CN113340187A - Thickness gauge, control circuit and magnetic and eddy current dual-mode measuring method - Google Patents
Thickness gauge, control circuit and magnetic and eddy current dual-mode measuring method Download PDFInfo
- Publication number
- CN113340187A CN113340187A CN202110608731.4A CN202110608731A CN113340187A CN 113340187 A CN113340187 A CN 113340187A CN 202110608731 A CN202110608731 A CN 202110608731A CN 113340187 A CN113340187 A CN 113340187A
- Authority
- CN
- China
- Prior art keywords
- measuring head
- measuring
- magnetic
- key
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
The invention discloses a thickness gauge, a control circuit and a magnetic and eddy current dual-mode measuring method.A display screen is arranged on the front side of a packaging shell, an operation panel is arranged on the lower side of the display screen, and a power key, a zero calibration key, a menu key, a backlight on-off key/return key, a menu up key, a menu down key and a rotary display screen key are arranged on the operation panel; the measuring head assembly for measuring the thickness is arranged at the bottom of the packaging shell and comprises a measuring head positioning sleeve, a sensor measuring head and a spring, an integrated circuit board is arranged inside the packaging shell, and a processor module, a USB interface module, a key module, a Bluetooth module, a display module, an alarm module, a storage module, a power supply module and a control circuit are integrated on the integrated circuit board. The thickness of the non-magnetic covering layer on the magnetic metal substrate and the thickness of the non-conductive covering layer on the non-magnetic metal substrate can be measured by adopting two thickness measuring methods of magnetism and eddy current.
Description
Technical Field
The invention relates to the technical field of measurement, in particular to a thickness gauge, a control circuit and a magnetic and eddy current dual-mode measurement method.
Background
On one hand, the surface of a metal substrate and a coating have great influence on measurement, the influence is increased along with the increase of roughness, and the influence of the surface roughness can cause system errors and accidental errors, so that the errors need to be eliminated by measuring at each position for multiple times, and the current thickness gauge adopts single-point or even single-time calibration, so that the calibration accuracy cannot be ensured;
on the other hand, the body to be measured is made of metal materials and non-metal materials, the current thickness gauge cannot realize real-time measurement on bodies made of different materials, the instrument measurement needs to be replaced aiming at the bodies made of different materials, and the market demand cannot be met;
the prior art can not meet the requirements of people at the present stage, and the prior art is urgently needed to be reformed based on the current situation.
Disclosure of Invention
The present invention is directed to a thickness gauge, a control circuit, and a magnetic and eddy current dual-mode measuring method, so as to solve the problems of the background art.
The invention provides a thickness gauge, a control circuit and a magnetic and eddy current dual-mode measuring method according to the following technical scheme, which comprises a packaging shell, wherein a display screen is arranged on the front side of the packaging shell, and the display screen is provided with battery residual capacity display information, measuring head type information, thickness measurement value information and unit system information;
an operation panel is arranged on the lower side of the display screen, and a power key, a zero calibration key, a menu key, a backlight on-off key/return key, a menu up key, a menu down key and a rotary display screen key are arranged on the operation panel;
the bottom of the packaging shell is provided with a measuring head component for measuring the thickness, the measuring head component comprises a measuring head positioning sleeve, a sensor measuring head and a spring, the front end of the sensor measuring head extends out by 1.5CM from the inside of the measuring head positioning sleeve, the rear end of the sensor measuring head is installed in the measuring head positioning sleeve through the spring, and the maximum compression distance of the spring is 1.5CM, so that when the measuring head component is used for measuring, the sensor measuring head is placed on a physical surface to be measured, the sensor measuring head is vertically contacted with a test surface downwards and slightly presses the measuring head positioning sleeve, the sensor measuring head can retract towards the inside of the measuring head positioning sleeve along with the compression of the spring until the sensor measuring head and the measuring head positioning sleeve are kept horizontal, and the sensor measuring head is effectively protected from being damaged due to;
the sensor probe comprises an F-shaped sensor probe, wherein the F-shaped sensor probe is used for measuring the thickness of a non-magnetic covering layer (such as aluminum, chromium, copper, enamel, rubber, paint and the like) on a magnetic metal matrix (such as steel, iron, alloy, hard magnetic steel and the like); the F-type sensor measuring head adopts a magnetic measuring method, when the F-type sensor measuring head is contacted with the covering layer, the measuring head and the magnetic metal matrix form a closed magnetic circuit, the magnetic resistance of the magnetic circuit is changed due to the existence of the non-magnetic covering layer, and the thickness of the covering layer can be derived by measuring the change of the magnetic resistance;
the sensor measuring head also comprises an N-type sensor measuring head, wherein the N-type sensor measuring head is used for measuring the thickness of a non-conductive covering layer (such as enamel, rubber, paint, plastic and the like) on a non-magnetic metal substrate (such as copper, aluminum, zinc, tin and the like); the N-type sensor measuring head adopts an eddy current measuring method, an electromagnetic field is generated in a coil by utilizing high-frequency alternating current, when the measuring head is in contact with a covering layer, an eddy current is generated on a metal base body, a feedback effect is generated on the coil in the measuring head, and the thickness of the covering layer can be derived by measuring the size of the feedback effect.
The inside integrated circuit board that is equipped with of packaging shell, and integrated processor module, USB interface module, button module, bluetooth module, display module, alarm module, storage module, power module and control circuit on the integrated circuit board, sensor gauge head is coupled control circuit, control circuit includes: an eddy current thickness measuring circuit and a magnetic circuit thickness measuring circuit;
the eddy current thickness measuring circuit comprises an eddy current sensor, the eddy current sensor is coupled with a capacitor C31, a capacitor C32, a capacitor C43, a capacitor C44, a resistor R40 and a potentiometer to form an RC oscillating circuit, the eddy current thickness measuring circuit further comprises a counter, and a No. 1 pin of the counter is coupled with a processor through a series connection capacitor C35
The magnetic circuit thickness measuring circuit comprises a magnetic sensor, wherein an SIN output end of the magnetic sensor is coupled with an operational amplifier U9A, an output end of the operational amplifier U9A is coupled with a differential circuit to form two output ends, wherein a first output end is coupled with a processor through a coupled reverse Schmitt trigger U8D, a reference square wave signal generating end is arranged between the reverse Schmitt trigger U8D and the processor, a second output end is coupled with an SOUT input end of the magnetic sensor through a coupled potentiometer and an integrating circuit, the SIN output end of the magnetic sensor forms a magnetic circuit from an operational amplifier TLC27M4 to a magnetic sensor Sout input end,
the voltage follower circuit is coupled with the reverse input end of the differential circuit and the reverse input end of the integrating circuit and comprises an amplifier and a charge pump, the charge pump generates 2V voltage and loads the voltage to the same-direction input end of the amplifier, the feedback end of the amplifier is directly communicated through a lead, the voltage is not amplified, and the voltage 1:1 following is kept.
Advantageous effects
The thickness of a non-magnetic covering layer on a magnetic metal substrate and the thickness of a non-conductive covering layer on a non-magnetic metal substrate can be measured by adopting two thickness measuring methods of magnetism and eddy current; the magnetic sensor and the eddy current sensor are respectively coupled with the magnetic circuit thickness measuring circuit and the eddy current thickness measuring circuit and integrated in the same instrument, one sensor can be selected to measure a corresponding measuring body through a menu key, and the invention has two alternative measuring modes of a continuous measuring mode and a single measuring mode, and is provided with five statistics: MEAN (MEAN), Maximum (MAX), Minimum (MIN), number of tests (No.), standard deviation; during the measurement, the deletion function can be selected through the menu key, the single suspicious data appearing in the measurement can be deleted, and all the data in the storage area can be deleted, so that the new measurement can be carried out.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a block diagram of an internal integrated circuit board according to the present invention;
FIG. 3 is a schematic diagram of an eddy current thickness measuring circuit of the control circuit of the present invention;
FIG. 4 is a schematic diagram of a magnetic circuit thickness measuring circuit of the control circuit of the present invention;
FIG. 5 is a schematic diagram of the principle of the magnetic measurement method of the present invention;
FIG. 6 is a schematic diagram of the operation principle of the eddy current measurement method of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the invention without making any creative effort, shall fall within the protection scope of the invention.
The invention provides a thickness gauge, a control circuit and a magnetic and eddy current dual-mode measuring method in the following technical scheme, which comprises a packaging shell;
referring to fig. 1, a display screen is arranged on the front side of the package housing, and the display screen has battery remaining capacity display information, gauge head type information, thickness measurement value information, and unit system information; an operation panel is arranged on the lower side of the display screen, and a power key, a zero calibration key, a menu key, a backlight on-off key/return key, a menu up key, a menu down key and a rotary display screen key are arranged on the operation panel; the utility model discloses a measuring head, including the measuring head locating sleeve, the spring is installed in the inside of measuring head locating sleeve, the packing casing bottom is equipped with the gauge head subassembly of measuring thickness, this gauge head subassembly includes gauge head locating sleeve, the sensor gauge head, the spring, the front end of sensor gauge head is outwards stretched out 1.5CM by the inside of measuring head locating sleeve, and the rear end of sensor gauge head passes through spring mounting in the inside of measuring head locating sleeve, the maximum compression distance of this spring is 1.5CM, so, when using the measuring head subassembly to measure, arrange the sensor gauge head in and await measuring the measuring physical surface, downwards with sensor gauge head and test surface ground contact and gently press the gauge head locating sleeve, along with the compression of spring, the sensor gauge head can be to the inside withdrawal of measuring head locating sleeve, until sensor gauge head and measuring head locating sleeve keep the level, the effectual sensor gauge head of having protected does not receive the extrusion and cause the damage.
Referring to fig. 2, an integrated circuit board is disposed inside the package housing, and a processor module, a USB interface module, a key module, a bluetooth module, a display module, an alarm module, a storage module, a power supply module, and a control circuit are integrated on the integrated circuit board, the sensor probe is coupled to the control circuit, and the control circuit includes: an eddy current thickness measuring circuit and a magnetic circuit thickness measuring circuit;
referring to fig. 3, the eddy current thickness measuring circuit includes an eddy current sensor, and the eddy current sensor is coupled with a capacitor C31, a capacitor C32, a capacitor C43, a capacitor C44, a resistor R40 and a potentiometer to form an RC oscillation circuit, the eddy current thickness measuring circuit further includes a counter, a pin 1 of the counter is coupled with a processor through a series connection capacitor C35, and a 74Hz reference square wave signal is generated at an input port N1 of the processor through a counter 74HC4060 chip, and due to different probe coil parameter differences, an oscillation frequency is determined by a phase balance condition, and a relationship is as follows:
the oscillation frequency can be changed by changing R, C in the formula, the RC oscillation circuit can generate a 74Hz reference square wave signal by adjusting the capacitance or resistance of the capacitor C31, the capacitor C32, the capacitor C43, the capacitor C44, the resistor R40 and a potentiometer in the RC oscillation circuit, calibration is performed during measurement, a maximum frequency point M1 (called as a calibration zero point) is generated at the end N1, when different bodies to be measured are connected, a square wave signal which is larger than 74Hz and smaller than M1 is generated at the end N1, the port signal is read by a processor, different frequency points correspond to different thicknesses, and the test values are displayed on a display screen, so that the thickness measurement of the non-magnetic body to be measured is completed.
Referring to fig. 4, the magnetic circuit thickness measuring circuit includes a magnetic sensor, the SIN output terminal of the magnetic sensor is coupled to an operational amplifier U9A, the output terminal of the operational amplifier U9A forms two output terminals by being coupled to a differential circuit, wherein the first output terminal is coupled to a processor by being coupled to an inverse schmitt trigger U8D, and a reference square wave signal generating terminal is provided between the inverse schmitt trigger U8D and the processor, the second output terminal is coupled to the SOUT input terminal of the magnetic sensor by being coupled to a potentiometer and an integrating circuit, the SIN output terminal of the magnetic sensor forms a magnetic circuit to the magnetic sensor SOUT input terminal through an operational amplifier TLC27M4, the inverse input terminal of the differential circuit and the inverse input terminal of the integrating circuit are coupled to a voltage follower circuit, the voltage follower circuit includes an amplifier and a charge pump, the charge pump generates a voltage of 2V to be applied to the same-direction input terminal of the amplifier, the feedback end of the amplifier is directly communicated through a wire, the voltage is not amplified, and the follow of 2V voltage 1:1 is kept; because the square wave voltage which can be processed by the processor cannot be achieved without adding the voltage follower circuit, the voltage follower circuit is added into the circuit to provide 2V bias voltage, so that the original square wave voltage signal is biased by 2V and is easy to be identified and processed by the processor, and a foundation is laid for measuring the frequency of the square wave signal and judging the thickness;
when the magnetic measuring body is in a state to be measured, a 2.4KHz reference square wave signal can be generated at the N2 end by the No. 8 pin of the reverse Schmitt trigger U8D, due to the parameter difference of different measuring heads, the potentiometer is adjusted to generate the 2.4KHz reference signal, calibration is firstly carried out during measurement, a maximum frequency point M2 (called as a calibration zero point) can be generated at the N2 end, when different measuring bodies are accessed, a square wave signal with the frequency being more than 2.4KHz and less than M2 is generated at the N2 end, the N2 signal is read by the processor, different frequency points correspond to different thicknesses, and a test value is displayed on the display screen, so that the thickness measurement of the magnetic measuring body is realized.
Referring to fig. 5, the sensor probe comprises an F-type sensor probe for measuring the thickness of a non-magnetic coating (e.g., aluminum, chromium, copper, enamel, rubber, paint, etc.) on a magnetic metal substrate (e.g., steel, iron, alloys, and hard-magnetic steel, etc.); the F-type sensor measuring head adopts a magnetic measuring method, when the F-type sensor measuring head is contacted with the covering layer, the measuring head and the magnetic metal matrix form a closed magnetic circuit, the magnetic resistance of the magnetic circuit is changed due to the existence of the non-magnetic covering layer, and the thickness of the covering layer can be derived by measuring the change of the magnetic resistance;
referring to fig. 6, the sensor probe further comprises an N-type sensor probe for measuring the thickness of a non-conductive coating (e.g., enamel, rubber, paint, plastic, etc.) on a non-magnetic metal substrate (e.g., copper, aluminum, zinc, tin, etc.); the N-type sensor measuring head adopts an eddy current measuring method, an electromagnetic field is generated in a coil by utilizing high-frequency alternating current, when the measuring head is in contact with a covering layer, an eddy current is generated on a metal base body, a feedback effect is generated on the coil in the measuring head, and the thickness of the covering layer can be derived by measuring the size of the feedback effect.
Before measurement, zero calibration is needed, 5 test pieces and 2 matrixes are prepared, and the thickness of each test piece is 50mm,100mm,250mm,500mm and 1000 mm.
The first calibrated matrix was an iron matrix:
pressing the menu up key and clicking the power key, hearing the sound of 'B', entering the F calibration interface on the page, displaying '0 th point', perfectly contacting the measuring head with the iron substrate, calibrating through the zero calibration key, displaying 0.0um, and repeating for multiple times to finish the calibration of the 0 th point.
Placing the first 50um test piece on the iron base body, perfectly contacting the measuring head with the test piece, displaying the 1 st point on the display screen, displaying the thickness of the iron base body on the display screen, correcting the reading through the menu up key and the menu down key to reach the standard value, repeatedly testing the test piece and correcting the reading, and completing the calibration of the test piece.
The standard sheet is used, the thickness can be increased for multiple times, and the steps are repeated until all the test pieces are calibrated by placing a second test piece and a third test piece … … on the iron base body in sequence.
After all the test pieces are calibrated, the measuring head is directly contacted with the iron matrix, the 'calibration is completed' is displayed, and the machine is automatically turned off, so that the calibration of the iron matrix is completed.
The second type of substrate for calibration is an aluminum substrate, which is replaced with aluminum and the above steps are repeated to complete the aluminum substrate calibration.
When the device is used, the distance between the device and a metal table top to be measured is at least 5cm, then the device is electrified, the initialization of the system is waited for 5 seconds, and during measurement, a magnetic measurement method and an eddy current measurement method are adopted, wherein the magnetic measurement method and the eddy current measurement method have two measurement modes of single-point measurement and rapid continuous measurement; setting a menu as a single-point measurement mode through a menu key, vertically contacting the measuring head with the test surface and slightly pressing the measuring head positioning sleeve, sounding along with a sound, displaying the measured value on a display screen, lifting the measuring head to perform next measurement, vertically and quickly measuring the matrix, and displaying the result in a liquid crystal mode after prompting the sound; and (3) quick continuous measurement, namely setting a menu to be in a continuous measurement mode through a menu key, vertically placing the probe on the substrate, and randomly changing a measurement point for the next measurement, wherein the probe does not need to be removed from the substrate in the process.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that various changes in the embodiments and/or modifications of the invention can be made, and equivalents and modifications of some features of the invention can be made without departing from the spirit and scope of the invention.
Claims (7)
1. The utility model provides a calibrator, control circuit, includes packaging shell (1), its characterized in that: the front side of the packaging housing (1) has a display: a display screen (2) for displaying information of the remaining battery capacity, information of the type of the measuring head, information of the thickness measurement value and information of a unit system;
an operation panel is arranged on the lower side of the display screen (2), and a power key (3), a zero calibration key (4), a menu key (5), a backlight switch key/return key (6), a menu up key (7), a menu down key (8) and a rotary display screen key (9) are arranged on the operation panel;
the bottom of the packaging shell is provided with a measuring head component (10) for measuring the thickness, and the measuring head component comprises a measuring head positioning sleeve, a sensor measuring head and a spring;
the front end of the sensor measuring head extends outwards from the inside of the measuring head positioning sleeve, and the rear end of the sensor measuring head is arranged in the measuring head positioning sleeve through a spring;
the sensor probe comprises an F-shaped sensor probe for measuring the thickness of a non-magnetic covering layer on a magnetic metal substrate;
the sensor measuring head also comprises an N-type sensor measuring head used for measuring the thickness of the non-conductive covering layer on the non-magnetic metal substrate;
an integrated circuit board is arranged in the packaging shell (1), and a processor module, a USB interface module, a key module, a Bluetooth module, a display module, an alarm module, a storage module, a power supply module and a control circuit are integrated on the integrated circuit board;
the control circuit includes: an eddy current thickness measuring circuit and a magnetic circuit thickness measuring circuit.
2. The thickness gauge and the control circuit according to claim 1, wherein: the maximum compression distance of the spring is 1.5CM, the sensor measuring head is vertically contacted with the test surface downwards, the measuring head positioning sleeve is slightly pressed, the sensor measuring head can retract towards the inside of the measuring head positioning sleeve along with the compression of the spring, and the sensor measuring head is protected from being damaged due to extrusion.
3. The thickness gauge and the control circuit according to claim 1, wherein: the eddy current thickness measuring circuit comprises an eddy current sensor, the eddy current sensor is coupled with a capacitor C31, a capacitor C32, a capacitor C43, a capacitor C44, a resistor R40 and a potentiometer to form an RC oscillating circuit, the eddy current thickness measuring circuit further comprises a counter, and a No. 1 pin of the counter is coupled with a processor through a series connection capacitor C35.
4. The thickness gauge and the control circuit according to claim 1, wherein: the magnetic circuit thickness measuring circuit comprises a magnetic sensor, wherein the SIN output end of the magnetic sensor is coupled with an operational amplifier U9A, and the output end of the operational amplifier U9A is coupled with a differential circuit to form two output ends; wherein the content of the first and second substances,
the first path output end is coupled with the processor through a coupling reverse Schmitt trigger U8D, and a reference square wave signal generating end is arranged between the reverse Schmitt trigger U8D and the processor;
the second output end is coupled with the SOUT input end of the magnetic sensor through a coupling potentiometer and an integrating circuit, and the SIN output end of the magnetic sensor is connected to the SOUT input end of the magnetic sensor through an operational amplifier to form a magnetic circuit.
5. The thickness gauge, control circuit of claim 4: the voltage follower circuit is coupled with the inverting input end of the differentiating circuit and the inverting input end of the integrating circuit, the voltage follower circuit comprises an amplifier and a charge pump, the charge pump generates 2V voltage to be loaded to the homodromous input end of the amplifier, the feedback end of the amplifier is directly communicated through a lead and does not amplify the voltage, the voltage 1:1 following is kept, and 2V bias voltage is provided for the processor.
6. A magnetic, eddy current dual mode measurement method, comprising: magnetic measurement and eddy current measurement;
the F-type sensor measuring head adopts a magnetic measuring method, when the F-type sensor measuring head is contacted with the covering layer, the measuring head and the magnetic metal matrix form a closed magnetic circuit, the nonmagnetic covering layer enables the magnetic resistance of the magnetic circuit to change, and the thickness of the covering layer can be derived by measuring the change of the magnetic resistance;
the N-type sensor measuring head adopts an eddy current measuring method, an electromagnetic field is generated in a coil by utilizing high-frequency alternating current, when the N-type sensor measuring head is contacted with a covering layer, eddy current is generated on a metal base body, a feedback effect is generated on the coil in the measuring head, and the thickness of the covering layer can be derived by measuring the feedback effect.
7. A magnetic, eddy current dual mode measurement method as set forth in claim 6, wherein: the magnetic measurement method and the eddy current measurement method both comprise a single-point measurement mode and a rapid continuous measurement mode; wherein the content of the first and second substances,
single-point measurement mode: setting a menu as a single-point measurement mode through a menu key, vertically contacting the measuring head with the surface of the substrate, slightly pressing the measuring head positioning sleeve, sounding along with a sound, displaying a measured value on a display screen, lifting the measuring head to carry out next measurement, vertically and quickly measuring the substrate, and displaying a result through a liquid crystal after prompting the sound;
and (3) rapid and continuous measurement: the measuring head is vertically placed on the surface of the base body through the menu key set to be in a continuous measuring mode, the measuring head is displayed on the display screen along with one-sound prompt, the measuring point is randomly changed for next measurement, the measuring point is continuously displayed on the display screen, and the measuring head does not need to be removed from the base body in the process.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110608731.4A CN113340187B (en) | 2021-06-01 | 2021-06-01 | Thickness gauge, control circuit and magnetic and eddy current dual-mode measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110608731.4A CN113340187B (en) | 2021-06-01 | 2021-06-01 | Thickness gauge, control circuit and magnetic and eddy current dual-mode measuring method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113340187A true CN113340187A (en) | 2021-09-03 |
| CN113340187B CN113340187B (en) | 2022-09-02 |
Family
ID=77474138
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110608731.4A Active CN113340187B (en) | 2021-06-01 | 2021-06-01 | Thickness gauge, control circuit and magnetic and eddy current dual-mode measuring method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113340187B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114413740A (en) * | 2022-02-21 | 2022-04-29 | 深圳市聚茂源科技有限公司 | Coating thickness gauge and application method thereof |
Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE705605A (en) * | 1966-10-27 | 1968-03-01 | ||
| WO2000028337A2 (en) * | 1998-11-06 | 2000-05-18 | Onguard Systems, Inc. | Electronic circuit with a non-continuous discharge path |
| US20030071222A1 (en) * | 2001-10-11 | 2003-04-17 | Harvey Philip C. | Charge measuring device with wide dynamic range |
| CN2833511Y (en) * | 2005-07-15 | 2006-11-01 | 北京时代之峰科技有限公司 | Cladding thickness measurer |
| CN103489357A (en) * | 2013-09-18 | 2014-01-01 | 北京天路时代电气设备有限责任公司 | Control circuit of magnetic suspension experimental setup |
| CN204854614U (en) * | 2015-07-30 | 2015-12-09 | 深圳大禹防水工程有限公司 | Dual -purpose portable coating calibrator of magnetism and vortex |
| CN204963772U (en) * | 2015-08-26 | 2016-01-13 | 张璐华 | Thickness tester |
| CN205120028U (en) * | 2015-09-28 | 2016-03-30 | 广州市果欧电子科技有限公司 | Coating thickness meter |
| CN205946373U (en) * | 2015-07-01 | 2017-02-08 | 广东成德电子科技股份有限公司 | A regulator circuit for printed circuit board |
| CN206919826U (en) * | 2017-07-06 | 2018-01-23 | 深圳市林上科技有限公司 | Calibrator |
| CN209013918U (en) * | 2018-10-11 | 2019-06-21 | 广州市果欧电子科技有限公司 | A kind of coating thickness detector |
| CN209485260U (en) * | 2018-11-26 | 2019-10-11 | 北京顺科达科技有限公司 | A kind of magnetic and current vortex coating thickness measuring system and portable coating measuring thickness device |
| CN210603173U (en) * | 2019-11-27 | 2020-05-22 | 南京信息工程大学 | Coating thickness gauge suitable for iron base and aluminum base |
| CN111649662A (en) * | 2020-06-17 | 2020-09-11 | 深圳市林上科技有限公司 | Coating thickness gauge and coating thickness detection method |
-
2021
- 2021-06-01 CN CN202110608731.4A patent/CN113340187B/en active Active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE705605A (en) * | 1966-10-27 | 1968-03-01 | ||
| WO2000028337A2 (en) * | 1998-11-06 | 2000-05-18 | Onguard Systems, Inc. | Electronic circuit with a non-continuous discharge path |
| US20030071222A1 (en) * | 2001-10-11 | 2003-04-17 | Harvey Philip C. | Charge measuring device with wide dynamic range |
| WO2003032007A2 (en) * | 2001-10-11 | 2003-04-17 | Diamond Semiconductor Group, Llc. | Dosimeter having charge-measuring device with wide dynamic range |
| CN2833511Y (en) * | 2005-07-15 | 2006-11-01 | 北京时代之峰科技有限公司 | Cladding thickness measurer |
| CN103489357A (en) * | 2013-09-18 | 2014-01-01 | 北京天路时代电气设备有限责任公司 | Control circuit of magnetic suspension experimental setup |
| CN205946373U (en) * | 2015-07-01 | 2017-02-08 | 广东成德电子科技股份有限公司 | A regulator circuit for printed circuit board |
| CN204854614U (en) * | 2015-07-30 | 2015-12-09 | 深圳大禹防水工程有限公司 | Dual -purpose portable coating calibrator of magnetism and vortex |
| CN204963772U (en) * | 2015-08-26 | 2016-01-13 | 张璐华 | Thickness tester |
| CN205120028U (en) * | 2015-09-28 | 2016-03-30 | 广州市果欧电子科技有限公司 | Coating thickness meter |
| CN206919826U (en) * | 2017-07-06 | 2018-01-23 | 深圳市林上科技有限公司 | Calibrator |
| CN209013918U (en) * | 2018-10-11 | 2019-06-21 | 广州市果欧电子科技有限公司 | A kind of coating thickness detector |
| CN209485260U (en) * | 2018-11-26 | 2019-10-11 | 北京顺科达科技有限公司 | A kind of magnetic and current vortex coating thickness measuring system and portable coating measuring thickness device |
| CN210603173U (en) * | 2019-11-27 | 2020-05-22 | 南京信息工程大学 | Coating thickness gauge suitable for iron base and aluminum base |
| CN111649662A (en) * | 2020-06-17 | 2020-09-11 | 深圳市林上科技有限公司 | Coating thickness gauge and coating thickness detection method |
Non-Patent Citations (3)
| Title |
|---|
| 代万辉: "《全国电子设计大赛培训宝典》", 31 May 2012 * |
| 邵越: "基于 PWM 整流器的恒压输出无线电能传输系统研究", 《中国优秀博硕士学位论文全文数据库(硕士)工程科技Ⅱ辑》 * |
| 邵越: "基于 PWM 整流器的恒压输出无线电能传输系统研究", 《中国优秀博硕士学位论文全文数据库(硕士)工程科技Ⅱ辑》, 15 February 2020 (2020-02-15) * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114413740A (en) * | 2022-02-21 | 2022-04-29 | 深圳市聚茂源科技有限公司 | Coating thickness gauge and application method thereof |
| CN114413740B (en) * | 2022-02-21 | 2024-02-27 | 深圳市聚茂源科技有限公司 | Coating thickness gauge and application method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113340187B (en) | 2022-09-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106020559B (en) | Pressure sensitive detection device, electronic equipment and touch display screen | |
| US4277744A (en) | Apparatus for measuring electric and magnetic fields | |
| CN201796013U (en) | Electric eddy current metal material analysis sensor | |
| WO2004044539B1 (en) | Non-contact surface conductivity measurement probe | |
| CN205120028U (en) | Coating thickness meter | |
| KR20190079677A (en) | User input sensing device | |
| CN208653681U (en) | Pressure sensitive component and electronic equipment | |
| CN101936791A (en) | Digital pressure gauge | |
| CN113340187B (en) | Thickness gauge, control circuit and magnetic and eddy current dual-mode measuring method | |
| US4255709A (en) | Device for providing an electrical signal proportional to the thickness of a measured coating with an automatic range switch and sensitivity control | |
| EP1426772B1 (en) | Impedance measuring circuit, its method, and capacitance measuring circuit | |
| EP3044766B1 (en) | A device for use in detecting counterfeit or altered bullion, coins or metal | |
| US9933867B2 (en) | Active pen capacitive displacement gauge | |
| CN205879100U (en) | Coating thickness meter | |
| CN103293506A (en) | Achieving method for conductivity measurement instrument without detecting front test block calibration | |
| CN106610313A (en) | Touch screen terminal and weight measurement method | |
| CN109540980A (en) | A kind of measurement of water ratio sensing device based on capacitor edge effect | |
| KR101081866B1 (en) | Mobile Communication Terminal having attachable Electronic Scale Case | |
| CS202665B1 (en) | Facility for metering the specific resistance of the conductive and semiconductive materials | |
| US11131569B2 (en) | Hand held moisture meter in-field calibration | |
| CN209446508U (en) | A kind of measurement of water ratio sensing device based on capacitor edge effect | |
| CN206787742U (en) | For measuring the new strain piece of steel bridge deck focus stress | |
| US5349288A (en) | Radial planar current detection device having an extended frequency range of response | |
| CN206311670U (en) | Dielectric material measurement apparatus | |
| JP2011089873A (en) | Impedance matching device and impedance measurement device with the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |