CN113484613A - Secondary open circuit principle-based dielectric loss and capacitance testing method for current transformer - Google Patents
Secondary open circuit principle-based dielectric loss and capacitance testing method for current transformer Download PDFInfo
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- CN113484613A CN113484613A CN202110565031.1A CN202110565031A CN113484613A CN 113484613 A CN113484613 A CN 113484613A CN 202110565031 A CN202110565031 A CN 202110565031A CN 113484613 A CN113484613 A CN 113484613A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- Testing Relating To Insulation (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention provides a method for testing dielectric loss and capacitance of a current transformer based on a secondary open circuit principle, and relates to the technical field of high voltage. The method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle comprises the following steps: s1, testing dielectric loss and capacitance of the current transformer based on the reverse wiring test; s2, testing dielectric loss and capacitance of the current transformer based on the positive wiring test; and S3, whether the measurement is carried out in a positive connection mode or a reverse connection mode, the judgment of the state needs comparison of historical data under the same test condition, if the comparison is carried out from the new installation, the detection is carried out according to a secondary open circuit method, and the state of the current transformer can be correctly evaluated according to the test data of the previous times. According to the method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle, secondary operation is not needed in the process of testing dielectric loss and capacitance of the current transformer, and therefore working efficiency is greatly improved.
Description
Technical Field
The invention relates to the technical field of high voltage, in particular to a method for testing dielectric loss and capacitance of a current transformer based on a secondary open circuit principle.
Background
The current transformer is widely applied to substations of various voltage levels and used for metering and protecting power equipment, so that the fault probability of the power equipment is reduced, and the loss of electric energy is avoided. In the process of pre-testing new equipment, dielectric loss and capacitance of the oil-filled or inflatable current transformer are used as test items which need to be developed, and the quality of an insulating medium in the current transformer can be effectively detected. Before the new current transformer is installed, the secondary terminal is in an open circuit state, and testers need to short and ground the secondary terminal. Therefore, it is highly desirable to research the dielectric loss and capacitance test method of the current transformer with the open secondary side
In summary, the research and development of a method for testing dielectric loss and capacitance of a current transformer based on the secondary open circuit principle still remains a key problem to be solved urgently in the technical field of high voltage.
Disclosure of Invention
The invention aims to provide a method for testing dielectric loss and capacitance of a current transformer based on a secondary open circuit principle, and solves the problems in the background art.
In order to achieve the purpose, the invention is realized by the following technical scheme: the method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle comprises the following operation steps:
s1, testing dielectric loss and capacitance of the current transformer based on the reverse wiring test;
s2, testing dielectric loss and capacitance of the current transformer based on the positive wiring test;
and S3, whether the measurement is carried out in a positive connection mode or a reverse connection mode, the judgment of the state needs comparison of historical data under the same test condition, if the comparison is carried out from the new installation, the detection is carried out according to a secondary open circuit method, and the state of the current transformer can be correctly evaluated according to the test data of the previous times.
Further, in the operation step of S1, the method includes the following steps:
s101, a dielectric loss and capacitance can be tested by the current transformer without a tail screen or a ground screen by using a reverse wiring method;
s102, disconnecting all secondary terminals, and opening all the secondary terminals without any operation;
s103, starting the dielectric loss tester, and detecting the reverse connection wire by 10kV to obtain dielectric loss and capacitance data.
Further, in the operation step of S2, the method includes the following steps:
s201, a current transformer with a tail screen or a ground screen can test dielectric loss and capacitance by using a positive wiring method;
s202, disconnecting all secondary terminals, and opening all the secondary terminals without any operation;
s203, starting the dielectric loss tester, and detecting the positive connection line 10kV to obtain dielectric loss and capacitance data.
Furthermore, a high-voltage wire of the dielectric loss tester is added at one end of the P and S of the current transformer.
Furthermore, the test needs to be carried out under the condition of good weather, and the insulation capacitance of the secondary coil to the ground is small.
Furthermore, the primary coil has small insulation capacitance to the secondary coil, and capacitance error and dielectric loss error are not counted.
The invention provides a method for testing dielectric loss and capacitance of a current transformer based on a secondary open circuit principle. The method has the following beneficial effects:
the invention comprises the following steps: the secondary operation is not needed in the process of testing the dielectric loss and the capacitance of the current transformer, so that the working efficiency is greatly improved.
Drawings
FIG. 1 is a dielectric loss and capacitance test chart of a current transformer for reverse wiring test according to the present invention;
FIG. 2 is a diagram of the dielectric loss and capacitance test of the current transformer for the positive wiring test according to the present invention;
FIG. 3 is a circuit equivalent model diagram of a secondary open circuit testing method compared with a secondary short circuit grounding method under the condition of the positive wiring test of the present invention;
FIG. 4 is a circuit equivalent model diagram of a secondary open circuit testing method compared with a secondary short circuit grounding method under the condition of reverse wiring testing according to the present invention.
Detailed Description
As shown in fig. 1-4: the method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle comprises the following steps:
step one, testing dielectric loss and capacitance of the current transformer based on a reverse wiring test (as shown in figure 1):
1) the current transformer without the end screen or the ground screen can test dielectric loss and capacitance by using a reverse wiring method;
2) all secondary terminals are disconnected, and the secondary terminals are all opened, so that any operation is not needed;
3) and starting the dielectric loss tester, and detecting the reverse connection wire by 10kV to obtain dielectric loss and capacitance data.
Step two, testing dielectric loss and capacitance of the current transformer based on the positive wiring test (as shown in fig. 2):
1) the current transformer with the end screen or the ground screen can test dielectric loss and capacitance by using a positive wiring method;
2) all secondary terminals are disconnected, and the secondary terminals are all opened, so that any operation is not needed;
3) and starting the dielectric loss tester, and detecting the positive connection line by 10kV to obtain dielectric loss and capacitance data.
And step three, whether the measurement is carried out in a positive connection mode or a reverse connection mode, the judgment of the state needs comparison of historical data under the same test condition, if the comparison is carried out from the new installation, the detection is carried out according to a secondary open circuit method, and the state of the current transformer can be correctly evaluated according to the test data of the previous times.
The reason why the double open circuit test method is possible is explained as follows: because the high-voltage wire of the dielectric loss tester is only added at one end of the P or S of the current transformer, a current loop cannot be formed, no current flows at the primary coil side, namely no exciting current, and no coupling magnetic field is formed at the iron core, therefore, no induced electromotive force exists at the secondary side, namely, the primary side and the secondary side are wound on the same iron core, but no magnetic field is coupled.
The dielectric loss and capacitance amplitude of the secondary open circuit testing method under the positive wiring testing condition is different from that of the secondary short circuit grounding method, and a circuit equivalent model is shown in figure 3: the insulation of the primary coil to the secondary coil is not included in the dielectric loss and capacitance test loop.
The dielectric loss and capacitance amplitude of the secondary open circuit testing method under the condition of the reverse wiring test is different from that of the secondary short circuit grounding method, and a circuit equivalent model is shown in figure 4: according to the national grid company transformation detection and management regulations: the test is carried out under the condition of good weather, so the insulation capacitance of the secondary coil to the ground is small; in addition, the insulation capacitance of the primary coil to the secondary coil is very small, so that capacitance error and dielectric loss error can be ignored, and the method has field application value.
The above is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, many variations and modifications can be made without departing from the inventive concept of the present invention, which falls into the protection scope of the present invention.
Claims (6)
1. The method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle is characterized by comprising the following operation steps of:
s1, testing dielectric loss and capacitance of the current transformer based on the reverse wiring test;
s2, testing dielectric loss and capacitance of the current transformer based on the positive wiring test;
and S3, whether the measurement is carried out in a positive connection mode or a reverse connection mode, the judgment of the state needs comparison of historical data under the same test condition, if the comparison is carried out from the new installation, the detection is carried out according to a secondary open circuit method, and the state of the current transformer can be correctly evaluated according to the test data of the previous times.
2. The method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle according to claim 1, wherein: in the operation step of S1, the method includes the steps of:
s101, a dielectric loss and capacitance can be tested by the current transformer without a tail screen or a ground screen by using a reverse wiring method;
s102, disconnecting all secondary terminals, and opening all the secondary terminals without any operation;
s103, starting the dielectric loss tester, and detecting the reverse connection wire by 10kV to obtain dielectric loss and capacitance data.
3. The method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle according to claim 2, is characterized in that: in the operation step of S2, the method includes the steps of:
s201, a current transformer with a tail screen or a ground screen can test dielectric loss and capacitance by using a positive wiring method;
s202, disconnecting all secondary terminals, and opening all the secondary terminals without any operation;
s203, starting the dielectric loss tester, and detecting the positive connection line 10kV to obtain dielectric loss and capacitance data.
4. The method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle according to claim 1, wherein: the high-voltage wire of the dielectric loss tester is added at one end of the P and S of the current transformer.
5. The method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle according to claim 1, wherein: the test is carried out under the condition of good weather, and the insulation capacitance of the secondary coil to the ground is small.
6. The method for testing dielectric loss and capacitance of the current transformer based on the secondary open circuit principle according to claim 1, wherein: the primary coil has small insulation capacitance to the secondary coil, and capacitance error and dielectric loss error are not counted.
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| CN202110565031.1A CN113484613A (en) | 2021-05-24 | 2021-05-24 | Secondary open circuit principle-based dielectric loss and capacitance testing method for current transformer |
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| CN202110565031.1A CN113484613A (en) | 2021-05-24 | 2021-05-24 | Secondary open circuit principle-based dielectric loss and capacitance testing method for current transformer |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101149416A (en) * | 2007-11-15 | 2008-03-26 | 上海交通大学 | Power cable insulation state monitoring and life span management system |
| CN202421421U (en) * | 2011-11-30 | 2012-09-05 | 北京光耀电力自动化有限公司 | Insulating-performance online monitoring device of capacitive high-voltage electrical equipment |
| CN102662110A (en) * | 2012-04-18 | 2012-09-12 | 河南省电力公司南阳供电公司 | Method for testing dielectric loss and capacitance of capacitance type voltage transformer |
| CN206038774U (en) * | 2016-08-31 | 2017-03-22 | 北京太格时代自动化系统设备有限公司 | Be situated between and decrease tester |
| CN112001616A (en) * | 2020-08-14 | 2020-11-27 | 广东电网有限责任公司 | CVT state evaluation system and method |
-
2021
- 2021-05-24 CN CN202110565031.1A patent/CN113484613A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101149416A (en) * | 2007-11-15 | 2008-03-26 | 上海交通大学 | Power cable insulation state monitoring and life span management system |
| CN202421421U (en) * | 2011-11-30 | 2012-09-05 | 北京光耀电力自动化有限公司 | Insulating-performance online monitoring device of capacitive high-voltage electrical equipment |
| CN102662110A (en) * | 2012-04-18 | 2012-09-12 | 河南省电力公司南阳供电公司 | Method for testing dielectric loss and capacitance of capacitance type voltage transformer |
| CN206038774U (en) * | 2016-08-31 | 2017-03-22 | 北京太格时代自动化系统设备有限公司 | Be situated between and decrease tester |
| CN112001616A (en) * | 2020-08-14 | 2020-11-27 | 广东电网有限责任公司 | CVT state evaluation system and method |
Non-Patent Citations (1)
| Title |
|---|
| 郝瑞峰: "750kV电容式电压互感器的介损及变比测量", 《科技资讯》, no. 20, pages 109 * |
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