CN113297075A - Software defect information acquisition method and device - Google Patents
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Abstract
The application provides a method and a device for acquiring software defect information, wherein the method comprises the following steps: in the testing process, responding to a defect screenshot instruction of a user, and performing screenshot on the current testing interface of the tested software to obtain a defect image of the testing interface; loading the defect image to a preset display window; acquiring the defect description information input by a user under the condition that the user inputs the defect description information through a display window; and when a storage instruction is received, the defect image in the display window and the acquired defect description information are stored in an associated manner. According to the technical scheme, after the test interface is subjected to screenshot, the defect image obtained through the screenshot is loaded to the preset display window, and the user can directly input the defect description information in the display window, so that under the condition that a storage instruction is received, the defect image in the display window and the defect description information input by the user can be directly subjected to associated storage, the defect information obtaining speed is increased, and the test efficiency is improved.
Description
Technical Field
The present application relates to the field of software testing, and in particular, to a method and an apparatus for acquiring software defect information.
Background
Software testing is an important stage in a software life cycle and is an important process for ensuring software quality, and in the software testing process, the acquisition of software defect information is often involved, namely the acquisition of a defect screenshot and defect description information corresponding to the defect screenshot.
The existing software defect information acquisition scheme is as follows: and calling a third-party screenshot tool to perform defect screenshot after the software defect is found, and then selecting and uploading the previous defect screenshot and adding corresponding defect description information when defect creation is performed subsequently. The existing software defect information acquisition scheme needs to consume a large amount of time on how to create and describe defects and arranging screenshot sequences, so that the software defect information acquisition speed is low, and the software testing efficiency is low.
Disclosure of Invention
The application provides a method and a device for acquiring software defect information, and aims to solve the problems that the conventional software defect information acquisition scheme needs to consume a large amount of time on how to create and describe defects and arranging screenshot sequences, so that the software defect information acquisition speed is low, and the software testing efficiency is low.
In order to achieve the above object, the present application provides the following technical solutions:
a software defect information acquisition method comprises the following steps:
in the testing process, responding to a defect screenshot instruction of a user, and screenshot a current testing interface of the tested software to obtain a defect image of the testing interface;
loading the defect image to a preset display window;
acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window;
and when a storage instruction is received, the defect image in the display window and the acquired defect description information are stored in a correlation mode.
In the foregoing method, optionally, after loading the defect image into a preset display window, the method further includes:
and responding to the editing instruction of the user, and executing the editing operation corresponding to the editing instruction on the defect image.
Optionally, the above method, where the associating and storing the defect image in the display window and the acquired defect description information includes:
acquiring a storage mode selected by the user through the display window;
and based on the storage mode selected by the user, performing associated storage on the defect image in the display window and the acquired defect description information.
Optionally, in the method, the associating and storing the defect image in the display window and the acquired defect description information based on the storage method selected by the user includes:
if the storage mode selected by the user is online storage, the defect image in the display window and the defect description information are stored to a test management system in an associated manner through a preset interface;
and if the storage mode selected by the user is offline storage, the defect image in the display window and the defect description information are stored in a local database in an associated manner.
In the foregoing method, optionally, after loading the defect image into a preset display window, the method further includes:
and responding to a hiding instruction of a user, and hiding the display window.
A software defect information acquisition apparatus comprising:
the screenshot unit is used for responding to a defect screenshot instruction of a user in the test process, and screenshot the current test interface of the software to be tested to obtain a defect image of the test interface;
the loading unit is used for loading the defect image to a preset display window;
the acquiring unit is used for acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window;
and the storage unit is used for storing the defect image in the display window and the acquired defect description information in a correlation manner when receiving a storage instruction.
The above apparatus, optionally, further comprises:
and the editing unit is used for responding to the editing instruction of the user and executing the editing operation corresponding to the editing instruction on the defect image.
Optionally, in the apparatus described above, the storage unit is configured to store the defect image in the display window and the acquired defect description information in an associated manner, and includes the storage unit specifically configured to:
acquiring a storage mode selected by the user through the display window;
and based on the storage mode selected by the user, performing associated storage on the defect image in the display window and the acquired defect description information.
Optionally, in the above apparatus, the storage unit is configured to perform associated storage on the defect image in the display window and the acquired defect description information based on the storage manner selected by the user, and includes the storage unit specifically configured to:
if the storage mode selected by the user is online storage, the defect image in the display window and the defect description information are stored to a test management system in an associated manner through a preset interface;
and if the storage mode selected by the user is offline storage, the defect image in the display window and the defect description information are stored in a local database in an associated manner.
The above apparatus, optionally, further comprises:
and the hiding unit is used for responding to a hiding instruction of a user and hiding the display window.
A storage medium, the storage medium comprising stored instructions, wherein when the instructions are executed, a device in which the storage medium is located is controlled to execute the software defect information acquiring method.
An electronic device comprises a memory and one or more instructions, wherein the one or more instructions are stored in the memory and configured to be executed by one or more processors to perform the software defect information acquisition method.
Compared with the prior art, the method has the following advantages:
the application provides a method and a device for acquiring software defect information, wherein the method comprises the following steps: in the testing process, responding to a defect screenshot instruction of a user, and performing screenshot on the current testing interface of the tested software to obtain a defect image of the testing interface; loading the defect image to a preset display window; acquiring the defect description information input by a user under the condition that the user inputs the defect description information through a display window; and when a storage instruction is received, the defect image in the display window and the acquired defect description information are stored in an associated manner. According to the technical scheme, after the test interface is subjected to screenshot, the defect image obtained through the screenshot is loaded to the preset display window, and the user can directly input the defect description information in the display window, so that under the condition that a storage instruction is received, the defect image in the display window and the defect description information input by the user can be directly subjected to associated storage, the defect information obtaining speed is increased, and the software test efficiency is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a flowchart illustrating a method for acquiring software defect information according to the present application;
FIG. 2 is a flowchart of another method of a software defect information obtaining method provided in the present application;
FIG. 3 is a flowchart illustrating another method of a software defect information obtaining method according to the present application;
fig. 4 is a schematic structural diagram of a software defect information acquiring apparatus provided in the present application;
fig. 5 is a schematic structural diagram of an electronic device provided in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the application provides a software defect information acquisition method, which can be applied to various system platforms, wherein an execution main body of the software defect information acquisition method can be screenshot software, the screenshot software can be integrated in a test platform or can be independent of test management communication and is associated with the test management system in an interface calling mode, and a method flow chart of the software defect information acquisition method is shown in fig. 1 and specifically comprises the following steps:
s101, in the testing process, responding to a defect screenshot instruction of a user, and performing screenshot on the current testing interface of the tested software to obtain a defect image of the testing interface.
In this embodiment, the screenshot software is started in advance, and may be displayed in a form of a small window, or alternatively, the screenshot software may be hidden after the screenshot software is started. It should be noted that, after the screenshot software is started, the screenshot software can monitor the keyboard operation in real time.
In this embodiment, the defect screenshot instruction is an instruction sent by a user by clicking a screenshot function in a small window corresponding to the screenshot software or inputting a screenshot shortcut key after the user finds that a current test interface of the software to be tested has a defect during a test process. Alternatively, the screenshot shortcut may be set to CTRL + B, or the CTRL key may be double clicked for a preset period of time.
In this embodiment, the screenshot software responds to the defect screenshot instruction, and performs screenshot on the current test interface of the software to be tested, so as to obtain a defect image of the test interface.
And S102, loading the defect image to a preset display window.
And after the defect image of the test interface is obtained, loading the defect image to a preset display window, wherein the preset display window is a display interface in screenshot software.
In this embodiment, after the defect image is loaded to the preset display window, the display window including the defect image is displayed to the user.
In this embodiment, the defect image is displayed in the form of a tab page in the display window.
It should be noted that, in the method provided in this embodiment, the step S101 and the step S102 may be executed multiple times to perform batch screenshot, that is, after the step S102 is executed each time, the step S101 is returned to be executed to implement batch screenshot; and loading each defect image of the batch screenshot into a display window in a label page mode.
It should be noted that the batch screenshot obtains different interfaces of the software to be tested corresponding to each defect image.
S103, acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window.
In this embodiment, a defect description information input box is preset in the display window, and a user can input the defect description information corresponding to the screenshot image through the defect description information input box in the display window.
And acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window.
In this embodiment, if the screenshot is a batch screenshot, the user may input the defect description information corresponding to all the defect images related to the batch screenshot through the display window after all the defect images related to the batch screenshot are loaded to the display window.
In this embodiment, for both the batch screenshot case and the non-batch screenshot case, the defect description information input by the user can be triggered and acquired only when the user inputs the defect description information through the display window.
In this embodiment, the defect description information includes, but is not limited to, a defect type, a defect header, and a defect description.
And S104, when a storage instruction is received, storing the defect image in the display window and the acquired defect description information in a correlation mode.
In this embodiment, when a storage instruction is received, the defect image in the display window and the acquired defect description information are stored in association, that is, the defect image in the display window and the defect description information input by the user in the defect description information input box are stored in association.
It should be noted that, after the defect image in the display window and the acquired defect description information are stored in association, the defect image and the defect description information will not exist in the display window.
The storage instruction is an instruction sent by a storage button in a display window or a keyboard shortcut key after a user finishes capturing a defect of a test flow. Wherein, the test flow is used for indicating the test process of one function or a plurality of related functions of the tested software,
referring to fig. 2, the process of storing the defect image in the display window and the acquired defect description information in association includes:
s201, acquiring a storage mode selected by a user through a display window.
In this embodiment, a plurality of storage modes are preset in the screenshot software, and optionally, the storage modes include offline storage and online storage.
The storage mode can be set in the display window of the screenshot software in the form of a lower box.
And the user selects a storage mode for storing the defect image and the defect description information through the display window, and acquires the storage mode selected by the user after the user selects the storage mode.
S202, based on the storage mode selected by the user, the defect image in the display window and the acquired defect description information are stored in a correlated mode.
In this embodiment, the defect image and the defect description information in the display window are stored in association with each other in the storage mode selected by the user.
Specifically, the process of performing associated storage on the defect image in the display window and the acquired defect description information based on the storage mode selected by the user includes:
if the storage mode selected by the user is online storage, the defect image and the defect description information in the display window are stored to a test management system in an associated manner through a preset interface;
and if the storage mode selected by the user is offline storage, the defect image in the display window and the defect description information are stored in a local database in an associated manner.
In this embodiment, if the storage mode selected by the user is online storage, the defect description information and the defect image in the display window are associated, and the associated defect description information and the defect image in the display window are sent to the test management system for storage through a preset interface, so as to perform defect management subsequently.
In this embodiment, if the storage mode selected by the user is offline storage, the defect description information and the defect image in the display window are associated, and the associated defect description information and the defect image in the display window are stored in the local database, and optionally, after the associated defect description information and the defect image in the display window are stored in the local database, the associated defect description information and the defect image in the display window may also be sent from the local database to the test management system for storage, so as to perform defect management subsequently.
According to the software defect information acquisition method provided by the embodiment of the application, after the screenshot is carried out on the test interface, the defect image obtained through the screenshot is loaded to the preset display window, the user can directly input the defect description information in the display window, so that under the condition of receiving the storage instruction, the defect image in the display window and the defect description information input by the user can be directly stored in a correlated mode, a large amount of time is not consumed in how to create and describe the defects and arranging the screenshot sequence, the defect information acquisition speed is increased, the software test efficiency is improved, the software test work returns to the essence, and the software test work returns to the defect discovery and problem solving.
After the step S102 disclosed in fig. 1 of the embodiment of the present application is executed to load the defect image into the preset display window, the method may further include the following steps:
in response to an editing instruction of a user, an editing operation corresponding to the editing instruction is performed on the defect image.
In the method provided by the embodiment of the application, after the defect image is loaded to the preset display window and displayed to the user, the user can edit the defect image included in the display window through the display window, that is, receive the editing instruction of the user, respond to the editing instruction of the user, and perform the editing operation corresponding to the editing instruction on the defect image in the display window, for example, the user can perform rectangular frame selection on the defect image in the display window through the display window. According to the method provided by the embodiment of the application, the defect image is edited, so that the diversified requirements of a user are met.
After the step S102 disclosed in fig. 1 of the embodiment of the present application is executed to load the defect image into the preset display window, the method may further include the following steps:
and responding to a hiding instruction of a user, and hiding the display window.
In the method provided by the embodiment of the application, the display window can be further hidden, and when the hidden instruction of the user is received, the hidden instruction is responded, and the display window is hidden. The hiding instruction can be sent out by presetting a hiding shortcut key or directly clicking a closing button on the display window.
Optionally, the hidden shortcut may be the shortcut CTRL + D.
It should be noted that the hidden display window runs in the background and monitors the keyboard operation in real time. According to the method provided by the embodiment of the application, the display window is hidden, so that the display screen is used for displaying the test interface of the tested software, and the experience of the user software test is improved.
In the method provided in the embodiment of the present application, an implementation process of acquiring software defect information is described, as shown in fig. 3, including the following steps:
s301, in the testing process, responding to a defect screenshot instruction of a user, and performing screenshot on the current testing interface of the tested software to obtain a defect image of the testing interface.
Optionally, a specific implementation process of step S301 is as described in step S101, and is not described herein again.
And S302, loading the defect image to a preset display window.
Optionally, a specific implementation process of step S302 is as described in step S102, and is not described herein again.
And S303, responding to an editing instruction of a user, and executing editing operation corresponding to the editing instruction on the defect image.
After the defect image is loaded to the preset display window and displayed to the user, the user can edit the defect image in the display window through the display window, namely, the editing instruction of the user is received, the edited instruction of the user is responded, and the editing operation corresponding to the editing instruction is executed on the defect image in the display window, so that the content needing to be paid attention to is more highlighted. For example, the user may rectangular frame the defect image in the display window through the display window.
S304, acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window.
Optionally, a specific implementation process of step S304 is as described in step S103, and is not described herein again.
S305, when a storage instruction is received, the defect image in the display window and the acquired defect description information are stored in an associated mode.
Optionally, the specific implementation process of step S305 is as described in step S104.
Note that the defect image in the display window mentioned in step S305 is a defect image on which an editing operation has been performed.
According to the method provided by the embodiment of the application, the editing operation can be performed on the defect image loaded into the display window, and the diversified requirements of a user are met.
In the method provided in the embodiment of the present application, specific implementation of the software defect information obtaining method is illustrated as follows:
the method comprises the following steps: after the screenshot software is started, displaying in a small window mode, and carrying out overall monitoring on keyboard operation;
step two: clicking a shortcut key CTRL + B or quickly double clicking a CTRL key to finish one-time screenshot, popping up a main interface after screenshot, performing rectangular frame selection on a picture, or adding description information in the picture, and clicking the shortcut key CTRL + D or closing a button to hide the main interface, wherein the process can be repeatedly operated to obtain a picture set of a test flow;
step three: adding additional information such as a system to be tested, a defect type, a defect grade, a defect title, a defect description and the like to the screenshot;
step four: clicking the submit button completes a defect creation.
Corresponding to the method illustrated in fig. 1, an embodiment of the present application further provides a software defect information obtaining apparatus, which is used for implementing the method illustrated in fig. 1 specifically, and a schematic structural diagram of the apparatus is shown in fig. 4, and specifically includes:
the screenshot unit 401 is configured to perform screenshot on a current test interface of the software to be tested in response to a defect screenshot instruction of a user in a test process to obtain a defect image of the test interface;
a loading unit 402, configured to load the defect image into a preset display window;
an obtaining unit 403, configured to obtain the defect description information input by the user if the user inputs the defect description information through the display window;
the storage unit 404 is configured to, when receiving a storage instruction, store the defect image in the display window and the acquired defect description information in an associated manner.
The software defect information acquisition device provided by the embodiment of the application loads the defect image obtained by screenshot to the preset display window after the screenshot is performed on the test interface, so that a user can directly input the defect description information in the display window, and under the condition of receiving the storage instruction, the defect image in the display window and the defect description information input by the user can be directly associated and stored without consuming a large amount of time on how to create and describe the defects and arranging the screenshot sequence, the defect information acquisition speed is increased, the software test efficiency is improved, the software test work returns to the essence, and the software test work returns to defect discovery and problem solving.
In an embodiment of the present application, based on the foregoing scheme, the method may further include:
and the editing unit is used for responding to the editing instruction of the user and executing the editing operation corresponding to the editing instruction on the defect image.
In an embodiment of the application, based on the foregoing solution, the storage unit 404 is configured to store the defect image in the display window and the acquired defect description information in an associated manner, and includes the storage unit 404 specifically configured to:
acquiring a storage mode selected by the user through the display window;
and based on the storage mode selected by the user, performing associated storage on the defect image in the display window and the acquired defect description information.
In an embodiment of the application, based on the foregoing solution, the storage unit 404 is configured to store the defect image in the display window and the acquired defect description information in an associated manner based on the storage manner selected by the user, and includes the storage unit 404 specifically configured to:
if the storage mode selected by the user is online storage, the defect image in the display window and the defect description information are stored to a test management system in an associated manner through a preset interface;
and if the storage mode selected by the user is offline storage, the defect image in the display window and the defect description information are stored in a local database in an associated manner.
In an embodiment of the present application, based on the foregoing scheme, the method may further include:
and the hiding unit is used for responding to a hiding instruction of a user and hiding the display window.
The embodiment of the application also provides a storage medium, which comprises a stored instruction, wherein when the instruction runs, the device where the storage medium is located is controlled to execute the software defect information acquisition method.
The present embodiment further provides an electronic device, whose schematic structural diagram is shown in fig. 5, specifically including a memory 501 and one or more instructions 502, where the one or more instructions 502 are stored in the memory 501, and are configured to be executed by one or more processors 503 to perform the following operations according to the one or more instructions 502:
in the testing process, responding to a defect screenshot instruction of a user, and screenshot a current testing interface of the tested software to obtain a defect image of the testing interface;
loading the defect image to a preset display window;
acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window;
and when a storage instruction is received, the defect image in the display window and the acquired defect description information are stored in a correlation mode.
It should be noted that, in the present specification, the embodiments are all described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments may be referred to each other. For the device-like embodiment, since it is basically similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
For convenience of description, the above devices are described as being divided into various units by function, and are described separately. Of course, the functionality of the units may be implemented in one or more software and/or hardware when implementing the present application.
From the above description of the embodiments, it is clear to those skilled in the art that the present application can be implemented by software plus necessary general hardware platform. Based on such understanding, the technical solutions of the present application may be essentially or partially implemented in the form of a software product, which may be stored in a storage medium, such as a ROM/RAM, a magnetic disk, an optical disk, etc., and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method according to the embodiments or some parts of the embodiments of the present application.
The method and the device for acquiring software defect information provided by the application are described in detail above, a specific example is applied in the description to explain the principle and the implementation of the application, and the description of the embodiment is only used for helping to understand the method and the core idea of the application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (10)
1. A software defect information acquisition method is characterized by comprising the following steps:
in the testing process, responding to a defect screenshot instruction of a user, and screenshot a current testing interface of the tested software to obtain a defect image of the testing interface;
loading the defect image to a preset display window;
acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window;
and when a storage instruction is received, the defect image in the display window and the acquired defect description information are stored in a correlation mode.
2. The method of claim 1, wherein after loading the defect image into the preset display window, further comprising:
and responding to the editing instruction of the user, and executing the editing operation corresponding to the editing instruction on the defect image.
3. The method according to claim 1, wherein the storing the defect image in the display window and the acquired defect description information in association comprises:
acquiring a storage mode selected by the user through the display window;
and based on the storage mode selected by the user, performing associated storage on the defect image in the display window and the acquired defect description information.
4. The method according to claim 3, wherein the associating and storing the defect image in the display window and the acquired defect description information based on the storage mode selected by the user comprises:
if the storage mode selected by the user is online storage, the defect image in the display window and the defect description information are stored to a test management system in an associated manner through a preset interface;
and if the storage mode selected by the user is offline storage, the defect image in the display window and the defect description information are stored in a local database in an associated manner.
5. The method of claim 1, wherein after loading the defect image into the preset display window, further comprising:
and responding to a hiding instruction of a user, and hiding the display window.
6. A software defect information acquiring apparatus, comprising:
the screenshot unit is used for responding to a defect screenshot instruction of a user in the test process, and screenshot the current test interface of the software to be tested to obtain a defect image of the test interface;
the loading unit is used for loading the defect image to a preset display window;
the acquiring unit is used for acquiring the defect description information input by the user under the condition that the user inputs the defect description information through the display window;
and the storage unit is used for storing the defect image in the display window and the acquired defect description information in a correlation manner when receiving a storage instruction.
7. The apparatus of claim 6, further comprising:
and the editing unit is used for responding to the editing instruction of the user and executing the editing operation corresponding to the editing instruction on the defect image.
8. The apparatus according to claim 6, wherein the storage unit is configured to store the defect image in the display window and the acquired defect description information in an associated manner, and the storage unit is specifically configured to:
acquiring a storage mode selected by the user through the display window;
and based on the storage mode selected by the user, performing associated storage on the defect image in the display window and the acquired defect description information.
9. The apparatus according to claim 8, wherein the storage unit is configured to store the defect image in the display window and the acquired defect description information in an associated manner based on the storage manner selected by the user, and the storage unit is specifically configured to:
if the storage mode selected by the user is online storage, the defect image in the display window and the defect description information are stored to a test management system in an associated manner through a preset interface;
and if the storage mode selected by the user is offline storage, the defect image in the display window and the defect description information are stored in a local database in an associated manner.
10. The apparatus of claim 6, further comprising:
and the hiding unit is used for responding to a hiding instruction of a user and hiding the display window.
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| CN112148191A (en) * | 2020-09-27 | 2020-12-29 | 深圳壹账通智能科技有限公司 | Test image uploading method, device, equipment and storage medium based on browser |
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| US9632912B1 (en) * | 2014-03-28 | 2017-04-25 | Cadence Design Systems, Inc. | Method and system for debugging a program |
| CN104484278A (en) * | 2015-01-05 | 2015-04-01 | 浪潮(北京)电子信息产业有限公司 | Static state code defect testing method and device |
| CN112148191A (en) * | 2020-09-27 | 2020-12-29 | 深圳壹账通智能科技有限公司 | Test image uploading method, device, equipment and storage medium based on browser |
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