CN113406428A - Two-in-one tester - Google Patents
Two-in-one tester Download PDFInfo
- Publication number
- CN113406428A CN113406428A CN202110834006.9A CN202110834006A CN113406428A CN 113406428 A CN113406428 A CN 113406428A CN 202110834006 A CN202110834006 A CN 202110834006A CN 113406428 A CN113406428 A CN 113406428A
- Authority
- CN
- China
- Prior art keywords
- testing
- testing machine
- locker
- chip
- insulating layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims abstract description 86
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 9
- 229910052802 copper Inorganic materials 0.000 claims description 9
- 239000010949 copper Substances 0.000 claims description 9
- 239000011148 porous material Substances 0.000 claims description 5
- 239000006260 foam Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000001174 ascending effect Effects 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention belongs to the technical field of testing devices, and discloses a two-in-one testing machine which comprises a machine base, a testing machine shell, a testing station, a testing board, an electric push rod and a control panel, wherein the testing machine shell is arranged above the machine base, the electric push rod is arranged on the testing machine shell, the testing board is arranged at the bottom end of the electric push rod through an electric telescopic rod, the testing station is arranged right below the testing board on the machine base through a screw, and the control panel is arranged on the testing machine shell; the test board comprises a universal board, a test head, a chip locker and a binding post. The invention integrates the test of the touch screen and the display screen on one test station through the two-in-one tester, and the test board is driven by the electric push rod to complete the test of the touch screen and the display screen on the test station, thereby greatly improving the operation efficiency.
Description
Technical Field
The invention relates to the field of testing devices, in particular to a two-in-one testing machine.
Background
The existing touch screen and display screen test is carried out through two stations respectively, and the process is complicated.
Disclosure of Invention
The invention mainly aims to provide a two-in-one testing machine, which integrates the testing of a touch screen and a display screen on a testing station through the two-in-one testing machine, and is matched with an electric push rod to drive a testing board to test the touch screen and the display screen on the testing station, so that the operating efficiency is greatly improved.
In order to achieve the purpose, the invention provides a two-in-one testing machine which comprises a machine base, a testing machine shell, a testing station, a testing board, an electric push rod and a control panel, wherein the testing machine shell is arranged above the machine base, the electric push rod is arranged on the testing machine shell, the testing board is arranged at the bottom end of the electric push rod through an electric telescopic rod, the testing station is arranged right below the testing board on the machine base through a screw, and the control panel is arranged on the testing machine shell; the test board comprises a universal board, a test head, a chip locker and a binding post; the universal plate is inserted with a chip locker and a pair of binding posts, the chip locker is provided with a left group of pin locking electrode sockets and a right group of pin locking electrode sockets, the left side of the pin locking electrode sockets is connected to one binding post through a public electrode lead, each electrode socket in the right side of the pin locking electrode sockets is connected to the other binding post through a corresponding counter electrode lead, and each public electrode lead and the counter electrode lead which is electrically connected with the public electrode lead correspondingly are equally divided into two groups of pin locking electrode sockets.
Optionally, a lifting button, a descending button and a switch button are arranged on the control panel.
Optionally, a locking handle for locking the F-shaped circuit pin is further provided on the chip locker.
Optionally, the universal plate comprises a copper plate and an insulating layer, wherein the insulating layer is arranged above the copper plate, and fine holes are arranged in order on the insulating layer; the pore runs through the insulating layer and the bottom end with the copper intercommunication.
Optionally, the chip locker and the pair of posts are inserted into the fine holes of the universal plate.
Optionally, the insulating layer is made of rubber.
Optionally, a foam layer is disposed across the fine pore lumen.
Optionally, the common electrode lead and the counter electrode lead are both embedded in the insulating layer.
Optionally, an F-type circuit pin is disposed on the test head, and the F-type circuit pin is inserted into the pin locking electrode socket on the chip locker.
The invention integrates the test of the touch screen and the display screen on one test station through the two-in-one tester, and the test board is driven by the electric push rod to complete the test of the touch screen and the display screen on the test station, thereby greatly improving the operation efficiency.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a two-in-one tester according to the present invention;
FIG. 2 is a schematic structural view of a two-in-one tester with a test board removed;
FIG. 3 is a schematic structural diagram of a test board of a two-in-one tester according to the present invention;
FIG. 4 is a schematic structural diagram of a universal board in a two-in-one tester according to the present invention;
the reference numbers illustrate:
the implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that, if directional indications (such as up, down, left, right, front, and back … …) are involved in the embodiment of the present invention, the directional indications are only used to explain the relative positional relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, if there is a description of "first", "second", etc. in an embodiment of the present invention, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
As shown in fig. 1-4, the invention provides a two-in-one testing machine, which comprises a machine base 1, a testing machine case 2, a testing station 3, a testing plate 4, an electric push rod 5 and a control panel, wherein the testing machine case 2 is installed above the machine base 1, the electric push rod 5 is installed on the testing machine case 2, the testing plate 4 is installed at the bottom end of the electric push rod 5 through an electric telescopic rod, the testing station 3 is installed right below the testing plate 4 on the machine base 1 through a screw, and the control panel is arranged on the testing machine case 2; test board 4 includes a universal board 41, a test head 42, a chip locker 43, and posts 46; a chip locker 43 and a pair of terminals 46 are inserted into the universal plate 41, a left group and a right group of pin locking electrode sockets 44 are arranged on the chip locker 43, an electrode socket in the left pin locking electrode socket 44 is connected to one terminal 46 through a common electrode lead 48, each electrode socket in the right pin locking electrode socket 44 is connected to the other terminal 46 through a corresponding counter electrode lead 47, and each common electrode lead 48 and the counter electrode lead 47 correspondingly and electrically connected with the common electrode lead 48 are respectively provided with a switch button 8.
Specifically, the control panel is provided with a lifting button 6, a descending button 7 and a switch button 8.
Specifically, the chip locker 43 is further provided with a locking handle 45 for locking the F-shaped circuit pin.
Specifically, the universal plate 41 comprises a copper plate 10 and an insulating layer 9, wherein the insulating layer 9 is arranged above the copper plate 10, and the insulating layer 9 is provided with pores 11 in order; the fine holes 11 penetrate the insulating layer 9 and the bottom ends communicate with the copper plate 10.
Specifically, the chip locker 43 and the pair of posts 46 are inserted into the fine holes 11 of the universal plate 41.
Specifically, the insulating layer 9 is made of rubber.
Specifically, a foam layer 12 is transversely arranged in the cavity of the pore 11.
Specifically, the common electrode lead 48 and the counter electrode lead 47 are embedded in the insulating layer 9.
Specifically, the test head 42 is provided with an F-shaped circuit pin, and the F-shaped circuit pin is inserted into the pin locking electrode socket 44 on the chip locker 43.
In addition, the electric push rod 5 adopts an NH32-900 electric push rod;
the testing machine shell 2 is internally provided with a controller and a power supply, the controller adopts an AT89C51 controller, and the electric push rod 5, the testing plate 4 and the control panel are electrically connected with the controller.
When the touch screen and the display screen are used, a worker places the touch screen and the display screen on the testing station 3, controls the electric push rod 5 through the controller to drive the testing plate 4 to descend to the position above the testing station 3 of the touch screen and the display screen through the control panel ascending button 6, the descending button 7 and the switch button 8, and tests the touch screen and the display screen on the testing station 3 through the testing plate 4, so that the operation efficiency is greatly improved.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (9)
1. A two-in-one testing machine is characterized by comprising a machine base (1), a testing machine shell (2), a testing station (3), a testing plate (4), an electric push rod (5) and a control panel, wherein the testing machine shell (2) is installed above the machine base (1), the electric push rod (5) is installed on the testing machine shell (2), the testing plate (4) is installed at the bottom end of the electric push rod (5) through an electric telescopic rod, the testing station (3) is installed on the machine base (1) under the testing plate (4) through a screw, and the control panel is arranged on the testing machine shell (2); the test board (4) comprises a universal board (41), a test head (42), a chip locker (43) and a binding post (46); a chip locker (43) and a pair of binding posts (46) are inserted into the universal plate (41), a left group and a right group of pin locking electrode sockets (44) are arranged on the chip locker (43), an electrode socket in the left pin locking electrode socket (44) is connected to one binding post (46) through a common electrode lead (48), each electrode socket in the right pin locking electrode socket (44) is connected to the other binding post (46) through a corresponding counter electrode lead (47), and each common electrode lead (48) and the counter electrode lead (47) which is correspondingly and electrically connected with the common electrode lead (48) are respectively provided with a switch button (8).
2. The two-in-one testing machine as set forth in claim 1, wherein the control panel is provided with a lifting button (6), a lowering button (7) and a switch button (8).
3. The two-in-one testing machine as set forth in claim 1, wherein the chip locker (43) is further provided with a locking handle (45) for locking the F-shaped circuit pin.
4. The two-in-one tester as claimed in claim 1, wherein the universal board (41) comprises a copper plate (10) and an insulating layer (9), the insulating layer (9) is disposed above the copper plate (10), and the insulating layer (9) is provided with pores (11) in alignment; the fine holes (11) penetrate through the insulating layer (9) and the bottom ends of the fine holes are communicated with the copper plate (10).
5. The two-in-one testing machine as set forth in claim 1, wherein the chip locker (43) and the pair of posts (46) are inserted into the fine hole (11) of the universal plate (41).
6. The two-in-one tester as set forth in claim 4, characterized in that the insulating layer (9) is made of rubber.
7. The two-in-one testing machine as set forth in claim 4, wherein a foam layer (12) is disposed transversely in the lumen of the fine hole (11).
8. The two-in-one tester as set forth in claim 1, wherein the common electrode lead (48) and the counter electrode lead (47) are embedded in the insulating layer (9).
9. The two-in-one tester as set forth in claim 1, wherein the test head (42) is provided with F-type circuit pins, which are inserted into the pin locking electrode sockets (44) on the chip locker (43).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110834006.9A CN113406428A (en) | 2021-07-22 | 2021-07-22 | Two-in-one tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110834006.9A CN113406428A (en) | 2021-07-22 | 2021-07-22 | Two-in-one tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113406428A true CN113406428A (en) | 2021-09-17 |
Family
ID=77687414
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110834006.9A Pending CN113406428A (en) | 2021-07-22 | 2021-07-22 | Two-in-one tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113406428A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000068425A (en) * | 1998-08-24 | 2000-03-03 | Mitsumi Electric Co Ltd | System for mounting chip part component |
| CN205879993U (en) * | 2016-07-14 | 2017-01-11 | 信阳师范学院 | Film photoelectric device testing arrangement is used in laboratory |
| CN106354312A (en) * | 2016-08-30 | 2017-01-25 | 苏州华兴源创电子科技有限公司 | On-Cell based touch screen and display screen integration testing system |
| CN209803288U (en) * | 2019-03-20 | 2019-12-17 | 江苏新安电器股份有限公司 | ICT (information and communications technology) testing device for automatic production line |
| CN212483719U (en) * | 2020-06-06 | 2021-02-05 | 惠州市坚柔科技有限公司 | Multifunctional probe test fixture |
-
2021
- 2021-07-22 CN CN202110834006.9A patent/CN113406428A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000068425A (en) * | 1998-08-24 | 2000-03-03 | Mitsumi Electric Co Ltd | System for mounting chip part component |
| CN205879993U (en) * | 2016-07-14 | 2017-01-11 | 信阳师范学院 | Film photoelectric device testing arrangement is used in laboratory |
| CN106354312A (en) * | 2016-08-30 | 2017-01-25 | 苏州华兴源创电子科技有限公司 | On-Cell based touch screen and display screen integration testing system |
| CN209803288U (en) * | 2019-03-20 | 2019-12-17 | 江苏新安电器股份有限公司 | ICT (information and communications technology) testing device for automatic production line |
| CN212483719U (en) * | 2020-06-06 | 2021-02-05 | 惠州市坚柔科技有限公司 | Multifunctional probe test fixture |
Non-Patent Citations (1)
| Title |
|---|
| 南寿松等: "《模拟电子技术基础实训指导》", vol. 1, 北京邮电大学出版社, pages: 218 - 127 * |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20210917 |