CN113340179B - 基准尺、基准尺的制作方法以及基准尺的使用方法 - Google Patents
基准尺、基准尺的制作方法以及基准尺的使用方法 Download PDFInfo
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- CN113340179B CN113340179B CN202110647405.4A CN202110647405A CN113340179B CN 113340179 B CN113340179 B CN 113340179B CN 202110647405 A CN202110647405 A CN 202110647405A CN 113340179 B CN113340179 B CN 113340179B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/14—Measuring arrangements characterised by the use of mechanical techniques for measuring distance or clearance between spaced objects or spaced apertures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B3/00—Measuring instruments characterised by the use of mechanical techniques
- G01B3/02—Rulers with scales or marks for direct reading
- G01B3/04—Rulers with scales or marks for direct reading rigid
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- Length-Measuring Instruments Using Mechanical Means (AREA)
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CN202110647405.4A CN113340179B (zh) | 2021-06-10 | 2021-06-10 | 基准尺、基准尺的制作方法以及基准尺的使用方法 |
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CN113340179A CN113340179A (zh) | 2021-09-03 |
CN113340179B true CN113340179B (zh) | 2023-01-31 |
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Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
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CN204100949U (zh) * | 2014-10-14 | 2015-01-14 | 北京长城华冠汽车科技有限公司 | 适合光学测量设备的改进型基准尺 |
DE102017012165A1 (de) * | 2017-03-09 | 2018-09-13 | Ima Klessmann Gmbh Holzbearbeitungssysteme | Verfahren zum Messen des Formats eines plattenförmigen Werkstücks |
DE102017002270B4 (de) * | 2017-03-09 | 2018-12-13 | Ima Klessmann Gmbh Holzbearbeitungssysteme | Verfahren zum Messen des Formats eines plattenförmigen Werkstücks |
CN108664963A (zh) * | 2017-04-02 | 2018-10-16 | 田雪松 | 基于编码标记的编解码方法 |
CN107131889B (zh) * | 2017-04-18 | 2020-04-21 | 北京信息科技大学 | 一种全角度成像基准尺 |
CN109115181A (zh) * | 2018-08-03 | 2019-01-01 | 湖南科技大学 | 一种编码标志 |
CN209263941U (zh) * | 2018-12-29 | 2019-08-16 | 上海诺司纬光电仪器有限公司 | 一种具有角度投线功能的角度尺 |
CN109978960B (zh) * | 2019-04-01 | 2023-01-24 | 易思维(杭州)科技有限公司 | 基于摄影测量的高精度屏幕-相机位姿标定方法 |
CN212513023U (zh) * | 2020-04-25 | 2021-02-09 | 张路 | 一种建筑工程质量检测装置 |
CN112902935B (zh) * | 2021-01-29 | 2022-06-14 | 中国科学院长春光学精密机械与物理研究所 | 一种多功能测量基准器 |
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Address after: Room 102, Unit 1, Building 12, No. 998, Wenyi West Road, Wuchang Street, Yuhang District, Hangzhou City, Zhejiang Province, 311121 Applicant after: Sikan Technology (Hangzhou) Co.,Ltd. Address before: Room 101, building 12, No. 998, Wenyi West Road, Wuchang Street, Yuhang District, Hangzhou City, Zhejiang Province Applicant before: HANGZHOU SCANTECH Co. |
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Inventor after: Wang Jiangfeng Inventor after: Zheng Jun Inventor after: Yang Yuju Inventor after: Wang Jun Inventor after: Yi Cheng Inventor before: Zheng Jun Inventor before: Yang Yuju |
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