CN113325828A - Parking lock controller test method, device and system and storage medium - Google Patents
Parking lock controller test method, device and system and storage medium Download PDFInfo
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- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
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Abstract
The embodiment of the application discloses a parking lock controller testing method, device and system and a storage medium. Wherein, the method comprises the following steps: selecting at least one DUT to be tested from the candidate DUTs, and determining a test task corresponding to the DUT to be tested; controlling conduction between the DUT to be tested and the associated load unit through the power supply assembly; and controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result. The technical scheme provided by the embodiment of the application can realize automatic testing of at least one DUT.
Description
Technical Field
The embodiment of the application relates to the technical field of automobiles, in particular to a parking lock controller testing method, device and system and a storage medium.
Background
With the development of the automobile industry, the testing of a Device Under Test (DUT) of an automobile is increasing. The parking lock controller is a technology for realizing parking braking by an electronic control method. In the prior art, a method for testing a parking lock controller comprises the following steps: whether the tested sample can normally work under the preset working mode is tested by using a testing tool manually, however, the testing state of the tested sample cannot be automatically detected in the prior art, and the reason cannot be traced when the tested sample is abnormal.
Therefore, a method for automatically testing the performance of the parking lock controller is needed.
Disclosure of Invention
The embodiment of the application provides a parking lock controller testing method, device and system and a storage medium, and can realize automatic testing of at least one DUT.
In a first aspect, an embodiment of the present application provides a parking lock controller testing method, including:
selecting at least one DUT to be tested from the candidate DUTs, and determining a test task corresponding to the DUT to be tested;
controlling, by the power supply component, conduction between the DUT to be tested and an associated load unit;
and controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result.
In a second aspect, an embodiment of the present application provides a parking lock controller testing device, including:
the determining module is used for selecting at least one DUT to be tested from the candidate DUTs and determining a test task corresponding to the DUT to be tested;
the control module is used for controlling the conduction between the DUT to be tested and the associated load unit through the power supply assembly;
and the test module is used for controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result.
In a third aspect, an embodiment of the present application provides a parking lock controller testing system, including:
the device comprises an upper computer, at least one candidate DUT, a power supply assembly, at least one load unit and a test environment control unit; the power supply assembly is respectively connected with the upper computer and the load unit; the candidate DUT is connected with an associated load unit; the test environment control unit is connected with the upper computer;
the parking lock controller testing system is used for executing the parking lock controller testing method in any embodiment of the application.
In a fourth aspect, embodiments of the present application provide a computer-readable storage medium, on which a computer program is stored, where the program, when executed by a processor, implements a parking lock controller testing method according to any of the embodiments of the present application.
The embodiment of the application provides a testing method, a testing device, a testing system and a testing storage medium for a parking locking controller, wherein at least one DUT to be tested is selected from candidate DUTs, and a testing task corresponding to the DUT to be tested is determined; controlling conduction between the DUT to be tested and the associated load unit through the power supply assembly; and controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result. By executing the technical scheme, the automatic test of at least one DUT can be realized.
It should be understood that the statements in this section do not necessarily identify key or critical features of the embodiments of the present application, nor do they limit the scope of the present application. Other features of the present application will become apparent from the following description.
Drawings
The drawings are included to provide a better understanding of the present solution and are not intended to limit the present application. Wherein:
FIG. 1 is a schematic structural diagram of a parking lock controller provided in an embodiment of the present application;
FIG. 2 is a schematic diagram of a first process of a parking lock controller testing method according to an embodiment of the present application;
FIG. 3 is a second flowchart of a parking lock controller testing method according to an embodiment of the present application;
FIG. 4 is a schematic structural diagram of a parking lock controller testing device provided by an embodiment of the application;
FIG. 5 is a schematic diagram of a parking lock controller testing system according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Before describing embodiments of the present application, the structure of the DUT is described: referring to fig. 1, the DUT includes an embedded power module, a motor drive module, a position sensing module, and a mechanical module. The external of the DUT is supplied with power by the storage battery, and the whole vehicle controller is used for driving control. The DUT drives the motor driving module to enter a parking gear and exit the parking gear through the mechanical module, and calculates whether the motor driving module completes the operation of entering the parking gear and exiting the parking gear through the position sensing module and the embedded power module.
Example one
Fig. 2 is a first flowchart of a parking lock controller testing method according to an embodiment of the present disclosure, which is applicable to a case where reliability of a plurality of parking lock controllers is automatically tested in a production testing stage. The parking lock controller testing method provided by the embodiment of the invention can be executed by the parking lock controller testing device provided by the embodiment of the invention, which can be realized by software and/or hardware and is integrated in a parking lock controller testing system for executing the method.
Referring to fig. 2, the method of the present embodiment includes, but is not limited to, the following steps:
s110, selecting at least one DUT to be tested from the candidate DUTs, and determining a test task corresponding to the DUT to be tested.
The DUT test system comprises an upper computer and at least one candidate DUT.
In the embodiment of the application, the test method of the DUT is executed by an upper computer, wherein the upper computer refers to a computer, such as an industrial personal computer (i.e., an industrial control computer), which can directly issue a test control command. In a test process, the upper computer can select one DUT to be tested from the candidate DUTs for testing, and can also select a plurality of DUTs to be tested from the candidate DUTs for testing at the same time, wherein the number of the DUTs to be tested can be set by a user according to the requirement of the user. In addition, the upper computer needs to determine a test task corresponding to the DUT to be tested. It should be noted that the test tasks corresponding to different DUTs to be tested are the same, that is, the same test task is used to test at least one DUT to be tested.
And S120, controlling the conduction between the DUT to be tested and the associated load unit through the power supply assembly.
The DUT test system further comprises a power supply assembly and at least one load unit; the power supply assembly is respectively connected with the upper computer and the load unit; the candidate DUT is connected to its associated load cell.
The power supply assembly comprises a power distribution module and a programmable power supply, wherein the programmable power supply supplies power to the DUT to be tested, the output end of the programmable power supply is connected with the power distribution module, and the control end of the programmable power supply is connected with the upper computer through a network port, so that the upper computer can configure the capacity of the programmable power supply for outputting voltage and current; the input end of the power distribution module is connected with the programmable power supply, the output end of the power distribution module is respectively connected with at least one load unit, and the function of the power distribution module is that when the upper computer selects a plurality of DUTs to be tested, the programmable power supply can be changed into a plurality of power supplies to supply power to the corresponding DUTs to be tested and perform overcurrent protection.
In the embodiment of the application, after the upper computer selects at least one DUT to be tested from the candidate DUTs, the programmable power supply in the power supply assembly supplies power to the DUT test system, and then the power distribution module in the power supply assembly powers on the load unit corresponding to the selected DUT to be tested, so that the selected DUT to be tested is switched from the off state to the on state with the load unit corresponding to the selected DUT to be tested.
In the application, the upper computer can select a plurality of DUTs to be tested from the candidate DUTs for testing, and correspondingly, the DUT testing system needs to configure a plurality of load units. In the prior art, when a test load device is developed, an environmental test load unit cannot meet the requirements of manual testing and electromagnetic Compatibility (EMC) testing, and the environmental test load unit has a large volume and is inconvenient to move, so that the EMC test load unit and the manual test load unit need to be developed again. Different from the prior art, the load unit of the application adopts an independent packaging design, integrates the interface required by the work of a single DUT to be tested, has small volume, light weight and convenient carrying, and can be applied to different office scenes. The load unit integrates a power supply interface, a CAN communication interface, a LIN communication interface and an interface, wherein the power supply interface, the CAN communication interface and the LIN communication interface are connected with a DUT to be tested, and the interface is used for providing mechanical load for the DUT to be tested. The load unit of independent encapsulation of this application can support manual test, EMC test, electrical property test etc to can assemble with whole DUT test system is nimble and the split, and the exclusive use can satisfy manual test and EMC experimental demand, and this kind of structural design greatly reduced equipment development cost.
And S130, controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result.
In the embodiment of the application, after the power supply assembly controls the conduction between the DUT to be tested and the associated load unit, the DUT to be tested is tested by controlling the load unit, the test task is completed, and the test result is obtained. Specifically, the load unit tests the DUT to be tested according to the specific content of the test task, and if the DUT to be tested can meet the performance index corresponding to the test task, the DUT to be tested has excellent performance, and the test result is successful; and if the DUT to be tested cannot meet the performance index corresponding to the test task, the performance of the DUT to be tested is poor, and the test result is failure.
Optionally, the specific process of controlling the load unit to test the DUT to be tested according to the test task in this step may be implemented by the following two substeps:
s1301, adjusting the test environment of the DUT to be tested through the test environment control unit according to the test environment parameter information to obtain the test environment corresponding to each sub-test task.
The DUT test system also comprises a test environment control unit connected with the upper computer; the test task comprises at least one sub-test task; the sub-test tasks comprise test environment parameter information and gear switching information; the method and the device test the reliability of the DUT to be tested when the DUT runs according to the gear switching information under the test environment corresponding to the test environment parameter information. The test environment parameter information comprises a temperature parameter, a humidity parameter, a mechanical pressure parameter, a voltage parameter and the like.
In the embodiment of the application, the upper computer controls each DUT to be tested to execute each sub-test task in the test tasks one by one. In the process of executing a certain sub-test task by the DUT to be tested, firstly, the upper computer sends the test environment parameter information in the sub-test task to the test environment control unit, and sends the gear switching information in the sub-test task to the load unit associated with the DUT to be tested; then the test environment control unit receives the test environment parameter information corresponding to the sub-test task and adjusts the test environment of the DUT to be tested so that the test environment of the DUT to be tested meets the test environment corresponding to the sub-test task; and finally, the upper computer controls the load unit to test the DUT to be tested according to the gear switching information.
Optionally, the DUT to be tested may be placed in a test box, and the environment of the test box is adjusted according to the test environment parameter information of the test task, so that the test environment of the DUT to be tested satisfies the test environment corresponding to the test task.
S1302, according to the gear switching information, the load unit controls the DUT to be tested to switch gears in the test environment, and electrical parameters of the DUT to be tested in the gear switching process are collected.
The gear switching information comprises switching from a parking gear to a non-parking gear and switching from the non-parking gear to the parking gear; the electrical parameters include voltage values and current values.
In this embodiment of the present application, the specific process of the upper computer controlling the load unit to test the DUT to be tested according to the gear switching information is as follows: the load unit is used for controlling the DUT to be tested to be switched from a parking gear to a non-parking gear in a test environment, and collecting a voltage value and a current value of the DUT to be tested in the non-parking gear; after the preset time, the load unit controls the DUT to be tested to be switched from the non-parking gear to the parking gear in the test environment, and collects the voltage value and the current value of the DUT to be tested in the parking gear.
Optionally, after acquiring the electrical parameters of the DUT to be tested in the gear shifting process, the method further includes: determining a threshold value of an electrical parameter associated with a test environment corresponding to the sub-test task; judging whether an electrical parameter value of a DUT to be tested in the gear switching process exceeds a threshold value; if so, marking the sub-test tasks as test failures and generating message records.
In the embodiment of the application, one sub-test task of the DUT to be tested corresponds to one test environment and corresponds to one threshold value of the electrical parameter. That is, the sub-test tasks, the test environment, and the threshold values of the electrical parameters are in a one-to-one correspondence relationship. Optionally, an association relation table of the sub-test tasks, the test environment and the threshold value of the electrical parameter may be established and stored in the upper computer. Specifically, when the DUT to be tested executes a certain sub-test task, the load unit controls the DUT to be tested to perform gear switching in the test environment corresponding to the sub-test task according to the gear switching information, and collects electrical parameters of the DUT to be tested in the gear switching process. Searching a threshold value of an electrical parameter corresponding to the sub-test task in the association relation table (for example, when the electrical parameter is a voltage value, the threshold value is plus or minus 0.1V, and when the electrical parameter is a current value, the threshold value is plus or minus 0.1A), comparing the acquired electrical parameter with the threshold value of the electrical parameter, and if the acquired electrical parameter does not exceed the threshold value of the electrical parameter, indicating that the performance of the DUT to be tested is normal, continuing to execute the sub-test task; if the collected electrical parameters exceed the threshold value of the electrical parameters, indicating that the performance of the DUT to be tested is abnormal, marking the sub-test tasks as test failures, and generating message records. The message records include the time of the test failure, the sub-test tasks corresponding to the test failure, and the electrical parameters corresponding to the test failure.
It should be noted that, when the DUT to be tested fails to be tested in a certain sub-test task, the sub-test task is ended, and the next sub-test task is executed until all sub-test tasks in the test task corresponding to the DUT to be tested are executed.
Optionally, the number of cycles of gear shifting may be set in the sub-test task, so as to test the reliability of the DUT to be tested in the sub-test task. The number of the running cycles of the DUT to be tested can be referred to in a display screen of the upper computer. If the electrical parameter of the DUT to be tested in a certain sub-test task does not satisfy the threshold value of the corresponding electrical parameter, the cycle number corresponding to the test failure of the DUT to be tested can be recorded in the message record.
According to the technical scheme provided by the embodiment, at least one DUT to be tested is selected from candidate DUTs, and a test task corresponding to the DUT to be tested is determined; controlling conduction between the DUT to be tested and the associated load unit through the power supply assembly; and controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result. According to the method and the device, the upper computer in the DUT test system is used for selecting the DUTs to be tested, the load unit is controlled to automatically test the DUTs to be tested, and message records are generated when the test fails.
Example two
Fig. 3 is a second flowchart of the parking lock controller testing method according to the embodiment of the present application. The embodiment of the application is optimized on the basis of the embodiment, and specifically optimized as follows: a detailed explanation of the process of the parking lock controller evaluation is added.
Referring to fig. 3, the method of the present embodiment includes, but is not limited to, the following steps:
s210, selecting at least one DUT to be tested from the candidate DUTs, and determining a test task corresponding to the DUT to be tested.
Wherein the test task comprises at least one sub-test task; the sub-test tasks include at least one of: the method comprises the following steps of carrying out temperature environment test on a DUT to be tested, carrying out mechanical environment test on the DUT to be tested, and carrying out chemical reagent corrosion environment test on the DUT to be tested.
In the embodiment of the present application, the testing task of the DUT to be tested includes simulating the reliability of the DUT operating under various harsh environments. Wherein, specifically include in the temperature environment test to the DUT that awaits measuring: temperature impact test, temperature gradient test, damp-heat cycle test, steady-state damp-heat test, high-temperature endurance test, temperature cycle test and the like; the mechanical environment test of the DUT to be tested specifically comprises the following steps: random vibration testing, mechanical shock testing, free fall testing, and the like.
Optionally, before the upper computer control load unit tests the DUT to be tested according to the test task, the DUT to be tested may be pretested, such as a low temperature storage test, a high temperature storage test, and the like; appearance inspection, dimension inspection and the like can also be carried out on the DUT to be tested.
And S220, controlling the conduction between the DUT to be tested and the associated load unit through the power supply assembly.
And S230, controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result.
S240, determining the functional state grade of the DUT to be tested according to the test result; and the functional state grade is used for representing the performance of the DUT to be tested.
In the embodiment of the application, the DUT to be tested is evaluated and analyzed according to the test result, and the functional state grade corresponding to the DUT to be tested is obtained. The functional state grades comprise five grades, wherein the first grade refers to that all functions of the DUT accord with design requirements during the process of the test task and after the end of the test task; the second level refers to that all functions of the DUT basically meet the design requirements (that is, one or more than one function is allowed to exceed a specified error) while the test task is in progress, but all functions can automatically recover to a normal working state after the test task is finished; the third level means that one or more functions of the DUT cannot meet the design requirement in the process of testing the task, but all the functions can automatically recover to the normal working state after the testing task is finished; the fourth level means that one or more than one function of the DUT cannot meet the design requirement in the process of testing the task, and the DUT cannot automatically return to the normal working state after the test is finished, but the DUT can be reset to return to the normal working state through a reset button after the test task is finished; the fifth level means that one or more functions of the DUT cannot meet the design requirements during the test task, but the DUT can be restored to the normal working state after the repair or replacement of the components after the test task is finished.
According to the technical scheme provided by the embodiment, at least one DUT to be tested is selected from candidate DUTs, and a test task corresponding to the DUT to be tested is determined; controlling conduction between the DUT to be tested and the associated load unit through the power supply assembly; controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result; and determining the functional state grade of the DUT to be tested according to the test result. After the automatic test is executed, the functional state grade corresponding to the DUT to be tested is obtained by evaluating and analyzing the test result of the DUT to be tested. By executing the scheme of the application, the automatic test of at least one DUT can be realized.
EXAMPLE III
Fig. 4 is a schematic structural diagram of a parking lock controller testing device according to an embodiment of the present application, and as shown in fig. 4, the device 400 may include:
a determining module 410, configured to select at least one DUT to be tested from the candidate DUTs, and determine a test task corresponding to the DUT to be tested.
And the control module 420 is used for controlling conduction between the DUT to be tested and the associated load unit through the power supply assembly.
And the test module 430 is configured to control the load unit to test the DUT to be tested according to the test task, and obtain a test result.
Further, the test module 430 includes: an environment configuration unit and a performance test unit;
and the environment configuration unit is used for adjusting the test environment of the DUT to be tested through the test environment control unit according to the test environment parameter information so as to obtain the test environment corresponding to each sub-test task.
And the performance test unit is used for controlling the DUT to be tested to carry out gear switching in the test environment through the load unit according to the gear switching information and acquiring the electrical parameters of the DUT to be tested in the gear switching process.
Further, the performance testing unit is specifically configured to: controlling the DUT to be tested to be switched from a parking gear to a non-parking gear in the test environment through the load unit, and collecting electrical parameters of the DUT to be tested in the non-parking gear; after the preset time, the load unit controls the DUT to be tested to be switched from a non-parking position to a parking position in the test environment, and electrical parameters of the DUT to be tested in the parking position are collected.
Further, the parking lock controller testing apparatus may further include: a judgment module;
the judging module is used for determining a threshold value of an electrical parameter associated with a test environment corresponding to a sub-test task after acquiring the electrical parameter of the DUT to be tested in the gear switching process; judging whether the electrical parameter value of the DUT to be tested in the gear switching process exceeds the threshold value; if so, marking the sub-test tasks as test failures and generating message records.
Optionally, the sub-test tasks include at least one of the following: the method comprises the following steps of carrying out temperature environment test on a DUT to be tested, carrying out mechanical environment test on the DUT to be tested, and carrying out chemical reagent corrosion environment test on the DUT to be tested.
Further, the parking lock controller testing apparatus may further include: evaluation module
The evaluation module is used for determining the functional state grade of the DUT to be tested according to the test result; wherein the functional state grade is used for characterizing the performance of the DUT to be tested.
The parking lock controller testing device provided by the embodiment can be applied to the parking lock controller testing method provided by any embodiment, and has corresponding functions and beneficial effects.
Example four
FIG. 5 is a schematic diagram of a parking lock controller testing system provided by an embodiment of the application, wherein the system comprises an upper computer, at least one candidate DUT, a power supply assembly, at least one load unit and a testing environment control unit; the power supply assembly is respectively connected with the upper computer and the load unit; the candidate DUT is connected with an associated load unit; and the test environment control unit is connected with the upper computer and used for configuring a test environment for the candidate DUT. The upper computer, the at least one candidate DUT, the power supply assembly, the at least one load unit and the test environment control unit CAN be connected through an Ethernet bus or a CAN bus.
The parking lock controller testing system provided by the embodiment can be applied to the parking lock controller testing method provided by any embodiment, and has corresponding functions and beneficial effects.
EXAMPLE five
Fifth embodiment of the present application further provides a computer-readable storage medium, on which a computer program (or referred to as computer-executable instructions) is stored, where the program, when executed by a processor, may be used to execute the parking lock controller testing method provided in any of the above embodiments of the present application.
The computer storage media of the embodiments of the present application may take any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
A computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Computer program code for carrying out operations for embodiments of the present application may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, Smalltalk, C + +, and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present application and the technical principles employed. It will be understood by those skilled in the art that the present application is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the application. Therefore, although the embodiments of the present application have been described in more detail through the above embodiments, the embodiments of the present application are not limited to the above embodiments, and many other equivalent embodiments may be included without departing from the spirit of the present application, and the scope of the present application is determined by the scope of the appended claims.
Claims (10)
1. The parking lock controller testing method is executed by an upper computer in a parking lock controller DUT testing system, and the DUT testing system further comprises at least one candidate DUT, a power supply assembly and at least one load unit; the power supply assembly is respectively connected with the upper computer and the load unit; the candidate DUT is connected with an associated load unit;
the method comprises the following steps:
selecting at least one DUT to be tested from the candidate DUTs, and determining a test task corresponding to the DUT to be tested;
controlling, by the power supply component, conduction between the DUT to be tested and an associated load unit;
and controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result.
2. The method of claim 1, wherein the DUT test system further comprises a test environment control unit connected to the host computer; the test task comprises at least one sub-test task; the sub-test tasks comprise test environment parameter information and gear switching information;
the controlling the load unit to test the DUT to be tested according to the test task comprises:
adjusting the test environment of the DUT to be tested through a test environment control unit according to the test environment parameter information to obtain the test environment corresponding to each sub-test task;
and controlling the DUT to be tested to carry out gear switching in the test environment through the load unit according to the gear switching information, and acquiring electrical parameters of the DUT to be tested in the gear switching process.
3. The method according to claim 2, wherein the range switching information includes switching from a parking range to a non-parking range, switching from a non-parking range to a parking range;
the step switching of the DUT to be tested in the test environment is controlled through the load unit according to the step switching information, and the electrical parameters of the DUT to be tested in the step switching process are collected, and the step switching method comprises the following steps:
controlling the DUT to be tested to be switched from a parking gear to a non-parking gear in the test environment through the load unit, and collecting electrical parameters of the DUT to be tested in the non-parking gear;
after the preset time, the load unit controls the DUT to be tested to be switched from a non-parking position to a parking position in the test environment, and electrical parameters of the DUT to be tested in the parking position are collected.
4. The method of claim 2, further comprising, after collecting electrical parameters of the DUT under test during the gear shift, the steps of:
determining a threshold value of an electrical parameter associated with a test environment corresponding to the sub-test task;
judging whether the electrical parameter value of the DUT to be tested in the gear switching process exceeds the threshold value;
if so, marking the sub-test tasks as test failures and generating message records.
5. The method of claim 2, wherein the sub-test tasks include at least one of: the method comprises the following steps of carrying out temperature environment test on a DUT to be tested, carrying out mechanical environment test on the DUT to be tested, and carrying out chemical reagent corrosion environment test on the DUT to be tested.
6. The method of claim 1, further comprising:
determining the functional state grade of the DUT to be tested according to the test result; wherein the functional state grade is used for characterizing the performance of the DUT to be tested.
7. The parking lock controller testing device is integrated in a parking lock controller DUT testing system, and the system comprises an upper computer, at least one candidate DUT, a power supply assembly and at least one load unit; the power supply assembly is respectively connected with the upper computer and the load unit; the candidate DUT is connected with an associated load unit;
the device comprises:
the determining module is used for selecting at least one DUT to be tested from the candidate DUTs and determining a test task corresponding to the DUT to be tested;
the control module is used for controlling the conduction between the DUT to be tested and the associated load unit through the power supply assembly;
and the test module is used for controlling the load unit to test the DUT to be tested according to the test task and obtaining a test result.
8. The apparatus of claim 7, further comprising: an evaluation module;
the evaluation module is used for determining the functional state grade of the DUT to be tested according to the test result; wherein the functional state grade is used for characterizing the performance of the DUT to be tested.
9. The parking lock controller testing system is characterized by comprising an upper computer, at least one candidate DUT, a power supply assembly, at least one load unit and a testing environment control unit; the power supply assembly is respectively connected with the upper computer and the load unit; the candidate DUT is connected with an associated load unit; the test environment control unit is connected with the upper computer;
the parking lock controller test system is used for executing the parking lock controller test method according to any one of claims 1 to 6.
10. A computer-readable storage medium, on which a computer program is stored, which program, when being executed by a processor, carries out a parking lock controller test method according to any one of claims 1-6.
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| CN202110643910.1A CN113325828A (en) | 2021-06-09 | 2021-06-09 | Parking lock controller test method, device and system and storage medium |
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