CN113418940A - Detection method and detection device based on X-ray tracing particles - Google Patents
Detection method and detection device based on X-ray tracing particles Download PDFInfo
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- CN113418940A CN113418940A CN202110702896.8A CN202110702896A CN113418940A CN 113418940 A CN113418940 A CN 113418940A CN 202110702896 A CN202110702896 A CN 202110702896A CN 113418940 A CN113418940 A CN 113418940A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10116—X-ray image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30168—Image quality inspection
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Abstract
The invention belongs to the technical field of defect detection, and particularly relates to a detection method and a detection device based on X-ray tracing particles. And then comparing the actual scanning result with the evaluation standard diagram to finish the defect detection of the part. Because various defect evaluation standard diagrams are established by pre-scanning simulated various defects before detection, which is equivalent to establishing a complete defect information base aiming at a detected piece, the invention can be suitable for assembly line operation and realizes batch detection. Compared with the prior art, the detection method is simpler and more accurate, and the detected piece does not need to be repeatedly measured, so the method has lower cost.
Description
Technical Field
The invention belongs to the technical field of defect detection, and particularly relates to a detection method and a detection device based on X-ray tracing particles.
Background
It is well known that X-rays have the ability to penetrate a substance and that different substances absorb X-rays to different extents. By utilizing the characteristics and fluorescence characteristics of X-ray penetrating substances, an X-ray imaging device is used for scanning a sample to obtain an image representing the penetrating power of the X-ray penetrating media with different densities, and the image is analyzed and processed to obtain information reflecting the quality of the sample, so that the quality of the sample can be improved
Faults, such as cracks, gaps, corrosion, etc., occurring during manufacture or use of the part are identified.
In a traditional X-ray imaging detection system, a ray source bombards a target surface by high-energy electrons to generate bremsstrahlung, and the radiation rays have the characteristics of continuity and wider energy spectrum distribution bandwidth; the detector for X-ray generally adopts an indirect measurement mode, and performs integral measurement on visible light photons obtained by exciting fluorescent materials with X-ray photons of different energies to reflect the statistical attenuation characteristic of the X-ray. With this measurement mode, a large amount of information related to the energy spectrum is lost during the imaging of X-rays, resulting in a low resolution of the picture and difficulty in providing a quantitative evaluation. Especially, in the aspect of determining the gap/crack depth, the physical properties of the detected material cannot be accurately judged; when dealing with complex, irregularly shaped material samples, it is difficult to ensure an optimal inspection strategy, resulting in inaccurate interpretation.
Disclosure of Invention
The invention aims to provide a detection method and a detection device based on X-ray tracing particles, and aims to solve the problems that in the prior art, due to the fact that a large amount of energy spectrum related information is lost in the X-ray imaging process, the image resolution is low, and the damage of a detection target cannot be accurately reflected.
In order to achieve the purpose, the invention adopts the following technical scheme:
a method for detecting particles based on X-ray tracing, comprising the steps of:
step 2, simulating various defects in the ideal model established in the step 1; then, pre-scanning the simulated defects, and establishing an evaluation standard chart corresponding to each defect according to the pre-scanning result;
step 3, filling the defect positions of the detected piece with tracer particles, and then transilluminating the detected piece by adopting X-rays to obtain X-ray imaging information and an energy spectrum distribution map of the detected piece;
and 4, comparing the imaging information and the energy spectrum distribution diagram obtained in the step 3 with the defect evaluation standard diagram established in the step 2, determining the position, the depth and other parameter information of the crack or the defect of the detected piece, and completing the defect detection of the detected piece.
According to the method, the invention also provides a detection device based on the X-ray tracing particles, which comprises a data pre-detection unit, an X-ray detection unit and an image analysis processing unit;
the data pre-detection unit comprises a detected piece parameter extraction module, a simulated detected piece generation module and a defect generation simulation module; the detected piece parameter extraction module is connected with the defect generation simulation module through the simulated detected piece generation module; the detected piece parameter extraction module is used for acquiring parameter information of the detected piece and providing the parameter information to the simulated detected piece generation module, wherein the extracted parameter information comprises element composition, shape, size and characteristic data of related special detected pieces; the simulation detected piece generating module establishes an ideal model of the detected piece according to the received parameter information; the defect generation simulation module carries out various defect simulations in an ideal model of the detected piece, then carries out pre-scanning on the simulated defects, establishes an evaluation standard diagram corresponding to each defect according to the pre-scanning result, and respectively provides the evaluation standard diagram to the X-ray detection unit and the image analysis processing unit.
The X-ray detection unit comprises a trace particle storage module, an X-ray irradiation module and an X-ray imaging acquisition module; the tracer particle storage module and the X-ray irradiation module are both connected with the detected piece, and the X-ray imaging acquisition module is connected with the X-ray irradiation module. The tracer particle storage module is used for storing tracer particles and guiding the stored tracer particles into a detected piece to enable the tracer particles to be fully attached to the detected piece; the X-ray irradiation module performs transillumination on the detected piece filled with the trace particles; the X-ray imaging acquisition module is used for acquiring the result of the penetration of the X-ray irradiation module, obtaining the X-ray imaging information and the energy spectrum distribution diagram of the detected piece and providing the X-ray imaging information and the energy spectrum distribution diagram to the image analysis processing unit.
The image analysis processing unit comprises a pre-detection image and actual image quantitative analysis module, a detected piece defect information confirmation module and a detection result output module; the pre-detection image and actual image quantitative analysis module is used for carrying out quantitative analysis on the evaluation standard graph and the energy spectrum distribution graph, then providing a quantitative analysis result to the detected piece defect information confirmation module, determining the position, depth and other parameter information of the detected piece crack or defect, obtaining the defect information of the detected piece, providing the defect information to the detection result output module, and finally outputting the defect information to a user for subsequent processing.
The detection method and the detection device based on the X-ray tracing particles are an ideal model established according to parameter information such as the material, the size, the shape and the like of a detected piece, so that various defects can be simulated by using the ideal model. In the invention, the simulated various defects are pre-scanned, the defect information such as depth, position, shape and the like corresponding to each defect is recorded, and an evaluation standard chart corresponding to various defects is established. And comparing the actual scanning result with the evaluation standard diagram to determine the defect position, depth and other parameter information of the detected part, thereby completing the defect detection of the part. Because various defect evaluation standard diagrams are established by pre-scanning simulated various defects before detection, namely a complete defect information base is established for a detected piece and can be repeatedly applied, the method can be suitable for assembly line operation and realizes batch detection. Compared with the prior art that the detected piece without defects is directly adopted as the standard diagram, the detection method is simpler and more accurate, and the detected piece does not need to be repeatedly measured. Therefore, the worker can judge the defect of the detected piece more accurately and efficiently. In addition, because the trace particles are filled in the defect part of the detected piece, when the detected piece filled with the trace particles is scanned by X-rays, the resolution of a scanned image can be enhanced, and the detection capability is further improved.
Drawings
FIG. 1 is a flow chart of an embodiment of the present invention;
FIG. 2 is a block diagram of the architecture of the present invention;
FIG. 3 is an x-ray image of a part without defects;
FIG. 4 is an X-ray image of an unfilled trace particle of a metal cylinder part according to an embodiment;
FIG. 5 is an X-ray image of the metal cylinder part filled with tracer particles in the example.
Detailed Description
For a better understanding of the objects and functions of the invention, reference should be made to the following detailed description taken in conjunction with the accompanying drawings. This example was tested for a defective metal cylinder part.
The invention provides a detection method based on X-ray tracing particles, as shown in figure 1, comprising the following steps:
2, simulating various typical cracks or defects in the ideal metal cylinder part model established in the step 1 by adopting Monte Carlo simulation software; simulating an X-ray irradiation process to obtain energy spectrum analysis graphs and X-ray imaging information of various defects; and then establishing an evaluation standard diagram corresponding to each defect by using the X-ray imaging information and the energy spectrum analysis diagram obtained by simulation. In order to realize the quantitative processing of the parts, the present embodiment classifies the defects according to the positions, depths and shapes thereof.
And 3, filling the defect positions of the metal cylinder parts with tracer particles, and carrying out X-ray transillumination on the detected object by adopting DR equipment to obtain X-ray imaging information and an energy spectrum distribution diagram of the metal cylinder parts. The 130kevDR device voltage during transillumination was 85-135 kev. The tracer particle is a customized ceramic particle that is added as a marker to observe, study and measure the behavior or properties of a substance during a given procedure, is easily detected and has no effect on the object. Mainly comprises ceramic material wrapping trace materials such as Carbon-11, Carbon-14, oxygen-15, fluorine-18, iododine-123, technetium-99, gallium-67 and the like to form tiny particles. In order to improve the imaging quality, in the embodiment, carbon-14 is selected to fill the defect position of the metal cylindrical part.
FIG. 4 is an X-ray image of the metal cylinder part of this embodiment without the tracer particles; fig. 5 is an X-ray image of the metal cylinder part of this embodiment after filling with tracer particles. Comparing fig. 4 and fig. 5, it can be seen that the definition of the image obtained after filling the trace particles is higher, and the information such as the size and the position of the defect can be effectively presented.
Step 4, comparing the imaging information and the energy spectrum distribution diagram obtained in the step 3 with the defect evaluation standard diagram established in the step 2; and determining the position, depth and other parameter information of the crack or defect of the detected part according to the comparison result, and completing the defect detection of the part.
According to the content, the ideal model is established through the element composition, shape and size extracted from the metal cylinder part, and the error between the ideal model and the actual part can be effectively reduced. The evaluation standard diagram established by the invention contains various simulated defects, namely establishing a defect library related to the metal cylinder part, so that the defect library can be directly called from the defect library in later use.
According to the method, the invention also provides a detection device based on X-ray tracing particles, the structure of the device is shown in FIG. 2, and the device comprises a data pre-detection unit, an X-ray detection unit and an image analysis processing unit;
the data pre-detection unit comprises a detected piece parameter extraction module, a simulated detected generation module and a defect generation simulation module; the detected piece parameter extraction module is connected with the defect generation simulation module through the simulated detected generation module; the detected piece parameter extraction module is used for acquiring parameter information of the detected piece and providing the parameter information to the simulated detected piece generation module, wherein the extracted parameter information comprises materials, shapes and sizes; the simulated detected piece generating module establishes a non-defective detected piece model for the detected piece according to the received parameter information; and the defect generation simulation module performs preview of various defect conditions according to the established defect-free detected model so as to establish evaluation standard graphs corresponding to various defects and respectively provide the evaluation standard graphs to the image analysis processing unit and the X-ray detection unit.
The X-ray detection unit comprises a trace particle storage module, an X-ray irradiation module and an X-ray imaging acquisition module; the tracer particle storage module and the X-ray irradiation module are both connected with the detected piece, and the X-ray imaging acquisition module is connected with the X-ray irradiation module. The tracer particle storage module is used for storing tracer particles and guiding the stored tracer particles into a detected piece to enable the tracer particles to be fully attached to the detected piece; the X-ray irradiation module performs transillumination on the detected piece filled with the trace particles; the X-ray imaging acquisition module is used for acquiring the result of the penetration of the X-ray irradiation module, obtaining the X-ray imaging information and the energy spectrum distribution diagram of the detected piece according to the result of the penetration and providing the X-ray imaging information and the energy spectrum distribution diagram to the image analysis processing unit.
The image analysis processing unit comprises a pre-detection image and actual image quantitative analysis module, a detected piece defect information confirmation module and a detection result output module; the pre-detection image and actual image quantitative analysis module is used for carrying out quantitative analysis on the evaluation standard graph and the energy spectrum distribution graph, then providing a quantitative analysis result to the detected piece defect information confirmation module, determining the position, depth and other parameter information of the detected piece crack or defect, obtaining the defect information of the detected piece, providing the defect information to the detection result output module, and finally outputting the defect information to a user for subsequent processing.
Claims (2)
1. A detection method based on X-ray tracing particles is characterized in that: the method comprises the following steps:
step 1, extracting element composition, shape and size parameters of a detected piece, and establishing an ideal model of the detected piece;
step 2, simulating various defects in the ideal model established in the step 1; then, pre-scanning the simulated defects, and establishing an evaluation standard chart corresponding to each defect according to the pre-scanning result;
step 3, filling the defect position of the detected piece with the tracer particles, and then transilluminating the detected object by adopting X-rays to obtain X-ray imaging information and an energy spectrum distribution map of the detected piece;
step 4, comparing the imaging information and the energy spectrum distribution diagram obtained in the step 3 with the defect evaluation standard diagram established in the step 2; and determining the position, depth and other parameter information of the crack or defect of the detected part to complete the defect detection of the part.
2. A detection device based on X-ray tracing particles comprises a data pre-detection unit, an X-ray detection unit and an image analysis processing unit; the method is characterized in that:
the data pre-detection unit comprises a detected piece parameter extraction module, a simulated detected piece generation module and a defect generation simulation module; the detected piece parameter extraction module is connected with the defect simulation module through the simulated detected piece generation module; the detected piece extracting module is used for acquiring parameter information of the detected piece and providing the parameter information to the simulated detected piece generating module, wherein the extracted parameter information comprises element composition, shape, size and characteristic data of related special detected pieces; the simulation detected piece generating module establishes an ideal model of the detected piece according to the received parameter information; the defect simulation module firstly carries out various defect simulations in an ideal model of the detected piece, then carries out pre-scanning on the simulated defects, establishes evaluation standard graphs corresponding to the defects according to the pre-scanning result and respectively provides the evaluation standard graphs to the image analysis unit and the X-ray detection unit;
the X-ray detection unit comprises a trace particle storage module, an X-ray irradiation module and an X-ray imaging acquisition module; the tracer particle storage module and the X-ray irradiation module are both connected with the detected piece, and the X-ray imaging acquisition module is connected with the X-ray irradiation module. The tracer particle storage module is used for storing tracer particles and guiding the stored tracer particles into the detected piece so as to enable the tracer particles to be fully attached to the detected object; the X-ray irradiation module performs transillumination on the detected piece filled with the trace particles; the X-ray imaging acquisition module is used for acquiring the result of the penetration of the X-ray irradiation module, obtaining the X-ray imaging information and the energy spectrum distribution diagram of the detected piece according to the result of the penetration and providing the X-ray imaging information and the energy spectrum distribution diagram to the image analysis unit;
the image analysis processing unit comprises a pre-detection image and actual image quantitative analysis module, a detected piece defect information confirmation module and a detection result output module; the pre-detection image and actual image quantitative analysis module is used for carrying out quantitative analysis on the evaluation standard graph and the energy spectrum distribution graph, and then providing a quantitative analysis result to the detected piece defect information confirmation module to determine the position, depth and other parameter information of the detected piece crack or defect to obtain the defect information of the detected object, and providing the defect information of the detected object to the detection result output module to output to a user for subsequent processing.
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