CN113341307B - Short-circuit closing capability test platform and method for open-type grounding switch - Google Patents
Short-circuit closing capability test platform and method for open-type grounding switch Download PDFInfo
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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Abstract
The invention discloses a short-circuit switching-on and switching-off capability test platform and a method of an open-type grounding switch, the method comprises the steps of firstly, setting up a short-circuit switching-on and switching-off capability test platform of the open-type grounding switch, aging the open-type grounding switch through the test platform, obtaining a current signal of the open-type grounding switch when the short-circuit current is switched on and off through a current transformer, connecting an oscilloscope for signal acquisition, acquiring a short-circuit current signal when the open-type grounding switch is switched on and off before and after aging, then carrying out wavelet transformation on the current signal, extracting characteristic parameters from an original signal waveform and a transformed signal waveform, calculating a switching-on and switching-off capability evaluation value of the open-type grounding switch, obtaining the short-circuit switching-on and switching-off capability influence of the open-type grounding switch caused by aging through comparison of the evaluation values before and after the aging of the open-type grounding switch, and finally obtaining a short-circuit switching-on and switching-off capability comprehensive evaluation value of the open-type grounding switch, and evaluating the short-circuit switching-on and switching-off capability of the open-type grounding switch.
Description
Technical Field
The invention belongs to the field of switch state performance evaluation, and particularly relates to a short-circuit closing capability test platform and a short-circuit closing capability test method for an open-type grounding switch.
Background
The open type grounding switch is one of the most important power equipment in a power system, and when a line needs to be overhauled, the grounding switch is switched on for normal work and grounding so as to ensure the safety of the equipment and maintainers; the closing is carried out under the condition of short circuit, and the specified rated short-circuit current and the corresponding peak current can be carried in the specified time so as to ensure the safety of the line.
The open type grounding switch is continuously aged under the action of physical and chemical factors such as heat, electricity and the like in the long-term operation process, and the mechanical and electrical properties are changed, so that the normal operation of the switch equipment is influenced. Aging is a complex physical and chemical change process which is mainly divided into thermal oxidation aging and electrical aging.
The open type grounding switch bears larger current during the period of putting into use, and is mainly influenced by electrical aging, so that the short circuit closing capability of the open type grounding switch is reduced. At present, the performance of an earthing switch is judged according to a standard test, but a systematic method is still not available for evaluating the short-circuit switching-on and switching-off capacity of an open earthing switch, so that it is difficult to accurately judge whether the open earthing switch can meet the performance requirement after aging in real time, and therefore, a method for evaluating the short-circuit switching-on and switching-off capacity of the open earthing switch is urgently needed.
Disclosure of Invention
In order to effectively evaluate the short-circuit switching-on and switching-off capacity of the open type grounding switch, the invention provides a short-circuit switching-on and switching-off capacity test platform and a short-circuit switching-on and switching-off capacity test method of the open type grounding switch.
The technical scheme for realizing the purpose of the invention is as follows:
a short-circuit on-off capability test platform of an open type grounding switch comprises a high-voltage generating device, a current transformer, an oscilloscope device, the open type grounding switch and a comprehensive grounding and protection resistor; wherein:
the high voltage generating device, the open type grounding switch and the protective resistor form an electric main loop to simulate the short circuit condition, the open type grounding switch is connected with the comprehensive grounding end, a current transformer is arranged in the electric main loop between the protective resistor and the open type grounding switch, and two output ports of the current transformer are connected to a probe of the oscilloscope device;
and comparing evaluation values before and after the aging of the open type grounding switch to obtain the influence of the aging on the short circuit on-off capability of the open type grounding switch, and finally obtaining a comprehensive evaluation value of the short circuit on-off capability of the open type grounding switch.
The invention also relates to a method for testing the short-circuit switching-on and switching-off capacity of the open-type grounding switch, which comprises the following steps:
the first step is as follows: building test platform
The second step is that: measuring current signal waveform
The third step: obtaining characteristic parameters
The maximum instantaneous value of the waveform x (t) occurring in the time interval is the peak value
The unit is A; the time required for the waveform x (T) to reach the first peak after exceeding its steady state value is the peak time T p The unit ms; the time required for the waveform x (T) to rise from 10% of the steady-state value to 90% of the steady-state value is the rise time T r Unit ms; the ratio of the instantaneous maximum deviation value to the steady state value of the waveform x (t) is the overshoot p.o., i.e.: />
Wherein, the first and the second end of the pipe are connected with each other,
is the peak value of the waveform x (t), and fv is the steady-state value of the waveform x (t);
the waveform x (T) returns to the range of +/-5% of the new equilibrium state from the original stable state, and the shortest time which elapses until the waveform x (T) does not exceed the new equilibrium state is the regulation time T s The unit ms, namely:
wherein x is the damping ratio of the system, ω n Is the natural frequency of the system;
this signal is wavelet transformed:
wherein psi is mother wavelet, a is scale operator, tau is displacement operator, and phi represents complex conjugate;
a Morlet wavelet function is selected as a mother wavelet function, and the mathematical expression of the Morlet wavelet function is as follows:
after wavelet transformation, analyzing the wavelet spectrum characteristics, and extracting amplitude-frequency characteristic parameters F for describing the spectrum characteristics 1 、 F 2 ：
The fourth step: calculating the evaluation value of the closing capability
Firstly, a short-circuit current closing test is carried out on a new open type grounding switch, after characteristic parameters are obtained through waveform x (t) and wavelet transformation, a closing capability evaluation value K is adopted to evaluate the characteristic parameters:
aging the open type grounding switch through electrical aging to obtain the grounding switch after aging treatment for i hours; the short-circuit current with the same size as that before aging is adopted, under the same input condition,obtaining the waveform x' (t) of the aged open-type grounding switch closing short-circuit current and performing wavelet transformation to obtain the characteristic parameters
T p ′、T r ′、P.O.′、T s ′、F 1 ' and F 2 ', calculating the evaluation value K after aging i ′：
The fifth step: comprehensive evaluation of short-circuit closing capability of open type grounding switch
The influence of aging on the short-circuit on-off capacity of the open type grounding switch is obtained through comparison of evaluation values before and after aging of the open type grounding switch, and finally a comprehensive evaluation value K of the short-circuit on-off capacity of the open type grounding switch is obtained i ：
Wherein, β is a correction coefficient of the comprehensive evaluation value of the short-circuit on-off capability of the open-type grounding switch, and the comprehensive evaluation value needs to be corrected according to different open-type short-circuit switch models.
Further, in the second step, the specific steps of measuring the current signal waveform are as follows:
the open type grounding switch (4) is firstly in an on-off state, a high voltage is generated by using a high voltage generating device (1), the open type grounding switch (4) is closed after the voltage is stabilized, the current waveform x (t) of the open type grounding switch (4) when the short-circuit current is closed is obtained by adjusting a vertical input sensitivity selection switch and a time base scanning rate selection switch of an oscilloscope device (3), after the waveform measurement is completed, the voltage generated by the high voltage generating device (1) is changed, so that 3 times of rated current flows through the open type grounding switch (4) all the time, the aging process of the open type grounding switch (4) is completed in an electrical aging mode, the aging time i is recorded, and then the aged current waveform x' (t) is measured;
furthermore, in the current waveform x (t), t is less than or equal to 10s; the aging time i is 500 in h.
Further, the scale operator a is larger than 0.
Further, in the fifth step:
when K is i When the value is between 0 and b, the open-type grounding switch can normally close the short-circuit current; when K is i If the value is larger than b, the open type grounding switch is indicated to be difficult to normally close the short-circuit current under the condition, and b is a critical value for judging whether the open type grounding switch can normally close the short-circuit current.
The invention also relates to an electronic device comprising a memory, a processor and a computer program running on the memory and on the processor, wherein the processor implements the steps of the method when executing the computer program.
The invention also relates to a non-transitory computer-readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the method as described above.
Compared with the prior art, the invention has the following beneficial effects:
the method comprises the steps of aging an open type grounding switch through a test platform, acquiring a current signal of the open type grounding switch when the open type grounding switch is closed and closed by a current transformer, connecting an oscilloscope for signal acquisition, acquiring a short-circuit current signal of the open type grounding switch when the open type grounding switch is closed and closed before and after aging, then performing wavelet transformation on the current signal, extracting characteristic parameters from an original signal waveform and a transformed signal waveform, calculating an evaluation value of the closing capability of the open type grounding switch, obtaining the influence of aging on the short-circuit closing capability of the open type grounding switch by comparing the evaluation values before and after aging of the open type grounding switch, finally obtaining a comprehensive evaluation value of the short-circuit closing capability of the open type grounding switch, and evaluating the short-circuit closing capability of the open type grounding switch. And extracting characteristic parameters for describing current waveform signals from a plurality of angles, and then visually judging whether the open type grounding switch can normally close the short-circuit current or not through comprehensive capacity evaluation values.
Drawings
FIG. 1 is a schematic structural view of the platform of the present invention;
fig. 2 is a flow chart of the method of the present invention.
Detailed Description
The technical solutions in the embodiments will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the examples without making any creative effort, shall fall within the protection scope of the present invention.
Unless otherwise defined, technical or scientific terms used in the embodiments of the present application should have the ordinary meaning as understood by those having ordinary skill in the art. The use of "first," "second," and similar words in this embodiment does not denote any order, quantity, or importance, but rather the terms "first," "second," and the like are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. "mounted," "connected," and "coupled" are to be construed broadly and may, for example, be fixedly coupled, detachably coupled, or integrally coupled; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. "upper," "lower," "left," "right," "transverse," and "vertical" are used merely for purposes of orientation relative to the elements in the drawings, and these directional terms are relative terms, which are used for descriptive and clarifying purposes and which can vary accordingly depending upon the orientation in which the elements in the drawings are placed.
As shown in fig. 1, the short-circuit closing capability test platform of the open-type grounding switch of the present embodiment includes a high-voltage generator 1, a current transformer 2, an oscilloscope apparatus 3, an open-type grounding switch 4, a comprehensive grounding 5, and a protection resistor 6. The high voltage generator 1, the current transformer 2 and the oscilloscope device 3 are all existing devices.
The high-voltage generator 1, the open type grounding switch 4 and the protection resistor 6 form an electric main loop to simulate short-circuit conditions, the open type grounding switch 4 is connected with the comprehensive grounding end 5, a current transformer 2 is arranged in the electric main loop between the protection resistor 6 and the open type grounding switch 4, and two output ports of the current transformer 2 are connected to a probe of the oscilloscope device 3.
Fig. 2 is a schematic structural diagram of a short-circuit closing capability evaluation research test platform of an open-type grounding switch, and as can be seen from fig. 2, the method of the embodiment includes the following steps:
the first step is as follows: building test platform
The method comprises the steps of building a short-circuit closing capability evaluation research test platform of an open type grounding switch, mainly comprising a high-voltage generator 1, a current transformer 2, an oscilloscope device 3, an open type grounding switch 4, a comprehensive grounding 5 and a protection resistor 6, wherein the high-voltage generator 1, the open type grounding switch 4 and the protection resistor 6 form an electric main loop, simulating the short-circuit condition, using the comprehensive grounding 5 and the protection resistor 6 to protect the device, installing the current transformer 2 in the electric main loop, and connecting two output ports of the current transformer 2 to probes of the oscilloscope device 3;
the second step: measuring current signal waveform
The open type grounding switch 4 is firstly in an on-off state, a high voltage of 110kV is generated by using a high voltage generator 1, the open type grounding switch 4 is closed after the voltage is stabilized, the current waveform x (t) (t is less than or equal to 10 s) of the open type grounding switch 4 when the short-circuit current is closed is obtained by adjusting a vertical input sensitivity selection switch and a time base scanning speed selection switch of an oscilloscope device 3, after the waveform measurement is completed, the voltage generated by the high voltage generator 1 is changed, so that 3 times of rated current flows through the open type grounding switch 4 all the time, the aging process of the open type grounding switch 4 is completed in an electrical aging mode, the value of the aging time i is recorded and is 500, the unit is h, and then the aged current waveform x' (t) measurement is carried out;
the third step: obtaining characteristic parameters
The maximum instantaneous value of the waveform x (t) occurring in the time interval is the peak value
The unit is A; the time required for the waveform x (T) to reach the first peak after exceeding its steady state value is the peak time T p =2.73, unit ms; the time required for the waveform x (T) to rise from 10% of the steady-state value to 90% of the steady-state value is the rise time T r =2.34, unit ms; the ratio of the instantaneous maximum deviation value to the steady state value of the waveform x (t) is the overshoot p.o., i.e.: />
Wherein the content of the first and second substances,
is the peak value of the waveform x (t), and fv is the steady-state value of the waveform x (t);
the waveform x (T) returns to the range of +/-5% of the new equilibrium state from the original stable state, and the shortest time which elapses until the waveform x (T) does not exceed the new equilibrium state is the regulation time T s The unit ms, namely:
where x is the damping ratio of the system, ω n Is the natural frequency of the system;
this signal is wavelet transformed:
wherein psi is mother wavelet, a (a > 0) is scale operator, tau is displacement operator, and phi represents complex conjugation;
a Morlet wavelet function is selected as a mother wavelet function, and the mathematical expression of the Morlet wavelet function is as follows:
after wavelet transformation, analyzing the wavelet spectrum characteristics, and extracting amplitude-frequency characteristic parameters F for describing the spectrum characteristics 1 、 F 2 ：
The fourth step: calculating the evaluation value of the closing capability
Firstly, a short-circuit current closing test is carried out on a new open type grounding switch, after characteristic parameters are obtained through waveform x (t) and wavelet transformation, a closing capability evaluation value K is adopted to evaluate the characteristic parameters:
aging the open type grounding switch through electrical aging to obtain the grounding switch after 500 hours of aging treatment; obtaining the waveform x' (t) of the aged open type grounding switch closing short-circuit current and performing wavelet transformation to obtain the characteristic parameters thereof by adopting the short-circuit current with the same size as the short-circuit current before aging under the same input condition
T p ′＝2.19、T r ′＝1.71、P.O.′＝8.64、 T s ′＝49.67、F 1 ' =7.44 and F 2 ' =5.18, calculate evaluation value K after aging i ′：
The fifth step: comprehensive evaluation of short-circuit closing capability of open type grounding switch
The influence of aging on the short-circuit on-off capacity of the open type grounding switch is obtained through comparison of evaluation values before and after aging of the open type grounding switch, and finally a comprehensive evaluation value K of the short-circuit on-off capacity of the open type grounding switch is obtained i ：
Wherein beta is a correction coefficient of a comprehensive evaluation value of the short-circuit on-off capacity of the open-type grounding switch, 1 is taken here, and the comprehensive evaluation value needs to be corrected according to different open-type short-circuit switch models;
when K is i When the value is between 0 and 2, the open type grounding switch can normally close the short-circuit current; when K is i When the value is larger than 2, the open type grounding switch is indicated to be difficult to normally close the short-circuit current under the condition, and b is a critical value for judging whether the open type grounding switch can normally close the short-circuit current.
After the open type grounding switch is aged for i =500h, the comprehensive evaluation value K of the short-circuit on-off capacity of the open type grounding switch i And the number of the open-type grounding switches is between 0 and 2, and the open-type grounding switches can normally close the short-circuit current and are still in a normal working range.
Optionally, an embodiment of the present application further provides a storage medium, where instructions are stored, and when the storage medium is run on a computer, the storage medium causes the computer to execute the method according to the embodiment described above.
Optionally, an embodiment of the present application further provides a chip for executing the instruction, where the chip is configured to execute the method in the foregoing illustrated embodiment.
The embodiments of the present application also provide a program product, where the program product includes a computer program, where the computer program is stored in a storage medium, and at least one processor can read the computer program from the storage medium, and when the at least one processor executes the computer program, the at least one processor can implement the method of the above-mentioned embodiments.
In the above embodiments, the implementation may be wholly or partially realized by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, cause the processes or functions described in accordance with the embodiments of the application to occur, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored on a readable storage medium or transmitted from one readable storage medium to another readable storage medium, for example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital Subscriber Line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The readable storage medium may be any available medium that can be accessed by a computer or a data storage device including one or more available media integrated servers, data centers, and the like. The usable medium may be a magnetic medium (e.g., a floppy disk, a hard disk, a magnetic tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a Solid State Disk (SSD)), among others.
It is to be understood that the various numerical references referred to in the embodiments of the present application are merely for convenience of description and distinction and are not intended to limit the scope of the embodiments of the present application.
It should be understood that, in the embodiment of the present application, the sequence numbers of the above-mentioned processes do not imply an order of execution, and the order of execution of the processes should be determined by their functions and inherent logic, and should not limit the implementation process of the embodiment of the present application in any way.
Claims (7)
1. A short-circuit switching-on and switching-off capability test method of an open-type grounding switch is characterized by comprising the following steps: the method comprises the following steps:
the first step is as follows: building test platform
The testing platform comprises a high-voltage generating device (1), a current transformer (2), an oscilloscope device (3), an open type grounding switch (4), a comprehensive grounding (5) and a protective resistor (6); wherein:
the high-voltage part of the high-voltage generating device (1) is connected with a protective resistor (6), the grounding part of the high-voltage generating device (1) is connected with the end of a comprehensive grounding switch (5), the other end of the protective resistor (6) is connected with an open type grounding switch (4), the open type grounding switch (4) is connected with the end of the comprehensive grounding switch (5), a current transformer (2) is arranged between the protective resistor (6) and the open type grounding switch (4), and two output ports of the current transformer (2) are connected to a probe of an oscilloscope device (3);
the second step is that: measuring a current signal waveform;
the third step: obtaining characteristic parameters
The maximum instantaneous value of the waveform x (t) occurring in the time interval is the peak value
The unit is A; the time required for the waveform x (T) to reach the first peak after exceeding its steady state value is the peak time T p Unit ms; the time required for the waveform x (T) to rise from 10% of the steady-state value to 90% of the steady-state value is the rise time T r The unit ms; the ratio of the instantaneous maximum deviation value to the steady state value of the waveform x (t) is the overshoot p.o., i.e.:
wherein, the first and the second end of the pipe are connected with each other,
is the peak value of the waveform x (t), and fv is the steady-state value of the waveform x (t);
the waveform x (T) returns to the range of +/-5% of the new equilibrium state from the original stable state, and the shortest time which elapses until the waveform x (T) does not exceed the new equilibrium state is the regulation time T s The unit ms, namely:
where ξ is the damping ratio of the system, ω n Is the natural frequency of the system;
wavelet transform the waveform x (t):
wherein, the matrix is mother wavelet, a is scale operator, and is displacement operator, and x represents complex conjugation;
a Morlet wavelet function is selected as a mother wavelet function, and the mathematical expression of the Morlet wavelet function is as follows:
after wavelet transformation, analyzing the wavelet spectrum characteristics, and extracting amplitude-frequency characteristic parameters F for describing the spectrum characteristics 1 、F 2 ：
The fourth step: calculating the evaluation value of the closing capability
Firstly, a short-circuit current closing test is carried out on a new open type grounding switch, after characteristic parameters are obtained through waveform x (t) and wavelet transformation, a closing capability evaluation value K is adopted to evaluate the characteristic parameters:
aging the open type grounding switch through electrical aging to obtain the grounding switch after aging treatment for i hours; obtaining the waveform x '(t) of the aged open type grounding switch closing short-circuit current by adopting the short-circuit current with the same magnitude as that before the aging under the same input condition, and performing wavelet transformation to obtain the characteristic parameter M' Pt 、T p ′、T r ′、P.O.′、T s ′、F 1 ' and F 2 ', calculation of the evaluation value K after aging i ′：
The fifth step: comprehensive evaluation of short-circuit closing capability of open type grounding switch
The influence of aging on the short-circuit on-off capacity of the open type grounding switch is obtained through comparison of evaluation values before and after aging of the open type grounding switch, and finally a comprehensive evaluation value K of the short-circuit on-off capacity of the open type grounding switch is obtained i ：
Wherein, β is a correction coefficient of the comprehensive evaluation value of the short-circuit on-off capability of the open-type grounding switch, and the comprehensive evaluation value needs to be corrected according to different open-type short-circuit switch models.
2. The method for testing the short-circuit closing capability of an open-type grounding switch according to claim 1, wherein: in the second step, the specific steps of measuring the current signal waveform are as follows:
the open type grounding switch (4) is firstly in an open state, a high voltage is generated by using a high voltage generating device (1), the open type grounding switch (4) is closed after the voltage is stabilized, the current waveform x (t) of the open type grounding switch (4) when the short-circuit current is closed is obtained by adjusting a vertical input sensitivity selection switch and a time base scanning speed selection switch of an oscilloscope device (3), after the waveform measurement is completed, the voltage generated by the high voltage generating device (1) is changed, so that 3 times of rated current always flows through the open type grounding switch (4), the aging process of the open type grounding switch (4) is completed in an electrical aging mode, the aging time i is recorded, and then the aged current waveform x' (t) is measured.
3. The method for testing the short-circuit closing capability of an open-type grounding switch according to claim 2, wherein: in the current waveform x (t), t is less than or equal to 10s; the aging time i is 500 in h.
4. The method for testing the short-circuit closing capability of an open-type grounding switch according to claim 1, wherein: the scale operator a is greater than 0.
5. The method for testing the short-circuit closing capability of an open-type grounding switch according to claim 1, wherein: in the fifth step:
when K is i When the value is between 0 and b, the open-type grounding switch can normally close the short-circuit current; when K is i If the value is larger than b, the open type grounding switch is difficult to normally close the short-circuit current, and b is a critical value for judging whether the open type grounding switch can normally close the short-circuit current.
6. An electronic device comprising a memory, a processor, and a computer program that is executable on the memory and on the processor, wherein: the processor, when executing the computer program, realizes the steps of the method of any of the preceding claims 1 to 5.
7. A non-transitory computer-readable storage medium having stored thereon a computer program, characterized in that: the computer program, when being executed by a processor, realizes the steps of the method as claimed in any one of claims 1 to 5.
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