CN113363933B - Single event effect protection device and method - Google Patents
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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- H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
- H02H3/08—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current
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- H—ELECTRICITY
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- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
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- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
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Abstract
The invention discloses a single event effect protection device and a method, which relate to the technical field of single event effect protection of a CMOS image sensor, and the device comprises a controller and one or more linear voltage-stabilized power supplies; a first input end of the controller is connected with a current feedback signal output end of each linear voltage-stabilized power supply; the power supply enable control signal output end of the controller is connected with the enable input end of each linear stabilized voltage supply; the second input end of the controller is connected with the image data output end of the CMOS image sensor; the working instruction output end of the controller is connected with the instruction input end of the CMOS image sensor; the power input end of the CMOS image sensor is connected with each linear stabilized voltage power supply, and a dynamic refreshing control program and/or a current monitoring over-limit power-off control program are/is arranged in the controller. By applying the invention, the high-reliability and high-flexibility protection of the single event effect of the CMOS image sensor of the space camera is realized.
Description
Technical Field
The invention relates to the technical field of single event effect protection of CMOS image sensors, in particular to a single event effect protection device and a single event effect protection method of a CMOS image sensor of a space camera.
Background
The CMOS image sensor is gradually replacing the original ccd (charge Coupled device) photoelectric device in the field of space imaging (such as space remote sensing imaging camera, star sensor, sun sensor, etc.) because of the advantages of low power consumption, light weight, small volume, high integration level, simple peripheral circuit, etc.
The CMOS image sensor is applied to a space environment, and the first problem is the radiation hazard of space charged particles, especially the single event upset and the single event locking effect caused by high-energy heavy ion irradiation. If effective protection measures are not taken, the device is slightly abnormal or interrupted, the normal work of the equipment is influenced, and the device is burnt out and the equipment is permanently damaged.
The conventional single event lockout protection method is to connect a current limiting resistor or a current limiting device in series at the power input end of the device. The method of using the series current-limiting resistor to carry out single-event locking protection on the CMOS image sensor has the following defects: 1. the resistance value of the current-limiting resistor is difficult to determine, when the resistance value is too small, the current-limiting resistor cannot play a role in protection, and when the resistance value is too large, the normal work of the device can be influenced, because the voltage drop on the current-limiting resistor can reduce the voltage on the power supply input end of the device, and the voltage on the power supply input end can be unstable due to the changed current, which is especially fatal to an image sensor requiring low ripple power supply; 2. once the current-limiting resistor is selected, the current-limiting resistor can not be changed on the rail, if the resistance value is not properly selected, the condition of over-protection or ineffective protection on the rail can be caused, and the normal function or safety is seriously influenced; 3. the device has no timely self-recovery capability, and can recover normal work only by powering up the device again after external intervention is carried out on the device, so that the work task is seriously influenced. The main disadvantages of using the method of connecting the current limiting device in series to perform single event latchup protection on the CMOS image sensor are as follows: 1. the on-track can not be changed, if the current limiting parameter of the device is not properly selected, the situation of excessive protection or ineffective protection can be caused on the on-track, and the normal function or safety can be seriously influenced; 2. the device has no timely self-recovery capability, and can recover normal work only by powering up the device again after external intervention is carried out on the device, so that the work task is seriously influenced.
Disclosure of Invention
The invention aims to provide a single event effect protection device and a single event effect protection method, so as to achieve the purposes of high reliability and high flexibility of single event effect protection of a space camera CMOS image sensor.
In order to achieve the purpose, the invention provides the following scheme:
a single event effect protection device is applied to a CMOS image sensor and comprises a controller and a linear voltage-stabilizing power supply set consisting of one or more linear voltage-stabilizing power supplies;
the first input end of the controller is connected with the current feedback signal output end of each linear stabilized voltage supply; the power supply enable control signal output end of the controller is connected with the enable input end of each linear stabilized voltage supply; a second input end of the controller is connected with an image data output end of the CMOS image sensor; the working instruction output end of the controller is connected with the instruction input end of the CMOS image sensor; the power supply input end of the CMOS image sensor is also connected with the voltage output end of each linear stabilized voltage power supply so as to realize the power supply function of the linear stabilized voltage power supply on the CMOS image sensor;
the working instruction is a data configuration control instruction; the data configuration control command is determined according to a dynamic refresh control program built in the controller; the dynamic refreshing control program is a control program which periodically performs reset operation and register parameter reconfiguration on the CMOS image sensor; the register is arranged inside the CMOS image sensor.
The controller includes:
a working time obtaining module for obtaining the working time of the current stage controller,
a first judging module for judging whether the working time is less than a set time threshold value to obtain a first judging result,
a working parameter reconfiguration module, configured to, when the first determination result indicates that the working time is not less than the set time threshold, input a data configuration control instruction to the CMOS image sensor to control the CMOS image sensor to perform a reset operation first and then perform a configuration data write operation on a register, and, after the CMOS image sensor executes the data configuration control instruction, start to acquire the working time of the controller in the next stage and return to the first determination module,
and the first returning module is used for returning to the first judging module when the first judging result shows that the working time is less than the set time threshold.
The power supply enabling control signal output by the controller is determined according to a current monitoring power-off overrun control program built in the controller; the current monitoring over-limit power-off control program is a control program which compares the acquired current value of each linear stabilized power supply with an over-limit current threshold interval and outputs a power supply enabling control signal according to a comparison result.
Optionally, the controller further includes:
a current feedback signal acquisition module for acquiring current feedback signals of the linear stabilized voltage power supplies,
a second judging module, configured to sequentially judge whether a current value in each current feedback signal exceeds a current threshold to obtain a second judgment result,
the power supply control module is used for inputting a disable signal in a power supply enabling control signal into the linear stabilized voltage power supply to sequentially power off the CMOS image sensor when the second judgment result shows that one or more current values continuously exceed the current threshold value for multiple times, and inputting a power-on signal in the power supply enabling control signal into the linear stabilized voltage power supply to control each linear stabilized voltage power supply to sequentially power on the CMOS image sensor after the power off is subjected to a self-recovery time interval, and returning to the current feedback signal acquisition module,
and the second returning module is used for returning to the second judging module when the second judging result shows that the current value does not continuously exceed the current threshold value for multiple times.
Optionally, the system further comprises a conversion module; the conversion module comprises a multi-channel operational amplifier and a multi-channel A/D converter;
a first input end of the controller is connected with a current feedback signal output end of each linear stabilized voltage supply through the multi-channel A/D converter and the multi-channel operational amplifier in sequence;
and the time sequence control signal output end of the controller is also connected with the multi-channel A/D converter to control the working time sequence of the multi-channel A/D converter.
Optionally, different ones of the linear voltage-stabilized power supplies provide different supply voltages, and one of the linear voltage-stabilized power supplies corresponds to one of the supply voltages.
In order to achieve the above purpose, the invention also provides the following scheme:
a single event effect protection method comprises the following steps:
acquiring the working time of a current stage controller;
judging whether the working time is less than a set time threshold value or not to obtain a first judgment result;
if the first judgment result shows that the working time is not less than the set time threshold, inputting a data configuration control instruction to a CMOS image sensor to control the CMOS image sensor to perform reset operation firstly and then perform configuration data writing operation on a register, starting to acquire the working time of a controller at the next stage after the CMOS image sensor executes the data configuration control instruction, and returning to the step of judging whether the working time is less than the set time threshold to obtain a first judgment result;
and if the first judgment result shows that the working time is less than the set time threshold, returning to the step of judging whether the working time is less than the set time threshold to obtain a first judgment result.
Optionally, the method further includes:
when a photographing instruction is received in a judging stage, a CMOS exposure control signal is input to a CMOS image sensor to obtain image data output by the CMOS image sensor;
when a photographing instruction is received in the control instruction execution stage, inputting a CMOS exposure control signal to the CMOS image sensor after the control instruction execution is finished so as to acquire image data output by the CMOS image sensor;
the judging stage is a stage for judging whether the working time is less than a set time threshold value or not to obtain a first judging result; the control instruction execution stage is a stage of executing the data configuration control instruction for the CMOS image sensor.
Optionally, the method further includes:
acquiring current feedback signals of each linear voltage-stabilized power supply;
sequentially judging whether the current value in each current feedback signal exceeds a current threshold value to obtain a second judgment result;
if the second judgment result shows that one current value or a plurality of current values continuously exceed the current threshold value for multiple times, inputting a disable signal in a power supply enabling control signal into the linear stabilized voltage power supply to sequentially power off the CMOS image sensor, inputting a power-on signal in the power supply enabling control signal into the linear stabilized voltage power supply to control each linear stabilized voltage power supply to sequentially power on the CMOS image sensor after power off passes through a self-recovery time interval, and returning to the step of acquiring a current feedback signal of each linear stabilized voltage power supply;
and if the second judgment result indicates that the current value does not continuously exceed the current threshold for multiple times, returning to the step of sequentially judging whether the current value in each current feedback signal is within the range of the current threshold to obtain a second judgment result.
Optionally, the method further includes:
and acquiring the power-off times of the CMOS image sensor within set time, and inputting a disabling signal in a power supply enabling control signal into the linear stabilized voltage power supply when the power-off times are larger than a set value so as to stop power supply operation of the CMOS image sensor.
The invention has the following beneficial effects:
1. the single event upset protection of the CMOS image sensor of the space camera can be realized by periodically resetting the CMOS image sensor and reconfiguring working parameters and timely correcting data errors caused by single event upset.
2. The linear voltage-stabilized power supply with the enabling control end and the current feedback function is selected to supply power to the CMOS image sensor, the controller is used for monitoring the power supply current in real time, and the power is automatically cut off when the power is exceeded, so that the single-particle locking protection of the CMOS image sensor of the space camera is realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
Fig. 1 is a block diagram of a single event effect protection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a single event effect protection apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic flow chart of a single event effect protection method according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a single event effect protection apparatus according to an embodiment of the present invention;
fig. 5 is a schematic flow chart of a single event effect protection method according to an embodiment of the present invention;
fig. 6 is a schematic diagram of a single event effect protection apparatus according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention aims to provide a high-reliability single event effect protection device, method and system for a space camera CMOS image sensor, and the high-reliability and high-flexibility protection of the single event effect of the space camera CMOS image sensor is realized.
In order to make the aforementioned objects, features and advantages of the present invention more comprehensible, the present invention is described in detail with reference to the accompanying drawings and the detailed description thereof.
Example one
As shown in fig. 1, the present embodiment provides a single event effect protection device applied to a CMOS image sensor, where the single event effect protection device includes a controller and a linear regulated power supply set composed of one or more linear regulated power supplies.
The first input end of the controller is connected with the current feedback signal output end of each linear stabilized voltage supply; the power supply enable control signal output end of the controller is connected with the enable input end of each linear stabilized voltage supply; the second input end of the controller is connected with the image data output end of the CMOS image sensor; the working instruction output end of the controller is connected with the instruction input end of the CMOS image sensor; the power supply input end of the CMOS image sensor is also connected with the voltage output end of each linear stabilized voltage power supply so as to realize the power supply function of the linear stabilized voltage power supply to the CMOS image sensor.
Wherein, the working instruction is a data configuration control instruction; the data configuration control command is determined according to a dynamic refresh control program built in the controller; the dynamic refreshing control program is a control program for periodically carrying out reset operation and register parameter reconfiguration on the CMOS image sensor; the register is arranged inside the CMOS image sensor.
As a preferred embodiment, the single event effect protection device provided in this embodiment further includes a conversion module; the conversion module comprises a multi-channel operational amplifier and a multi-channel A/D converter; a first input end of the controller is connected with a current feedback signal output end of each linear stabilized voltage supply through the multi-channel operational amplifier and the multi-channel A/D converter in sequence; the time sequence control signal output end of the controller is also connected with the multi-channel A/D converter to control the working time sequence of the multi-channel A/D converter.
The specific structure of the single event effect protection device provided by this embodiment is as shown in fig. 2, a current feedback signal output by each linear voltage-stabilized power supply is transmitted to a multi-channel operational amplifier for voltage adjustment and impedance conversion, the processed current feedback signal is input to a multi-channel a/D converter for analog-to-digital conversion, and then an a/D conversion result is sent to a controller; the controller is a core control unit of the whole protection device, runs a control program, controls the multichannel A/D converter to poll and acquire each current feedback signal and perform analog-to-digital conversion, then performs digital filtering processing and threshold judgment on the A/D conversion result, and performs enabling power supply control on the linear stabilized voltage supply according to the judgment result. Meanwhile, the controller also serves as a control unit of the CMOS image sensor, generates the working time sequence of the CMOS image sensor, configures the configuration parameters of the CMOS image sensor, and receives and processes the image data output by the CMOS image sensor.
As a preferred embodiment, the linear regulated power supply provided in this embodiment is used to power a CMOS image sensor, and generally, a CMOS image sensor is powered by a plurality of different voltages, and each voltage uses only one linear regulated power supply, that is, in the single event effect protection apparatus provided in this embodiment, different linear regulated power supplies provide different power supply voltages, and one linear regulated power supply corresponds to one power supply voltage.
The linear voltage-stabilized power supply selected by the embodiment has an enabling control end and a current feedback function. The current feedback function is a function in which the device reflects the actual output current change in proportion to the voltage change of a certain output terminal.
As a preferred implementation manner, in the single event effect protection apparatus provided in this embodiment, the controller is an irradiation-resistant high-reliability aerospace-level FPGA, and the linear voltage-stabilized power supply, the multi-channel a/D converter, and the multi-channel operational amplifier are also irradiation-resistant high-reliability aerospace-level devices.
Example two
For the single event upset effect of the CMOS image sensor, this embodiment provides a single event effect protection method, as shown in fig. 3, which specifically includes the following steps:
step 101: and when the system is powered on, the controller starts and runs the dynamic refreshing control program.
Step 102: the controller outputs power supply enabling control signals of the linear voltage-stabilized power supplies so as to sequentially power on the CMOS image sensor.
Step 103: the controller generates a reset signal to reset the CMOS image sensor, and then writes preset configuration data into each register inside the CMOS image sensor through the communication interface, and after the configuration is completed, the CMOS image sensor enters a work ready state.
Step 104: the controller starts timing and then obtains the working time of the controller in the current phase.
Step 105: judging whether the working time is less than a set time threshold value or not to obtain a first judgment result; if the first determination result indicates that the working time is not less than the set time threshold, execute step 106; if the first determination result indicates that the operating time is less than the set time threshold, step 105 is executed.
Step 106: inputting the data configuration control instruction to the CMOS image sensor to control the CMOS image sensor to perform the reset operation and then perform the configuration data write operation on the register, and after the CMOS image sensor executes the data configuration control instruction, starting to acquire the operating time of the controller in the next stage, and returning to step 105.
If the controller receives the photographing instruction during the counting period or the execution of the step 106, a trigger signal is output immediately or after the execution of the step 106 to control the exposure of the CMOS image sensor and output the image data, and after the output of the image data is finished. The specific operation is as follows:
when a photographing instruction is received in a judging stage, a CMOS exposure control signal is input to a CMOS image sensor to obtain image data output by the CMOS image sensor; when a photographing instruction is received in the control instruction execution stage, inputting a CMOS exposure control signal to the CMOS image sensor after the control instruction execution is finished so as to acquire image data output by the CMOS image sensor; the judging stage is a stage for judging whether the working time is less than a set time threshold value or not to obtain a first judging result; the control instruction execution stage is a stage of executing the data configuration control instruction for the CMOS image sensor.
According to the embodiment, the CMOS image sensor is periodically reset and the working parameters are reconfigured, so that data errors caused by single event upset can be corrected in time, and the data of the register in the CMOS image sensor can be kept at a correct value to the greatest extent, so that the normal work of the CMOS image sensor is ensured, and the purpose of single event upset protection is achieved.
EXAMPLE III
The embodiment provides a single event effect protection device, as shown in fig. 4, including:
and an operating time acquiring module 201, configured to acquire an operating time of the current stage controller.
The first determining module 202 is configured to determine whether the working time is less than a set time threshold, so as to obtain a first determination result.
The working parameter reconfiguration module 203 is configured to, when the first determination result indicates that the working time is not less than the set time threshold, input a data configuration control instruction to the CMOS image sensor to control the CMOS image sensor to perform a reset operation first and then perform a configuration data write operation on the register, and after the CMOS image sensor executes the data configuration control instruction, start to acquire the working time of the controller in the next stage, and return to the first determination module 202.
The first returning module 204 is configured to return to the first determining module 202 when the first determination result indicates that the working time is less than the set time threshold.
Example four
The embodiment provides a single event effect protection device, as shown in fig. 1, the single event effect protection device includes a controller and a linear regulated power supply set composed of one or more linear regulated power supplies.
The first input end of the controller is connected with the current feedback signal output end of each linear stabilized voltage supply; the power supply enable control signal output end of the controller is connected with the enable input end of each linear stabilized voltage supply; a second input end of the controller is connected with an image data output end of the CMOS image sensor; the working instruction output end of the controller is connected with the instruction input end of the CMOS image sensor; the power supply input end of the CMOS image sensor is also connected with the voltage output end of each linear voltage-stabilized power supply so as to realize the power supply function of the linear voltage-stabilized power supply on the CMOS image sensor;
the power supply enabling control signal output by the controller is determined according to a current monitoring power-off overrun control program built in the controller; the current monitoring over-limit power-off control program is a control program which compares the acquired current value of each linear stabilized power supply with an over-limit current threshold interval and outputs a power supply enabling control signal according to a comparison result.
As a preferred embodiment, the single event effect protection device provided in this embodiment further includes a conversion module; the conversion module comprises a multi-channel operational amplifier and a multi-channel A/D converter; a first input end of the controller is connected with a current feedback signal output end of each linear stabilized power supply through the multi-channel operational amplifier and the multi-channel A/D converter in sequence; the time sequence control signal output end of the controller is also connected with the multi-channel A/D converter to control the working time sequence of the multi-channel A/D converter.
For the single event latchup effect of the CMOS image sensor, the present embodiment adopts a current monitoring overrun power-off control program, and specifically executes the steps of:
step 1: and when the system is powered on, the controller starts and runs a current monitoring power-off overrun control program.
Step 2: the controller outputs power supply enabling control signals of the linear voltage-stabilized power supplies so as to sequentially power on the CMOS image sensor.
And step 3: the controller generates a reset signal to reset the CMOS image sensor, then writes preset configuration data into each register in the CMOS image sensor through the communication interface, and after configuration is completed, the CMOS image sensor enters a work ready state;
and 4, step 4: the controller generates a working time sequence of the multi-channel A/D converter, controls the multi-channel A/D converter to acquire current feedback signals of each linear stabilized voltage supply in turn and performs analog-to-digital conversion, the conversion result is input into the controller through the data interface, and the controller performs mean value filtering processing on the conversion result of each channel A/D converter.
And 5: comparing the conversion result after the average filtering with a preset threshold, and executing the step 4 if the conversion result is not over-limited; if one or more paths of data continuously exceed the limit for multiple times (for example, 5 times), the controller immediately outputs a disabling signal of the linear voltage-stabilized power supply to sequentially power off the CMOS image sensor, so that the CMOS image sensor is effectively prevented from being damaged due to a long-time locking state.
Step 6: after the CMOS image sensor is powered off, waiting for a certain time (such as 1-2 seconds), executing the steps 2-5, and realizing self-recovery after locking protection; if the number of times of power-off overrun exceeds the set value (such as 2 times) within the specified time (such as 10 seconds), no attempt is made to power on the CMOS image sensor again, so that the protection measures are safer and more reliable.
And 7: after the protection action (power off of the CMOS image sensor) is triggered each time, the abnormal state and the data collected when the abnormality occurs are reported to the upper computer through the controller.
In step 5, the method for determining the threshold is as follows:
measuring the maximum current value I of each linear voltage-stabilized power supply when the CMOS image sensor works normally NORMAL . During measurement, the controller transmits the A/D conversion result after filtering to the upper computer for recording and interpretation. When measured, all normal use conditions and limit temperature ranges should be covered.
Inducing the CMOS image sensor to enter a single-particle locking state through a heavy particle test or a pulse laser test, and measuring the minimum current value I of each linear stabilized voltage power supply when the CMOS image sensor is locked SEL . During measurement, the controller transmits the A/D conversion result after filtering to the upper computer for recording and interpretation. After data acquisition is completed, the CMOS image sensor is powered off as soon as possible, and the device is prevented from being burnt due to long-time locking.
The current threshold value of each linear voltage-stabilized power supply is greater than the respective maximum current value I NORMAL But less than the respective minimum current value I SEL 。
The threshold value can be set to 1.2-1.3 times of the maximum power without performing a heavy particle test or a pulsed laser testFlow value I NORMAL 。
As a preferred embodiment, the linear regulated power supply provided in this embodiment is used to power a CMOS image sensor, and generally, a CMOS image sensor is powered by a plurality of different voltages, and each voltage uses only one linear regulated power supply, that is, in the single event effect protection apparatus provided in this embodiment, different linear regulated power supplies provide different power supply voltages, and one linear regulated power supply corresponds to one power supply voltage.
The linear voltage-stabilized power supply selected by the embodiment has the functions of enabling the control end and current feedback. The current feedback function is a function in which the device reflects the actual output current change in proportion to the voltage change of a certain output terminal.
As a preferred implementation manner, in the single event effect protection apparatus provided in this embodiment, the controller is an irradiation-resistant high-reliability aerospace-level FPGA, and the linear voltage-stabilized power supply, the multi-channel a/D converter, and the multi-channel operational amplifier are also irradiation-resistant high-reliability aerospace-level devices.
EXAMPLE five
As shown in fig. 5, the embodiment provides a single event effect protection method, which includes the following steps:
step 301: and acquiring current feedback signals of the linear stabilized voltage power supplies.
Step 302: sequentially judging whether the current value in each current feedback signal exceeds a current threshold value to obtain a second judgment result; if the second determination result indicates that one or more of the current values continuously exceed the current threshold for multiple times, execute step 303; if the second determination result indicates that the current value does not exceed the current threshold at the interval, multiple times or multiple consecutive times, the process returns to step 302.
Step 303: inputting a disable signal in a power enable control signal into the linear stabilized voltage power supply to sequentially power off the CMOS image sensor, and inputting a power-on signal in the power enable control signal into the linear stabilized voltage power supply to control each linear stabilized voltage power supply to sequentially power on the CMOS image sensor after power off passes through a self-recovery time interval, and returning to step 301.
Before step 301 is executed for the first time, preparation work needs to be executed, and the preparation work refers to steps 101 to 103 described in embodiment two.
As a preferred specific implementation manner, the method for protecting against a single event effect provided in this embodiment further includes: and acquiring the power-off times of the CMOS image sensor within set time, and inputting a disabling signal in a power supply enabling control signal into the linear stabilized voltage power supply when the power-off times are larger than a set value so as to stop power supply operation of the CMOS image sensor.
EXAMPLE six
As shown in fig. 6, the present embodiment provides a single event effect protection device, including:
a current feedback signal obtaining module 401, configured to obtain a current feedback signal of each linear voltage-stabilized power supply;
a second determining module 402, configured to sequentially determine whether a current value in each current feedback signal exceeds a current threshold, so as to obtain a second determination result;
the power control module 403 is configured to, when the second determination result indicates that one current value or multiple current values continuously exceed the current threshold value for multiple times, input a disable signal in a power enable control signal into the linear voltage-stabilized power supply to sequentially power off the CMOS image sensor, and, after the CMOS image sensor after power off has a self-recovery time interval, input an power-up signal in the power enable control signal into the linear voltage-stabilized power supply to control each linear voltage-stabilized power supply to sequentially power up the CMOS image sensor, and return to the current feedback signal acquisition module 401;
a second returning module 404, configured to return to the second determining module 402 when the second determination result indicates that the current value interval, multiple times, or multiple consecutive times does not exceed the current threshold.
Parameters (such as dynamic refresh frequency, overrun threshold, overrun judging condition, filtering strength, self-recovery time interval and the like) related to the method can be injected into the controller through the communication interface, and on-track configuration is achieved.
The invention has the following advantages:
firstly, the method is easy to realize, can fully utilize the original hardware resources of a controller, an operational amplifier, an A/D converter and the like in the system, carry out a small amount of design change, and can be realized by matching with a simple software program.
Secondly, the sensitivity of the single-particle locking protection can be flexibly adjusted on the track, parameters such as an overrun threshold, an overrun judging condition and filtering strength are modified through an injected instruction, the triggering condition of the current overrun protection can be changed, and the situations of excessive protection or ineffective protection and the like caused by improper ground calibration parameters are effectively avoided.
Thirdly, the device has a timely self-recovery capability, and after protection is triggered, the controller can automatically power on and configure the device again to enable the device to enter a normal working state, so that the functional influence caused by single particle locking is reduced to the minimum.
And fourthly, after the protection is triggered, the abnormal state and the parameters are accurately and automatically reported, so that the on-orbit operation maintenance and the irradiation basic data statistics and accumulation are facilitated.
Obviously, compared with the traditional method, the method has the advantages of on-orbit flexible configuration, and has the capabilities of timely self-recovery and accurate state parameter reporting.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. For the system disclosed by the embodiment, the description is relatively simple because the system corresponds to the method disclosed by the embodiment, and the relevant points can be referred to the method part for description.
The principle and the embodiment of the present invention are explained by applying specific examples, and the above description of the embodiments is only used to help understanding the method and the core idea of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (8)
1. The single event effect protection device is characterized by being applied to a CMOS image sensor and comprising a controller and a linear voltage-stabilizing power supply set consisting of one or more linear voltage-stabilizing power supplies;
the first input end of the controller is connected with the current feedback signal output end of each linear stabilized voltage supply; the power supply enable control signal output end of the controller is connected with the enable input end of each linear stabilized voltage supply; a second input end of the controller is connected with an image data output end of the CMOS image sensor; the working instruction output end of the controller is connected with the instruction input end of the CMOS image sensor; the power supply input end of the CMOS image sensor is also connected with the voltage output end of each linear stabilized voltage power supply so as to realize the power supply function of the linear stabilized voltage power supply on the CMOS image sensor; the working instruction is a data configuration control instruction;
the controller includes:
a working time obtaining module for obtaining the working time of the current stage controller,
a first judging module for judging whether the working time is less than a set time threshold value to obtain a first judging result,
a working parameter reconfiguration module, configured to, when the first determination result indicates that the working time is not less than the set time threshold, input a data configuration control instruction to the CMOS image sensor to control the CMOS image sensor to perform a reset operation first and then perform a configuration data write operation on a register, and, after the CMOS image sensor executes the data configuration control instruction, start to acquire the working time of the controller in the next stage and return to the first determination module,
and the first returning module is used for returning to the first judging module when the first judging result shows that the working time is less than the set time threshold.
2. The single event effect protection device of claim 1, wherein the controller further comprises:
a current feedback signal acquisition module for acquiring current feedback signals of the linear stabilized voltage power supplies,
a second judging module for sequentially judging whether the current value in each current feedback signal exceeds the current threshold value to obtain a second judgment result,
the power supply control module is used for inputting a disable signal in a power supply enabling control signal into the linear stabilized voltage power supply to sequentially power off the CMOS image sensor when the second judgment result shows that one or more current values continuously exceed the current threshold value for multiple times, and inputting a power-on signal in the power supply enabling control signal into the linear stabilized voltage power supply to control each linear stabilized voltage power supply to sequentially power on the CMOS image sensor after the power off is subjected to a self-recovery time interval, and returning to the current feedback signal acquisition module,
and the second returning module is used for returning to the second judging module when the second judging result shows that the current value does not continuously exceed the current threshold value for multiple times.
3. The single event effect protection device of claim 1, further comprising a conversion module; the conversion module comprises a multi-channel operational amplifier and a multi-channel A/D converter;
a first input end of the controller is connected with a current feedback signal output end of each linear stabilized power supply sequentially through the multi-channel A/D converter and the multi-channel operational amplifier;
and the time sequence control signal output end of the controller is also connected with the multi-channel A/D converter to control the working time sequence of the multi-channel A/D converter.
4. The single event effect protection device of claim 1, wherein different ones of the linear regulated power supplies provide different supply voltages, and one of the linear regulated power supplies corresponds to one of the supply voltages.
5. A single event effect protection method is characterized by comprising the following steps:
acquiring the working time of a current stage controller;
judging whether the working time is less than a set time threshold value or not to obtain a first judgment result;
if the first judgment result shows that the working time is not less than the set time threshold, inputting a data configuration control instruction to a CMOS image sensor to control the CMOS image sensor to perform reset operation firstly and then perform configuration data writing operation on a register, starting to acquire the working time of a controller at the next stage after the CMOS image sensor executes the data configuration control instruction, and returning to the step of judging whether the working time is less than the set time threshold to obtain a first judgment result;
and if the first judgment result shows that the working time is less than the set time threshold, returning to the step of judging whether the working time is less than the set time threshold to obtain a first judgment result.
6. The method for single event effect protection according to claim 5, further comprising:
when a photographing instruction is received in a judging stage, a CMOS exposure control signal is input to a CMOS image sensor to obtain image data output by the CMOS image sensor;
when a photographing instruction is received in the control instruction execution stage, inputting a CMOS exposure control signal to the CMOS image sensor after the control instruction execution is finished so as to acquire image data output by the CMOS image sensor;
the judging stage is a stage for judging whether the working time is less than a set time threshold value or not to obtain a first judging result; the control instruction execution stage is a stage of executing the data configuration control instruction for the CMOS image sensor.
7. The method for single event effect protection according to claim 6, further comprising:
acquiring current feedback signals of each linear voltage-stabilized power supply;
sequentially judging whether the current value in each current feedback signal exceeds a current threshold value to obtain a second judgment result;
if the second judgment result shows that one current value or a plurality of current values continuously exceed the current threshold value for multiple times, inputting a disable signal in a power supply enabling control signal into the linear stabilized voltage power supply to sequentially power off the CMOS image sensor, inputting a power-on signal in the power supply enabling control signal into the linear stabilized voltage power supply to control each linear stabilized voltage power supply to sequentially power on the CMOS image sensor after power off passes through a self-recovery time interval, and returning to the step of acquiring a current feedback signal of each linear stabilized voltage power supply;
and if the second judgment result shows that the current value does not continuously exceed the current threshold value for multiple times, returning to the step of sequentially judging whether the current value in each current feedback signal is within the current threshold value range to obtain a second judgment result.
8. The method for single event effect protection according to claim 7, further comprising:
and acquiring the power-off times of the CMOS image sensor within set time, and inputting a disabling signal in a power supply enabling control signal into the linear stabilized voltage power supply when the power-off times are larger than a set value so as to stop power supply operation of the CMOS image sensor.
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