CN113238963A - Test report generation method, device, equipment, storage medium and program product - Google Patents
Test report generation method, device, equipment, storage medium and program product Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 308
- 238000000034 method Methods 0.000 title claims abstract description 43
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- 238000004590 computer program Methods 0.000 claims description 17
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- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
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- G06F11/00—Error detection; Error correction; Monitoring
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Abstract
The test report generation method, apparatus, device, storage medium and program product provided by the present disclosure include: acquiring test defect information input by a user, and determining keywords in the test defect information; the test defect information is used for describing defects found when the program is tested; determining whether a test record matched with the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application information; and if the test record matched with the test defect information exists, generating a test report according to the test record. According to the scheme provided by the disclosure, historical application defect information can be recorded in a test record mode, and the application defect information is reasonably utilized when the test report is generated, so that the utilization rate of the application defect information is improved, and the generation efficiency of the test report can also be improved.
Description
Technical Field
The present disclosure relates to test report generation technologies, and in particular, to a test report generation method, apparatus, device, storage medium, and program product.
Background
With the development of computer technology, more and more applications are developed, and the iteration speed of the applications is high. In order to ensure that the online application can normally run, the application needs to be tested. If the tester finds the defects when testing the application, the tester can write a defect report and feed the defect report back to the developer, so that the developer can optimize the code of the application according to the defect report.
The tester generally writes a defect report according to experience, and the defect report includes information such as a defect number, a defect title, a defect finder, a defect finding date, a function module to which the defect belongs, and an application version for finding the defect. After the developer finishes processing the applied defect based on the defect report, the defect report has no other function.
Therefore, the defect report written by the tester in the prior art is only used once, namely, the defect report is used when the defect in the defect report is solved. This wastes the work product of the tester and does not fully utilize the information in the defect report, resulting in a low utilization of the defect report.
Disclosure of Invention
The present disclosure provides a method, an apparatus, a device, a storage medium, and a program product for generating a test report, so as to solve the problem of low utilization of a defect report in the prior art.
A first aspect of the present disclosure is to provide a test report generation method, including:
acquiring test defect information input by a user, and determining keywords in the test defect information; the test defect information is used for describing defects found when a program is tested;
determining whether a test record matched with the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application test information;
and if the test record matched with the test defect information exists, generating a test report according to the test record.
Another aspect of the present disclosure is to provide a test report generation apparatus, including:
the device comprises a determining unit, a judging unit and a judging unit, wherein the determining unit is used for acquiring test defect information input by a user and determining keywords in the test defect information; the test defect information is used for describing defects found when a program is tested;
the matching unit is used for determining whether a test record matched with the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application test information;
and the report generating unit is used for generating a test report according to the test record if the test record matched with the test defect information exists.
Yet another aspect of the present disclosure is to provide an electronic device including:
a memory;
a processor; and
a computer program;
wherein the computer program is stored in the memory and configured to be executed by the processor to implement the test report generation method as described in the first aspect above.
Yet another aspect of the present disclosure is to provide a computer readable storage medium having stored thereon a computer program to be executed by a processor to implement the test report generating method as described in the first aspect above.
Yet another aspect of the present disclosure is to provide a computer program product comprising a computer program which, when executed by a processor, implements the test report generation method as described in the first aspect above.
The test report generation method, the test report generation device, the test report generation equipment, the storage medium and the program product have the technical effects that:
the test report generation method, apparatus, device, storage medium, and program product provided in this embodiment include: acquiring test defect information input by a user, and determining keywords in the test defect information; the test defect information is used for describing defects found when the program is tested; determining whether a test record matched with the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application information; and if the test record matched with the test defect information exists, generating a test report according to the test record. In the scheme provided by this embodiment, historical application defect information can be recorded in a test record manner, and the application defect information is reasonably utilized when a test report is generated, so as to improve the utilization rate of the application defect information and improve the generation efficiency of the test report.
Drawings
FIG. 1 is a flowchart illustrating a method for generating a test report according to an exemplary embodiment of the present disclosure;
FIG. 2 is a flowchart illustrating a method for generating a test report according to another exemplary embodiment of the present disclosure;
FIG. 3 is a schematic diagram of an input interface for defect description information, shown in an exemplary embodiment of the present disclosure;
fig. 4 is a schematic structural diagram of a test report generation apparatus according to an exemplary embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a test report generation apparatus according to another exemplary embodiment of the present disclosure;
fig. 6 is a block diagram of an electronic device shown in an exemplary embodiment of the present disclosure.
Detailed Description
At present, when a tester tests an application, if the tester finds a defect, the tester needs to fill in a defect report to record the defect, and the developer is informed of the problem through the defect report. Defect reporting is an important tool for testers and developers to communicate.
After the defect report is written, the tester can submit the defect report, a development manager distributes the defect report, a research and development worker processes the application defect pointed by the defect report, after the processing is finished, the tester retests the application defect, and after the retest is passed, the tester can close the defect report.
After the defect report is closed, one application process of the defect report is finished, and the defect report can not be reused at a later stage. Therefore, the prior art does not fully utilize the information in the defect report, resulting in low utilization rate of the information in the defect report.
In order to solve the above technical problem, in the test report generation scheme provided by the present disclosure, the test record is generated according to the historical test defect information, and when the test report needs to be generated again, the corresponding test record can be matched according to the test defect information input by the user, and then the test report is directly generated according to the existing test record, so as to improve the generation efficiency of the test report. The method can fully utilize the information in the existing test report to improve the utilization rate of the information of the test report and achieve the effect of quickly generating the test report.
Fig. 1 is a flowchart illustrating a test report generation method according to an exemplary embodiment of the present disclosure.
As shown in fig. 1, the test report generation method provided by the present disclosure includes:
The method provided by the present disclosure may be executed by an electronic device with computing capability, which may be, for example, a background server for generating test reports. The electronic device may be a single server, or may be a cluster server or a distributed server.
Specifically, the electronic device can provide a service for generating a test report to the outside, for example, a user terminal used by a user can be connected to the electronic device through a network, and the user terminal can display an interactive interface when accessing the service for generating a test report provided by the electronic device.
Further, the user may operate the user terminal, in which the test defect information is input. The test defect information is information of a defect found when a user tests an application. For example, when the user tests the application, if a defect is found, the user terminal may be operated to access the service for generating the test report, so that the user terminal displays the interactive interface.
In practical application, the user terminal can acquire the test defect information input by the user and send the test defect information to the electronic equipment, so that the electronic equipment can acquire the test defect information input by the user.
In an alternative embodiment, the test defect information is used to describe a defect found when the program is tested, and for example, the test defect information may include defect description information and information about a reproduction of the defect.
Wherein the electronic device may determine the keyword in the acquired test defect information. For example, nonsense words such as "what", "o", etc. in the test defect information may be eliminated. The electronic equipment can also extract key words in the residual content in the test defect information as key words.
Specifically, if the test defect information includes defect description information and defect recurrence information, the electronic device may extract the keywords from the defect description information and the defect recurrence information, respectively.
Further, if the test defect information includes a plurality of categories of information, the keyword may be extracted from each category of information. For example, if the test defect information includes the defect necessity level, for example, the defect necessity level is "must occur", the electronic device may extract the keyword "must". For another example, the test defect information includes a model system, for example, if the model system is "all models", the electronic device may extract a keyword "all".
In practical application, in the scheme provided by the disclosure, a record library is preset, and a plurality of test records are arranged in the preset record library. Each test record is generated based on historical application test information. For example, after the user inputs the test defect information, if the electronic device does not determine the test record matching the test defect information in the preset record library, the user may continue to input more detailed information corresponding to the test defect information, such as a cause of defect generation, and the like, and the electronic device may generate the test record according to the application defect information and store the test record in the preset record library.
The electronic device can perform matching in a preset record library according to keywords in the test defect information input by the current user to determine a matched test record.
Specifically, if a test record includes each key of the test defect information, the test record may be considered to be matched with the current test defect information. Alternatively, the test record may include most of the keys of the test defect information, and the test record may be considered to match the current test defect information. The method can be specifically set according to requirements.
Further, if the keyword is obtained from a plurality of category information included in the test defect information, it may be determined that the test record matches the current test defect information when each category information in the test record corresponds to each keyword.
For example, the keyword a is extracted from the class a information in the test defect information, and when the class a information of the test record includes the keyword a, the test defect information is considered to match the class a information of the test record. When the test defect information matches all of the plurality of categories of information of the test record, it is determined that the test defect information matches the test record.
And 103, if the test record matched with the test defect information exists, generating a test report according to the test record.
Further, if the preset record library includes a test record matching the test defect information, the electronic device may generate a test report using the matched test record, so as to improve the efficiency of the test report, and may also utilize historical test data.
In practical application, the test record in the preset record library includes test defect information and may also include information such as defect generation reasons, and the electronic device may acquire each information in the test record and generate a test report according to the information.
In an optional implementation manner, a report template may be further disposed in the electronic device, and the electronic device may fill each piece of information obtained from the test record into a corresponding position in the report template, so as to generate the test report quickly.
According to the embodiment, historical application defect information can be recorded in a test record mode, and the application defect information is reasonably utilized when a test report is generated, so that the utilization rate of the application defect information is improved.
The method provided by the present embodiment is used for generating a test report, and the method is performed by a device provided with the method provided by the present embodiment, and the device is generally implemented in a hardware and/or software manner.
The test report generation method provided by the embodiment includes: acquiring test defect information input by a user, and determining keywords in the test defect information; the test defect information is used for describing defects found when the program is tested; determining whether a test record matched with the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application information; and if the test record matched with the test defect information exists, generating a test report according to the test record. In the test report generation method provided by this embodiment, historical application defect information can be recorded in a test record manner, and the application defect information is reasonably utilized when a test report is generated, so as to improve the utilization rate of the application defect information and also improve the generation efficiency of the test report.
Fig. 2 is a flowchart illustrating a test report generation method according to another exemplary embodiment of the present disclosure.
As shown in fig. 2, the method for generating a test report according to this embodiment includes:
In an alternative embodiment, if the user finds a defect during the test of the application, the user terminal may be operated to send a request for generating a test report to the electronic device. After receiving the request, the electronic device may send an input interface of the defect description information to the user terminal based on the method provided by the present disclosure.
The user may perform an operation in an input interface of the defect description information displayed by the user terminal, and may specifically input the defect description information therein.
In one embodiment, the input interface of the defect description information may include an input box in which the user may input the defect description information. In another embodiment, the input interface of the defect description information may include a plurality of information titles, a selection box may be displayed after the information titles, and a user may select information in the selection box that is consistent with the current defect information. The two modes can also be combined, and the interface can comprise an input box for inputting information and a selection box for selecting information.
Fig. 3 is a schematic diagram of an input interface of defect description information according to an exemplary embodiment of the present disclosure.
As shown in fig. 3, the input interface of the defect description information may include a component for inputting various information, and the component may be an input box or a selection box.
In one embodiment, the defect description information may include a degree of necessity, which may specifically be a case of necessity, a case of high probability, a case of difficulty, and the like.
The defect description information may include a model system, where the model system is used to represent a model in which a current defect may appear, and specifically may include all models, low-end operating models, new operating systems, common operating systems, and other situations.
The defect description information may include a trigger frequency, general defects are generated when a certain function is used, and the use frequency of the function may be characterized by the trigger frequency, which may specifically include situations of few use, frequent use, general use, and the like.
The defect description information may include a severity, which is used to characterize the severity of the defect that is currently present, and specifically may include the situations that the defect cannot disappear, the defect can be repaired by restarting, and other problems are caused.
The defect description information may include a range of influence, some defects may affect only the current function, but some defects may affect the function associated with the current function. Thus, this information can be described by the scope of influence. For example, when the application is an application for an asset transaction, the scope of influence may include only the present transaction, the associated transaction, the entire system, and so on.
After the user inputs the defect description information in the interface, the user terminal can upload corresponding information to the electronic device through the network, so that the electronic device can acquire the defect description information.
In an alternative embodiment, the electronic device may send an input interface of the defect recurrence information to the user terminal after the user inputs the defect description information.
In another embodiment, the electronic device may send an input interface of the defect description information and an input interface of the reproduction information to the user terminal at the same time. The user terminal can simultaneously display the input interface of the defect description information and the input interface of the defect reproduction information in a large interface.
In practical application, the user terminal can display an input interface of the defect recurrence information, so that the user can input the defect recurrence information in the interface. The defect recurrence information is information that the same defect occurs again, for example, a defect that triggers an application when a specific number is input.
The defect recurrence information may include boundary value verification, null input submission, return operation, abnormal input values, and the like, and the user may input the defect recurrence information according to actual conditions.
Specifically, after the user inputs the defect recurrence information in the user terminal, the user terminal may report the corresponding information to the electronic device, so that the electronic device can obtain the defect recurrence information.
Further, after the electronic device acquires the defect description information and the defect recurrence information input by the user, keywords may be extracted from the two pieces of information, specifically, at least one first keyword may be determined in the defect description information, and at least one second keyword may be determined in the defect recurrence information.
In practical application, a keyword recognition algorithm can be preset in the electronic device, and keywords can be extracted from the defect description information and the defect reproduction information through the corresponding algorithm. For example, the electronic device may perform word segmentation processing in the defect description information and the defect recurrence information, may remove a word with a mood and a word without an actual meaning, may determine a key word in the remaining words, and may use a corresponding character as a keyword.
The keywords are extracted from the defect description information and the defect recurrence information respectively, so that the key information representing the defect description information and the defect recurrence information can be extracted, and the existing matching test information can be determined by combining the defect description information and the defect recurrence information.
Specifically, the electronic device may access a preset record library, the preset record library may be set in the electronic device or in other devices, and the electronic device may be connected to the other devices to access the preset record library.
Further, a plurality of test records may be set in the preset record library, and each test record may be generated based on the historical application test information.
In practical application, each test record in the preset record library may include defect description information and defect recurrence information.
The electronic device can query the matched test record in the preset record library by using the first keyword and the second keyword. Specifically, the test record in which the defect description information includes the first key and the defect reproduction information includes the second key may be used as the matched test record. For example, if the first keyword "a" and the second keyword "B" are extracted according to the test defect information currently input by the user, the matching defect description information including "a" and the matching defect recurrence information including "B" may be searched in the preset record library. And then the test record which comprises the matching defect description information and the matching defect recurrence information is used as the test record matched with the test defect information.
And step 205, if the test record matched with the test defect information exists, generating a test report according to the test record.
Step 205 is similar to step 103 in implementation and principle, and is not described in detail again.
In step 206, if there is no test record matching with the test defect information, the information of the cause of defect generation input by the user is obtained.
Specifically, if there is no test record matching the test defect information in the preset record library, the electronic device may continue to acquire the defect generation cause information input by the user.
Further, if the electronic device does not determine the test record matching the test defect information in the preset record library, the electronic device may send an interface for inputting the cause information of the defect generation to the user terminal, so that the user may input the cause information of the defect generation in the user terminal, and the user terminal may report the cause information of the defect generation to the electronic device, so that the electronic device may obtain the cause information of the defect generation input by the user.
In practical application, a tester can discuss the reason of the defect with the developed reason, so that the tester can or the accurate reason of the defect.
And step 207, generating a test record according to the test defect information and the reason information, and storing the test record into a preset defect library.
In practical application, the electronic device may generate a test record according to the test defect information input by the user and the reason information for the defect generation, and may store the test record in a preset defect library.
Each test record may include test defect information and defect generation cause information, and the test defect information may specifically include defect description information and defect recurrence information.
Specifically, when the user inputs the test defect information again, the electronic device may search the preset defect library for a matching test record based on the information input by the user.
And step 208, generating a test report according to the generated test record.
Further, the electronic device may also generate a test report according to the generated test record, and the specific generation manner is similar to the manner of generating the test report based on the matched test record in step 103, and is not described again.
In an alternative embodiment, the electronic device may further obtain defect summary information input by the user. The electronic device can send an input interface of the defect summary information to the user terminal, the user can input the defect summary information into the user terminal, and the user terminal can report the defect summary information to the electronic device.
In this embodiment, the electronic device generates a test report based on the test record and the defect summary information. For example, the electronic device may obtain a preset report template, a filling position of the defect summary information may be set in the preset template, and the electronic device may fill the defect summary information input by the user into the corresponding position, so as to generate the test report.
In practical application, the electronic device may generate a test report based on the test record matched with the test defect information, or may generate a test report based on the test record generated according to the test information.
Fig. 4 is a schematic structural diagram of a test report generation apparatus according to an exemplary embodiment of the present disclosure.
As shown in fig. 4, the test report generating apparatus 400 provided by the present disclosure includes:
a determining unit 410, configured to obtain test defect information input by a user, and determine a keyword in the test defect information; the test defect information is used for describing defects found when a program is tested;
a matching unit 420, configured to determine whether a test record matching the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application test information;
a report generating unit 430, configured to generate a test report according to the test record if the test record matching the test defect information exists.
The specific principle and implementation of the test report generating apparatus provided in this embodiment are similar to those of the embodiment shown in fig. 1, and are not described here again.
Fig. 5 is a schematic structural diagram of a test report generation apparatus according to another exemplary embodiment of the present disclosure.
As shown in fig. 5, in the test report generating apparatus 500 provided by the present disclosure, in an optional implementation manner, if there is no test record matching with the test defect information, the apparatus further includes a record generating unit 440, configured to:
acquiring reason information of defect generation input by a user;
generating a test record according to the test defect information and the reason information, and storing the test record into the preset defect library;
the report generating unit 430 is further configured to: and generating a test report according to the generated test record.
In an optional implementation manner, the determining unit 410 includes a defect information obtaining module 411, configured to:
sending an input interface of defect description information to a user terminal, responding to the input operation of a user on the input interface of the defect description information, and acquiring the defect description information;
and sending an input interface of the defect recurrence information to the user terminal, responding to the input operation of the user on the input interface of the defect recurrence information, and acquiring the defect recurrence information.
In an alternative embodiment, the determining unit 410 includes a keyword determining module 412, configured to:
determining at least one first key in the defect description information and at least one second key in the defect reproduction information;
correspondingly, the matching unit 420 is specifically configured to:
determining whether a test record matched with the test defect information exists in the preset record library according to the first keyword and the second keyword; and the test record matched with the test defect information comprises defect description information matched with the first keyword and defect recurrence information matched with the second keyword.
In an optional embodiment, the defect description information includes any one of the following information: the current degree, the model system, the trigger frequency, the severity and the influence range.
In an optional implementation, the apparatus further includes a summary obtaining unit 450, configured to:
acquiring defect summary information input by a user;
correspondingly, the report generating unit 430 is specifically configured to:
and generating the test report according to the test record and the defect summary information.
Fig. 6 is a block diagram of an electronic device shown in an exemplary embodiment of the present disclosure.
As shown in fig. 6, the electronic device provided in this embodiment includes:
a memory 61;
a processor 62; and
a computer program;
wherein the computer program is stored in the memory 61 and configured to be executed by the processor 62 to implement any of the test report generation methods as described above.
The present embodiments also provide a computer-readable storage medium, having stored thereon a computer program,
the computer program is executed by a processor to implement any of the test report generation methods described above.
The present embodiment also provides a computer program comprising a program code for executing any one of the test report generating methods described above when the computer program is run by a computer.
Those of ordinary skill in the art will understand that: all or a portion of the steps of implementing the above-described method embodiments may be performed by hardware associated with program instructions. The program may be stored in a computer-readable storage medium. When executed, the program performs steps comprising the method embodiments described above; and the aforementioned storage medium includes: various media that can store program codes, such as ROM, RAM, magnetic or optical disks.
Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present disclosure, and not for limiting the same; while the present disclosure has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present disclosure.
Claims (10)
1. A method for generating a test report, comprising:
acquiring test defect information input by a user, and determining keywords in the test defect information; the test defect information is used for describing defects found when a program is tested;
determining whether a test record matched with the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application test information;
and if the test record matched with the test defect information exists, generating a test report according to the test record.
2. The method of claim 1, wherein if there is no test record matching the test defect information, the method further comprises:
acquiring reason information of defect generation input by a user;
generating a test record according to the test defect information and the reason information, and storing the test record into the preset defect library;
and generating a test report according to the generated test record.
3. The method of claim 1, wherein the obtaining of the test defect information input by the user comprises:
sending an input interface of defect description information to a user terminal, responding to the input operation of a user on the input interface of the defect description information, and acquiring the defect description information;
and sending an input interface of the defect recurrence information to the user terminal, responding to the input operation of the user on the input interface of the defect recurrence information, and acquiring the defect recurrence information.
4. The method of claim 3, wherein determining the key in the test defect information comprises:
determining at least one first key in the defect description information and at least one second key in the defect reproduction information;
correspondingly, the determining whether a test record matching the test defect information exists in a preset record library according to the keyword includes:
determining whether a test record matched with the test defect information exists in the preset record library according to the first keyword and the second keyword; and the test record matched with the test defect information comprises defect description information matched with the first keyword and defect recurrence information matched with the second keyword.
5. The method of claim 3,
the defect description information includes any one of the following information: the current degree, the model system, the trigger frequency, the severity and the influence range.
6. The method of any one of claims 1-5, further comprising:
acquiring defect summary information input by a user;
correspondingly, the generating a test report according to the test record includes:
and generating the test report according to the test record and the defect summary information.
7. A test report generation apparatus, comprising:
the device comprises a determining unit, a judging unit and a judging unit, wherein the determining unit is used for acquiring test defect information input by a user and determining keywords in the test defect information; the test defect information is used for describing defects found when a program is tested;
the matching unit is used for determining whether a test record matched with the test defect information exists in a preset record library according to the keyword; the preset record library comprises test records generated according to historical application test information;
and the report generating unit is used for generating a test report according to the test record if the test record matched with the test defect information exists.
8. An electronic device, comprising:
a memory;
a processor; and
a computer program;
wherein the computer program is stored in the memory and configured to be executed by the processor to implement the method of any of claims 1-6.
9. A computer-readable storage medium, having stored thereon a computer program,
the computer program is executed by a processor to implement the method according to any one of claims 1-6.
10. A computer program product comprising a computer program which, when executed by a processor, implements the method according to any one of claims 1-6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110665481.8A CN113238963A (en) | 2021-06-16 | 2021-06-16 | Test report generation method, device, equipment, storage medium and program product |
Applications Claiming Priority (1)
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