CN113300906A - Automatic switching method and device for PCIe test fixture Lane - Google Patents
Automatic switching method and device for PCIe test fixture Lane Download PDFInfo
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- CN113300906A CN113300906A CN202110428298.6A CN202110428298A CN113300906A CN 113300906 A CN113300906 A CN 113300906A CN 202110428298 A CN202110428298 A CN 202110428298A CN 113300906 A CN113300906 A CN 113300906A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/206—Switches for connection of measuring instruments or electric motors to measuring loads
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/12—Network monitoring probes
Abstract
The application relates to a method and a device for automatically switching a PCIe test fixture Lane, belonging to the field of PCIe interface test technology, wherein the automatic switching comprises the following steps: s1: connecting the test fixture to a PCIe interface of the backboard to be tested; s2: connecting the test fixture, the multi-path selector switch, the oscilloscope, the MCU and the upper computer, wherein signal lines of the test fixture lane1-laneN are respectively connected with input ports of the multi-path selector switch in a one-to-one correspondence manner; s3: entering a lane test, grabbing a test waveform by an oscilloscope, and sending the test waveform to an upper computer; s4: whether the test is finished or not is judged, if yes, the step is S5, and if not, the step is returned to S3; s5: the upper computer sends a switching instruction to the MCU, and the MCU controls the multi-path switching switch to the next lane data signal for output; s6: and repeating the steps S3-S5 until all Lane tests are completed. The application has the effect of improving the testing efficiency.
Description
Technical Field
The present application relates to the field of PCIe interface test technologies, and in particular, to a method and an apparatus for automatically switching lanes of a PCIe test fixture.
Background
PCI Express (PCIe for short) is a new bus proposed to solve the problems of PCI bus, and adopts serial mode, and really uses "voltage differential transmission", i.e. two signal lines, and the voltage difference between them is used as the expression of logic "0" and "1", so that the transmission frequency can be raised by this mode, the signal is easy to read, and the noise influence is reduced.
Types of standard PCIe interfaces are x16, x8, x4, and x1, where x16 has 16 lanes, x8 has 8 lanes, and x4 has 4 lanes. When the existing test fixture tests the PCIe interface, Lane is connected with an oscilloscope, and whether the waveform is normal or not is checked through the oscilloscope. When a plurality of Lanes are tested, after one Lane is tested, the test probe of the oscilloscope needs to be manually replaced, the next Lane is connected with the oscilloscope, and then the next Lane is tested.
With respect to the related art among the above, the inventors consider that the following drawbacks exist: when testing multiple PCIe interfaces, the manual replacement of the plug position may result in low testing efficiency.
Disclosure of Invention
In order to improve the testing efficiency, the application provides an automatic switching method and device for a PCIe testing jig Lane.
In a first aspect, the present application provides a method for automatically switching Lane of a PCIe test fixture, which adopts the following technical scheme:
a method for automatically switching a PCIe test fixture Lane comprises the following steps:
s1: connecting the test fixture to a PCIe interface of the backboard to be tested;
s2: connecting the test fixture, the multi-path selector switch, the oscilloscope, the MCU and the upper computer, wherein signal lines of the test fixture lane1-laneN are respectively connected with input ports of the multi-path selector switch in a one-to-one correspondence manner;
s3: entering a lane test, grabbing a test waveform by an oscilloscope, and sending the test waveform to an upper computer;
s4: whether the test is finished or not is judged, if yes, the step is S5, and if not, the step is returned to S3;
s5: the upper computer sends a switching instruction to the MCU, and the MCU controls the multi-path switching switch to the next lane data signal for output;
s6: and repeating the steps S3-S5 until all Lane tests are completed.
By adopting the technical scheme, the Data signals of the Lanes are connected to the multi-path selector switch through the cables, the multi-path selector switch is controlled by the MCU to realize that the Data signals of different Lanes are connected to the oscilloscope for testing, automatic switching is completed, manual switching of Lane is not needed, and the testing efficiency is improved. The upper computer stores the test waveform, and subsequent checking is facilitated.
Optionally, in S2, the method specifically includes:
s21: respectively connecting signal lines of lane1-laneN on the test fixture with J1-JN interfaces of the multi-way selector switch;
s22: the common end C of the multi-path change-over switch is connected with the oscilloscope, and the control end DB9 of the multi-path change-over switch is connected with the MCU;
s23: the MCU is in communication connection with the upper computer through a serial port.
By adopting the technical scheme, the multi-path change-over switch, the oscilloscope and the MCU are connected, so that the measurement can be smoothly carried out. During measurement, the MCU controls the multi-way switch to switch through the control end of the multi-way switch, and the next lane test is carried out.
Optionally, the test fixture is connected to the multi-way selector switch through an SMP cable.
By adopting the technical scheme, the SMP cable enables signals to be smoothly transmitted to the oscilloscope from the multi-path change-over switch, and interference is reduced.
Optionally, the testing until all lanes are completed includes:
s61: acquiring a data signal, and obtaining the number of lanes on the test fixture according to the data signal;
s62: and identifying the number of the waveforms stored currently, judging whether the number of the waveforms is equal to the number of the lanes, and if so, judging that all the lanes are tested completely.
By adopting the technical scheme, the oscilloscope detects the waveforms of the lane on the test fixture, then captures the test waveforms, sends the captured test waveforms to the upper computer, and the upper computer stores the test waveforms, wherein the number of the waveforms is the number of the stored test waveforms. And acquiring the data signal on the test fixture, acquiring the type of the test fixture, and further determining the number of lanes on the test fixture. And then comparing the saved waveform number with the number of lanes, and if the waveform number is equal to the number of lanes, all lanes on the surface are tested.
Optionally, the acquiring the data signal includes:
s611: the MCU acquires pressure signals, obtains data signals of the test fixture lane according to the pressure signals on different pins, and sends the data signals to an upper computer.
By adopting the technical scheme, the pressure signals are identified, and the type of the test fixture is X4, X8 or X16, so that the number of lanes is obtained.
Optionally, the testing jig is provided with a pressure sensor, and the pressure sensors on different testing jigs are respectively connected with different pins of the MCU.
By adopting the technical scheme, the testing jig is provided with the pressure sensors, the pressure sensors on the testing jigs of different types are connected with the different pins of the MCU, and pressure signals are received through the different pins so as to determine the types of the testing jigs and further determine the number of the lanes.
In a second aspect, the present application provides an automatic Lane switching device for PCIe test fixtures, which adopts the following technical scheme:
an automatic switching device for a Lane test fixture is suitable for the automatic switching method, and comprises the following steps:
the test fixture is used for being connected with a PCIe interface of the backboard to be tested, and a data signal of the lane1-laneN on the test fixture is connected to an input port of the multi-way selector switch;
the multi-path selector switch is used for being connected with the test fixture, the oscilloscope and the MCU and switching to the next lane data signal to output according to the signal of the MCU;
the oscilloscope is used for being connected with the test fixture, testing the waveform, grabbing the waveform and sending the test waveform to the upper computer;
the upper computer is used for receiving and storing the test waveform and outputting a switching signal to the MCU;
and the MCU is used for being connected with the upper computer and controlling the multi-path selector switch to switch after receiving the switching signal.
By adopting the technical scheme, the Data signals of the Lanes are connected to the multi-path selector switch through the cables, the multi-path selector switch is controlled by the MCU to realize that the Data signals of different Lanes are connected to the oscilloscope for testing, automatic switching is completed, manual switching of Lane is not needed, and the testing efficiency is improved. The upper computer stores the test waveform, and subsequent checking is facilitated.
Optionally, a pressure sensor is arranged on the test fixture, the pressure sensor is located at a position where the test fixture is close to the golden finger, the pressure sensor is arranged towards the golden finger, and the pressure sensor is connected with the MCU.
Through adopting above-mentioned technical scheme, test fixture is pegged graft on the PCIe interface, and pressure sensor and PCIe interface contact, pressure sensor are extrudeed, and pressure sensor output signal gives MCU, and the different pins of MCU are connected respectively to the pressure sensor on the test fixture of different grade type, through the pressure signal that transmits on the different pins, and then confirm the figure of lane.
In summary, the present application includes at least one of the following beneficial technical effects:
1. the Data signals of a plurality of Lanes are connected to the multi-path selector switch through cables, the multi-path selector switch is controlled through the MCU to realize that the Data signals of different Lanes are connected to the oscilloscope for testing, automatic switching is completed, manual switching of Lanes is not needed, and testing efficiency is improved.
2. The testing jig is provided with pressure sensors, the pressure sensors on the testing jigs of different types are respectively connected with different pins of the MCU, the testing jig is inserted into the PCIe interface, and the number of the lane is determined through pressure signals transmitted from the different pins.
Drawings
Fig. 1 is a flowchart illustrating an automatic Lane switching method for a PCIe test fixture according to the present invention;
FIG. 2 is a flowchart of S2 of FIG. 1;
fig. 3 is a block diagram illustrating a structure of an automatic Lane switching device for a PCIe test fixture according to the present invention;
fig. 4 is a schematic structural diagram of a test fixture.
Description of reference numerals: 100. testing the jig; 101. a golden finger; 102. a pressure sensor; 200. a multi-way selector switch; 300. an oscilloscope; 400. and (4) an upper computer.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is further described in detail below with reference to fig. 1-4 and the embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The embodiment of the application discloses a method for automatically switching Lane test fixtures for PCIe test. Referring to fig. 1, the automatic switching method includes the steps of:
s1: the test fixture 100 is connected to the PCIe interface of the backplane to be tested.
Specifically, one side of the test fixture 100 having the gold finger 101 is plugged into the PCIe interface.
S2: the test fixture 100, the multi-way switch 200, the oscilloscope 300, the MCU and the upper computer 400 are connected, wherein the signal lines of the test fixture 100lane1-laneN are respectively connected with the input ports of the multi-way switch 200 in a one-to-one correspondence manner.
Specifically, the test fixture 100 is connected to the multi-way switch 200 through an SMP cable, wherein a signal line of one lane is connected to the oscilloscope 300, and signal lines of other lanes are disconnected from the oscilloscope 300, and the signal lines of different lanes are controlled to be connected to the oscilloscope 300, so that lane switching is realized.
S3: and entering a lane test, the oscilloscope 300 grabs a test waveform and sends the test waveform to the upper computer 400.
Specifically, the system is powered on and started, the oscilloscope 300 runs, and the oscilloscope 300 is debugged after a signal appears, so that the signal is completely displayed. And entering Lane testing, defaulting to start testing from Lane1, wherein the testing waveform is the waveform of Lane1 measured on the oscilloscope 300, the oscilloscope 300 captures the testing waveform of Lane1, the oscilloscope 300 is connected with the upper computer 400 through an RS232 cable, the oscilloscope 300 sends the testing waveform to the upper computer 400, the upper computer 400 is a computer, and the upper computer 400 stores the testing waveform. The test waveform may be subsequently called up from the host computer 400 to see if the waveform is problematic.
S4: if the test is finished, the process proceeds to S5, otherwise, the process returns to S3.
Specifically, the lane test is started, the oscilloscope 300 tests a corresponding test waveform and displays the test waveform, after the preset time is reached, the oscilloscope 300 grabs the test waveform and sends the test waveform to the upper computer 400, and the upper computer 400 receives the test waveform, which indicates that the current lane test is finished.
S5: the upper computer 400 sends a switching instruction to the MCU, and the MCU controls the multi-path change-over switch 200 to switch to the next lane data signal for output.
Specifically, the multi-way switch 200 switches to control the connection of the signal lines of different lanes to the oscilloscope 300.
S6: and repeating the steps S3-S5 until all Lane tests are completed.
Specifically, during testing, the signal line of one lane is connected to the oscilloscope 300, the signal lines of the other lanes are disconnected from the oscilloscope 300, after the current lane is tested, the signal line of the current lane is disconnected, so that the signal line of the next lane is connected to the oscilloscope 300, and then the testing is performed, wherein the switching sequence is as follows: lane1 → Lane2 → Lane3 → … → Lanen.
Optionally, referring to fig. 2, in step S2, the method specifically includes:
s21: the signal lines of lane1-laneN on the test fixture 100 are connected to the J1-JN interfaces of the multi-way switch 200, respectively.
S22: the common terminal C of the multi-way selector switch 200 is connected with the oscilloscope 300, and the control terminal DB9 of the multi-way selector switch 200 is connected with the MCU.
S23: the MCU is in communication connection with the upper computer 400 through a serial port.
Specifically, for example, the test fixture 100 of type X4, the multi-way switch 200 includes an a multi-way switch 200 and a B multi-way switch 200, the signal line P of Tx lane1-lane4 of the test fixture 100 is connected to J1, J2, J3 and J4 of the a multi-way switch 200 through SMP cables, the common terminal C of the a multi-way switch 200 is connected to CH3 of the oscilloscope 300, the signal line N of Tx lane1-lane4 is connected to J1, J2, J3 and J4 of the B multi-way switch 200 through SMP cables, the common terminal C of the B multi-way switch 200 is connected to CH4 of the oscilloscope 300, and the signal line P and the signal line N of PCIe clock signal are connected to CH1 and CH2 of the oscilloscope 300.
In step S6, until the tests of all lanes are completed, including:
s61: and acquiring a data signal, and obtaining the number of lanes on the test fixture 100 according to the data signal.
S62: and identifying the number of the waveforms stored currently, judging whether the number of the waveforms is equal to the number of the lanes, and if so, judging that all the lanes are tested completely.
Specifically, the oscilloscope 300 detects the waveforms of the lane on the test fixture 100, then captures the test waveforms, sends the captured test waveforms to the upper computer 400, and the upper computer 400 stores the test waveforms, where the number of the waveforms is the number of the stored test waveforms. The data signal on the test fixture 100 is obtained to obtain the type of the test fixture 100, so as to determine the number of lanes on the test fixture 100. And then comparing the saved waveform number with the number of lanes, and if the waveform number is equal to the number of lanes, all lanes on the surface are tested.
In step S6, a data signal is acquired, including:
s611: the MCU acquires pressure signals, acquires data signals of the test fixture 100lane according to the pressure signals on different pins, and sends the data signals to the upper computer 400.
Specifically, the test fixture 100 is provided with the pressure sensors 102, the pressure sensors 102 on different test fixtures 100 are respectively connected with different pins of the MCU, the pressure sensors 102 are squeezed, the pressure sensors 102 send pressure signals to the MCU, and the pressure signals are received through the different pins to determine the type of the test fixture 100, and further determine the number of lanes. For example, the pressure sensor 102 on the test fixture 100 of type X4 is connected to the 1 pin of the MCU, and the pressure sensor 102 on the test fixture 100 of type X8 is connected to the 2 pin of the MCU. When the 1 pin of the MCU receives the pressure signal, it indicates that the type of the current test fixture 100 is X4, and the number of lanes is 4; when the 2 pins of the MCU receive the pressure signal, it indicates that the type of the current test fixture 100 is X8, and the number of lanes is 8.
The embodiment of the application also discloses a device for automatically switching Lane test fixtures. Referring to fig. 3, the automatic switching apparatus includes:
the test fixture 100 is used for being connected with a PCIe interface of the backboard to be tested, and a data signal of lane1-laneN on the test fixture 100 is connected to an input port of the multi-way selector switch 200;
the multi-path selector switch 200 is used for being connected with the test fixture 100, the oscilloscope 300 and the MCU, and switching to the next lane data signal according to the signal of the MCU for outputting;
the oscilloscope 300 is connected with the test fixture 100, tests waveforms, captures the waveforms and sends the test waveforms to the upper computer 400;
the upper computer 400 is used for receiving and storing the test waveform and outputting a switching signal to the MCU;
and the MCU is used for being connected with the upper computer 400 and controlling the multi-way selector switch 200 to switch after receiving the switching signal.
Optionally, referring to fig. 4, a pressure sensor 102 is disposed on the test fixture 100, the pressure sensor 102 is located at a position where the test fixture 100 is close to the golden finger 101, the pressure sensor 102 is disposed toward the golden finger 101, and the pressure sensor 102 is connected to the MCU.
The implementation principle of the Lane automatic switching device for the PCIe test fixture in the embodiment of the application is as follows: the Data signals of a plurality of Lanes are connected to the multi-path selector switch 200 through cables, the multi-path selector switch 200 is controlled through the MCU to realize that the Data signals of different Lanes are connected to the oscilloscope 300 for testing, automatic switching is completed, manual switching of Lane is not needed, and testing efficiency is improved. The upper computer 400 stores the test waveforms, and facilitates subsequent checking.
The foregoing is a preferred embodiment of the present application and is not intended to limit the scope of the application in any way, and any features disclosed in this specification (including the abstract and drawings) may be replaced by alternative features serving equivalent or similar purposes, unless expressly stated otherwise. That is, unless expressly stated otherwise, each feature is only an example of a generic series of equivalent or similar features.
Claims (8)
1. A method for automatically switching a Lane test fixture for PCIe is characterized by comprising the following steps:
s1: connecting the test fixture (100) to a PCIe interface of the backboard to be tested;
s2: connecting a test fixture (100), a multi-way selector switch (200), an oscilloscope (300), an MCU (microprogrammed control unit) and an upper computer (400), wherein signal lines of lane1-laneN of the test fixture (100) are respectively connected with input ports of the multi-way selector switch (200) in a one-to-one correspondence manner;
s3: entering a lane test, grabbing a test waveform by an oscilloscope (300), and sending the test waveform to an upper computer (400);
s4: whether the test is finished or not is judged, if yes, the step is S5, and if not, the step is returned to S3;
s5: the upper computer (400) sends a switching instruction to the MCU, and the MCU controls the multi-path switching switch (200) to switch to the next lane data signal for output;
s6: and repeating the steps S3-S5 until all Lane tests are completed.
2. The automatic switching method according to claim 1, wherein in S2, the method specifically includes:
s21: connecting signal lines of lane1-laneN on the test fixture (100) with a J1-JN interface of the multi-way switch (200) respectively;
s22: the common end C of the multi-path selector switch (200) is connected with the oscilloscope (300), and the control end DB9 of the multi-path selector switch (200) is connected with the MCU;
s23: the MCU is in communication connection with the upper computer (400) through a serial port.
3. The automatic switching method according to claim 2, wherein the test fixture (100) is connected to the multi-way switch (200) by an SMP cable.
4. The automatic switching method of claim 1, wherein said testing until all lanes are completed comprises:
s61: acquiring a data signal, and acquiring the number of lanes on the test fixture (100) according to the data signal;
s62: and identifying the number of the waveforms stored currently, judging whether the number of the waveforms is equal to the number of the lanes, and if so, judging that all the lanes are tested completely.
5. The automatic switching method according to claim 4, wherein said acquiring a data signal comprises:
s611: the MCU acquires pressure signals, acquires data signals of the lane of the test fixture (100) according to the pressure signals on different pins, and sends the data signals to the upper computer (400).
6. The automatic switching method according to claim 5, wherein the testing fixture (100) is provided with a pressure sensor (102), and the pressure sensors (102) of different testing fixtures (100) are respectively connected to different pins of the MCU.
7. An automatic switching device for Lane testing jig, which is suitable for the automatic switching method of any one of claims 1 to 6, comprising:
the test fixture (100) is used for being connected with a PCIe interface of the backboard to be tested, and a data signal of the lane1-laneN on the test fixture (100) is connected to an input port of the multi-way selector switch (200);
the multi-path selector switch (200) is used for being connected with the test fixture (100), the oscilloscope (300) and the MCU, and switching to the next lane data signal according to the signal of the MCU for outputting;
the oscilloscope (300) is connected with the test fixture (100), tests the waveform, captures the waveform and sends the test waveform to the upper computer (400);
the oscilloscope (300) is connected with the test fixture (100), tests the waveform, captures the waveform and sends the test waveform to the upper computer (400);
the upper computer (400) is used for receiving and storing the test waveform and outputting a switching signal to the MCU;
and the MCU is used for being connected with the upper computer (400) and controlling the multi-way selector switch (200) to switch after receiving the switching signal.
8. The automatic switching device according to claim 7, wherein a pressure sensor (102) is disposed on the testing fixture (100), the pressure sensor (102) is located at a position of the testing fixture (100) close to the golden finger (101), the pressure sensor (102) is disposed towards the golden finger (101), and the pressure sensor (102) is connected to the MCU.
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| CN202110428298.6A CN113300906B (en) | 2021-04-21 | 2021-04-21 | Automatic switching method and device for PCIe test fixture Lane |
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