CN113484629B - General test system for electronic and electrical equipment - Google Patents
General test system for electronic and electrical equipment Download PDFInfo
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- CN113484629B CN113484629B CN202110603277.3A CN202110603277A CN113484629B CN 113484629 B CN113484629 B CN 113484629B CN 202110603277 A CN202110603277 A CN 202110603277A CN 113484629 B CN113484629 B CN 113484629B
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- 238000012812 general test Methods 0.000 title description 7
- 238000012360 testing method Methods 0.000 claims abstract description 306
- 230000005284 excitation Effects 0.000 claims abstract description 82
- 238000006243 chemical reaction Methods 0.000 claims abstract description 53
- 238000004891 communication Methods 0.000 claims abstract description 27
- 238000004088 simulation Methods 0.000 claims description 10
- 238000009413 insulation Methods 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 3
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- 230000000875 corresponding effect Effects 0.000 description 27
- 238000011161 development Methods 0.000 description 5
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- 230000009286 beneficial effect Effects 0.000 description 3
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- 238000010586 diagram Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The invention relates to a universal test system for electronic and electrical equipment, which comprises a control module, a power module, a communication module and a test module; the system also comprises a selection access module, an excitation output module and an interface; the control module for realizing the whole test control mounts the selection access module, the excitation output module and the test module through a primary bus; the bus conversion/function selection unit is used for receiving and analyzing the command of the control module, completing self-checking and feeding back the control module according to the analyzed content, or issuing the analyzed command to the corresponding selection access unit through the secondary bus and controlling the bus to complete corresponding function selection, so that the connection between the corresponding to-be-tested point and the test module is realized, and the test module executes the corresponding test; the bus conversion unit is used for receiving and analyzing the command of the control module, completing self-checking and feeding back the control module according to the analyzed content, or transmitting the analyzed command to the corresponding excitation output unit through the secondary bus, so that the power-up of the relevant relay in the tested electronic and electric equipment is realized.
Description
Technical Field
The invention relates to a universal test system for electronic and electrical equipment, and belongs to the technical field of electronic and electrical test.
Background
In the fields of military industry and civil use such as aerospace, weapon ships, energy traffic and the like, the development of high integration of functions and scales of electronic and electric equipment is a current remarkable trend, and the development trend not only puts forward higher requirements on the design of the electronic and electric equipment, but also brings greater challenges to the test of the electronic and electric equipment, particularly the general test.
However, in the technical field of general testing of electronic and electrical equipment, most of the existing testing instruments on the market have single functions, smaller testing scale and poorer performance. And the test function and test scale of the existing test instrument basically do not have the condition of convenient expansion, let alone the improvement of the performance. To realize the conventional function and performance test of a certain electronic and electric device, a plurality of sets of test instruments are required to be matched for use, so that the test site is disordered, the operation skill requirement on a tester is high, the test efficiency is low, the test cost is high, and the most serious problem is that the consistency and reliability of test data are difficult to guarantee. Therefore, it is difficult for the conventional test apparatus to fully cover the requirements of the highly integrated electronic and electric equipment, such as the test function and the test scale.
In the face of the development trend of high integration of functions and scale of electronic and electric equipment, the application limitation of the existing test instrument is more obvious, and the general test requirement of the electronic and electric equipment is more and more difficult to meet. Therefore, the invention is particularly urgent in a test system which is universal in the field of electronic and electrical equipment test.
Disclosure of Invention
The invention solves the technical problems that: the invention aims to overcome the defects of the prior art and provide a highly integrated universal test system for electronic and electric equipment, which can realize universal test items such as conduction test, resistance test, circuit breaking test, diode test, relay test, insulation test, withstand voltage test, capacitance test, voltage test, current test and the like of the electronic and electric equipment.
The solution of the invention is as follows: a universal test system for electronic and electrical equipment comprises a control module, a power module, a communication module and a test module; the system also comprises a selection access module, an excitation output module and an interface; the communication module is used for data transmission between the control module and the test module, and between the selection access module and the excitation output module;
The control module for realizing the whole test control mounts the selection access module, the excitation output module and the test module through a primary bus; the selective access module comprises a bus conversion/function selection unit, N selective access units and an isolated DC/DC unit 1 for supplying power to the units; the bus conversion/function selection unit mounts N selection access units through a secondary bus; the excitation output module comprises a bus conversion unit, M excitation output units and an isolated DC/DC unit 2 for supplying power to the units; the bus conversion unit mounts M excitation output units through a secondary bus; the N selection access units and the M excitation output units are respectively connected with all points to be measured in the tested electronic and electric equipment and the relay power-on point through interfaces; the bus conversion/function selection unit is connected with the test module through a cable;
The bus conversion/function selection unit is used for receiving and analyzing the command of the control module, completing self-checking and feeding back the control module according to the analyzed content, or issuing the analyzed command to the corresponding selection access unit and controlling the bus conversion/function selection unit to complete corresponding function selection, so that the connection between the corresponding to-be-tested point and the test module is realized, and the test module executes the corresponding test;
The bus conversion unit is used for receiving and analyzing the command of the control module, completing self-checking and feeding back the control module according to the analyzed content or issuing the analyzed command to the corresponding excitation output unit, so as to realize the powering up of the relevant relay in the tested electronic and electric equipment.
Preferably, the control module exchanges data with the selection access module and the excitation output module through a CAN bus; the bus conversion/function selection unit and the selection access unit exchange data through an RS485 bus; the bus conversion unit and the excitation output unit exchange data through an RS485 bus; and data exchange is carried out between the test module and the control module through a PCI bus and/or an RS232 bus.
Preferably, the number of the selective access modules and the excitation output modules is multiple and the selective access modules and the excitation output modules are mounted on the primary bus, and the number of the modules is determined according to all points to be detected and the number of the relay power-on points in the tested electronic and electric equipment; the selected access modules are connected through a communication expansion cable, a power expansion cable and an analog test bus expansion cable; the excitation output modules are connected through a communication expansion cable and a power expansion cable.
Preferably, the test module includes: a low voltage test unit, a high voltage test unit and a capacitance test unit;
the low-voltage test unit is used for conducting, resisting, breaking, testing a diode and a relay between points to be tested of the tested electronic and electric equipment and testing voltage and current;
The high-voltage testing unit is used for conducting insulation and voltage withstand tests between points to be tested of the tested electronic and electric equipment;
The capacitance test unit is used for carrying out capacitance test between points to be tested of the tested electronic and electric equipment, and the capacitance of the components or the capacitance of the two wires are arranged between the points to be tested.
Preferably, the selective access unit comprises 4 analog test buses W1-W4 connected with the bus conversion/function selection unit and 2n double-pole single-throw switches K1-K2 n, wherein the 2n double-pole single-throw switches are numbered in sequence;
the 1 point and 3 points of each double-pole single-throw switch are the movable contacts, the fixed contact corresponding to the 1 point is recorded as 2 points, and the other fixed contact is 4 points;
All 3 points of the odd-numbered switches K1, K3 and K5 … K2n-1 are connected to the analog test bus W1;
All 1 points of the odd-numbered switches K1, K3 and K5 … K2n-1 are connected to the analog test bus W2;
all 3 points of even-numbered switches K2, K4 and K6 … K2n are connected to the analog test bus W3;
all 1 points of even-numbered switches K2, K4 and K6 … K2n are connected to the analog test bus W4;
The 4 point of the switch K1 is connected to the 2 point of the switch K2 and connected to the channel CS1 of the interface;
the 2 point of the switch K1 is connected to the 4 point of the K2 and connected to the channel CS2 of the interface;
the 4 point of the switch K3 is connected to the 2 point of the switch K4 and connected to the channel CS3 of the interface;
the 2 point of the switch K3 is connected to the 4 point of the K4 and connected to the channel CS4 of the interface;
the 4 point of the switch K5 is connected to the 2 point of the switch K6 and connected to the channel CS5 of the interface;
the 2 point of the switch K5 is connected to the 4 point of the K6 and connected to the channel CS6 of the interface;
… … and so on;
The 4 point of the switch K2n-1 is connected to the 2 point of the K2n and connected to the channel CS2n-1 of the interface;
the 2 point of the switch K2n-1 is connected to the 4 point of the K2n and connected to the channel CS2n of the interface.
Preferably, when the analyzed instruction content shows that the open circuit, insulation and withstand voltage test is executed, determining a tested starting point from the analyzed content, and when the tested starting point is an odd number, switching on the odd number double-pole single-throw switch connected with the tested starting point to realize the connection between the tested starting point and W1; when the measured starting point is an even number, a double-pole single-throw switch corresponding to the even number minus 1 connected with the measured starting point is turned on, so that the connection between the measured starting point and W2 is realized;
Determining other measured points corresponding to the test from the analyzed content, and grouping according to parity; aiming at the measured points in the even number group, a double-pole single-throw switch with the serial numbers consistent with the measured points is connected, and all the measured points in the even number group are connected to a simulation test bus W3 after being short-circuited; aiming at the measured points in the odd-numbered groups, a double-pole single-throw switch corresponding to the measured point number plus 1 is turned on, and all the measured points in the odd-numbered groups are connected to the analog test bus W4 after being short-circuited;
and accessing the simulation test buses accessed by the tested starting point and the rest tested points to a test module for testing.
Preferably, when the analyzed instruction content shows that the on, resistance, diode, relay, voltage, current and capacitance test is executed, determining a tested starting point from the analyzed content, and when the tested starting point is an odd number, switching on the odd number double-pole single-throw switch connected with the tested starting point to realize the connection between the tested starting point and W1; when the measured starting point is an even number, a double-pole single-throw switch corresponding to the even number minus 1 connected with the measured starting point is turned on, so that the connection between the measured starting point and W2 is realized;
Determining a tested termination point of a corresponding test from the analyzed content, when the tested termination point is an odd number, switching on a double-pole single-throw switch corresponding to the number +1 of the tested termination point, and connecting the tested termination point to the analog test bus W4; when the measured termination point is even, the double-pole single-throw switch with the same number as the measured termination point is turned on, and the measured termination point is connected to the analog test bus W3.
Preferably, the excitation output unit comprises k isolated DC/DC and m groups of double-pole single-throw switches, each group of double-pole single-throw switches comprising k double-pole single-throw switches;
the 1 point and 3 points of each double-pole single-throw switch are the movable contacts, the fixed contact corresponding to the 1 point is recorded as 2 points, and the other fixed contact is 4 points;
Each isolated DC/DC is used to convert the input voltage into an isolated demand power source; the positive end and the ground end of the converted required power supply respectively form one path of driving output through a group of double-pole single-throw switches, and each path of driving output comprises a driving output positive end CH+ and a driving output ground end CHG;
the 1 and 3 points of the k double-pole single-throw switches in each group are respectively connected to the power bus, the 2 points are commonly connected to the driving output positive end CH+ of the path, and the 4 points are commonly connected to the driving output ground end CHG of the path.
When the test system is portable, N is preferably 2 or 4, m is preferably 2; when the test system is distributed and centralized, N is preferably 16 and m is preferably 8.
Preferably, the system of the present invention further comprises a convergence cable for concentrating the input and output ports of the option access module and the stimulus output module to the interface; the interface adopts a round connector or a rectangular connector with a locking device and an error preventing function.
Compared with the prior art, the invention has the beneficial effects that:
(1) The invention adopts a two-stage bus cascade architecture, realizes the conversion/function selection unit and the bus conversion unit from the top control module to the middle bus through the first-stage bus, and then realizes the communication between the middle bus conversion/function selection unit and the bus conversion unit to the bottom selection access unit and the excitation output unit through the second-stage bus, thereby effectively solving the limit of the number of mounting nodes under the single-stage bus, and realizing the flexible expansion of the test scale of the test system according to the diversity test requirements of different users;
(2) The invention adopts an embedded industrial control computer with various communication bus interfaces as a control core; the selection of various communication bus interfaces is convenient for flexible expansion of each test unit of the test module so as to realize flexible expansion of test functions of the test system; the cascade connection of the access module and the excitation output module is convenient to select, so that the flexible expansion of the test scale of the test system is realized; the embedded industrial control computer has small volume and low power consumption, is convenient for taking protective measures in the aspects of mechanics, thermodynamics, electromagnetism and the like, ensures the reliability of a test system, and is beneficial to the realization of the series development of the test system;
(3) The invention adopts a multipath isolated AC/AC unit and a multipath isolated AC/DC unit to respectively provide mutually isolated working power supplies for a control module, a test module, a selection access module and an excitation output module of a test system; the multipath isolated power supply units can prevent fault diffusion caused by abnormality of a certain unit among the modules of the test system, so that the working stability of the test system is improved; in addition, after a certain power supply unit fails, the failure point can be rapidly positioned, the power supply unit is maintained in a targeted manner, the average failure-free time of the test system is improved, and the maintenance cost of the test system is reduced;
(4) The invention adopts a 3-level power isolation scheme, namely a multipath isolated AC/DC unit of a power module, an isolated DC/DC unit 2 of an excitation output module and a DC/DC of the excitation output unit, which not only ensures the self power safety of a test system, but also provides sufficient guarantee for the power supply safety of a relay in tested electronic and electrical equipment;
(5) The invention adopts a plurality of mutually independent test units to realize the test of different functions and performances of the tested electronic and electric equipment, and can be flexibly configured according to the diversity test requirements of different users;
(6) The invention adopts the selective access unit, achieves the aim of switching the most test points by using the least switches, achieves the improvement of the test efficiency of breaking, insulating and withstand voltage, and achieves the flexibility of the expansion of the test system by adopting a concise circuit topology structure;
(7) The invention adopts the excitation output unit, realizes the programmable output isolation of each path of voltage and improves the application flexibility of the test system;
(8) The invention adopts the round or rectangular connector with the locking device and the misplug preventing function and convenient for the plugging operation as the external interface, thereby realizing the reliable and convenient butt joint of the tested electronic and electric equipment and the testing system.
Drawings
FIG. 1 is a system block diagram of the present invention;
FIG. 2 is a schematic diagram of a selective access unit according to the present invention;
fig. 3 is a schematic diagram of the excitation output unit of the present invention.
Detailed Description
The invention is further illustrated below with reference to examples.
The universal test system for the electronic and electrical equipment adopts a two-stage bus cascade architecture and a modularized design, can flexibly expand test functions and test scales supported by the test system according to the diversity test requirements of different users, and configures the test system into various forms such as portability, distribution, centralization and the like so as to adapt to the changeable test environments of users in different industries or fields; the general test system has simple structure, high automation degree and integration level, no confusion of test sites, and low requirements of friendly test interfaces and operation steps on comprehensive quality and operation skills of testers; in addition, the general test system has higher efficiency in the aspects of resistance test, breaking test, insulation test, voltage withstand test and the like, and the consistency and reliability of test data are better.
As shown in fig. 1, a universal test system for electronic and electrical equipment comprises a control module, a power module, a communication module, a test module, a selection access module, an excitation output module, an interface, a power expansion cable, a communication expansion cable, an analog test bus expansion cable and a collection cable;
on one hand, the control module analyzes the test engineering data created by the user into corresponding control instructions, and sends the corresponding control instructions to the selection access module, the driving output module or the test module to execute corresponding functional tests; when the test function is relay test, the control instruction is issued to the selection access module, the driving output module and the test module at the same time; when the test function is other tests except the relay test, the control instruction is issued to the selection access module and the test module at the same time; on the other hand, according to the selection of the user, the selection access module, the driving output module or the testing module is controlled to execute the related self-checking function.
The power module provides isolation power required by work for each module of the whole general test system;
The communication module is used for data transmission between the control module and the test module, and between the selective access module and the excitation output module; the communication module adopts various communication bus forms, so that the flexible expansion of the test function of the test system is realized;
The test module is used for realizing different test functions;
The selection access module is used for accessing the relevant points to be tested in the tested electronic and electric equipment to the test module;
the excitation output module is used for powering on a relay to be tested in the tested electronic and electric equipment;
The access module and the excitation output module are selected, and the design idea of high modularization is adopted, so that the flexible expansion of the test scale of the test system is realized;
The interface is used for connecting all to-be-tested points and relay power-on points in the tested electronic and electric equipment to the test system; the interface adopts a common round connector or rectangular connector with a locking device and an error preventing function, and is convenient for plugging and unplugging operation, so that the tested electronic and electrical equipment can be conveniently and reliably docked with the testing system;
The power expansion cable is used for connecting the power module with the control module, the test module, the selective access module and the excitation output module; the power expansion cable supports flexible expansion of the power module, the test module, the selective access module and the excitation output module;
the communication expansion cable is used for connecting the control module with the test module, the selective access module and the excitation output module; the communication expansion cable supports flexible expansion of the communication module, the test module, the selective access module and the excitation output module;
the simulation test bus extension cable is used for connecting the test module and the selective access module; the simulation test bus expansion cable supports flexible expansion of the test module and the selective access module;
The collecting cable is used for collecting the input and output ports of the selective access module and the excitation output module to the interface, so that the connection between the test system and the tested electronic and electric equipment is neat and concise;
The control module exchanges data with the selection access module and the excitation output module through a first-level CAN bus; the bus conversion/function selection unit inside the selection access module exchanges data with the selection access unit through a secondary RS485 bus; the data exchange is carried out between a bus conversion unit and an excitation output unit in the excitation output module through a secondary RS485 bus; the data exchange is carried out from the top layer control module to the middle layer bus conversion/function selection unit and the bus conversion unit through the first-level bus, and then from the middle layer bus conversion/function selection unit and the bus conversion unit to the bottom layer selection access unit and the excitation output unit through the second-level bus, so that the flexible expansion of the test scale and the test function of the test system is realized.
The invention provides a preferred embodiment that the control module adopts an embedded industrial control computer with various communication bus interfaces; the form of the communication bus interface comprises, but is not limited to, an RS232 bus, a PCI bus and a CAN bus which are contained in the communication module, and various communication bus interfaces realize flexible expansion of the test function of the test system; the embedded industrial control computer has small volume and low power consumption, is convenient for taking protective measures in the aspects of mechanics, thermodynamics, electromagnetism and the like, ensures the reliability of the test system and is beneficial to the series development of the test system;
The power module comprises a multipath isolated AC/AC unit and a multipath isolated AC/DC unit; the multipath isolated AC/AC unit respectively provides an alternating current 220VAC/50Hz working power supply for the high-voltage test unit in the control module and the test module; working power supplies of a low-voltage test unit and a capacitance test unit in the test module are provided by a PCI bus;
the multipath isolated AC/DC units respectively provide 5VDC working power for the selective access module and provide 5VDC and 28VDC working power for the excitation output module;
The power supply module provides working power supplies which are isolated from each other for each module, so that fault diffusion caused by power supply abnormality among the modules of the test system can be avoided, and the working stability of the test system is improved; after a certain power supply unit fails, the failure point can be rapidly positioned, the power supply unit can be maintained in a targeted manner, the average failure-free time of the test system is improved, and the maintenance cost of the test system is reduced.
The test module comprises a low-voltage test unit, a high-voltage test unit and a capacitance test unit;
The low-voltage test unit is used for conducting, resisting, breaking, diode, relay, capacitor, voltage and current tests among relevant points to be tested on the tested electronic and electrical equipment;
the high-voltage testing unit is used for conducting insulation and voltage withstand tests between related points to be tested on the tested electronic and electric equipment;
the capacitance test unit is used for carrying out capacitance test between related points to be tested on the tested electronic and electric equipment, and the capacitance of components or two wires can be arranged between the points to be tested;
In order to realize flexible expansion of the test function of the test system, other test units can be added to the test module or the existing test units can be reduced.
The selective access module comprises an isolated DC/DC unit 1, a bus conversion/function selection unit and a selective access unit;
The isolated DC/DC unit 1 provides 5VDC power supply needed by the work for the bus conversion/function selection unit and the selection access unit;
The bus conversion/function selection unit is used for converting an instruction issued by the control module through a CAN bus in the communication module into an instruction in the form of an RS485 bus, forwarding the instruction to the selection access unit, executing corresponding actions by the selection access unit, and simultaneously accessing a relevant test unit in the test module to the selection access unit through the bus conversion/function selection unit according to the instruction issued by the control module, so that the connection between a corresponding to-be-tested point and the test module is realized, and the test module executes a corresponding test; or performing self-checking and feeding back the control module according to the instruction issued by the control module;
n selective access units can be mounted on the RS485 bus of each selective access module, and each selective access unit is provided with 64 selective access channels (the selective access channels are multiples of 2, preferably 64); when the test system is portable, N is preferably 2 or 4; when the test system is distributed and centralized, N is preferably 16;
as shown in fig. 2, the selective access unit includes 4 analog test buses W1 to W4, 2n double-pole single-throw switches K1 to K2n, 2n to-be-tested point channels CS1 to CS2n;
the 1 point and 3 points of each double-pole single-throw switch are the movable contacts, the fixed contact corresponding to the 1 point is recorded as 2 points, and the other fixed contact is 4 points;
All 3 points of the odd-numbered switches K1, K3 and K5 … K2n-1 are connected to the analog test bus W1;
All 1 points of the odd-numbered switches K1, K3 and K5 … K2n-1 are connected to the analog test bus W2;
all 3 points of even-numbered switches K2, K4 and K6 … K2n are connected to the analog test bus W3;
all 1 points of even-numbered switches K2, K4 and K6 … K2n are connected to the analog test bus W4;
the 4 points of the switch K1 are connected to the 2 points of the switch K2 and connected to the channel CS1 of the point to be detected;
the 2 points of the switch K1 are connected to the 4 points of the K2 and connected to the channel CS2 of the point to be detected;
the 4 point of the switch K3 is connected to the 2 point of the switch K4 and connected to the channel CS3 of the point to be detected;
the 2 points of the switch K3 are connected to the 4 points of the K4 and connected to the channel CS4 of the point to be detected;
the 4 points of the switch K5 are connected to the 2 points of the switch K6 and connected to the channel CS5 of the point to be detected;
The 2 points of the switch K5 are connected to the 4 points of the switch K6 and connected to the channel CS6 of the point to be detected;
… … and so on;
the 4 points of the switch K2n-1 are connected to the 2 points of the K2n and connected to the channel CS2n-1 of the point to be detected;
The 2 point of the switch K2n-1 is connected to the 4 point of the K2n and connected to the channel CS2n of the point to be detected;
The efficiency of the circuit breaking, insulating and withstand voltage test is remarkably improved by carrying out odd and even grouping and short-circuiting on the to-be-tested points;
The test efficiency will be described below with reference to fig. 2, taking the test of disconnection between 8 points CS1 to CS8 as an example;
0) The test requirement is that any 1 point is tested on other 7 points;
1) The invention relates to a method for testing CS 2-CS 8 of a to-be-tested point CS 1;
1a) The measurement point CS1 tests the even number groups of measurement points CS4, CS6 and CS 8;
Closing a switch K1, and connecting the to-be-tested point CS1 to the analog test bus W1;
Closing switches K4, K6 and K8, shorting the to-be-tested points CS4, CS6 and CS8 and then connecting the to-be-tested points CS4, CS6 and CS8 to the simulation test bus W3;
the bus conversion/function selection unit is used for connecting the analog test buses W1 and W3 to the corresponding low-voltage test units, and the low-voltage test units respectively apply test excitation signals to the to-be-tested points CS1, CS4, CS6 and CS8 through the bus conversion/function selection unit and the selection connection unit and collect and calculate the excitation signals so as to realize the test of the to-be-tested points CS1 to the to-be-tested points CS4, CS6 and CS 8;
1b) Testing the odd-numbered groups of to-be-tested points CS3, CS5 and CS7 by the to-be-tested point CS 1;
Closing a switch K1, and connecting the to-be-tested point CS1 to the analog test bus W1;
Closing switches K4, K6 and K8, shorting the to-be-tested points CS3, CS5 and CS7 and then connecting the to-be-tested points CS3, CS5 and CS7 to the simulation test bus W4;
the bus conversion/function selection unit is used for connecting the analog test buses W1 and W4 to the corresponding low-voltage test units, and the low-voltage test units respectively apply test excitation signals to the to-be-tested points CS1, CS3, CS5 and CS7 through the bus conversion/function selection unit and the selection connection unit and collect and calculate the excitation signals so as to realize the test of the to-be-tested points CS1 to the to-be-tested points CS3, CS5 and CS 7;
1c) Testing CS2 of the to-be-tested point CS 1;
Closing a switch K1, and connecting the to-be-tested point CS1 to the analog test bus W1;
closing a switch K2, and connecting the to-be-tested point CS2 to the analog test bus W3;
The bus conversion/function selection unit is used for connecting the analog test buses W1 and W3 to the corresponding low-voltage test units, and the low-voltage test units respectively apply test excitation signals to the to-be-tested points CS1 and CS2 through the bus conversion/function selection unit and the selection connection unit and collect and calculate the excitation signals so as to realize the test of the to-be-tested points CS1 and CS 2;
1d) The test of the to-be-tested points CS1 and CS 2-CS 8 is realized by the step 3;
2) The invention relates to a method for testing CS 3-CS 8 of a to-be-tested point CS 2;
2a) Testing the to-be-tested points CS2 and the even number groups of to-be-tested points CS4, CS6 and CS 8;
closing a switch K1, and connecting the to-be-tested point CS2 to the analog test bus W2;
Closing switches K4, K6 and K8, shorting the to-be-tested points CS4, CS6 and CS8 and then connecting the to-be-tested points CS4, CS6 and CS8 to the simulation test bus W3;
the bus conversion/function selection unit is used for connecting the analog test buses W2 and W3 to the corresponding low-voltage test units, and the low-voltage test units are used for respectively applying test excitation signals to the to-be-tested points CS2, CS4, CS6 and CS8 through the bus conversion/function selection unit and the selection connection unit and collecting and calculating the excitation signals to realize the test of the to-be-tested points CS2 to the to-be-tested points CS4, CS6 and CS 8;
2b) Testing the odd-numbered groups of to-be-tested points CS3, CS5 and CS7 by the to-be-tested point CS 2;
closing a switch K1, and connecting the to-be-tested point CS2 to the analog test bus W2;
Closing switches K4, K6 and K8, shorting the to-be-tested points CS3, CS5 and CS7 and then connecting the to-be-tested points CS3, CS5 and CS7 to the simulation test bus W4;
The bus conversion/function selection unit is used for connecting the analog test buses W2 and W4 to the corresponding low-voltage test units, and the low-voltage test units are used for respectively applying test excitation signals to the to-be-tested points CS2, CS3, CS5 and CS7 through the bus conversion/function selection unit and the selection connection unit and collecting and calculating the excitation signals to realize the test of the to-be-tested points CS2 to the to-be-tested points CS3, CS5 and CS 7;
2c) The test of the to-be-tested points CS2 and the to-be-tested points CS3 to CS8 is realized by the step 2;
supplementary explanation: in describing the test of the point CS2 to other points, the test of CS2 to CS1 need not be performed, because the test of CS2 to CS1 is identical to the test of the adjacent parity point CS1 to CS2 described in 1 c.
3) According to the invention, through the steps 5, the test of the CS1 and CS2 points of the to-be-tested points on other to-be-tested points is realized;
4) According to the invention, the to-be-measured point CS3 is used for testing to-be-measured points CS1, CS2 and CS 4-CS 8, the to-be-measured point CS4 is used for testing to-be-measured points CS1, CS2 and CS 5-CS 8, the … … to-be-measured point CS7 is used for testing to-be-measured points CS 1-CS 6 and CS8 is used for testing to-be-measured points CS 1-CS 6, and the above is referred to for carrying out the test;
5) According to the invention, the mutual test between the to-be-tested points CS 1-CS 8 is realized, and the total requirement is 5 multiplied by 4=20 steps;
6) The mutual test between the to-be-tested points CS1 to CS8 is realized by the existing other test instruments, and the total requirement is that
7) The efficiency of the 20 steps required by the invention is obviously improved compared with the 56 steps required by the existing other testing instruments after the testing is completed;
the excitation output module comprises an isolated DC/DC unit 2, a bus conversion unit and an excitation output unit;
The isolated DC/DC unit 2 provides the bus conversion unit with 5VDC power required for operation and the excitation output unit with 5VDC and 28VDC power required for operation;
The bus conversion unit is used for converting an instruction issued by the control module through a CAN bus in the communication module into an instruction in the form of an RS485 bus, and then forwarding the instruction to the excitation output unit, and the excitation output unit executes corresponding excitation output to power up a relay to be tested in the tested electronic and electric equipment; or performing self-checking and feeding back the control module according to the instruction issued by the control module;
M excitation output units can be mounted on an RS485 bus of each excitation output module, 20 excitation output channels (the excitation output channels are preferably 20) are arranged on each excitation output unit, and each excitation output channel can be used for outputting 5VDC, 12VDC or 28VDC in a program-controlled manner; when the test system is portable, M is preferably 2; when the test system is distributed and centralized, M is preferably 8;
as shown in fig. 3, the excitation output unit includes 3 isolated DC/DC and m sets of double-pole single-throw switches, each set of double-pole single-throw switches including 3 double-pole single-throw switches;
the 1 point and 3 points of each double-pole single-throw switch are the movable contacts, the fixed contact corresponding to the 1 point is recorded as 2 points, and the other fixed contact is 4 points;
The 1 st isolated DC/DC1 converts 5VDC to an isolated 5VDC+/5VDCG power supply;
the 2 nd isolated DC/DC2 converts 28VDC to an isolated 12VDC+/12VDCG power supply;
The 3 rd isolated DC/DC3 converts 28VDC to an isolated 28VDC+/28VDCG power supply;
The 1 st group of double-pole single-throw switches comprises 3 double-pole single-throw switches which are K1A, K1B, K C respectively;
The 1 point and the 3 point of the K1A are respectively connected to a power bus 5VDC+/5 VDCG;
The 1 point and the 3 point of the K1B are respectively connected to the 12VDC+/12VDCG of the power bus;
The 1 point and the 3 point of the K1C are respectively connected to the 28VDC+/28VDCG of the power bus;
The 2 points of K1A, K1B, K C are commonly connected to the 1 st path of driving output channel CH 1+;
the 4 points of K1A, K1B, K C are commonly connected to the 1 st path driving output channel CH 1G;
the 2 nd group of double-pole single-throw switches comprises 3 double-pole single-throw switches which are K2A, K2B, K C respectively;
the 1 point and the 3 point of the K2A are respectively connected to the 5VDC+/5VDCG of the power bus;
The 1 point and the 3 point of the K2B are respectively connected to the 12VDC+/12VDCG of the power bus;
the 1 point and the 3 point of the K2C are respectively connected to the 28VDC+/28VDCG of the power bus;
The 2 points of K2A, K2B, K C are commonly connected to the 2 nd path of driving output channel CH 2+;
the 4 points of K2A, K2B, K C are commonly connected to the 2 nd path of driving output channel CH 2G;
… … and so on;
The m-th group of double-pole single-throw switches comprises 3 double-pole single-throw switches which are KmA, kmB, kmC respectively;
The 1 point and the 3 point of KmA are respectively connected to the 5VDC+/5VDCG of the power bus;
The 1 point and the 3 point of KmB are respectively connected to the 12VDC+/12VDCG of the power bus;
the 1 point and the 3 point of KmC are respectively connected to the 28VDC+/28VDCG of the power bus;
the 2 points of KmA, kmB, kmC are commonly connected to the mth path of driving output channel CHm+;
the 4 points of KmA, kmB, kmC are commonly connected to the mth drive output channel CHmG;
The interface comprises a selection access point interface and an excitation output point interface;
the interface adopts a round connector or a rectangular connector with a locking device and an anti-misplug function;
the selective access point interface is used for accessing all the points to be tested in the tested electronic and electric equipment to the selective access unit in the selective access module;
The excitation output point interface is used for connecting all relay power-on points in the tested electronic and electric equipment to an excitation output unit in the excitation output module.
The power extension cable involves a 220VAC/50Hz power line that powers the high voltage test cells in the control module and test module, a 5VDC power line that powers the optional access module, and 5VDC and 28VDC power lines that power the excitation output module.
The communication expansion cable relates to an RS232 bus for data exchange between a control module and a high-voltage test unit in the test module, a PCI bus for data exchange between the control module and a low-voltage test unit and between the control module and a capacitance test unit in the test module, and a CAN bus for data exchange between the control module and a bus conversion/function selection unit in the selection access module and a bus conversion unit in the excitation output module.
What is not described in detail in the present specification is a technology known to those skilled in the art.
Claims (8)
1. A universal test system for electronic and electrical equipment comprises a control module, a power module, a communication module and a test module; the method is characterized in that: the system also comprises a selection access module, an excitation output module and an interface; the communication module is used for data transmission between the control module and the test module, and between the selection access module and the excitation output module;
The control module for realizing the whole test control mounts the selection access module, the excitation output module and the test module through a primary bus; the selective access module comprises a bus conversion/function selection unit, N selective access units and an isolated DC/DC unit 1 for supplying power to the units; the bus conversion/function selection unit mounts N selection access units through a secondary bus; the excitation output module comprises a bus conversion unit, M excitation output units and an isolated DC/DC unit 2 for supplying power to the units; the bus conversion unit mounts M excitation output units through a secondary bus; the N selection access units and the M excitation output units are respectively connected with all points to be measured in the tested electronic and electric equipment and the relay power-on point through interfaces; the bus conversion/function selection unit is connected with the test module through a cable;
The bus conversion/function selection unit is used for receiving and analyzing the command of the control module, completing self-checking and feeding back the control module according to the analyzed content, or issuing the analyzed command to the corresponding selection access unit and controlling the bus conversion/function selection unit to complete corresponding function selection, so that the connection between the corresponding to-be-tested point and the test module is realized, and the test module executes the corresponding test;
the bus conversion unit is used for receiving and analyzing the command of the control module, completing self-checking and feeding back the control module according to the analyzed content or issuing the analyzed command to the corresponding excitation output unit so as to realize the powering up of the related relay in the tested electronic and electric equipment;
The selective access unit comprises 4 analog test buses W1-W4 and 2n double-pole single-throw switches K1-K2 n which are connected with the bus conversion/function selection unit, wherein the 2n double-pole single-throw switches are numbered in sequence;
the 1 point and 3 points of each double-pole single-throw switch are the movable contacts, the fixed contact corresponding to the 1 point is recorded as 2 points, and the other fixed contact is 4 points;
All 3 points of the odd-numbered switches K1, K3 and K5 … K2n-1 are connected to the analog test bus W1;
All 1 points of the odd-numbered switches K1, K3 and K5 … K2n-1 are connected to the analog test bus W2;
all 3 points of even-numbered switches K2, K4 and K6 … K2n are connected to the analog test bus W3;
all 1 points of even-numbered switches K2, K4 and K6 … K2n are connected to the analog test bus W4;
The 4 point of the switch K1 is connected to the 2 point of the switch K2 and connected to the channel CS1 of the interface;
the 2 point of the switch K1 is connected to the 4 point of the K2 and connected to the channel CS2 of the interface;
the 4 point of the switch K3 is connected to the 2 point of the switch K4 and connected to the channel CS3 of the interface;
the 2 point of the switch K3 is connected to the 4 point of the K4 and connected to the channel CS4 of the interface;
the 4 point of the switch K5 is connected to the 2 point of the switch K6 and connected to the channel CS5 of the interface;
the 2 point of the switch K5 is connected to the 4 point of the K6 and connected to the channel CS6 of the interface;
… … and so on;
The 4 point of the switch K2n-1 is connected to the 2 point of the K2n and connected to the channel CS2n-1 of the interface;
the 2 point of the switch K2n-1 is connected to the 4 point of the K2n and connected to the channel CS2n of the interface;
When the analyzed instruction content shows that the open circuit, insulation and withstand voltage test is executed, determining a tested starting point from the analyzed content, and when the tested starting point is an odd number, switching on the odd number double-pole single-throw switch connected with the tested starting point to realize the connection between the tested starting point and W1; when the measured starting point is an even number, a double-pole single-throw switch corresponding to the even number minus 1 connected with the measured starting point is turned on, so that the connection between the measured starting point and W2 is realized;
Determining other measured points corresponding to the test from the analyzed content, and grouping according to parity; aiming at the measured points in the even number group, a double-pole single-throw switch with the serial numbers consistent with the measured points is connected, and all the measured points in the even number group are connected to a simulation test bus W3 after being short-circuited; aiming at the measured points in the odd-numbered groups, a double-pole single-throw switch corresponding to the measured point number plus 1 is turned on, and all the measured points in the odd-numbered groups are connected to the analog test bus W4 after being short-circuited;
and accessing the simulation test buses accessed by the tested starting point and the rest tested points to a test module for testing.
2. The system according to claim 1, wherein: the control module exchanges data with the selection access module and the excitation output module through a CAN bus; the bus conversion/function selection unit and the selection access unit exchange data through an RS485 bus; the bus conversion unit and the excitation output unit exchange data through an RS485 bus; and data exchange is carried out between the test module and the control module through a PCI bus and/or an RS232 bus.
3. The system according to claim 1, wherein: the number of the selective access modules and the excitation output modules is multiple and the selective access modules and the excitation output modules are mounted on the primary bus, and the number of the modules is determined according to all points to be detected and the relay power-on points in the tested electronic and electric equipment; the selected access modules are connected through a communication expansion cable, a power expansion cable and an analog test bus expansion cable; the excitation output modules are connected through a communication expansion cable and a power expansion cable.
4. The system according to claim 1, wherein: the test module comprises: a low voltage test unit, a high voltage test unit and a capacitance test unit;
the low-voltage test unit is used for conducting, resisting, breaking, testing a diode and a relay between points to be tested of the tested electronic and electric equipment and testing voltage and current;
The high-voltage testing unit is used for conducting insulation and voltage withstand tests between points to be tested of the tested electronic and electric equipment;
The capacitance test unit is used for carrying out capacitance test between points to be tested of the tested electronic and electric equipment, and the capacitance of the components or the capacitance of the two wires are arranged between the points to be tested.
5. The system according to claim 1, wherein: when the analyzed instruction content shows that the on, resistance, diode, relay and voltage, current and capacitance tests are executed, determining a tested starting point from the analyzed content, and when the tested starting point is an odd number, switching on the odd number double-pole single-throw switch connected with the tested starting point to realize the connection between the tested starting point and W1; when the measured starting point is an even number, a double-pole single-throw switch corresponding to the even number minus 1 connected with the measured starting point is turned on, so that the connection between the measured starting point and W2 is realized;
Determining a tested termination point of a corresponding test from the analyzed content, when the tested termination point is an odd number, switching on a double-pole single-throw switch corresponding to the number +1 of the tested termination point, and connecting the tested termination point to the analog test bus W4; when the measured termination point is even, the double-pole single-throw switch with the same number as the measured termination point is turned on, and the measured termination point is connected to the analog test bus W3.
6. The system according to claim 1 or 2, characterized in that: the excitation output unit comprises k isolated DC/DC and m groups of double-pole single-throw switches, and each group of double-pole single-throw switches comprises k double-pole single-throw switches;
the 1 point and 3 points of each double-pole single-throw switch are the movable contacts, the fixed contact corresponding to the 1 point is recorded as 2 points, and the other fixed contact is 4 points;
Each isolated DC/DC is used to convert the input voltage into an isolated demand power source; the positive end and the ground end of the converted required power supply respectively form one path of driving output through a group of double-pole single-throw switches, and each path of driving output comprises a driving output positive end CH+ and a driving output ground end CHG;
the 1 and 3 points of the k double-pole single-throw switches in each group are respectively connected to the power bus, the 2 points are commonly connected to the driving output positive end CH+ of the path, and the 4 points are commonly connected to the driving output ground end CHG of the path.
7. The system according to claim 1, wherein: when the test system is portable, selecting 2 from N or 4, selecting 2 from M; when the test system is distributed and centralized, N is 16 and M is 8.
8. The system according to claim 1, wherein: the system also comprises a collecting cable for collecting the input and output ports of the selective access module and the excitation output module to the interface; the interface adopts a round connector or a rectangular connector with a locking device and an error preventing function.
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