CN113324492A - High-precision object deformation monitoring system and method based on infrared ray - Google Patents
High-precision object deformation monitoring system and method based on infrared ray Download PDFInfo
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- CN113324492A CN113324492A CN202110672395.XA CN202110672395A CN113324492A CN 113324492 A CN113324492 A CN 113324492A CN 202110672395 A CN202110672395 A CN 202110672395A CN 113324492 A CN113324492 A CN 113324492A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
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Abstract
The invention relates to the technical field of object deformation monitoring, and discloses a high-precision object deformation monitoring system and method based on infrared rays. The invention has the advantages that: the transmission direction of infrared emission module is corresponding with the position of reflector, the reflector sets up the arbitrary surface with the object, infrared deformation detection module's receiving terminal is corresponding with the reflection direction of reflector, when can making the detection, only needs to set up an infrared transmitter, need not set up infrared device at every face, reduces the volume, reduces the setting of transmitter simultaneously, can reduce the mutual interference between the infrared transmitter, reduces the deviation, and a plurality of faces adopt a light to detect moreover, can improve accurate nature.
Description
Technical Field
The invention relates to the technical field of object deformation monitoring, in particular to a high-precision object deformation monitoring system and method based on infrared rays.
Background
With the continuous development of the industrial production level, people have higher and higher requirements on the measurement precision and efficiency. The photoelectric detection technology has the characteristics of high precision, high speed, high stability and the like, and can meet the requirements and development directions of people on the modern detection technology, so that the photoelectric detection technology is more and more emphasized by people.
With the application of the photoelectric detection technology, the traditional method for measuring the deformation of the object is eliminated, and the photoelectric detection technology is applied to the measurement of the deformation of the object.
However, the object has a plurality of surfaces, and in order to monitor the plurality of surfaces, a plurality of infrared monitoring devices need to be installed, so that the device is large in size, and the measurement accuracy is affected, so that the accuracy is low.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides a high-precision object deformation monitoring system and method based on infrared rays, which have the advantages of small volume, high detection precision and the like, and solve the problems of complex structure and low detection precision.
(II) technical scheme
In order to achieve the purpose, the invention provides the following technical scheme: the utility model provides a high accuracy object deformation monitoring system based on infrared ray, includes little the control unit, infrared deformation detection module, three-dimensional angle detection module, quartz crystal syntonizer, infrared emission module, low voltage detection module, button scanning module, DC power module, battery power module, reflector and LDE pilot lamp, infrared deformation detection module's output and little the control unit's input electric connection, three-dimensional angle detection module's output and little the control unit's input electric connection, the output of quartz crystal syntonizer and little the control unit's input electric connection, little the control unit's output and infrared emission module's output electric connection.
Preferably, the output ends of the low-voltage detection module and the key scanning module are electrically connected with the input end of the micro control unit, the output ends of the DC power supply module and the battery power supply module are electrically connected with the input ends of the micro control unit and the LDE indicator lamp together, and the output end of the micro control unit is electrically connected with the input end of the LDE indicator lamp.
Preferably, the emitting direction of the infrared emitting module corresponds to the position of a reflector, the reflector is arranged at a corner of the object, the receiving end of the infrared deformation detecting module corresponds to the reflecting direction of the reflector, and the three-dimensional angle detecting module is arranged at the bottom of the object to be detected.
The invention aims to solve another technical problem of providing a high-precision object deformation monitoring method based on infrared rays, which comprises the following steps:
1) the infrared emission module emits an infrared signal to irradiate the reflector;
2) the infrared rays are reflected by the reflectors until the last reflector receives the infrared rays and are reflected to the infrared deformation detection module;
3) when the object is deformed, the deformed part shields a part of wave frequency;
4) and judging whether deformation occurs according to the infrared light wave frequency width received by the infrared deformation detection module, and judging the position of the deformation surface according to the wave frequency loss range.
Preferably, the detection origin is a position where the object is reflected to the infrared deformation detection module when the object is not deformed, the detection origin is an infrared wave frequency reflected to the infrared deformation detection module when the object is not deformed, the judgment of the offset and the deformation surface is carried out according to an object deformation reflection receiving point data model, and the data model is accumulated according to wave frequency data received by the infrared deformation detection module after the object is deformed every time.
Preferably, the infrared deformation detection module sends the received reflected receiving position information to the micro control unit, and the micro control unit comprehensively judges the deformation surface by combining the object angle deviation information sensed by the three-dimensional angle detection module.
(III) advantageous effects
Compared with the prior art, the invention provides a high-precision object deformation monitoring system and method based on infrared rays, which have the following beneficial effects:
the infrared-based high-precision object deformation monitoring system and method are characterized in that a micro control unit, an infrared deformation detection module, a three-dimensional angle detection module, a quartz crystal resonator, an infrared emission module, a low voltage detection module, a key scanning module, a DC power supply module, a battery power supply module, a reflector and an LDE indicator lamp are arranged, the output end of the infrared deformation detection module is electrically connected with the input end of the micro control unit, the output end of the three-dimensional angle detection module is electrically connected with the input end of the micro control unit, the output end of the quartz crystal resonator is electrically connected with the input end of the micro control unit, the output end of the micro control unit is electrically connected with the output end of the infrared emission module, the emission direction of the infrared emission module corresponds to the position of the reflector, the reflector is arranged at the edge of an object, and the receiving end of the infrared deformation detection module corresponds to the reflection direction of the reflector, the three-dimensional angle detection module is arranged at the bottom of an object to be detected, when detection can be carried out, the infrared rays are reflected by the reflectors to the last reflector, the infrared rays are received and are reflected to the infrared deformation detection module, the infrared light waves penetrate through any surface of the object through the reflectors, when the object is deformed, the deformed part shields a part of wave frequency, whether deformation occurs or not is judged according to the infrared light wave frequency width received by the infrared deformation detection module, the deformed surface position is judged according to the wave frequency loss range, an infrared emission unit can be adopted for detecting the deformation information of the surfaces through reflection of the reflectors, meanwhile, the shielded position of the light waves can be judged through the wave frequency of the received infrared spectrum, the purpose of judging the deformed position is achieved, and meanwhile, the judgment precision is improved.
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FIG. 1 is a schematic diagram of the system of the present invention;
fig. 2 is a schematic circuit structure of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The first embodiment is as follows: the utility model provides a high accuracy object deformation monitoring system based on infrared ray, including little the control unit, infrared deformation detection module, three-dimensional angle detection module, quartz crystal syntonizer, infrared emission module, low-voltage detection module, button scanning module, DC power module, battery power module, reflector and LDE pilot lamp, infrared deformation detection module's output and little the control unit's input electric connection, three-dimensional angle detection module's output and little the control unit's input electric connection, quartz crystal syntonizer's output and little the control unit's input electric connection, little the control unit's output and infrared emission module's output electric connection.
The output ends of the low-voltage detection module and the key scanning module are electrically connected with the input end of the micro control unit, the output ends of the DC power supply module and the battery power supply module are electrically connected with the input ends of the micro control unit and the LDE indicating lamp together, and the output end of the micro control unit is electrically connected with the input end of the LDE indicating lamp.
The transmitting direction of the infrared transmitting module corresponds to the position of the reflector, the reflector is arranged at the corner of the object, the receiving end of the infrared deformation detecting module corresponds to the reflecting direction of the reflector, the three-dimensional angle detecting module is arranged at the bottom of the object to be detected, the three-dimensional angle detecting module is a pressure sensor, after the object is deformed, the gravity center can be shifted, and angle shift information can be obtained through the change of pressure.
A high-precision object deformation monitoring method based on infrared rays comprises the following steps:
1) the infrared emission module emits an infrared signal to irradiate the reflector;
2) the infrared rays are reflected by the reflectors until the last reflector receives the infrared rays and are reflected to the infrared deformation detection module;
3) when the object is deformed, the deformed part shields a part of wave frequency;
4) and judging whether deformation occurs according to the infrared light wave frequency width received by the infrared deformation detection module, and judging the position of the deformation surface according to the wave frequency loss range.
The position that reflects infrared deformation detection module when detecting the initial point for the object does not have deformation on, the detection initial point reflects infrared wave frequency on the infrared deformation detection module when not having deformation for the object, the judgement of offset and deformation face is judged according to object deformation reflection receiving point data model, the data model takes place the wave frequency data accumulation that infrared deformation detection module received after deformation at every turn according to the object and comes, through the accumulation of data, can provide the reference for the change of offset, can improve the accuracy of judgement gradually.
The infrared deformation detection module sends the received reflection receiving position information to the micro control unit, the micro control unit comprehensively judges a deformation surface by combining the object angle deviation information sensed by the three-dimensional angle detection module, and the judgment accuracy can be improved by combining the angle change information.
The invention has the beneficial effects that: by arranging the micro control unit, the infrared deformation detection module, the three-dimensional angle detection module, the quartz crystal resonator, the infrared emission module, the low voltage detection module, the key scanning module, the DC power supply module, the battery power supply module, the reflector and the LDE indicator lamp, the output end of the infrared deformation detection module is electrically connected with the input end of the micro control unit, the output end of the three-dimensional angle detection module is electrically connected with the input end of the micro control unit, the output end of the quartz crystal resonator is electrically connected with the input end of the micro control unit, the output end of the micro control unit is electrically connected with the output end of the infrared emission module, the emission direction of the infrared emission module corresponds to the position of the reflector, the reflector is arranged at the corner of an object, and the receiving end of the infrared deformation detection module corresponds to the reflection direction of the reflector, the three-dimensional angle detection module is arranged at the bottom of an object to be detected, when detection can be carried out, the infrared rays are reflected by the reflectors to the last reflector, the infrared rays are received and are reflected to the infrared deformation detection module, the infrared light waves penetrate through any surface of the object through the reflectors, when the object is deformed, the deformed part shields a part of wave frequency, whether deformation occurs or not is judged according to the infrared light wave frequency width received by the infrared deformation detection module, the deformed surface position is judged according to the wave frequency loss range, an infrared emission unit can be adopted for detecting the deformation information of the surfaces through reflection of the reflectors, meanwhile, the shielded position of the light waves can be judged through the wave frequency of the received infrared spectrum, the purpose of judging the deformed position is achieved, and meanwhile, the judgment precision is improved through a continuously accumulated data model.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a high accuracy object deformation monitoring system based on infrared ray, its characterized in that, includes little the control unit, infrared deformation detection module, three-dimensional angle detection module, quartz crystal syntonizer, infrared emission module, low-voltage detection module, button scanning module, DC power module, battery power module, reflector and LDE pilot lamp, infrared deformation detection module's output and little the control unit's input electric connection, three-dimensional angle detection module's output and little the control unit's input electric connection, the output of quartz crystal syntonizer and little the control unit's input electric connection, little the control unit's output and infrared emission module's output electric connection.
2. The infrared-based high-precision object deformation monitoring system according to claim 1, wherein the output ends of the low voltage detection module and the key scanning module are electrically connected to the input end of the micro control unit, the output ends of the DC power supply module and the battery power supply module are electrically connected to the input ends of the micro control unit and the LDE indicator lamp, and the output end of the micro control unit is electrically connected to the input end of the LDE indicator lamp.
3. The infrared-based high-precision object deformation monitoring system according to claim 1, wherein the emitting direction of the infrared emitting module corresponds to the position of a reflector, the reflector is arranged at a corner of an object, the receiving end of the infrared deformation detecting module corresponds to the reflecting direction of the reflector, and the three-dimensional angle detecting module is arranged at the bottom of the object to be detected.
4. An infrared-based high-precision object deformation monitoring method as claimed in claim 1, characterized by comprising the following steps:
1) the infrared emission module emits an infrared signal to irradiate the reflector;
2) the infrared rays are reflected by the reflectors until the last reflector receives the infrared rays and are reflected to the infrared deformation detection module;
3) when the object is deformed, the deformed part shields a part of wave frequency;
4) and judging whether deformation occurs according to the infrared light wave frequency width received by the infrared deformation detection module, and judging the position of the deformation surface according to the wave frequency loss range.
5. The method as claimed in claim 4, wherein the detection origin is an infrared wave frequency reflected to an infrared deformation detection module when the object is not deformed, the offset and the deformation surface are determined according to an object deformation reflection receiving point data model, and the data model is accumulated according to wave frequency data received by the infrared deformation detection module after each deformation of the object.
6. An infrared-based high-precision object deformation monitoring method as claimed in claim 4, wherein the infrared deformation detection module sends the received reflected receiving position information to the micro control unit, and the micro control unit comprehensively judges the deformation surface by combining the object angle deviation information sensed by the three-dimensional angle detection module.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114018169A (en) * | 2021-11-03 | 2022-02-08 | 扬州万泰电子科技有限公司 | Optical detection system and detection method for monitoring load deformation of metal piece in real time |
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2021
- 2021-06-17 CN CN202110672395.XA patent/CN113324492A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114018169A (en) * | 2021-11-03 | 2022-02-08 | 扬州万泰电子科技有限公司 | Optical detection system and detection method for monitoring load deformation of metal piece in real time |
| CN114018169B (en) * | 2021-11-03 | 2024-05-28 | 扬州万泰电子科技有限公司 | Optical detection system and detection method for monitoring load deformation of metal part in real time |
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