CN113448786A - PCIe equipment testing method, device, equipment and readable storage medium - Google Patents
PCIe equipment testing method, device, equipment and readable storage medium Download PDFInfo
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
Abstract
The invention discloses a PCIe equipment testing method, which comprises the following steps: acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device; determining the PCIe equipment actual deployment information by combining the hardware in-place information and the basic in-place information; calling a preset PCIe device configuration table; and testing each PCIe device according to the PCIe device configuration table based on the PCIe device actual deployment information. By applying the PCIe equipment testing method provided by the invention, the success rate of PCIe equipment inspection is improved, the false information report rate is reduced, and the testing efficiency is improved. The invention also discloses a PCIe equipment testing device, equipment and a storage medium, and has corresponding technical effects.
Description
Technical Field
The present invention relates to the field of computer application technologies, and in particular, to a PCIe device testing method, apparatus, device, and computer-readable storage medium.
Background
In the product development process, especially in the hardware development process, in order to avoid various problems caused by PCIe device loss or insufficient resource allocation in the system, PCIe devices in the system need to be tested, and whether resource reservation is correct is tested.
The existing testing method for PCIe equipment is mainly divided into two types, one is to use a manual mode to test; the other is to perform resource checking on the PCIe devices inherent in the system. However, both of the above test methods have their own disadvantages. Firstly, the manual testing method is time-consuming in testing due to the fact that the PCIe devices in the system are more in variety and PCIe resource allocation is different. Secondly, the testing method for the resource check of the inherent PCIe device in the system can cause the PCIe device to be failed in check and generate information misinformation due to the fact that the PCIe device is replaced according to actual requirements due to the pluggable property of certain slots.
In summary, how to effectively solve the problems of long test time consumption, failure of PCIe device inspection, easy generation of information false alarm, and the like is a problem that needs to be solved by those skilled in the art at present.
Disclosure of Invention
The invention aims to provide a PCIe equipment testing method, which improves the success rate of PCIe equipment inspection, reduces the false information report rate and improves the testing efficiency; another object of the present invention is to provide a PCIe device test apparatus, a device, and a computer readable storage medium.
In order to solve the technical problems, the invention provides the following technical scheme:
a PCIe device test method, comprising:
acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device;
determining PCIe equipment actual deployment information by combining the hardware in-place information and the basic in-place information;
calling a preset PCIe device configuration table;
and testing each PCIe device according to the PCIe device configuration table based on the PCIe device actual deployment information.
In a specific embodiment of the present invention, determining PCIe device actual deployment information by combining each piece of hardware in-place information and each piece of basic in-place information includes:
determining each target slot in an in-place state according to the in-place information of each hardware;
determining the number of head slots and slots in a slot group occupied by each PCIe device according to each basic in-place information;
acquiring socket numbers corresponding to the head sockets respectively;
determining the corresponding relation between each head slot and each target slot according to each slot number;
and determining the actual deployment information of the PCIe equipment according to the corresponding relation and the number of the slots.
In a specific embodiment of the present invention, the testing each PCIe device according to the PCIe device configuration table includes:
acquiring a project to be tested;
acquiring target actual parameters respectively corresponding to the PCIe devices according to the items to be tested;
searching a target standard parameter corresponding to the item to be tested from the PCIe equipment configuration table;
judging whether each target actual parameter is consistent with the target standard parameter;
if so, determining that the test result is that each PCIe device meets the test requirement;
if not, determining that the PCIe equipment does not meet the test requirement as a test result.
In a specific embodiment of the present invention, after determining that the test result is that there is a PCIe device that does not meet the test requirement, the method further includes:
acquiring a target fault type of PCIe equipment which does not meet the test requirement;
when the target fault type is a recoverable type, automatically recovering PCIe equipment which does not meet the test requirement;
and outputting equipment maintenance prompt information when the target fault type is an unrecoverable type.
In one embodiment of the present invention, performing an automatic recovery operation on a PCIe device that does not meet a test requirement includes:
automatic recovery operations are performed for PCIe devices that do not meet test requirements by performing a system restart or retraining.
In one embodiment of the present invention, the method further comprises:
and logging the test result.
In one embodiment of the present invention, the method further comprises:
and outputting and displaying the test result.
A PCIe device test apparatus, comprising:
the in-place information acquisition module is used for acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device;
the deployment information determining module is used for determining the actual deployment information of the PCIe equipment by combining the in-place information of each piece of hardware and the basic in-place information of each piece of hardware;
the configuration table calling module is used for calling a preset PCIe device configuration table;
and the equipment testing module is used for testing each PCIe equipment according to the PCIe equipment configuration table based on the PCIe equipment actual deployment information.
A PCIe device test apparatus comprising:
a memory for storing a computer program;
a processor for implementing the steps of the PCIe device testing method as described above when executing the computer program.
A computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the PCIe device testing method as previously described.
The PCIe equipment testing method provided by the invention obtains hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe equipment; determining the PCIe equipment actual deployment information by combining the hardware in-place information and the basic in-place information; calling a preset PCIe device configuration table; and testing each PCIe device according to the PCIe device configuration table based on the PCIe device actual deployment information.
According to the technical scheme, the actual deployment information of the PCIe devices in the slots can be determined by acquiring the hardware in-place information of the slots and the basic in-place information of the PCIe devices and combining the hardware in-place information and the basic in-place information, so that the specific distribution condition of the PCIe devices in the slots is obtained, the failure of acquiring the insertion condition of the PCIe devices in a certain slot is avoided, the success rate of PCIe device inspection is improved, and the false information report rate is reduced. Compared with a manual testing method, the testing time consumption is greatly reduced, and the testing efficiency is improved.
Correspondingly, the invention also provides a PCIe device testing device, equipment and a computer readable storage medium corresponding to the PCIe device testing method, which have the technical effects and are not described herein again.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a flowchart illustrating an embodiment of a method for testing a PCIe device;
FIG. 2 is a flowchart of another embodiment of a method for testing a PCIe device in an embodiment of the invention;
FIG. 3 is a block diagram of a PCIe device testing apparatus according to an embodiment of the present invention;
FIG. 4 is a block diagram of a PCIe device test equipment in an embodiment of the invention;
fig. 5 is a schematic structural diagram of a PCIe device test apparatus provided in this embodiment.
Detailed Description
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a flowchart of an implementation of a PCIe device testing method in an embodiment of the present invention, where the method may include the following steps:
s101: and acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device.
When the PCIe equipment is tested, the slots are checked to obtain hardware in-place information corresponding to the slots respectively, so that which slots are in-place states and which are not in-place states are determined. And obtaining the basic in-place information corresponding to the PCIe devices, where the basic in-place information of the PCIe devices may include transmission channel types of the PCIe devices, such as X8 and X16, and may also include header slot numbers occupied by the PCIe devices. For example, when the PCIe device transport channel type is X16 and the slot is X8, the PCIe device will occupy two slots.
S102: and determining the PCIe device actual deployment information by combining the hardware in-place information and the basic in-place information.
After hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device are obtained, the PCIe device actual deployment information is determined by combining the hardware in-place information and the basic in-place information.
For example, when the PCIe device transmission channel type is X16 and the slot is X8, only the head slot of the two slots occupied by the PCIe device is in an in-place state, and the other slot except the head slot is in an out-of-place state, so that only checking the slot may not check whether the second slot is occupied, and therefore, information acquisition cannot be performed on the PCIe device carried by the second slot, resulting in failure of PCIe device checking, and false information notification is generated. On the basis of acquiring hardware in-place information corresponding to each slot, basic in-place information corresponding to each PCIe device is further combined, namely, a head slot number occupied by each PCIe device, a transmission channel type of the PCIe device and a channel type of the slot are combined, the occupied corresponding relation between each slot and each PCIe device is determined, and the information on the relevant slot is ensured to be correct, so that the actual deployment information of the PCIe device is determined, the misinformation that the slot state information cannot be inquired and the like due to the fact that one PCIe device shares a plurality of slots is avoided, and the reliability of the test is ensured.
S103: and calling a preset PCIe device configuration table.
And presetting a PCIe device configuration table, wherein the PCIe device configuration table comprises various parameter standards required to be met by the PCIe device to be tested. And after the PCIe device actual deployment information is determined, a preset PCIe device configuration table is called.
S104: and testing each PCIe device according to the PCIe device configuration table based on the PCIe device actual deployment information.
And after the preset PCIe equipment configuration table is called, testing each PCIe equipment according to the PCIe equipment configuration table based on the PCIe equipment actual deployment information. If the parameter items to be tested can be selected from the PCIe equipment configuration table in advance, and the corresponding test items are tested based on the practical PCIe equipment deployment information, so that the integrity and the reserved resource size of the PCIe equipment can be tested.
According to the technical scheme, the actual deployment information of the PCIe devices in the slots can be determined by acquiring the hardware in-place information of the slots and the basic in-place information of the PCIe devices and combining the hardware in-place information and the basic in-place information, so that the specific distribution condition of the PCIe devices in the slots is obtained, the failure of acquiring the insertion condition of the PCIe devices in a certain slot is avoided, the success rate of PCIe device inspection is improved, and the false information report rate is reduced. Compared with a manual testing method, the testing time consumption is greatly reduced, and the testing efficiency is improved.
It should be noted that, based on the above embodiments, the embodiments of the present invention also provide corresponding improvements. In the following embodiments, steps that are the same as or correspond to those in the above embodiments may be referred to one another, and corresponding advantageous effects may also be referred to one another, which is not described in detail in the following modified embodiments.
Referring to fig. 2, fig. 2 is a flowchart of another implementation of a PCIe device testing method in the embodiment of the present invention, where the method may include the following steps:
s201: and acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device.
S202: and determining each target slot in the in-place state according to the in-place information of each hardware.
After hardware in-place information corresponding to each slot is obtained, each target slot in the in-place state is determined according to the hardware in-place information, and accordingly a head slot occupied by each PCIe device to be tested is determined.
S203: and determining the head slots and the number of slots in the slot group respectively occupied by each PCIe device according to each basic in-place information.
The basic in-place information corresponding to each PCIe device may include a head slot in the slot group occupied by each PCIe device, may further include a transmission channel type of the PCIe device, further calculate the number of slots occupied by each PCIe device according to the transmission channel type of the PCIe device and the channel type of the slot, and may also directly include the number of slots in the slot group occupied by each PCIe device in the basic in-place information corresponding to each PCIe device. After the basic in-place information corresponding to each PCIe device is obtained, the number of head slots and slots in the slot group occupied by each PCIe device is determined according to the basic in-place information.
S204: and acquiring the socket numbers corresponding to the head sockets respectively.
Each head slot may include slot number identification information, and after determining the head slots in the slot group occupied by each PCIe device, the slot numbers corresponding to the head slots are obtained.
S205: and determining the corresponding relation between each head slot and each target slot according to the number of each slot.
After the slot numbers corresponding to the head slots are obtained, the corresponding relation between the head slots and the target slots is determined according to the slot numbers. That is, it can be obtained which target slot in the in-place state corresponds to the head slot occupied by each PCIe device.
S206: and determining the actual deployment information of the PCIe equipment according to the corresponding relation and the number of the slots.
After the corresponding relation between each head slot and each target slot is determined, the PCIe device actual deployment information is determined according to the corresponding relation and the number of the slots, and which part of the PCIe device is respectively inserted into each slot can be obtained.
S207: and calling a preset PCIe device configuration table.
S208: and acquiring the items to be tested based on the actual deployment information of the PCIe equipment.
And presetting a to-be-tested project according to the test requirement on the PCIe equipment, and acquiring the to-be-tested project.
The items to be tested may include parameter information such as manufacturer, type, function, resource size, etc. of the PCIe device.
S209: and acquiring target actual parameters respectively corresponding to the PCIe devices according to the items to be tested.
After the items to be tested are obtained, target actual parameters corresponding to the PCIe devices are collected according to the items to be tested based on the PCIe device actual deployment information.
S210: and searching a target standard parameter corresponding to the item to be tested from the PCIe device configuration table.
After the items to be tested are obtained, the target standard parameters corresponding to the items to be tested are searched in the PCIe device configuration table, and therefore the reference standard for testing each target actual parameter is obtained.
S211: and judging whether each target actual parameter is consistent with the target standard parameter, if so, executing the step S212, and if not, executing the step S213.
After the target actual parameters corresponding to the PCIe devices are acquired and the target standard parameters are found, determining whether the target actual parameters are consistent with the target standard parameters, if yes, indicating that the target actual parameters of the PCIe devices all satisfy the test standard, executing step S212, and if not, indicating that the target actual parameters of the PCIe devices in the PCIe devices do not satisfy the test standard, and executing step S213.
S212: and determining that the test result indicates that each PCIe device meets the test requirement.
And when the target actual parameters are determined to be consistent with the target standard parameters, determining that the PCIe equipment meets the test requirements according to the test result.
S213: and determining that the PCIe equipment does not meet the test requirement as a test result.
And when the target actual parameters inconsistent with the target standard parameters exist in the target actual parameters, determining that the PCIe equipment does not meet the test requirement as a test result.
S214: and acquiring the target fault type of the PCIe equipment which does not meet the test requirement.
And after the testing result is determined that the PCIe equipment does not meet the testing requirement, acquiring the target fault type of the PCIe equipment which does not meet the testing requirement. For example, the target failure type may be classified into a recoverable failure type and an unrecoverable failure type.
S215: and when the target fault type is a recoverable type, performing automatic recovery operation on the PCIe equipment which does not meet the test requirement.
And when the target fault type is determined to be a recoverable type, performing automatic recovery operation on the PCIe equipment which does not meet the test requirement. The recoverable type generally belongs to the link problem, and can be automatically recovered by restarting and retraining the system.
In one embodiment of the present invention, step S215 may include the following steps:
automatic recovery operations are performed for PCIe devices that do not meet test requirements by performing a system restart or retraining.
And when the target fault type is determined to be a recoverable type, performing automatic recovery operation on the PCIe equipment which does not meet the test requirement by performing system restart or retraining. By retraining or restarting the system, the next check is continued, and by performing automatic recovery operation, the probability of misjudgment of the test result is reduced, and the test efficiency of the PCIe equipment is improved.
S216: and outputting equipment maintenance prompt information when the target fault type is an unrecoverable type.
And when the target fault type is an unrecoverable type, outputting equipment maintenance prompt information so as to remind operation and maintenance personnel to artificially correct the fault PCIe equipment.
The unrecoverable type of failure may include a failure due to an error in vendor, model information, etc. of the PCIe device. In addition, if the PCIe device determined as a recoverable type fails to recover the error after a predetermined number of times (e.g., three times) of error correction, the PCIe device continues to perform the next check by performing retraining or system restarting, and the error is converted into an unrecoverable error type.
S217: and logging the test result.
After the test results for each PCIe device are obtained, the test results are logged. For example, PCIe devices that meet the test requirements and PCIe devices that do not meet the requirements may be recorded in different logs, so that test results can be conveniently checked.
S218: and outputting and displaying the test result.
And after the test result is obtained, performing output display operation on the test result. If the PCIe equipment inspection result table can be established in advance, the test result is added into the PCIe equipment inspection result table, the PCIe equipment inspection result table is displayed back, the test result can be conveniently and directly checked,
corresponding to the above method embodiments, the present invention further provides a PCIe device testing apparatus, and the PCIe device testing apparatus described below and the PCIe device testing method described above may be referred to in correspondence to each other.
Referring to fig. 3, fig. 3 is a block diagram of a PCIe device testing apparatus in an embodiment of the present invention, where the apparatus may include:
an in-place information obtaining module 31, configured to obtain hardware in-place information corresponding to each slot and basic in-place information corresponding to each PCIe device;
the deployment information determining module 32 is configured to determine, by combining the hardware in-place information and the basic in-place information, actual deployment information of the PCIe device;
a configuration table retrieving module 33, configured to retrieve a preset PCIe device configuration table;
the device testing module 34 is configured to test each PCIe device according to the PCIe device configuration table based on the PCIe device actual deployment information.
According to the technical scheme, the actual deployment information of the PCIe devices in the slots can be determined by acquiring the hardware in-place information of the slots and the basic in-place information of the PCIe devices and combining the hardware in-place information and the basic in-place information, so that the specific distribution condition of the PCIe devices in the slots is obtained, the failure of acquiring the insertion condition of the PCIe devices in a certain slot is avoided, the success rate of PCIe device inspection is improved, and the false information report rate is reduced. Compared with a manual testing method, the testing time consumption is greatly reduced, and the testing efficiency is improved.
In a specific embodiment of the present invention, the deployment information determining module 32 includes:
the in-place state determining submodule is used for determining each target slot in the in-place state according to the in-place information of each hardware;
the slot occupation determining submodule is used for determining the number of head slots and slots in the slot group occupied by each PCIe device according to each basic in-place information;
the slot good acquisition submodule is used for acquiring slot numbers corresponding to all head slots respectively;
the corresponding relation determining submodule is used for determining the corresponding relation between each head slot and each target slot according to the number of each slot;
and the deployment information determining submodule is used for determining the actual deployment information of the PCIe equipment according to the corresponding relation and the number of the slots.
In one embodiment of the present invention, device testing module 34 includes:
the test item acquisition submodule is used for acquiring a to-be-tested item;
the actual parameter acquisition submodule is used for acquiring target actual parameters corresponding to the PCIe devices respectively according to the items to be tested;
the standard parameter searching submodule is used for searching a target standard parameter corresponding to the item to be tested from a PCIe equipment configuration table;
the judgment submodule is used for judging whether each target actual parameter is consistent with the target standard parameter;
the first test result determining submodule is used for determining that the PCIe equipment meets the test requirements when the target actual parameters are determined to be consistent with the target standard parameters;
and the second test result determining submodule is used for determining that the test result indicates that the PCIe equipment does not meet the test requirement when determining that target actual parameters inconsistent with the target standard parameters exist in all the target actual parameters.
In one embodiment of the present invention, the apparatus may further include:
the fault type acquisition module is used for acquiring a target fault type of the PCIe equipment which does not meet the test requirement after the test result is determined to be that the PCIe equipment does not meet the test requirement;
the automatic recovery module is used for carrying out automatic recovery operation on the PCIe equipment which does not meet the test requirement when the target fault type is a recoverable type;
and the information output module is used for outputting equipment maintenance prompt information when the target fault type is an unrecoverable type.
In a specific embodiment of the present invention, the automatic recovery module is specifically a module that performs an automatic recovery operation on PCIe devices that do not meet the test requirements by performing a system restart or retraining.
In one embodiment of the present invention, the apparatus may further include:
and the log recording module is used for carrying out log recording on the test result.
In one embodiment of the present invention, the apparatus may further include:
and the display module is used for outputting and displaying the test result.
Corresponding to the above method embodiment, referring to fig. 4, fig. 4 is a schematic diagram of a PCIe device test device provided in the present invention, where the device may include:
a memory 332 for storing a computer program;
the processor 322 is configured to implement the steps of the PCIe device testing method of the foregoing method embodiment when executing the computer program.
Specifically, referring to fig. 5, fig. 5 is a schematic diagram of a specific structure of a PCIe device testing apparatus provided in this embodiment, the PCIe device testing apparatus may generate a relatively large difference due to different configurations or performances, and may include a processor (CPU) 322 (for example, one or more processors) and a memory 332, where the memory 332 stores one or more computer applications 342 or data 344. Memory 332 may be, among other things, transient or persistent storage. The program stored in memory 332 may include one or more modules (not shown), each of which may include a sequence of instructions operating on a data processing device. Still further, processor 322 may be configured to communicate with memory 332 to execute a series of instruction operations in memory 332 on PCIe device test device 301.
The PCIe device test device 301 may also include one or more power supplies 326, one or more wired or wireless network interfaces 350, one or more input output interfaces 358, and/or one or more operating systems 341.
The steps in the PCIe device test method described above may be implemented by the structure of the PCIe device test device.
Corresponding to the above method embodiment, the present invention further provides a computer-readable storage medium having a computer program stored thereon, the computer program, when executed by a processor, implementing the steps of:
acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device; determining the PCIe equipment actual deployment information by combining the hardware in-place information and the basic in-place information; calling a preset PCIe device configuration table; and testing each PCIe device according to the PCIe device configuration table based on the PCIe device actual deployment information.
The computer-readable storage medium may include: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
For the introduction of the computer-readable storage medium provided by the present invention, please refer to the above method embodiments, which are not described herein again.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other. The device, the apparatus and the computer-readable storage medium disclosed in the embodiments correspond to the method disclosed in the embodiments, so that the description is simple, and the relevant points can be referred to the description of the method.
The principle and the implementation of the present invention are explained in the present application by using specific examples, and the above description of the embodiments is only used to help understanding the technical solution and the core idea of the present invention. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (10)
1. A PCIe device test method, comprising:
acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device;
determining PCIe equipment actual deployment information by combining the hardware in-place information and the basic in-place information;
calling a preset PCIe device configuration table;
and testing each PCIe device according to the PCIe device configuration table based on the PCIe device actual deployment information.
2. The PCIe device test method of claim 1, wherein determining PCIe device actual deployment information by combining each piece of hardware in-place information and each piece of basic in-place information comprises:
determining each target slot in an in-place state according to the in-place information of each hardware;
determining the number of head slots and slots in a slot group occupied by each PCIe device according to each basic in-place information;
acquiring socket numbers corresponding to the head sockets respectively;
determining the corresponding relation between each head slot and each target slot according to each slot number;
and determining the actual deployment information of the PCIe equipment according to the corresponding relation and the number of the slots.
3. The PCIe device test method according to claim 1 or 2, wherein testing each PCIe device according to the PCIe device configuration table includes:
acquiring a project to be tested;
acquiring target actual parameters respectively corresponding to the PCIe devices according to the items to be tested;
searching a target standard parameter corresponding to the item to be tested from the PCIe equipment configuration table;
judging whether each target actual parameter is consistent with the target standard parameter;
if so, determining that the test result is that each PCIe device meets the test requirement;
if not, determining that the PCIe equipment does not meet the test requirement as a test result.
4. The PCIe device test method of claim 3, further comprising, after determining that the test result is that there is a PCIe device that fails to meet the test requirements:
acquiring a target fault type of PCIe equipment which does not meet the test requirement;
when the target fault type is a recoverable type, automatically recovering PCIe equipment which does not meet the test requirement;
and outputting equipment maintenance prompt information when the target fault type is an unrecoverable type.
5. The PCIe device test method of claim 4, wherein performing an auto-resume operation on a PCIe device that does not meet test requirements comprises:
automatic recovery operations are performed for PCIe devices that do not meet test requirements by performing a system restart or retraining.
6. The PCIe device test method of claim 3, further comprising:
and logging the test result.
7. The PCIe device test method of claim 3, further comprising:
and outputting and displaying the test result.
8. A PCIe device test apparatus, comprising:
the in-place information acquisition module is used for acquiring hardware in-place information respectively corresponding to each slot and basic in-place information respectively corresponding to each PCIe device;
the deployment information determining module is used for determining the actual deployment information of the PCIe equipment by combining the in-place information of each piece of hardware and the basic in-place information of each piece of hardware;
the configuration table calling module is used for calling a preset PCIe device configuration table;
and the equipment testing module is used for testing each PCIe equipment according to the PCIe equipment configuration table based on the PCIe equipment actual deployment information.
9. A PCIe device test apparatus, comprising:
a memory for storing a computer program;
a processor for implementing the steps of the PCIe device test method as recited in any one of claims 1 to 7 when said computer program is executed.
10. A computer-readable storage medium, having stored thereon a computer program which, when executed by a processor, carries out the steps of the PCIe device test method as recited in any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110680416.2A CN113448786A (en) | 2021-06-18 | 2021-06-18 | PCIe equipment testing method, device, equipment and readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110680416.2A CN113448786A (en) | 2021-06-18 | 2021-06-18 | PCIe equipment testing method, device, equipment and readable storage medium |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114780325A (en) * | 2022-06-21 | 2022-07-22 | 新华三信息技术有限公司 | PCIe equipment detection method and device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114780325A (en) * | 2022-06-21 | 2022-07-22 | 新华三信息技术有限公司 | PCIe equipment detection method and device |
| CN114780325B (en) * | 2022-06-21 | 2022-09-30 | 新华三信息技术有限公司 | PCIe equipment detection method and device |
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Application publication date: 20210928 |