CN113504700B - Atomic time imaging device and method based on all-optical grid principle - Google Patents

Atomic time imaging device and method based on all-optical grid principle Download PDF

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CN113504700B
CN113504700B CN202110868058.8A CN202110868058A CN113504700B CN 113504700 B CN113504700 B CN 113504700B CN 202110868058 A CN202110868058 A CN 202110868058A CN 113504700 B CN113504700 B CN 113504700B
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grid
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CN113504700A (en
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李景镇
朱永乐
陆小微
蔡懿
曾选科
龙虎
朱启凡
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Shenzhen University
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B39/00—High-speed photography
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00—Optical objectives specially designed for the purposes specified below
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/355—Non-linear optics characterised by the materials used
    • G02F1/3551—Crystals

Abstract

The application provides an atomic time imaging device and method based on a full optical grid principle, and the device comprises: the femtosecond laser amplifier emits femtosecond laser to the wedge beam splitter for processing to obtain detection light and excitation light; the frequency doubling and vertical polarization system receives the exciting light, performs frequency doubling and vertical polarization processing on the exciting light, and obtains ultrafast event exciting light which is focused to a target excitation ultrafast event; the broadening shaping delay system receives the detection light and obtains fundamental frequency detection light synchronous with ultrafast event excitation light after broadening shaping delay processing; the microscope objective receives the fundamental frequency detection light after irradiating the target, and transmits the fundamental frequency detection light to the grid framing camera after amplification treatment; and the grid framing camera is used for sampling the target and recording a grid image of spectral dispersion. The invention provides an ultrafast full-gloss single-time grid imaging technology with high space-time resolution, high photographic frequency and multiple frames.

Description

Atomic time imaging device and method based on all-optical grid principle
Technical Field
The application relates to the technical field of ultrafast optics, in particular to an atomic time imaging device and method based on a full optical grid principle.
Background
The acquisition of kinetic images of atomic time (1ps-10fs) is a hot problem of research for a long time, and is a main means for exploring the formation of basic mechanisms in basic science such as physics, chemistry, biology and the like. Meanwhile, the method has wide practical value for observation and diagnosis of the ultrafast process in the fields of industry, national defense, energy, medicine and the like.
In order to obtain ultrafast optical images with high spatial and temporal resolution, many ultrafast imaging techniques have been proposed in recent decades, and generally, a pump-probe (pump-probe) method is considered as the most widespread and popular detection technique, which captures the dynamic process of ultrafast events through repeated measurement for many times, but is only suitable for the periodically recurring ultrafast events, however, many ultrafast processes are non-repetitive, such as irreversible chemical reactions, a shock wave forming process, a laser nuclear fusion process, and the like. In order to overcome the limitations of the pump-probe technology, the single-measurement ultrafast optical imaging technology has become an important research direction in recent years, and currently, representative technologies include Compact Ultrafast Photography (CUP), full light time-series frame photography (STAMP), and the like. The CUP is difficult to apply to actual measurement due to too low spatial resolution, the STAMP is an ultrafast imaging technology based on spectral coding, an original STAMP imaging device is complex in structure and expensive in experimental cost, and only 6 images are obtained by single detection; spectral filtering type (SF) -STAMP although 25 images are obtained by a single measurement of the spectral filtering technique, the imaging light flux is severely degraded, causing too low image contrast; to address the problem of imaging system flux degradation, currently, the microlens-type (LA) -STAMP incorporates a pair of non-parallel mirrors to generate discrete spectrally encoded pulse trains and microlens array sampling, although this design improves the imaging system flux degradation problem, resulting in a single-measurement imaging frequency limit of 109The method has the advantages that the method is in the order of magnitude of frames per second (fps), only 7 time sequence images are obtained, kinetic images of atomic time (1ps-10fs) cannot be obtained, meanwhile, the system needs to be accurately adjusted, the structure is complex, and the stability of the system is reduced.
Therefore, how to provide a solution that can simplify the structure of the microlens-type (LA) -STAMP system, reduce the experimental cost, and increase the imaging frequency is an urgent technical problem to be solved in the art.
Disclosure of Invention
The application aims to provide an atomic time imaging device and method based on a full optical grid principle, which can simplify micro-imagingThe structure of lens type (LA) -STAMP system, while reducing the experiment cost and increasing the photographing frequency to 1012The number of frames per second (fps) obtained by single measurement is more than or equal to 10, and the application range of the system is expanded.
In order to achieve the above object, the present application provides an atomic time imaging apparatus based on a full optical grid principle, including: the system comprises a femtosecond laser amplifier, a wedge beam splitter, a frequency doubling and vertical polarization system, a stretching shaping delay system, a microscope objective and a grid framing camera; wherein the content of the first and second substances,
the femtosecond laser amplifier sends femtosecond laser to the wedge beam splitter, and the wedge beam splitter processes the femtosecond laser to obtain transmitted detection light and reflected exciting light;
the frequency doubling and vertical polarization system receives the exciting light to perform frequency doubling and vertical polarization processing to obtain ultrafast event exciting light and focus the ultrafast event exciting light to a target excitation ultrafast event;
the broadening shaping delay system receives the detection light and performs broadening shaping delay processing to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light;
the microscope objective receives the fundamental frequency detection light irradiated on the target, amplifies the fundamental frequency detection light and transmits the amplified fundamental frequency detection light to the grid framing camera;
the grid framing camera receives the amplified target and samples the target to form a grid image, the grid image forms a grid image with spectral dispersion on an image surface after spectral-spatial linear mapping, a single-wavelength grid image is extracted by using a system calibration method, and finally an ultrafast process is reconstructed through a Fourier algorithm.
Optionally, wherein the grid framing camera comprises: the system comprises an objective lens, a micro-lens array, a collimating lens, a grating, a Fourier lens and an image surface; wherein the content of the first and second substances,
the objective lens is used for converting the fundamental frequency linear chirp pulse I (x, y, t (lambda))i) The illuminated target is imaged to form an intermediate image on the microlens array surface, and the target can be represented as a discrete frame sequence O (x, y, t)i) i is 1,2, … n, where x and y represent two-dimensional plane position coordinates, t (λ)iThe time is represented, lambda represents the wavelength of the detection light, and i is a time point mark;
the microlens array samples the target to form a grid image R (x, y, lambda)i) The i-1, 2, … n single wavelength grid image is represented as:
R(x,y,λi)＝S(x,y)O(x,y,λi)I(x,y,λi) Wherein S (x, y) is the sampling pattern of the microlens array, O (x, y, λ)i) Denotes the ultrafast process, I (x, y, λ)i) Indicating the light intensity distribution of the detection light;
the collimating lens is positioned between the micro-lens array and the grating and guides the picture sequence into the grating;
the grating is arranged on a Fourier surface of a 4f optical system, a grid image of spectral dispersion is imaged on a CCD detection surface, and a single-wavelength grid image R (x ', y', lambda) is formed on the CCD detection surfacei) Expressed as:
Figure BDA0003188007290000031
d and f are respectively a grating constant and a Fourier lens focal length, and x 'and y' respectively represent x-axis coordinates and y-axis coordinates of the position of the CCD detection surface;
the Fourier lens converts the grid image of the spectral dispersion to an image surface, extracts a single-wavelength grid image and guides the single-wavelength grid image to the image surface;
on the image surface, a grid image of spectral dispersion on a CCD detection surface is represented as:
Figure BDA0003188007290000032
extracting single-wavelength grid image R (x ', y ', lambda ') from spectral dispersion grid image R (x ', y ')i)；
Rebuilding an ultrafast process O (x, y, t)i) Expressed as:
Figure BDA0003188007290000033
wherein the content of the first and second substances,
Figure BDA0003188007290000034
and H respectively represents a Fourier transform operator and a filter operator, the grating dispersion axis is along the x axis, and in an actual optical imaging system, in order to avoid the mutual coincidence of the spectral dispersion grid pixels, the grating dispersion axis is rotated along the plane vertical to the optical axis to form a specific angle with the x axis.
Optionally, the frequency doubling and vertical polarization system includes: the nonlinear frequency doubling crystal BBO, the half-wave plate HWP and the spherical convex lens; wherein the content of the first and second substances,
the nonlinear frequency doubling crystal BBO receives the exciting light and converts the wavelength into frequency doubling exciting light to be transmitted to the half-wave plate HWP;
the half-wave plate HWP controls the polarization directions of the frequency doubling exciting light and the detection light to be mutually vertical and guides the frequency doubling exciting light and the detection light into the spherical convex lens;
the spherical convex lens is a (L3, f is 25mm) spherical convex lens, and the frequency doubling excitation light after vertical polarization processing is focused to a target excitation ultrafast event.
Optionally, wherein the spread shaping delay system comprises: the system comprises a timing sequence time module STM, a spectrum shaping module SSM and a delay line; wherein, the first and the second end of the pipe are connected with each other,
the time sequence time module STM consists of a pair of high dispersion prisms, receives the detection light and expands the detection light into linear chirped pulses with the pulse width of 6 ps;
the spectrum shaping module SSM receives the linear chirp pulse processing to obtain a detection pulse with a preset spectral bandwidth;
and the delay line receives the detection pulse and processes the detection pulse to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light.
Optionally, the spectrum shaping module SSM is composed of a pair of reflection gratings 1200lp/mm, a 4f zero dispersion system composed of two spherical convex lenses, f being 75mm, and a tunable slit placed on a fourier plane, and receives the linear chirped pulse to process the linear chirped pulse, so as to obtain a detection pulse with a preset spectral bandwidth.
On the other hand, the invention also provides an atomic time imaging method based on the all-optical grid principle, which comprises the following steps:
processing high-power laser emitted by a femtosecond laser amplifier by a wedge beam splitter, and dividing the high-power laser into transmitted detection light and reflected exciting light;
processing the exciting light by a frequency doubling vertical polarization system to obtain ultrafast event exciting light, and focusing the ultrafast event exciting light to a target exciting ultrafast event;
after the detection light is processed by a broadening shaping delay system, obtaining fundamental frequency detection light synchronous with the ultrafast event excitation light;
after the target is irradiated by the fundamental frequency detection light, the fundamental frequency detection light enters a grid framing camera after being amplified by a microscope objective, a single-wavelength grid image is extracted by using a system calibration method according to the sampling and framing functions of the grid framing camera, and finally an ultrafast process is reconstructed through a Fourier algorithm.
The ultrafast event excitation light is focused on the target excitation ultrafast event to form a discrete frame sequence O (x, y, t)i) i is 1,2, … n, where x and y represent two-dimensional plane position coordinates, t (λ)iThe time is represented, lambda represents the wavelength of the detection light, and i is a time point mark; the linear chirp pulse I (x, y, t (lambda)) of the fundamental frequency probe lighti) An ultrafast process of irradiating the target;
the target is imaged on a micro-lens array surface as an intermediate image through an objective lens, and the micro-lens array samples the target to form a grid image R (x, y, lambda)i) i is 1,2, … n, and the single wavelength grid image is represented as:
R(x,y,λi)＝S(x,y)O(x,y,λi)I(x,y,λi) Wherein S (x, y) is the sampling pattern of the microlens array, O (x, y, λ)i) Denotes the ultrafast process, I (x, y, λ)i) Indicating the light intensity distribution of the detection light; the grid image is imaged on a CCD detection array surface through a 4f optical system, a transmission grating is arranged on a Fourier surface of the 4f system, the grid image of spectral dispersion is imaged on the CCD detection surface, and a single-wavelength grid image R (x ', y ', lambda ') is formed on the CCD detection surfacei) Expressed as:
Figure BDA0003188007290000051
wherein d and f are each a gratingThe number and the focal length of the Fourier lens, x 'and y' respectively represent the x-axis coordinate and the y-axis coordinate of the position of the CCD detection surface; thus, the grid image of the spectral dispersion on the CCD detection plane is represented as:
Figure BDA0003188007290000052
extracting single-wavelength grid image R (x ', y ', lambda ') from spectral dispersion grid image R (x ', y ')i)；
Rebuilding an ultrafast process O (x, y, t)i) Expressed as:
Figure BDA0003188007290000053
wherein the content of the first and second substances,
Figure BDA0003188007290000054
and H respectively represents a Fourier transform operator and a filter operator, the grating dispersion axis is along the x axis, and in an actual optical imaging system, in order to avoid the mutual coincidence of the spectral dispersion grid pixels, the grating dispersion axis is rotated along the plane vertical to the optical axis to form a specific angle with the x axis.
Optionally, after the excitation light is processed by the frequency doubling and vertical polarization system, the ultrafast event excitation light obtained is focused to the target excitation ultrafast event, and the method includes:
the exciting light converts the wavelength into frequency doubling exciting light through a nonlinear frequency doubling crystal BBO;
controlling the polarization directions of the frequency doubling exciting light and the detection light to be vertical to each other through a half-wave plate HWP;
and focusing the frequency-doubled excitation light subjected to vertical polarization processing to a target excitation ultrafast event through a spherical convex lens (L3, wherein f is 25 mm).
Optionally, after the probe light is processed by the broadening shaping delay system, a fundamental-frequency probe light synchronized with the ultrafast event excitation light is obtained, where the fundamental-frequency probe light is:
the detection light is broadened into linear chirp pulses with preset pulse width through a time sequence time module STM consisting of a high dispersion prism;
the linear chirped pulse is processed by a Spectrum Shaping Module (SSM) to obtain a detection pulse with a preset spectral bandwidth;
and processing the detection pulse by a delay line to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light.
Optionally, the spectrum shaping module SSM is composed of a pair of reflection gratings 1200lp/mm, a 4f zero dispersion system composed of two spherical convex lenses, f being 75mm, and a tunable slit placed on the fourier plane.
The atomic time imaging device and method based on the all-optical grid principle have the following beneficial effects:
(1) compared with the existing micro-Lens (LA) -STAMP, the atomic time imaging device and method based on the all-optical grid principle have the advantages that the high-dispersion prism pair is used as the stretcher, so that the structure is simpler and more stable, the stability of the system is improved, and meanwhile, the experiment cost is reduced.
(2) The atomic time imaging device and method based on the all-optical grid principle adopt the 4f zero dispersion spectrum shaping structure for system calibration, and reliability of measured data is guaranteed.
(3) The atomic time imaging device and method based on the all-optical grid principle perform framing imaging according to grid image elements, and the shooting frequency reaches 1012The method is characterized by comprising 12 high-spatial resolution images with the amplitude/second (fps) order, and atomic time (10fs-1ps) atomic/molecular dynamics images can be captured at a single time.
(4) The atomic time imaging device and method based on the all-optical grid principle utilize the high-dispersion prism with a simple structure to generate chirped pulses with femtosecond-magnitude time resolution serving as a stretcher, and perform framing imaging according to grid image pixels according to a spectrum-time-space position linear mapping relation, wherein the shooting frequency can reach 1012The magnitude per second (fps) is of magnitude, the number of the drawn frames is more than or equal to 10, and meanwhile, the Fourier algorithm is utilized to enable the image reconstruction process to be faster and simpler, and the error is small.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art according to the drawings.
Fig. 1 is a schematic structural diagram of an atomic time imaging apparatus based on a full optical grid principle according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an ORP image sampling theory based on a grid sampling principle and a spectrum-time coding technique in an atomic time imaging device based on a full-optical grid principle according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of ORP principle based on grid sampling principle and spectrum-time coding technique in an atomic time imaging device based on the all-optical grid principle according to an embodiment of the present invention;
fig. 4 is a schematic diagram of an RFC optical path of a grid framing camera in an atomic time imaging device based on a plenoptic grid principle according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a grid image of the original spectral dispersion without a target in an embodiment of the invention;
FIG. 6 is a schematic diagram of a detail enlarged image in a dashed box in FIG. 5 according to an embodiment of the present invention;
fig. 7 is a schematic diagram of reconstructing a spectral sub-bandwidth image by using a fourier algorithm in an atomic time imaging device based on a plenoptic grid principle according to an embodiment of the present invention;
fig. 8 is a schematic diagram of the working principle of a high dispersion prism in an atomic time imaging device based on the all-optical grid principle according to an embodiment of the present invention;
fig. 9 is a schematic flowchart of an atomic time imaging method based on the principle of a plenoptic grid in an embodiment of the present invention;
fig. 10 is a schematic flowchart of a second atomic time imaging method based on the principle of a plenoptic grid according to an embodiment of the present invention;
fig. 11 is a schematic flowchart of a third atomic time imaging method based on the all-optical grid principle in an embodiment of the present invention;
fig. 12 is a schematic flowchart of a fourth atomic time imaging method based on the all-optical grid principle in this embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present application are clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Examples
The dynamic process of detecting the atomic time (1ps-10fs) is a hot problem of research for a long time, and is a main means for exploring the formation of basic mechanisms in basic science such as physics, chemistry, biology and the like. Meanwhile, the method has wide practical value for observation and diagnosis of the ultrafast process in the fields of industry, national defense, energy, medicine and the like.
In order to obtain ultrafast optical images with high spatial and temporal resolution, many ultrafast imaging techniques have been proposed in recent decades, and generally, a pump-probe (pump-probe) method is considered as the most widespread and popular detection technique, which captures the dynamic process of ultrafast events through repeated measurement for many times, but is only suitable for the periodically recurring ultrafast events, however, many ultrafast processes are non-repetitive, such as irreversible chemical reactions, a shock wave forming process, a laser nuclear fusion process, and the like. In order to overcome the limitation of pump-probe technology, single-shot ultrafast optical imaging technology becomes an important research direction in recent years, and single shot refers to an ultrafast dynamic process capable of capturing events in real time, such as ultrafast framing camera, compressed ultrafast photography (cpu), full gloss time-sequential framing photography (STAMP), multiple exposure frequency identification method (FRAME), non-collinear optical parametric amplification method (NCOPA), and other ultrafast photography technologies. Wherein, the shooting frequency of the ultrafast framing camera can reach 108Amplitude per second (fps), nanosecond (10)-9s) magnitude time resolution, Compressed Ultrafast Photography (CUP) technology, and single imaging to obtain photography frequency greater than 10 by pseudo-random coding, combination of stripe camera and compressed sensing algorithm11Time-series images of fps due to detection of eventsThe sparsity and the spatial-temporal mixing superposition effect of the event information on the detection surface of the streak camera are limited, and the too low spatial resolution is difficult to apply to actual measurement; multiple exposure frequency identification (FRAME) uses structured light encoding to record 4 sequential images with a single photograph at a photographing frequency of 5x 1012fps, the spatial resolution is 15lp/mm, and the number of the frames cannot be further improved due to the mutual restriction with the spatial resolution; non-collinear optical parametric amplification (NCOPA) method for obtaining 4 time sequence image photographing frequency 10 by single photographing13fps, the spatial resolution is more than 30lp/mm, and the number of frames is limited by pulse energy; full light time-sequence frame division photography (STAMP) adopts a spectral coding method to obtain 6 time-sequence images at a time, and the photographic frequency is 4.4 x 1012fps, because of the restriction of the measured inaccurate relation, the exposure time is far longer than the framing time, the information overlapping rate of adjacent frames is very high, and the effective photographing frequency is 1.4 x 1012fps. In view of the above, it is necessary to develop an imaging technique with high spatial and temporal resolution and high imaging frequency/multiple frames.
The method combines a grid sampling principle and a spectrum-time coding technology (ORP) to provide a novel ultrafast full-gloss single grid imaging technology with high space-time resolution and high photographic frequency/multiple frames. The ORP technology has unique advantages, and can be applied to single detection of femtosecond atomic molecular dynamics processes, such as laser-induced plasma, shock waves in laser damage, laser inertial confinement nuclear fusion and the like.
The embodiment provides a full-light single-shot ultrafast photography technology OPR based on a grid principle, the technology can detect the atomic molecular dynamics process in real time, and the system is composed of a Sequence Time Module (STM), a Spectrum Shaping Module (SSM) and a grid framing camera (RFC). STM and SSM are used for spectrum-time linear coding and system calibration respectively, and RFC is used for sampling imaging target and framing imaging. The system can reach 2 x 10 of the current single measurement shooting frequency12Amplitude per second (fps), spatial resolution 90lp/mm, reconstruction data cube 1236 x 1626 x 12, OPR can obtain high space-time resolution optical image of atomic time (10fs-1ps) by its unique advantages, such as laser induced plasma, shock wave in laser damage, laser inertial confinement nuclear fusion, etc.
As shown in fig. 1 to 8, fig. 1 is a schematic structural diagram of an atomic time imaging device (ORP) based on a full optical grid principle in this embodiment; FIG. 2 is a schematic diagram illustrating image sampling theory in this embodiment; FIG. 3 is a schematic representation of the ORP principle in this example; fig. 4 is a schematic diagram of an RFC optical path of a grid framing camera in an atomic time imaging device based on a plenoptic grid principle in this embodiment; FIG. 5 is a schematic diagram of a grid image of the original spectral dispersion without the target in this embodiment; FIG. 6 is a schematic diagram of an enlarged detail image in a dashed box in FIG. 5 according to the present embodiment; fig. 7 is a schematic diagram of reconstructing a spectral sub-bandwidth image by using a fourier algorithm in an atomic time imaging device based on the plenoptic grid principle according to the embodiment; fig. 8 is a schematic diagram of the working principle of a high dispersion prism in the atomic time imaging device based on the all-optical grid principle according to the embodiment. Specifically, the atomic time imaging device based on the full optical grid principle is characterized by comprising: a femtosecond laser amplifier 101, a wedge beam splitter 102, a frequency doubling vertical polarization system 103, a widening and shaping delay system 104, a microscope objective 105 and a grid framing camera 106.
The femtosecond laser amplifier 101 sends femtosecond laser to the wedge 102 beam splitter, and the wedge beam splitter processes the femtosecond laser to obtain transmitted detection light and reflected exciting light.
And the frequency doubling vertical polarization system 103 receives the exciting light and performs frequency doubling vertical polarization processing to obtain ultrafast event exciting light and focuses the ultrafast event exciting light to a target excitation ultrafast event.
And the broadening shaping delay system 104 is used for receiving the detection light and performing broadening shaping delay processing to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light.
And the microscope objective 105 receives the fundamental frequency detection light irradiated on the target, amplifies the fundamental frequency detection light and transmits the amplified fundamental frequency detection light to the grid framing camera.
And the grid framing camera 106 is used for receiving the amplified target, sampling the target to form a grid image, forming a grid image with spectral dispersion on an image surface after the grid image is subjected to spectrum-space linear mapping, extracting a single-wavelength grid image by using a system calibration method, and finally reconstructing an ultrafast process through a Fourier algorithm.
In some optional embodiments, the grid framing camera comprises: the system comprises an objective lens, a micro-lens array, a collimating lens, a grating, a Fourier lens and an image surface; wherein the content of the first and second substances,
objective lens for focusing the fundamental frequency linear chirp pulse I (x, y, t (lambda)i) The illuminated target is imaged to form an intermediate image on the microlens array surface, and the target can be represented as a discrete frame sequence O (x, y, t)i) i is 1,2, … n, where x and y represent two-dimensional planar position coordinates, t (λ)iTime is represented, λ represents the probe light wavelength, and i is a time point mark.
A microlens array for sampling the target to form a grid image R (x, y, lambda)i) The i-1, 2, … n single wavelength grid image is represented as:
R(x,y,λi)＝S(x,y)O(x,y,λi)I(x,y,λi) Where S (x, y) is the sampling pattern of the microlens array, O (x, y, λ)i) Denotes the ultrafast process, I (x, y, λ)i) Indicating the light intensity distribution of the detection light;
the collimating lens is positioned between the micro-lens array and the grating and guides the picture sequence into the grating;
a grating disposed on the Fourier plane of the 4f optical system, wherein the spectrally dispersed grid image is imaged on the CCD detection plane, and the single-wavelength grid image R (x ', y', lambda) is imaged on the CCD detection planei) Expressed as:
Figure BDA0003188007290000111
d and f are respectively a grating constant and a Fourier lens focal length, and x 'and y' respectively represent x-axis coordinates and y-axis coordinates of the position of the CCD detection surface;
the Fourier lens is used for converting the grid image of the spectral dispersion to an image surface;
on the image plane, the grid image of the spectral dispersion on the CCD detection plane is represented as:
Figure BDA0003188007290000112
extracting single-wavelength grid image R (x ', y ', lambda ') from spectral dispersion grid image R (x ', y ')i)；
Rebuilding an ultrafast process O (x, y, t)i) Expressed as:
Figure BDA0003188007290000113
wherein the content of the first and second substances,
Figure BDA0003188007290000114
and H respectively represents a Fourier transform operator and a filter operator, the grating dispersion axis is along the x axis, and in an actual optical imaging system, in order to avoid the mutual coincidence of the spectral dispersion grid pixels, the grating dispersion axis is rotated along the plane vertical to the optical axis to form a specific angle with the x axis.
In some alternative embodiments, a frequency doubled vertical polarization system, comprises: the nonlinear frequency doubling crystal BBO, the half-wave plate HWP and the spherical convex lens; wherein the content of the first and second substances,
the nonlinear frequency doubling crystal BBO receives the exciting light and converts the wavelength into frequency doubling exciting light to be transmitted to the half-wave plate HWP;
the half-wave plate HWP controls the polarization directions of frequency doubling exciting light and detection light to be mutually vertical and guides the frequency doubling exciting light into the spherical convex lens;
and the spherical convex lens is a (L3, f is 25mm) spherical convex lens, and focuses the frequency-doubled excitation light after the vertical polarization processing to a target excitation ultrafast event.
In some optional embodiments, a spread shaping delay system, comprising: the system comprises a timing sequence time module STM, a spectrum shaping module SSM and a delay line; wherein the content of the first and second substances,
the time sequence time module STM consists of a pair of high dispersion prisms, receives the detection light and expands the detection light into linear chirped pulses with the pulse width of 6 ps;
the spectrum shaping module SSM receives the linear chirp pulse processing to obtain a detection pulse with a preset spectral bandwidth;
and the delay line receives the detection pulse and processes the detection pulse to obtain the fundamental frequency detection light synchronous with the ultrafast event excitation light.
In some optional embodiments, the spectrum shaping module SSM is composed of a pair of reflection gratings 1200lp/mm, a 4f zero dispersion system composed of two spherical convex lenses, f being 75mm, and a tunable slit placed on the fourier plane, and receives the linear chirped pulse for processing, so as to obtain a detection pulse with a preset spectral bandwidth.
Fig. 9 is a schematic flowchart of an atomic time imaging method based on the plenoptic grid principle in this embodiment, and the method can be implemented by the atomic time imaging apparatus based on the plenoptic grid principle. Specifically, the method comprises the following steps:
step 901, high-power laser emitted by the femtosecond laser amplifier is processed by a wedge beam splitter and divided into transmitted detection light and reflected excitation light.
And 902, processing the exciting light by a frequency doubling vertical polarization system to obtain ultrafast event exciting light, and focusing the ultrafast event exciting light to a target to excite the ultrafast event.
And step 903, processing the detection light by a broadening shaping delay system to obtain fundamental frequency detection light synchronous with ultrafast event excitation light.
And 904, receiving the amplified target, sampling the target to form a grid image, forming a grid image of spectral dispersion on an image surface after the grid image is subjected to spectrum-space linear mapping, extracting a single-wavelength grid image by using a system calibration method, and finally reconstructing an ultrafast process by using a Fourier algorithm.
In some optional embodiments, as shown in fig. 10, which is a schematic flowchart of a second atomic time imaging method based on the plenoptic grid principle in this embodiment, different from fig. 9, the reconstruction of the ultrafast process by using the fourier algorithm to form a spectral sub-bandwidth image is as follows:
1001, focusing ultrafast event excitation light to a target excitation ultrafast event to form a discrete frame sequence O (x, y, t)i) 1,2, … n; linear chirped pulse I (x, y, t (lambda)) of fundamental probe lighti) Ultrafast process of illuminating the target.
The target is imaged on the microlens array surface as an intermediate image through the objective lens, and the microlens array samples the target to form a grid image R (x, y, lambda)i) The i-1, 2, … n single wavelength grid image is represented as:
R(x,y,λi)＝S(x,y)O(x,y,λi)I(x,y,λi) Where S (x, y) is the sampling pattern of the microlens array.
Step 1002, imaging the grid image on a CCD detection array surface through a 4f optical system, placing a transmission grating on a Fourier surface of the 4f system, imaging the spectrally dispersed grid image on the CCD detection surface, and imaging a single-wavelength grid image R (x ', y', lambda) on the CCD detection surfacei) Expressed as:
Figure BDA0003188007290000131
wherein d and f are the grating constant and the focal length of the Fourier lens respectively, so the grid image of the spectral dispersion on the CCD detection surface is represented as:
Figure BDA0003188007290000132
extracting single-wavelength grid image R (x ', y ', lambda ') from spectral dispersion grid image R (x ', y ')i)。
Step 1003, rebuilding ultrafast process O (x, y, t)i) Expressed as:
Figure BDA0003188007290000133
wherein the content of the first and second substances,
Figure BDA0003188007290000134
and H respectively represents a Fourier transform operator and a filter operator, the grating dispersion axis is along the x axis, and in an actual optical imaging system, in order to avoid the mutual coincidence of the spectral dispersion grid pixels, the grating dispersion axis is rotated along the plane vertical to the optical axis to form a specific angle with the x axis.
In some optional embodiments, as shown in fig. 11, which is a schematic flow chart of a third atomic time imaging method based on the all-optical grid principle in this embodiment, different from fig. 9, that after excitation light is processed by a frequency doubling vertical polarization system, ultrafast event excitation light is obtained and focused on a target excitation ultrafast event, where:
step 1101, the excitation light is converted into frequency-doubled excitation light by the nonlinear frequency doubling crystal BBO.
And 1102, controlling the polarization directions of the frequency doubling exciting light and the detection light to be perpendicular to each other through a half-wave plate HWP.
And step 1103, focusing the frequency-doubled excitation light after the vertical polarization processing on the target excitation ultrafast event through a spherical convex lens (L3, where f is 25 mm).
In some alternative embodiments, as shown in fig. 12, which is a schematic flowchart of a fourth atomic time imaging method based on the all-optical grid principle in this embodiment, different from fig. 9, after the probe light is processed by the broadening shaping delay system, a fundamental-frequency probe light synchronized with the ultrafast event excitation light is obtained, and is:
step 1201, broadening the detection light into linear chirped pulses with preset pulse width through a time sequence time module STM consisting of high dispersion prisms.
Step 1202, the linear chirped pulse is processed by a spectrum shaping module SSM to obtain a detection pulse with a preset spectral bandwidth.
And 1203, processing the detection pulse by using a delay line to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light.
Optionally, the spectrum shaping module SSM is composed of a pair of reflection gratings 1200lp/mm, a 4f zero dispersion system composed of two spherical convex lenses f-75 mm, and a tunable slit placed on the fourier plane. In some specific examples, shown in the upper diagram of the ORP system apparatus, the high power laser output from the femtosecond amplification laser system (pulse width 35fs, repetition frequency 1kHZ, center wavelength 800nm, single pulse energy 2.5mJ) is split into transmitted probe light and reflected excitation light by a wedge beam splitter (99:1), the excitation light converts the wavelength into 400nm by a nonlinear frequency doubling crystal BBO, the half-wave plate HWP controls the polarization directions of the probe light and the excitation light to be perpendicular to each other, and the frequency doubling light (400nm) is focused into a sample by a spherical convex lens (L3, f is 25mm) to excite an ultrafast event. The detection light is broadened into linear chirped pulse with the pulse width of 6ps by a time Sequence Time Module (STM) (consisting of a pair of high dispersion prisms), and then passes through a Spectrum Shaping Module (SSM) (consisting of a 4f zero dispersion system consisting of a pair of reflection gratings 1200lp/mm and two spherical convex lenses f 75mm and a tunable slit arranged on a Fourier plane), and the detection light and the excitation light are synchronously adjusted by a delay lineThe emergent detection light illuminates a target, the target is magnified by a microscope objective (5X) and enters a grid framing camera (RFC), the magnified target image is imaged on a micro lens array surface (the size is 12mm multiplied by 12 mm; the number is 300 multiplied by 300; the diameter of a micro lens is 40 um; the focal length is 220 um; NA is 0.18; the interval between adjacent lenses is 40um) through the camera objective, the micro lens array is used as a sampling plate to sample the intermediate image to form a grid image, a detection pulse is incident on a diffraction grating (50lp/mm) placed on a Fourier surface through a collimating lens (f is 50mm), finally, the detection pulse is imaged on a CCD camera (1626 multiplied by 1236 pixel, the pixel size is 4.4 multiplied by 4.4 mu m) through the Fourier lens (f is 75mm), the width of a slit in a spectrum shaping module is adjusted to 4.5mm in order to avoid the superposition of the spectrum dispersion pixel, the detection pulse with the 28nm (782 + 810nm) bandwidth is selected, meanwhile, an included angle of a grating dispersion axis and an x-axis is adjusted to 26.5 degrees, a grid image without original spectral dispersion under the condition of a target is shown in fig. 5, a detail enlarged image in a dotted line frame in fig. 5 is shown in fig. 6, in order to calibrate the characteristics of an ORP, the slit width of an SSM is adjusted to 0.375mm, a sub-bandwidth of a detection spectrum is selected to be 2.3nm (approximate single wavelength), the size of a corresponding grid image pixel is about 2 CCD combined pixels (8.8um), as shown in fig. 7, the size of the grid image pixel is larger than the diffraction limit of a micro lens, meanwhile, the spectral resolution of the grating is smaller than the sub-bandwidth of the spectrum, therefore, the framing time is δ t ═ η δ λ 500fs (chirp parameter η ═ 0.22ps/nm), fourier algorithm reconstruction is carried out on each single-wavelength grid image, an ultrafast process is obtained, each image is 1236 × 1626, similarly, the slit width and the position is tuned along the plane of an SSM fourier module (slit width is 0.375, moving step size 0.375mm), a calibrated data cube 1236 × 1626 × 12 is obtained (frame number n-ceil ((λ))max-λmin) And delta lambda)), in a single detection mode, extracting 12 time sequence grid images through the grid images calibrated by the spectrum-space positions, and reconstructing an ultrafast process through a Fourier algorithm.
In order to achieve optimal performance of the OPR system, it is necessary to design optimal parameters, in this system, the framing exposure time depends on the sub-bandwidths of the original fourier transform limit pulse and the linearly chirped pulse according to the formula
Figure BDA0003188007290000151
There is an optimized exposure time of about 460fs, where t0Is the original Fourier transform limit pulse width, tcIs the pulse width of the linearly chirped pulse, time information correction factor g for best image quality2/3(g＝τf/τ,τfFor framing time) should be greater than 1, in an OPR system, due to the framing time τf500fs, thus g2/31.06, adjacent image information overlap is avoided. The spatial resolution of the system mainly depends on the magnification of the microscope system and the pixel spacing of the grid image (the system is 60um), as shown in fig. 5-7, the spectral sub-bandwidth grid image and the single reconstructed image when the microscope system is microscopically magnified by 10 times in fig. 5 and fig. 6 respectively, and as seen from the reconstructed image, the spatial resolution can reach 90lp/mm, and fig. 7 is a relational graph of the microscope magnification and the spatial resolution.
In addition, a smaller grid image pixel size can achieve a higher photographing frequency and a larger number of frames, in which case the spatial resolution is degraded due to the loss of high frequency information of the image.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including the preferred embodiment and all changes and modifications that fall within the scope of the present application. It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.

Claims (8)

1. An atomic time imaging device based on the all-optical grid principle, comprising: the system comprises a femtosecond laser amplifier, a wedge beam splitter, a frequency doubling vertical polarization system, a broadening and shaping delay system, a microscope objective and a grid framing camera; wherein the content of the first and second substances,
the femtosecond laser amplifier sends femtosecond laser to the wedge beam splitter, and the wedge beam splitter processes the femtosecond laser to obtain transmitted detection light and reflected exciting light;
the frequency doubling vertical polarization system receives the exciting light and carries out frequency doubling vertical polarization processing to obtain ultrafast event exciting light, and the ultrafast event exciting light is focused to a target excitation ultrafast event;
the broadening shaping delay system receives the detection light and performs broadening shaping delay processing to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light;
the microscope objective receives the fundamental frequency detection light irradiated on the target, amplifies the fundamental frequency detection light and transmits the amplified fundamental frequency detection light to the grid framing camera;
the grid framing camera receives the amplified target, samples the target to form a grid image, forms a grid image with spectral dispersion on an image surface after the grid image is subjected to spectrum-space linear mapping, extracts a single-wavelength grid image by using a system calibration method, and finally reconstructs an ultrafast process through a Fourier algorithm, and comprises the following steps: the device comprises an objective lens, a micro-lens array, a collimating lens, a grating, a Fourier lens and an image surface CCD; wherein the content of the first and second substances,
the objective lens is used for converting the fundamental frequency linear chirp pulse I (x, y, t (lambda))i) The illuminated target is imaged to form an intermediate image on the microlens array surface, and the target can be represented as a discrete frame sequence O (x, y, t)i) i is 1,2, … n, where x and y represent two-dimensional planar position coordinates, t (λ)iThe time is represented, lambda represents the wavelength of the detection light, and i is a time point mark;
the microlens array samples the target to form a grid image R (x, y, lambda)i) i is 1,2, … n, and the single wavelength grid image is represented as:
R(x,y,λi)＝S(x,y)O(x,y,λi)I(x,y,λi) Wherein S (x, y) is the sampling pattern of the microlens array, O (x, y, λ)i) Denotes the ultrafast process, I (x, y, λ)i) Indicating the light intensity distribution of the detection light;
the collimating lens is positioned between the micro-lens array and the grating and guides the picture sequence into the grating;
the grating is arranged on a Fourier surface of a 4f optical system, a grid image of spectral dispersion is imaged on a CCD detection surface, and a single-wavelength grid image R (x ', y', lambda) is formed on the CCD detection surfacei) Expressed as:
Figure FDA0003577581920000021
wherein d and f are respectively a grating constant and a Fourier lens focal length, and x 'and y' respectively represent x-axis coordinates and y-axis coordinates of the position of the CCD detection surface;
the Fourier lens converts the grid image of the spectral dispersion to an image surface;
on the image surface, a grid image of spectral dispersion on a CCD detection surface is represented as:
Figure FDA0003577581920000022
extracting single-wavelength grid image R (x ', y ', lambda ') from spectral dispersion grid image R (x ', y ')i)；
Rebuilding an ultrafast process O (x, y, t)i) Forming a spectral sub-bandwidth image, represented as:
Figure FDA0003577581920000023
f and H respectively represent Fourier transform and filter operators, a grating dispersion axis is along an x axis, and in an actual optical imaging system, in order to avoid overlapping of spectral dispersion grid pixels, the grating dispersion axis is rotated along a plane vertical to an optical axis to form a specific angle with the x axis.
2. The all-optical grid principle-based atomic time imaging device according to claim 1, wherein the frequency doubling vertical polarization system comprises: a nonlinear frequency doubling crystal BBO, a half-wave plate HWP and a spherical convex lens; wherein the content of the first and second substances,
the nonlinear frequency doubling crystal BBO receives the exciting light and converts the wavelength into frequency doubling exciting light to be transmitted to the half-wave plate HWP;
the half-wave plate HWP controls the polarization directions of the frequency doubling exciting light and the detection light to be mutually vertical and guides the frequency doubling exciting light and the detection light into the spherical convex lens;
the spherical convex lens is L3, and f is 25mm, and the frequency doubling excitation light after vertical polarization processing is focused to a target excitation ultrafast event.
3. An atomic time imaging device based on the all-optical grid principle according to claim 1, wherein the broadening shaping delay system comprises: the system comprises a time sequence time module STM, a spectrum shaping module SSM and a delay line; wherein, the first and the second end of the pipe are connected with each other,
the time sequence time module STM consists of a pair of high dispersion prisms, receives the detection light and expands the detection light into linear chirped pulses with the pulse width of 6 ps;
the spectrum shaping module SSM receives the linear chirp pulse processing to obtain a detection pulse with a preset spectral bandwidth;
and the delay line receives the detection pulse and processes the detection pulse to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light.
4. The all-optical-grid-principle-based atomic time imaging device according to claim 3, wherein the spectrum shaping module SSM comprises a 4f zero dispersion system consisting of a pair of reflection gratings 1200lp/mm and two spherical convex lenses, f is 75mm, and a tunable slit disposed on a Fourier plane, and receives the linearly chirped pulse for processing to obtain a detection pulse with a preset spectral bandwidth.
5. An atomic time imaging method based on a full optical grid principle is characterized by comprising the following steps:
processing high-power laser emitted by a femtosecond laser amplifier by a wedge beam splitter, and dividing the high-power laser into transmitted detection light and reflected exciting light;
processing the exciting light by a frequency doubling vertical polarization system to obtain ultrafast event exciting light, and focusing the ultrafast event exciting light to a target exciting ultrafast event;
after the detection light is processed by a broadening shaping delay system, obtaining fundamental frequency detection light synchronous with the ultrafast event excitation light;
after the target is irradiated by the fundamental frequency detection light, the fundamental frequency detection light enters a grid framing camera after being amplified by a microscope objective, the spectral sub-bandwidth of the detection light is adjusted by a preset adjusting strategy, a single-wavelength grid image is extracted by using a system calibration method according to the sampling and framing functions of the grid framing camera, and finally an ultrafast process is reconstructed by a Fourier algorithm,
through sampling and framing of the grid framing camera, an ultrafast process is reconstructed by utilizing a Fourier algorithm, and the method comprises the following steps:
the ultrafast event excitation light is focused on the target excitation ultrafast event to form a discrete frame sequence O (x, y, t)i) i is 1,2, … n, where x and y represent two-dimensional planar position coordinates, t (λ)iThe time is represented, lambda represents the wavelength of the detection light, and i is a time point mark; the linear chirp pulse I (x, y, t (lambda)) of the fundamental frequency probe lighti) An ultrafast process of irradiating the target;
the target is imaged on a micro-lens array surface as an intermediate image through an objective lens, and the micro-lens array samples the target to form a grid image R (x, y, lambda)i) i is 1,2, … n, and the single wavelength grid image is represented as:
R(x,y,λi)＝S(x,y)O(x,y,λi)I(x,y,λi) Wherein S (x, y) is the sampling pattern of the microlens array, O (x, y, λ)i) Denotes the ultrafast process, I (x, y, λ)i) Indicating the light intensity distribution of the detection light; the grid image is imaged on a CCD detection array surface through a 4f optical system, a transmission grating is arranged on a Fourier surface of the 4f system, the grid image of spectral dispersion is imaged on the CCD detection surface, and a single-wavelength grid image R (x ', y ', lambda ') is formed on the CCD detection surfacei) Expressed as:
Figure FDA0003577581920000041
d and f are respectively a grating constant and a Fourier lens focal length, and x 'and y' respectively represent x-axis coordinates and y-axis coordinates of the position of the CCD detection surface; thus, a grid image representation of the spectral dispersion on the CCD detection planeComprises the following steps:
Figure FDA0003577581920000042
extracting single-wavelength grid image R (x ', y ', lambda ') from spectral dispersion grid image R (x ', y ')i)；
Rebuilding an ultrafast process O (x, y, t)i) Forming a spectral sub-bandwidth image is represented as:
Figure FDA0003577581920000043
f and H respectively represent Fourier transform and filter operators, a grating dispersion axis is along an x axis, and in an actual optical imaging system, in order to avoid overlapping of spectral dispersion grid pixels, the grating dispersion axis is rotated along a plane vertical to an optical axis to form a specific angle with the x axis.
6. The atomic time imaging method based on the all-optical grid principle of claim 5, wherein the ultrafast event excitation light obtained after the excitation light is processed by a frequency doubling and vertical polarization system is focused on a target excitation ultrafast event, and the method comprises the following steps:
the exciting light converts the wavelength into frequency doubling exciting light through a nonlinear frequency doubling crystal BBO;
controlling the polarization directions of the frequency doubling excitation light and the detection light to be vertical to each other through a half-wave plate HWP;
and the frequency doubling excitation light after vertical polarization processing passes through a spherical convex lens L3, and f is 25mm and is focused on a target excitation ultrafast event.
7. The all-optical grid principle-based atomic time imaging method according to claim 5, wherein the probe light is processed by a broadening, shaping and delaying system to obtain a fundamental probe light synchronized with the ultrafast event excitation light, and the fundamental probe light is:
the detection light is broadened into linear chirped pulses with preset pulse width through a time sequence time module STM consisting of a high dispersion prism;
the linear chirped pulse is processed by a Spectrum Shaping Module (SSM) to obtain a detection pulse with a preset spectral bandwidth;
and processing the detection pulse by a delay line to obtain fundamental frequency detection light synchronous with the ultrafast event excitation light.
8. The all-optical-grid-principle-based atomic time imaging method according to claim 7, wherein the spectrum shaping module SSM is composed of a pair of reflection gratings 1200lp/mm, a 4f zero dispersion system composed of two spherical convex lenses f-75 mm, and a tunable slit placed in a Fourier plane.
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