CN113494962A - Scene self-adaptive quantitative measurement thermal infrared imager and method - Google Patents
Scene self-adaptive quantitative measurement thermal infrared imager and method Download PDFInfo
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- CN113494962A CN113494962A CN202010192441.1A CN202010192441A CN113494962A CN 113494962 A CN113494962 A CN 113494962A CN 202010192441 A CN202010192441 A CN 202010192441A CN 113494962 A CN113494962 A CN 113494962A
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- 238000003384 imaging method Methods 0.000 claims abstract description 59
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- 238000005057 refrigeration Methods 0.000 claims abstract description 49
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Abstract
The invention provides a scene self-adaptive quantitative measurement thermal infrared imager, which relates to the technical field of infrared detection imaging and comprises an optical lens, a refrigeration assembly, an imaging processing system and a power supply system, wherein the optical lens is positioned at the front end of the refrigeration assembly, the refrigeration assembly consists of a refrigeration type infrared detector and a Stirling refrigerator, an interface circuit board provides bias voltage for the refrigeration type infrared detector, and the electrical signal is converted into a digital signal and transmitted to an imaging circuit board; the imaging circuit board provides a working time sequence for the refrigeration type infrared detector, and the digital signal is converted into a digital image signal to be transmitted to the quantitative processing circuit board; the invention is used for solving the technical problems that in the prior art, an infrared thermal imager does not have the function of automatically adjusting the integral time, so that local thermal imaging saturation or integral imaging is dark, the operation of resetting the integral time is complicated, and professional personnel are required to operate, so that the application range is greatly limited.
Description
Technical Field
The invention relates to the technical field of infrared detection imaging, in particular to a scene self-adaptive quantitative measurement thermal infrared imager and a method.
Background
The infrared thermal imager has longer working waveband wavelength, stronger anti-interference and penetration capability, less influence by rain, fog and haze weather and no limitation of night, and can provide all-weather service, thereby being vigorously developed and widely applied. The infrared imager has various forms, but basically consists of six parts, referring to fig. 1, which are an optical system, an infrared detector, a temperature control device, an imaging processing system, a display device and a power supply system.
The imaging processing system mainly completes the processing of amplification, filtering, analog-to-digital conversion and the like of the electric signals output by the infrared detector, and simultaneously processes original image data and outputs the data according to a certain format. And the power supply system provides stable working voltage for the electronic components of the whole thermal infrared imager. The display device is used for displaying the image data output by the imaging processing system, and is convenient for human eyes to observe.
When the existing thermal infrared imager is used, an important setting parameter is integration time, when the temperature of a target scene is high, the integration time is shortened to avoid image saturation and shorten, and when the temperature of the target scene is low, the integration time is increased to improve the signal-to-noise ratio of an image. When the existing thermal imager is used, an operator needs to set the integration time according to the measurement scene and experience, when the scene is changed, the integration time needs to be set again, the operation is complex, and the operator needs to have certain professional background knowledge.
Disclosure of Invention
In view of the above disadvantages of the prior art, an object of the present invention is to provide a scene adaptive quantitative measurement thermal infrared imager, which is used to solve the technical problems that the thermal infrared imager in the prior art does not have the function of automatically adjusting the integration time, so that local thermal imaging saturation occurs or the whole imaging is dark, the operation of resetting the integration time is cumbersome, and professional personnel are required to operate, so that the application range is greatly limited.
The invention provides a scene self-adaptive quantitative measurement thermal infrared imager, which comprises an optical lens, a refrigeration assembly, an imaging processing system and a power supply system, wherein the optical lens is positioned at the front end of the refrigeration assembly, the refrigeration assembly consists of a refrigeration type infrared detector and a Stirling refrigerator,
the Stirling refrigerator provides a stable working temperature environment for the refrigeration type infrared detector;
the optical lens converges the infrared radiation in the field of view onto a focal plane of the refrigeration type infrared detector;
the refrigeration type infrared detector converts the received infrared radiation into an electric signal and outputs the electric signal to an imaging processing system;
the imaging processing system comprises an interface circuit board, an imaging circuit board and a quantitative processing circuit board,
the interface circuit board provides bias voltage for the refrigeration type infrared detector, and converts the electric signal into a digital signal and transmits the digital signal to the imaging circuit board;
the imaging circuit board provides a working time sequence for the refrigeration type infrared detector, converts the digital signals into digital image signals to be transmitted to the quantitative processing circuit board, receives integral time information of the quantitative processing circuit board in real time, and adjusts the working time sequence by utilizing the integral time information;
the quantitative processing circuit board carries out quantitative processing on the digital image signals to obtain radiation temperature information of each pixel of the image, and calculates integral time corresponding to the radiation temperature by using an automatic exposure control algorithm and transmits the integral time to the imaging circuit board;
the power supply system provides stable working voltage for the optical lens, the refrigeration assembly and the imaging processing system.
In an embodiment of the present invention, the interface circuit board is electrically connected to an output pin of the refrigeration-type infrared detector, and is configured to amplify, filter and condition the electrical signal, and complete analog-to-digital conversion to obtain a digital signal.
In an embodiment of the invention, the imaging circuit board also provides a working time sequence for the interface circuit board, and the interface circuit board completes analog-to-digital conversion of the electrical signal according to the working time sequence.
In an embodiment of the present invention, the quantitative processing circuit board may pre-load a scaling file, and perform quantitative processing on the digital image signal according to the scaling file.
In an embodiment of the invention, the calibration file may be obtained through a pre-calibration experiment.
A method of scene adaptive quantitative measurement, the method comprising the steps of:
step 1: the Stirling refrigerator is cooled to a target temperature, the imaging circuit board sends a driving signal to the refrigeration type infrared detector, and the driving signal comprises preset integration time;
step 2: the refrigeration type infrared detector converts the infrared radiation converged by the optical lens into an electric signal according to the driving signal and outputs the electric signal to the interface circuit board;
and step 3: the interface circuit board converts the electric signal into a digital signal and outputs the digital signal to the imaging circuit board; the imaging circuit board processes the digital signals to obtain digital image signals and outputs a given quantity processing circuit board;
and 4, step 4: the quantitative processing circuit board carries out quantitative processing on the digital image according to a prestored calibration file to obtain radiation temperature information of each pixel of the image, and calculates integral time corresponding to the radiation temperature by using an automatic exposure control algorithm and transmits the integral time to the imaging circuit board;
and 5: the imaging circuit board obtains a new driving signal according to the corresponding integral time adjustment, and sends the new driving signal to the refrigeration type infrared detector;
step 6: and (5) repeating the step 2 to the step 5.
In an embodiment of the invention, the operation timing is adjusted according to variation of the integration time, and the driving signal is changed according to the adjustment of the operation timing.
In an embodiment of the present invention, the flow of the automatic exposure control algorithm in step 4 is as follows:
(1) acquiring an image of the current field of view according to default integral time I, and performing histogram statistics on the image by using an algorithm histogram statistics module to obtain a current image histogram;
(2) setting an upper adjustable threshold alpha and a lower adjustable threshold beta, wherein beta is the ratio of an expected image gray value to a maximum gray value, and the value range is 0-1; alpha is the ratio of the number of pixels not less than the desired gray value to the total number of pixels;
(3) setting alpha and beta values, calculating an expected gray value, calculating the number of pixels exceeding the expected gray value according to the statistical result of the step (1), calculating the ratio alpha ' of the number of pixels to the total number of pixels, comparing the ratio alpha ' with alpha, and calculating the difference delta alpha-alpha ' -alpha;
(4) judging the value of delta alpha, if the value of the delta alpha is less than 0.05, keeping the integration time unchanged, otherwise, calculating the value I' of the integration time to be adjusted, I (1-delta alpha);
(5) repeating steps (1) - (4) until | Δ α | < 0.05.
As described above, the present invention has the following advantageous effects:
according to the invention, the quantitative processing circuit board is added in the imaging processing system, the automatic exposure control algorithm is operated, the self-adaptive selection and quantitative measurement of the integration time of the thermal infrared imager under different scenes are realized, the integration time is automatically adjusted according to the actual using scene to complete the measurement, the operation process of the thermal infrared imager is simplified, manual intervention is not needed, the use is simpler, more convenient and faster, and an operator without background knowledge can also use the thermal infrared imager for measurement.
Drawings
Fig. 1 shows a block diagram of a prior art thermal infrared imager.
FIG. 2 is a block diagram of a scene adaptive quantitative measurement thermal infrared imager disclosed in the present invention.
Fig. 3 shows a flow chart of the automatic exposure control algorithm disclosed in the present invention.
Description of the element reference numerals
Detailed Description
The embodiments of the present invention are described below with reference to specific embodiments, and other advantages and effects of the present invention will be easily understood by those skilled in the art from the disclosure of the present specification. The invention is capable of other and different embodiments and of being practiced or of being carried out in various ways, and its several details are capable of modification in various respects, all without departing from the spirit and scope of the present invention. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict.
It should be noted that the drawings provided in the following embodiments are only for illustrating the basic idea of the present invention, and the components related to the present invention are only shown in the drawings rather than drawn according to the number, shape and size of the components in actual implementation, and the type, quantity and proportion of the components in actual implementation may be changed freely, and the layout of the components may be more complicated.
Referring to fig. 2, the present invention provides a scene adaptive quantitative measurement thermal infrared imager, which comprises an optical lens, a refrigeration assembly, an imaging processing system and a power system, wherein the optical lens is located at the front end of the refrigeration assembly, the refrigeration assembly comprises a refrigeration type infrared detector and a stirling cryocooler,
the Stirling refrigerator provides a stable working temperature environment of about 80K for the refrigeration type infrared detector;
the optical lens converges the infrared radiation in the field of view onto a focal plane of the refrigeration type infrared detector;
the refrigeration type infrared detector converts the received infrared radiation into an electric signal and outputs the electric signal to an imaging processing system;
the imaging processing system comprises an interface circuit board, an imaging circuit board and a quantitative processing circuit board,
the interface circuit board provides bias voltage for the refrigeration type infrared detector, and converts the electric signal into a digital signal and transmits the digital signal to the imaging circuit board;
the imaging circuit board provides a working time sequence for the refrigeration type infrared detector, converts the digital signals into digital image signals to be transmitted to the quantitative processing circuit board, receives integral time information of the quantitative processing circuit board in real time, and adjusts the working time sequence by utilizing the integral time information;
the quantitative processing circuit board carries out quantitative processing on the digital image signals to obtain the radiation temperature information of each pixel of the image, the digital image signals are output to a display module of a computer, and the integration time corresponding to the radiation temperature is calculated and transmitted to the imaging circuit board by using an automatic exposure control algorithm;
the power supply system provides stable working voltage for the optical lens, the refrigeration assembly and the imaging processing system.
Based on the above embodiment, the interface circuit board is electrically connected with the output pin of the refrigeration type infrared detector, and is used for amplifying, filtering and conditioning the electric signal, and completing analog-to-digital conversion to obtain a digital signal.
Based on the above embodiment, the imaging circuit board also provides a working time sequence for the interface circuit board, and the interface circuit board completes analog-to-digital conversion of the electrical signal according to the working time sequence.
Based on the above embodiment, the quantitative processing circuit board may pre-load a calibration file, and perform quantitative processing on the digital image signal according to the calibration file (the calibration file is a comparison table, and the gray value or the voltage value may be converted into a temperature value according to the comparison table).
Based on the above embodiments, the calibration file may be obtained through a pre-calibration experiment.
A method of scene adaptive quantitative measurement, the method comprising the steps of:
step 1: the Stirling refrigerator is cooled to a target temperature, the imaging circuit board sends a driving signal to the refrigeration type infrared detector, and the driving signal comprises preset integration time;
step 2: the refrigeration type infrared detector converts the infrared radiation converged by the optical lens into an electric signal according to the driving signal and outputs the electric signal to the interface circuit board;
and step 3: the interface circuit board converts the electric signal into a digital signal and outputs the digital signal to the imaging circuit board; the imaging circuit board processes the digital signals to obtain digital image signals and outputs a given quantity processing circuit board;
and 4, step 4: the quantitative processing circuit board carries out quantitative processing on the digital image according to a prestored calibration file to obtain radiation temperature information of each pixel of the image, and calculates integral time corresponding to the radiation temperature by using an automatic exposure control algorithm and transmits the integral time to the imaging circuit board;
and 5: the imaging circuit board obtains a new driving signal according to the corresponding integral time adjustment, and sends the new driving signal to the refrigeration type infrared detector;
step 6: and (5) repeating the step 2 to the step 5.
Based on the above embodiment, the operation timing is adjusted according to the variation of the integration time, and the driving signal is changed according to the adjustment of the operation timing.
Referring to fig. 3, based on the above embodiment, the flow of the automatic exposure control algorithm in step 4 is as follows:
(1) acquiring an image of the current field of view according to default integral time I, and performing histogram statistics on the image by using an algorithm histogram statistics module to obtain a current image histogram;
(2) setting an upper adjustable threshold α and a lower adjustable threshold β, where β is a ratio of an expected image gray value to a maximum gray value, and a value range is 0-1, for example: for a 16-bit gray image, if the gray expectation value is x, then β is x/216; α is a ratio of the number of pixels not less than the desired gray-scale value to the total number of pixels, for example, for a 640 × 512 area array refrigeration-type infrared detector, counting the number of pixels y not less than the desired gray-scale value, α is y/(640 × 512);
(3) setting alpha and beta values, calculating an expected gray value, calculating the number of pixels exceeding the expected gray value according to the statistical result of the step (1), calculating the ratio alpha ' of the number of pixels to the total number of pixels, comparing the ratio alpha ' with alpha, and calculating the difference delta alpha-alpha ' -alpha;
(4) judging the value of delta alpha, if the value of the delta alpha is less than 0.05, keeping the integration time unchanged, otherwise, calculating the value I' of the integration time to be adjusted, I (1-delta alpha);
(5) repeating steps (1) - (4) until | Δ α | < 0.05.
The working process is as follows: firstly, electrifying the thermal infrared imager, completing power supply conversion by a power supply system, and providing stable working voltage for each part; the Stirling refrigerator starts to refrigerate, and the imaging system is initialized; after the Stirling refrigerator is cooled to the target temperature, the imaging system sends a driving signal to the refrigeration infrared detector, the refrigeration infrared detector converts the infrared radiation gathered by the infrared lens into an electric signal according to the integral time specified by the driving signal and outputs the electric signal, an interface circuit board in the imaging processing system converts the electric signal into a digital signal, the imaging circuit board processes the digital signal to form a digital image signal and outputs the digital image signal to a quantitative processing board, the quantitative processing board finishes image quantitative processing according to a prestored calibration file and outputs the image, meanwhile, an automatic exposure control algorithm is operated to calculate new integral time and send the image signal to the imaging circuit board, the imaging circuit board adjusts the driving signal, and the next frame of image is collected according to the new integral time.
In conclusion, when the scene self-adaptive quantitative measurement thermal infrared imager is used, the integration time can be automatically adjusted according to the actual use scene to finish measurement, manual intervention is not needed, and the scene self-adaptive quantitative measurement thermal infrared imager is simpler, more convenient and faster to use. Therefore, the invention effectively overcomes various defects in the prior art and has high industrial utilization value.
The foregoing embodiments are merely illustrative of the principles and utilities of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.
Claims (8)
1. A scene self-adaptive quantitative measurement thermal infrared imager is characterized by comprising an optical lens, a refrigeration assembly, an imaging processing system and a power supply system, wherein the optical lens is positioned at the front end of the refrigeration assembly, the refrigeration assembly consists of a refrigeration type infrared detector and a Stirling refrigerator,
the Stirling refrigerator provides a stable working temperature environment for the refrigeration type infrared detector;
the optical lens converges the infrared radiation in the field of view onto a focal plane of the refrigeration type infrared detector;
the refrigeration type infrared detector converts the received infrared radiation into an electric signal and outputs the electric signal to an imaging processing system;
the imaging processing system comprises an interface circuit board, an imaging circuit board and a quantitative processing circuit board,
the interface circuit board provides bias voltage for the refrigeration type infrared detector, and converts the electric signal into a digital signal and transmits the digital signal to the imaging circuit board;
the imaging circuit board provides a working time sequence for the refrigeration type infrared detector, converts the digital signals into digital image signals to be transmitted to the quantitative processing circuit board, receives integral time information of the quantitative processing circuit board in real time, and adjusts the working time sequence by utilizing the integral time information;
the quantitative processing circuit board carries out quantitative processing on the digital image signals to obtain radiation temperature information of each pixel of the image, and calculates integral time corresponding to the radiation temperature by using an automatic exposure control algorithm and transmits the integral time to the imaging circuit board;
the power supply system provides stable working voltage for the optical lens, the refrigeration assembly and the imaging processing system.
2. The scene adaptive quantitative measurement thermal infrared imager of claim 1, characterized in that: the interface circuit board is electrically connected with an output pin of the refrigeration type infrared detector, amplifies, filters and conditions the electric signal, and completes analog-to-digital conversion to obtain a digital signal.
3. The scene adaptive quantitative measurement thermal infrared imager of claim 2, characterized in that: the imaging circuit board also provides a working time sequence for the interface circuit board, and the interface circuit board completes analog-to-digital conversion of the electrical signals according to the working time sequence.
4. The scene adaptive quantitative measurement thermal infrared imager of claim 1, characterized in that: the quantitative processing circuit board can load a calibration file in advance and carry out quantitative processing on the digital image signals according to the calibration file.
5. The scene adaptive quantitative measurement thermal infrared imager of claim 4, wherein: the calibration file may be obtained by pre-calibration experiments.
6. A method for scene adaptive quantitative measurement, the method comprising the steps of:
step 1: the Stirling refrigerator is cooled to a target temperature, the imaging circuit board sends a driving signal to the refrigeration type infrared detector, and the driving signal comprises preset integration time;
step 2: the refrigeration type infrared detector converts the infrared radiation converged by the optical lens into an electric signal according to the driving signal and outputs the electric signal to the interface circuit board;
and step 3: the interface circuit board converts the electric signal into a digital signal and outputs the digital signal to the imaging circuit board; the imaging circuit board processes the digital signals to obtain digital image signals and outputs a given quantity processing circuit board;
and 4, step 4: the quantitative processing circuit board carries out quantitative processing on the digital image according to a prestored calibration file to obtain radiation temperature information of each pixel of the image, and calculates integral time corresponding to the radiation temperature by using an automatic exposure control algorithm and transmits the integral time to the imaging circuit board;
and 5: the imaging circuit board obtains a new driving signal according to the corresponding integral time adjustment, and sends the new driving signal to the refrigeration type infrared detector;
step 6: and (5) repeating the step 2 to the step 5.
7. The method of claim 6, wherein: the operation timing is adjusted according to the variation of the integration time, and the driving signal is changed according to the adjustment of the operation timing.
8. The method of claim 6, wherein: the automatic exposure control algorithm in the step 4 comprises the following steps:
(1) acquiring an image of the current field of view according to default integral time I, and performing histogram statistics on the image by using an algorithm histogram statistics module to obtain a current image histogram;
(2) setting an upper adjustable threshold alpha and a lower adjustable threshold beta, wherein beta is the ratio of an expected image gray value to a maximum gray value, and the value range is 0-1; alpha is the ratio of the number of pixels not less than the desired gray value to the total number of pixels;
(3) setting alpha and beta values, calculating an expected gray value, calculating the number of pixels exceeding the expected gray value according to the statistical result of the step (1), calculating the ratio alpha ' of the number of pixels to the total number of pixels, comparing the ratio alpha ' with alpha, and calculating the difference delta alpha-alpha ' -alpha;
(4) judging the value of delta alpha, if the value of the delta alpha is less than 0.05, keeping the integration time unchanged, otherwise, calculating the value I' of the integration time to be adjusted, I (1-delta alpha);
(5) repeating steps (1) - (4) until | Δ α | < 0.05.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115278119A (en) * | 2022-09-30 | 2022-11-01 | 中国科学院长春光学精密机械与物理研究所 | Automatic adjusting method for integration time of infrared camera for measuring infrared radiation characteristics |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115278119A (en) * | 2022-09-30 | 2022-11-01 | 中国科学院长春光学精密机械与物理研究所 | Automatic adjusting method for integration time of infrared camera for measuring infrared radiation characteristics |
| CN115278119B (en) * | 2022-09-30 | 2022-12-06 | 中国科学院长春光学精密机械与物理研究所 | Infrared camera integral time automatic adjusting method for infrared radiation characteristic measurement |
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