring the height difference of the height column 3. In some embodiments of the present application, the distance between the upper surface of each height post 3 and the first reference surface may be measured to calculate the height difference of the height posts 3.
The whole detection process can be carried out at normal temperature or at high temperature. For example, in the actual detection process, the actual use environment of the sample can be simulated, and the parallelism of the sample can be detected. Therefore, the detection error can be reduced, and the accuracy of the detection result can be improved.
It will be appreciated that when the actual environment of use of the sample is at a high temperature, the sample parallelism can be measured at normal temperature as well. Therefore, the detection difficulty can be reduced, the detection efficiency is improved, and the detection time consumption is shortened.
According to the method for detecting the parallelism of the sample, the groove 11 is formed in the positioning block 1, the height column 3 and the supporting piece 2 which can be subjected to plastic deformation under the detection condition are arranged in the groove 11, so that the supporting piece 2 can be deformed by pressing down the height column 3, the parallelism of the sample can be detected and corrected by measuring the height difference of the plurality of height columns 3 after the supporting piece 2 is deformed, the structure of the jig 100 is simple, the detection process is simple and convenient, the operation is easy, the time for detecting the parallelism of the sample is greatly shortened, the detection efficiency is improved, and the detection difficulty is reduced.
According to some embodiments of the application, the method of detecting parallelism of a sample further comprises the steps of:
s40: the position of the first plate 200 is adjusted according to the height difference so that the first plate 200 is parallel to the second plate 300. Therefore, the parallelism of the sample can be conveniently and rapidly corrected.
According to some embodiments of the application, in step S30, the difference in height of the height column 3 is measured using a height gauge. Thereby, the accuracy of detection can be improved.
According to some embodiments of the present application, the first plate 200 is provided with a plurality of fixing holes, where the plurality of fixing holes are in one-to-one correspondence with the plurality of height columns 3, and in step S10, at least a portion of the central axes of the fixing holes are coincident with the central axes of the height columns 3 corresponding thereto. Wherein, the fixing hole can be penetrated with a fixing member, and the first plate 200 is fixed on the device with the sample through the fixing member.
Specifically, the central axes of some of the fixing holes may coincide with the central axes of the height posts 3 corresponding thereto, or the central axes of all of the fixing holes may coincide with the central axes of the height posts 3 corresponding thereto. Therefore, after the height difference of the height column 3 is measured, the fixing piece in the fixing hole can be adjusted according to the height condition of the height column 3 corresponding to the fixing hole so as to adjust the position of the first plate body 200, so that the first plate body 200 is parallel to the second plate body 300, the accuracy of correcting the parallelism of the sample is improved, the parallelism of the correction sample is reduced, the correction efficiency is improved, and the correction time is further shortened.
For example, in some embodiments of the present application, the fixing member is a bolt, and after the height difference of the height column 3 is measured, the position of the first plate 200 may be adjusted by rotating the bolt. Further, a spacer 500 is disposed between the first plate 200 and the main body, and after the height difference of the height column 3 is measured, the position of the first plate 200 can be adjusted by adjusting the height of the spacer 500, so as to adjust the parallelism of the sample, and make the first plate 200 parallel to the second plate 300.
According to some embodiments of the application, the sample is a template of a glass heat bender, the first plate 200 is an upper template, and the second plate 300 is a lower template.
The jig 100 for detecting parallelism of a sample according to an embodiment of the present application is described below.
Example 1
As shown in fig. 1 to 6, a jig 100 for detecting parallelism of a sample according to an embodiment of the present application includes a positioning block 1, the positioning block 1 is formed in a rectangular parallelepiped shape, a bottom surface of the positioning block 1 is configured as a first reference surface, four grooves 11 with open tops are provided on the positioning block 1, a supporting member 2 and a height column 3 are provided in each groove 11, the supporting member 2 is provided on a bottom wall of the groove 11, the height column 3 is supported on the supporting member 2, and in an initial form of the supporting member 2, upper surfaces of the height columns 3 in all the grooves 11 are located in a second reference surface, the second reference surface being parallel to the first reference surface. The line between the geometric centers of gravity of the upper surfaces of the four height posts 3 is formed in a rectangular shape.
The positioning block 1 is provided with four through channels 12, the four through channels 12 are in one-to-one correspondence with the four grooves 11, the through channels 12 extend in the vertical direction, the upper ends of the through channels 12 extend to the bottom wall of the through groove 11 to form a first communication port 121, and the lower ends of the through channels 12 extend to the bottom surface of the through positioning block 1 to form a second communication port 122.
The support member 2 is formed in a spherical shape in an initial state, and a portion of an orthographic projection of the support member 2 on the bottom wall of the recess 11 is covered on the first communication port 121. The support piece 2 is a plasticine piece, and the positioning block 1 and the height column 3 are die steel pieces.
The method for detecting parallelism of a sample using the jig 100 of the first embodiment will be described below by taking the sample as a template of a glass heat bender as an example.
First, the structure of the lower glass heat bender will be described. Referring to fig. 7 and 8, the shaping plate includes an upper shaping plate and a lower shaping plate, and the upper shaping plate is connected to a driving member 400 of the glass heat bender. Four fixing holes are formed in the upper template, and bolts penetrate through the fixing holes to connect the upper template to the driving piece 400. Four cushion blocks 500 are arranged between the upper template and the driving piece 400, and one cushion block 500 is arranged at the periphery of each fixing hole. The spacer 500 may be a tungsten steel piece.
The method for detecting the parallelism of the sample comprises the following steps:
placing the positioning block 1 on the second plate 300, so that the second plate 300 is attached to the first reference surface;
moving the first plate 200 downward to bring the first plate 200 into contact with the upper surface of the elevation column 3;
the support 2 is plastically deformed by the first plate 200 being pressed down by the driving member 400;
measuring the distance between the upper surface of the height column 3 and the first reference surface by using a height gauge to obtain a height difference between the height columns 3;
the height of the spacer 500 at the corresponding fixing hole is adjusted according to the height difference between the height posts 3 so that the first plate 200 is parallel to the second plate 300.
Example two
The structure of the jig 100 for detecting parallelism of a sample in this embodiment is substantially the same as that of the first embodiment, except that the supporting member 2 in this embodiment is a glass member, and the positioning block 1 and the height column 3 are graphite members.
The method for detecting parallelism of a sample using the jig 100 in the second embodiment will be described below by taking the sample as a template of a glass heat bender as an example.
The jig 100 is pushed into a hot bending machine, the positioning block 1 is placed on the lower template, the lower template is attached to the first reference surface, the temperature of the forming station is set to be 700 ℃, the hot bending pressure is set to be 50KG, and the single process is 40s, so that the support piece 2 can be fully heated and softened. The upper platen of the heat bender is moved slowly downward and in contact with the height posts 3, and the softened support members 2 will be gradually flattened as the upper platen is moved gradually downward (as shown in fig. 8). Then, the jig 100 is pushed out of the hot bending machine, the height difference of the height column 3 is measured by using a height gauge, and the height of the cushion block 500 is adjusted according to the height difference, so that the parallelism of the glass hot bending machine template is corrected.
In the description of the present application, it should be understood that the terms "center," "upper," "lower," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate description of the present application and simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.
In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the present application have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the spirit and principles of the application, the scope of which is defined by the claims and their equivalents.

Claims (13)

1. A tool for detecting sample parallelism, its characterized in that includes:
the positioning block is provided with a first reference surface on the bottom surface, a plurality of grooves with open tops are formed in the positioning block, a supporting piece and a height column are arranged in each groove, the supporting piece is arranged on the bottom wall of each groove, the Gao Duzhu is supported on the supporting piece, under the detection condition, the supporting piece can be subjected to plastic deformation, under the initial form of the supporting piece, the upper surfaces of the height columns in all the grooves are located in a second reference surface, the second reference surface is parallel to the first reference surface, the connecting lines between the geometric centers of the upper surfaces of the height columns are formed into polygons, a plurality of through channels are arranged on the positioning block, the through channels are in one-to-one correspondence with the grooves, one ends of the through channels extend to the bottom wall penetrating the grooves to form first communication ports, and the other ends of the through channels extend to the bottom surfaces penetrating the positioning block to form second communication ports.
2. The jig for detecting parallelism of a sample according to claim 1, wherein the support is formed in a spherical shape, an ellipsoidal shape, a cylindrical shape, a rectangular parallelepiped shape, a square shape, or an irregular shape in the initial state.
3. The jig for detecting parallelism of a sample according to claim 2, wherein a portion of orthographic projection of the support member on the groove bottom wall is overlaid on the first communication port.
4. The jig for detecting parallelism of a sample according to claim 1, wherein the first reference surface extends in a horizontal direction.
5. The jig for detecting parallelism of a sample according to claim 4, wherein the positioning block is formed in a square or rectangular parallelepiped shape.
6. The jig for detecting parallelism of a sample according to claim 1, wherein the positioning block is a die steel piece or a graphite piece.
7. The jig for detecting parallelism of a sample according to claim 1, wherein the height column is a die steel member or a graphite member.
8. The jig for detecting parallelism of a sample according to claim 1, wherein the support member is a plasticine member, a plastic member, a metal member, or a glass member.
9. A method for detecting parallelism of a sample using the jig for detecting parallelism of a sample according to any one of claims 1 to 8, wherein the sample comprises a first plate body and a second plate body, the method for detecting parallelism of a sample comprising the steps of:
s10: moving the first plate downwards to enable the first plate to be in contact with the upper surface of the height column;
s20: pressing down the first plate body to plastically deform the support member;
s30: and measuring the height difference of the height column.
10. The method of detecting parallelism of a sample according to claim 9, further comprising the steps of:
s40: and adjusting the position of the first plate body according to the height difference to enable the first plate body to be parallel to the second plate body.
11. The method for detecting parallelism of a sample according to claim 9, wherein in step S30, the height difference of the height column is measured using a height gauge.
12. The method according to any one of claims 9 to 11, wherein a plurality of fixing holes are provided on the first plate body, the plurality of fixing holes are in one-to-one correspondence with the plurality of height posts, and in step S10, at least a part of central axes of the fixing holes are coincident with central axes of the height posts corresponding thereto.
13. The method of any one of claims 9-11, wherein the sample is a template of a glass heat bender, the first plate is an upper template of the template, and the second plate is a lower template of the template.
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US3698492A (en) * 1970-05-15 1972-10-17 Establissement Michelin Raison Hydraulic balance
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CN102033077A (en) * 2010-10-19 2011-04-27 北京航空航天大学 Method for testing contact thermal resistance of GH4169/K417 alloy
CN103743892A (en) * 2014-01-22 2014-04-23 上海交通大学 Rapid detection method for lubricating effect
CN206573106U (en) * 2017-03-29 2017-10-20 四川建筑职业技术学院 A kind of easy-to-read high-precision flatness detecting device
CN208620950U (en) * 2018-09-07 2019-03-19 Oppo(重庆)智能科技有限公司 The jig of detecting size
CN109990692A (en) * 2019-05-16 2019-07-09 曾庆雪 Flatness checking device is used in a kind of processing of building board

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3698492A (en) * 1970-05-15 1972-10-17 Establissement Michelin Raison Hydraulic balance
CN101126839A (en) * 2007-08-23 2008-02-20 蔡然 Semiconductor array technology
CN101865646A (en) * 2010-06-21 2010-10-20 宁波市产品质量监督检验研究院 Heat deformation detection instrument
CN102033077A (en) * 2010-10-19 2011-04-27 北京航空航天大学 Method for testing contact thermal resistance of GH4169/K417 alloy
CN103743892A (en) * 2014-01-22 2014-04-23 上海交通大学 Rapid detection method for lubricating effect
CN206573106U (en) * 2017-03-29 2017-10-20 四川建筑职业技术学院 A kind of easy-to-read high-precision flatness detecting device
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