CN113466592A - Power unit's test system - Google Patents

Power unit's test system Download PDF

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Publication number
CN113466592A
CN113466592A CN202110764328.0A CN202110764328A CN113466592A CN 113466592 A CN113466592 A CN 113466592A CN 202110764328 A CN202110764328 A CN 202110764328A CN 113466592 A CN113466592 A CN 113466592A
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China
Prior art keywords
power unit
power
voltage
test
voltage regulator
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Pending
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CN202110764328.0A
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Chinese (zh)
Inventor
王俊杰
李军
徐晓彬
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HANGZHOU FIRSTACK TECHNOLOGY CO LTD
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HANGZHOU FIRSTACK TECHNOLOGY CO LTD
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Priority to CN202110764328.0A priority Critical patent/CN113466592A/en
Publication of CN113466592A publication Critical patent/CN113466592A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/003Environmental or reliability tests

Abstract

The present application provides a test system for a power unit, comprising: the power unit is a device to be tested, in the aging test of the power unit, three-phase power of a power grid is transmitted to the primary side of the voltage regulator, the output voltage of the secondary side of the voltage regulator is regulated, expected direct-current voltage is obtained after the output voltage passes through the rectifying circuit, and the direct-current voltage is respectively transmitted to the direct-current sides of the power unit; the control system sends an instruction to the power unit, and the power unit works in a specific modulation mode; the output end of the power unit is connected with a load. The power unit test system provided by the application takes the power unit as a test object, and can be suitable for aging tests of different output voltages or different numbers of power units.

Description

Power unit's test system
Technical Field
The application relates to the technical field of power electronics, in particular to a test system of a power unit, which is suitable for aging tests of different power units.
Background
Before the wind power converter, the photovoltaic inverter, the frequency converter and other power electronic equipment (hereinafter referred to as equipment) are put into operation formally, aging tests for a certain period of time are required to verify the reliability of the equipment in long-time operation. For mature products, the aging test selects a certain proportion (e.g., 10% or 20%) of the total product. Aging tests are essential for brand new designed products, or for mature products, with improved, optimized products. Only the products which are subjected to aging test and qualified can be formally put into the market and used in the field of customers. In the above devices, the most core, most critical part is the power unit. As long as the operational reliability of the power unit is guaranteed, the operational reliability of the device can generally be guaranteed as well. Therefore, the burn-in test of the device is, to a large extent, a burn-in test of the power unit.
Currently, the burn-in test for power cells has several problems: firstly, a set of test system is only suitable for one product, if the direct current voltage or alternating current output voltage of the product is changed, test equipment needs to be replaced, and therefore the application range of the test system is limited; secondly, because the test system contains a plurality of devices, a large amount of active loss and reactive loss can be generated, and a large amount of electric energy is consumed; in addition, many parts are installed in the device, and if a certain part fails, the test of the power unit is affected, so that the efficiency of the burn-in test is reduced.
Disclosure of Invention
The application provides a test system of a power unit, which takes the power unit as a test object and is suitable for aging tests of power units with different output voltages or different quantities.
In order to achieve the above object, the present application provides the following technical solutions:
a test system for a power cell, comprising: voltage regulator, rectifier circuit, load, control system and power unit, the power unit is the equipment that awaits measuring, wherein:
the primary side of the voltage regulator is connected with a power grid, the secondary side of the voltage regulator is connected with the first end of the rectifying circuit, and the control end of the voltage regulator is connected with the first control end of the control system;
the second end of the rectifying circuit is connected with the second control end of the control system, and the third end of the rectifying circuit is respectively connected with the first end of the power unit; the third control end of the control system is respectively connected with the second end of the power unit; the output ends of the power units are respectively connected with the loads;
in the aging test of the power unit, the three-phase power of the power grid is transmitted to the primary side of the voltage regulator, the output voltage of the secondary side of the voltage regulator is regulated, after passing through the rectifier circuit, the expected direct current voltage is obtained, and the direct current voltage is respectively transmitted to the direct current sides of the power unit; the control system sends an instruction to the power unit, and the power unit works in a specific modulation mode; and the output end of the power unit supplies power to the load.
When the alternating current output voltage of the power unit changes, the direct current voltage of the power unit correspondingly changes, and the expected direct current voltage is obtained by adjusting the output voltage of the voltage regulator and rectifying the output voltage through the rectifying circuit so as to realize the aging test of the power unit under the changed voltage.
When the number of the power units to be tested is changed, the primary electrical connection schematic diagram of the test system is correspondingly adjusted, so that the test requirement can be met, and the purpose of simultaneously carrying out aging test on the power units with different numbers is achieved.
The present application describes a power unit test system, comprising: the power unit is a device to be tested, in the aging test of the power unit, three-phase power of a power grid is transmitted to the primary side of the voltage regulator, the output voltage of the secondary side of the voltage regulator is regulated, expected direct-current voltage is obtained after the output voltage passes through the rectifying circuit, and the direct-current voltage is respectively transmitted to the direct-current sides of the power unit; the control system sends an instruction to the power unit, and the power unit works in a specific modulation mode; the output end of the power unit is connected with a load. The power unit test system provided by the application takes the power unit as a test object, and can be suitable for aging tests of different output voltages or different numbers of power units.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is an electrical schematic diagram of an exemplary power cell disclosed in the prior art;
FIG. 2 is a schematic diagram of a testing system for photovoltaic inverters as disclosed in the prior art;
FIG. 3 is a schematic diagram of a system for testing a power unit according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram of a system for testing three power units according to an embodiment of the present disclosure;
FIG. 5 is a schematic diagram of a power unit testing system (omitting a control system) according to an embodiment of the present disclosure;
FIG. 6 is a schematic diagram of a test system for two power units (omitting a control system) disclosed in an embodiment of the present application;
fig. 7 is a schematic diagram of a six-power-unit test system (omitting a control system) disclosed in an embodiment of the present application.
Detailed Description
In the research of the applicant, taking the electrical schematic diagram of the typical power unit shown in fig. 1 as an example, T1, T2 are semiconductor switching devices, a driving circuit provides driving signals for T1 and T2, C1 is a supporting capacitor, and T1, T2, C1, DC +, DC-, AC are connected through a bus (such as a laminated busbar, a copper bar, a cable, etc.).
For example, an aging test system of a photovoltaic inverter is generally shown in fig. 2. The test system consists of test equipment, a transformer 1, a transformer 2 and a control system. In fig. 2, a "test sample" is a photovoltaic inverter to be tested, and includes the power unit, the dc filter circuit, the ac filter circuit, the switching device, the control protection sampling circuit, and the like shown in fig. 1. The "test device" may be the same device as the "test article" or may be a device functionally equivalent thereto. In the aging test, a control system sends instructions to a test article and test equipment, the test article and the test equipment run in a dragging mode, the test article is in a rectification or inversion working state, correspondingly, the test equipment is in an inversion or rectification working state, positive and negative ends of direct current sides of the test article and the test equipment are respectively connected, an alternating current side of the test article and the test equipment is respectively connected to one side of a transformer 1 (the transformer 1 is a double-split transformer), and then the test article and the test equipment are connected with a power grid through a transformer 2. Energy flows between the "test article", the "test device" and the "transformer 1". If all the elements are ideal elements, no loss occurs, and the current will flow all the time, but in reality, no ideal elements exist, so that after the current flows through the 2 windings of the "test sample", "test equipment" and "transformer 1", the loss occurs in each element, and the loss is dissipated as heat. How to not supplement energy, the capacitance voltage of the test sample is reduced, and the aging test cannot be normally carried out. Therefore, the losses generated during the test need to be supplemented by the grid through the "transformer 2".
Thus, the applicant can determine in the research that the conventional aging test system has the following disadvantages: 1) in the aging test process, a test system contains a plurality of devices, so that a large amount of active loss and reactive loss can be generated, and a large amount of electric energy is consumed; 2) the set of test system is only suitable for one test article, if the direct current voltage or alternating current output voltage of the test article is changed, the test equipment and the transformer 1 (or the transformer 2) need to be replaced, and the application range of the test system is limited; 3) the power unit is aged in the form of the device after the device is installed. If only the power unit needs to be tested, the equipment is not tested, and the test cannot be realized; 4) many parts are installed in the equipment. If a certain component (such as a certain element in a direct current filter circuit and an alternating current filter circuit) fails, the test of the power unit is affected, and the efficiency of the aging test is reduced.
Therefore, the power unit testing system is provided, the power unit is used as a testing object, and the power unit testing system is suitable for aging tests of different output voltages or different numbers of power units.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 3, a schematic diagram of a system for testing a power unit according to an embodiment of the present disclosure is shown. As shown in fig. 3, an embodiment of the present application provides a test system for a power unit, the system including: the voltage regulator 2, the rectifying circuit 3, the load 5, the control system 4, and a plurality of power unit (1, … …, N) power units are devices to be tested, wherein:
the primary side of the voltage regulator 2 is connected with the power grid 1, the secondary side of the voltage regulator 2 is connected with the first end of the rectifying circuit 3, and the control end of the voltage regulator 2 is connected with the first control end of the control system 4; the second end of the rectifying circuit 3 is connected with the second control end of the control system 4, and the third end of the rectifying circuit 3 is respectively connected with the first end of the power unit (1, … …, N); the third control ends of the control system 4 are respectively connected with the second ends of the power units (1, … …, N); the output terminals of the power units (1, … …, N) are respectively connected with the load 5.
The power unit (1, … …, N) is a test article to be tested, in the aging test of the power unit, the three-phase power of the power grid 1 is transmitted to the primary side of the voltage regulator 2, the output voltage of the secondary side of the voltage regulator 2 is regulated, after passing through the rectifier circuit 3, the expected direct current voltage is obtained, and the direct current voltage is transmitted to the direct current sides of the power unit (1, … …, N) respectively; the control system 4 issues instructions to the power unit (1, … …, N), the power unit (1, … …, N) operating under a specific modulation mode (e.g. SPWM, SVPWM, DPWM, etc.); the output of the power unit (1, … …, N) supplies the load 5.
In the embodiment of the present application, the primary side of the voltage regulator is connected to the power grid, and the voltage is constant; the secondary side is connected with a rectifying circuit, and the voltage is adjustable. The voltage regulation mode is various, such as changing the number of coils of a secondary winding of the transformer or changing the coupling magnetic flux of the primary winding and the secondary winding. The control system can adjust the secondary output voltage of the voltage regulator according to the parameter setting requirement, and the requirement of a normal aging test is met.
Furthermore, when the alternating current output voltage of the power unit changes, the direct current voltage of the power unit correspondingly changes, and the expected direct current voltage is obtained by adjusting the output voltage of the voltage regulator and rectifying the output voltage through the rectifying circuit, so that the power unit can perform aging test under the changed voltage.
Further, when the number of the power units to be tested changes, the primary electrical connection schematic diagram of the test system is correspondingly adjusted, so that the test requirements can be met, as shown in fig. 4-7 (omitting the control system), and the purpose of simultaneously performing aging tests on different numbers of power units is achieved. When different numbers of power units are subjected to aging tests, the command of the control system needs to be correspondingly adjusted so as to ensure the smooth development of the aging tests.
It should be noted that, in the embodiment of the present application, when different numbers of power units are subjected to burn-in tests, the primary electrical connection schematic diagram of the system needs to be adjusted accordingly (as shown in fig. 4, 5, 6, and 7). The different power cells are not in the same operating state all the time during the test, but are an organic whole. And after the number of the power units is changed, the working modes need to be changed correspondingly, and the commands of the control system also need to be adjusted correspondingly so that the power units can continue to carry out the aging test in the new working mode.
Further, it should be noted that, in the embodiment of the present application, the load has multiple implementation manners, and specifically, an embodiment of the load is a reactor. In the aging test, the reactor only transmits reactive power and does not generate active power.
The test system of a power unit that this application embodiment provided includes: the power unit is a device to be tested, in the aging test of the power unit, three-phase power of a power grid is transmitted to the primary side of the voltage regulator, the output voltage of the secondary side of the voltage regulator is regulated, after passing through the rectifying circuit, expected direct current voltage is obtained, and the direct current voltage is respectively transmitted to the direct current sides of the power unit; the control system sends an instruction to the power unit, and the power unit works in a specific modulation mode; the output end of the power unit is connected with a load. The power unit test system provided by the embodiment of the application takes the power unit as a test object, and can be suitable for the aging test of different output voltages or different numbers of power units.
It is to be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or apparatus that comprises the element.
The above are merely examples of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

Claims (3)

1. A system for testing a power cell, comprising: voltage regulator, rectifier circuit, load, control system and power unit, the power unit is the equipment that awaits measuring, wherein:
the primary side of the voltage regulator is connected with a power grid, the secondary side of the voltage regulator is connected with the first end of the rectifying circuit, and the control end of the voltage regulator is connected with the first control end of the control system;
the second end of the rectifying circuit is connected with the second control end of the control system, and the third end of the rectifying circuit is respectively connected with the first end of the power unit; the third control end of the control system is respectively connected with the second end of the power unit; the output ends of the power units are respectively connected with the loads;
in the aging test of the power unit, the three-phase power of the power grid is transmitted to the primary side of the voltage regulator, the output voltage of the secondary side of the voltage regulator is regulated, after passing through the rectifier circuit, the expected direct current voltage is obtained, and the direct current voltage is respectively transmitted to the direct current sides of the power unit; the control system sends an instruction to the power unit, and the power unit works in a specific modulation mode; and the output end of the power unit supplies power to the load.
2. The test system of claim 1, wherein when the ac output voltage of the power unit varies, the dc voltage of the power unit varies accordingly, and the output voltage of the voltage regulator is adjusted to obtain a desired dc voltage after being rectified by the rectifier circuit, so as to implement the aging test of the power unit under the varied voltage.
3. The test system of claim 1, wherein when the number of the power units to be tested is changed, the test requirement can be met by correspondingly adjusting the primary electrical connection schematic diagram of the test system, so as to achieve the purpose of aging test of different numbers of power units simultaneously.
CN202110764328.0A 2021-07-06 2021-07-06 Power unit's test system Pending CN113466592A (en)

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CN202110764328.0A CN113466592A (en) 2021-07-06 2021-07-06 Power unit's test system

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114646407A (en) * 2022-05-20 2022-06-21 深圳众城卓越科技有限公司 Reactor thermal test circuit and thermal test method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109633300A (en) * 2018-11-30 2019-04-16 北京电力自动化设备有限公司 High-voltage chain type SVG power cell full power degradation system and method
CN113064003A (en) * 2021-03-18 2021-07-02 株洲中车时代电气股份有限公司 Three-level power module accelerated aging test system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109633300A (en) * 2018-11-30 2019-04-16 北京电力自动化设备有限公司 High-voltage chain type SVG power cell full power degradation system and method
CN113064003A (en) * 2021-03-18 2021-07-02 株洲中车时代电气股份有限公司 Three-level power module accelerated aging test system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114646407A (en) * 2022-05-20 2022-06-21 深圳众城卓越科技有限公司 Reactor thermal test circuit and thermal test method

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Address after: 311100 Floor 2, Building 1, No. 96, Longchuanwu Road, Donghu Street, Linping District, Hangzhou, Zhejiang

Applicant after: Hangzhou Feishide Technology Co.,Ltd.

Address before: 311100 2 / F, building 1, No. 96, longchuanwu Road, Donghu street, Yuhang District, Hangzhou City, Zhejiang Province

Applicant before: HANGZHOU FIRSTACK TECHNOLOGY Co.,Ltd.