CN113434406B - Function test method and device, storage medium and electronic equipment - Google Patents
Function test method and device, storage medium and electronic equipment Download PDFInfo
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- CN113434406B CN113434406B CN202110707676.4A CN202110707676A CN113434406B CN 113434406 B CN113434406 B CN 113434406B CN 202110707676 A CN202110707676 A CN 202110707676A CN 113434406 B CN113434406 B CN 113434406B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
The invention discloses a function test method and device, a storage medium and electronic equipment. Wherein the method comprises the following steps: in a script generation area of the current display interface, synchronously displaying function scripts corresponding to each function tested in the test equipment; under the condition that the testing equipment tests the functional defect, clearing all currently displayed functional scripts in the script generation area, and displaying a target functional script of a target function corresponding to the functional defect; acquiring functional defect information corresponding to a target function in a defect recording area of a current display interface; and responding to the information submitting operation triggered in the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information. The invention solves the technical problem of low functional test processing efficiency.
Description
Technical Field
The present invention relates to the field of computers, and in particular, to a functional testing method and apparatus, a storage medium, and an electronic device.
Background
Before an operating system or an application program applied to the terminal faces a user, functional testing is required to be conducted, so that the operating system or the application program can be pushed to the user for use under the condition that the set functions can be executed and realized.
However, the existing test scripts are usually developed and written by a test engineer, and the quality of the test scripts depends on the technical capabilities of the test engineer, so that the accuracy of the test scripts is low. Meanwhile, under the condition that defects are tested, a test engineer is required to enter a management system to fill in the defect related information, so that the function test processing efficiency is low.
In view of the above problems, no effective solution has been proposed at present.
Disclosure of Invention
The embodiment of the invention provides a functional test method and device, a storage medium and electronic equipment, which are used for at least solving the technical problem of low functional test processing efficiency.
According to an aspect of an embodiment of the present invention, there is provided a function test method including: in a script generation area of the current display interface, synchronously displaying function scripts corresponding to each function tested in the test equipment; under the condition that the testing equipment tests the functional defect, clearing all currently displayed functional scripts in the script generation area, and displaying a target functional script of a target function corresponding to the functional defect; acquiring function defect information corresponding to the target function in a defect recording area of the current display interface; and responding to the information submitting operation triggered by the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information.
According to another aspect of the embodiment of the present invention, there is also provided a function test apparatus, including: the first display unit is used for synchronously displaying function scripts corresponding to each function tested in the test equipment in a script generation area of the current display interface; a second display unit, configured to clear all function scripts currently displayed in the script generation area and display a target function script of a target function corresponding to the function defect when the test device tests the function defect; an obtaining unit, configured to obtain, in a defect recording area of the current display interface, functional defect information corresponding to the target function; and the generating unit is used for responding to the information submitting operation triggered by the defect recording area and automatically generating a defect recording feedback interface according to the target function script and the function defect information.
According to a further aspect of embodiments of the present invention, there is also provided a computer-readable storage medium having a computer program stored therein, wherein the computer program is arranged to perform the above-described functional test method when run.
According to still another aspect of the embodiments of the present invention, there is also provided an electronic device including a memory in which a computer program is stored, and a processor configured to execute the above-described function test method by the computer program.
In the embodiment of the invention, the script generation area of the display interface is adopted to display the corresponding script which is automatically generated, and under the condition of testing the function defect, the script irrelevant to the target function is removed to display the target function script, the function defect information is filled in the defect recording area, and the information submitting operation is responded, so that the function script corresponding to the function is automatically generated through the script generation area and the function defect information is recorded in the defect recording area in a mode of generating the feedback interface in the defect recording system based on the target function script and the function defect information, thereby achieving the purposes of reducing the writing flow of the function script, ensuring the correctness of the function script, directly recording the function defect information by the defect recording area, and directly submitting the function defect information to the defect recording system by using the generated feedback interface, thereby realizing the technical effects of reducing the writing flow and correcting flow of the script, reducing the flow of the function defect information in the defect recording system, improving the efficiency of function test processing, and further solving the technical problem of low efficiency of function test processing.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiments of the invention and together with the description serve to explain the invention and do not constitute a limitation on the invention. In the drawings:
FIG. 1 is a schematic illustration of an application environment for an alternative functional test method according to an embodiment of the present invention;
FIG. 2 is a flow chart of an alternative functional test method according to an embodiment of the present invention;
FIG. 3 is a flow chart of an alternative functional test method according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of an interface of a test apparatus of an alternative functional test method according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a defect recording interface of an alternative functional test method according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of an alternative functional test device according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of an alternative electronic device according to an embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the invention described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to an aspect of an embodiment of the present invention, there is provided a functional testing method, alternatively, the functional testing method may be applied, but not limited to, in the environment shown in fig. 1. The test apparatus 100 performs data interaction with the defect recording system 120 through the network 110, and the test apparatus 100 transmits the acquired functional defect information to the defect recording system 120 through the network 110. The test device 100 is not limited to a terminal device that performs functional testing of an application or an operating system. The functional test is not limited to being implemented by performing S102 to S108.
And displaying the function script corresponding to the function. And synchronously displaying function scripts corresponding to the tested functions in a script generation area of the current display interface of the testing equipment. And displaying the target function script. The script of the target function is a script of the target function corresponding to the function defect. And under the condition that the testing equipment tests the functional defects, clearing all the functional scripts currently displayed in the script generation area, so that the target functional scripts of the target functions corresponding to the functional defects are displayed. And acquiring the functional defect information. And acquiring function defect information corresponding to the target function in a defect recording area of the current display interface. And generating a defect record feedback interface. And responding to the information submitting operation triggered in the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information.
Alternatively, in this embodiment, the above-mentioned test device may be a device configured with a target client under test or a target operating system under test, and may include, but is not limited to, at least one of the following: cell phones (e.g., android cell phones, IOS cell phones, etc.), notebook computers, tablet computers, palm computers, MIDs (Mobile Internet Devices ), PADs, desktop computers, smart televisions, etc. The target client may be a video client, an instant messaging client, a browser client, an educational client, and the like. The network may include, but is not limited to: a wired network, a wireless network, wherein the wired network comprises: local area networks, metropolitan area networks, and wide area networks, the wireless network comprising: bluetooth, WIFI, and other networks that enable wireless communications. The defect recording system is not limited to a server, and the server may be a single server, a server cluster composed of a plurality of servers, or a cloud server. The above is merely an example, and is not limited in any way in the present embodiment.
As an alternative embodiment, as shown in fig. 2, the above-mentioned functional test method includes:
s202, in a script generation area of a current display interface, synchronously displaying function scripts corresponding to each function tested in the test equipment;
s204, under the condition that the testing equipment tests the functional defect, clearing all functional scripts currently displayed in the script generation area, and displaying a target functional script of a target function corresponding to the functional defect;
s206, acquiring function defect information corresponding to the target function in a defect recording area of the current display interface;
and S208, responding to the information submitting operation triggered in the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information.
Alternatively, the test apparatus is not limited to a terminal for performing a functional test. The function test is a running test of each function program contained in the operating system or the application before release so as to verify whether the operating system or the application can normally run and achieve a preset effect.
Alternatively, the current display interface is not limited to the display interface of the test device at the current time. The current display interface is not limited to the script generation area, the defect recording area, the function operation area and the operation display area. The function operation area is used for generating a test instruction of the function test, the operation display area is used for displaying a process of the function test, the script generation area is used for displaying a script corresponding to the generated function operation, and the defect recording area is used for filling functional defect information.
Optionally, in the script generation area, automatically generated scripts corresponding to the function operations are displayed. Each function operation has a corresponding function script.
Optionally, in the case that the test device tests the functional defect, all the functional scripts in the script generation area are cleared, and the target functional script is realized by reproducing the test instruction of the target function corresponding to the functional defect.
Alternatively, the functional defect information is information for identifying a functional defect, and is not limited to including version information of a functional program corresponding to the defect, corresponding functional identification information, defect level information, mode information for detecting the functional defect, defect description information, and the like.
Alternatively, the defect recording feedback interface is not limited to be used for defect recording of functional defect information in the defect recording system to achieve automatic synchronization of the test equipment with the data of the defect recording system.
In the embodiment of the application, the script generation area of the display interface is adopted to display the corresponding script which is automatically generated, and under the condition that the function defect is tested, the script irrelevant to the target function is removed to display the target function script, the function defect information is filled in the defect recording area, and the information submitting operation is responded, so that the function script corresponding to the function is automatically generated through the script generation area and the function defect information is recorded in the defect recording area in a mode of generating the feedback interface in the defect recording system based on the target function script and the function defect information, the writing flow of the function script is reduced, the correctness of the function script is ensured, the function defect information is directly recorded in the defect recording area, and the generated feedback interface is directly used for submitting the function defect information to the defect recording system, so that the purposes of reducing the writing flow and correcting flow of the script are realized, the flow of the function defect information in the defect recording system is reduced, the technical effect of improving the function test processing efficiency is improved, and the technical problem of low function test processing efficiency is solved.
As an alternative embodiment, as shown in fig. 3, the above-mentioned information submitting operation in response to triggering in the defect recording area, automatically generating the defect recording feedback interface according to the target function script and the function defect information includes:
s302, storing a target function script to a target storage position in response to an information submitting operation;
s304, generating a defect record feedback interface by using the functional defect information and the target storage position.
Optionally, storing the target function script with the target storage location and retrieving the target storage location. The target storage location may be used to store a location in a database of function scripts. The method is not limited to building corresponding storage relations through the identification of the functional defects, so that the functional scripts can be conveniently called when the functional defects are verified.
Alternatively, in the case where the system language of the defect recording system is the same as the language type of the scripting language of the function script, the target storage location is not limited to a location in the database of the defect recording system. And recording the position identification of the target storage position in a defect recording feedback interface.
Optionally, when the system language of the defect recording system is different from the language type of the script language of the function script, and the database where the target storage location is located is not the database of the defect recording system, mapping information corresponding to the target storage location is generated, and mapping information corresponding to the target storage location is included in the defect recording feedback interface to indicate the target storage location.
In the embodiment of the application, the function scripts are stored independently, and the storage positions are fed back to the defect record feedback interface, so that independent storage of the scripts and associated recording of the script storage positions and the function defect information can be realized under the condition that the script language is different from the defect record language, a barrier that records are not associated due to the fact that the script language is different from the defect record language is broken, further processing of the function defects is facilitated, and the processing efficiency of the function test is improved.
As an optional implementation manner, the generating the defect record feedback interface using the functional defect information and the target storage location includes: and inserting the functional defect information into a corresponding feedback position according to a preset data feedback format, and mapping an access link of the target storage position to a corresponding defect script access position to generate a defect record feedback interface.
Optionally, a preset data feedback format is set for the defect recording area, functional defect information is extracted, and the functional defect information is filled into the defect recording area according to the data feedback format to generate a defect recording feedback interface.
As an alternative embodiment, the functional defect information includes at least one of:
version information of the functional program to be tested in the test equipment;
defect level information of a functional program to be tested in the test equipment;
detecting mode information of a functional program to be tested in the test equipment;
defect description information of a functional program to be tested in the test apparatus.
Optionally, the version information is used to indicate a program version of the functional program. Where the functional program is a program of an operating system, the program version may be a system version of the operating system. When the function program is an application program of an application, the program version may be an application version of the application.
Alternatively, the defect level information is information indicating the defect level of the functional defect, and is not limited to being identified by numerals, letters, or the like. For example, the preset "A" represents the highest level of defect level, indicating that the functional defect is more serious.
Alternatively, the defect description information is used to indicate a summary of the functional defect, and the summary information of the functional defect can be known through the defect description information.
Alternatively, the display interface of the test apparatus is not limited to that shown in fig. 4. The display interface 400 includes an operation display area 402, a function operation area 404, a script generation area 406, and a defect recording area 408. In the operation display area 402, an operation interface of the tested function and a test connection state of the test equipment are displayed, and a real-time test interface of the function is displayed, so that the full-flow visualization of the function test is realized. The functional operation area 404 is used to generate functional test instructions, not limited to by responding to keyboard operations to generate functional test instructions to perform functional tests. The script generation area 406 is used to display automatically generated function scripts. The automatically generated functional script is not limited to the illustrated python language script. An information filling area in a predetermined data feedback format is displayed in the defect recording area 408, and corresponding information of the functional defect is filled in the corresponding area. A commit control for receiving an information commit instruction is also provided in the defect recording area 408. By operating the submit control, an information submit command is generated, the target function script in the script generation area 406 is stored in the target storage location, the access link of the target storage location is obtained as mapping information, and the function defect information in the defect recording area 408 and the access link of the target storage location are used as information in the defect feedback recording interface and fed back to the defect recording system.
As an optional implementation manner, the automatically generating the defect record feedback interface according to the target function script and the function defect information includes: and transmitting the target function script and the function defect information to a defect recording system to display an automatically generated defect recording feedback interface in the defect recording system.
Optionally, the mapping information at the target storage location of the target function script is transferred to a defect recording system to generate a defect recording feedback interface in the defect recording system. The defect recording feedback interface in the defect recording system is not limited to that shown in fig. 5. The defect recording system uses Lotu notes defect system under IBM framework as an example, and the defect recording feedback interface 500 displays access link map with the storage location of the functional defect information and the functional script.
In the embodiment of the application, the access link of the target function script and the function defect information are transmitted to the defect recording system so as to automatically generate the defect record in the defect recording system, so that the function test interface is displayed on the test equipment in real time, the function script corresponding to the function test is automatically generated, after the function defect is tested, the function defect information can be filled in the defect recording area, and the function defect information and the position mapping link stored by the script are submitted and transmitted to the defect recording system. The script generation area is utilized to automatically generate the functional script, so that the writing and error correction processes of the functional script are reduced, the problem of low script accuracy caused by writing the script is avoided, the correctness and standardability of the functional script are ensured, and meanwhile, the acquisition efficiency of the test script is improved. Meanwhile, the problem of low function test efficiency caused by the fact that the function information can be filled in a defect recording system to record the function defects is solved, the function test period is shortened, and the function test efficiency is improved.
As an optional implementation manner, before the function scripts corresponding to the functions tested in the test device are synchronously displayed in the script generation area of the current display interface, the method further includes: and displaying the running interface of the operating system or the target application where each function to be tested is located in the test equipment.
Optionally, displaying a test interface of the tested function in the operation display area, wherein the test interface comprises an operation interface of an operation system or a target application where the tested function is located. In the case where the function under test is a system function of the operating system, the running interface of the operating system is mapped in the operation display area. In the case where the function to be tested is an application function of the target application, a running interface of the target application is displayed in the operation display area.
In the embodiment of the application, the test interface of the tested function is displayed in the operation display area of the test equipment, so that the test interface is displayed in real time through the operation display area, the visualization of the function test is realized, the visualized function test is utilized to facilitate the execution of the function test, and the efficiency of the function test is improved.
As an optional implementation manner, before displaying, in the test device, the running interface of the operating system or the target application where each function to be tested is located, the method further includes:
connecting a target terminal where an operating system is located so as to synchronously display an operation interface of the operating system in the test equipment; or (b)
Connecting a target terminal where a target application is located so as to synchronously display an operation interface of the target application in the test equipment; or (b)
Installing the target application in the test equipment to display an operation interface of the target application in the test equipment.
Alternatively, in the case where the function under test is a system function of an operating system, the function test device and the target terminal are connected to map an interface of the operating system running in the target terminal in the test device.
Alternatively, in the case where the function to be tested is an application function of the target application, the display of the running interface of the target application in the operation display area may be performed by connecting the target terminal where the target application is located, by mapping the running interface of the target terminal, or the target application may be installed in the test device, and by running the target application, the running interface of the target application may be displayed.
In the embodiment of the application, the real-time test interface is displayed in the test equipment through the connection terminal and the test equipment or the application is installed in the test equipment, the visualization of the functional test is realized, the execution of the functional test is convenient by utilizing the visualized functional test, and the efficiency of the functional test is improved.
It should be noted that, for simplicity of description, the foregoing method embodiments are all described as a series of acts, but it should be understood by those skilled in the art that the present invention is not limited by the order of acts described, as some steps may be performed in other orders or concurrently in accordance with the present invention. Further, those skilled in the art will also appreciate that the embodiments described in the specification are all preferred embodiments, and that the acts and modules referred to are not necessarily required for the present invention.
According to another aspect of the embodiment of the present invention, there is also provided a function test device for implementing the above function test method. As shown in fig. 6, the apparatus includes:
a first display unit 602, configured to synchronously display, in a script generation area of a current display interface, function scripts corresponding to each function tested in the test device;
a second display unit 604, configured to, in a case where the test device tests a functional defect, clear all functional scripts currently displayed in the script generation area, and display a target functional script of a target function corresponding to the functional defect;
an obtaining unit 606, configured to obtain, in a defect recording area of the current display interface, function defect information corresponding to the target function;
and the generating unit 608 is used for responding to the information submitting operation triggered in the defect recording area and automatically generating a defect recording feedback interface according to the target function script and the function defect information.
Optionally, the generating unit 608 includes:
the response module is used for responding to the information submitting operation and storing the target function script to a target storage position;
and the generating module is used for generating a defect record feedback interface by utilizing the functional defect information and the target storage position.
Optionally, the generating module is further configured to insert the functional defect information into a corresponding feedback position according to a preset data feedback format, and map an access link of the target storage position to a corresponding defect script access position, so as to generate a defect record feedback interface.
Optionally, the generating module is further configured to transmit the target function script and the functional defect information to a defect recording system, so as to display an automatically generated defect recording feedback interface in the defect recording system.
Optionally, the function test device further includes a third display unit, configured to display, in the test device, an operating system or an operation interface of a target application where each function to be tested is located, before the function scripts corresponding to each function to be tested in the test device are synchronously displayed in the script generation area of the current display interface.
Optionally, the above function test device further includes a connection unit, configured to, before displaying, in the test apparatus, an operation interface of an operating system or a target application where each function to be tested is located, include:
the first connecting module is used for connecting a target terminal where the operating system is located so as to synchronously display an operation interface of the operating system in the test equipment;
the second connection module is used for connecting a target terminal where the target application is located so as to synchronously display an operation interface of the target application in the test equipment;
and the installation module is used for installing the target application in the test equipment so as to display the running interface of the target application in the test equipment.
Optionally, the above-mentioned functional defect information includes at least one of: version information of the functional program to be tested in the test equipment; defect level information of a functional program to be tested in the test equipment; detecting mode information of a functional program to be tested in the test equipment; defect description information of a functional program to be tested in the test apparatus.
In the embodiment of the application, the script generation area of the display interface is adopted to display the corresponding script which is automatically generated, and under the condition that the function defect is tested, the script irrelevant to the target function is removed to display the target function script, the function defect information is filled in the defect recording area, and the information submitting operation is responded, so that the function script corresponding to the function is automatically generated through the script generation area and the function defect information is recorded in the defect recording area in a mode of generating the feedback interface in the defect recording system based on the target function script and the function defect information, the writing flow of the function script is reduced, the correctness of the function script is ensured, the function defect information is directly recorded in the defect recording area, and the generated feedback interface is directly used for submitting the function defect information to the defect recording system, so that the purposes of reducing the writing flow and correcting flow of the script are realized, the flow of the function defect information in the defect recording system is reduced, the technical effect of improving the function test processing efficiency is improved, and the technical problem of low function test processing efficiency is solved.
According to still another aspect of the embodiment of the present invention, there is also provided an electronic device for implementing the above-mentioned function test method, where the electronic device may be a terminal device or a server as shown in fig. 1. The present embodiment is described taking the electronic device as a terminal device as an example. As shown in fig. 7, the electronic device comprises a memory 702 and a processor 704, the memory 702 storing a computer program, the processor 704 being arranged to perform the steps of any of the method embodiments described above by means of the computer program.
Alternatively, in this embodiment, the electronic device may be located in at least one network device of a plurality of network devices of the computer network.
Alternatively, in the present embodiment, the above-described processor may be configured to execute the following steps by a computer program:
s1, synchronously displaying function scripts corresponding to each function to be tested in the test equipment in a script generation area of a current display interface;
s2, under the condition that the testing equipment tests the functional defect, clearing all functional scripts currently displayed in the script generation area, and displaying a target functional script of a target function corresponding to the functional defect;
s3, acquiring function defect information corresponding to the target function in a defect recording area of the current display interface;
and S4, responding to information submitting operation triggered in the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information.
Alternatively, it will be understood by those skilled in the art that the structure shown in fig. 7 is only schematic, and the electronic device may also be a terminal device such as a smart phone (e.g. an Android phone, an iOS phone, etc.), a tablet computer, a palm computer, and a mobile internet device (Mobile Internet Devices, MID), a PAD, etc. Fig. 7 is not limited to the structure of the electronic device described above. For example, the electronic device may also include more or fewer components (e.g., network interfaces, etc.) than shown in FIG. 7, or have a different configuration than shown in FIG. 7.
The memory 702 may be used to store software programs and modules, such as program instructions/modules corresponding to the functional testing methods and apparatuses in the embodiments of the present invention, and the processor 704 executes the software programs and modules stored in the memory 702, thereby performing various functional applications and data processing, that is, implementing the functional testing methods described above. The memory 702 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid state memory. In some examples, the memory 702 may further include memory remotely located relative to the processor 704, which may be connected to the terminal via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof. The memory 702 may be used for storing information such as a function script and defect information, but is not limited to. As an example, as shown in fig. 7, the memory 702 may include, but is not limited to, the first display unit 602, the second display unit 604, the obtaining unit 606, and the generating unit 608 in the functional testing apparatus. In addition, other module units in the above-mentioned functional test device may be included, but are not limited to, and are not described in detail in this example.
Optionally, the transmission device 706 is used to receive or transmit data via a network. Specific examples of the network described above may include wired networks and wireless networks. In one example, the transmission device 706 includes a network adapter (Network Interface Controller, NIC) that may be connected to other network devices and routers via a network cable to communicate with the internet or a local area network. In one example, the transmission device 706 is a Radio Frequency (RF) module that is configured to communicate wirelessly with the internet.
In addition, the electronic device further includes: a display 708 for displaying the script generation area, the defect recording area, the functional defect information, and the functional script; and a connection bus 710 for connecting the respective module parts in the above-described electronic device.
In other embodiments, the terminal device or the server may be a node in a distributed system, where the distributed system may be a blockchain system, and the blockchain system may be a distributed system formed by connecting the plurality of nodes through a network communication. Among them, the nodes may form a Peer-To-Peer (P2P) network, and any type of computing device, such as a server, a terminal, etc., may become a node in the blockchain system by joining the Peer-To-Peer network.
According to one aspect of the present application, there is provided a computer program product or computer program comprising computer instructions stored in a computer readable storage medium. The computer instructions are read from the computer-readable storage medium by a processor of a computer device, which executes the computer instructions, causing the computer device to perform the methods provided in the various alternative implementations of the functional testing aspects described above. Wherein the computer program is arranged to perform the steps of any of the method embodiments described above when run.
Alternatively, in the present embodiment, the above-described computer-readable storage medium may be configured to store a computer program for executing the steps of:
s1, synchronously displaying function scripts corresponding to each function to be tested in the test equipment in a script generation area of a current display interface;
s2, under the condition that the testing equipment tests the functional defect, clearing all functional scripts currently displayed in the script generation area, and displaying a target functional script of a target function corresponding to the functional defect;
s3, acquiring function defect information corresponding to the target function in a defect recording area of the current display interface;
and S4, responding to information submitting operation triggered in the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information.
Alternatively, in this embodiment, it will be understood by those skilled in the art that all or part of the steps in the methods of the above embodiments may be performed by a program for instructing a terminal device to execute the steps, where the program may be stored in a computer readable storage medium, and the storage medium may include: flash disk, read-Only Memory (ROM), random-access Memory (Random Access Memory, RAM), magnetic or optical disk, and the like.
The foregoing embodiment numbers of the present invention are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments.
The integrated units in the above embodiments may be stored in the above-described computer-readable storage medium if implemented in the form of software functional units and sold or used as separate products. Based on such understanding, the technical solution of the present invention may be embodied in essence or a part contributing to the prior art or all or part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing one or more computer devices (which may be personal computers, servers or network devices, etc.) to perform all or part of the steps of the method described in the embodiments of the present invention.
In the foregoing embodiments of the present invention, the descriptions of the embodiments are emphasized, and for a portion of this disclosure that is not described in detail in this embodiment, reference is made to the related descriptions of other embodiments.
In several embodiments provided in the present application, it should be understood that the disclosed client may be implemented in other manners. The above-described embodiments of the apparatus are merely exemplary, and the division of the units, such as the division of the units, is merely a logical function division, and may be implemented in another manner, for example, multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some interfaces, units or modules, or may be in electrical or other forms.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The foregoing is merely a preferred embodiment of the present invention and it should be noted that modifications and adaptations to those skilled in the art may be made without departing from the principles of the present invention, which are intended to be comprehended within the scope of the present invention.
Claims (9)
1. A method of functional testing comprising:
in a script generation area of the current display interface, synchronously displaying function scripts corresponding to each function tested in the test equipment;
under the condition that the testing equipment tests the functional defect, clearing all currently displayed functional scripts in the script generation area, and displaying a target functional script of a target function corresponding to the functional defect;
acquiring function defect information corresponding to the target function in a defect recording area of the current display interface;
responding to information submitting operation triggered in the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information;
the responding to the information submitting operation triggered in the defect recording area, and automatically generating a defect recording feedback interface according to the target function script and the function defect information comprises the following steps:
storing the target function script to a target storage location in response to the information submission operation;
and generating the defect record feedback interface by utilizing the functional defect information and the target storage position.
2. The method of claim 1, wherein the generating the defect record feedback interface using the functional defect information and the target storage location comprises:
and inserting the functional defect information into a corresponding feedback position according to a preset data feedback format, and mapping the access link of the target storage position to a corresponding defect script access position to generate the defect record feedback interface.
3. The method of claim 1, wherein automatically generating a defect record feedback interface from the target function script and the function defect information comprises:
and transmitting the target function script and the function defect information to a defect recording system so as to display the automatically generated defect recording feedback interface in the defect recording system.
4. The method according to claim 1, wherein before the function scripts corresponding to the respective functions tested in the test device are synchronously displayed in the script generation area of the current display interface, further comprising:
and displaying the running interface of the operating system or the target application where each function to be tested is located in the test equipment.
5. The method of claim 1, further comprising, prior to displaying in the test device an operating system or a running interface of a target application where each function under test is located:
connecting a target terminal where the operating system is located so as to synchronously display an operation interface of the operating system in the test equipment;
connecting a target terminal where the target application is located so as to synchronously display an operation interface of the target application in the test equipment;
and installing the target application in the test equipment so as to display the running interface of the target application in the test equipment.
6. The method according to any one of claims 1 to 5, wherein the functional defect information comprises at least one of:
version information of the functional program to be tested in the test equipment;
defect level information of a functional program to be tested in the test equipment;
detection mode information of a functional program to be tested in the test equipment;
defect description information of the functional program to be tested in the test equipment.
7. A functional test device, comprising:
the first display unit is used for synchronously displaying function scripts corresponding to each function tested in the test equipment in a script generation area of the current display interface;
the second display unit is used for clearing all currently displayed function scripts in the script generation area and displaying target function scripts of target functions corresponding to the function defects under the condition that the testing equipment tests the function defects;
an obtaining unit, configured to obtain, in a defect recording area of the current display interface, functional defect information corresponding to the target function;
the generating unit is used for responding to the information submitting operation triggered in the defect recording area and automatically generating a defect recording feedback interface according to the target function script and the function defect information;
the generating unit further includes: the response module is used for responding to the information submitting operation and storing the target function script to a target storage position; and the generating module is used for generating a defect record feedback interface by utilizing the functional defect information and the target storage position.
8. A computer-readable storage medium, characterized in that the computer-readable storage medium comprises a stored program which, when run, performs the method of any one of claims 1 to 6.
9. An electronic device comprising a memory and a processor, characterized in that the memory has stored therein a computer program, the processor being arranged to execute the method according to any of the claims 1 to 6 by means of the computer program.
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