CN113295972B - Insulation defect detection method, system, device, computer equipment and storage medium - Google Patents
Insulation defect detection method, system, device, computer equipment and storage medium Download PDFInfo
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Abstract
The application relates to an insulation defect detection method, system, device, computer equipment and storage medium. The method comprises the following steps: acquiring a first oscillation waveform when a switching-on/off coil to be tested receives a first pulse voltage; acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; the second pulse voltage is greater than the first pulse voltage, and the difference value between the first pulse voltage and the second pulse voltage is greater than a first preset threshold value; determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform; and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and a preset difference threshold value. By adopting the method, the accuracy of testing the insulation defect of the switching-on and switching-off coil can be improved.
Description
Technical Field
The present application relates to the field of power system technologies, and in particular, to an insulation defect detection method, system, apparatus, computer device, and storage medium.
Background
In recent years, a problem of override trip of equipment such as a circuit breaker due to insulation defect of a switching-on/off coil sometimes occurs. Therefore, the method has important significance for analyzing the insulation defects of the switching-on/off coil.
In the prior art, when insulation defect analysis is performed on a switching-on/off coil in an operation field, pulse oscillation voltage needs to be applied to the switching-on/off coil to form an oscillation impact test waveform, and the oscillation impact test waveform is compared with a standard waveform generated after pulse oscillation voltage is applied to a switching-on/off standard coil of the same type to determine whether the switching-on/off coil has insulation defects.
The prior art has the problem of low testing accuracy of insulation defects.
Disclosure of Invention
In view of the foregoing, it is desirable to provide an insulation defect detection method, system, apparatus, computer device, and storage medium capable of improving test accuracy.
In a first aspect, the present application provides an insulation defect detection method, including:
acquiring a first oscillation waveform when a switching-on/off coil to be tested receives a first pulse voltage;
acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; the second pulse voltage is greater than the first pulse voltage, and the difference value between the first pulse voltage and the second pulse voltage is greater than a first preset threshold value;
determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform;
and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and a preset difference threshold value.
In one embodiment, the determining the insulation defect of the switching-on/off coil to be tested according to the first frequency difference and a preset difference threshold includes:
if the first frequency difference is larger than a preset difference threshold value, determining that the opening and closing coil to be tested has insulation defects;
and if the first frequency difference is smaller than or equal to the preset difference threshold value, determining that the opening and closing coil to be tested does not have insulation defects.
In one embodiment, the edge defect detection method further includes:
acquiring a third oscillation waveform of the switching-on/off coil to be tested when receiving a third pulse voltage; the third pulse voltage is greater than the second pulse voltage, and the difference value between the third pulse voltage and the second pulse voltage is greater than a second preset threshold value;
determining a second frequency difference between the frequency of the first oscillating waveform and the frequency of the third oscillating waveform according to the first oscillating waveform and the third oscillating waveform;
according to the first frequency difference, the insulation defect of the opening and closing coil to be tested is determined, and the method comprises the following steps:
and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference.
In one embodiment, determining an insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference includes:
if the difference value between the first frequency difference and the second frequency difference is smaller than or equal to a first preset frequency difference threshold value, determining that the opening and closing coil to be tested does not have an insulation defect;
and if the difference value between the first frequency difference and the second frequency difference is larger than the first preset frequency difference threshold value, determining that the opening and closing coil to be tested has an insulation defect.
In one embodiment, the edge defect detection method further includes:
acquiring a first standard waveform and a second standard waveform of a standard opening and closing coil with the same model as that of the opening and closing coil to be detected; the first standard waveform is a waveform generated when the standard opening and closing coil receives the first pulse signal; the second standard waveform is a waveform generated when the standard opening and closing coil receives the second pulse signal;
acquiring a first similarity of a first oscillating waveform and a first standard waveform; and a second similarity between the second oscillating waveform and the second standard waveform;
if the first similarity and the second similarity are both smaller than or equal to a preset similarity threshold, determining that the opening and closing coil to be tested does not have an insulation defect;
and if the first similarity and/or the second similarity is/are larger than a preset similarity threshold, determining that the opening and closing coil to be tested has an insulation defect.
In one embodiment, the determining a first frequency difference between the frequency of the first oscillation waveform and the frequency of the second oscillation waveform according to the first oscillation waveform and the second oscillation waveform includes:
determining a first frequency difference corresponding to each opening and closing coil according to the first oscillation waveform and the second oscillation waveform of each opening and closing coil;
and if the difference value between the first frequency difference of the target opening and closing coil and the first frequency difference of other opening and closing coils is larger than a second preset frequency difference threshold value, determining that the target opening and closing coil has an insulation defect, wherein the target opening and closing coil is any one of a plurality of opening and closing coils with the same model.
In a second aspect, the present application provides an insulation defect testing system, comprising: the device comprises a pulse type coil tester, a switching-on and switching-off coil to be tested, an oscilloscope and a terminal;
the pulse type coil test is used for providing a first pulse signal or a second pulse signal for the opening and closing coil to be tested;
the oscilloscope is used for receiving a first oscillation waveform generated by a first pulse signal according to the opening and closing coil to be tested; and receiving a second oscillation waveform generated by the second pulse signal according to the opening and closing coil to be tested, and sending the first oscillation waveform and the second oscillation waveform to the terminal.
A terminal configured to implement the steps of the method in any embodiment of the first aspect. .
In a third aspect, the present application provides an insulation defect analysis apparatus comprising:
the first acquisition module is used for acquiring a first oscillation waveform when the switching-on/off coil to be tested receives the low-voltage pulse voltage;
the second acquisition module is used for acquiring a second oscillation waveform when the switching-on/off coil to be tested receives the first high-voltage pulse voltage;
the calculation module is used for calculating a first frequency difference when the switching-on/off coil to be tested receives the low-voltage pulse voltage and the first high-voltage pulse voltage according to the first oscillation waveform and the second oscillation waveform;
and the determining module is used for determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference.
In a fourth aspect, the present application provides a computer device comprising a memory and a processor, the memory storing a computer program, the processor implementing the steps of the method in any one of the embodiments of the first aspect when executing the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of the embodiments of the first aspect.
According to the insulation defect analysis method, the insulation defect analysis device, the computer equipment and the storage medium, a first oscillation waveform when the opening and closing coil to be tested receives the first pulse voltage is obtained; acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform; and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference. Because the second pulse voltage is greater than the first pulse voltage and the difference between the first pulse voltage and the second pulse voltage is greater than the first preset threshold, namely the second pulse voltage is much greater than the first pulse voltage, the opening and closing coil to be tested can be tested from two angles of low voltage and high voltage, and then the first oscillation waveform and the second oscillation waveform are obtained and the frequency difference of the corresponding frequencies of the two correct waveforms is calculated, so that the insulation defect of the opening and closing coil to be tested is detected. The standard waveform of the standard coil of the opening and closing coil to be tested when different pulse voltages are received does not need to be compared, only the opening and closing coil to be tested is considered, the influence of improper selection of the standard coil cannot be caused, and the accuracy of the test is improved.
Drawings
FIG. 1 is a diagram of an exemplary embodiment of an insulation defect detection method;
FIG. 2 is a schematic flow chart diagram of a method for insulation defect detection in one embodiment;
FIG. 3 is a schematic flowchart of a method for insulation defect detection in another embodiment;
FIG. 4 is a schematic flowchart of another embodiment of a method for insulation defect detection;
FIG. 5 is a schematic flow chart of a method for insulation defect detection in another embodiment;
FIG. 6 is a schematic flow chart of a method for insulation defect detection in another embodiment;
FIG. 7 is a schematic flowchart of a method for insulation defect detection in another embodiment;
FIG. 8 is a schematic flowchart of a method for insulation defect detection in another embodiment;
FIG. 9 is a schematic diagram of an embodiment of an insulation defect detection system;
FIG. 10 is a block diagram showing the structure of an insulation defect detecting apparatus according to an embodiment;
FIG. 11 is a block diagram showing the construction of an insulation defect detecting apparatus according to another embodiment;
FIG. 12 is a block diagram showing the construction of an insulation defect detecting apparatus according to another embodiment;
FIG. 13 is a block diagram showing the construction of an insulation defect detecting apparatus according to another embodiment;
FIG. 14 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The insulation defect detection method provided by the application can be applied to the application environment shown in FIG. 1. The application environment comprises a pulse type coil tester 101, a switching-on/off coil 102 to be tested, an oscilloscope 103 and a terminal 104. The terminal 104 communicates with the pulse type coil tester 101 and the oscilloscope 103 through a network, obtains the voltage provided by the pulse type coil tester to the switching-on/off coil to be tested, obtains the oscillation waveform of the oscilloscope after receiving the pulse signal of the pulse type coil tester according to the switching-on/off coil to be tested, and calculates the frequency of the oscillation waveform. The terminal 104 may be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, and portable wearable devices.
In one embodiment, as shown in fig. 2, an insulation defect detection method is provided, which is described by taking the method as an example applied to the terminal in fig. 1, and includes the following steps:
s202, acquiring a first oscillation waveform when the opening and closing coil to be tested receives the first pulse voltage.
The first pulse voltage may be a low-voltage provided by the pulse type coil tester for the opening and closing coil to be tested, where the low-voltage may include a voltage within 1-1000V, which is not limited herein. Preferably, the first pulse voltage may be a 200V voltage signal. The first oscillation waveform is a response waveform generated when the switching-on and switching-off coil to be tested receives the first pulse voltage, and can be displayed by an oscilloscope connected with the switching-on and switching-off coil to be tested.
Specifically, when the opening and closing coil to be tested receives the first pulse voltage, a pulse response waveform corresponding to the pulse voltage, namely a first oscillation waveform, can be generated, the waveform can be used for monitoring the pulse response waveform through an oscilloscope connected with the opening and closing coil to be tested, the monitored first oscillation waveform is transmitted to a terminal, and the first oscillation waveform when the opening and closing coil to be tested receives the first pulse voltage is obtained.
S204, acquiring a second oscillation waveform when the opening and closing coil to be tested receives a second pulse voltage; the second pulse voltage is greater than the first pulse voltage, and the difference between the first pulse voltage and the second pulse voltage is greater than a first preset threshold.
The second pulse voltage may be a high-voltage provided by the pulse type coil tester for the opening and closing coil to be tested, or a high-voltage provided by the power grid for the opening and closing coil to be tested, which is not limited herein. Preferably, the second pulse voltage is 2000V. The second pulse voltage is greater than the first pulse voltage, and a difference between the first pulse voltage and the second pulse voltage is greater than a first predetermined threshold, for example, the first predetermined threshold is 1790, and the first pulse voltage is 200V, then the second pulse voltage may be 2000V.
Specifically, when the opening/closing coil to be tested receives the second pulse voltage, a pulse response waveform corresponding to the pulse voltage, that is, a second oscillation waveform, can be generated, and the waveform can be used for monitoring the pulse response waveform through an oscilloscope connected with the opening/closing coil to be tested, and transmitting the monitored second oscillation waveform to the terminal, that is, the second oscillation waveform when the opening/closing coil to be tested receives the second pulse voltage is obtained.
206, a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform is determined according to the first oscillating waveform and the second oscillating waveform.
Specifically, after the terminal acquires the first oscillating waveform, the frequency of the first oscillating waveform can be obtained according to the time of two adjacent wave troughs of the first oscillating waveform and the period of the first oscillating waveform; and meanwhile, the frequency of the second oscillating waveform is obtained according to the time of two adjacent wave troughs of the second oscillating waveform and the period of the second oscillating waveform. I.e. can be according to the formula
Determining a first frequency difference Δ f between a frequency of the first oscillating waveform and a frequency of the second oscillating waveform, wherein f 1 Is the frequency of the first oscillating waveform, f 2 Is the frequency of the first oscillating waveform.
And S208, determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and a preset difference threshold value.
Specifically, after the first frequency difference is obtained, the magnitude comparison may be performed according to the first frequency difference and a preset difference threshold, and when the first frequency difference is less than or equal to the preset difference threshold, the opening/closing coil to be tested does not have an insulation defect, for example, when the preset difference threshold is 0.5 and the first frequency difference is 0.3, the opening/closing coil to be tested does not have an insulation defect; and when the preset difference threshold is 0.5 and the first frequency difference is 0.67, the opening and closing coil to be tested has an insulation defect. Or subtracting the first frequency difference from a preset difference threshold, if the difference of the subtraction is greater than a preset value, determining that the opening and closing coil to be tested has an insulation defect, and if the difference of the subtraction is less than or equal to the preset value, determining that the opening and closing coil to be tested does not have the insulation defect. And if the quotient value is less than or equal to 1, determining that the opening and closing coil to be tested does not have the insulation defect, and not limiting the opening and closing coil to be tested.
Optionally, the value range of the preset difference threshold may be set in a range of 0.5 to 0.7.
In the insulation defect detection method, a first oscillation waveform when the opening and closing coil to be detected receives a first pulse voltage is obtained; acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform; and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference. Because the second pulse voltage is greater than the first pulse voltage and the difference between the first pulse voltage and the second pulse voltage is greater than the first preset threshold, namely the second pulse voltage is much greater than the first pulse voltage, the opening and closing coil to be tested can be tested from two angles of low voltage and high voltage, and then the first oscillation waveform and the second oscillation waveform are obtained and the frequency difference of the corresponding frequencies of the two correct waveforms is calculated, so that the insulation defect of the opening and closing coil to be tested is detected. The standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages does not need to be compared with the standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages, and the accuracy of the test is improved only by considering the switching-on/off coil to be tested, and in addition, in order to avoid the inaccuracy of the test caused by the low precision when the pulse type coil tester tests the response waveform of the switching-on/off coil to be tested, an oscilloscope with high precision is selected to collect the response waveforms of the switching-on/off coil to be tested when receiving different pulse signals, and the accuracy of the test is improved.
In the above embodiment, how to determine whether an insulation defect exists in the opening/closing switch to be tested according to the first frequency difference and the preset difference threshold is described, after the detection of the insulation defect is performed on the opening/closing switch coil to be tested, the coil without the insulation defect may be further detected, in an embodiment, as shown in fig. 3, the insulation defect testing method further includes:
s302, acquiring a third oscillation waveform when the opening and closing coil to be tested receives a third pulse voltage; the third pulse voltage is greater than the second pulse voltage, and a difference between the third pulse voltage and the second pulse voltage is greater than a second preset threshold.
The third pulse voltage may be a high-voltage provided by the pulse type coil tester for the opening and closing coil to be tested, or a high-voltage provided by the power grid for the opening and closing coil to be tested, which is not limited herein. The third pulse voltage is greater than the second pulse voltage, and a difference between the third pulse voltage and the second pulse voltage is greater than a second preset threshold, that is, the third pulse voltage is much greater than the second pulse voltage. For example, if the second preset threshold is 1000V and the second pulse voltage is 2000V, the third pulse voltage may be a voltage of 3000V or more. Preferably, the third pulse voltage is 3000V.
Specifically, when the opening/closing coil to be tested receives the third pulse voltage, a pulse response waveform corresponding to the pulse voltage, that is, a third oscillation waveform, can be generated, and the waveform can be used for monitoring the pulse response waveform through an oscilloscope connected with the opening/closing coil to be tested, and transmitting the monitored third oscillation waveform to the terminal, that is, the third oscillation waveform when the opening/closing coil to be tested receives the third pulse voltage is obtained.
S304, determining a second frequency difference between the frequency of the first oscillating waveform and the frequency of the third oscillating waveform according to the first oscillating waveform and the third oscillating waveform.
Specifically, after the terminal acquires the first oscillating waveform, the frequency of the first oscillating waveform can be obtained according to the time of two adjacent wave troughs of the first oscillating waveform and the period of the first oscillating waveform; and meanwhile, the frequency of the third oscillating waveform is obtained according to the time when the two wave troughs of the third oscillating waveform are connected and the period of the third oscillating waveform. I.e. according to the formula
Determining a second frequency difference Δ f between the frequency of the first oscillating waveform and the frequency of the third oscillating waveform, wherein f 1 Is the frequency, f, of the first oscillating waveform 3 Is the frequency of the first oscillating waveform.
And S306, determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference.
Specifically, according to the first frequency difference, the insulation defect of the opening and closing coil to be tested is determined, which includes: and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference. And determining the insulation defect of the opening and closing coil to be tested according to the magnitude relation of the first frequency difference and the second frequency difference. Optionally, if the difference between the first frequency difference and the second frequency difference is smaller than or equal to a first preset frequency difference threshold, determining that the opening and closing coil to be tested does not have an insulation defect; and if the difference value between the first frequency difference and the second frequency difference is larger than the first preset frequency difference threshold value, determining that the opening and closing coil to be tested has an insulation defect. The first frequency difference and the second frequency difference can be subtracted, and if the difference value is smaller than or equal to a preset value, the opening and closing coil to be tested does not have insulation defects; if the difference value is larger than the preset value, the opening and closing coil to be tested has insulation defects. And are not intended to be limiting herein.
In this embodiment, a third oscillating waveform of the opening and closing coil to be tested when receiving the third pulse voltage can be obtained; and determining a second frequency difference between the frequency of the first oscillation waveform and the frequency of the third oscillation waveform according to the first oscillation waveform and the third oscillation waveform, and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference. Can further carry out the detection of insulation defect to the divide-shut brake coil that awaits measuring, the realization is to carrying out the further detection of the coil that does not have insulation defect in preliminary insulation defect detection, the rate of accuracy that detects has been improved, the pulse voltage that awaits measuring divide-shut brake coil received has been increaseed simultaneously, can follow up the insulation defect of the divide-shut brake coil that awaits measuring of further excitation, lead to the inductance grow of the divide-shut brake coil that awaits measuring, and then lead to the frequency grow, consequently, the further grow of second frequency difference that reflects, can more accurate definite divide-shut brake coil's that awaits measuring insulation defect.
The above embodiment describes the detection of the insulation defect of the opening and closing coil to be detected, and when the opening and closing coil to be detected is detected for the insulation defect, the insulation defect result of the opening and closing coil to be detected can be obtained by comparing a plurality of opening and closing coils to be detected of the same type. Further explanation will be given on the insulation defect detection method according to an embodiment, in an embodiment, as shown in fig. 4, the insulation defect testing method further includes:
s402, acquiring a first standard waveform and a second standard waveform of a standard opening and closing coil with the same model as that of the opening and closing coil to be detected; the first standard waveform is a waveform generated when the standard opening and closing coil receives the first pulse signal; the second standard waveform is a waveform generated when the standard opening and closing coil receives the second pulse signal.
Specifically, a first standard waveform and a second standard waveform obtained by different types of standard opening and closing coils are stored in a database, and when insulation defect detection needs to be carried out on the opening and closing coils to be detected, the first standard waveform and the second standard waveform of the standard opening and closing coils can be directly obtained from the database; for example, the first standard waveform may be a standard opening and closing coil with the same model as that of the opening and closing coil to be tested, and the first standard waveform and the second standard waveform generated by the 200V pulse voltage and the 2000V pulse voltage are respectively received.
S404, acquiring a first similarity of the first oscillating waveform and the first standard waveform; and a second similarity between the second oscillating waveform and the second standard waveform.
Specifically, comparing the first oscillating waveform with the first standard waveform to obtain a first similarity between the first oscillating waveform and the first standard waveform; and comparing the second oscillating waveform with the second standard waveform to obtain a second similarity between the second oscillating waveform and the second standard waveform.
S406, if the first similarity and the second similarity are both smaller than or equal to the preset similarity threshold, it is determined that the opening and closing coil to be tested does not have insulation defects.
Specifically, the first similarity and the second similarity are respectively compared with a preset similarity threshold, and if and only if the first similarity and the second similarity are both smaller than or equal to the preset similarity threshold, it is determined that the opening and closing coil to be tested does not have insulation defects. For example, if the first similarity is 0.1, the second similarity is 0.2, and the preset similarity threshold is 0.3, the opening and closing coil to be tested does not have an insulation defect. And if the first similarity is 0.1, the second similarity is 0.4 and the preset similarity threshold is 0.3, the opening and closing coil to be tested has insulation defects.
And S408, if the first similarity and/or the second similarity is/are larger than a preset similarity threshold, determining that the opening and closing coil to be tested has insulation defects.
Specifically, the first similarity and the second similarity are respectively compared with a preset similarity threshold, and when the first similarity is larger than the preset similarity threshold, it is determined that the opening and closing coil to be tested has an insulation defect. And when the second similarity is larger than a preset similarity threshold, determining that the opening and closing coil to be tested has insulation defects. And when the first similarity and the second similarity are both greater than a preset similarity threshold, determining that the opening and closing coil to be tested has an insulation defect.
In this embodiment, a first similarity between a first oscillation waveform and a first standard waveform is obtained by obtaining a first standard waveform and a second standard waveform of a standard opening and closing coil with the same model as that of an opening and closing coil to be tested; and a second similarity between the second oscillation waveform and the second standard waveform, if the first similarity and the second similarity are both smaller than or equal to a preset similarity threshold, determining that the opening and closing coil to be tested does not have an insulation defect, and if the first similarity and/or the second similarity are larger than the preset similarity threshold, determining that the opening and closing coil to be tested has an insulation defect. After the insulation defect of the opening and closing coil to be detected is detected, the insulation defect of the opening and closing coil to be detected is determined through comparison with a standard opening and closing coil, and the accuracy of the detection of the insulation defect of the opening and closing coil to be detected is improved.
In the above embodiment, after obtaining the first oscillation waveform and the second oscillation waveform of a plurality of to-be-detected switching-on/off coils of the same type, the switching-on/off coil having the insulation defect can be determined from the plurality of to-be-detected switching-on/off coils, which is described with an embodiment, in an embodiment, as shown in fig. 5, the to-be-detected switching-on/off coil includes a plurality of switching-on/off coils of the same type, and then according to the first oscillation waveform and the second oscillation waveform, a first frequency difference between a frequency of the first oscillation waveform and a frequency of the second oscillation waveform is determined, including:
s502, determining a first frequency difference corresponding to each opening and closing coil according to the first oscillation waveform and the second oscillation waveform of each opening and closing coil.
Specifically, after a first pulse voltage and a second pulse voltage are applied to each opening and closing coil, corresponding first oscillation waveforms and second oscillation waveforms are generated, and then corresponding frequencies are calculated according to the moments of two adjacent wave troughs of the first oscillation waveforms and the second oscillation waveforms and the respective change periods of the two adjacent wave troughs, and further according to a formula
Determining a first frequency difference Δ f between a frequency of the first oscillating waveform and a frequency of the second oscillating waveform, wherein f 1 Is the frequency of the first oscillating waveform, f 2 Is the frequency of the first oscillating waveform.
S504, if the difference value between the first frequency difference of the target opening and closing coil and the first frequency difference of each other opening and closing coil is larger than a second preset frequency difference threshold value, it is determined that the target opening and closing coil has insulation defects, and the target opening and closing coil is any one of a plurality of opening and closing coils with the same model.
Specifically, after the first frequency difference of each opening and closing coil of the same type is obtained, the first frequency difference of each opening and closing coil of the same type and the first frequency difference of each other opening and closing coil can be compared, the first frequency difference in each opening and closing coil and the first frequency difference of each other opening and closing coil with a larger difference are selected as a target opening and closing coil, and if the difference value between the first frequency difference of the target opening and closing coil and the first frequency difference of each other opening and closing coil is larger than a second preset frequency difference threshold value, it is determined that the target opening and closing coil has an insulation defect.
In this embodiment, a first frequency difference corresponding to each switching-on/off coil is determined according to the first oscillation waveform and the second oscillation waveform of each switching-on/off coil, and a difference value between the first frequency difference of the target switching-on/off coil and the first frequency difference of each other switching-on/off coil is greater than a second preset frequency difference threshold, so that it is determined that the target switching-on/off coil has an insulation defect. The method can simply and efficiently determine the target opening and closing coil with insulation defects in the plurality of opening and closing coils.
To facilitate understanding by those skilled in the art, the insulation defect testing method will now be further described with an embodiment, as shown in fig. 6, which includes:
s601, acquiring a first oscillation waveform when the opening and closing coil to be tested receives the first pulse voltage.
S602, acquiring a second oscillation waveform when the opening and closing coil to be tested receives a second pulse voltage; the second pulse voltage is greater than the first pulse voltage, and the difference between the first pulse voltage and the second pulse voltage is greater than a first preset threshold.
S603, determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform.
S604, determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and a preset difference threshold value.
And S605, if the first frequency difference is larger than a preset difference threshold value, determining that the opening and closing coil to be tested has insulation defects.
And S606, if the first frequency difference is smaller than or equal to the preset difference threshold value, determining that the opening and closing coil to be tested does not have insulation defects.
S607, acquiring a third oscillation waveform when the opening and closing coil to be tested receives a third pulse voltage; the third pulse voltage is greater than the second pulse voltage, and a difference between the third pulse voltage and the second pulse voltage is greater than a second preset threshold.
S608, determining a second frequency difference between the frequency of the first oscillating waveform and the frequency of the third oscillating waveform according to the first oscillating waveform and the third oscillating waveform.
And S609, determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference.
S610, if the difference value between the first frequency difference and the second frequency difference is smaller than or equal to a first preset frequency difference threshold value, it is determined that the opening and closing coil to be tested does not have insulation defects.
S611, if the difference value between the first frequency difference and the second frequency difference is larger than a first preset frequency difference threshold value, it is determined that the opening and closing coil to be tested has an insulation defect.
For the specific definition of the insulation defect testing method, reference may be made to the definition of the insulation defect testing method above, and details are not repeated here.
In the embodiment, a first oscillation waveform when the switching-on/off coil to be tested receives the first pulse voltage is obtained; acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform; and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference. Because the second pulse voltage is greater than the first pulse voltage and the difference between the first pulse voltage and the second pulse voltage is greater than the first preset threshold, namely the second pulse voltage is much greater than the first pulse voltage, the opening and closing coil to be tested can be tested from two angles of low voltage and high voltage, and then the first oscillation waveform and the second oscillation waveform are obtained and the frequency difference of the corresponding frequencies of the two correct waveforms is calculated, so that the insulation defect of the opening and closing coil to be tested is detected. The standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages does not need to be compared with the standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages, and the accuracy of the test is improved only by considering the switching-on/off coil to be tested, and in addition, in order to avoid the inaccuracy of the test caused by the low precision when the pulse type coil tester tests the response waveform of the switching-on/off coil to be tested, an oscilloscope with high precision is selected to collect the response waveforms of the switching-on/off coil to be tested when receiving different pulse signals, and the accuracy of the test is improved. Meanwhile, the insulation defect of the opening and closing coil to be tested is further verified, and the testing accuracy is further improved.
In another embodiment, as shown in fig. 7, an insulation defect testing method includes:
s701, acquiring a first oscillation waveform when the opening and closing coil to be tested receives the first pulse voltage.
S702, acquiring a second oscillation waveform when the opening and closing coil to be tested receives a second pulse voltage; the second pulse voltage is greater than the first pulse voltage, and the difference between the first pulse voltage and the second pulse voltage is greater than a first preset threshold.
S703, determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform.
And S704, determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and a preset difference threshold value.
S705, if the first frequency difference is larger than a preset difference threshold value, it is determined that the opening and closing coil to be tested has insulation defects.
And S706, if the first frequency difference is smaller than or equal to the preset difference threshold value, determining that the opening and closing coil to be tested does not have insulation defects.
S707, acquiring a first standard waveform and a second standard waveform of a standard opening and closing coil with the same model as that of the opening and closing coil to be detected; the first standard waveform is a waveform generated when the standard opening and closing coil receives the first pulse signal; the second standard waveform is a waveform generated when the standard opening and closing coil receives the second pulse signal.
S708, acquiring a first similarity of the first oscillating waveform and the first standard waveform; and a second similarity between the second oscillating waveform and the second standard waveform.
And S709, if the first similarity and the second similarity are both smaller than or equal to a preset similarity threshold, determining that the opening and closing coil to be tested does not have insulation defects.
And S710, if the first similarity and/or the second similarity is/are larger than a preset similarity threshold, determining that the opening and closing coil to be tested has insulation defects.
For the specific definition of the insulation defect testing method, reference may be made to the definition of the insulation defect testing method above, and details are not repeated here.
In the embodiment, a first oscillation waveform when the switching-on/off coil to be tested receives the first pulse voltage is obtained; acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform; and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference. Because the second pulse voltage is greater than the first pulse voltage and the difference value between the first pulse voltage and the second pulse voltage is greater than the first preset threshold value, namely the second pulse voltage is far greater than the first pulse voltage, the opening and closing coil to be tested can be tested from two angles of low voltage and high voltage, the first oscillation waveform and the second oscillation waveform are obtained, the frequency difference of the corresponding frequencies of the two proper waveforms is calculated, and the detection of the insulation defect of the opening and closing coil to be tested is realized. The standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages does not need to be compared with the standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages, and the accuracy of the test is improved only by considering the switching-on/off coil to be tested, and in addition, in order to avoid the inaccuracy of the test caused by the low precision when the pulse type coil tester tests the response waveform of the switching-on/off coil to be tested, an oscilloscope with high precision is selected to collect the response waveforms of the switching-on/off coil to be tested when receiving different pulse signals, and the accuracy of the test is improved. Meanwhile, the insulation defect of the opening and closing coil to be tested is further verified, and the testing accuracy is further improved.
In another embodiment, as shown in fig. 8, an insulation defect testing method includes:
s801, acquiring a first oscillation waveform when a switching-on/off coil to be tested receives a first pulse voltage; the opening and closing coil to be tested comprises a plurality of opening and closing coils with the same model.
S802, acquiring a second oscillation waveform when the opening and closing coil to be tested receives a second pulse voltage; the second pulse voltage is greater than the first pulse voltage, and the difference between the first pulse voltage and the second pulse voltage is greater than a first preset threshold.
And S803, determining a first frequency difference corresponding to each opening and closing coil according to the first oscillation waveform and the second oscillation waveform of each opening and closing coil.
S804, if the difference value between the first frequency difference of the target opening and closing coil and the first frequency difference of each other opening and closing coil is larger than a second preset frequency difference threshold value, it is determined that the target opening and closing coil has an insulation defect, and the target opening and closing coil is any one of a plurality of opening and closing coils with the same model.
For the specific definition of the insulation defect testing method, reference may be made to the definition of the insulation defect testing method above, and details are not repeated here.
In the embodiment, a first oscillation waveform when the switching-on/off coil to be tested receives the first pulse voltage is obtained; acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform; and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference. Because the second pulse voltage is greater than the first pulse voltage and the difference between the first pulse voltage and the second pulse voltage is greater than the first preset threshold, namely the second pulse voltage is much greater than the first pulse voltage, the opening and closing coil to be tested can be tested from two angles of low voltage and high voltage, and then the first oscillation waveform and the second oscillation waveform are obtained and the frequency difference of the corresponding frequencies of the two correct waveforms is calculated, so that the insulation defect of the opening and closing coil to be tested is detected. The standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages does not need to be compared with the standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages, and the accuracy of the test is improved only by considering the switching-on/off coil to be tested, and in addition, in order to avoid the inaccuracy of the test caused by the low precision when the pulse type coil tester tests the response waveform of the switching-on/off coil to be tested, an oscilloscope with high precision is selected to collect the response waveforms of the switching-on/off coil to be tested when receiving different pulse signals, and the accuracy of the test is improved. Meanwhile, the insulation defect of the opening and closing coil to be tested is further verified, and the testing accuracy is further improved.
It should be understood that although the various steps in the flow charts of fig. 2-8 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 2-8 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps.
The above embodiments describe an insulation defect detection method, which can be applied to an insulation detection system, and now an insulation defect detection system is described with an embodiment, in an embodiment, as shown in fig. 9, there is provided an insulation defect testing system, including: a pulse type coil tester 901, a switching-on/off coil 902 to be tested, an oscilloscope 903 and a terminal 904;
the pulse type coil test 901 is used for providing a first pulse signal or a second pulse signal for the opening and closing coil to be tested;
the oscilloscope 903 is used for receiving a first oscillation waveform generated by a first pulse signal according to the opening and closing coil to be tested; and receiving a second oscillation waveform generated by a second pulse signal according to the opening and closing coil to be tested, and sending the first oscillation waveform and the second oscillation waveform to the terminal.
Terminal 902 for performing the steps of the method in any of the embodiments described above.
Specifically, after the pulse type coil test is powered on, a first pulse signal or a second pulse signal can be provided for the switching-on/off coil to be tested, so that the switching-on/off coil to be tested generates a corresponding first oscillation waveform and a corresponding second oscillation waveform when receiving the first pulse signal or the second pulse signal.
Receiving a first oscillation waveform generated by a first pulse signal at a switching-on/off coil to be tested; and receiving the second pulse signal to generate a second oscillation waveform, collecting and displaying the second oscillation waveform through the oscilloscope, and sending the first oscillation waveform and the second oscillation waveform to the terminal.
The terminal is configured to perform the steps of the method in any of the embodiments, which is not described herein again.
Optionally, in order to avoid damage caused by impact on the oscilloscope, a voltage attenuator can be connected to the input end of the oscilloscope. The voltage attenuator can be combined with an attenuation probe of the oscilloscope, and the attenuation multiple of the voltage attenuator is 250 times.
In this embodiment, the pulse type coil test provides a first pulse signal or a second pulse signal for the switching-on/off coil to be tested; the oscilloscope receives a first oscillation waveform generated by a first pulse signal according to the opening and closing coil to be tested; and receiving a second oscillation waveform generated by a second pulse signal according to the opening and closing coil to be tested, and sending the first oscillation waveform and the second oscillation waveform to the terminal. The terminal performs the steps of the method in any of the embodiments described above. In the test process, the standard waveforms of the switching-on and switching-off coils to be tested when receiving different pulse voltages are not required to be compared, the accuracy of the test is improved only by considering the switching-on and switching-off coils to be tested, and the accuracy of the test is improved because an oscilloscope with higher accuracy is selected to collect the response waveforms of the switching-on and switching-off coils to be tested when the pulse type coil tester tests the response waveforms of the switching-on and switching-off coils to be tested, so that the accuracy of the test is improved. Meanwhile, all the components of the test system are common electrical equipment, and the test system is simple and easy to implement.
In one embodiment, as shown in fig. 10, there is provided an insulation defect testing apparatus including:
the first obtaining module 11 is configured to obtain a first oscillation waveform when the switching-on/off coil to be tested receives the low-voltage pulse voltage;
the second obtaining module 12 is configured to obtain a second oscillation waveform when the opening/closing coil to be tested receives the first high-voltage pulse voltage;
the calculating module 13 is configured to calculate a first frequency difference when the switching-on/off coil to be tested receives the low-voltage pulse voltage and the first high-voltage pulse voltage according to the first oscillating waveform and the second oscillating waveform;
and the determining module 14 is used for determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference.
In this embodiment, the first obtaining module obtains a first oscillating waveform when the switching-on/off coil to be tested receives the low-voltage pulse voltage; the second acquisition module acquires a second oscillation waveform when the switching-on/off coil to be tested receives the first high-voltage pulse voltage; the calculation module calculates a first frequency difference when the switching-on/off coil to be tested receives the low-voltage pulse voltage and the first high-voltage pulse voltage according to the first oscillation waveform and the second oscillation waveform; the determining module determines the insulation defect of the opening and closing coil to be tested according to the first frequency difference. The standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages does not need to be compared with the standard waveform of the switching-on/off coil to be tested when receiving different pulse voltages, and the accuracy of the test is improved only by considering the switching-on/off coil to be tested, and in addition, in order to avoid the inaccuracy of the test caused by the low precision when the pulse type coil tester tests the response waveform of the switching-on/off coil to be tested, an oscilloscope with high precision is selected to collect the response waveforms of the switching-on/off coil to be tested when receiving different pulse signals, and the accuracy of the test is improved.
In one embodiment, as shown in fig. 11, the determination module 14 includes: a first determination unit 141;
and the first determining unit 141 is configured to determine an insulation defect of the opening/closing coil to be tested according to the first frequency difference and a preset difference threshold.
In an embodiment, the first determining unit is specifically configured to determine that the opening/closing coil to be tested has an insulation defect if the first frequency difference is greater than a preset difference threshold; and if the first frequency difference is smaller than or equal to the preset difference threshold value, determining that the opening and closing coil to be tested does not have insulation defects.
In one embodiment, referring to fig. 11, the insulation defect detecting apparatus further includes:
the second obtaining module 15 is configured to obtain a third oscillation waveform when the switching-on/off coil to be tested receives the third pulse voltage; the third pulse voltage is greater than the second pulse voltage, and the difference value between the third pulse voltage and the second pulse voltage is greater than a second preset threshold value;
a second determining module 16, configured to determine a second frequency difference between the frequency of the first oscillating waveform and the frequency of the third oscillating waveform according to the first oscillating waveform and the third oscillating waveform;
the third determining module 17 is configured to determine an insulation defect of the opening/closing coil to be tested according to the first frequency difference, and includes: and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference.
In one embodiment, the second determining module is specifically configured to determine that the opening/closing coil to be tested does not have an insulation defect if a difference between the first frequency difference and the second frequency difference is smaller than or equal to a first preset frequency difference threshold; and if the difference value between the first frequency difference and the second frequency difference is larger than the first preset frequency difference threshold value, determining that the opening and closing coil to be tested has an insulation defect.
In one embodiment, referring to fig. 12, the insulation defect testing apparatus further includes:
the third obtaining module 18 is used for obtaining a first standard waveform and a second standard waveform of a standard opening and closing coil with the same model as that of the opening and closing coil to be detected; the first standard waveform is a waveform generated when the standard opening and closing coil receives the first pulse signal; the second standard waveform is a waveform generated when the standard opening and closing coil receives the second pulse signal;
a fourth obtaining module 19, configured to obtain a first similarity between the first oscillating waveform and the first standard waveform; and a second similarity between the second oscillating waveform and the second standard waveform;
the fourth determining module 20 is configured to determine that the opening/closing coil to be tested does not have an insulation defect if the first similarity and the second similarity are both smaller than or equal to a preset similarity threshold;
and the fifth determining module 21 is configured to determine that the opening/closing coil to be tested has an insulation defect if the first similarity and/or the second similarity is greater than the preset similarity threshold.
In one embodiment, referring to fig. 13, if the switching-on/off coil to be tested includes a plurality of switching-on/off coils of the same type, the determining module 14 includes:
the second determining unit 142 is configured to determine a first frequency difference corresponding to each switching-on/off coil according to the first oscillation waveform and the second oscillation waveform of each switching-on/off coil;
and a third determining unit 143, configured to determine that the target switching-off and switching-on coil has an insulation defect if the difference between the first frequency difference of the target switching-off and switching-on coil and the first frequency difference of each other switching-off and switching-on coil is greater than the second preset frequency difference threshold, where the target switching-off and switching-on coil is any one of multiple switching-off and switching-on coils with the same model.
For the specific definition of the insulation defect testing apparatus, reference may be made to the above definition of the insulation defect testing method, which is not described herein again. The respective modules in the insulation defect testing apparatus described above may be wholly or partially implemented by software, hardware, and a combination thereof. The modules can be embedded in a hardware form or independent of a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 14. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, an operator network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement an insulation defect testing method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
It will be appreciated by those skilled in the art that the configuration shown in fig. 14 is a block diagram of only a portion of the configuration associated with the present application, and is not intended to limit the computing device to which the present application may be applied, and that a particular computing device may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory in which a computer program is stored and a processor, which when executing the computer program performs the steps of the method in any of the above embodiments.
In an embodiment, a computer-readable storage medium is provided, on which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of the method of any of the above embodiments.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include at least one of non-volatile and volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), for example.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. An insulation defect detection method, comprising:
acquiring a first oscillation waveform when a switching-on/off coil to be tested receives a first pulse voltage;
acquiring a second oscillation waveform when the switching-on/off coil to be tested receives a second pulse voltage; the second pulse voltage is greater than the first pulse voltage, and the difference value between the first pulse voltage and the second pulse voltage is greater than a first preset threshold value;
determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform;
determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and a preset difference threshold value;
if the fact that the opening and closing coil to be tested does not have insulation defects is determined according to the first frequency difference and a preset difference threshold value, a third oscillation waveform when the opening and closing coil to be tested receives third pulse voltage is obtained; the third pulse voltage is greater than the second pulse voltage, and the difference value between the third pulse voltage and the second pulse voltage is greater than a second preset threshold value;
determining a second frequency difference between the frequency of the first oscillating waveform and the frequency of the third oscillating waveform according to the first oscillating waveform and the third oscillating waveform;
and determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference.
2. The method according to claim 1, wherein the determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and a preset difference threshold value comprises:
if the first frequency difference is larger than the preset difference threshold value, determining that the opening and closing coil to be tested has an insulation defect;
and if the first frequency difference is smaller than or equal to the preset difference threshold value, determining that the opening and closing coil to be tested does not have insulation defects.
3. The method according to claim 1, wherein the determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference comprises:
if the difference value between the first frequency difference and the second frequency difference is smaller than or equal to a first preset frequency difference threshold value, determining that the opening and closing coil to be tested does not have insulation defects;
and if the difference value between the first frequency difference and the second frequency difference is larger than a first preset frequency difference threshold value, determining that the opening and closing coil to be tested has an insulation defect.
4. The method according to any one of claims 1 or 2, further comprising:
acquiring a first standard waveform and a second standard waveform of a standard opening and closing coil with the same model as the opening and closing coil to be detected; the first standard waveform is a waveform generated when the standard opening and closing coil receives the first pulse voltage; the second standard waveform is a waveform generated when the standard opening and closing coil receives the second pulse voltage;
acquiring a first similarity of the first oscillating waveform and the first standard waveform; and a second similarity between the second oscillating waveform and the second standard waveform;
if the first similarity and the second similarity are both smaller than or equal to a preset similarity threshold, determining that the opening and closing coil to be tested does not have an insulation defect;
and if the first similarity and/or the second similarity is/are larger than the preset similarity threshold, determining that the opening and closing coil to be tested has insulation defects.
5. The method according to any one of claims 1 or 2, wherein the switching-on/off coils to be tested comprise a plurality of switching-on/off coils with the same model, and determining a first frequency difference between the frequency of the first oscillating waveform and the frequency of the second oscillating waveform according to the first oscillating waveform and the second oscillating waveform comprises:
determining a first frequency difference corresponding to each switching-on and switching-off coil according to the first oscillation waveform and the second oscillation waveform of each switching-on and switching-off coil;
and if the difference value between the first frequency difference of the target opening and closing coil and the first frequency difference of each other opening and closing coil is larger than a second preset frequency difference threshold value, determining that the target opening and closing coil has an insulation defect, wherein the target opening and closing coil is any one of the plurality of opening and closing coils with the same model.
6. An insulation defect testing system, the system comprising: the device comprises a pulse type coil tester, a switching-on and switching-off coil to be tested, an oscilloscope and a terminal;
the pulse type coil tester is used for providing a first pulse voltage or a second pulse voltage for the opening and closing coil to be tested;
the oscilloscope is used for receiving a first oscillating waveform generated by the first pulse voltage according to the opening and closing coil to be tested; receiving a second oscillation waveform generated by the second pulse voltage according to the switching-on and switching-off coil to be tested, and sending the first oscillation waveform and the second oscillation waveform to the terminal;
the terminal for performing the steps of the method according to any of claims 1-5.
7. An insulation defect analysis apparatus, characterized in that the apparatus comprises:
the first acquisition module is used for acquiring a first oscillation waveform when the switching-on/off coil to be tested receives the low-voltage pulse voltage;
the second acquisition module is used for acquiring a second oscillation waveform when the switching-on/off coil to be tested receives the first high-voltage pulse voltage;
the calculation module is used for calculating a first frequency difference when the switching-on/off coil to be tested receives the low-voltage pulse voltage and the first high-voltage pulse voltage according to the first oscillation waveform and the second oscillation waveform;
the determining module is used for determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference;
a fifth obtaining module, configured to obtain a third oscillating waveform when the switching-on/off coil to be tested receives a third pulse voltage if it is determined that the switching-on/off coil to be tested does not have an insulation defect according to the first frequency difference and a preset difference threshold; the third pulse voltage is greater than the first high-voltage pulse voltage, and the difference value between the third pulse voltage and the first high-voltage pulse voltage is greater than a second preset threshold value;
a second determining module, configured to determine, according to the first oscillating waveform and the third oscillating waveform, a second frequency difference between a frequency of the first oscillating waveform and a frequency of the third oscillating waveform;
and the third determining module is used for determining the insulation defect of the opening and closing coil to be tested according to the first frequency difference and the second frequency difference.
8. The insulation defect analysis apparatus according to claim 7, further comprising:
the third acquisition module is used for acquiring a first standard waveform and a second standard waveform of a standard opening and closing coil with the same model as that of the opening and closing coil to be detected; the first standard waveform is a waveform generated when the standard opening and closing coil receives the low-voltage pulse voltage; the second standard waveform is a waveform generated when the standard opening and closing coil receives the first high-voltage pulse voltage;
a fourth obtaining module, configured to obtain a first similarity between the first oscillating waveform and the first standard waveform; and a second similarity between the second oscillating waveform and the second standard waveform;
the fourth determining module is used for determining that the opening and closing coil to be tested does not have an insulation defect if the first similarity and the second similarity are both smaller than or equal to a preset similarity threshold;
and the fifth determining module is used for determining that the opening and closing coil to be tested has insulation defects if the first similarity and/or the second similarity is larger than a preset similarity threshold.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 5.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 5.
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| JPH09257862A (en) * | 1996-03-21 | 1997-10-03 | Toshiba Corp | Device for diagnosis of winding insulation |
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| US6549017B2 (en) * | 2000-05-04 | 2003-04-15 | Georgia Tech Research Corporation | System and method for on-line impulse frequency response analysis |
| CN200953040Y (en) * | 2006-04-20 | 2007-09-26 | 青岛艾诺电子仪器有限公司 | Turn-to-turn compact resistance voltage testing instrument |
| JP5537721B1 (en) * | 2013-12-11 | 2014-07-02 | 株式会社 電子制御国際 | Winding test equipment |
| CN106443433B (en) * | 2016-10-18 | 2023-08-25 | 国家电网公司 | Breaker state monitoring system and method based on opening and closing coil current |
| CN108279359A (en) * | 2018-02-05 | 2018-07-13 | 国网山西省电力公司电力科学研究院 | Dry-type reactor interturn insulation method for diagnosing faults based on frequency response analysis |
| CN110456242A (en) * | 2019-08-30 | 2019-11-15 | 国家电网有限公司 | Coil turn-to-turn insulation detecting method and device |
| CN210604864U (en) * | 2019-08-30 | 2020-05-22 | 国家电网有限公司 | Coil turn-to-turn insulation detection device |
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| JPH09257862A (en) * | 1996-03-21 | 1997-10-03 | Toshiba Corp | Device for diagnosis of winding insulation |
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