CN113358220B - Luminance measurement method and device based on single-pixel imaging - Google Patents
Luminance measurement method and device based on single-pixel imaging Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
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- G—PHYSICS
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- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
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Abstract
The application discloses a brightness measurement method and device based on single-pixel imaging, wherein the method comprises the following steps: setting up a single-pixel imaging type brightness measurement light path based on a digital micro-reflector, correcting the spectral response sensitivity of an incident CCD photosensitive chip and matching with a photopic vision luminous efficiency function V (lambda); collecting one-dimensional coded light field signals of a light emitting device to be tested by using a single-pixel sensor; obtaining two-dimensional light intensity distribution of the light emitting device to be detected based on a single-pixel imaging reconstruction algorithm according to the one-dimensional coded light field signal; and obtaining the brightness information of the light-emitting device to be tested by utilizing photometry and geometrical optics calculation. The method provided by the embodiment of the application does not depend on the imaging type brightness measurement method and device of the high-performance CCD photosensitive chip, and can simultaneously acquire the two-dimensional image information and the brightness information of the light-emitting device.
Description
Technical Field
The present disclosure relates to the field of optical measurement technologies, and in particular, to a brightness measurement method and device based on single-pixel imaging.
Background
Currently, luminance is one of the important photometric measurement parameters, and can quantitatively characterize the luminous intensity of a light-emitting device per unit area in a certain direction, in candela per square meter (cd/m) 2 )。
In the related art, the brightness measurement method mainly adopts an aiming point measurement mode, and a two-dimensional brightness distribution image of the surface of the light-emitting device is obtained in a point-by-point scanning mode. In recent years, with the continuous development of various types of molded-matrix photosensitive chips, imaging type brightness meters based on CCDs (charge coupled device, charge-coupled devices) are becoming mainstream measurement devices. The main structure of the imaging type brightness meter comprises an imaging objective lens, a diaphragm, a V (lambda) filter, a CCD photosensitive chip, a micro-processor and the like. The imaging objective lens collects light rays emitted by the light emitting device, the diaphragm restrains the light beam range, the CCD photosensitive chip directly obtains a two-dimensional image of the light emitting device in an optical imaging mode, and the V (lambda) filter corrects the spectral response sensitivity of the incident CCD photosensitive chip and matches the spectral response sensitivity with the photopic vision efficiency function V (lambda) to obtain brightness information conforming to the visual response of human eyes.
However, the CCD-based imaging type luminance meter has significantly improved the operation convenience and obtained a two-dimensional luminance distribution image with higher spatial resolution as compared with the conventional luminance measurement method, but the imaging type luminance meter currently on the market suffers from the following two problems:
(1) The cost of the refrigeration type high-resolution CCD photosensitive chip is too high. The temperature of the CCD photosensitive chip is obviously increased along with the working time in the acquisition process, so that the influence of serious dark current noise is caused, and therefore, the refrigeration type high-resolution CCD photosensitive chip is required to be used, but the manufacturing process of the type of CCD photosensitive chip is complex, and the manufacturing cost is high;
(2) The quantum efficiency (the ratio of the average photoelectron number generated in unit time to the incident photoelectron number) of the conventional CCD photosensitive chip is about 40% -60%, so that the photoelectric conversion efficiency is low. The quantum conversion efficiency of the back-illuminated CCD can reach 80-90%, but the problems of complex process and high manufacturing cost are faced.
Content of the application
The application provides a brightness measurement method and device based on single-pixel imaging, which are used for solving the problem of dependence of a traditional imaging type brightness meter on a high-performance CCD photosensitive chip.
An embodiment of a first aspect of the present application provides a luminance measurement method based on single-pixel imaging, including the following steps: setting up a single-pixel imaging type brightness measurement light path based on a digital micro-reflector, correcting the spectral response sensitivity of an incident CCD photosensitive chip and matching with a photopic vision luminous efficiency function V (lambda); collecting one-dimensional coded light field signals of a light emitting device to be tested by using a single-pixel sensor; obtaining the two-dimensional light intensity distribution of the light emitting device to be detected based on a single-pixel imaging reconstruction algorithm according to the one-dimensional coded light field signal; and obtaining the brightness information of the light-emitting device to be tested by utilizing photometry and geometrical optics calculation.
Optionally, in an embodiment of the present application, the obtaining the two-dimensional light intensity distribution of the light emitting device to be measured based on the single-pixel imaging reconstruction algorithm includes: and calculating an estimated value of the target image according to the random intensity image modulated by the digital micro-reflector and the second-order correlation of the one-dimensional coded light field signal.
Optionally, in an embodiment of the present application, the calculation formula of the estimated value is:
wherein,<·>the average of N measurements is shown,for the estimated value, P i (x, y) is the random intensity image, S i Is a one-dimensional intensity signal.
Optionally, in an embodiment of the present application, the obtaining the brightness information of the light emitting device to be measured by using photometry and geometrical optics calculation includes: obtaining a virtual image plane illumination value according to the relation between the light intensity distribution and the illumination; and calculating the brightness distribution of the surface of the light emitting device to be detected according to the virtual image plane illuminance value.
Optionally, in an embodiment of the present application, a calculation formula of the brightness distribution of the surface of the light emitting device to be measured is:
E＝ξL，
wherein L is the brightness of the light-emitting device to be detected, and τ is the transmittance of the optical system; f is the focal length of the converging lens, f m =f/D is the F number of the system, D is the aperture diameter.
An embodiment of a second aspect of the present application provides a luminance measurement apparatus based on single-pixel imaging, including: the building module is used for building a single-pixel imaging type brightness measurement light path based on the digital micro-reflector; the correcting module is used for correcting the spectral response sensitivity of the incident CCD photosensitive chip and matching with the photopic vision luminous efficiency function V (lambda); the acquisition module is used for acquiring one-dimensional coded light field signals of the light emitting device to be detected by using the single-pixel sensor; and the calculation module is used for obtaining the two-dimensional light intensity distribution of the light emitting device to be detected based on a single-pixel imaging reconstruction algorithm according to the one-dimensional coded light field signal, and obtaining the brightness information of the light emitting device to be detected by utilizing photometry and geometric optics calculation.
Optionally, in one embodiment of the present application, the acquiring module is specifically configured to calculate the estimated value of the target image according to a second-order correlation of the random intensity image modulated by the digital micro-mirror and the one-dimensional coded light field signal.
Optionally, in an embodiment of the present application, the calculation formula of the estimated value is:
wherein,<·>the average of N measurements is shown,for the estimated value, P i (x, y) is the random intensity image, S i Is a one-dimensional intensity signal.
Optionally, in one embodiment of the present application, the computing module includes: the first calculation unit is used for obtaining a virtual image plane illumination value according to the relation between the light intensity distribution and the illumination; and the second calculating unit is used for calculating the brightness distribution of the surface of the light emitting device to be detected according to the virtual image plane illuminance value.
Optionally, in an embodiment of the present application, a calculation formula of the brightness distribution of the surface of the light emitting device to be measured is:
E＝ξL，
wherein L is the brightness of the light-emitting device to be detected, and τ is the transmittance of the optical system; f is the focal length of the converging lens, f m =f/D is the F number of the system, D is the aperture diameter.
Through setting up single pixel imaging formula luminance measurement light path, carry out single pixel imaging formula luminance measurement to lighting device, utilize single pixel imaging reconstruction algorithm to obtain the lighting device two-dimensional light intensity distribution that awaits measuring, utilize photometry and geometric optics calculation to obtain the lighting device two-dimensional luminance information that awaits measuring, can realize imaging formula luminance measurement, reduce dark current noise influence, improve quantum conversion efficiency, break away from traditional imaging formula luminance meter to the dependence of high performance CCD sensitization chip.
Additional aspects and advantages of the application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the application.
Drawings
The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:
fig. 1 is a flowchart of a brightness measurement method based on single-pixel imaging according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a single pixel imaging luminance measurement light path according to one embodiment of the present application;
fig. 3 is an exemplary diagram of a luminance measurement apparatus based on single-pixel imaging according to an embodiment of the present application.
Detailed Description
Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and intended for the purpose of explaining the present application and are not to be construed as limiting the present application.
The following describes a luminance measurement method and apparatus based on single pixel imaging according to the embodiments of the present application with reference to the accompanying drawings. Aiming at the problem of dependence of the traditional imaging type luminance meter on the high-performance CCD photosensitive chip, the application provides a luminance measurement method based on single-pixel imaging. Therefore, the problem of dependence of the traditional imaging type brightness meter on the high-performance CCD photosensitive chip is solved.
Specifically, fig. 1 is a flow chart of a brightness measurement method based on single-pixel imaging according to an embodiment of the present application.
As shown in fig. 1, the brightness measurement method based on single pixel imaging includes the following steps:
in step S101, a single-pixel imaging type brightness measurement light path based on a digital micro-mirror is constructed, and the spectral response sensitivity of an incident CCD photosensitive chip is corrected and matched with a photopic vision efficiency function V (λ).
As shown in fig. 2, 101 is a light emitting device to be tested, 102 is a diaphragm, 103 is an imaging objective lens, 104 is a spatial light modulation module, 105 is a converging lens, 106 is a visual light efficiency function V (λ) correction module, 107 is a Shan Xiangsu photosensor, and 108 is a microprocessor.
The light emitting device to be measured 101 comprises a self-luminous object, the spatial light modulation module 103 comprises a digital micro-reflector, the visual light visual efficiency function V (lambda) correction module 106 comprises a glass filter, and the spectral response sensitivity of the incident CCD photosensitive chip is corrected and matched with the visual light visual efficiency function V (lambda).
In step S102, a one-dimensional coded light field signal of the light emitting device to be tested is collected by using a single pixel sensor.
For example, assume that the random intensity image modulated by a digital micromirror is P i (x, y), where i=1, 2, k, N represents the ith measurement, the number of measurements is N, and (x, y) is the image coordinates. P (P) i The intensity signals generated after the (x, y) and the light emitting device O (x, y) to be tested act are collected by a converging lens and are collected by a single-pixel photoelectric sensor to form a one-dimensional intensity signal S i From the association relationship, it is derived that:
S i ＝∫∫P i (x,y)I(x,y)dxdy， (1)
in step S103, a two-dimensional light intensity distribution of the light emitting device to be measured is obtained based on a single-pixel imaging reconstruction algorithm according to the one-dimensional coded light field signal. It can be understood that, in the embodiment of the application, the two-dimensional light intensity distribution of the light emitting device to be measured is obtained by using a single-pixel imaging reconstruction algorithm, and the two-dimensional brightness information of the light emitting device to be measured is obtained by using photometry and geometric optics calculation.
Optionally, in one embodiment of the present application, obtaining the two-dimensional light intensity distribution of the light emitting device to be measured based on a single-pixel imaging reconstruction algorithm includes: and calculating an estimated value of the target image according to the second-order correlation of the random intensity image modulated by the digital micro-reflector and the one-dimensional coded light field signal.
In one embodiment of the present application, the calculation formula of the estimated value is:
wherein,<·>the average of N measurements is shown,to estimate the value, P i (x, y) is a random intensity image, S i Is a one-dimensional intensity signal.
For example, after N measurements, the estimated value of the target imageCan be according to P i (x, y) and S i Is a second order correlation of (2):
wherein < · > represents the average of N measurements, and as the number of measurements increases, the target image estimate will gradually approach the true value.
In step S104, luminance information of the light emitting device to be measured is obtained by using photometry and geometrical optics calculation.
Optionally, in one embodiment of the present application, obtaining luminance information of the light emitting device to be measured using photometry and geometrical optics calculation includes: obtaining a virtual image plane illumination value according to the relation between the light intensity distribution and the illumination; and calculating the brightness distribution of the surface of the light-emitting device to be detected according to the virtual image plane illuminance value.
In one embodiment of the present application, the calculation formula of the brightness distribution of the surface of the light emitting device to be measured is:
E＝ξL，
wherein L is the brightness of the light-emitting device to be detected, and τ is the transmittance of the optical system; f is the focal length of the converging lens, f m =f/D is the F number of the system, D is the aperture diameter.
Specifically, the virtual image plane illuminance value E is obtained by the relation between the light intensity distribution and illuminance, and can be derived from photometry and geometric optics:
wherein L is the brightness of the light emitting device to be tested; τ is the transmittance of the optical system; f is the focal length of the converging lens; l is the distance between the lens and the light-emitting device to be tested; f (f) m =f/D is the F number of the system, where D is the aperture diameter.
In general, f/l can be approximately 0 within the error range, i.eApproximately equal to 1, equation (3) can be reduced to:
E＝ξL， (4)
wherein the method comprises the steps ofAnd (4) obtaining the brightness distribution of the surface of the light-emitting device to be detected according to the formula.
In summary, the embodiment of the application builds a single-pixel imaging type brightness measurement light path based on a digital micro-mirror, records a one-dimensional coded light field signal of a light emitting device to be measured by using a single-pixel sensor, obtains two-dimensional light intensity distribution of the light emitting device to be measured by using a single-pixel imaging reconstruction algorithm, and obtains a two-dimensional brightness distribution image of the light emitting device to be measured by calculating the relation between the light intensity distribution and the brightness distribution, thereby reducing the requirement of imaging type brightness measurement equipment on complex high-precision area array detectors (such as CCD (charge coupled device), CMOS (complementary metal oxide semiconductor) and the like), improving the quantum efficiency of the system, and promoting the development of a calculation luminosity measurement technology.
According to the brightness measurement method based on single-pixel imaging, the single-pixel imaging type brightness measurement light path is built, single-pixel imaging type brightness measurement is carried out on the light emitting device, the two-dimensional light intensity distribution of the light emitting device to be measured is obtained through a single-pixel imaging reconstruction algorithm, the two-dimensional brightness information of the light emitting device to be measured is obtained through photometry and geometric optics calculation, imaging type brightness measurement can be achieved, dark current noise influence is reduced, quantum conversion efficiency is improved, and dependence of a traditional imaging type brightness meter on a high-performance CCD photosensitive chip is eliminated.
Next, a luminance measuring apparatus based on single-pixel imaging according to an embodiment of the present application will be described with reference to the accompanying drawings.
Fig. 3 is a block schematic diagram of a brightness measurement device based on single pixel imaging according to an embodiment of the present application.
As shown in fig. 3, the luminance measuring apparatus 10 based on single-pixel imaging includes: the system comprises a building module 100, a correction module 200, an acquisition module 300 and a calculation module 400.
Specifically, the building module 100 is configured to build a single-pixel imaging type brightness measurement light path based on a digital micro-mirror.
And the correction module 200 is used for correcting the spectral response sensitivity of the incident CCD photosensitive chip and matching with the photopic vision luminous efficiency function V (lambda).
The acquisition module 300 is used for acquiring one-dimensional coded light field signals of the light emitting device to be detected by using a single pixel sensor.
The calculation module 400 is configured to obtain a two-dimensional light intensity distribution of the light emitting device to be measured based on a single-pixel imaging reconstruction algorithm according to the one-dimensional coded light field signal, and obtain luminance information of the light emitting device to be measured by using photometry and geometric optics calculation.
Optionally, in one embodiment of the present application, the calculation module 400 is specifically configured to calculate the estimated value of the target image according to the second-order correlation of the digital micro-mirror modulated random intensity image and the one-dimensional coded light field signal.
Optionally, in one embodiment of the present application, the calculation formula of the estimated value is:
wherein,<·>the average of N measurements is shown,to estimate the value, P i (x, y) is a random intensity image, S i Is a one-dimensional intensity signal.
Optionally, in one embodiment of the present application, the computing module 400 includes: a first computing unit and a second computing unit.
The first calculating unit is used for obtaining a virtual image plane illumination value according to the relation between the light intensity distribution and the illumination.
And the second calculating unit is used for calculating the brightness distribution of the surface of the light emitting device to be detected according to the virtual image plane illuminance value.
Optionally, in one embodiment of the present application, a calculation formula of the brightness distribution of the surface of the light emitting device to be measured is:
E＝ξL，
wherein L is the brightness of the light-emitting device to be detected, and τ is the transmittance of the optical system; f is the focal length of the converging lens, f m =f/D is the F number of the system, D is the aperture diameter.
It should be noted that the foregoing explanation of the embodiment of the luminance measurement method based on single-pixel imaging is also applicable to the luminance measurement apparatus based on single-pixel imaging of this embodiment, and will not be repeated here.
According to the brightness measurement device based on single-pixel imaging, the single-pixel imaging type brightness measurement light path is built, single-pixel imaging type brightness measurement is carried out on the light emitting device, two-dimensional light intensity distribution of the light emitting device to be measured is obtained through a single-pixel imaging reconstruction algorithm, two-dimensional brightness information of the light emitting device to be measured is obtained through photometry and geometric optics calculation, imaging type brightness measurement can be achieved, dark current noise influence is reduced, quantum conversion efficiency is improved, and dependence of a traditional imaging type brightness meter on a high-performance CCD photosensitive chip is eliminated.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or N embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the meaning of "N" is at least two, such as two, three, etc., unless explicitly defined otherwise.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more N executable instructions for implementing specific logical functions or steps of the process, and further implementations are included within the scope of the preferred embodiment of the present application in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the embodiments of the present application.
It is to be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above-described embodiments, the N steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. As with the other embodiments, if implemented in hardware, may be implemented using any one or combination of the following techniques, as is well known in the art: discrete logic circuits having logic gates for implementing logic functions on data signals, application specific integrated circuits having suitable combinational logic gates, programmable Gate Arrays (PGAs), field Programmable Gate Arrays (FPGAs), and the like.
Those of ordinary skill in the art will appreciate that all or a portion of the steps carried out in the method of the above-described embodiments may be implemented by a program to instruct related hardware, where the program may be stored in a computer readable storage medium, and where the program, when executed, includes one or a combination of the steps of the method embodiments.
Claims (10)
1. A brightness measurement method based on single-pixel imaging, comprising the steps of:
setting up a single-pixel imaging type brightness measurement light path based on a digital micro-reflector, correcting the spectral response sensitivity of an incident CCD photosensitive chip and matching with a photopic vision luminous efficiency function V (lambda);
collecting one-dimensional coded light field signals of a light emitting device to be tested by using a single-pixel sensor;
obtaining the two-dimensional light intensity distribution of the light emitting device to be detected based on a single-pixel imaging reconstruction algorithm according to the one-dimensional coded light field signal;
and obtaining the brightness information of the light-emitting device to be tested by utilizing photometry and geometrical optics calculation.
2. The method of claim 1, wherein the obtaining the two-dimensional light intensity distribution of the light emitting device under test based on the single-pixel imaging reconstruction algorithm comprises:
and calculating an estimated value of the target image according to the random intensity image modulated by the digital micro-reflector and the second-order correlation of the one-dimensional coded light field signal.
3. The method according to claim 2, wherein the estimated value is calculated by the formula:
wherein,<·>the average of N measurements is shown,for the estimated value, P i (x, y) is the random intensity image, S i Is a one-dimensional intensity signal.
4. The method of claim 1, wherein obtaining the luminance information of the light emitting device to be measured using photometry and geometrical optics calculation comprises:
obtaining a virtual image plane illumination value according to the relation between the light intensity distribution and the illumination;
and calculating the brightness distribution of the surface of the light emitting device to be detected according to the virtual image plane illuminance value.
5. The method of claim 4, wherein the calculation formula of the brightness distribution of the surface of the light emitting device to be measured is:
E＝ξL，
wherein L is the brightness of the light-emitting device to be detected, and τ is the transmittance of the optical system; f is the focal length of the converging lens, f m =f/D is the F number of the system, D is the aperture diameter.
6. A brightness measurement device based on single pixel imaging, comprising:
the building module is used for building a single-pixel imaging type brightness measurement light path based on the digital micro-reflector;
the correcting module is used for correcting the spectral response sensitivity of the incident CCD photosensitive chip and matching with the photopic vision luminous efficiency function V (lambda);
the acquisition module is used for acquiring one-dimensional coded light field signals of the light emitting device to be detected by using the single-pixel sensor;
and the calculation module is used for obtaining the two-dimensional light intensity distribution of the light emitting device to be detected based on a single-pixel imaging reconstruction algorithm according to the one-dimensional coded light field signal, and obtaining the brightness information of the light emitting device to be detected by utilizing photometry and geometric optics calculation.
7. The apparatus of claim 6, wherein the computing module is configured to compute the estimate of the target image based on a second order correlation of the digital micromirror modulated random intensity image and the one-dimensional encoded light field signal.
8. The apparatus of claim 7, wherein the estimation value is calculated by the formula:
wherein,<·>the average of N measurements is shown,for the estimated value, P i (x, y) is the randomIntensity image, S i Is a one-dimensional intensity signal.
9. The apparatus of claim 6, wherein the computing module comprises:
the first calculation unit is used for obtaining a virtual image plane illumination value according to the relation between the light intensity distribution and the illumination;
and the second calculating unit is used for calculating the brightness distribution of the surface of the light emitting device to be detected according to the virtual image plane illuminance value.
10. The device of claim 9, wherein the calculation formula of the brightness distribution of the surface of the light emitting device to be measured is:
E＝ξL，
wherein L is the brightness of the light-emitting device to be detected, and τ is the transmittance of the optical system; f is the focal length of the converging lens, f m =f/D is the F number of the system, D is the aperture diameter.
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