CN113360367A - Defect data processing method and device, computer equipment and readable storage medium - Google Patents

Abstract

The invention discloses a defect data processing method, a defect data processing device, computer equipment and a readable storage medium. The method comprises the following steps: respectively acquiring and storing information of defect data with preset marks of each item to be counted from a project management platform based on each item to be counted; for each item to be counted, determining at least one piece of defect detection index data corresponding to the item to be counted according to the information of the defect data; and respectively carrying out visual display on the defect detection index data corresponding to each item to be counted. According to the defect data processing method provided by the invention, any plurality of defect detection indexes of any plurality of projects can be calculated at the same time, the multi-dimensional visual display of the multi-project defect data can be realized without manual participation, and the diversified look-up requirements of users are met.

Description

Defect data processing method and device, computer equipment and readable storage medium

Technical Field

The invention relates to the technical field of computers, in particular to a defect data processing method, a defect data processing device, computer equipment and a computer readable storage medium.

Background

In terms of development projects for computer programs, bugs (bugs) refer to errors, bugs, imperfections, etc. in computer programs. At present, after the project test is finished, developers usually use a project management tool (for example, a JIRA platform) that provides functions of defect entry, state tracking, and the like to refer to the statistical result of the project defect data.

However, the project management tools represented by the JIRA platform have limited statistical indexes, and cannot meet daily reference requirements of project defect data in a customized manner. Moreover, the tool can only record the defect data aiming at the established project, so that the defect data can only be counted and displayed aiming at the established project, and manual counting and drawing are needed for displaying the defect data change and difference among a plurality of different projects, so that the accuracy and objectivity of the data cannot be ensured while the labor cost is increased.

It is to be noted that the above information disclosed in the background section is only for enhancement of understanding of the background of the invention, and therefore it may contain information that does not constitute prior art that is already known to a person of ordinary skill in the art.

Disclosure of Invention

In view of the above, the present invention provides a defect data processing method, a defect data processing apparatus, a computer device and a computer readable storage medium.

Additional features and advantages of the invention will be set forth in the detailed description which follows, or may be learned by practice of the invention.

According to an aspect of the present invention, there is provided a defect data processing method including: respectively acquiring and storing information of defect data with preset marks of each item to be counted from a project management platform based on each item to be counted; for each item to be counted, determining at least one piece of defect detection index data corresponding to the item to be counted according to the information of the defect data; and respectively carrying out visual display on the defect detection index data corresponding to each item to be counted.

According to an embodiment of the present invention, the information of the defect data includes: project version information corresponding to the defect data; for each item to be counted, determining at least one piece of defect detection index data corresponding to the item to be counted according to the information of the defect data, wherein the determining comprises the following steps: for each item to be counted, determining item version information corresponding to different versions based on different versions of the item to be counted according to item version information corresponding to the defect data; respectively carrying out visual display on the defect detection index data corresponding to each item to be counted, wherein the visual display comprises the following steps: and respectively carrying out visual processing on the defect detection index data corresponding to different versions of each item to be counted.

According to an embodiment of the present invention, the at least one defect detection index data corresponding to each item to be counted includes: and the online defect density is determined by the quotient of the online defect data total amount and the defect data total amount of the item to be counted.

According to an embodiment of the present invention, the at least one defect detection index data corresponding to each item to be counted includes: and determining the online defect repair rate according to the quotient of the online defect data amount of which the item repair duration to be counted is less than the first preset duration and the online defect data total amount.

According to an embodiment of the present invention, the at least one defect detection index data corresponding to each item to be counted includes: and determining the on-line defect retention rate according to the quotient of the on-line defect data quantity with the item repair time length to be counted being greater than a second preset time length and the on-line defect data total quantity.

According to an embodiment of the present invention, the at least one defect detection index data corresponding to each item to be counted includes: and the average repairing time length of the online defects is determined by the quotient of the sum of the repairing time lengths of the online defect data of the items to be counted and the total quantity of the online defect data.

According to an embodiment of the present invention, the obtaining and storing information of the defect data with the preset mark of each item to be counted based on each item to be counted from the item management platform respectively includes: based on a pre-written query statement and an interface provided by a JIRA platform, acquiring and storing information of defect data with online defect data marks of each item to be counted in a preset period from the JIRA platform based on each item to be counted respectively.

According to an embodiment of the invention, the information of the defect data includes at least one of: the serial number of the online defect data, the real-time state of the online defect data and the repair duration of the online defect data.

According to another aspect of the present invention, there is provided a defect data processing apparatus including: the data acquisition module is used for acquiring and storing information of the defect data with the preset marks of each item to be counted based on each item to be counted from the item management platform; the index determining module is used for determining at least one piece of defect detection index data corresponding to each item to be counted according to the information of the defect data; and the index display module is used for visually displaying the defect detection index data corresponding to each item to be counted respectively.

According to still another aspect of the present invention, there is provided a computer apparatus comprising: the defect data processing system comprises a memory, a processor and executable instructions stored in the memory and capable of running in the processor, wherein the processor executes the executable instructions to realize any one of the defect data processing methods.

According to yet another aspect of the present invention, there is provided a computer-readable storage medium having stored thereon computer-executable instructions that, when executed by a processor, implement any of the above-described defect data processing methods.

According to the defect data processing method provided by the invention, any plurality of defect detection indexes of any plurality of projects can be calculated at the same time, the multi-dimensional visual display of the multi-project defect data can be realized without manual participation, and the diversified look-up requirements of users are met.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention, as claimed.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.

Fig. 1 is a flowchart illustrating a defect data processing method according to an exemplary embodiment.

Fig. 2 is a block diagram illustrating a defect data processing apparatus according to an exemplary embodiment.

FIG. 3 is a schematic diagram illustrating a configuration of a computer device, according to an example embodiment.

FIG. 4 is a visual trend graph illustrating defect detection index data according to an exemplary embodiment.

FIG. 5 is a visual trend graph illustrating another type of defect detection index data, according to an exemplary embodiment.

FIG. 6 is a visual trend graph illustrating yet another type of defect detection index data according to an exemplary embodiment.

FIG. 7 is a visual trend graph illustrating yet another type of defect detection index data according to an exemplary embodiment.

Detailed Description

Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The drawings are merely schematic illustrations of the invention and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus their repetitive description will be omitted.

Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to provide a thorough understanding of embodiments of the invention. One skilled in the relevant art will recognize, however, that the invention may be practiced without one or more of the specific details, or with other methods, apparatus, steps, and so forth. In other instances, well-known structures, methods, devices, implementations, or operations are not shown or described in detail to avoid obscuring aspects of the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

As described above, taking the JIRA platform in the related art as an example, in the project development, the project may be managed by creating a project in the JIRA platform to record related data (e.g., defect data). However, the JIRP platform only provides statistics and display of defect data for each item, and if people want to see comparative display of different items, the people need to run the data of each item in the JIRA platform, and after obtaining the display diagrams provided by the JIRA platform, the people manually obtain the display diagrams one by one, and then perform comparative display. The invention provides a defect data processing method for meeting the requirement of developers for diversified consulting of project defect data. The following specifically describes embodiments of the present invention.

Fig. 1 is a flowchart illustrating a defect data processing method according to an exemplary embodiment. The defect data processing method shown in fig. 1 can be used, for example, to process defect data (hereinafter, simply referred to as "on-line defect data") that occurs after a project is brought on line, marked by a tester, and entered into a project management tool such as a JIRA platform.

Referring to fig. 1, a defect data processing method 10 includes:

in step S102, information of defect data having a preset mark of each item to be counted is acquired and stored based on each item to be counted from the item management platform, respectively.

Still taking the above-mentioned JIRA platform as an example, for each item to be counted, information of defect data having a preset mark of each item to be counted is acquired and stored from the JIRA platform, respectively.

It will be appreciated by those skilled in the art that, taking the example of a company having separate JIRA platforms between different departments, the JIRA platform of each department may establish one or more projects for the respective department. The above-mentioned slave JIRA platform acquires and stores the information of the defect data with the preset mark of each item to be counted based on each item to be counted, and may be for different items of the same JIRA platform or for different items in different JIRA platforms, only the corresponding JIRA platform address information or identification information needs to be set during query.

In some embodiments, the information of the defect data may include at least one of: the serial number (bug ID) of the online defect data, the real-time state of the online defect data, and the repair time length of the online defect data.

In step S104, for each item to be counted, at least one piece of defect detection index data corresponding to the item to be counted is determined according to the information of the defect data.

Based on the information of the defect data stored in the background, defect index data corresponding to the items to be counted can be calculated.

In step S106, the defect detection index data corresponding to each item to be counted is visually displayed.

For example, the defect detection index data of each item can be displayed in a front-end page in a form of a graph, a table and the like, so that interaction between a background and related personnel is realized.

According to the defect data processing method provided by the embodiment of the invention, any plurality of defect detection indexes of any plurality of projects can be calculated at the same time, the multi-dimensional visual display of the multi-project defect data can be realized without manual participation, and the diversified look-up requirements of users are met.

It should be clearly understood that the present disclosure describes how to make and use particular examples, but the principles of the present disclosure are not limited to any details of these examples. Rather, these principles can be applied to many other embodiments based on the teachings of the present disclosure.

Bearing the application scenario, step S102 may further include: based on a pre-written query statement and an interface provided by the JIRA platform, acquiring and storing information of defect data with on-line defect data marks of each item to be counted in a preset period from the JIRA platform based on each item to be counted. The preset period may be, for example, 7 days, that is, the online defect data of any plurality of items may be updated, counted, and displayed in units of "week". In the present invention, the period can be customized by the user.

In some embodiments, the acquired defect data of each item to be counted may further reflect information of different versions of the item, where the information of the defect data includes: and project version information corresponding to the defect data. Step S104, for each item to be counted, determining at least one defect detection index data corresponding to the item to be counted according to the information of the defect data may further include: and for each item to be counted, determining the item version information corresponding to different versions based on different versions of the item to be counted according to the item version information corresponding to the defect data. Step S106, performing a visual display on the defect detection index data corresponding to each item to be counted may further include: and respectively carrying out visual processing on the defect detection index data corresponding to different versions of each project to be counted. According to the embodiment, statistics and presentation of the defect data for different versions in the same project can be further provided.

At least one defect detection indicator data corresponding to each item (or version of an item) may, in some embodiments, include:

an on-line defect density determined by the quotient of the total amount of on-line defect data and the total amount of defect data for the entry (or the version).

And (II) determining the online defect repair rate according to the quotient of the online defect data amount of which the repair time length of the item (or the version) is less than the first preset time length and the online defect data total amount.

Wherein, the first preset time period may be, for example, 24 hours, and the repair rate of the online defect is the repair rate of the online defect within one day.

And (III) determining the on-line defect retention rate according to the quotient of the on-line defect data amount and the on-line defect data total amount of the item (or the version) with the repair time length longer than a second preset time length.

Wherein, the second predetermined time period may be 48 hours, for example, and the on-line defect retention rate is the retention rate of the on-line defect after two days of occurrence.

And (IV) the average repair time length of the on-line defect determined by the quotient of the sum of the repair time lengths of the on-line defect data of the item (or the version) and the total amount of the on-line defect data.

It should be noted that the present invention does not limit the values of the first/second preset durations, nor the four types of defect detection index data. In some embodiments, the user may perform any possible expansion of the defect detection index data based on specific review requirements.

The line graphs shown in fig. 4 to 7 respectively correspond to the background and visually display the online defect density of a certain project (or a certain version of a certain project), the repair rate of the online defect within one day, the retention rate of the online defect after two days, and the average repair time of the online defect according to the method 10. Wherein, each graph updates, counts and displays the defect data on the line by taking week as a unit.

In the visual display stage of the method, the defect detection index data of a plurality of projects (or a plurality of versions of one project) can be respectively displayed in a plurality of charts, and can also be uniformly displayed in one chart for visual comparison. In addition, in the invention, the form of the visual display can be customized by the user. The user can select any possible diagram form such as a scatter diagram, a line diagram, a pie chart, a column chart, a box chart and the like to realize diversified display of the defect data.

Those skilled in the art will appreciate that all or part of the steps implementing the above embodiments are implemented as computer programs executed by a CPU. The computer program, when executed by the CPU, performs the functions defined by the method provided by the present invention. The program may be stored in a computer readable storage medium, which may be a read-only memory, a magnetic or optical disk, or the like.

Furthermore, it should be noted that the above-mentioned figures are only schematic illustrations of the processes involved in the method according to exemplary embodiments of the invention, and are not intended to be limiting. It will be readily understood that the processes shown in the above figures are not intended to indicate or limit the chronological order of the processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously, e.g., in multiple modules.

The following are embodiments of the apparatus of the present invention that may be used to perform embodiments of the method of the present invention. For details which are not disclosed in the embodiments of the apparatus of the present invention, reference is made to the embodiments of the method of the present invention.

Fig. 2 is a block diagram illustrating a defect data processing apparatus according to an exemplary embodiment.

Referring to fig. 2, the defect data processing apparatus 20 includes: a data acquisition module 202, an index determination module 204, and an index presentation module 206.

The data obtaining module 202 is configured to obtain and store information of defect data with preset marks of each item to be counted based on each item to be counted from the item management platform.

The index determining module 204 is configured to determine, for each item to be counted, at least one defect detection index data corresponding to the item to be counted according to the information of the defect data.

The indicator displaying module 206 is configured to visually display the defect detection indicator data corresponding to each item to be counted.

In some embodiments, the information of the defect data includes: project version information corresponding to the defect data; the index determining module 204 is configured to determine, for each item to be counted, item version information corresponding to different versions based on different versions of the item to be counted according to the item version information corresponding to the defect data. The index display module 206 is configured to perform visualization processing on the defect detection index data corresponding to different versions of each item to be counted.

In some embodiments, the at least one defect detection indicator data corresponding to each item to be counted includes: and the on-line defect density is determined by the quotient of the total quantity of the on-line defect data and the total quantity of the defect data of the items to be counted.

In some embodiments, the at least one defect detection indicator data corresponding to each item to be counted includes: and the online defect repair rate is determined by the quotient of the online defect data quantity with the item repair duration to be counted being less than the first preset duration and the online defect data total quantity.

In some embodiments, the at least one defect detection indicator data corresponding to each item to be counted includes: and the online defect retention rate is determined by the quotient of the online defect data volume of which the item repair duration to be counted is greater than the second preset duration and the online defect data total volume.

In some embodiments, the at least one defect detection indicator data corresponding to each item to be counted includes: and the average repairing time length of the online defects is determined by the quotient of the sum of the repairing time lengths of the online defect data of the items to be counted and the total quantity of the online defect data.

In some embodiments, the data obtaining module 202 is configured to obtain and store information of the defect data with the online defect data mark of each item to be counted in a preset period from the jitra platform based on the interface provided by the jitra platform and based on each item to be counted respectively based on the interface provided by the jitra platform.

In some embodiments, the information of the defect data includes at least one of: the serial number of the online defect data, the real-time state of the online defect data and the repair duration of the online defect data.

According to the defect data processing device provided by the embodiment of the invention, any plurality of defect detection indexes of any plurality of projects can be calculated at the same time, the multi-dimensional visual display of the multi-project defect data can be realized without manual participation, and the diversified look-up requirements of users are met.

It is noted that the block diagrams shown in the above figures are functional entities and do not necessarily correspond to physically or logically separate entities. These functional entities may be implemented in the form of software, or in one or more hardware modules or integrated circuits, or in different networks and/or processor devices and/or microcontroller devices.

As will be appreciated by one skilled in the art, aspects of the present invention may be embodied as a system, method or program product. Thus, various aspects of the invention may be embodied in the form of: an entirely hardware embodiment, an entirely software embodiment (including firmware, microcode, etc.) or an embodiment combining hardware and software aspects that may all generally be referred to herein as a "circuit," module "or" system.

FIG. 3 is a schematic diagram illustrating a configuration of a computer device, according to an example embodiment. It should be noted that the computer device shown in fig. 3 is only an example, and should not bring any limitation to the function and the scope of the application of the embodiment of the present invention.

As shown in fig. 3, the computer apparatus 800 includes a Central Processing Unit (CPU)801 that can perform various appropriate actions and processes in accordance with a program stored in a Read Only Memory (ROM)802 or a program loaded from a storage section 808 into a Random Access Memory (RAM) 803. In the RAM 803, various programs and data necessary for the operation of the apparatus 800 are also stored. The CPU 801, ROM 802, and RAM 803 are connected to each other via a bus 804. An input/output (I/O) interface 805 is also connected to bus 804.

The following components are connected to the I/O interface 805: an input portion 806 including a keyboard, a mouse, and the like; an output section 807 including a signal such as a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), and the like, and a speaker; a storage portion 808 including a hard disk and the like; and a communication section 809 including a network interface card such as a LAN card, a modem, or the like. The communication section 809 performs communication processing via a network such as the internet. A drive 810 is also connected to the I/O interface 805 as necessary. A removable medium 811 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is mounted on the drive 810 as necessary, so that a computer program read out therefrom is mounted on the storage section 808 as necessary.

In particular, according to an embodiment of the present invention, the processes described above with reference to the flowcharts may be implemented as computer software programs. For example, embodiments of the invention include a computer program product comprising a computer program embodied on a computer-readable medium, the computer program comprising program code for performing the method illustrated in the flow chart. In such an embodiment, the computer program can be downloaded and installed from a network through the communication section 809 and/or installed from the removable medium 811. The computer program performs the above-described functions defined in the apparatus of the present invention when executed by the Central Processing Unit (CPU) 801.

It should be noted that the computer readable medium shown in the present invention can be a computer readable signal medium or a computer readable storage medium or any combination of the two. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples of the computer readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present invention, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. In the present invention, however, a computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wire, fiber optic cable, RF, etc., or any suitable combination of the foregoing.

The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams or flowchart illustration, and combinations of blocks in the block diagrams or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.

The units described in the embodiments of the present invention may be implemented by software or hardware. The described units may also be provided in a processor, and may be described as: a processor includes a transmitting unit, an obtaining unit, a determining unit, and a first processing unit. The names of these units do not in some cases constitute a limitation to the unit itself, and for example, the sending unit may also be described as a "unit sending a picture acquisition request to a connected server".

As another aspect, the present invention also provides a computer-readable medium that may be contained in the apparatus described in the above embodiments; or may be separate and not incorporated into the device. The computer readable medium carries one or more programs which, when executed by a device, cause the device to comprise:

respectively acquiring and storing information of defect data with preset marks of each item to be counted from a project management platform based on each item to be counted; for each item, determining at least one defect detection index data corresponding to the item according to the information of the defect data; and respectively carrying out visual display on the defect detection index data corresponding to each item to be counted.

Exemplary embodiments of the present invention are specifically illustrated and described above. It is to be understood that the invention is not limited to the precise construction, arrangements, or instrumentalities described herein; on the contrary, the invention is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims.

Claims (10)

1. A defect data processing method, comprising:

respectively acquiring and storing information of defect data with preset marks of each item to be counted from a project management platform based on each item to be counted;

for each item to be counted, determining at least one piece of defect detection index data corresponding to the item to be counted according to the information of the defect data; and

and respectively carrying out visual display on the defect detection index data corresponding to each item to be counted.

2. The method of claim 1, wherein the information of the defect data comprises: project version information corresponding to the defect data;

for each item to be counted, determining at least one piece of defect detection index data corresponding to the item to be counted according to the information of the defect data, wherein the determining comprises the following steps: for each item to be counted, determining item version information corresponding to different versions based on different versions of the item to be counted according to item version information corresponding to the defect data;

respectively carrying out visual display on the defect detection index data corresponding to each item to be counted, wherein the visual display comprises the following steps: and respectively carrying out visual processing on the defect detection index data corresponding to different versions of each item to be counted.

3. The method according to claim 1, wherein the at least one defect detection index data corresponding to each item to be counted comprises: and the online defect density is determined by the quotient of the online defect data total amount and the defect data total amount of the item to be counted.

4. The method according to claim 1, wherein the at least one defect detection index data corresponding to each item to be counted comprises: and determining the online defect repair rate according to the quotient of the online defect data amount of which the item repair duration to be counted is less than the first preset duration and the online defect data total amount.

5. The method according to claim 1, wherein the at least one defect detection index data corresponding to each item to be counted comprises: and determining the on-line defect retention rate according to the quotient of the on-line defect data quantity with the item repair time length to be counted being greater than a second preset time length and the on-line defect data total quantity.

6. The method according to claim 1, wherein the at least one defect detection index data corresponding to each item to be counted comprises: and the average repairing time length of the online defects is determined by the quotient of the sum of the repairing time lengths of the online defect data of the items to be counted and the total quantity of the online defect data.

7. The method according to any one of claims 1 to 6, wherein the obtaining and storing information of the defect data with the preset mark of each item to be counted based on each item to be counted from the item management platform respectively comprises: based on a pre-written query statement and an interface provided by a JIRA platform, acquiring and storing information of defect data with online defect data marks of each item to be counted in a preset period from the JIRA platform based on each item to be counted respectively.

8. A defect data processing apparatus, comprising:

the data acquisition module is used for acquiring and storing information of the defect data with the preset marks of each item to be counted based on each item to be counted from the item management platform;

the index determining module is used for determining at least one defect detection index data corresponding to each item to be counted according to the information of the defect data to be counted; and

and the index display module is used for visually displaying the defect detection index data corresponding to each item to be counted respectively.

9. A computer device, comprising: memory, processor and executable instructions stored in the memory and executable in the processor, characterized in that the processor implements the method according to any of claims 1-7 when executing the executable instructions.

10. A computer-readable storage medium having stored thereon computer-executable instructions, which when executed by a processor, implement the method of any one of claims 1-7.

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