CN113325301B - High-speed switch control protection equipment testing device and method - Google Patents
High-speed switch control protection equipment testing device and method Download PDFInfo
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- CN113325301B CN113325301B CN202110453705.9A CN202110453705A CN113325301B CN 113325301 B CN113325301 B CN 113325301B CN 202110453705 A CN202110453705 A CN 202110453705A CN 113325301 B CN113325301 B CN 113325301B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
Abstract
The invention discloses a testing device and a method for high-speed switch control protection equipment, wherein the testing device is respectively connected with the high-speed switch control protection equipment and a static mould or dynamic mould testing system and receives a high-speed switch opening and closing instruction signal sent by the high-speed switch control protection equipment and a first state signal and a voltage and current input signal sent by the static mould or dynamic mould testing system, and the testing device comprises a switching value input and output module, an analog-digital conversion module, a digital signal processor, a field programmable gate array, a central processing unit and a photoelectric conversion module. The invention supports static mode test and dynamic mode test, has comprehensive test function of action time and action characteristic, ensures the integrity of test content, reduces the dependence on a high-speed switch and a test system, and improves the convenience of test work.
Description
Technical Field
The invention relates to the field of power systems, in particular to a high-speed switch control protection equipment testing device and method.
Background
The high-speed switch based on the electromagnetic repulsion mechanism is widely applied to the field of power systems at present, in order to reduce the transmission delay of the system, the information interaction between the high-speed switch control protection equipment and the high-speed switch body is generally realized by adopting a point-to-point optical fiber communication mode based on an FT3 protocol, a state monitoring signal sent by the high-speed switch is received in a preset data frame format, and an opening and closing instruction signal is sent. Because of the adoption of the optical transmission mode, the function and performance of the high-speed switch control protection equipment are difficult to test, and at present, the following modes are mainly adopted:
1. The method can only be used for on-site communication transmission and outlet transmission tests, cannot test the action time of the control protection equipment, is difficult to verify the locking logic of the control protection equipment, and simultaneously, the flexibility of the test is limited because the high-speed switch needs to be connected;
2. the high-speed switch control protection device is connected with a digital relay protection tester and a fault recorder, the digital relay protection tester simulates a high-speed switch sending port to send a high-speed switch state signal in an FT3 data frame format to the control protection device, the fault recorder simulates a high-speed switch receiving port to receive and record a high-speed switch opening and closing instruction signal in an FT3 data frame format sent by the control protection device, and in such a way, the high-speed switch state signal cannot change along with the opening and closing instruction signal, so that the action logic of the control protection device cannot be comprehensively verified, and meanwhile, the application layer definitions of communication among the control protection device, the digital relay protection tester and the fault recorder are usually different, so that communication interfaces are difficult to be compatible, and related interface programs need to be modified;
Generally speaking, the test of the high-speed switch control protection equipment at present has the problem of interface compatibility, and the function and performance of the equipment are difficult to be checked comprehensively and in detail by the test device and the test method at present.
Disclosure of Invention
In order to solve the problems, the invention provides a device and a method for testing high-speed switch control protection equipment.
In order to realize the purpose, the technical scheme of the invention is as follows:
high-speed switch control protection equipment testing arrangement, testing arrangement is connected with high-speed switch control protection equipment, quiet mould or movable mould test system respectively, and the high-speed switch divide-shut brake command signal and the first state signal and the voltage current input signal that quiet mould or movable mould test system sent that receive high-speed switch control protection equipment sent, testing arrangement includes:
the switching value input and output module is configured to receive the first state signal and output the high-speed switch opening and closing instruction signal to a static mould or dynamic mould test system;
the analog-digital conversion module is configured to sample the voltage-current input signal to obtain a voltage-current sampling signal;
the digital signal processor is configured to process the first state signal, the high-speed switch opening and closing instruction signal and the voltage and current sampling signal, and generate a second state signal and a high-speed switch state signal through a state control program;
The field programmable gate array is configured to decode the high-speed switch opening and closing instruction signal and encode the high-speed switch state signal and the voltage and current sampling signal;
the central processing unit is configured to perform fault recording, event recording, constant value management, time setting and communication operation;
the photoelectric conversion module is configured to convert the received high-speed switch opening and closing instruction signal into an electric signal from an optical signal and send the electric signal to the field programmable gate array, and convert the high-speed switch state signal and the voltage and current sampling signal into an optical signal from the electric signal and send the optical signal to the high-speed switch control protection device;
the central processing unit selects the first state signal and the second state signal through a fixed value to control the digital signal processor to generate a high-speed switch state signal.
Furthermore, the central processing unit is provided with an embedded real-time operating system, and the communication and the fixed value management are carried out through the embedded real-time operating system.
Further, the second state signal comprises a preset signal name, an initial state, a trigger source and a deflection delay, wherein the trigger source is the high-speed switch opening and closing instruction signal or a preset software forced trigger signal.
Furthermore, signals adopted by the fault recording comprise a high-speed switch state signal, a high-speed switch opening and closing instruction signal and a voltage and current sampling signal, and signals adopted by the event record comprise a high-speed switch state signal and a high-speed switch opening and closing instruction signal.
Furthermore, the central processing unit is provided with an indication module for indicating the states of the high-speed switch state signal and the high-speed switch opening and closing instruction signal.
Further, the static mould or moving mould test system has a static mould test mode and a moving mould test mode.
Further, the switching value input and output module receives the first state signal through a photoelectric coupler.
Furthermore, the digital signal processor is connected with the field programmable gate array through a PCIE bus, connected with the switching value input/output module through an input/output port, and connected with the analog-digital conversion module through a DMA mode.
The test method of the test device of the high-speed switch control protection equipment comprises the following steps:
setting a fixed value of a static mode test mode or a dynamic mode test mode of the test device through a central processing unit according to test requirements, and setting a signal name, an initial state, a trigger source and deflection delay of a first state signal in the static mode test mode;
The voltage and current input signals of a static mould or dynamic mould test system are received through an analog-digital conversion module, sampled and encoded and then sent to a high-speed switch control protection device through a photoelectric conversion module;
decoding a high-speed switch opening and closing instruction signal sent by high-speed switch control protection equipment, triggering fault recording, event recording, state indication and a state control program of a digital signal processor of a central processing unit, and outputting to a static mould or dynamic mould test system through a switching value input and output module;
and judging the action logic and the action characteristics of the high-speed switch control protection equipment according to the fault recording, the event recording and the state indication to finish the test.
Furthermore, the state control program is provided with a multi-way timer and a state trigger, the multi-way timer starts to time after receiving a switching-on/off command signal or a software forced trigger signal issued by the control protection device, the state trigger is controlled to shift after reaching the shift delay, and the state control program outputs a corresponding second state signal.
Compared with the prior art, the invention has the beneficial effects that:
the high-speed switch control protection equipment testing device and method provided by the invention support static mode testing and dynamic mode testing, have comprehensive testing functions of action time and action characteristics, ensure the integrity of testing contents, reduce the dependence on a high-speed switch and a testing system and improve the convenience of testing work.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic composition diagram of a high-speed switch control protection device testing apparatus according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of a dsp state control procedure according to an embodiment of the present invention.
Detailed Description
The technical scheme and the beneficial effects of the invention are explained in detail in the following with the accompanying drawings.
Referring to fig. 1, the testing device for the high-speed switch control protection device of the invention is respectively connected with the high-speed switch control protection device and the static mold or dynamic mold testing system, and receives a high-speed switch opening and closing instruction signal sent by the high-speed switch control protection device and a first state signal and a voltage current input signal sent by the static mold or dynamic mold testing system. The testing device comprises a switching value input/output module, an analog-digital conversion module, a digital signal processor, a field programmable gate array, a central processing unit and a photoelectric conversion module.
The switching value input and output module is used for receiving the first state signal and outputting the switching-on and switching-off command signal of the high-speed switch to a static mold or dynamic mold test system;
the analog-digital conversion module is used for sampling the voltage and current input signals to obtain voltage and current sampling signals;
the digital signal processor is respectively connected with the field programmable gate array, the switching value input and output module and the analog-digital conversion module, and is configured to process a first state signal, a high-speed switch switching-on and switching-off instruction signal and a voltage and current sampling signal and generate a second state signal and a high-speed switch state signal through a state control program;
the field programmable gate array is respectively connected with the central processing unit and the photoelectric conversion module and is used for decoding the high-speed switch opening and closing instruction signal and coding the high-speed switch state signal and the voltage and current sampling signal;
the central processing unit is used for carrying out fault recording, event recording, fixed value management, time synchronization and communication operation; the central processing unit selects the first state signal and the second state signal through a fixed value to control the digital signal processor to generate a high-speed switch state signal;
The photoelectric conversion module is used for converting the received high-speed switch opening and closing instruction signal into an electric signal from an optical signal and sending the electric signal to the field programmable gate array, converting the high-speed switch state signal and the voltage and current sampling signal into an optical signal from the electric signal and sending the optical signal to the high-speed switch control protection device; and the static mould or dynamic mould test system is respectively connected with the switching value input and output module and the analog-digital conversion module.
In this embodiment, the central processing unit has an embedded real-time operating system, and the communication and the fixed value management are performed through the embedded real-time operating system.
In this embodiment, the second state signal is composed of a preset signal name, an initial state, a trigger source and a shift delay, where the trigger source is the high-speed switch opening and closing instruction signal or a preset software forced trigger signal.
In this embodiment, the signals used for fault recording include a high-speed switch state signal, a high-speed switch opening and closing instruction signal and a voltage and current sampling signal, and the signals used for event recording include a high-speed switch state signal and a high-speed switch opening and closing instruction signal.
In this embodiment, the central processing unit has an indication module, and is used for indicating the states of the high-speed switch state signal and the high-speed switch opening and closing instruction signal.
In this embodiment, the static mold or dynamic mold testing system has a static mold testing mode and a dynamic mold testing mode.
In this embodiment, the switching value input/output module receives the first status signal through a photocoupler.
In this embodiment, the digital signal processor is connected to the field programmable gate array through a PCIE bus, connected to the switching value input/output module through an input/output port, and connected to the analog-to-digital conversion module through a DMA.
The test method of the test device of the high-speed switch control protection equipment comprises the following steps:
step 1: setting a fixed value of a static mold test mode or a dynamic mold test mode of the test device through a central processing unit according to test requirements, and setting a signal name, an initial state, a trigger source and displacement delay of a first state signal in the static mold test mode;
and 2, step: the voltage and current input signals of a static mould or dynamic mould test system are received through an analog-digital conversion module, sampled and encoded and then sent to a high-speed switch control protection device through a photoelectric conversion module;
and 3, step 3: decoding a high-speed switch opening and closing instruction signal sent by high-speed switch control protection equipment, triggering fault recording, event recording, state indication and a state control program of a digital signal processor of a central processing unit, and outputting the signal to a static mold or dynamic mold test system through a switching value input and output module;
And 4, step 4: and judging the action logic and the action characteristics of the high-speed switch control protection equipment according to the fault recording, the event recording and the state indication to finish the test.
It is clear that the analog high-speed switch state signal is set according to the actual signal of the high-speed switch body.
Referring to fig. 2, the state control program has a multi-way timer and a state trigger, the multi-way timer starts timing after receiving a switching-on/off command signal or a software forced trigger signal issued by the control protection device, the state trigger is controlled to shift after reaching shift delay, and the state control program outputs a corresponding second state signal.
In a moving die test mode, the test device mainly realizes the communication protocol conversion and fault recording functions between the high-speed switch control protection equipment and the test system;
the testing device can also verify the influence of the normal opening and closing action of the high-speed switch and abnormal working conditions such as operation rejection, misoperation, fault locking and the like on the action logic of the control protection equipment by simulating the high-speed switch body in the static mode testing mode, and realizes effective testing of the control protection equipment.
It should be noted that the above-mentioned embodiments described with reference to the drawings are only intended to illustrate the present invention and not to limit the scope of the present invention, and it should be understood by those skilled in the art that modifications and equivalent substitutions can be made without departing from the spirit and scope of the present invention. Furthermore, unless the context indicates otherwise, words that appear in the singular include the plural and vice versa. Additionally, all or a portion of any embodiment may be utilized with all or a portion of any other embodiment, unless stated otherwise.
Claims (10)
1. High speed switch control protection equipment testing arrangement, its characterized in that, testing arrangement is connected with high speed switch control protection equipment, quiet mould or movable mould test system respectively, and the high speed switch divide-shut brake command signal and the first state signal and the voltage current input signal that quiet mould or movable mould test system sent that receive high speed switch control protection equipment sent, testing arrangement includes:
the switching value input and output module is configured to receive the first state signal and output the high-speed switch opening and closing instruction signal to a static mold or dynamic mold test system;
the analog-digital conversion module is configured to sample the voltage-current input signal to obtain a voltage-current sampling signal;
the digital signal processor is configured to process the first state signal, the high-speed switch opening and closing instruction signal and the voltage and current sampling signal, and generate a second state signal and a high-speed switch state signal through a state control program;
the field programmable gate array is configured to decode the high-speed switch opening and closing instruction signal and encode the high-speed switch state signal and the voltage and current sampling signal;
the central processing unit is configured to perform fault recording, event recording, fixed value management, time synchronization and communication operation;
The photoelectric conversion module is configured to convert the received high-speed switch opening and closing instruction signal into an electric signal from an optical signal and send the electric signal to the field programmable gate array, convert the high-speed switch state signal and the voltage and current sampling signal into the optical signal from the electric signal and send the optical signal to the high-speed switch control protection device;
the central processing unit selects the first state signal and the second state signal through a fixed value to control the digital signal processor to generate a high-speed switch state signal.
2. The high-speed switch control protection device test apparatus of claim 1, wherein: the central processing unit is provided with an embedded real-time operating system, and the communication and the fixed value management are carried out through the embedded real-time operating system.
3. The high-speed switch control protection device test apparatus of claim 2, wherein: the second state signal comprises a preset signal name, an initial state, a trigger source and a deflection delay, wherein the trigger source is the high-speed switch opening and closing instruction signal or a preset software forced trigger signal.
4. The high-speed switch control protection device test apparatus of claim 3, wherein: the signals adopted by the fault recording comprise a high-speed switch state signal, a high-speed switch opening and closing instruction signal and a voltage and current sampling signal, and the signals adopted by the event recording comprise a high-speed switch state signal and a high-speed switch opening and closing instruction signal.
5. The high-speed switch control protection device test apparatus of claim 4, wherein: the central processing unit is provided with an indicating module used for indicating the states of the high-speed switch state signal and the high-speed switch opening and closing instruction signal.
6. The high-speed switch control protection device test apparatus of claim 5, wherein: the static mold or moving mold test system has a static mold test mode and a moving mold test mode.
7. The high-speed switch control protection device test apparatus of claim 1, wherein: the switching value input and output module receives a first state signal through a photoelectric coupler.
8. The high-speed switch control protection device test apparatus of claim 1, wherein: the digital signal processor is connected with the field programmable gate array through a PCIE bus, connected with the switching value input and output module through an input and output port and connected with the analog-digital conversion module through a DMA mode.
9. The test method of the test device of the high-speed switch control protection equipment according to claim 6, characterized by comprising the following steps:
setting a fixed value of a static mode test mode or a dynamic mode test mode of the test device through a central processing unit according to test requirements, and setting a signal name, an initial state, a trigger source and deflection delay of a first state signal in the static mode test mode;
Receiving a voltage and current input signal of a static mold or dynamic mold test system through an analog-digital conversion module, sampling and encoding the voltage and current input signal, and sending the signal to a high-speed switch control protection device through a photoelectric conversion module;
decoding a high-speed switch opening and closing instruction signal sent by high-speed switch control protection equipment, triggering fault recording, event recording, state indication and a state control program of a digital signal processor of a central processing unit, and outputting the signal to a static mold or dynamic mold test system through a switching value input and output module;
and judging the action logic and the action characteristics of the high-speed switch control protection equipment according to the fault recording, the event recording and the state indication to finish the test.
10. The test method of the high-speed switch control protection device test apparatus according to claim 9, characterized in that: the state control program is provided with a multi-way timer and a state trigger, the multi-way timer starts to time after receiving a switching-on/off command signal or a software forced trigger signal issued by the control protection device, the state trigger is controlled to shift after the shift delay is reached, and the state control program outputs a corresponding second state signal.
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| CN113740725B (en) * | 2021-09-09 | 2023-05-16 | 广东电网有限责任公司 | Method and device for monitoring state of driving unit of repulsive force switch |
| CN114371641B (en) * | 2021-12-02 | 2024-04-26 | 浙江省送变电工程有限公司 | Portable quick switch debugging device |
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